Eon Turn-on switching energy per pulse VCC=600 V, IC=IE=150 A, - 24.2 -
E
Turn-off switching energy per pulse VGE=±15 V, RG=0 Ω, Tj=150 °C, - 16.0 -
off
(Note.1)
Err
R
Reverse recovery energy per pulse Inductive load - 12.2 -
Internal lead resistance
CC'+EE'
Main terminals-chip, per switch,
=25 °C
T
C
(Note.2)
- - 1.8 mΩ
rg Internal gate resistance Per switch - 13 - Ω
Limits
Unit
V
V
nF
ns
V
V
mJ
2
Feb. 2011
MITSUBISHI IGBT MODULES
CM150DX-24S
HIGH POWER SWITCHING USE
INSULATED TYPE
ELECTRICAL CHARACTERISTICS (cont.; Tj=25 °C, unless otherwise specified)
NTC THERMISTOR PART
Symbol Item Conditions
R25 Zero-power resistance TC=25 °C
ΔR/R Deviation of resistance TC=100 °C, R
B
B-constant Approximate by equation
(25/50)
P25 Power dissipation TC=25 °C
(Note.2)
4.85 5.00 5.15 kΩ
=493 Ω -7.3 - +7.8 %
100
(Note.2)
- - 10 mW
(Note.6)
- 3375 - K
Min. Typ. Max.
Limits
Unit
THERMAL RESISTANCE CHARACTERISTICS
Symbol Item Conditions
R
Junction to case, per IGBT - - 0.13 K/W
th(j-c)Q
R
th(j-c)D
R
th(c-s)
Thermal resistance
Contact thermal resistance
(Note.2)
(Note.2)
Junction to case, per FWDi - - 0.23 K/W
Case to heat sink, per 1 module,
Thermal grease applied
(Note.7)
Min. Typ. Max.
- 15 - K/kW
Limits
Unit
MECHANICAL CHARACTERISTICS
Symbol Item Conditions
Mt Main terminals M 6 screw 3.5 4.0 4.5
Ms
ds Creepage distance
da Clearance
Mounting torque
Mounting to heat sink M 5 screw 2.5 3.0 3.5
Terminal to terminal 11.55 - -
Terminal to base plate 12.32 - -
Terminal to terminal 10.00 - -
Terminal to base plate 10.85 - -
Min. Typ. Max.
m Weight - - 350 - g
ec Flatness of base plate On the centerline X, Y
(Note.8)
±0 - +100 μm
Note.1: Represent ratings and characteristics of the anti-parallel, emitter-collector free wheeling diode (FWDi).
Note.2: Case temperature (T
) and heat sink temperature (Ts) are defined on the each surface (mounting side) of base plate
C
and heat sink just under the chips. Refer to the figure of chip location.
The heat sink thermal resistance should measure just under the chips.
Note.3: Pulse width and repetition rate should be such that the device junction temperature (T
Note.4: Junction temperature (T
) should not increase beyond T
j
jmax
rating.
j
Note.5: Pulse width and repetition rate should be such as to cause negligible temperature rise.
Note.6:
Refer to the figure of test circuit for V
R
25
/()
ln(B
)/(
5025
R
R
: resistance at absolute temperature T25 [K]; T25=25 [°C]+273.15=298.15 [K]
25
R
: resistance at absolute temperature T50 [K]; T50=50 [°C]+273.15=323.15 [K]
50
11
)
TT
502550
CEsat
, VEC.
Note.7: Typical value is measured by using thermally conductive grease of λ=0.9 W/(m·K).
Note.8: The base plate (mounting side) flatness measurement points (X, Y) are as follows of the following figure.
Y
mounting side
-:Concave
mounting side
+:Convex
-:Concave
X
Limits
) dose not exceed T
jmax
Unit
N·m
mm
mm
rating.
mounting side
+:Convex
Note.9: Japan Electronics and Information Technology Industries Association (JEITA) standards,
"EIAJ ED-4701/300: Environmental and endurance test methods for semiconductor devices (Stress test I)"
Note.10: Use the following screws when mounting the printed circuit board (PCB) on the stand offs.
"M2.6×10 or M2.6×12 self tapping screw"
The length of the screw depends on the thickness of the PCB.
3
Feb. 2011
MITSUBISHI IGBT MODULES
CM150DX-24S
HIGH POWER SWITCHING USE
INSULATED TYPE
RECOMMENDED OPERATING CONDITIONS (Ta=25 °C)
Symbol Item Conditions
VCC (DC) Supply voltage Applied across C1-E2 - 600 850 V
V
Gate (-emitter drive) voltage Applied across G1-Es1/G2-Es2 13.5 15.0 16.5 V
GEon
RG External gate resistance Per switch 0 - 30 Ω
Min. Typ. Max.
CHIP LOCATION (top view)
Limits
Dimension in mm, tolerance: ±1 mm
Unit
Tr1/Tr2: IGBT, Di1/Di2: FWDi, Th: NTC thermistor. Each mark points the center position of each chip.
4
Feb. 2011
MITSUBISHI IGBT MODULES
CM150DX-24S
HIGH POWER SWITCHING USE
INSULATED TYPE
TEST CIRCUIT AND WAVEFORMS
VGE=15 V
circuited
V
Short-
vCE
22
15
16
38
39
48
23/24
47
IC
Short-
circuited
VGE=15 V
22
15
16
38
39
48
23/24
47
V
I
C
Tr1 Tr2 Di1 Di2
V
test circuit VEC test circuit
CEsat
v
iE
GE
0 V
Load
VCE
V
+
i
C
i
CC
C
0 A
t
d(on )
+V
-V
-VGE
R
G
GE
VGE 0 V
GE
Switching characteristics test circuit and waveforms t
I
CM
VCC
iC
i
C
V
CC
Short-
circuited
V
Short-
circuited
t
r
t
d(off)
ICM
22
15
16
38
39
~
~
90 %
48
I
E
23/24
47
0
iE
t
Short-
circuited
Short-
circuited
22
15
16
38
39
Q
=0.5×Irr×t
rr
t
rr
48
23/24
47
V
I
E
rr
IE
0.5×I
t
rr
~
~
90 %
0 A
Irr
10%
t
t
f
, Qrr test waveform
rr
i
E
v
CE
0 A
IEM
v
EC
V
CC
t
0.1×I
0
CM
0.1×VCC
t
ti
IGBT Turn-on switching energy IGBT Turn-off switching energy FWDi Reverse recovery energy
Turn-on / Turn-off switching energy and Reverse recovery energy test waveforms (Integral time instruction drawing)
0.1×V
CC
t
i
0.02×I
CM
t0
t0 V
ti
5
Feb. 2011
MITSUBISHI IGBT MODULES
CM150DX-24S
HIGH POWER SWITCHING USE
INSULATED TYPE
PERFORMANCE CURVES
INVERTER PART
COLLECTOR-EMITTER SATURATION
VOLTAGE CHARACTERISTICS
(TYPICAL)
VGE=15 V
3
Tj=125 °C
2
1
(Chip)
Tj=150 °C
Tj=25 °C
300
250
(A)
C
200
150
100
COLLECTOR CURRENT I
50
Tj=25 °C
VGE=20 V
15 V
OUTPUT CHARACTERISTICS
(TYPICAL)
13.5 V
12 V
11 V
10 V
9 V
(Chip)
3.5
(V)
2.5
CEsat
1.5
COLLECTOR-EMITTER
SATURATION VOLTAGE V
0.5
0
0246810
0
050100150200250300
COLLECTOR-EMITTER VOLTAGE VCE (V) COLLECTOR CURRENT IC (A)
COLLECTOR-EMITTER SATURATION
VOLTAGE CHARACTERISTICS
10
8
Tj=25 °C
(V)
CEsat
6
4
COLLECTOR-EMITTER
2
SATURATION VOLTAGE V
(TYPICAL)
(Chip)
1000
IC=300 A
IC=150 A
(A)
E
IC=60 A
100
EMITTER CURRENT I
FREE WHEELING DIODE
FORWARD CHARACTERISTICS
(TYPICAL)
G-E short-circuited
Tj=125 °C
Tj=150 °C
Tj=25 °C
(Chip)
0
68101214161 820
10
0123
GATE-EMITTER VOLTAGE VGE (V) EMITTER-COLLECTOR VOLTAGE VEC (V)
6
Feb. 2011
MITSUBISHI IGBT MODULES
VCC=600 V, VGE=±15 V, RG=0 Ω, INDUCTIVE LOAD
1000
100
SWITCHING TIME (ns)
SWITCHING CHARACTERISTICS
HALF-BRIDGE
(TYPICAL)
--------------- : T
=150 °C, - - - - -: Tj=125 °C
j
t
d(off)
t
d(on)
tf
tr
CM150DX-24S
HIGH POWER SWITCHING USE
INSULATED TYPE
SWITCHING CHARACTERISTICS
VCC=600 V, IC=150 A, VGE=±15 V, INDUCTIVE LOAD
1000
100
--------------- : T
SWITCHING TIME (ns)
HALF-BRIDGE
(TYPICAL)
=150 °C, - - - - -: Tj=125 °C
j
t
d(off)
t
d(on)
t
r
t
f
10
101001000
10
110100
COLLECTOR CURRENT IC (A) EXTERNAL GATE RESISTANCE RG (Ω)
SWITCHING ENERGY (mJ)
100
SWITCHING CHARACTERISTICS
SWITCHING CHARACTERISTICS
(TYPICAL)
HALF-BRIDGE
VCC=600 V, VGE=±15 V, RG=0 Ω,
INDUCTIVE LOAD, PER PULSE
--------------- : T
10
=150 °C, - - - - -: Tj=125 °C
j
Eon
E
off
Err
100
10
VCC=600 V, IC/IE=150 A, VGE=±15 V,
INDUCTIVE LOAD, PER PULSE
--------------- : T
SWITCHING ENERGY (mJ)
HALF-BRIDGE
(TYPICAL)
=150 °C, - - - - -: Tj=125 °C
j
E
on
E
off
E
rr
REVERSE RECOVERY ENERGY (mJ)
1
101001000
COLLECTOR CURRENT IC (A)
EMITTER CURRENT I
(A)
E
7
REVERSE RECOVERY ENERGY (mJ)
1
0.1110100
EXTERNAL GATE RESISTANCE R
(Ω)
G
Feb. 2011
MITSUBISHI IGBT MODULES
100
10
1
CAPACITANCE (nF)
0.1
CAPACITANCE CHARACTERISTICS
(TYPICAL)
G-E short-circuited, Tj=25 °C
CM150DX-24S
HIGH POWER SWITCHING USE
INSULATED TYPE
REVERSE RECOVERY CHARACTERISTICS
VCC=600 V, VGE=±15 V, RG=0 Ω, INDUCTIVE LOAD
1000
C
ies
(A)
rr
C
oes
C
res
100
(ns), I
rr
t
FREE WHEELING DIODE
(TYPICAL)
--------------- : T
=150 °C, - - - - -: Tj=125 °C
j
trr
Irr
0.01
0.1110100
10
101001000
COLLECTOR-EMITTER VOLTAGE VCE (V) EMITTER CURRENT IE (A)
TRANSIENT THERMAL IMPEDANCE
CHARACTERISTICS
(MAXIMUM)
Single pulse, TC=25°C
1
0.1
20
15
(V)
GE
10
5
GATE-EMITTER VOLTAGE V
GATE CHARGE CHARACTERISTICS
(TYPICAL)
VCC=600 V, IC=150 A, Tj=25 °C
th(j-c)
0.01
0.001
0
0100200300400500
0.00001 0.00010.0010.010.1110
NORMALIZED TRANSIENT THERMAL IMPEDANCE Z
R
th(j-c)Q
=0.13 K/W, R
th(j-c)D
=0.23 K/W
GATE CHARGE QG (nC) TIME (S)
8
Feb. 2011
MITSUBISHI IGBT MODULES
CM150DX-24S
HIGH POWER SWITCHING USE
INSULATED TYPE
Keep safety first in your circuit designs!
·Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is
always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property
damage.
Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of
substitutive, auxiliary circuits, (ii) use of non-flammable material or (iii) prevention against any malfunction or mishap.
Notes regarding these materials
·These materials are intended as a reference to assist our customers in the selection of the Mitsubishi semiconductor product best suited
to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to
Mitsubishi Electric Corporation or a third party.
·Mitsubishi Electric Corporation assumes no responsibility for any damage, or infringement of any third-party's rights, originating in the
use of any product data, diagrams, charts, programs, algorithms, or circuit application examples contained in these materials.
·All information contained in these materials, including product data, diagrams, charts, programs and algorithms represents information
on products at the time of publication of these materials, and are subject to change by Mitsubishi Electric Corporation without notice due
to product improvements or other reasons. It is therefore recommended that customers contact Mitsubishi Electric Corporation or an
authorized Mitsubishi Semiconductor product distributor for the latest product information before purchasing a product listed herein.
The information described here may contain technical inaccuracies or typographical errors. Mitsubishi Electric Corporation assumes no
responsibility for any damage, liability, or other loss rising from these inaccuracies or errors.
Please also pay attention to information published by Mitsubishi Electric Corporation by various means, including the Mitsubishi
Semiconductor home page (http://www.mitsubishichips.com/Global/index.html).
·When using any or all of the information contained in these materials, including product data, diagrams, charts, programs, and
algorithms, please be sure to evaluate all information as a total system before making a final decision on the applicability of the
information and products. Mitsubishi Electric Corporation assumes no responsibility for any damage, liability or other loss resulting from
the information contained herein.
·Mitsubishi Electric Corporation semiconductors are not designed or manufactured for use in a device or system that is used under
circumstances in which human life is potentially at stake. Please contact Mitsubishi Electric Corporation or an authorized Mitsubishi
Semiconductor product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus
or systems for transportation, vehicular, medical, aerospace, nuclear, or undersea repeater use.
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·If these products or technologies are subject to the Japanese export control restrictions, they must be exported under a license from the
Japanese government and cannot be imported into a country other than the approved destination.
Any diversion or reexport contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited.
·Please contact Mitsubishi Electric Corporation or an authorized Mitsubishi Semiconductor product distributor for further details on these
materials or the products contained therein.
9
Feb. 2011
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