Microsemi Corporation MSAFA1N100D Datasheet

2830 S. Fairview Street Santa Ana, CA 92704 Phone: (714) 979-8220 Fax: (714) 559-5989
MSAFA1N100D
Fast MOSFET Die for
Implantable Cardio Defibrillator
Applications
DESCRIPTION:
Passivation: oxynitride, 4um
Frontside (top) Metallization: Al/1%Cu for aluminum wire bonding, 9 um typical.
Backside Metallization: Ti – Ni (1 um) – Ag (0.2 um) for soft solder attach
FEATURES:
Low On-state resistance
Avalanche and Surge Rated
High Freq. Switching
Ultra Low Leakage Current
UIS rated
Available with Lot Acceptance Testing Spec MSAFA1N100DL, "-L" Suffix
MAXIMUM RATINGS:
SYMBOL PARAMETER VALUE UNIT
V
DSS
V
GS
I
D1
I
D2
I
DM1
I
AR
E
AR
E
AS
T
J, TSTG
Drain - Source Voltage 1000 Volts Gate - Source Voltage ±20 Volts Continuous Drain Current @ TC = 25°°C 1 Amps Continuous Drain Current @ TC = 100°°C .8 Amps Pulsed Drain Current ¬¬ @ TC = 25°°C 4 Amps Avalanche Current 1 Amps Repetitive Avalanche Energy TBD mJ Single Pulse Avalanche Energy TBD mJ Operating and Storage: Junction Temperature Range -55 to 150 °°C
STATIC ELECTRICAL CHARACTERISTICS:
SYMBOLCHARACTERISTIC / TEST CONDITIONS MIN TYP MAX UNIT
BV
DSS
V
GS(TH)2
V
GS(TH)1
R
DS(ON)1
R
DS(ON)2
R
DS(ON)3
R
DS(ON)4
R
DS(ON)5
I
DSS1
I
DSS2
I
DSS3
I
GSS1
I
GSS2
I
GSS3
Drain - Source Breakdown Voltage (VGS = 0V, ID = 0.25mA) Gate Threshold Voltage (V Gate Threshold Voltage (V Drain – Source On-State Resistance (V
Drain – Source On-State Resistance (V Drain – Source On-State Resistance (V Drain – Source On-State Resistance (V Drain – Source On-State Resistance (V Zero Gate Voltage Drain Current (V Zero Gate Voltage Drain Current (V Zero Gate Voltage Drain Current (V Gate-Source Leakage Current (V Gate-Source Leakage Current (V Gate-Source Leakage Current (V
= VDS, ID = 1 mA, T
GS
= VDS, ID = 1 mA, T
GS
= 10V, ID = I
GS
= 7V, ID = 5…150 mA, TJ= 37°°C)
GS
= 7V, ID = 5…150 mA, TJ= 25°°C)
GS
= 7V, ID = 5…150 mA, TJ= 60°°C)
GS
= 7V, ID = I
GS
= 80%BV
DS
= 80%BV
DS
= 80%BV
DS
= ±20V, VCE =0V)
GS
= ±20V VCE =0V), Tj= 37°°C
GS
= ±20V VCE =0V), Tj= 125°°C
GS
= 37°°C
J
= 25°°C
J
D1, TJ
D1, TJ
, VGS = 0V, TJ = 25°°C)
DSS
, VGS = 0V, TJ = 37°°C)
DSS
, VGS = 0V, TJ = 125°°C)
DSS
= 25°°C)
= 125°°C)
1000 Volts
3.4 Volts
2 3.5 4.5 Volts
12.5 13.5 ohm
12.5 ohm
11.5 ohm 15 ohm
23.5 ohm
10 uA
1 uA
100 uA
±100 nA
10 nA
500 nA
MSC1054.PDF 6/23/99 All Ratings: Device Packaged in TO-3 or Microsemi CoolPack Package, T
= 25°C unless otherwise specified
C
MSAFA1N100D
Fast MOSFET Die for
Implantable Cardio Defibrillator
Applications
DYNAMIC CHARACTERISTICS:
SYMBOL CHARACTERISTIC TEST CONDITIONS MIN TYP MAX UNIT
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance
Reverse Transfer Capacitance f = 1 MHz 15 25 pF Qg Total Gate Charge ¯¯ Qgs Gate-Source Charge
Qgd Gate-Drain ("Miller") Charge
td (on) t
r
td (off) t
f
td (on) t
r
td (off) t
f
V
SD
Turn-on Delay Time Resistive Switching (25°°C) 6.3 ns
Rise Time
Turn-off Delay Time
Fall Time
Turn-On Delay Time Resistive Switching (25°°C) 6.3 ns
Rise Time
Turn-off Delay Time
Fall Time
Diode Forward Voltage
trr Reverse Recovery Time
Q
rr
Reverse Recovery Charge
V
= 0V
GS
V
= 25V
DS
VGS = 10V
VDS = 0.5BV
I
= 20 mA
C
DSS
VGS = 10V, VDS = 0.5BV
I
= 20 mA
D
R
= 1.6ΩΩ
g
VGS = 10V, VDS = 0.5BV
I
= 100 mA
D
R
= 1.6ΩΩ
g
V
=0 V, IS = 1 A
GS
I
= 1 A, d IS / dt = 100 A/us
S
I
= 1 A, d IS / dt = 100 A/us
S
DSS
DSS
290 350 pF
36 45 pF
20 nC
1 nC
10 nC
5.9 ns
315 ns
2.6 us
5.8 ns 76 ns
470 ns
1 V
130 ns
.7 uC
¬ Repetitive Rating: Pulse width limited by maximum junction temperature.
- IC = I ® TJ = 150°°C ¯ See MIL-STD-750 Method 3471
= 50V, RCE = 25ΩΩ, L = 300µµH, TJ = 25°°C
C2, VCC
DIE PROBE PARAMETERS (100% TESTS):
SYMBOL CHARACTERISTIC / TEST CONDITIONS MIN TYP MAX UNIT BV
DSS
VGS(TH) Gate Threshold Voltage (VDS = VGS, IC = 1000µµA, TJ = 25°°C 2 4.5 RDS (ON) Drain-Source On-Resistance (VGS = 10V, IC = 1 A, TJ = 25°°C) 14 ohm I
DSS
I
GSS
MSC1054.PDF 6/23/99 All Ratings: Device Packaged in TO-3 or Microsemi CoolPack Package, T
Drain-Source Breakdown Voltage (VGS = 0V, IC = 0.25mA) 1000 Volts
Zero Gate Voltage Drain Current (VDS = 800 V, VGS = 0V, TJ = 25°°C) 25 uA Gate-Source Leakage Current (VGS = ±20 V, VDS =0V) ±100 nA
= 25°C unless otherwise specified
C
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