Microsemi Corporation MSAEX8P50A Datasheet

2830 S. Fairview St. Santa Ana, CA 92704 PH: (714) 979-8220 FAX: (714) 966-5256
MSAEX8P50A
Features
High voltage p-channel power mosfet with parallel fast switching, soft recovery fred; complements MSAFX24N50A
Ultrafast body diode
Increased Unclamped Inductive Switching (UIS) capability
Hermetically sealed, surface mount power package
Low package inductance
Very low thermal resistance
Reverse polarity available upon request
ENHANCEMENT MODE
POWER MOSFET/FRED
Maximum Ratings @ 25°°C (unless otherwise specified)
DESCRIPTION SYMBOL MAX. UNIT
500 Volts
8 Amps
1.2
P-CHANNEL
Drain-to-Source Breakdown Voltage (Gate Shorted to Source)
@ TJ 25°C
Drain-to-Gate Breakdown Voltage @ T
25°C, RGS= 1 M BV
J
BV
Continuous Gate-to-Source Voltage V Transient Gate-to-Source Voltage V Continuous Drain Current Tj= 25°C
Tj= 100°C
Peak Drain Current, pulse width limited by T
Jmax
I
I
D100
I Repetitive Avalanche Current I Repetitive Avalanche Energy E Single Pulse Avalanche Energy E Voltage Rate of Change of the Recovery Diode
@ I
≤ IDM, di/dt 100 A/µs, VDD V
S
, TJ 150°C
DSS
dv/dt 5.0 V/ns
Power Dissipation P Junction Temperature Range T Storage Temperature Range T Continuous Source Current (Body Diode) I Pulse Source Current (Body Diode) I Thermal Resistance, Junction to Case
θ
Mechanical Outline
DSS
DGR
GS
GSM
D25
DM
AR
AR AS
D
j stg S
SM
JC
DRAIN
500 Volts
500 Volts +/-20 Volts +/-30 Volts
8 5
32 Amps
8 Amps
30 mJ
tbd mJ
300 Watts
-55 to +150
-55 to +150 8 Amps
32 Amps
0.35
Amps
°C °C
°C/W
Datasheet# MSC0307A
GATE
SOURCE
MSAEX8P50A
Electrical Parameters @ 25°°C (unless otherwise specified)
DESCRIPTION SYMBOL CONDITIONS MIN TYP. MAX UNIT
Drain-to-Source Breakdown Voltage (Gate Shorted to Source) Temperature Coefficient of the Drain-to-Source Breakdown Voltage Gate Threshold Voltage V Temperature Coefficient of the Threshold Voltage Gate-to-Source Leakage Current
Drain-to-Source Leakage Current (Zero Gate Voltage Drain Current) I
Static Drain-to-Source On-State Resistance (1)
Temperature Coefficient of the Drain-to-Source Resistance Forward Transconductance (1) g
BV
V
R
BV
GSth
R
DSon
DSS
GS(th)
I
GSS
DSS
DS(on)
DSS
fs
/T
/T
/T
VGS = 0 V, ID = 250 µA
J
VDS = VGS, ID =250 µA
J
VGS = ± 20VDC, VDS = 0 TJ = 25°C TJ = 125°C VDS =0.8•BV
VGS
DSS TJ
= 0 V TJ = 125°C VGS= 10V, ID= 4 A TJ = 25°C ID= 4 A TJ = 125°C
J
VDS 10 V; ID = 8 A
= 25°C
500 V
0.054
%/°C
2.0 4.5 V
0.12
%/°C
±100 ±200
200
1000
1.2
2.2
0.6
%/°C
4 5 S
nA
µA
Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time
T Rise Time Turn-off Delay Time Fall Time Total Gate Charge
Q Gate-to-Source Charge Gate-to-Drain (Miller) Charge Body Diode Forward Voltage (1) V
Reverse Recovery Time (Body Diode) t
Reverse Recovery Charge Q
C C C
t
d(off)
Q Q
iss oss rss
d(on)
t
r
t
f
g(on)
gs
gd SD
rr
V
= 0 V, VDS = 25 V, f = 1 MHz 3400
GS
pF 450 175
VGS = 10 V, VDS = 250 V,
ID = 4 A, RG = 2.00
33 27
ns
35 35
VGS = 10 V, VDS = 250V, ID = 4 A 130
nC
32 64
IF = IS, VGS = 0 V 1.2 1.5 V IF = 10 A, 25 C
-di/dt = 100 A/µs, 125 C
rr
IF = 10 A, 25 C di/dt = 100 A/µs, 125 C
35 50
tbd
125 250
tbd
ns
µC
Notes
(1) Pulse test, t ≤≤ 300 µµs, duty cycle δδ ≤≤ 2% (2) Microsemi Corp. does not manufacture the mosfet die; contact company for details.
Datasheet# MSC0307A
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