Device configuration16Gb (128 Meg x 4 x 16 banks x2 ranks)
Logic rank address1 C0
Package rank address2 CS_n[1:0]
Table 3: Part Numbers and Timing Parameters – 64GB Modules
Base device: MT40A4G4,1 16Gb DDR4 2H 3DS M/S DRAM DDR4 SDRAM
Part Number
2
DensityConfiguration
MTA72ASS8G72PSZ-3S2__64GB8 Gig x 7225.6 GB/s0.62ns/3200 MT/s26-22-22
MTA72ASS8G72PSZ-2S9__64GB8 Gig x 7223.47 GB/s0.682ns/2933 MT/s24-21-21
MTA72ASS8G72PSZ-2S6__64GB8 Gig x 7221.3 GB/s0.75ns/2666 MT/s22-19-19
Module
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
Features
Notes:
1. The data sheet for the base device can be found at micron.com.
2. All part numbers end with a two-place code (not shown) that designates component and PCB revisions.
Consult factory for current revision codes. Example: MTA72ASS8G72PSZ-3S2E1.
CCMTD-341111752-10423
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2
Micron Technology, Inc. reserves the right to change products or specifications without notice.
Micron Technology, Inc. ("Micron") reserves the right to make changes to information published in this document,
including without limitation specifications and product descriptions. This document supersedes and replaces all
information supplied prior to the publication hereof. You may not rely on any information set forth in this document if you obtain the product described herein from any unauthorized distributor or other source not authorized
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authorized representative.
CCMTD-341111752-10423
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3
Micron Technology, Inc. reserves the right to change products or specifications without notice.
The pin assignment table below is a comprehensive list of all possible pin assignments
for DDR4 RDIMM modules. See the Functional Block Diagram for pins specific to this
module.
Table 4: Pin Assignments
288-Pin DDR4 RDIMM Front288-Pin DDR4 RDIMM Back
Pin Symbol Pin Symbol Pin Symbol Pin SymbolPin Symbol Pin Symbol Pin Symbol Pin Symbol
1NC37V
2V
38DQ2474CK0_t110 DQS14_t/
SS
3DQ439V
4V
SS
40 DQS12_t/
TDQS12_t
5DQ041 DQS12_c/
TDQS12_c
6V
7DQS9_t/
42V
SS
43DQ3079A0115DQ42151V
TDQS9_t
8DQS09_c/
44V
TDQS9_c
9V
45DQ2681BA0117DQ52153DQS0_t189V
SS
73V
SS
75CK0_c111 DQS14_c/
SS
76V
77V
78EVENT_n 114V
SS
80V
SS
DD
DD
TT
DD
109V
145NC181DQ29217V
SS
146V
TDQS14_t
147V
TDQS14_c
112V
148DQ5184V
SS
113DQ46149V
150DQ1186DQS3_t222PARITY258DQ47
SS
116V
152DQS0_c188DQ31224BA1260DQ43
SS
REFCA
SS
SS
SS
253DQ41
DD
182V
218CK1_t254V
SS
183DQ25219CK1_c255DQS5_c
220V
SS
185DQS3_c221V
187V
223V
SS
225A10/AP261V
SS
DD
TT
DD
256DQS5_t
257V
259V
SS
SS
SS
SS
10DQ646V
11V
47CB483V
SS
12DQ248V
13V
49CB085V
SS
14DQ1250V
15V
SS
51 DQS17_t/
SS
SS
SS
TDQS17_t
16DQ852 DQS17_c/
TDQS17_c
17V
18 DQS10_t/
53V
SS
54CB690V
SS
TDQS10_t
19 DQS10_c/
55V
SS
TDQS10_c
20V
21DQ1457V
22V
23DQ1059V
24V
56CB292V
SS
SS
58RESET_n94V
SS
DD
60CKE096V
SS
82RAS_n/
118V
A16
119DQ48155DQ7191V
DD
84CS0_n120V
121 DQS15_t/
DD
TDQS15_t
86CAS_n/
A15
122 DQS15_c/
TDQS15_c
87ODT0123V
88V
124DQ54160V
DD
89CS1_n/NC125V
126DQ50162V
DD
91ODT1/NC127V
128DQ60164DQS1_t200V
DD
93CS2_n/C0129V
130DQ56166DQ15202V
SS
95DQ36131V
132 DQS16_t/
SS
TDQS16_t
SS
SS
154V
156V
190DQ27226V
SS
SS
192CB5228WE_n/
SS
DD
227NC263V
A14
157DQ3193V
158V
159DQ13195V
SS
161DQ9197DQS8_t233V
SS
163DQS1_c199CB7235NC/C2271DQ51
SS
165V
SS
194CB1230NC266DQS6_c
SS
196DQS8_c232A13268V
SS
198V
SS
201CB3237CS3_n/
SS
229V
SS
231V
SS
234A17270V
SS
236V
SS
DD
DD
DD
DD
C1, NC
238SA2274V
SS
167V
SS
168DQ11204V
203CKE1/NC239V
SS
DD
SS
240DQ37276V
262DQ53
SS
264DQ49
265V
SS
267DQS6_t
SS
269DQ55
SS
272V
SS
273DQ61
SS
275DQ57
SS
CCMTD-341111752-10423
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4
Micron Technology, Inc. reserves the right to change products or specifications without notice.
The pin description table below is a comprehensive list of all possible pins for DDR4
modules. All pins listed may not be supported on this module. See Functional Block Diagram for pins specific to this module.
Table 5: Pin Descriptions
SymbolTypeDescription
AxInputAddress inputs: Provide the row address for ACTIVATE commands and the column address for
A10/APInputAuto precharge: A10 is sampled during READ and WRITE commands to determine whether an
A12/BC_nInputBurst chop: A12/BC_n is sampled during READ and WRITE commands to determine if burst
ACT_nInputCommand input: ACT_n defines the ACTIVATE command being entered along with CS_n. The
BAxInputBank address inputs: Define the bank (with a bank group) to which an ACTIVATE, READ,
BGxInputBank group address inputs: Define the bank group to which a REFRESH, ACTIVATE, READ,
C0, C1, C2
(RDIMM/LRDIMM on-
ly)
CKx_t
CKx_c
CKExInputClock enable: CKE HIGH activates and CKE LOW deactivates the internal clock signals, device
CSx_nInputChip select: All commands are masked when CS_n is registered HIGH. CS_n provides external
InputChip ID: These inputs are used only when devices are stacked; that is, 2H, 4H, and 8H stacks for
InputClock: Differential clock inputs. All address, command, and control input signals are sampled
READ/WRITE commands in order to select one location out of the memory array in the respective bank (A10/AP, A12/BC_n, WE_n/A14, CAS_n/A15, and RAS_n/A16 have additional functions;
see individual entries in this table). The address inputs also provide the op-code during the
MODE REGISTER SET command. A17 is only defined for x4 SDRAM.
auto precharge should be performed on the accessed bank after a READ or WRITE operation
(HIGH = auto precharge; LOW = no auto precharge). A10 is sampled during a PRECHARGE command to determine whether the precharge applies to one bank (A10 LOW) or all banks (A10
HIGH). If only one bank is to be precharged, the bank is selected by the bank group and bank
addresses.
chop (on-the-fly) will be performed (HIGH = no burst chop; LOW = burst chopped). See Command Truth Table in the DDR4 component data sheet.
input into RAS_n/A16, CAS_n/A15, and WE_n/A14 are considered as row address A16, A15, and
A14. See Command Truth Table.
WRITE, or PRECHARGE command is being applied. Also determine which mode register is to be
accessed during a MODE REGISTER SET command.
WRITE, or PRECHARGE command is being applied. Also determine which mode register is to be
accessed during a MODE REGISTER SET command. BG[1:0] are used in the x4 and x8 configurations. x16-based SDRAM only has BG0.
x4 and x8 configurations using through-silicon vias (TSVs). These pins are not used in the x16
configuration. Some DDR4 modules support a traditional DDP package, which uses CS1_n,
CKE1, and ODT1 to control the second die. All other stack configurations, such as a 4H or 8H,
are assumed to be single-load (master/slave) type configurations where C0, C1, and C2 are used
as chip ID selects in conjunction with a single CS_n, CKE, and ODT. Chip ID is considered part of
the command code.
on the crossing of the positive edge of CK_t and the negative edge of CK_c.
input buffers, and output drivers. Taking CKE LOW provides PRECHARGE POWER-DOWN and
SELF REFRESH operations (all banks idle), or active power-down (row active in any bank). CKE is
asynchronous for self refresh exit. After V
tialization sequence, it must be maintained during all operations (including SELF REFRESH). CKE
must be maintained HIGH throughout read and write accesses. Input buffers (excluding CK_t,
CK_c, ODT, RESET_n, and CKE) are disabled during power-down. Input buffers (excluding CKE
and RESET_n) are disabled during self refresh.
rank selection on systems with multiple ranks. CS_n is considered part of the command code
(CS2_n and CS3_n are not used on UDIMMs).
has become stable during the power-on and ini-
REFCA
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
ODTxInputOn-die termination: ODT (registered HIGH) enables termination resistance internal to the
PARITYInputParity for command and address: This function can be enabled or disabled via the mode
RAS_n/A16
CAS_n/A15
WE_n/A14
RESET_nCMOS Input Active LOW asynchronous reset: Reset is active when RESET_n is LOW and inactive when RE-
SAxInput
SCLInput
DQx, CBxI/OData input/output and check bit input/output: Bidirectional data bus. DQ represents
DM_n/DBI_n/
TDQS_t (DMU_n,
DBIU_n), (DML_n/
DBIl_n)
SDAI/OSerial Data: Bidirectional signal used to transfer data in or out of the EEPROM or EEPROM/TS
DQS_t
DQS_c
DQSU_t
DQSU_c
DQSL_t
DQSL_c
ALERT_nOutputAlert output: Possesses functions such as CRC error flag and command and address parity error
EVENT_nOutputTemperature event: The EVENT_n pin is asserted by the temperature sensor when critical tem-
InputCommand inputs: RAS_n/A16, CAS_n/A15, and WE_n/A14 (along with CS_n) define the com-
I/OInput data mask and data bus inversion: DM_n is an input mask signal for write data. Input
I/OData strobe: Output with read data, input with write data. Edge-aligned with read data, cen-
DDR4 SDRAM. When enabled, ODT (RTT) is applied only to each DQ, DQS_t, DQS_c, DM_n/
DBI_n/TDQS_t, and TDQS_c signal for x4 and x8 configurations (when the TDQS function is enabled via the mode register). For the x16 configuration, RTT is applied to each DQ, DQSU_t,
DQSU_c, DQSL_t, DQSL_c, UDM_n, and LDM_n signal. The ODT pin will be ignored if the mode
registers are programmed to disable RTT.
register. When enabled in MR5, the DRAM calculates parity with ACT_n, RAS_n/A16, CAS_n/A15,
WE_n/A14, BG[1:0], BA[1:0], A[16:0]. Input parity should be maintained at the rising edge of the
clock and at the same time as command and address with CS_n LOW.
mand and/or address being entered and have multiple functions. For example, for activation
with ACT_n LOW, these are addresses like A16, A15, and A14, but for a non-activation command with ACT_n HIGH, these are command pins for READ, WRITE, and other commands defined in Command Truth Table.
SET_n is HIGH. RESET_n must be HIGH during normal operation.
Serial address inputs: Used to configure the temperature sensor/SPD EEPROM address range
on the I2C bus.
Serial clock for temperature sensor/SPD EEPROM: Used to synchronize communication to
and from the temperature sensor/SPD EEPROM on the I2C bus.
DQ[3:0], DQ[7:0], and DQ[15:0] for the x4, x8, and x16 configurations, respectively. If cyclic redundancy checksum (CRC) is enabled via the mode register, the CRC code is added at the end of
the data burst. Any one or all of DQ0, DQ1, DQ2, or DQ3 may be used for monitoring of internal V
level during test via mode register setting MR[4] A[4] = HIGH; training times change
REF
when enabled.
data is masked when DM_n is sampled LOW coincident with that input data during a write access. DM_n is sampled on both edges of DQS. DM is multiplexed with the DBI function by the
mode register A10, A11, and A12 settings in MR5. For a x8 device, the function of DM or TDQS
is enabled by the mode register A11 setting in MR1. DBI_n is an input/output identifying
whether to store/output the true or inverted data. If DBI_n is LOW, the data will be stored/
output after inversion inside the DDR4 device and not inverted if DBI_n is HIGH. TDQS is only
supported in x8 SDRAM configurations (TDQS is not valid for UDIMMs).
combo device.
tered-aligned with write data. For x16 configurations, DQSL corresponds to the data on
DQ[7:0], and DQSU corresponds to the data on DQ[15:8]. For the x4 and x8 configurations, DQS
corresponds to the data on DQ[3:0] and DQ[7:0], respectively. DDR4 SDRAM supports a differential data strobe only and does not support a single-ended data strobe.
flag as output signal. If a CRC error occurs, ALERT_n goes LOW for the period time interval and
returns HIGH. If an error occurs during a command address parity check, ALERT_n goes LOW until the on-going DRAM internal recovery transaction is complete. During connectivity test mode,
this pin functions as an input. Use of this signal is system-dependent. If not connected as signal,
ALERT_n pin must be connected to VDD on DIMMs.
perature thresholds have been exceeded. This pin has no function (NF) on modules without
temperature sensors.
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
NC–No connect: No internal electrical connection is present.
NF–No function: May have internal connection present, but has no function.
OutputTermination data strobe: When enabled via the mode register, the DRAM device enables the
same RTT termination resistance on TDQS_t and TDQS_c that is applied to DQS_t and DQS_c.
When the TDQS function is disabled via the mode register, the DM/TDQS_t pin provides the data mask (DM) function, and the TDQS_c pin is not used. The TDQS function must be disabled in
the mode register for both the x4 and x16 configurations. The DM function is supported only in
x8 and x16 configurations. DM, DBI, and TDQS are a shared pin and are enabled/disabled by
mode register settings. For more information about TDQS, see the DDR4 DRAM component data sheet (TDQS_t and TDQS_c are not valid for UDIMMs).
SupplyModule power supply: 1.2V (TYP).
SupplyDRAM activating power supply: 2.5V –0.125V / +0.250V.
SupplyReference voltage for control, command, and address pins.
SupplyGround.
SupplyPower supply for termination of address, command, and control VDD/2.
SupplyPower supply used to power the I2C bus for SPD.
Ranks) 288-Pin DDR4 RDIMM
Pin Descriptions
CCMTD-341111752-10423
ass72c8gx72psz.pdf - Rev. E 2/18 EN
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Micron Technology, Inc. reserves the right to change products or specifications without notice.