Micron MTA72ASS8G72PSZ – 64GB User Manual

Module height: 31.25mm (1.23in)
64GB (x72, ECC, 3DS 2H Stack, 2 Package Ranks x 2 Logic

DDR4 3DS SDRAM RDIMM

MTA72ASS8G72PSZ – 64GB
Ranks) 288-Pin DDR4 RDIMM

Features

Features
• DDR4 functionality and operations supported as defined in the component data sheet
• 288-pin, registered dual in-line memory module (RDIMM)
• Fast data transfer rates: PC4-3200, PC4-2933, or PC4-2666
• 64GB (8 Gig x 72)
• VDD = 1.20V (NOM)
• VPP = 2.5V (NOM)
• V
• Supports ECC error detection and correction
• Nominal and dynamic on-die termination (ODT) for data, strobe, and mask signals
• Low-power auto self refresh (LPASR)
• On-die V
• Two package ranks x two logic ranks
• On-board I2C temperature sensor with integrated serial presence-detect (SPD) EEPROM
• 16Gb, 3DS 2-high die stack x4 package, Master/Slave control logic. Each die with16 internal banks; 4 groups of 4 banks each
• Fixed burst chop (BC) of 4 and burst length (BL) of 8 via the mode register set (MRS)
• Selectable BC4 or BL8 on-the-fly (OTF)
• Gold edge contacts
• Halogen-free
• Fly-by topology
• Terminated control, command, and address bus
= 2.5V (NOM)
DDSPD
generation and calibration
REFDQ
Figure 1: 288-Pin RDIMM (MO-309, R/C-B2)
Options Marking
• Operating temperature – Commercial (0°C T
• Package – 288-pin DIMM (halogen-free) Z
• Frequency/CAS latency – 0.62ns @ CL = 26 (DDR4-3200) -3S2 – 0.682ns @ CL = 24 (DDR4-2933) -2S9 – 0.75ns @ CL = 22 (DDR4-2666) -2S6
95°C) None
OPER
Table 1: Key Timing Parameters
Speed Grade PC4-
-3S2 3200 3200 2666 2666 2400 2400 2133 2133 1866 1600 13.75 13.75 45.75
-2S9 2933 2933 2933 2666 2666 2400 2400 2133 2133 1866 1600 14.32 14.32 46.32
-2S6 2666 2666 2666 2400 2400 2133 2133 1866 1600 14.25 14.25 46.25
-2S3 2400 2400 2133 1866 1600 15 15 47
CCMTD-341111752-10423 ass72c8gx72psz.pdf - Rev. E 2/18 EN
Data Rate (MT/s)
CL =
t
28 –
26 25 24 24 22 22 20 20 18 16 14
1
Products and specifications discussed herein are subject to change by Micron without notice.
Micron Technology, Inc. reserves the right to change products or specifications without notice.
RCD
(ns)
© 2017 Micron Technology, Inc. All rights reserved.
t
RP
(ns)
t
RC
(ns)
64GB (x72, ECC, 3DS 2H Stack, 2 Package Ranks x 2 Logic
Ranks) 288-Pin DDR4 RDIMM
Table 2: Addressing
Parameter 64GB
Row address 128K A[16:0]
Column address 1K A[9:0]
Device bank group address 4 BG[1:0]
Device bank address per group 4 BA[1:0]
Device configuration 16Gb (128 Meg x 4 x 16 banks x2 ranks)
Logic rank address 1 C0
Package rank address 2 CS_n[1:0]
Table 3: Part Numbers and Timing Parameters – 64GB Modules
Base device: MT40A4G4,1 16Gb DDR4 2H 3DS M/S DRAM DDR4 SDRAM
Part Number
2
Density Configuration
MTA72ASS8G72PSZ-3S2__ 64GB 8 Gig x 72 25.6 GB/s 0.62ns/3200 MT/s 26-22-22
MTA72ASS8G72PSZ-2S9__ 64GB 8 Gig x 72 23.47 GB/s 0.682ns/2933 MT/s 24-21-21
MTA72ASS8G72PSZ-2S6__ 64GB 8 Gig x 72 21.3 GB/s 0.75ns/2666 MT/s 22-19-19
Module
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
Features
Notes:
1. The data sheet for the base device can be found at micron.com.
2. All part numbers end with a two-place code (not shown) that designates component and PCB revisions. Consult factory for current revision codes. Example: MTA72ASS8G72PSZ-3S2E1.
CCMTD-341111752-10423 ass72c8gx72psz.pdf - Rev. E 2/18 EN
2
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2017 Micron Technology, Inc. All rights reserved.
64GB (x72, ECC, 3DS 2H Stack, 2 Package Ranks x 2 Logic
Ranks) 288-Pin DDR4 RDIMM

Important Notes and Warnings

Important Notes and Warnings
Micron Technology, Inc. ("Micron") reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions. This document supersedes and replaces all information supplied prior to the publication hereof. You may not rely on any information set forth in this docu­ment if you obtain the product described herein from any unauthorized distributor or other source not authorized by Micron.
Automotive Applications. Products are not designed or intended for use in automotive applications unless specifi­cally designated by Micron as automotive-grade by their respective data sheets. Distributor and customer/distrib­utor shall assume the sole risk and liability for and shall indemnify and hold Micron harmless against all claims, costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of product liability, personal injury, death, or property damage resulting directly or indirectly from any use of non­automotive-grade products in automotive applications. Customer/distributor shall ensure that the terms and con­ditions of sale between customer/distributor and any customer of distributor/customer (1) state that Micron products are not designed or intended for use in automotive applications unless specifically designated by Micron as automotive-grade by their respective data sheets and (2) require such customer of distributor/customer to in­demnify and hold Micron harmless against all claims, costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of product liability, personal injury, death, or property damage resulting from any use of non-automotive-grade products in automotive applications.
Critical Applications. Products are not authorized for use in applications in which failure of the Micron compo­nent could result, directly or indirectly in death, personal injury, or severe property or environmental damage ("Critical Applications"). Customer must protect against death, personal injury, and severe property and environ­mental damage by incorporating safety design measures into customer's applications to ensure that failure of the Micron component will not result in such harms. Should customer or distributor purchase, use, or sell any Micron component for any critical application, customer and distributor shall indemnify and hold harmless Micron and its subsidiaries, subcontractors, and affiliates and the directors, officers, and employees of each against all claims, costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of product liability, personal injury, or death arising in any way out of such critical application, whether or not Mi­cron or its subsidiaries, subcontractors, or affiliates were negligent in the design, manufacture, or warning of the Micron product.
Customer Responsibility. Customers are responsible for the design, manufacture, and operation of their systems, applications, and products using Micron products. ALL SEMICONDUCTOR PRODUCTS HAVE INHERENT FAIL­URE RATES AND LIMITED USEFUL LIVES. IT IS THE CUSTOMER'S SOLE RESPONSIBILITY TO DETERMINE WHETHER THE MICRON PRODUCT IS SUITABLE AND FIT FOR THE CUSTOMER'S SYSTEM, APPLICATION, OR PRODUCT. Customers must ensure that adequate design, manufacturing, and operating safeguards are included in customer's applications and products to eliminate the risk that personal injury, death, or severe property or en­vironmental damages will result from failure of any semiconductor component.
Limited Warranty. In no event shall Micron be liable for any indirect, incidental, punitive, special or consequential damages (including without limitation lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort, warranty, breach of contract or other legal theory, unless explicitly stated in a written agreement executed by Micron's duly authorized representative.
CCMTD-341111752-10423 ass72c8gx72psz.pdf - Rev. E 2/18 EN
3
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2017 Micron Technology, Inc. All rights reserved.
64GB (x72, ECC, 3DS 2H Stack, 2 Package Ranks x 2 Logic
Ranks) 288-Pin DDR4 RDIMM

Pin Assignments

Pin Assignments
The pin assignment table below is a comprehensive list of all possible pin assignments for DDR4 RDIMM modules. See the Functional Block Diagram for pins specific to this module.
Table 4: Pin Assignments
288-Pin DDR4 RDIMM Front 288-Pin DDR4 RDIMM Back
Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol
1 NC 37 V
2 V
38 DQ24 74 CK0_t 110 DQS14_t/
SS
3 DQ4 39 V
4 V
SS
40 DQS12_t/
TDQS12_t
5 DQ0 41 DQS12_c/
TDQS12_c
6 V
7 DQS9_t/
42 V
SS
43 DQ30 79 A0 115 DQ42 151 V
TDQS9_t
8 DQS09_c/
44 V
TDQS9_c
9 V
45 DQ26 81 BA0 117 DQ52 153 DQS0_t 189 V
SS
73 V
SS
75 CK0_c 111 DQS14_c/
SS
76 V
77 V
78 EVENT_n 114 V
SS
80 V
SS
DD
DD
TT
DD
109 V
145 NC 181 DQ29 217 V
SS
146 V
TDQS14_t
147 V
TDQS14_c
112 V
148 DQ5 184 V
SS
113 DQ46 149 V
150 DQ1 186 DQS3_t 222 PARITY 258 DQ47
SS
116 V
152 DQS0_c 188 DQ31 224 BA1 260 DQ43
SS
REFCA
SS
SS
SS
253 DQ41
DD
182 V
218 CK1_t 254 V
SS
183 DQ25 219 CK1_c 255 DQS5_c
220 V
SS
185 DQS3_c 221 V
187 V
223 V
SS
225 A10/AP261 V
SS
DD
TT
DD
256 DQS5_t
257 V
259 V
SS
SS
SS
SS
10 DQ6 46 V
11 V
47 CB4 83 V
SS
12 DQ2 48 V
13 V
49 CB0 85 V
SS
14 DQ12 50 V
15 V
SS
51 DQS17_t/
SS
SS
SS
TDQS17_t
16 DQ8 52 DQS17_c/
TDQS17_c
17 V
18 DQS10_t/
53 V
SS
54 CB6 90 V
SS
TDQS10_t
19 DQS10_c/
55 V
SS
TDQS10_c
20 V
21 DQ14 57 V
22 V
23 DQ10 59 V
24 V
56 CB2 92 V
SS
SS
58 RESET_n 94 V
SS
DD
60 CKE0 96 V
SS
82 RAS_n/
118 V
A16
119 DQ48 155 DQ7 191 V
DD
84 CS0_n 120 V
121 DQS15_t/
DD
TDQS15_t
86 CAS_n/
A15
122 DQS15_c/
TDQS15_c
87 ODT0 123 V
88 V
124 DQ54 160 V
DD
89 CS1_n/NC125 V
126 DQ50 162 V
DD
91 ODT1/NC127 V
128 DQ60 164 DQS1_t 200 V
DD
93 CS2_n/C0129 V
130 DQ56 166 DQ15 202 V
SS
95 DQ36 131 V
132 DQS16_t/
SS
TDQS16_t
SS
SS
154 V
156 V
190 DQ27 226 V
SS
SS
192 CB5 228 WE_n/
SS
DD
227 NC 263 V
A14
157 DQ3 193 V
158 V
159 DQ13 195 V
SS
161 DQ9 197 DQS8_t 233 V
SS
163 DQS1_c 199 CB7 235 NC/C2271 DQ51
SS
165 V
SS
194 CB1 230 NC 266 DQS6_c
SS
196 DQS8_c 232 A13 268 V
SS
198 V
SS
201 CB3 237 CS3_n/
SS
229 V
SS
231 V
SS
234 A17 270 V
SS
236 V
SS
DD
DD
DD
DD
C1, NC
238 SA2 274 V
SS
167 V
SS
168 DQ11 204 V
203 CKE1/NC239 V
SS
DD
SS
240 DQ37 276 V
262 DQ53
SS
264 DQ49
265 V
SS
267 DQS6_t
SS
269 DQ55
SS
272 V
SS
273 DQ61
SS
275 DQ57
SS
CCMTD-341111752-10423 ass72c8gx72psz.pdf - Rev. E 2/18 EN
4
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2017 Micron Technology, Inc. All rights reserved.
64GB (x72, ECC, 3DS 2H Stack, 2 Package Ranks x 2 Logic
Ranks) 288-Pin DDR4 RDIMM
Pin Assignments
Table 4: Pin Assignments (Continued)
288-Pin DDR4 RDIMM Front 288-Pin DDR4 RDIMM Back
Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol
25 DQ20 61 V
26 V
62 ACT_n 98 V
SS
27 DQ16 63 BG0 99 DQS13_t/
28 V
29 DQS11_t/
64 V
SS
65 A12/BC_n 101 V
TDQS11_t
30 DQS11_c/
66 A9 102 DQ38 138 V
TDQS11_c
31 V
67 V
SS
32 DQ22 68 A8 104 DQ34 140 SA1 176 V
33 V
69 A6 105 V
SS
34 DQ18 70 V
35 V
71 A3 107 V
SS
36 DQ28 72 A1 108 DQ40 144 NC 180 V
97 DQ32 133 DQS16_c/
DD
SS
TDQ13_t
100 DQS13_c/
DD
TDQS13_c
SS
103 V
DD
106 DQ44 142 V
DD
SS
SS
SS
169 V
205 NC 241 V
SS
SS
277 DQS7_c
TDQS16_c
134 V
135 DQ62 171 V
136 V
137 DQ58 173 V
170 DQ21 206 V
SS
207 BG1 243 V
SS
172 DQ17 208 ALERT_n 244 DQS4_c 280 DQ63
SS
209 V
SS
174 DQS2_c 210 A11 246 V
SS
242 DQ33 278 DQS7_t
DD
SS
245 DQS4_t 281 V
DD
SS
279 V
282 DQ59
139 SA0 175 DQS2_t 211 A7 247 DQ39 283 V
SS
212 V
DD
248 V
284 V
SS
DDSPD
141 SCL 177 DQ23 213 A5 249 DQ35 285 SDA
143 V
178 V
PP
179 DQ19 215 V
PP
214 A4 250 V
SS
DD
216 A2 252 V
SS
286 V
SS
251 DQ45 287 V
288 V
SS
PP
PP
PP
SS
SS
SS
CCMTD-341111752-10423 ass72c8gx72psz.pdf - Rev. E 2/18 EN
5
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2017 Micron Technology, Inc. All rights reserved.
64GB (x72, ECC, 3DS 2H Stack, 2 Package Ranks x 2 Logic
Ranks) 288-Pin DDR4 RDIMM

Pin Descriptions

Pin Descriptions
The pin description table below is a comprehensive list of all possible pins for DDR4 modules. All pins listed may not be supported on this module. See Functional Block Di­agram for pins specific to this module.
Table 5: Pin Descriptions
Symbol Type Description
Ax Input Address inputs: Provide the row address for ACTIVATE commands and the column address for
A10/AP Input Auto precharge: A10 is sampled during READ and WRITE commands to determine whether an
A12/BC_n Input Burst chop: A12/BC_n is sampled during READ and WRITE commands to determine if burst
ACT_n Input Command input: ACT_n defines the ACTIVATE command being entered along with CS_n. The
BAx Input Bank address inputs: Define the bank (with a bank group) to which an ACTIVATE, READ,
BGx Input Bank group address inputs: Define the bank group to which a REFRESH, ACTIVATE, READ,
C0, C1, C2
(RDIMM/LRDIMM on-
ly)
CKx_t CKx_c
CKEx Input Clock enable: CKE HIGH activates and CKE LOW deactivates the internal clock signals, device
CSx_n Input Chip select: All commands are masked when CS_n is registered HIGH. CS_n provides external
Input Chip ID: These inputs are used only when devices are stacked; that is, 2H, 4H, and 8H stacks for
Input Clock: Differential clock inputs. All address, command, and control input signals are sampled
READ/WRITE commands in order to select one location out of the memory array in the respec­tive bank (A10/AP, A12/BC_n, WE_n/A14, CAS_n/A15, and RAS_n/A16 have additional functions; see individual entries in this table). The address inputs also provide the op-code during the MODE REGISTER SET command. A17 is only defined for x4 SDRAM.
auto precharge should be performed on the accessed bank after a READ or WRITE operation (HIGH = auto precharge; LOW = no auto precharge). A10 is sampled during a PRECHARGE com­mand to determine whether the precharge applies to one bank (A10 LOW) or all banks (A10 HIGH). If only one bank is to be precharged, the bank is selected by the bank group and bank addresses.
chop (on-the-fly) will be performed (HIGH = no burst chop; LOW = burst chopped). See Com­mand Truth Table in the DDR4 component data sheet.
input into RAS_n/A16, CAS_n/A15, and WE_n/A14 are considered as row address A16, A15, and A14. See Command Truth Table.
WRITE, or PRECHARGE command is being applied. Also determine which mode register is to be accessed during a MODE REGISTER SET command.
WRITE, or PRECHARGE command is being applied. Also determine which mode register is to be accessed during a MODE REGISTER SET command. BG[1:0] are used in the x4 and x8 configura­tions. x16-based SDRAM only has BG0.
x4 and x8 configurations using through-silicon vias (TSVs). These pins are not used in the x16 configuration. Some DDR4 modules support a traditional DDP package, which uses CS1_n, CKE1, and ODT1 to control the second die. All other stack configurations, such as a 4H or 8H, are assumed to be single-load (master/slave) type configurations where C0, C1, and C2 are used as chip ID selects in conjunction with a single CS_n, CKE, and ODT. Chip ID is considered part of the command code.
on the crossing of the positive edge of CK_t and the negative edge of CK_c.
input buffers, and output drivers. Taking CKE LOW provides PRECHARGE POWER-DOWN and SELF REFRESH operations (all banks idle), or active power-down (row active in any bank). CKE is asynchronous for self refresh exit. After V tialization sequence, it must be maintained during all operations (including SELF REFRESH). CKE must be maintained HIGH throughout read and write accesses. Input buffers (excluding CK_t, CK_c, ODT, RESET_n, and CKE) are disabled during power-down. Input buffers (excluding CKE and RESET_n) are disabled during self refresh.
rank selection on systems with multiple ranks. CS_n is considered part of the command code (CS2_n and CS3_n are not used on UDIMMs).
has become stable during the power-on and ini-
REFCA
CCMTD-341111752-10423 ass72c8gx72psz.pdf - Rev. E 2/18 EN
6
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2017 Micron Technology, Inc. All rights reserved.
64GB (x72, ECC, 3DS 2H Stack, 2 Package Ranks x 2 Logic
Ranks) 288-Pin DDR4 RDIMM
Pin Descriptions
Table 5: Pin Descriptions (Continued)
Symbol Type Description
ODTx Input On-die termination: ODT (registered HIGH) enables termination resistance internal to the
PARITY Input Parity for command and address: This function can be enabled or disabled via the mode
RAS_n/A16 CAS_n/A15
WE_n/A14
RESET_n CMOS Input Active LOW asynchronous reset: Reset is active when RESET_n is LOW and inactive when RE-
SAx Input
SCL Input
DQx, CBx I/O Data input/output and check bit input/output: Bidirectional data bus. DQ represents
DM_n/DBI_n/
TDQS_t (DMU_n,
DBIU_n), (DML_n/
DBIl_n)
SDA I/O Serial Data: Bidirectional signal used to transfer data in or out of the EEPROM or EEPROM/TS
DQS_t
DQS_c DQSU_t DQSU_c
DQSL_t DQSL_c
ALERT_n Output Alert output: Possesses functions such as CRC error flag and command and address parity error
EVENT_n Output Temperature event: The EVENT_n pin is asserted by the temperature sensor when critical tem-
Input Command inputs: RAS_n/A16, CAS_n/A15, and WE_n/A14 (along with CS_n) define the com-
I/O Input data mask and data bus inversion: DM_n is an input mask signal for write data. Input
I/O Data strobe: Output with read data, input with write data. Edge-aligned with read data, cen-
DDR4 SDRAM. When enabled, ODT (RTT) is applied only to each DQ, DQS_t, DQS_c, DM_n/ DBI_n/TDQS_t, and TDQS_c signal for x4 and x8 configurations (when the TDQS function is ena­bled via the mode register). For the x16 configuration, RTT is applied to each DQ, DQSU_t, DQSU_c, DQSL_t, DQSL_c, UDM_n, and LDM_n signal. The ODT pin will be ignored if the mode registers are programmed to disable RTT.
register. When enabled in MR5, the DRAM calculates parity with ACT_n, RAS_n/A16, CAS_n/A15, WE_n/A14, BG[1:0], BA[1:0], A[16:0]. Input parity should be maintained at the rising edge of the clock and at the same time as command and address with CS_n LOW.
mand and/or address being entered and have multiple functions. For example, for activation with ACT_n LOW, these are addresses like A16, A15, and A14, but for a non-activation com­mand with ACT_n HIGH, these are command pins for READ, WRITE, and other commands de­fined in Command Truth Table.
SET_n is HIGH. RESET_n must be HIGH during normal operation.
Serial address inputs: Used to configure the temperature sensor/SPD EEPROM address range on the I2C bus.
Serial clock for temperature sensor/SPD EEPROM: Used to synchronize communication to and from the temperature sensor/SPD EEPROM on the I2C bus.
DQ[3:0], DQ[7:0], and DQ[15:0] for the x4, x8, and x16 configurations, respectively. If cyclic re­dundancy checksum (CRC) is enabled via the mode register, the CRC code is added at the end of the data burst. Any one or all of DQ0, DQ1, DQ2, or DQ3 may be used for monitoring of inter­nal V
level during test via mode register setting MR[4] A[4] = HIGH; training times change
REF
when enabled.
data is masked when DM_n is sampled LOW coincident with that input data during a write ac­cess. DM_n is sampled on both edges of DQS. DM is multiplexed with the DBI function by the mode register A10, A11, and A12 settings in MR5. For a x8 device, the function of DM or TDQS is enabled by the mode register A11 setting in MR1. DBI_n is an input/output identifying whether to store/output the true or inverted data. If DBI_n is LOW, the data will be stored/ output after inversion inside the DDR4 device and not inverted if DBI_n is HIGH. TDQS is only supported in x8 SDRAM configurations (TDQS is not valid for UDIMMs).
combo device.
tered-aligned with write data. For x16 configurations, DQSL corresponds to the data on DQ[7:0], and DQSU corresponds to the data on DQ[15:8]. For the x4 and x8 configurations, DQS corresponds to the data on DQ[3:0] and DQ[7:0], respectively. DDR4 SDRAM supports a differen­tial data strobe only and does not support a single-ended data strobe.
flag as output signal. If a CRC error occurs, ALERT_n goes LOW for the period time interval and returns HIGH. If an error occurs during a command address parity check, ALERT_n goes LOW un­til the on-going DRAM internal recovery transaction is complete. During connectivity test mode, this pin functions as an input. Use of this signal is system-dependent. If not connected as signal, ALERT_n pin must be connected to VDD on DIMMs.
perature thresholds have been exceeded. This pin has no function (NF) on modules without temperature sensors.
CCMTD-341111752-10423 ass72c8gx72psz.pdf - Rev. E 2/18 EN
7
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2017 Micron Technology, Inc. All rights reserved.
64GB (x72, ECC, 3DS 2H Stack, 2 Package Ranks x 2 Logic
Table 5: Pin Descriptions (Continued)
Symbol Type Description
TDQS_t
TDQS_c
(x8 DRAM-based
RDIMM only)
V
DD
V
PP
V
REFCA
V
SS
V
TT
V
DDSPD
RFU Reserved for future use.
NC No connect: No internal electrical connection is present.
NF No function: May have internal connection present, but has no function.
Output Termination data strobe: When enabled via the mode register, the DRAM device enables the
same RTT termination resistance on TDQS_t and TDQS_c that is applied to DQS_t and DQS_c. When the TDQS function is disabled via the mode register, the DM/TDQS_t pin provides the da­ta mask (DM) function, and the TDQS_c pin is not used. The TDQS function must be disabled in the mode register for both the x4 and x16 configurations. The DM function is supported only in x8 and x16 configurations. DM, DBI, and TDQS are a shared pin and are enabled/disabled by mode register settings. For more information about TDQS, see the DDR4 DRAM component da­ta sheet (TDQS_t and TDQS_c are not valid for UDIMMs).
Supply Module power supply: 1.2V (TYP).
Supply DRAM activating power supply: 2.5V –0.125V / +0.250V.
Supply Reference voltage for control, command, and address pins.
Supply Ground.
Supply Power supply for termination of address, command, and control VDD/2.
Supply Power supply used to power the I2C bus for SPD.
Ranks) 288-Pin DDR4 RDIMM
Pin Descriptions
CCMTD-341111752-10423 ass72c8gx72psz.pdf - Rev. E 2/18 EN
8
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2017 Micron Technology, Inc. All rights reserved.
Loading...
+ 18 hidden pages