– 32GB (4 Gig x 72) DDR4 RDIMM
– 64GB SLC Flash
– DDR4 functionality and operations supported as
defined in the component data sheet
– JEDEC-compliant DDR4 288-pin dual in-line
memory module connector
– Fast data transfer rate: PC4-2933
– VDD = 1.20V (typical)
– VPP = 2.5V (typical)
– V
– Supports ECC error detection and correction
– Nominal and dynamic on-die termination (ODT)
for data, strobe, and mask signals
– Low-power auto self refresh (LPASR)
– On-die V
– Dual-rank, comprised of TwinDie, x4 DRAM
components
– On-board I2C temperature sensor with integrated
serial presence-detect (SPD) EEPROM
– 16 internal banks; 4 groups of 4 banks each
– Fixed burst chop (BC) of 4 and burst length (BL)
of 8 via the mode register set (MRS)
– Selectable BC4 or BL8 on-the-fly (OTF)
– Gold edge contacts
– Halogen-free
– Fly-by topology
– Terminated control, command, and address bus
DDSPD
= 2.2–2.8V
generation and calibration
REFDQ
• Battery-free power source (ultra capacitor based
PowerGEM)
– Powers the Micron NVDIMM when the host sys-
tem loses power
– 5-year operating life
– No catastrophic failure modes
– RoHS-, REACH-, and UL-compliant
• Nonvolatile memory (NVM) system-level features
– In-system health monitoring of PowerGEM and
NAND Flash
– Automatic history tracking: tracks critical inter-
nal system parameters
– Interlocked control sequence for safe and reliable
1. Down-bin timing, refer to component data sheet Speed Bin Tables for details.
Table 2: Addressing
Parameter32GB
Row address128K A[16:0]
Column address1K A[9:0]
Device bank group address4 BG[1:0]
Device bank address per group4 BA[1:0]
Device configuration16Gb TwinDie (4 Gig x 4), 16 banks
Module rank address2 CS_n [1:0]
Table 3: Part Numbers and Timing Parameters – 32GB Modules
Base device: MT40A4G4,1 16Gb TwinDie DDR4 SDRAM
Module
Part Number
DensityConfiguration
MTA36ASS4G72PF1Z-2G9__32GB4 Gig x 7223.47 GB/s0.68ns/2933 MT/s21-21-21
Notes:
1. The data sheet for the base device can be found on micron.com.
2. All NVDIMM part numbers end with a five-character code (not shown) that designates die revision, PCB revision and controller type. Consult factory for current revision/controller codes. Example:
MTA36ASS4G72PF1Z-2G9PR1AB.
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-nRCD-nRP)
CCM005-341111752-10458
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2
Micron Technology, Inc. reserves the right to change products or specifications without notice.
Micron Technology, Inc. ("Micron") reserves the right to make changes to information published in this document,
including without limitation specifications and product descriptions. This document supersedes and replaces all
information supplied prior to the publication hereof. You may not rely on any information set forth in this document if you obtain the product described herein from any unauthorized distributor or other source not authorized
by Micron.
Automotive Applications. Products are not designed or intended for use in automotive applications unless specifically designated by Micron as automotive-grade by their respective data sheets. Distributor and customer/distributor shall assume the sole risk and liability for and shall indemnify and hold Micron harmless against all claims,
costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of
product liability, personal injury, death, or property damage resulting directly or indirectly from any use of nonautomotive-grade products in automotive applications. Customer/distributor shall ensure that the terms and conditions of sale between customer/distributor and any customer of distributor/customer (1) state that Micron
products are not designed or intended for use in automotive applications unless specifically designated by Micron
as automotive-grade by their respective data sheets and (2) require such customer of distributor/customer to indemnify and hold Micron harmless against all claims, costs, damages, and expenses and reasonable attorneys'
fees arising out of, directly or indirectly, any claim of product liability, personal injury, death, or property damage
resulting from any use of non-automotive-grade products in automotive applications.
Critical Applications. Products are not authorized for use in applications in which failure of the Micron component could result, directly or indirectly in death, personal injury, or severe property or environmental damage
("Critical Applications"). Customer must protect against death, personal injury, and severe property and environmental damage by incorporating safety design measures into customer's applications to ensure that failure of the
Micron component will not result in such harms. Should customer or distributor purchase, use, or sell any Micron
component for any critical application, customer and distributor shall indemnify and hold harmless Micron and
its subsidiaries, subcontractors, and affiliates and the directors, officers, and employees of each against all claims,
costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of
product liability, personal injury, or death arising in any way out of such critical application, whether or not Micron or its subsidiaries, subcontractors, or affiliates were negligent in the design, manufacture, or warning of the
Micron product.
Customer Responsibility. Customers are responsible for the design, manufacture, and operation of their systems,
applications, and products using Micron products. ALL SEMICONDUCTOR PRODUCTS HAVE INHERENT FAILURE RATES AND LIMITED USEFUL LIVES. IT IS THE CUSTOMER'S SOLE RESPONSIBILITY TO DETERMINE
WHETHER THE MICRON PRODUCT IS SUITABLE AND FIT FOR THE CUSTOMER'S SYSTEM, APPLICATION, OR
PRODUCT. Customers must ensure that adequate design, manufacturing, and operating safeguards are included
in customer's applications and products to eliminate the risk that personal injury, death, or severe property or environmental damages will result from failure of any semiconductor component.
Limited Warranty. In no event shall Micron be liable for any indirect, incidental, punitive, special or consequential
damages (including without limitation lost profits, lost savings, business interruption, costs related to the removal
or replacement of any products or rework charges) whether or not such damages are based on tort, warranty,
breach of contract or other legal theory, unless explicitly stated in a written agreement executed by Micron's duly
authorized representative.
CCM005-341111752-10458
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
This Micron NVDIMM is available as a 288-pin DDR4 RDIMM with a 72-bit-wide data
bus in a dual-rank x4 configuration, using 16Gb TwinDie DRAM components for 32GB
DRAM density.
Figure 2: Micron DDR4 NVDIMM System Block Diagram
NVDIMM System Block Diagram
A persistent energy source ensures continuity of power to the Micron NVDIMM after
the system power supply is interrupted. This enables the NVDIMM to save the contents
of the DDR4 SDRAM to the nonvolatile NAND Flash memory and shut down independently from the system's power supply.
The persistent energy source can be provided to the NVDIMM in one of two ways:
•
Option 1 – PowerGEM (green energy module): Designed by Agiga Tech,® this ultraca-
pacitor-based energy source is connected to the Micron NVDIMM via a proprietary
cable and connection, providing backup power as well as health monitoring features.
The ultracaps are charged through the 12V power pin on the DDR4 connector. Please
refer to the Ultracapacitor Power Module data sheet available from micron.com for
further information.
•
Option 2 – Backup Energy Source: Consists of a rechargeable energy source provided
by the system. After power interruption, the persistent 12V power pin on the JEDECcompliant DDR4 DIMM connector supplies the power needed to backup the data
from the DDR4 SDRAM to the NAND Flash. Implementation of this option requires
further system design. Without implementation of the PowerGEM, health monitoring
and power management become dependent on the system design.
Host Coordination Using Micron NVDIMM Control Signal
To prevent SDRAM data corruption due to a sudden power failure, the host must take
steps to ensure the SDRAM is placed in a safe state as soon as a power failure has been
detected.
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
Host Coordination Using Micron NVDIMM Control Signal
The Micron NVDIMM will be able to provide proper coordination if the host meets the
following requirements:
• The host must have early warning that power is failing, allowing it to perform an orderly shutdown. Typically, this is achieved by the system monitoring the system power supply and providing a signal that indicates power is failing.
• The host must put the DDR4 SDRAM into self refresh before handing it off to the Micron NVDIMM subsystem. After this state is entered, the clock enable (CKE0) signal is
LOW and all SDRAM control signals except CKE0 and RESET_n are "Don't Care." The
SDRAM refreshes itself in this mode, preserving its contents as the host triggers the
NVDIMM to take control of the SDRAM, and the SDRAM contents are backed up to
the Flash memory.
• When the host regains control of the DDR4 SDRAM from the Micron NVDIMM controller (for example, after performing a RESTORE operation), the host must remove
the DDR4 SDRAM from self refresh. The host should take care not to assert the RESET_n signal after a RESTORE operation completes, as the RESET_n signal resets the
internal SDRAM state machine and restored data can be potentially lost.
For more detailed information regarding host coordination with the Micron NVDIMM
controller, refer to the Micron NVDIMM firmware specification.
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
The pin assignment table below is a comprehensive list of all possible pin assignments
for DDR4 RDIMM modules. See the Functional Block Diagram for pins specific to this
module.
Table 4: Pin Assignments
288-Pin DDR4 NVDIMM Front288-Pin DDR4 NVDIMM Back
Pin Symbol Pin Symbol Pin Symbol Pin SymbolPin Symbol Pin Symbol Pin Symbol Pin Symbol
112V37V
2V
38DQ2474CK0_t110 DQS14_t/
SS
3DQ439V
4V
SS
40 DQS12_t/
TDQS12_t
5DQ041 DQS12_c/
TDQS12_c
6V
7DQS9_t/
42V
SS
43DQ3079A0115DQ42151V
TDQS9_t
8DQS09_c/
44V
TDQS9_c
9V
45DQ2681BA0117DQ52153DQS0_t189V
SS
73V
SS
75CK0_c111 DQS14_c/
SS
76V
77V
78EVENT_n 114V
SS
80V
SS
DD
DD
TT
DD
109V
14512V181DQ29217V
SS
146V
TDQS14_t
147V
TDQS14_c
112V
148DQ5184V
SS
113DQ46149V
150DQ1186DQS3_t222PARITY258DQ47
SS
116V
152DQS0_c188DQ31224BA1260DQ43
SS
REFCA
SS
SS
SS
253DQ41
DD
182V
218CK1_t254V
SS
183DQ25219CK1_c255DQS5_c
220V
SS
185DQS3_c221V
187V
223V
SS
225A10/AP261V
SS
DD
TT
DD
256DQS5_t
257V
259V
SS
SS
SS
SS
10DQ646V
11V
47CB483V
SS
12DQ248V
13V
49CB085V
SS
14DQ1250V
15V
SS
51 DQS17_t/
SS
SS
SS
TDQS17_t
16DQ852 DQS17_c/
TDQS17_c
17V
18 DQS10_t/
53V
SS
54CB690V
SS
TDQS10_t
19 DQS10_c/
55V
SS
TDQS10_c
20V
21DQ1457V
22V
23DQ1059V
24V
56CB292V
SS
SS
58RESET_n94V
SS
DD
60CKE096V
SS
82RAS_n/
118V
A16
119DQ48155DQ7191V
DD
84CS0_n120V
121 DQS15_t/
DD
TDQS15_t
86CAS_n/
A15
122 DQS15_c/
TDQS15_c
87ODT0123V
88V
124DQ54160V
DD
89CS1_n/NC125V
126DQ50162V
DD
91ODT1/NC127V
128DQ60164DQS1_t200V
DD
93CS2_n/C0129V
130DQ56166DQ15202V
SS
95DQ36131V
132 DQS16_t/
SS
TDQS16_t
SS
SS
154V
156V
190DQ27226V
SS
SS
192CB5228WE_n/
SS
DD
227NC263V
A14
157DQ3193V
158V
159DQ13195V
SS
161DQ9197DQS8_t233V
SS
163DQS1_c199CB7235NC/C2271DQ51
SS
165V
SS
194CB1230SAVE_n266DQS6_c
SS
196DQS8_c232A13268V
SS
198V
SS
201CB3237CS3_n/
SS
229V
SS
231V
SS
234A17270V
SS
236V
SS
DD
DD
DD
DD
C1, NC
238SA2274V
SS
167V
SS
168DQ11204V
203CKE1/NC239V
SS
DD
SS
240DQ37276V
262DQ53
SS
264DQ49
265V
SS
267DQS6_t
SS
269DQ55
SS
272V
SS
273DQ61
SS
275DQ57
SS
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
Pin Symbol Pin Symbol Pin Symbol Pin SymbolPin Symbol Pin Symbol Pin Symbol Pin Symbol
25DQ2061V
26V
62ACT_n98V
SS
27DQ1663BG099DQS13_t/
28V
29 DQS11_t/
64V
SS
65 A12/BC_n 101V
TDQS11_t
30 DQS11_c/
66A9102DQ38138V
TDQS11_c
31V
67V
SS
32DQ2268A8104DQ34140SA1176V
33V
69A6105V
SS
34DQ1870V
35V
71A3107V
SS
36DQ2872A1108DQ40144NC180V
97DQ32133 DQS16_c/
DD
SS
TDQ13_t
100 DQS13_c/
DD
TDQS13_c
SS
103V
DD
106DQ44142V
DD
SS
SS
SS
169V
205NC241V
SS
SS
277DQS7_c
TDQS16_c
134V
135DQ62171V
136V
137DQ58173V
170DQ21206V
SS
207BG1243V
SS
172DQ17208 ALERT_n 244DQS4_c280DQ63
SS
209V
SS
174DQS2_c210A11246V
SS
242DQ33278DQS7_t
DD
SS
245DQS4_t281V
DD
SS
279V
282DQ59
139SA0175DQS2_t211A7247DQ39283V
SS
212V
DD
248V
284V
SS
DDSPD
141SCL177DQ23213A5249DQ35285SDA
143V
178V
PP
179DQ19215V
PP
214A4250V
SS
DD
216A2252V
SS
286V
SS
251DQ45287V
288V
SS
SS
SS
SS
PP
PP
PP
Pin Descriptions
The pin description table below is a comprehensive list of all possible pins for DDR4
UDIMM, RDIMM, SODIMM, and LRDIMM modules. All pins listed may not be supported on the module defined in this data sheet. See functional block diagram specific to
this module to review all pins utilized on this module.
Table 5: Pin Descriptions
SymbolTypeDescription
AxInputAddress inputs: Provide the row address for ACTIVATE commands and the column
address for READ/WRITE commands to select one location out of the memory array in
the respective bank. (A10/AP, A12/BC_n, WE_n/A14, CAS_n/A15, and RAS_n/A16 have
additional functions; see individual entries in this table). The address inputs also provide the op-code during the MODE REGISTER SET command. A17 is only defined for
x4 SDRAM configuration.
A10/APInputAuto precharge: A10 is sampled during READ and WRITE commands to determine
whether auto precharge should be performed to the accessed bank after a READ or
WRITE operation (HIGH = Auto precharge; LOW = No auto precharge). A10 is sampled
during a PRECHARGE command to determine whether the PRECHARGE applies to one
bank (A10 LOW) or all banks (A10 HIGH). If only one bank is to be precharged, the
bank is selected by the bank group and bank addresses.
A12/BC_nInputBurst chop: A12/BC_n is sampled during READ and WRITE commands to determine if
burst chop (on-the-fly) will be performed. (HIGH = No burst chop; LOW = Burst-chopped). See the Command Truth Table in DDR4 component data sheet for more information.
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
ACT_nInputCommand input: ACT_n defines the activation command being entered along with
CS_n. The input into RAS_n/A16, CAS_n/A15, and WE_n/A14 will be considered as row
address A16, A15, and A14. See the Command Truth Table in DDR4 component data
sheet for more information.
BAxInputBank address inputs: Define to which bank an ACTIVATE, READ, WRITE, or PRE-
CHARGE command is being applied. Also determines which mode register is to be accessed during a MODE REGISTER SET command.
BGxInputBank group address inputs: Define to which bank group a REFRESH, ACTIVATE,
READ, WRITE, or PRECHARGE command is being applied. Also determines which
mode register is to be accessed during a MODE REGISTER SET command. BG[1:0] are
used in the x4 and x8 configurations. x16-based SDRAMs only have BG0.
C0, C1, C2
(RDIMM/LRDIMM
only)
CKx_t
CKx_c
CKExInputClock enable: CKE HIGH activates, and CKE LOW deactivates, the internal clock sig-
CSx_nInputChip select: All commands are masked when CS_n is registered HIGH. CS_n provides
PARITYInputParity for command and address: This function can be enabled or disabled via the
InputChip ID: These inputs are used only when devices are stacked, that is, 2H, 4H, and 8H
stacks for x4 and x8 configurations using though-silicon vias (TSVs). These pins are not
used in the x16 configuration. Some DDR4 modules support a traditional DDP package, which use CS1_n, CKE1, and ODT1 to control the second die. For all other stack
configurations, such as a 4H or 8H, it is assumed to be a single-load (master/slave)type configuration where C0, C1, and C2 are used as chip ID selects in conjunction
with a single CS_n, CKE, and ODT. Chip ID is considered part of the command code.
InputClock: Differential clock inputs. All address, command, and control input signals are
sampled on the crossing of the positive edge of CK_t and the negative edge of CK_c.
nals, device input buffers, and output drivers. Taking CKE LOW provides PRECHARGE
POWER-DOWN and SELF REFRESH operations (all banks idle), or active power-down
(row active in any bank). CKE is asynchronous for self refresh exit. After V
come stable during the power-on and initialization sequence, it must be maintained
during all operations (including SELF REFRESH). CKE must be held HIGH throughout
read and write accesses. Input buffers (excluding CK_t, CK_c, ODT, RESET_n, and CKE)
are disabled during power-down. Input buffers (excluding CKE and RESET_n) are disabled during self refresh.
external rank selection on systems with multiple ranks. CS_n is considered part of the
command code. CS2_n and CS3_n are not used on UDIMMs.
to the DDR4 SDRAM. When ODT is enabled, on-die termination (RTT) is applied only to
each DQ, DQS_t, DQS_c, DM_n/DBI_n/TDQS_t, and TDQS_c signal for x4 and x8 configurations (when the TDQS function is enabled via the mode register). For the x16 configuration, RTT is applied to each DQ, DQSU_t, DQSU_c, DQSL_t, DQSL_c, UDM_n, and
LDM_n signal. The ODT pin will be ignored if the mode registers are programmed to
disable RTT.
mode register. When enabled in MR5, then DRAM calculates Parity with ACT_n,
RAS_n/A16, CAS_n/A15, WE_n/A14, BG[1:0], BA[1:0], A[16:0]. Input parity should be
maintained at the rising edge of the clock and at the same time with command and
address with CS_n LOW.
REFCA
has be-
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Micron Technology, Inc. reserves the right to change products or specifications without notice.