Table 3: Part Numbers and Timing Parameters – 16GB Modules
Base device: MT40A1G8,1 8Gb DDR4 SDRAM
Part Number
2
DensityConfiguration
MTA18ASF2G72PDZ-2G6__16GB2 Gig x 7221.3 GB/s0.75ns/2666 MT/s19-19-19
MTA18ASF2G72PDZ-2G3__16GB2 Gig x 7219.2 GB/s0.83ns/2400 MT/s17-17-17
Module
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
Features
Notes:
1. The data sheet for the base device can be found on micron.com.
2. All part numbers end with a two-place code (not shown) that designates component and PCB revisions.
Consult factory for current revision codes. Example: MTA18ASF2G72PDZ-2G6B1.
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The pin assignment table below is a comprehensive list of all possible pin assignments
for DDR4 RDIMM modules. See the Functional Block Diagram for pins specific to this
module.
Table 4: Pin Assignments
288-Pin DDR4 RDIMM Front288-Pin DDR4 RDIMM Back
Pin SymbolPin Symbol Pin SymbolPin SymbolPin Symbol Pin SymbolPin Symbol PinSymbol
1NC37V
2V
38DQ2474CK0_t110 DQS14_t/
SS
3DQ439V
4V
SS
40DQS12_t/
TDQS12_t
5DQ041DQS12_c/
TDQS12_c
6V
7DQS9_t/
42V
SS
43DQ3079A0115DQ42151V
TDQS9_t
8DQS09_c/
44V
TDQS9_c
9V
45DQ2681BA0117DQ52153DQS0_t189V
SS
73V
SS
75CK0_c111 DQS14_c/
SS
76V
77V
78EVENT_n 114V
SS
80V
SS
DD
DD
TT
DD
109V
145NC181DQ29217V
SS
146V
TDQS14_t
147V
TDQS14_c
112V
148DQ5184V
SS
113DQ46149V
150DQ1186DQS3_t222PARITY258DQ47
SS
116V
152DQS0_c188DQ31224BA1260DQ43
SS
REFCA
SS
SS
SS
253DQ41
DD
182V
218CK1_t254V
SS
SS
183DQ25219CK1_c255DQS5_c
220V
SS
185DQS3_c221V
187V
223V
SS
225A10/AP261V
SS
DD
TT
DD
256DQS5_t
257V
259V
SS
SS
SS
10DQ646V
11V
47CB483V
SS
12DQ248V
13V
49CB085V
SS
14DQ1250V
15V
SS
51DQS17_t/
SS
SS
SS
TDQS17_t
16DQ852DQS17_c/
TDQS17_c
17V
18DQS10_t/
53V
SS
54CB690V
SS
TDQS10_t
19 DQS10_c/
55V
SS
TDQS10_c
20V
21DQ1457V
22V
23DQ1059V
24V
56CB292V
SS
SS
58RESET_n94V
SS
DD
60CKE096V
SS
82RAS_n/
118V
A16
119DQ48155DQ7191V
DD
84CS0_n120V
121 DQS15_t/
DD
TDQS15_t
86CAS_n/
A15
122 DQS15_c/
TDQS15_c
87ODT0123V
88V
124DQ54160V
DD
89CS1_n/NC125V
126DQ50162V
DD
91ODT1/NC127V
128DQ60164DQS1_t200V
DD
93CS2_n/C0129V
130DQ56166DQ15202V
SS
95DQ36131V
132 DQS16_t/
SS
TDQS16_t
SS
SS
154V
156V
190DQ27226V
SS
SS
192CB5228WE_n/
SS
DD
227NC263V
A14
157DQ3193V
158V
159DQ13195V
SS
161DQ9197DQS8_t233V
SS
163DQS1_c199CB7235NC/C2271DQ51
SS
165V
SS
194CB1230NC266DQS6_c
SS
196DQS8_c232A13268V
SS
198V
SS
201CB3237CS3_n/
SS
229V
SS
231V
SS
234A17270V
SS
236V
SS
DD
DD
DD
DD
C1, NC
238SA2274V
SS
167V
SS
168DQ11204V
203CKE1/NC239V
SS
DD
SS
240DQ37276V
262DQ53
SS
264DQ49
265V
SS
267DQS6_t
SS
269DQ55
SS
272V
SS
273DQ61
SS
275DQ57
SS
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Note:
16GB (x72, ECC, DR) 288-Pin DDR4 RDIMM
Functional Block Diagram
1. The ZQ ball on each DDR4 component is connected to an external 240Ω ±1% resistor
that is tied to ground. It is used for the calibration of the component’s ODT and output
driver.
7
Micron Technology, Inc. reserves the right to change products or specifications without notice.
High-speed DDR4 SDRAM modules use DDR4 SDRAM devices with two or four internal
memory bank groups. DDR4 SDRAM modules utilizing 4- and 8-bit-wide DDR4 SDRAM
devices have four internal bank groups consisting of four memory banks each, providing a total of 16 banks. 16-bit-wide DDR4 SDRAM devices have two internal bank
groups consisting of four memory banks each, providing a total of eight banks. DDR4
SDRAM modules benefit from DDR4 SDRAM's use of an 8n-prefetch architecture with
an interface designed to transfer two data words per clock cycle at the I/O pins. A single
READ or WRITE operation for the DDR4 SDRAM effectively consists of a single 8n-bitwide, four-clock data transfer at the internal DRAM core and eight corresponding n-bitwide, one-half-clock-cycle data transfers at the I/O pins.
DDR4 modules use two sets of differential signals: DQS_t and DQS_c to capture data
and CK_t and CK_c to capture commands, addresses, and control signals. Differential
clocks and data strobes ensure exceptional noise immunity for these signals and provide precise crossing points to capture input signals.
Fly-By Topology
DDR4 modules use faster clock speeds than earlier DDR technologies, making signal
quality more important than ever. For improved signal quality, the clock, control, command, and address buses have been routed in a fly-by topology, where each clock, control, command, and address pin on each DRAM is connected to a single trace and terminated (rather than a tree structure, where the termination is off the module near the
connector). Inherent to fly-by topology, the timing skew between the clock and DQS signals can be easily accounted for by using the write-leveling feature of DDR4.
16GB (x72, ECC, DR) 288-Pin DDR4 RDIMM
General Description
Module Manufacturing Location
Micron Technology manufactures modules at sites world-wide. Customers may receive
modules from any of the following manufacturing locations:
Table 6: DRAM Module Manufacturing Locations
Manufacturing Site LocationCountry of Origin Specified on Label
Boise, USAUSA
Aguadilla, Puerto RicoPuerto Rico
Xian, ChinaChina
SingaporeSingapore
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To achieve optimum routing of the address bus on DDR4 multi rank modules, the address bus will be wired as shown in the table below, or mirrored. For quad rank modules, ranks 1 and 3 are mirrored and ranks 0 and 2 are non-mirrored. Highlighted address pins have no secondary functions allowing for normal operation when crosswired. Data is still read from the same address it was written. However, Load Mode operations require a specific address. This requires the controller to accommodate for a
rank that is "mirrored." Systems may reference DDR4 SPD to determine if the module
has mirroring implemented or not. See the JEDEC DDR4 SPD specification for more details.
Registered DDR4 SDRAM modules use a registering clock driver device consisting of a
register and a phase-lock loop (PLL). The device complies with the JEDEC DDR4 RCD01
Specification.
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To reduce the electrical load on the host memory controller's command, address, and
control bus, Micron's RDIMMs utilize a DDR4 registering clock driver (RCD). The RCD
presents a single load to the controller while redriving signals to the DDR4 SDRAM devices, which helps enable higher densities and increase signal integrity. The RCD also
provides a low-jitter, low-skew PLL that redistributes a differential clock pair to multiple
differential pairs of clock outputs.
The RCD device(s) used on DDR4 RDIMMs and LRDIMMs contain configuration registers known as control words, which the host uses to configure the RCD based on criteria
determined by the module design. Control words can be set by the host controller
through either the DRAM address and control bus or the I2C bus interface. The RCD I2C
bus interface resides on the same I2C bus interface as the module temperature sensor
and EEPROM.
The RCD includes a parity-checking function that can be enabled or disabled in control
word RC0E. The RCD receives a parity bit at the DPAR input from the memory controller and compares it with the data received on the qualified command and address inputs; it indicates on its open-drain ALERT_n pin whether a parity error has occurred. If
parity checking is enabled, the RCD forwards commands to the SDRAM when no parity
error has occurred. If the parity error function is disabled, the RCD forwards sampled
commands to the SDRAM regardless of whether a parity error has occurred. Parity is also checked during control word WRITE operations unless parity checking is disabled.
Rank Addressing
The chip select pins (CS_n) on Micron's modules are used to select a specific rank of
DRAM. The RDIMM is capable of selecting ranks in one of three different operating
modes, dependant on setting DA[1:0] bits in the DIMM configuration control word located within the RCD. Direct DualCS mode is utilized for single- or dual-rank modules.
For quad-rank modules, either direct or encoded QuadCS mode is used.
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The integrated thermal sensor continuously monitors the temperature of the module
PCB directly below the device and updates the temperature data register. Temperature
data may be read from the bus host at any time, which provides the host real-time feedback of the module's temperature. Multiple programmable and read-only temperature
registers can be used to create a custom temperature-sensing solution based on system
requirements and JEDEC JC-42.2.
EVENT_n Pin
The temperature sensor also adds the EVENT_n pin (open-drain), which requires a pullup to V
can be set up in the sensor’s configuration registers. EVENT_n is not used by the serial
presence-detect (SPD) EEPROM.
EVENT_n has three defined modes of operation: interrupt, comparator, and TCRIT. In
interrupt mode, the EVENT_n pin remains asserted until it is released by writing a 1 to
the clear event bit in the status register. In comparator mode, the EVENT_n pin clears
itself when the error condition is removed. Comparator mode is always used when the
temperature is compared against the TCRIT limit. In TCRIT only mode, the EVENT_n
pin is only asserted if the measured temperature exceeds the TCRIT limit; it then remains asserted until the temperature drops below the TCRIT limit minus the TCRIT
hysteresis.
. EVENT_n is a temperature sensor output used to flag critical events that
DDSPD
SPD EEPROM Operation
DDR4 SDRAM modules incorporate SPD. The SPD data is stored in a 512-byte, JEDEC
JC-42.4-compliant EEPROM that is segregated into four 128-byte, write-protectable
blocks. The SPD content is aligned with these blocks as shown in the table below.
BlockRangeDescription
00–127000h–07FhConfiguration and DRAM parameters
1128–255080h–0FFhModule parameters
2256–319100h–13FhReserved (all bytes coded as 00h)
320–383140h–17FhManufacturing information
3384–511180h–1FFhEnd-user programmable
The first 384 bytes are programmed by Micron to comply with JEDEC standard JC-45,
"Appendix X: Serial Presence Detect (SPD) for DDR4 SDRAM Modules." The remaining
128 bytes of storage are available for use by the customer.
The EEPROM resides on a two-wire I2C serial interface and is not integrated with the
memory bus in any manner. It operates as a slave device in the I2C bus protocol, with all
operations synchronized by the serial clock. Transfer rates of up to 1 MHz are achievable at 2.5V (NOM).
Micron implements reversible software write protection on DDR4 SDRAM-based modules. This prevents the lower 384 bytes (bytes 0 to 383) from being inadvertently programmed or corrupted. The upper 128 bytes remain available for customer use and are
unprotected.
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
Stresses greater than those listed may cause permanent damage to the module. This is a
stress rating only, and functional operation of the module at these or any other conditions outside those indicated in each device's data sheet is not implied. Exposure to absolute maximum rating conditions for extended periods may adversely affect reliability.
Table 8: Absolute Maximum Ratings
SymbolParameterMinMaxUnitsNotes
V
V
DDQ
V
VIN, V
Table 9: Operating Conditions
SymbolParameterMinNomMaxUnits Notes
V
V
V
REFCA(DC)
I
VTT
V
I
I/O
I
OZpd
I
OZpu
I
VREFCAVREFCA
VDD supply voltage relative to V
DD
V
supply voltage relative to V
DDQ
Voltage on VPP pin relative to V
PP
Voltage on any pin relative to V
OUT
VDD supply voltage1.141.201.26V1
DD
DRAM activating power supply2.3752.52.75V2
PP
Input reference voltage –
SS
SS
SS
SS
0.49 × V
–0.41.5V1
–0.41.5V1
–0.43.0V2
–0.41.5V
DD
0.5 × V
DD
0.51 × V
DD
command/address bus
Termination reference current from V
Termination reference voltage (DC) –
TT
command/address bus
I
Input leakage current; any input excluding ZQ; 0V <
I
TT
–750–750mA
0.49 × VDD 20mV
0.5 × VDD0.51 × VDD +
20mV
–––µA5
VIN < 1.1V
I
Input leakage current; ZQ–3–3µA6, 7
I
DQ leakage; 0V < VIN < V
Output leakage current; V
Output leakage current; V
DD
= VDD; DQ is disabled––5µA
OUT
= VSS; DQ and ODT
OUT
–4–4µA7
––50µA
are disabled; ODT is disabled with ODT input HIGH
leakage; V
= VDD/2 (after DRAM is ini-
REFCA
–2–2µA7
tialized)
V3
V4
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Notes:
1. V
balls on DRAM are tied to VDD.
DDQ
2. VPP must be greater than or equal to VDD at all times.
3. V
must not be greater than 0.6 × VDD. When VDD is less than 500mV, V
REFCA
may be
REF
less than or equal to 300mV.
4. VTT termination voltages in excess of specification limit adversely affect command and
address signals' voltage margins and reduce timing margins.
5. Command and address inputs are terminated to VDD/2 in the registering clock driver. Input current is dependent on termination resistance set in the registering clock driver.
6. Tied to ground. Not connected to edge connector.
7. Multiply by number of DRAM die on module.
12
Micron Technology, Inc. reserves the right to change products or specifications without notice.
Recommended AC operating conditions are given in the DDR4 component data sheets.
Component specifications are available at micron.com. Module speed grades correlate
with component speed grades, as shown below.
Table 11: Module and Component Speed Grades
DDR4 components may exceed the listed module speed grades; module may not be available in all listed speed grades
Module Speed GradeComponent Speed Grade
-2G6-075
-2G4-083E
-2G3-083
-2G1-093E
-1G9-107E
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully designed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level. Micron encourages designers to simulate the signal characteristics of the system's memory bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the edge connector of the module, not at the DRAM.
Designers must account for any system voltage drops at anticipated power levels to ensure the required supply voltage is maintained.
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put high measurement level (for output slew rate)
AC differential out-
V
OLdiff(AC)
put low measurement level (for output slew rate)
DD
REF
V
TT
t
IN-
OH(AC)
OL(AC)
All outputs except
Yn_t - Yn_c, BCK_t -
–1.141.21.26V
V
REFCA
–V
DRST_n0.65 × V
0.49 × V
REF
DD
- 40mVV
DD
0.5 × V
DD
REF
–V
0–0.35 × V
0.51 × V
V
REF
DD
+ 40mVV
DD
DD
–1.0––µs
VTT + (0.15 × VDD)––V
ALERT_n
––VTT + (0.15 x VDD)V
–0.3 × V
DD
–mV
BCK_c
––0.3 × V
DD
–mV
V
V
V
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Note:
1. Timing and switching specifications for the register listed are critical for proper operation of DDR4 SDRAM RDIMMs. These are meant to be a subset of the parameters for the
specific device used on the module. See the JEDEC RCD01 specification for complete operating electrical characteristics. Registering clock driver parametric values are specified
for device default control word settings, unless otherwise stated. The RC0A control
word setting does not affect parametric values.
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
The temperature sensor continuously monitors the module's temperature and can be
read back at any time over the I2C bus shared with the serial presence-detect (SPD) EEPROM. Refer to JEDEC JC-42.4 EE1004 and TSE2004 device specifications for complete
details.
SPD Data
For the latest SPD data, refer to Micron's SPD page: micron.com/SPD.
Table 15: Temperature Sensor With SPD EEPROM Operating Conditions
Parameter/ConditionSymbolMinNomMaxUnits
Supply voltageV
DDSPD
Input low voltage: logic 0; all inputsV
Input high voltage: logic 1; all inputsV
Output low voltage: 3mA sink current V
Input leakage current: (SCL, SDA) VIN = V
Output leakage current: V
OUT
= V
DDSPD
> 2VV
DDSPD
or V
DDSPD
or V
SSSPD
SSSPD
, SDA in High-ZI
IL
IH
OL
I
LI
LO
–2.5–V
–0.5–V
V
× 0.7–V
DDSPD
DDSPD
DDSPD
––0.4V
––±5µA
––±5µA
× 0.3V
+ 0.5V
Table 16: Temperature Sensor and EEPROM Serial Interface Timing
Parameter/ConditionSymbolMinMaxUnits
Clock frequency
Clock pulse width HIGH time
Clock pulse width LOW time
Detect clock LOW timeout
SDA rise time
SDA fall time
Data-in setup time
Data-in hold time
Data out hold time
Start condition setup time
Start condition hold time
Stop condition setup time
Time the bus must be free before a new transition can start
Write time
Warm power cycle time off
Time from power-on to first command
f
SCL101000kHz
t
HIGH260–ns
t
LOW500–ns
t
TIMEOUT2535ms
t
R–120ns
t
F–120ns
t
SU:DAT50–ns
t
HD:DI0–ns
t
HD:DAT0350ns
t
SU:STA260–ns
t
HD:STA260–ns
t
SU:STO260–ns
t
BUF500–ns
t
W–5ms
t
POFF1–ms
t
INIT10–ms
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