Device configuration1Gb (128 Meg x 8)2Gb (256 Meg x 8)
Column address1K A[9:0]1K A[9:0]
Module rank address1 S0#1 S0#
Table 3: Part Numbers and Timing Parameters – 1GB Modules
Base device: MT41J128M8,1 1Gb DDR3 SDRAM
Part Number
2
DensityConfiguration
MT8JSF12864H(I)Z-1G6__1GB128 Meg x 6412.8 GB/s1.25ns/1600 MT/s11-11-11
MT8JSF12864H(I)Z-1G4__1GB128 Meg x 6410.6 GB/s1.5ns/1333 MT/s9-9-9
MT8JSF12864H(I)Z-1G1__1GB128 Meg x 648.5 GB/s1.87ns/1066 MT/s7-7-7
Module
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
DIMM
Features
Table 4: Part Numbers and Timing Parameters – 2GB Modules
Base device: MT41J256M8,1 2Gb DDR3 SDRAM
Part Number
22
DensityConfiguration
MT8JSF25664H(I)Z-1G6__2GB256 Meg x 6412.8 GB/s1.25ns/1600 MT/s11-11-11
MT8JSF25664H(I)Z-1G4__2GB256 Meg x 6410.6 GB/s1.5ns/1333 MT/s9-9-9
MT8JSF25664H(I)Z-1G1__2GB256 Meg x 648.5 GB/s1.87ns/1066 MT/s7-7-7
Module
Notes:
1. The data sheet for the base device can be found on Micron’s Web site.
2. All part numbers end with a two-place code (not shown) that designates component and PCB revisions.
Consult factory for current revision codes. Example: MT8JSF12864HZ-1G1D1.
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
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The pin description table below is a comprehensive list of all possible pins for all DDR3
modules. All pins listed may not be supported on this module. See Pin Assignments for
information specific to this module.
Table 6: Pin Descriptions
SymbolTypeDescription
AxInputAddress inputs: Provide the row address for ACTIVE commands, and the column ad-
dress and auto precharge bit (A10) for READ/WRITE commands, to select one location
out of the memory array in the respective bank. A10 sampled during a PRECHARGE
command determines whether the PRECHARGE applies to one bank (A10 LOW, bank
selected by BAx) or all banks (A10 HIGH). The address inputs also provide the op-code
during a LOAD MODE command. See the Pin Assignments Table for density-specific
addressing information.
BAxInputBank address inputs: Define the device bank to which an ACTIVE, READ, WRITE, or
PRECHARGE command is being applied. BA define which mode register (MR0, MR1,
MR2, or MR3) is loaded during the LOAD MODE command.
DMxInputData mask (x8 devices only): DM is an input mask signal for write data. Input data
ODTxInputOn-die termination: Enables (registered HIGH) and disables (registered LOW) termi-
Par_InInputParity input: Parity bit for Ax, RAS#, CAS#, and WE#.
RAS#, CAS#, WE#InputCommand inputs: RAS#, CAS#, and WE# (along with S#) define the command being
RESET#Input
Sx#InputChip select: Enables (registered LOW) and disables (registered HIGH) the command
SAxInputSerial address inputs: Used to configure the temperature sensor/SPD EEPROM ad-
SCLInputSerial clock for temperature sensor/SPD EEPROM: Used to synchronize communi-
CBxI/OCheck bits: Used for system error detection and correction.
DQxI/OData input/output: Bidirectional data bus.
DQSx,
DQSx#
InputClock: Differential clock inputs. All control, command, and address input signals are
sampled on the crossing of the positive edge of CK and the negative edge of CK#.
try and clocks on the DRAM.
is masked when DM is sampled HIGH, along with that input data, during a write access. Although DM pins are input-only, DM loading is designed to match that of the
DQ and DQS pins.
nation resistance internal to the DDR3 SDRAM. When enabled in normal operation,
ODT is only applied to the following pins: DQ, DQS, DQS#, DM, and CB. The ODT input
will be ignored if disabled via the LOAD MODE command.
entered.
Reset: RESET# is an active LOW asychronous input that is connected to each DRAM
(LVCMOS)
I/OData strobe: Differential data strobes. Output with read data; edge-aligned with
and the registering clock driver. After RESET# goes HIGH, the DRAM must be reinitialized as though a normal power-up was executed.
decoder.
dress range on the I2C bus.
cation to and from the temperature sensor/SPD EEPROM on the I2C bus.
read data; input with write data; center-aligned with write data.
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SDAI/OSerial data: Used to transfer addresses and data into and out of the temperature sen-
sor/SPD EEPROM on the I2C bus.
TDQSx,
TDQSx#
Err_Out#Output
EVENT#Output
V
DD
V
DDSPD
V
REFCA
V
REFDQ
V
SS
V
TT
NC–No connect: These pins are not connected on the module.
NF–No function: These pins are connected within the module, but provide no functional-
OutputRedundant data strobe (x8 devices only): TDQS is enabled/disabled via the LOAD
MODE command to the extended mode register (EMR). When TDQS is enabled, DM is
disabled and TDQS and TDQS# provide termination resistance; otherwise, TDQS# are
no function.
Parity error output: Parity error found on the command and address bus.
(open drain)
Temperature event:The EVENT# pin is asserted by the temperature sensor when criti-
(open drain)
cal temperature thresholds have been exceeded.
SupplyPower supply: 1.5V ±0.075V. The component VDD and V
module VDD.
SupplyTemperature sensor/SPD EEPROM power supply: 3.0–3.6V.
SupplyReference voltage: Control, command, and address VDD/2.
SupplyReference voltage: DQ, DM VDD/2.
SupplyGround.
SupplyTermination voltage: Used for control, command, and address VDD/2.
ity.
Pin Descriptions
are connected to the
DDQ
DIMM
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Note:
1. The ZQ ball on each DDR3 component is connected to an external 240Ω ±1% resistor
that is tied to ground. It is used for the calibration of the component’s ODT and output
driver.
7
Micron Technology, Inc. reserves the right to change products or specifications without notice.
DDR3 SDRAM modules are high-speed, CMOS dynamic random access memory modules that use internally configured 8-bank DDR3 SDRAM devices. DDR3 SDRAM modules use DDR architecture to achieve high-speed operation. DDR3 architecture is essentially an 8n-prefetch architecture with an interface designed to transfer two data words
per clock cycle at the I/O pins. A single read or write access for the DDR3 SDRAM module effectively consists of a single 8n-bit-wide, one-clock-cycle data transfer at the internal DRAM core and eight corresponding n-bit-wide, one-half-clock-cycle data transfers
at the I/O pins.
DDR3 modules use two sets of differential signals: DQS, DQS# to capture data and CK
and CK# to capture commands, addresses, and control signals. Differential clocks and
data strobes ensure exceptional noise immunity for these signals and provide precise
crossing points to capture input signals.
Fly-By Topology
DDR3 modules use faster clock speeds than earlier DDR technologies, making signal
quality more important than ever. For improved signal quality, the clock, control, command, and address buses have been routed in a fly-by topology, where each clock, control, command, and address pin on each DRAM is connected to a single trace and terminated (rather than a tree structure, where the termination is off the module near the
connector). Inherent to fly-by topology, the timing skew between the clock and DQS signals can be easily accounted for by using the write-leveling feature of DDR3.
Temperature Sensor with Serial Presence-Detect EEPROM
Thermal Sensor Operations
The temperature from the integrated thermal sensor is monitored and converts into a
digital word via the I2C bus. System designers can use the user-programmable registers
to create a custom temperature-sensing solution based on system requirements. Programming and configuration details comply with JEDEC standard No. 21-C page 4.7-1,
"Definition of the TSE2002av, Serial Presence Detect with Temperature Sensor."
Serial Presence-Detect EEPROM Operation
DDR3 SDRAM modules incorporate serial presence-detect. The SPD data is stored in a
256-byte EEPROM. The first 128 bytes are programmed by Micron to comply with JEDEC standard JC-45, "Appendix X: Serial Presence Detect (SPD) for DDR3 SDRAM Modules." These bytes identify module-specific timing parameters, configuration information, and physical attributes. The remaining 128 bytes of storage are available for use by
the customer. System READ/WRITE operations between the master (system logic) and
the slave EEPROM device occur via a standard I2C bus using the DIMM’s SCL (clock)
SDA (data), and SA (address) pins. Write protect (WP) is connected to VSS, permanently
disabling hardware write protection. For further information refer to Micron technical
note TN-04-42, "Memory Module Serial Presence-Detect."
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Stresses greater than those listed may cause permanent damage to the module. This is a
stress rating only, and functional operation of the module at these or any other conditions outside those indicated in each device's data sheet is not implied. Exposure to absolute maximum rating conditions for extended periods may adversely affect reliability.
Table 8: Absolute Maximum Ratings
SymbolParameterMinMaxUnits
V
DD
VIN, V
Table 9: Operating Conditions
Symbol ParameterMinNomMaxUnitsNotes
V
DD
I
VTT
V
TT
I
I
I
OZ
I
VREF
T
A
T
C
VDD supply voltage relative to V
Voltage on any pin relative to V
OUT
SS
SS
–0.41.975V
–0.41.975V
VDD supply voltage1.4251.51.575V
Termination reference current from
V
TT
Termination reference voltage (DC) –
–600–+600mA
0.49 × VDD - 20mV0.5 × V
0.51 × VDD + 20mVV1
DD
command/address bus
Input leakage current;
Any input 0V ≤ VIN ≤
VDD;
V
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Notes:
1. VTT termination voltage in excess of the stated limit will adversely affect the command
and address signals’ voltage margin and will reduce timing margins.
2. TA and TC are simultaneous requirements.
3. For further information, refer to technical note TN-00-08: “Thermal Applications,”
available on Micron’s Web site.
4. The refresh rate is required to double when 85°C < TC ≤ 95°C.
9
Micron Technology, Inc. reserves the right to change products or specifications without notice.
Recommended AC operating conditions are given in the DDR3 component data sheets.
Component specifications are available on Micron’s web site. Module speed grades correlate with component speed grades, as shown below.
Table 10: Module and Component Speed Grades
DDR3 components may exceed the listed module speed grades; module may not be available in all listed speed grades
Module Speed GradeComponent Speed Grade
-2G1-093
-1G9-107
-1G6-125
-1G4-15E
-1G1-187E
-1G0-187
-80C-25E
-80B-25
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully designed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level.
Micron encourages designers to simulate the signal characteristics of the system's
memory bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the DRAM, not at the edge connector of the module.
Designers must account for any system voltage drops at anticipated power levels to ensure the required supply voltage is maintained.
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Temperature Sensor with Serial Presence-Detect EEPROM
Temperature Sensor with Serial Presence-Detect EEPROM
The temperature sensor continuously monitors the module's temperature and can be
read back at any time over the I2C bus shared with the SPD EEPROM. Refer to JEDEC
standard No. 21-C page 4.7-1, "Definition of the TSE2002av, Serial Presence Detect with
Temperature Sensor."
Serial Presence-Detect
For the latest SPD data, refer to Micron's SPD page: www.micron.com/SPD.
Table 14: Temperature Sensor with SPD EEPROM Operating Conditions
Parameter/ConditionSymbolMinMaxUnits
Supply voltageV
Supply current: VDD = 3.3VI
Input high voltage: Logic 1; SCL, SDAV
Input low voltage: Logic 0; SCL, SDAV
Output low voltage: I
= 2.1mAV
OUT
Input currentI
DDSPD
DD
IH
IL
OL
IN
Temperature sensing range––40125°C
Temperature sensor accuracy (class B)––1.01.0°C
3.03.6V
–2.0mA
V
x 0.7V
DDSPD
–0.5V
+ 1V
DDSPD
x 0.3V
DDSPD
–0.4V
–5.05.0µA
DIMM
Table 15: Temperature Sensor and SPD EEPROM Serial Interface Timing
Parameter/ConditionSymbolMinMaxUnits
Time bus must be free before a new transition can
start
SDA fall time
SDA rise time
Data hold time
Start condition hold time
Clock HIGH period
Clock LOW period
SCL clock frequency
Data setup time
Start condition setup time
Stop condition setup time
t
BUF4.7–µs
t
F20300ns
t
R–1000ns
t
HD:DAT200900ns
t
H:STA4.0–µs
t
HIGH4.050µs
t
LOW4.7–µs
t
SCL10100kHz
t
SU:DAT250–ns
t
SU:STA4.7–µs
t
SU:STO4.0–µs
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Temperature Sensor with Serial Presence-Detect EEPROM
The temperature sensor also adds the EVENT# pin (open-drain). Not used by the SPD
EEPROM, EVENT# is a temperature sensor output used to flag critical events that can be
set up in the sensor’s configuration register.
EVENT# has three defined modes of operation: interrupt mode, compare mode, and
critical temperature mode. Event thresholds are programmed in the 0x01 register using
a hysteresis. The alarm window provides a comparison window, with upper and lower
limits set in the alarm upper boundary register and the alarm lower boundary register,
respectively. When the alarm window is enabled, EVENT# will trigger whenever the
temperature is outside the MIN or MAX values set by the user.
The interrupt mode enables software to reset EVENT# after a critical temperature
threshold has been detected. Threshold points are set in the configuration register by
the user. This mode triggers the critical temperature limit and both the MIN and MAX of
the temperature window.
The compare mode is similar to the interrupt mode, except EVENT# cannot be reset by
the user and returns to the logic HIGH state only when the temperature falls below the
programmed thresholds.
Critical temperature mode triggers EVENT# only when the temperature has exceeded
the programmed critical trip point. When the critical trip point has been reached, the
temperature sensor goes into comparator mode, and the critical EVENT# cannot be
cleared through software.
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