MICRON MT48LC4M8A1TG-10, MT48LC4M4A1TG-8B Datasheet

PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.
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16 Meg: x4, x8 SDRAM ©1998, Micron Technology, Inc. 16MSDRAMx4x8_B.p65 – Rev. 5/98
16 MEG: x4, x8
SDRAM
16Mb (x4/x8) SDRAM PART NUMBERS
PART NUMBER ARCHITECTURE
MT48LC4M4A1TG S 4 Meg x 4 (tWR = 1 CLK) MT48LC2M8A1TG S 2 Meg x 8 (
t
WR = 1 CLK)
4 MEG x 4 2 MEG x 8
Configuration 2 Meg x 4 x 2 banks 1 Meg x 8 x 2 banks Refresh Count 4K 4K Row Addressing 2K (A0-A10) 2K (A0-A10) Bank Addressing 2 (BA) 1 (BA) Column Addressing 1K (A0-A9) 512 (A0-A8)
FEATURES
• PC100-compliant; includes CONCURRENT AUTO PRECHARGE
• Fully synchronous; all signals registered on positive edge of system clock
• Internal pipelined operation; column address can be changed every clock cycle
• Internal banks for hiding row access/precharge
• Programmable burst lengths: 1, 2, 4, 8, or full page
• Auto Precharge and Auto Refresh Modes
• Self Refresh Mode
• 64ms, 4,096-cycle refresh
• LVTTL-compatible inputs and outputs
• Single +3.3V ±0.3V power supply
• Longer lead TSOP for improved reliability (OCPL*)
• One- and two-clock WRITE recovery (tWR) versions
OPTIONS MARKING
• Configurations 4 Meg x 4 (2 Meg x 4 x 2 banks) 4M4 2 Meg x 8 (1 Meg x 8 x 2 banks) 2M8
• WRITE Recovery (tWR/tDPL)
t
WR = 1 CLK A1
t
WR = 2 CLK (Contact factory for availability.)A2
• Plastic Package - OCPL* 44-pin TSOP (400 mil) TG
• Timing (Cycle Time) 8ns; tAC = 6ns @ CL = 3 -8B 10ns; tAC = 9ns @ CL = 2 -10
NOTE: The 16Mb SDRAM base number differentiates the
offerings in two places: MT48LC2M8A1 S. The fourth field distinguishes the architecture offering: 4M4 designates 4 Meg x 4, and 2M8 designates 2 Meg x 8. The fifth field distinguishes the WRITE recovery offering: A1 designates one CLK and A2 designates two CLKs.
Part Number Example:
MT48LC2M8A1TG-10 S
PIN ASSIGNMENT (Top View)
44-Pin TSOP
VDD
DQ0
VssQ
DQ1
V
DDQ
DQ2
VssQ
DQ3
V
DDQ
NC NC
WE# CAS# RAS#
CS#
BA
A10
A0 A1 A2 A3
V
DD
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
Vss
DQ7
VssQ
DQ6
V
DDQ
DQ5
VssQ
DQ4
V
DDQ
NC NC DQM CLK CKE NC
A9 A8 A7 A6 A5 A4
Vss
-
NC
-
DQ0
-
NC
-
DQ1
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
NC
-
DQ3
-
NC
-
DQ2
-
-
-
-
-
-
-
-
-
-
-
-
-
-
x4x8 x8x4
NOTE: The # symbol indicates signal is active LOW. A dash
(-) indicates x4 pin function is same as x8 pin function.
SYNCHRONOUS DRAM
MT48LC4M4A1/A2 S - 2 Meg x 4 x 2 banks MT48LC2M8A1/A2 S - 1 Meg x 8 x 2 banks
For the latest data sheet revisions, please refer to the Micron Web site: www.micron.com/datasheets.
KEY TIMING PARAMETERS
SPEED CLOCK ACCESS TIME SETUP HOLD
GRADE FREQUENCY CL = 2** CL = 3** TIME TIME
-8B 125 MHz 6ns 2ns 1ns
-10 100 MHz 7.5ns 3ns 1ns
-8B 83 MHz 9ns 2ns 1ns
-10 66 MHz 9ns 3ns 1ns
* Off-center parting line **CL = CAS (READ) latency
2
16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
GENERAL DESCRIPTION
The Micron 16Mb SDRAM is a high-speed CMOS, dynamic random-access memory containing 16,777,216 bits. It is internally configured as a dual memory array (the 4 Meg x 4 is a dual 2 Meg x 4, and the 2 Meg x 8 is a dual 1 Meg x 8) with a synchronous interface (all signals are registered on the positive edge of the clock signal, CLK). Each of the two internal banks is organized with 2,048 rows and either 1,024 columns by 4 bits (4 Meg x 4) or 512 columns by 8 bits (2 Meg x 8).
Read and write accesses to the SDRAM are burst ori­ented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an AC­TIVE command, which is then followed by a READ or WRITE command. The address bits registered coinci­dent with the ACTIVE command are used to select the bank and row to be accessed (BA selects the bank, A0-A10 select the row). The address bits registered coincident with the READ or WRITE command are used to select the starting column location for the burst access.
The SDRAM provides for programmable READ or WRITE burst lengths of 1, 2, 4, or 8 locations, or the full page, with a burst terminate option. An auto precharge
function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst sequence.
The Micron 16Mb SDRAM uses an internal pipelined architecture to achieve high-speed operation. This ar­chitecture is compatible with the 2n rule of prefetch architectures, but it also allows the column address to be changed on every clock cycle to achieve a high-speed, fully random access. Precharging one bank while access­ing the alternate bank will hide the PRECHARGE cycles and provide seamless, high-speed, random-access op­eration.
The Micron 16Mb SDRAM is designed to operate in
3.3V, low-power memory systems. An auto refresh mode is provided, along with a power-saving, power-down mode. All inputs and outputs are LVTTL-compatible.
SDRAMs offer substantial advances in DRAM operat­ing performance, including the ability to synchronously burst data at a high data rate with automatic column­address generation, the ability to interleave between in­ternal banks in order to hide precharge time, and the capability to randomly change column addresses on each clock cycle during a burst access.
3
16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
TABLE OF CONTENTS
Functional Block Diagram - 4 Meg x 4 ........................ 4
Functional Block Diagram - 2 Meg x 8 ........................ 5
Pin Descriptions ............................................................ 6
Functional Description ................................................ 7
Initialization ............................................................. 7
Register Definitions ................................................. 7
Mode Register ..................................................... 7
Burst Length .................................................. 7
Burst Type ..................................................... 7
CAS Latency .................................................. 9
Operating Mode............................................ 9
Write Burst Mode ......................................... 9
Commands..................................................................... 10
Truth Table 1 (Commands and DQM Operation) ....... 10
Command Inhibit .............................................. 11
No Operation (NOP) .......................................... 11
Load Mode Register ........................................... 11
Active ................................................................... 11
Read ..................................................................... 11
Write .................................................................... 11
Precharge ............................................................ 11
Auto Precharge ................................................... 11
Burst Terminate ................................................. 11
Auto Refresh ....................................................... 12
Self Refresh ......................................................... 12
Operation ....................................................................... 13
Bank/Row Activation ......................................... 13
Reads ................................................................... 14
Writes .................................................................. 20
Precharge ............................................................ 22
Power-Down ....................................................... 22
Clock Suspend .................................................... 23
Burst Read/Single Write .................................... 23
Concurrent Auto Precharge .............................. 24
Truth Table 2 (CKE) ................................................. 26
Truth Table 3 (Current State) .................................... 27
Truth Table 4 (Current State) .................................... 29
Absolute Maximum Ratings ......................................... 31
DC Electrical Characteristics and Operating Conditions . 31
ICC Operating Conditions and Maximum Limits ........ 31
Capacitance .................................................................... 32
AC Electrical Characteristics (Timing Table) ............ 32
Timing Waveforms
Initialize and Load Mode Register ......................... 35
Power-Down Mode .................................................. 36
Clock Suspend Mode ............................................... 37
Auto Refresh Mode .................................................. 38
Self Refresh Mode .................................................... 39
Reads
Read - Without Auto Precharge ........................ 40
Read - With Auto Precharge .............................. 41
Alternating Bank Read Accesses ....................... 42
Read - Full-Page Burst ....................................... 43
Read - DQM Operation ...................................... 44
Writes
Write - Without Auto Precharge ....................... 45
Write - With Auto Precharge ............................. 46
Alternating Bank Write Accesses ...................... 47
Write - Full-Page Burst ...................................... 48
Write - DQM Operation ..................................... 49
4
16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
FUNCTIONAL BLOCK DIAGRAM
4 Meg x 4 SDRAM
11
11
11
RAS#
REFRESH
CONTROLLER
2,048
REFRESH
COUNTER
CAS#
1,024
1,024 (x4)
10
COLUMN-
ADDRESS BUFFER
BURST COUNTER
ROW-
ADDRESS
MUX
CLK
CS#
WE#
CKE
1,024 (x4)
BANK 1
MEMORY
ARRAY
(2,048 x 1,024 x 4)
SENSE AMPLIFIERS
I/O GATING
DQM MASK LOGIC
CONTROL
LOGIC
COLUMN
DECODER
COLUMN-
ADDRESS LATCH
10
MODE REGISTER
ROW-
ADDRESS
LATCH
11
ROW
DECODER
11
COMMAND
DECODE
DQ0 -
DQ3
A0-A10, BA
4
8
DQM
1,024
2,048
BANK 0
MEMORY
ARRAY
(2,048 x 1,024 x 4)
ROW
DECODER
ROW-
ADDRESS
LATCH
11
12
ADDRESS REGISTER
12
SENSE AMPLIFIERS
I/O GATING
DQM MASK LOGIC
DATA INPUT
REGISTER
DATA
OUTPUT
REGISTER
4
4
5
16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
FUNCTIONAL BLOCK DIAGRAM
2 Meg x 8 SDRAM
11
11
11
RAS#
REFRESH
CONTROLLER
2,048
REFRESH
COUNTER
CAS#
512
512 (x8)
9
COLUMN-
ADDRESS BUFFER
BURST COUNTER
ROW-
ADDRESS
MUX
CLK
CS#
WE#
CKE
512 (x8)
BANK 1
MEMORY
ARRAY
(2,048 x 512 x 8)
SENSE AMPLIFIERS
I/O GATING
DQM MASK LOGIC
CONTROL
LOGIC
COLUMN
DECODER
COLUMN-
ADDRESS LATCH
9
MODE REGISTER
ROW-
ADDRESS
LATCH
11
ROW
DECODER
11
COMMAND
DECODE
DQ0 ­DQ7
A0-A10, BA
8
8
DQM
512
2,048
BANK 0
MEMORY
ARRAY
(2,048 x 512 x 8)
ROW
DECODER
ROW-
ADDRESS
LATCH
11
12
ADDRESS REGISTER
12
SENSE AMPLIFIERS
I/O GATING
DQM MASK LOGIC
DATA INPUT
REGISTER
DATA
OUTPUT
REGISTER
8
8
6
16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
PIN DESCRIPTIONS
PIN NUMBERS SYMBOL TYPE DESCRIPTION
32 CLK Input Clock: CLK is driven by the system clock. All SDRAM input signals are sampled on
the positive edge of CLK. CLK also increments the internal burst counter and controls the output registers.
31 CKE Input Clock Enable: CKE activates (HIGH) and deactivates (LOW) the CLK signal.
Deactivating the clock provides PRECHARGE POWER-DOWN and SELF REFRESH operations (all banks idle), ACTIVE POWER-DOWN (row active in either bank), or CLOCK SUSPEND operation (burst/access in progress). CKE is synchronous except after the device enters power-down and self refresh modes, where CKE becomes asynchronous until after exiting the same mode. The input buffers, including CLK, are disabled during power-down and self refresh modes, providing low standby power. CKE may be tied HIGH.
15 CS# Input Chip Select: CS# enables (registered LOW) and disables (registered HIGH) the
command decoder. All commands are masked when CS# is registered HIGH. CS# provides for external bank selection on systems with multiple banks. CS# is considered part of the command code.
14, 13, RAS#, CAS#, Input Command Inputs: RAS#, CAS#, and WE# (along with CS#) define the command
12 WE# being entered. 33 DQM Input Input/Output Mask: DQM is an input mask signal for write accesses and an
output enable signal for read accesses. Input data is masked when DQM is sampled HIGH during a WRITE cycle. The output buffers are placed in a High-Z state (after a two-clock latency) when DQM is sampled HIGH during a READ cycle.
16 BA Input Bank Address: BA defines to which bank the ACTIVE, READ, WRITE, or
PRECHARGE command is being applied. BA is also used to program the twelfth bit of the Mode Register.
18-21, 24-29, 17 A0-A10 Input Address Inputs: A0-A10 are sampled during the ACTIVE command (row-address
A0-A10) and READ/WRITE command (column-address A0-A9 [x4]; A0-A8 [x8], with A9 as a “Don’t Care;” and with A10 defining AUTO PRECHARGE) to select one location out of the memory array in the respective bank. A10 is sampled during a PRECHARGE command to determine if both banks are to be precharged (A10 HIGH). The address inputs also provide the op-code during a LOAD MODE REGISTER command.
4, 8, 37, 41 x4: DQ0, 1, 2, 3 Input Data I/O: Data bus.
x8: DQ1, 3, 4, 6
2, 6, 39, 43 x4: NC No Connect: These pins should be left unconnected.
x8: DQ0, 2, 5, 7 Input Data I/O: Data bus.
10, 11, 30, 34, 35 NC No Connect: These pins should be left unconnected.
5, 9, 36, 40 VDDQ Supply DQ Power. 3, 7, 38, 42 VSSQ Supply DQ Ground.
1, 22 V
DD
Supply Power Supply: +3.3V ±0.3V.
23, 44 V
SS
Supply Ground.
7
16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
FUNCTIONAL DESCRIPTION
In general, the SDRAM is a dual memory array (the 4 Meg x 4 is a dual 2 Meg x 4, and the 2 Meg x 8 is a dual 1 Meg x 8) which operates at 3.3V and includes a synchro­nous interface (all signals are registered on the positive edge of the clock signal, CLK). Each of the two internal banks is organized with 2,048 rows and either 1,024 col­umns by 4 bits (4 Meg x 4) or 512 columns by 8 bits (2 Meg x 8).
Read and write accesses to the SDRAM are burst ori­ented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an AC­TIVE command, which is then followed by a READ or WRITE command. The address bits registered coinci­dent with the ACTIVE command are used to select the bank and row to be accessed (BA selects the bank, A0-A10 select the row). The address bits (A0-A9; A9 is a “Don’t Care” for x8) registered coincident with the READ or WRITE command are used to select the starting column location for the burst access.
Prior to normal operation, the SDRAM must be ini­tialized. The following sections provide detailed infor­mation covering device initialization, register definition, command descriptions and device operation.
Initialization
SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those specified may result in undefined operation. Once power is applied to VDD and VDDQ (simultaneously) and the clock is stable, the SDRAM requires a 100µs delay prior to applying an executable command. The RAS#, CAS#, WE# and CS# inputs should be held HIGH during this phase of power-up.
Once the 100µs delay has been satisfied, CKE HIGH and the PRECHARGE command can be applied (set up and held with respect to a positive edge of CLK). Both banks must then be precharged, thereby placing the device in the all banks idle state.
Once in the idle state, two AUTO REFRESH cycles must be performed. After the AUTO REFRESH cycles are complete, the SDRAM is ready for Mode Register pro­gramming. Because the Mode Register will power up in an unknown state, it should be loaded prior to applying any operational command.
Register Definition
MODE REGISTER
The Mode Register is used to define the specific mode of operation of the SDRAM. This definition includes the selection of a burst length, a burst type, a CAS latency, an
operating mode, and a write burst mode, as shown in Figure 1. The Mode Register is programmed via the LOAD MODE REGISTER command and will retain the stored information until it is programmed again or the device loses power.
Mode Register bits M0-M2 specify the burst length, M3 specifies the type of burst (sequential or interleaved), M4-M6 specify the CAS latency, M7 and M8 specify the operating mode, M9 specifies the write burst mode, and M10 and M11 are reserved for future use.
The Mode Register must be loaded when both banks are idle, and the controller must wait the specified time before initiating the subsequent operation. Violating ei­ther of these requirements will result in unspecified op­eration.
Burst Length
Read and write accesses to the SDRAM are burst ori­ented, with the burst length being programmable, as shown in Figure 1. The burst length determines the maxi­mum number of column locations that can be accessed for a given READ or WRITE command. Burst lengths of 1, 2, 4 or 8 locations are available for both the sequential and the interleaved burst types, and a full-page burst is available for the sequential type. The full-page burst is used in conjunction with the BURST TERMINATE com­mand to generate arbitrary burst lengths.
Reserved states should not be used, as unknown op­eration or incompatibility with future versions may re­sult.
When a READ or WRITE command is issued, a block of columns equal to the burst length is effectively se­lected. All accesses for that burst take place within this block, meaning that the burst will wrap within the block if a boundary is reached. The block is uniquely selected by A1-A9 (A9 is “Don’t Care” for x8) when the burst length is set to two; by A2-A9 (A9 is “Don’t Care” for x8) when the burst length is set to four; and by A3-A9 (A9 is “Don’t Care” for x8) when the burst length is set to eight. The remaining (least significant) address bit(s) is (are) used to select the starting location within the block. Full-page bursts wrap within the page if the boundary is reached.
Burst Type
Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst type and is selected via bit M3.
The ordering of accesses within a burst is determined by the burst length, the burst type and the starting col­umn address, as shown in Table 1.
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16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
NOTE: 1. For a burst length of two, A1-A9 select the block
of two burst (A9 is a “Don’t Care” for x8); A0 selects the starting column within the block.
2. For a burst length of four, A2-A9 select the block of four burst (A9 is a “Don’t Care” for x8); A0-A1 select the starting column within the block.
3. For a burst length of eight, A3-A9 select the block of eight burst (A9 is a “Don’t Care” for x8); A0-A2 select the starting column within the block.
4. For a full-page burst, the full row is selected and A0-A9 select the starting column (A9 is a “Don’t Care” for x8).
5. Whenever a boundary of the block is reached within a given sequence above, the following access wraps within the block.
6. For a burst length of one, A0-A9 select the unique column to be accessed (A9 is a “Don’t Care” for x8), and Mode Register bit M3 is ignored.
Table 1
Burst Definition
Burst Starting Column Order of Accesses Within a Burst
Length Address: Type = Sequential Type = Interleaved
A0
2
0 0-1 0-1 1 1-0 1-0
A1 A0
0 0 0-1-2-3 0-1-2-3
4
0 1 1-2-3-0 1-0-3-2 1 0 2-3-0-1 2-3-0-1 1 1 3-0-1-2 3-2-1-0
A2 A1 A0
0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7 0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6 0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5
8
0 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4 1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3 1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2 1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1 1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0
Full x4: n = A0-A9
Cn, Cn+1, Cn+2
Page x8: n = A0-A8
Cn+3, Cn+4...
Not supported
(x4: 1,024) (location 0-1,023)
…Cn-1,
(x8: 512) (location 0-511) Cn…
M2
0
0
0
0
1
1
1
1
M1
0
0
1
1
0
0
1
1
M0
0
1
0
1
0
1
0
1
M3 = 0
1
2
4
8
Reserved
Reserved
Reserved
Full Page
M3 = 1
1
2
4
8
Reserved
Reserved
Reserved
Reserved
Operating Mode
Standard Operation
All other states reserved
0-0-Defined
-
0
1
Burst Type
Sequential
Interleaved
CAS Latency
Reserved
1
2
3
Reserved
Reserved
Reserved
Reserved
M6
0
0
0
0
1
1
1
1
M4
0
1
0
1
0
1
0
1
M5
0
0
1
1
0
0
1
1
Burst Length
Burst LengthCAS Latency B T
A9
A7
A6 A5 A4
A3A8A2A1A0
Mode Register (Mx)
Address Bus
9
7
654
382
1
0
M3
M6-M0
M8
M7
Op Mode
A10
BA
10
11
Reserved* WB
0
1
Write Burst Mode
Programmed Burst Length
Single Location Access
M9
*Should program
M11, M10 = 0, 0
to ensure compatibility
with future devices.
Figure 1
Mode Register Definition
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16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
ALLOWABLE OPERATING
FREQUENCY (MHz)
CAS CAS CAS
SPEED LATENCY = 1 LATENCY = 2 LATENCY = 3
-8D/E £ 33 £ 100 £ 125
-8A/B/C £ 33 £ 83 £ 125
-10 £ 33 £ 66 £ 100
CAS Latency
The CAS latency is the delay, in clock cycles, between the registration of a READ command and the availability of the first piece of output data. The latency can be set to 1, 2, or 3 clocks.
If a READ command is registered at clock edge n, and the latency is m clocks, the data will be available by clock edge n + m. The DQs will start driving as a result of the clock edge one cycle earlier (n + m - 1) and, provided that the relevant access times are met, the data will be valid by clock edge n + m. For example, assuming that the clock cycle time is such that all relevant access times are met, if a READ command is registered at T0, and the latency is programmed to two clocks, the DQs will start driving after T1 and the data will be valid by T2, as shown in Figure 2. Table 2 below indicates the operating frequen­cies at which each CAS latency setting can be used.
Reserved states should not be used, as unknown op­eration or incompatibility with future versions may re­sult.
Operating Mode
The normal operating mode is selected by setting M7 and M8 to zero; the other combinations of values for M7 and M8 are reserved for future use and/or test modes. The programmed burst length applies to both READ and WRITE bursts.
Test modes and reserved states should not be used because unknown operation or incompatibility with fu­ture versions may result.
Write Burst Mode
When M9 = 0, the burst length programmed via M0­M2 applies to both READ and WRITE bursts; when M9 = 1, the programmed burst length applies to READ bursts, but write accesses are single-location (nonburst) accesses.
CLK
DQ
T2T1 T3T0
CAS Latency = 3
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
T4
NOP
DON’T CARE
UNDEFINED
CLK
DQ
T2T1T0
CAS Latency = 1
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
CLK
DQ
T2T1 T3T0
CAS Latency = 2
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
Figure 2
CAS LATENCY
Table 2
CAS LATENCY
10
16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
TRUTH TABLE 1 – Commands and DQM Operation
(Note: 1)
NAME (FUNCTION) CS# RAS# CAS# WE# DQM ADDR DQs NOTES
COMMAND INHIBIT (NOP) H XXXX X X NO OPERATION (NOP) L H H H X X X ACTIVE (Select bank and activate row) L L H H X Bank/Row X 3 READ (Select bank and column and start READ burst) L H L H X Bank/Col X 4 WRITE (Select bank and column and L H L L X Bank/Col Valid 4
start WRITE burst) BURST TERMINATE L H H L X X Active PRECHARGE (Deactivate row in bank or banks) L L H L X Code X 5 AUTO REFRESH or L L L H X X X 6, 7
SELF REFRESH (Enter self refresh mode) LOAD MODE REGISTER L L L L X Op-code X 2 Write Enable/Output Enable ––––L – Active 8 Write Inhibit/Output High-Z ––––H –High-Z 8
following the Operation section; these tables provide current state/next state information.
COMMANDS
Truth Table 1 provides a quick reference of avail­able commands. This is followed by a written description of each command. Two additional Truth Tables appear
NOTE: 1. CKE is HIGH for all commands shown except SELF REFRESH.
2. A0-A10 and BA define the op-code written to the Mode Register.
3. A0-A10 provide row address, and BA determines which bank is made active (BA LOW = Bank 0; BA HIGH = Bank 1).
4. A0-A9 (A9 is a “Don’t Care” for x8) provide column address; A10 HIGH enables the auto precharge feature (nonpersis­tent), while A10 LOW disables the auto precharge feature; BA determines which bank is being read from or written to (BA LOW = Bank 0; BA HIGH = Bank 1).
5. For A10 LOW, BA determines which bank is being precharged (BA LOW = Bank 0; BA HIGH = Bank 1); for A10 HIGH, both banks are precharged and BA is a “Don’t Care.”
6. This command is AUTO REFRESH if CKE is HIGH, SELF REFRESH if CKE is LOW.
7. Internal refresh counter controls row addressing; all inputs and I/Os are “Don’t Care” except for CKE.
8. Activates or deactivates the DQs during WRITEs (zero-clock delay) and READs (two-clock delay).
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16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
COMMAND INHIBIT
The COMMAND INHIBIT function prevents new com­mands from being executed by the SDRAM, regardless of whether the CLK signal is enabled. The SDRAM is effec­tively deactivated, or deselected.
NO OPERATION (NOP)
The NO OPERATION (NOP) command is used to per­form a NOP to an SDRAM which is selected (CS# is LOW). This prevents unwanted commands from being regis­tered during idle or wait states.
LOAD MODE REGISTER
The Mode Register is loaded via inputs A0-A10 and BA. See Mode Register heading in Register Definition section. The LOAD MODE REGISTER command can only be issued when both banks are idle, and a subsequent executable command cannot be issued until tMRD is met.
ACTIVE
The ACTIVE command is used to open (or activate) a row in a particular bank for a subsequent access. The value on the BA input selects the bank, and the address provided on inputs A0-A10 selects the row. This row remains active (or open) for accesses until a PRECHARGE command is issued to that bank. A PRECHARGE com­mand must be issued before opening a different row in the same bank.
READ
The READ command is used to initiate a burst read access to an active row. The value on the BA input selects the bank, and the address provided on inputs A0-A9 (A9 is a “Don’t Care” on x8) selects the starting column location. The value on input A10 determines whether or not auto precharge is used. If auto precharge is selected, the row being accessed will be precharged at the end of the READ burst; if auto precharge is not selected, the row will remain open for subsequent accesses. Read data appears on the DQs, subject to the logic level on the DQM input, two clocks earlier. If the DQM signal was regis­tered HIGH, the DQs will be High-Z two clocks later; if the DQM signal was registered LOW, the DQs will provide valid data.
WRITE
The WRITE command is used to initiate a burst write access to an active row. The value on the BA input selects the bank, and the address provided on inputs A0-A9 (A9 is a “Don’t Care” on x8) selects the starting column location. The value on input A10 determines whether or not auto precharge is used. If auto precharge is selected,
the row being accessed will be precharged at the end of the WRITE burst; if auto precharge is not selected, the row will remain open for subsequent accesses. Input data appearing on the DQs is written to the memory array subject to the DQM input logic level appearing coinci­dent with the data. If the DQM signal is registered LOW, the corresponding data will be written to memory; if the DQM signal is registered HIGH, the corresponding data inputs will be ignored, and a WRITE will not be executed to that location.
PRECHARGE
The PRECHARGE command is used to deactivate the open row in a particular bank or the open row in both banks. The bank(s) will be available for a subsequent row access some specified time (tRP) after the PRECHARGE command is issued. Input A10 determines whether one or both banks are to be precharged, and in the case where only one bank is to be precharged, input BA selects the bank. Otherwise BA is treated as a “Don’t Care.” Once a bank has been precharged, it is in the idle state and must be activated prior to any READ or WRITE commands being issued to that bank.
AUTO PRECHARGE
Auto precharge is a feature which performs the same individual-bank PRECHARGE function described above, without requiring an explicit command. This is accom­plished by using A10 to enable auto precharge in con­junction with a specific READ or WRITE command. A PRECHARGE of the bank/row that is addressed with the READ or WRITE command is automatically performed upon completion of the READ or WRITE burst, except in the full-page burst mode, where auto precharge does not apply. Auto precharge is nonpersistent in that it is either enabled or disabled for each individual READ or WRITE command.
Auto precharge ensures that the PRECHARGE is initi­ated at the earliest valid stage within a burst. The user must not issue another command until the precharge time (tRP) is completed. This is determined as if an ex­plicit PRECHARGE command was issued at the earliest possible time, as described for each burst type in the Operation section of this data sheet.
BURST TERMINATE
The BURST TERMINATE command is used to trun­cate either fixed-length or full-page bursts. The most recently registered READ or WRITE command prior to the BURST TERMINATE command will be truncated, as shown in the Operation section of this data sheet.
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16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
AUTO REFRESH
AUTO REFRESH is used during normal operation of the SDRAM and is analagous to CAS#-BEFORE-RAS# (CBR) REFRESH in conventional DRAMs. This command is nonpersistent, so it must be issued each time a refresh is required.
The addressing is generated by the internal refresh controller. This makes the address bits “Don’t Care” during an AUTO REFRESH command. The Micron 16Mb SDRAM requires all of its 4,096 rows to be refreshed every 64ms (tREF). Providing a distributed AUTO REFRESH command every 15.6µs will meet the refresh require­ment and ensure that each row is refreshed. Alterna­tively, all 4,096 AUTO REFRESH commands can be is­sued in a burst at the minimum cycle rate (tRC) once every 64ms.
SELF REFRESH
The SELF REFRESH command can be used to re­tain data in the SDRAM, even if the rest of the system is powered down. When in the self refresh mode, the SDRAM retains data without external clocking. The SELF RE-
FRESH command is initiated like an AUTO REFRESH command except CKE is disabled (LOW). Once the SELF REFRESH command is registered, all the inputs to the SDRAM become “Don’t Care,” with the exception of CKE, which must remain LOW.
Once self refresh mode is engaged, the SDRAM pro­vides its own internal clocking, causing it to perform its own AUTO REFRESH cycles. The SDRAM must remain in self refresh mode for a minimum period equal to tRAS and may remain in self refresh mode for an indefinite period beyond that.
The procedure for exiting self refresh requires a se­quence of commands. First, CLK must be stable prior to CKE going back HIGH. Once CKE is HIGH, the SDRAM must have NOP commands issued (a minimum of two clocks) for tXSR because time is required for the comple­tion of any internal refresh in progress.
A burst of 4,096 AUTO REFRESH cycles should be completed just prior to entering and just after exiting the self refresh mode.
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16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
OPERATION
BANK/ROW ACTIVATION
Before any READ or WRITE commands can be issued to a bank within the SDRAM, a row in that bank must be “opened.” This is accomplished via the ACTIVE com­mand, which selects both the bank and the row to be activated.
After opening a row (issuing an ACTIVE command), a READ or WRITE command may be issued to that row, subject to the tRCD specification. tRCD (MIN) should be divided by the clock period and rounded up to the next whole number to determine the earliest clock edge after the ACTIVE command on which a READ or WRITE com­mand can be entered. For example, a tRCD specification of 30ns with a 90 MHz clock (11.11ns period) results in 2.7 clocks, rounded to 3. This is reflected in Figure 4, which covers any case where 2 < tRCD (MIN)/tCK < 3. (The same procedure is used to convert other specification limits from time units to clock cycles.)
A subsequent ACTIVE command to a different row in the same bank can only be issued after the previous active row has been “closed” (precharged). The mini­mum time interval between successive ACTIVE com­mands to the same bank is defined by tRC.
A subsequent ACTIVE command to the other bank can be issued while the first bank is being accessed, resulting in a reduction of total row access overhead. The minimum time interval between successive ACTIVE com­mands to different banks is defined by tRRD.
CS#
WE#
CAS#
RAS#
CKE
CLK
A0-A10
BA
ROW
ADDRESS
HIGH
BANK 0
BANK 1
Figure 3
Activating a Specific Row in a
Specific Bank
CLK
T2T1 T3T0
t
COMMAND
NOPACTIVE
READ or
WRITE
T4
NOP
RCD
DON’T CARE
Figure 4
EXAMPLE: MEETING tRCD (MIN) WHEN 2 < tRCD (MIN)/tCK < 3
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16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
Upon completion of a burst, assuming no other com­mands have been initiated, the DQs will go High-Z. A full­page burst will continue until terminated. (At the end of the page, it will wrap to column 0 and continue.)
A fixed-length READ burst may be followed by, or truncated with, a READ burst (provided that auto precharge is not activated), and a full-page READ burst can be truncated with a subsequent READ burst. In either case, a continuous flow of data can be maintained. The first data element from the new burst follows either the last element of a completed burst or the last desired data element of a longer burst that is being truncated. The new READ command should be issued x cycles before the clock edge at which the last desired data element is valid, where x equals the CAS latency minus one. This is
READs
READ bursts are initiated with a READ command, as
shown in Figure 5 (A9 is a “Don’t Care”on x8).
The starting column and bank addresses are pro­vided with the READ command, and auto precharge is either enabled or disabled for that burst access. If auto precharge is enabled, the row being accessed is precharged at the completion of the burst. For the ge­neric READ commands used in the following illustra­tions, auto precharge is disabled.
During READ bursts, the valid data-out element from the starting column address will be available following the CAS latency after the READ command. Each subse­quent data-out element will be valid by the next positive clock edge. Figure 6 shows general timing for each pos­sible CAS latency setting.
CS#
WE#
CAS#
RAS#
CKE
CLK
COLUMN ADDRESS
A0-A9
A10
BA
BANK 0
BANK 1
HIGH
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
(
A9 is a “Don’t Care” for x8)
Figure 5
READ Command
CLK
DQ
T2T1 T3T0
CAS Latency = 3
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
T4
NOP
DON’T CARE
UNDEFINED
CLK
DQ
T2T1T0
CAS Latency = 1
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
CLK
DQ
T2T1 T3T0
CAS Latency = 2
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
Figure 6
CAS Latency
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16 Meg: x4, x8 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 16MSDRAMx4x8_B.p65 – Rev. 5/98 ©1998, Micron Technology, Inc.
16 MEG: x4, x8
SDRAM
shown in Figure 7 for CAS latencies of one, two and three; data element n + 3 is either the last of a burst of four or the last desired of a longer burst. The Micron 16Mb SDRAM uses a pipelined architecture and therefore does not require the 2n rule associated with a prefetch architec-
Figure 7
Consecutive READ Bursts
ture. A READ command can be initiated on any clock cycle following a previous READ command. Full-speed random read accesses can be performed to the same bank, as shown in Figure 8, or each subsequent READ may be performed to a different bank.
CLK
DQ
D
OUT
n
T2T1 T4T3 T5T0
COMMAND
ADDRESS
READ NOP NOP NOP
BANK, COL n
DON’T CARE
NOP
BANK, COL b
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
D
OUT
b
READ
X = 0 cycles
NOTE: Each READ command may be to either bank. DQM is LOW.
CAS Latency = 1
CLK
DQ
D
OUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP NOP
BANK, COL n
NOP
BANK, COL b
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
D
OUT
b
READ
X = 1 cycle
CAS Latency = 2
CLK
DQ
D
OUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP NOP
BANK, COL n
NOP
BANK, COL b
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
D
OUT
b
READ
NOP
T7
X = 2 cycles
CAS Latency = 3
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