Microchip Technology Inc MCP3208-CI-P, MCP3204-CI-P, MCP3204-CI-SL Datasheet

MCP3204/3208
2.7V 4-Channel/8-Channel 12-Bit A/D Converters with SPI® Serial Interface
FEATURES
• 12-bit resolution
• ± 1 LSB max DNL
• ± 1 LSB max INL (MCP3204/3208-B)
• ± 2 LSB max INL (MCP3204/3208-C)
• 4 (MCP3204) or 8 (MCP3208) input channels
• On-chip sample and hold
®
serial interface (modes 0,0 and 1,1)
• SPI
• Single supply operation: 2.7V - 5.5V
• 100ksps max. sampling rate at V
• 50ksps max. sa mpling rate at V
DD
= 2.7V
DD
= 5V
• Low power CMOS technology
- 500 nA typical standby current, 2µA max.
- 400 µA max. active current at 5V
• Industrial temp range: -40°C to +85°C
• Available in PDIP, SOIC and TSSOP packages
APPLICATIONS
• Sensor Interface
• Process Control
• Data Acquisition
• Battery Operated Systems
DESCRIPTION
PAC K AGE TYPES
PDIP, SOIC, TSSOP
14
CH0 CH1 CH2 CH3
NC NC
DGND
1 2 3 4 5 6
7
MCP3204
V
DD
13
V
REF
12
AGND CLK
11 10
D
OUT
D
9
IN
8
/SHDN
CS
PDIP, SOIC
CH0 CH1 CH2 CH3 CH4 CH5 CH6 CH7
1 2
3 4 5 6 7 8
MCP3208
16 15
14 13 12 11 10
9
V
DD
V
REF
AGND CLK D
OUT
D
IN
CS/SHDN DGND
FUNCTIONAL BLOCK DIAGRAM
V
V
REF
DD
V
SS
The Microchip Technology Inc. MCP3204/3208 devices are successive approximation 12-bit Ana­log-to-Digital (A/D) Converters with on-board sample and hold circuitry. The MCP3204 is programmable to provide two pseudo-differential input pairs or four sin­gle-ended inputs. The MCP3208 is programmable to provide four pseudo-diffe rential i nput pai rs or eig ht sin­gle-ended inputs. Differential Nonlinearity (DNL) is specified at ±1 LSB, and Integral Nonlinearity (INL) is offered in ±1 LSB (MCP3204/3208-B) and ±2 LSB
CH0 CH1
CH7*
Input
Channel
Mux
Sample
and Hold
DAC
Comparator
Control Logic
12-Bit SAR
Shift
Register
(MCP3204/3208-C) versions. Communication with the devices i s done using a si mple serial interfac e compat­ible with the SPI protocol. The devices are capable of conversion rates o f up to 100k sps. The MCP3204/3208
CS/SHDN
*Note: Channels 5-7 available on MCP3208 Only
D
CLK
IN
D
OUT
devices operate over a broad voltage range (2.7V -
5.5V). Low current design permits operation with typi-
cal standby and active currents of only 500nA and 320µA, respectively. The MCP3204 is offe red in 14-pin PDIP, 150mil SOIC and TSSOP packages, and the MCP3208 is offered in 16-pin PDIP and SOIC pack­ages.
1999 Microchip Technology Inc. Preliminary DS21298B-page 1
MCP3204/3208
1.0 ELECTRICAL
PIN FUNCTION TABLE
CHARACTERISTICS
NAME FUNCTION

1.1 Maximum Ratings*

VDD.........................................................................7.0V
All inputs and outputs w.r.t. V
Storage temperature..........................-65°C to +150°C
Ambient temp. with power applied......-65°C to +125°C
Soldering temperature of leads (10 seconds)..+300°C
ESD protection on all pins...................................> 4kV
*Notice: Stresses above those listed under “Maximum R atings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listin gs of this spe cificat ion is not implied. Exposure to maximum rating conditions for extended peri­ods may affect device reliability.
...... -0.6V to VDD +0.6V
SS
V
DD
DGND AGND CH0-CH7 CLK D
IN
D
OUT
CS/SHDN V
REF
+2.7V to 5.5V Power Supply Digital Ground Analog Ground Analog Inputs Serial Clock Serial Data In Serial Data Out Chip Select/Shutdown Input Reference Voltage Input

ELECTRICAL CHARACTERISTICS

All parameters apply at VDD = 5V, VSS = 0V, V
f
CLK
= 20*f
, unless otherwise noted.
SAMPLE
PARAMETER SYMBOL MIN. TYP. MAX. UNITS CONDITIONS
Convers ion Rate
Conversion Time t
Analog Input Sample Time t
Throughput Rate f
CONV
SAMPLE
SAMPLE
DC Accuracy
Resolution 12 bits Integral Nonlinearity INL ±0.75
Differential Nonlinearity DNL ±0.5 ±1 LSB No missing codes over
Offset Error ±1.25 ±3 LSB Gain Error ±1.25 ±5 LSB
Dynamic Performance
Total Harmonic Distortion -82 dB V Signal to Noise and Distortion
(SINAD) Spurious Free Dynamic
Range Reference Input Voltage Range 0.25 V
Current Drain 100
Analog Inputs
Input Voltage Range for CH0-CH7 in Single-Ended Mode
Input V oltage Rang e for IN+ In pseudo-differential Mode
Input Voltage Range for IN - In pseudo-differential Mode
Leakage Current 0.001 ±1 µA
REF
= 5V, T
= -40°C to +85°C, f
AMB
12 clock
cycles
1.5 clock cycles
±1
100
50
±1 ±2
ksps ksps
LSB MCP3204/3208-B
72 dB V
86 dB VIN = 0.1V to 4.9V@1kHz
VNote2
DD
0.001
V
SS
IN- V
V
REF
150
3
REF
+IN-
µA µA CS
V
VSS-100 VSS+100 mV
= 100ksps and
SAMPLE
V
= V
= V
REF REF
= 5V = 2.7V
DD
V
DD
MCP3204/3208-C
temperature
IN = 0.1V to 4.9V@1kHz IN = 0.1V to 4.9V@1kHz
= VDD = 5V
DS21298B-page 2 Preliminary 1999 Microchip Technology Inc.
MCP3204/3208
ELECTRICAL CHARACTERISTICS (CONTINUED)
All parameters apply at VDD = 5V, VSS = 0V, V f
CLK
= 20*f
, unless otherwise noted.
SAMPLE
PARAMETER SYMBOL MIN. TYP. MAX. UNITS CONDITIONS
Analog Inputs (Continued)
Switch Resistance 1K See Figure 4-1 Sample Capacitor 20 pF See Figure 4-1
Digital Input/Output
Data Coding Format Straight Binary High Level Input Voltage V
Low Level Input Voltage V High Level Output Voltage V Low Level Output Voltage V Input Leakage Current I
Output Leakage Current I Pin Capacitance
(All Inputs/Outputs)
LO
CIN, C
IH
IL
OH
OL
LI
OUT
Timing Parameters
Clock Frequency f
Clock High Time t Clock Low Tim e t
Fall To First Rising CLK
CS Edge
Data Input Setup Time t Data Input Hold Time t CLK Fall To Output Data Valid t CLK Fall To Output Enable t CS
Rise To Output Disable t
CS
Disable Time t
Rise Time t
D
OUT
D
Fall Time t
OUT
CLK
t
SUCS
CSH
HI
LO
SU
HD
DO
EN
DIS
R
F
Power Requirements
Operating Voltage V Operating Current I
Standby Current I
DD
320
DD
DDS
Note 1: This parameter is guaranteed by characterization and not 100% tested. Note 2: See graphs that relate linearity performance to V Note 3: Because the sampl e c ap wil l eventually los e c ha rge, effective clock rates below 10kHz ca n a ffec t l ine arity
performance, especially at elevated temperatures. See Section 6.2 for more information.
REF
0.7 V
= 5V, T
DD
= -40°C to +85°C, f
AMB
0.3 V
DD
V V
= 100ksps and
SAMPLE
4.1 V IOH = -1mA, VDD = 4.5V
0.4 V IOL = 1mA, VDD = 4.5V
-10 10 µA VIN = VSS or V
-10 10 µA V
= VSS or V
OUT
DD
DD
10 pF VDD = 5.0V (Note 1)
T
= 25°C, f = 1 MHz
AMB
2.0
1.0
MHz MHz
VDD = 5V (Note 3) VDD = 2.7V (Note 3)
250 ns 250 ns 100 ns
50 ns
50 ns 200 ns See Test Circuits, Figure 1-2 200 ns See Test Circuits, Figure 1-2 100 ns See Test Circuits, Figure 1-2
500 ns
100 ns See Test Circuits, Figure 1-2
(Note 1)
100 ns See Test Circuits, Figure 1-2
(Note 1)
2.7 5.5 V
225
400 µA VDD = V
VDD = V
= 5V, D
REF
= 2.7V, D
REF
0.5 2 µA CS = VDD = 5.0V
levels.
REF
unloaded
OUT
unloaded
OUT
1999 Microchip Technology Inc. Preliminary DS21298B-page 3
MCP3204/3208
t
CSH
CS
t
SUCS
CLK
t
t
HD
SU
D
IN MSB IN
D
OUT
FIGURE 1-1: Serial Interface Timing.
Load circuit for tR, t
D
OUT
1.4V
3K
= 100pF
C
L
F, tDO
Test Point
t
t
LO
HI
t
t
EN
DO
NULL BIT
MSB OUT
t
R
Load circuit for
t
F
t
DIS
LSB
t
and t
DIS
EN
Test Point
V
DD
3K
D
OUT
100pF
V
SS
VDD/2
t
Waveform 2
DIS
tEN Waveform
t
Waveform 1
DIS
Voltage Waveforms for tR, t
D
OUT
t
R
Voltage Waveforms for t
CLK
D
OUT
F
V
OH
V
OL
t
F
DO
t
DO
CS
CLK
D
OUT
Voltage Waveforms for t
Voltage Waveforms for t
CS
D
OUT
Waveform 1*
D
OUT
EN
12
t
EN
DIS
V
IH
T
DIS
3
4
B11
90%
10%
Waveform 2†
* Waveform 1 is for an output with internal con di-
tions such that the output is high, unless dis­abled by the output control.
† Waveform 2 is for an output with internal condi-
tions such that the output is low, unless disabled by the output control.
FIGURE 1-2: Test Circuits.
DS21298B-page 4 Preliminary 1999 Microchip Technology Inc.

2.0 TYPICAL PERFORMANCE CHARACTERISTICS

Note: Unless otherwise indicated, V
DD
= V
= 5V, VSS = 0V, f
REF
SAMPLE
= 100ksps, f
MCP3204/3208
CLK
= 20* f
SAMPLE,TA
= 25°C
1.0
0.8
0.6
0.4
0.2
0.0
-0.2
INL (LSB)
-0.4
-0.6
-0.8
-1.0 0 25 50 75 100 125 150
Positive INL
Negative INL
Sample Rate (ksps)
FIGURE 2-1: Integral Nonlinearity (INL) vs. Sample Rate.
3.0
2.5
2.0
1.5
1.0
0.5
0.0
-0.5
INL(LSB)
-1.0
-1.5
-2.0
-2.5
-3.0 0123456
Positive INL
Negative INL
V
(V)
REF
2.0
VDD = V
= 2.7V
1.5
1.0
0.5
0.0
-0.5
INL (LSB)
-1.0
-1.5
-2.0
REF
Positive INL
Negative INL
0 1020304050607080
Sample Rate (ksps)
FIGURE 2-4: Integral Nonl inearity (IN L) vs. Sample Rate (V
= 2.7V).
DD
2.0
1.5
1.0
0.5
0.0
-0.5
INL(LSB)
-1.0
-1.5
-2.0
0.0 0.5 1.0 1.5 2.0 2.5 3.0
Positive INL
Negative INL
V
REF
(V)
FIGURE 2-2: Integral Nonlinearity (INL) vs. V
1.0
0.8
0.6
0.4
0.2
0.0
-0.2
INL (LSB)
-0.4
-0.6
-0.8
-1.0 0 512 1024 1536 2048 2560 3072 3584 4096
REF.
Digital Code
FIGURE 2-3: Integral Nonlinearity (INL) vs. Code (Representative Part).
FIGURE 2-5: Integral Nonlinearity (INL) vs. V
= 2.7V).
(V
DD
1.0
VDD = V
= 2.7V
REF
= 50ksps
F
SAMPLE
0 512 1024 1536 2048 2560 3072 3584 4096
INL (LSB)
0.8
0.6
0.4
0.2
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
Digital Code
FIGURE 2-6: Integral Nonlinearity (INL) vs. Code (Representative Part, V
= 2.7V).
DD
REF
1999 Microchip Technology Inc. Preliminary DS21298B-page 5
MCP3204/3208
Note: Unless otherwise indicated, V
1.0
0.8
0.6
0.4
0.2
0.0
-0.2
INL (LSB)
-0.4
-0.6
-0.8
-1.0
-50 -25 0 25 50 75 100
Positive INL
Negative INL
DD
= V
= 5V, VSS = 0V, f
REF
Temperature (°C)
FIGURE 2-7: Integral Nonlinearity (INL) vs. Temperature.
1.0
0.8
0.6
0.4
0.2
0.0
-0.2
DNL (LSB)
-0.4
-0.6
-0.8
-1.0 0 25 50 75 100 125 150
Positive DNL
Negativ e DNL
Sample Rate (ksps)
SAMPLE
= 100ksps, f
1.0
VDD = V
0.8
F
SAMPLE
0.6
0.4
0.2
0.0
-0.2
INL (LSB)
-0.4
-0.6
-0.8
-1.0
-50 -25 0 25 50 75 100
CLK
= 2.7V
REF
= 50ksps
= 20* f
SAMPLE,TA
Positive INL
Negative INL
= 25°C
Temperature (° C )
FIGURE 2-10: Integral Nonlinearity (INL) vs.
VDD = V
= 2.7V).
DD
= 2.7V
REF
Positive DNL
Negative DNL
Sample Rate (ksps)
Temperature (V
2.0
1.5
1.0
0.5
0.0
-0.5
DNL (LSB)
-1.0
-1.5
-2.0 0 10203040506070
FIGURE 2-8: Differential Nonlinearity (DNL) vs. Sample Rate.
3.0
2.0
1.0
0.0
DNL (LSB)
-1.0
-2.0
-3.0 012345
Positive DNL
Negative DNL
V
(V)
REF
FIGURE 2-9: Differential Nonlinearity (DNL) vs. V
REF.
FIGURE 2-11: Differential Nonlinearity (DNL) vs.
.
= 2.7V).
DD
Positive DNL
Negative DNL
V
REF
(V)
VDD = V F
SAMPLE
= 2.7V
REF
= 50ksps
REF
Sample Rate (V
3.0
2.0
1.0
0.0
DNL (LSB)
-1.0
-2.0
-3.0
0.00.51.01.52.02.53.0
FIGURE 2-12: Differe nti al N onl ine arity (DNL) vs . V (VDD = 2.7V)
DS21298B-page 6 Preliminary 1999 Microchip Technology Inc.
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