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MI 3394 CE MultiTesterXA
Instruction Manual
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METREL MI 3394 CE MultiTesterXA Instruction Manual

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CE MultiTesterXA
MI 3394
Instruction manual
Ver. 3.4.13, Code no.20 752 432
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Mark on your equipment certifies that this equipment meets the requirements of the all applicable EU (European Union) regulations.
Distributor:
Metrel d.d. Ljubljanska cesta 77 SI-1354 Horjul E-mail: metrel@metrel.si http://www.metrel.si
© 2019 Metrel The trade names Metrel, Smartec, Eurotest, Autosequence are trademarks registered or
pending in Europe and other countries No part of this publication may be reproduced or utilized in any form or by any means without permission in writing from METREL.
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i. About the Instruction manual
Version note: Ver. 3.1.6 and higher relates to HW 3 version. This Instruction manual contains detailed information on the CE MultiTesterXA, its key
features, functionalities and use.
It is intended for technically qualified personnel responsible for the product and its use. Please note that LCD screenshots in this document may differ from the actual instrument
screens in details due to firmware variations and modifications.
Version note: Ver. 3.3.12 has added reference to EN 61180 standard.
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MI 3394 CE MultiTesterXA Table of contents
TABLE OF CONTENTS
1 General description ....................................................................................................... 7
1.1 Warnings and notes .................................................................................................... 7
1.1.1 Safety warnings ....................................................................................................... 7
1.1.2 Warnings related to safety of measurement functions ............................................. 7
1.1.2.1 HV AC, HV DC, HV AC programmable, HV DC programmable ....................... 7
1.1.2.2 Diff. Leakage, Ipe Leakage, Touch Leakage, Power, Leak’s & Power ............. 8
1.1.2.3 Insulation resistance ........................................................................................ 8
1.1.3 Markings on the instrument ..................................................................................... 8
1.2 Standards applied ................................................................ ....................................... 9
2 Instrument set and accessories ................................................................................. 10
2.1 Standard set of the instrument .................................................................................. 10
2.2 Optional accessories ................................................................................................. 10
3 Instrument description................................................................................................ 11
3.1 Front panel ................................................................................................................ 11
4 Instrument operation .................................................................................................. 12
4.1 General meaning of keys .......................................................................................... 12
4.2 General meaning of touch gestures: .......................................................................... 12
4.3 Safety checks ............................................................................................................ 13
4.4 Symbols and messages ............................................................................................ 13
4.5 Instrument main menu ............................................................................................... 17
4.6 General settings ................................ ........................................................................ 18
4.6.1 Language .............................................................................................................. 19
4.6.2 Date and time ........................................................................................................ 19
4.6.3 Profiles .................................................................................................................. 19
4.6.4 Workspace Manager ............................................................................................. 19
4.6.5 Auto Sequence® groups ........................................................................................ 20
4.6.6 User accounts ....................................................................................................... 20
4.6.6.1 Signing in ...................................................................................................... 20
4.6.6.2 Changing user password, signing out ............................................................ 21
4.6.6.3 Managing accounts ....................................................................................... 22
4.6.6.4 Edit user accounts ................................................................ ......................... 24
4.6.6.5 Setting Blackbox password ........................................................................... 25
4.6.7 Change password for HV functions ....................................................................... 26
4.6.8 Settings ................................................................................................................. 27
4.6.9 Devices ................................................................................................................. 29
4.6.10 Initial Settings .................................................................................................... 30
4.6.11 About ................................................................................................................. 30
4.7 Instrument profiles ..................................................................................................... 31
4.8 Workspace Manager ................................................................................................. 31
4.8.1 Workspaces and Exports ....................................................................................... 31
4.8.2 Workspace Manager main menu ........................................................................... 32
4.8.2.1 Operations with Workspaces ......................................................................... 33
4.8.2.2 Operations with Exports ................................................................................ 33
4.8.2.3 Adding a new Workspace .............................................................................. 34
4.8.2.4 Opening a Workspace ................................................................................... 35
4.8.2.5 Deleting a Workspace / Export ...................................................................... 35
4.8.2.6 Importing a Workspace.................................................................................. 36
4.8.2.7 Exporting a Workspace ................................................................................. 37
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MI 3394 CE MultiTesterXA Table of contents
4.9 Auto Sequence® groups ............................................................................................ 38
4.9.1 Auto Sequence® groups menu ............................................................................... 38
4.9.1.1 Operations in Auto Sequence® groups menu ................................................. 38
4.9.1.2 Selecting a group of Auto Sequences® .......................................................... 39
4.9.1.3 Deleting a group of Auto Sequences® ........................................................... 39
5 Memory Organizer ....................................................................................................... 41
5.1 Memory Organizer menu ........................................................................................... 41
5.1.1 Measurement statuses .......................................................................................... 42
5.1.2 Structure Objects ................................................................................................... 43
5.1.2.1 Measurement status indication under the Structure object ............................ 43
5.1.3 Selecting an active Workspace in Memory Organizer ............................................ 44
5.1.4 Adding Nodes in Memory Organizer ...................................................................... 45
5.1.5 Operations in Tree menu ....................................................................................... 46
5.1.5.1 Operations on measurements (finished or empty measurements) ................. 46
5.1.5.2 Operations on Structure objects .................................................................... 47
5.1.5.3 View / Edit parameters and attachments of a Structure object ....................... 49
5.1.5.4 Add a new Structure Object ........................................................................... 50
5.1.5.5 Add a new measurement ............................................................................... 51
5.1.5.6 Clone a Structure object ................................................................................ 52
5.1.5.7 Clone a measurement ................................................................................... 53
5.1.5.8 Copy & Paste a Structure object .................................................................... 53
5.1.5.9 Cloning and Pasting sub-elements of selected structure object ..................... 54
5.1.5.10 Copy & Paste a measurement ....................................................................... 55
5.1.5.11 Cut & Paste a Structure object with sub-items ............................................... 56
5.1.5.12 Delete a Structure object ............................................................................... 56
5.1.5.13 Delete a measurement .................................................................................. 57
5.1.5.14 Rename a Structure object ............................................................................ 59
5.1.5.15 Recall and Retest selected measurement ..................................................... 59
5.1.6 Searching in Memory Organizer ............................................................................ 61
6 Single tests .................................................................................................................. 64
6.1 Selection of single tests ............................................................................................. 64
6.1.1 Single test screens ................................................................................................ 66
6.1.1.1 Single test start screen .................................................................................. 66
6.1.1.2 Setting parameters and limits of single tests .................................................. 67
6.1.1.3 Single test screen during test ................................ ........................................ 67
6.1.1.4 Single test result screen ................................................................................ 69
6.1.1.5 Single test memory screen ................................................................ ............ 70
6.1.2 Single test (inspection) screens ............................................................................. 71
6.1.2.1 Single test (inspection) start screen ............................................................... 71
6.1.2.2 Single test (Inspection) screen during test ..................................................... 72
6.1.2.3 Single test (Inspection) result screen ............................................................. 73
6.1.2.4 Single test (inspection) memory screen ......................................................... 74
6.1.3 Help screens ......................................................................................................... 75
6.2 Single test measurements ......................................................................................... 76
6.2.1 Visual inspections .................................................................................................. 76
6.2.2 Continuity ................................................................ .............................................. 77
6.2.2.1 Compensation of test leads resistance .......................................................... 80
6.2.2.2 Limit Calculator ............................................................................................. 81
6.2.3 HV AC ................................................................................................................... 83
6.2.4 HV DC ................................................................................................................... 84
6.2.5 HV AC programmable ........................................................................................... 86
6.2.6 HV DC programmable ........................................................................................... 89
6.2.7 Insulation resistance (Riso, Riso-S) ....................................................................... 91
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6.2.8 Sub-leakage (Isub, Isub-S) .................................................................................... 93
6.2.9 Differential Leakage .............................................................................................. 95
6.2.10 Ipe Leakage ....................................................................................................... 97
6.2.11 Touch Leakage .................................................................................................. 99
6.2.12 Power .............................................................................................................. 100
6.2.13 Leak's & Power ................................................................................................ 103
6.2.14 Discharging Time ............................................................................................. 105
6.2.15 Functional inspections ..................................................................................... 108
7 Auto Sequences® ...................................................................................................... 110
7.1 Selection of Auto Sequences® ................................................................................. 110
7.1.1 Selecting an active Auto Sequence® group in Auto Sequences® menu ............... 110
7.1.2 Searching in Auto Sequences® menu .................................................................. 111
7.1.3 Structure organization of Auto Sequence® group ................................................. 113
7.2 Organization of Auto Sequence® tests ..................................................................... 114
7.2.1 Auto Sequence® view menu ................................................................ ................ 114
7.2.1.1 Auto Sequence® view menu (header is selected) ........................................ 114
7.2.1.2 Auto Sequence® view menu (measurement is selected) .............................. 115
7.2.1.3 Auto Sequence® Configurator menu ............................................................ 116
7.2.1.4 Indication of Loops ...................................................................................... 117
7.2.1.5 Managing multiple points ............................................................................. 117
7.2.2 Step by step execution of Auto Sequences® ....................................................... 117
7.2.3 Auto Sequence® result screen ............................................................................. 119
7.2.4 Auto Sequence
®
memory screen......................................................................... 121
8 Maintenance .............................................................................................................. 122
8.1 Periodic calibration .................................................................................................. 122
8.2 Fuses ...................................................................................................................... 122
8.3 Service .................................................................................................................... 122
8.4 Cleaning .................................................................................................................. 122
9 Communications ....................................................................................................... 123
9.1 USB and RS232 communication with PC ................................................................ 123
9.2 Bluetooth communication ........................................................................................ 123
9.3 Bluetooth communication with printers and scanners .............................................. 124
9.4 Ethernet communication .......................................................................................... 124
9.5 RS232 communication with other external devices ................................................. 124
9.6 Connections to test adapters ................................................................................... 124
9.6.1 Test connector TC1 ............................................................................................. 124
9.7 INPUTs ................................................................................................................... 125
9.8 OUTPUTs ............................................................................................................... 126
10 Technical specifications ........................................................................................... 127
10.1 HV AC, HV AC programmable ................................................................................ 127
10.2 HV DC, HV DC programmable ................................................................ ................ 127
10.3 Continuity ................................................................................................................ 128
10.4 Insulation Resistance, Insulation Resistance-S ....................................................... 129
10.5 Substitute Leakage Current, Substitute Leakage Current - S .................................. 129
10.6 Differential Leakage current .................................................................................... 130
10.7 PE leakage current .................................................................................................. 130
10.8 Touch leakage current ............................................................................................. 130
10.9 Power ...................................................................................................................... 131
10.10 Leak’s & Power ....................................................................................................... 132
10.11 Discharging time ..................................................................................................... 134
10.12 General data ........................................................................................................... 134
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Appendix A - Structure objects in CE MultiTesterXA ......................................................... 136
Appendix B - Profile Notes ................................................................................................... 137
Appendix C - Print labels and write / read RFID / NFC tags ............................................... 138
C.1 PAT tag format ........................................................................................................ 138
C.2 Generic tag format .................................................................................................. 138
Appendix D - Default list of Auto Sequences® .................................................................... 140
Appendix E - Programming of Auto Sequences® on Metrel ES Manager ......................... 141
E.1 Auto Sequence® Editor workspace .......................................................................... 141
E.2 Managing of Auto Sequence® groups ...................................................................... 142
E.2.1 Auto Sequence® Name, Description and Image editing ................................... 144
E.2.2 Search within selected Auto Sequence® group ................................................ 145
E.3 Elements of an Auto Sequence® ............................................................................. 146
E.3.1 Auto Sequence® steps ..................................................................................... 146
E.3.2 Single tests ................................ ...................................................................... 146
E.3.3 Flow commands .............................................................................................. 146
E.3.4 Number of measurement steps ........................................................................ 146
E.4 Creating / modifying an Auto Sequence® ................................................................ 147
E.5 Description of flow commands ................................................................ ................. 148
E.6 Custom Inspections programming ........................................................................... 153
E.6.1 Creating and editing Custom Inspections ........................................................ 153
E.6.2 Applying Custom Inspections........................................................................... 155
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MI 3394 CE MultiTesterXA General description
Read before use

1 General description

1.1 Warnings and notes

1.1.1 Safety warnings

In order to reach high level of operator safety while carrying out various measurements using the CE MultiTesterXA instrument, as well as to keep the test equipment undamaged, it is necessary to consider the following general warnings:
Read this Instruction manual carefully, otherwise use of the instrument may be
dangerous for the operator, for the instrument or for the equipment under test!
Consider warning markings on the instrument! If the test equipment is used in manner not specified in this Instruction manual the
protection provided by the equipment may be impaired!
Do not use the instrument and accessories if any damage is noticed! Regularly check the instrument and accessories for correct functioning to avoid
hazard that could occur from misleading results.
Consider all generally known precautions in order to avoid risk of electric shock
while dealing with hazardous voltages!
Use only standard or optional test accessories supplied by your distributor! Only test adapters provided or approved by Metrel should be connected to TC1
(test and communication) connectors.
Use only earthed mains outlets to supply the instrument! In case a fuse has blown refer to chapter 8.2 Fuses in this Instruction manual to
replace it!
Instrument servicing and calibration is allowed to be carried out only by a
competent authorized person!
Metrel is not responsible for the content of the user-programmed Auto
Sequences®!

1.1.2 Warnings related to safety of measurement functions

1.1.2.1 HV AC, HV DC, HV AC programmable, HV DC programmable
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MI 3394 CE MultiTesterXA General description
A dangerous voltage up to 5 kV
or 6 kVDC is applied to the HV instrument outputs
AC
during the test. Therefore special safety consideration must be taken when performing this test!
Only a skilled person familiar with hazardous voltages can perform this
measurement!
DO NOT perform this test if any damage or abnormality (test leads, instrument) is
noted!
Never touch exposed probe tip, connections equipment under test or any other
energized part during the measurements. Make sure that NOBODY can contact them either!
DO NOT touch any part of test probe in front of the barrier (keep your fingers behind
the finger guards on the probe) – possible danger of electric shock!
It is a good practice to use lowest possible trip-out current.
1.1.2.2 Diff. Leakage, Ipe Leakage, Touch Leakage, Power, Leak’s & Power
Load currents higher than 10 A can result in high temperatures of fuse holders and
On/Off switch! It is advisable not to run tested devices with load currents above 10 A for more than 15 minutes. Recovery period for cooling is required before proceeding with tests! Maximum intermittent duty cycle for measurements with load currents higher than 10 A is 50 %.
1.1.2.3 Insulation resistance
Do not touch the test object during the measurement or before it is fully discharged!
Risk of electric shock!

1.1.3 Markings on the instrument

Read the Instruction manual with special care to safety operation«. The
symbol requires an action!
Dangerous high voltage is present on terminals during the test. Consider all
precautions in order to avoid risk of electric shock.
Mark on your equipment certifies that this equipment meets the requirements
of the all applicable EU (European Union) regulations.
This equipment should be recycled as electronic waste.
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MI 3394 CE MultiTesterXA General description
EN 61326-1
Electrical equipment for measurement, control and laboratory use - EMC requirements – Part 1: General requirements Class B (Portable equipment used in controlled EM environments)
EN 61010-1
Safety requirements for electrical equipment for measurement, control, and laboratory use – Part 1: General requirements
EN 61010-2-030
Safety requirements for electrical equipment for measurement, control and laboratory use – Part 2-030: Particular requirements for testing and measuring circuits
EN 61010-031
Safety requirements for electrical equipment for measurement, control and laboratory use – Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test
EN 61557
Electrical safety in low voltage distribution systems up to 1 000 V a.c. and 1 500 V d.c. – Equipment for testing, measuring or monitoring of protective measures Instrument complies with all relevant parts of EN 61557 standards.
EN 60204-1
Safety of machinery - Electrical equipment of machines - Part 1: General requirements
EN 60335
Household and similar electrical appliances
EN 60598
Safety of lighting equipment
EN 60950
Information technology equipment – Safety
EN 61010
Safety requirements for electrical equipment for measurement, control, and laboratory use
EN 61180
High-voltage test techniques for low-voltage equipment - Definitions, test and procedure requirements, test equipment
EN 61439
Low-voltage switchgear and controlgear assemblies
VDE 0701-702
Inspection after repair, modification of electrical appliances – Periodic inspection on electrical appliances General requirements for electrical safety
EN 50191
Erection and operation of electrical test equipment

1.2 Standards applied

The CE MultiTesterXA instrument is manufactured and tested according to the following regulations, listed below.
Electromagnetic compatibility (EMC)
Safety (LVD)
Functionality
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MI 3394 CE MultiTesterXA Instrument set and accessories

2 Instrument set and accessories

2.1 Standard set of the instrument

Instrument MI 3394 CE MultitesterXA  Bag for accessories  HV test probes 2 m, 2 pcs  Continuity test lead set 2.5 m, 2 pcs  Continuity test lead red 1.5 m / 2.5 mm2  Test lead black 2.5 m  Test lead red 2.5 m  Alligator clips black 2 pcs  Alligator clips red 3 pcs  Mains cable (2 m, wire cross-section 3 x 1.5 mm2)  RS232 cable  USB cable  Calibration Certificate  Short form instruction manual  CD with instruction manual (full version) and PC SW Metrel ES Manager

2.2 Optional accessories

See the attached sheet for a list of optional accessories that are available on request from your distributor.
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MI 3394 CE MultiTesterXA Instrument description
1
Mains supply connector
2
F1, F2 fuses (F 5 A / 250 V)
3
F3, F4 fuses (T 16 A / 250 V)
4
On / Off switch
5
Test connections TC1 for external test adapters
6
Mains test socket
7
P/S (probe) connector
8
Keypad
9
HV output connectors
10
HV output warning lamp
11
Continuity connectors
12
Insulation / Subleakage connectors
13
Discharging time connectors
14
Colour TFT display with touch screen
15
Control outputs
16
Control inputs
17
Multipurpose RS232-1 port
18
Multipurpose RS232-2 port
19
Ethernet connector
20
USB connector
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MicroSD card slot

3 Instrument description

3.1 Front panel

Figure 3.1: Front panel
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MI 3394 CE MultiTesterXA Instrument operation
Cursor keys are used to:
- select appropriate option
Enter key is used to:
- confirm selected option
- start and stop measurements
Escape key is used to:
- return to previous menu without changes
- abort measurements
Option key is used to:
- expand column in control panel
- show detailed view of options
HV Test key is used to:
- start and stop HV tests
Tap (briefly touch surface with fingertip) is used to:
- select appropriate option
- confirm selected option
- start and stop measurements
Swipe (press, move, lift) up/ down is used to:
- scroll content in same level
- navigate between views in same level
long
Long press (touch surface with fingertip for at least 1 s) is used to:
- select additional keys (virtual keyboard)
- enter cross selector from single test screens
Tap Escape icon is used to:
- return to previous menu without changes
- abort measurements

4 Instrument operation

The CE MultiTesterXA can be manipulated via a keypad or touch screen.

4.1 General meaning of keys

4.2 General meaning of touch gestures:

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MI 3394 CE MultiTesterXA Instrument operation
Supply voltage warning
Possible causes:
No earth connection.  Instrument is connected to an IT earthing
system. Press YES to continue normally or NO to continue in a limited mode (measurements are disabled).
Warning: The instrument must be earthed properly to work
safely!
Resistance L-N > 30 kΩ
In pre-test a high input resistance was measured. Possible causes:
Device under test is not connected or switched
on
Input fuse of device under test is blown.
Select YES to proceed with or NO to cancel measurement.
Resistance L-N < 10 Ω
In pre-test a very low resistance of the device under test supply input was measured. This can result in a high current after applying power to the device under test. If the too high current is only of short duration (caused by a short inrush current) the test can be performed otherwise not.
Select YES to proceed with or NO to cancel measurement

4.3 Safety checks

At start up and during operation the instrument performs various safety checks to ensure safety and to prevent any damage. These safety pre-tests are checking for:
Correct input mains voltage  Presence of input PE connection,  Any external voltage against earth on mains test socket  Excessive leakage currents through measuring I/Os,  Too low resistance between L and N of tested device,  Proper operation of safety relevant internal electronic circuits
If a safety check fails, an appropriate warning message will be displayed and safety measures will be taken. The warnings and safety measures are described in chapter 4.4 Symbols and messages.

4.4 Symbols and messages

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MI 3394 CE MultiTesterXA Instrument operation
Resistance L-N < 30 Ω
In pre-test a low input resistance of the device under test was measured. This can result in a high current after applying power to the device. If the high current is only of short duration (caused by a short inrush current) the test can be performed, otherwise not.
Select YES to proceed with or NO to cancel measurement.
Warning for improper supply voltage condition. If pressing OK instrument will continue to work in a limited mode (measurements are disabled).
In pre-test an external voltage between C1/P1 and C2/P2 terminals was detected. The measurement was cancelled. Press OK to continue.
In pre-test a too high external voltage was detected between P and PE terminals. The measurement was cancelled. Press OK to continue.
In pre-test a too high external voltage was detected between ISO/SUB and PE terminals. The measurement was cancelled. Press OK to continue.
In pre-test a possible high leakage current was detected. It is likely that a dangerous leakage current (higher than 3.5 mA) will flow after applying power to the device under test.
Select YES to proceed with or NO to cancel measurement.
The measured leakage (Idiff, Ipe, Itouch) current was higher than 20 mA. Measurement was aborted. Press OK to continue.
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MI 3394 CE MultiTesterXA Instrument operation
The load current exceeded the highest upper limit of 10 A for the Discharging time test. Measurement was aborted. Press OK to continue.
The load current continuously exceeded 10 A for more than 4 min (moving average) in Power and Leakage tests. Measurement was stopped for safety. Press OK to continue.
The load current exceeded the highest upper limit of 16 A for the Power and Leakage tests. Measurement was aborted. Press OK to continue.
Warning for restart of the instrument to set new Ethernet settings. This message appears on exit from Settings menu after changing Ethernet settings. Press OK to continue.
The instrument is overheated. The measurement can’t
be carried out until the icon disappears. Press OK to continue.
The device under test should be switched on (to ensure that the complete circuit is tested).
Test voltage in Insulation resistance measurement is too low.
Measurement result is scaled to 110 V.
Red dot indicates phase of measurement where higher leakage was measured. Applicable only if phase reversal is enabled during the measurement.
Test leads resistance in Continuity P/S - PE measurement is not compensated.
Test leads resistance in Continuity P/S - PE measurement is compensated.
Warning! A high voltage is / will be present on the instrument
output! (Withstanding test voltage, Insulation test voltage, or mains voltage).
Warning! A very high and dangerous voltage is / will be present
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MI 3394 CE MultiTesterXA Instrument operation
on the instrument output! (Withstanding test voltage).
Test passed.
Test failed.
Conditions on the input terminals allow starting the measurement; consider other displayed warnings and messages.
Conditions on the input terminals do not allow starting the measurement, consider displayed warnings and messages.
Proceeds to next measurement step
Stop the measurement.
Expands column in control panel.
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MI 3394 CE MultiTesterXA Instrument operation
Figure 4.1: Main menu
Single Tests
Menu with single tests, see chapter 6 Single tests.
Auto Sequences®
Menu with customized test sequences, see chapter 7 Auto Sequences®.
Memory Organizer Menu for working with and documentation of test data, see chapter 5
Memory Organizer.
General Settings Menu for setup of the instrument, see chapter 4.6 General settings.

4.5 Instrument main menu

From the instrument Main Menu different main operation menus can be selected.
Options
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MI 3394 CE MultiTesterXA Instrument operation
Figure 4.2: Setup menu
Language
Instrument language selection
Date / Time Instruments Date and time.
Workspace Manager
Manipulation with project files. Refer to chapter 4.8 Workspace Manager for more information.
Auto Sequence® groups
Manipulation with lists of Auto Sequences®. Refer to chapter 4.9 Auto
Sequence® groups for more information.
User accounts
Users settings. Refer to chapter 4.6.6 User accounts for more information.
Profiles
Selection of available instrument profiles.
Settings Setting of different system parameters, including Ethernet settings.
Devices
Selection of external devices. Refer to chapter 4.6.9 Devices for more information.

4.6 General settings

In the General Settings menu general parameters and settings of the instrument can be viewed or set.
Options in General Settings menu
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MI 3394 CE MultiTesterXA Instrument operation
Change password Changing password for enabling HV tests.
Initial Settings Factory settings.
About Instrument info.
Figure 4.3: Select language menu
Figure 4.4: Setting data and time menu

4.6.1 Language

In this menu the language of the instrument can be set.

4.6.2 Date and time

In this menu date and time of the instrument can be set.

4.6.3 Profiles

Refer to Chapter 4.7 Instrument profiles for more information.

4.6.4 Workspace Manager

Refer to Chapter 4.8 Workspace Manager for more information.
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MI 3394 CE MultiTesterXA Instrument operation
Last signed in user is highlighted and displayed in the first row.
Another user can be selected from the User accounts list.
Enters User password entry screen.

4.6.5 Auto Sequence® groups

Refer to Chapter 4.9 Auto Sequence® groups for more information.

4.6.6 User accounts

In this menu user accounts can be managed:
Setting if signing in to work with the instrument is required or not.  Adding and deleting new users, setting their user names and passwords.
The demand to sign in can prevent from unauthorized persons to work with the instrument. If a user account is set and the user is signed in, the user's name will be stored in memory for each measurement. The user accounts can be managed by the administrator. User account password consists of an up to 4 digit number. Individual users can change their passwords. The administrator password consists of an up to 15 characters. Factory set administrator password is ADMIN. If the password is forgotten the second administrator password can be used. This password always unlocks the Account manager and is delivered with the instrument.
4.6.6.1 Signing in
By selecting User Accounts icon in Settings menu, Sign in menu appear on the screen. Same screen appear when instrument is switched on, if Sign in is set to required, see Chapter 4.6.6.3 Managing accounts for details.
Figure 4.5: Sign in menu
Options User signing in:
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MI 3394 CE MultiTesterXA Instrument operation
Enter the User password through the on-screen numerical keyboard and confirm .
User profile screen is opened as presented on Figure 4.6.
Enters Account manager password entry screen.
Enter the Administrator password through on­screen keyboard and confirm .
Account manager screen is opened as presented on Figure 4.7.
Signed in user is displayed and highlighted on the top of the screen.
Sign out current user. Sign in screen appear, see Chapter 4.6.6.1 Signing in for details.
Enters Account manager password entry screen, see Chapter 4.6.6.1 Signing in.
Administrator signing in:
4.6.6.2 Changing user password, signing out
After user completed Sign in procedure, User profile menu screen is presented. Same screen is presented if signed in user selects User accounts from General Settings menu.
Figure 4.6: User profile menu
Options
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MI 3394 CE MultiTesterXA Instrument operation
Change User password. Numerical user password entry keyboard appear on the screen.
First step: enter current user password and confirm
entry.
Wrong entry is reported by message. Confirm message, clear wrong password and repeat first step.
Second step: enter new user password and confirm
entry. Password change is confirmed with
short message appearance.
4.6.6.3 Managing accounts
To access Account manager menu, Administrator should be signed in, see Chapter 4.6.6.1 Signing in for details.
Administrator can set sign in requirement, change Administrator password and edit user accounts. Appearance of Account manager screen depends on previous settings, see Figure 4.7 below.
Figure 4.7: Account manager menu
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MI 3394 CE MultiTesterXA Instrument operation
User sign in is not required.
User sign in is required. Presented setting requires sign in, when instrument is switched on. Sign in could also be set to be required on every restart of instrument.
Change Administrator password. Alphanumerical keyboard appears on the screen.
First step: enter current Administrator password and confirm entry.
Wrong entry is reported by message. Confirm message, clear wrong password and repeat first step.
Second step: enter new Administrator password and confirm entry. Password change is
confirmed with short message appearance. Account manager screen appear again.
Administrator can continue to manage accounts or returns to Settings and Main menu.
Edit account icon. Enter Edit accounts screen, presented on Figure
4.8. For details see chapter 4.6.6.4 Edit user accounts.
Options
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Add New user account. Add New menu appear on the screen.
Add New selection options: Username opens onscreen alphanumerical
keyboard for new user name entry
Password opens onscreen numerical keyboard
for new user password entry
Add stores new user to User account list. Cancel interrupts procedure
New user account password must be entered; if not, warning message appears on the screen.
Delete all user accounts. Warning message appears on the screen.
4.6.6.4 Edit user accounts
Administrator can add new user and set his password, change user existing password, delete user account and delete all user accounts. Edit accounts screen is accessed by selecting Edit account icon from Account manager options screen, see Chapter 4.6.6.3 Managing accounts.
Figure 4.8: Edit accounts screen – user list on the left, user selected on the right
User accounts selected: Options
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Warning message selection options: YES: confirmation of deletion, all user accounts
will be deleted
NO: interrupts procedure and return to Edit
accounts menu
Set password For selected user, password is set, numerical keyboard appears on the screen.
Enter user password and confirm entry. Old user password is automatically overwritten
without warning or confirmation.
Delete selected user account. Warning message appears on the screen.
Warning message selection options: YES: confirmation of deletion, selected user
account will be deleted
NO: interrupts procedure and return to Edit
accounts menu
User selected (user is highlighted ): Options
4.6.6.5 Setting Blackbox password
Blackbox password can be set by administrator from the Account manager menu. Set Blackbox password is valid for all users. Default Blackbox password is empty (disabled).
Options
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Add or edit Blackbox password. Enter to modify.
Keyboard for entering new Blackbox password is opened. Empty string disables password.
Confirm entry.
Blackbox password is changed.

4.6.7 Change password for HV functions

In this menu the password to enable starting of HV functions can be set, changed or disabled.
Figure 4.9: Change password menu
Notes:
Default password is 0000. An empty entry disables the password. If password is lost, entry 4648 resets password to default.
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Option
Description
Touch screen
ON – touch screen is active. OFF – touch screen is deactivated.
Keys & touch sound
ON – sound is active. OFF – sound is deactivated.
Test mode
Standard – Visual and Functional inspection status fields should be set manually.
Expert – All Visual and Functional inspection status fields are filled automatically with PASS status.
Auto Seq. flow
Ends if fail – Auto Sequence will end after first fail status of measurement / inspection is detected. Proceeding tests will be skipped.
Proceeds if fail – Auto Sequence will proceed even if fail status of measurement / inspection is detected.
Ext. Keyboard
ON – enable external BT keyboard. (See A 1578 manual for details.) OFF – external BT keyboard is disabled.
Option
Available selection
Description
Obtain an IP
[AUTOMATICALLY, MANUAL]
When the manual mode is chosen, the user must provide the correct network settings. Otherwise the instrument is automatically assigned an IP address from the local network using the DHCP protocol.
IP address
XXX.XXX.XXX.XXX
Displays the instrument’s IP address. In manual mode, the user should enter the correct value.
Port number
0 – 65535
Selects the port number on which the instrument listens for incoming connections. The instrument communicates using UDP/IP protocol. Max. UDP packet length is 1024

4.6.8 Settings

In this menu different general parameters can be set.
Figure 4.10: Settings menu
Setting options:
Ethernet setting options:
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bytes.
Subnet mask
XXX.XXX.XXX.XXX
In manual mode, the user should enter the correct value.
Default gateway
XXX.XXX.XXX.XXX
In manual mode, depending on the network topology, the use can enter the correct value or leave it as it is, if not needed.
Preferred DNS server
XXX.XXX.XXX.XXX
In manual mode, depending on the network topology, the use can enter the correct value or leave it as it is, if not needed.
Alternate DNS server
XXX.XXX.XXX.XXX
In manual mode, depending on the network topology, the use can enter the correct value or leave it as it is, if not needed.
Host name
MI3394_XXXXXXXX
Displays the instrument’s unique name on the
local network. The host name consists of the instrument’s name and its serial number.
MAC address
XX:XX:XX:XX:XX:XX
Displays the instrument’s MAC address. User
can change the address in case of another device on the network using the same value.
Note:
Instrument will reset to apply new Ethernet settings (if modified).
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Writing devices
Type
Sets appropriate writing device (Serial printer, Bluetooth printer, RFID writer).
Port
Sets/views communication port of selected writing device.
Bluetooth device name
Goes to menu for pairing with selected Bluetooth device. Bluetooth dongle
Initializes Bluetooth Dongle.
Print labels
Selects label form size. See Appendix C - Print labels and write / read RFID / NFC tags for details.
Printed date
Selects date printed on label text area, Options: [Test date, Retest date]. See Appendix C - Print labels and write / read RFID / NFC tags for details.
Auto save
Sets simultaneous saving of finished Auto Sequence when label is printed or RFID / NFC tag is written. Options: [On print, On write, OFF] See chapter 7.2.3 Auto Sequence® result screen for details.
Tag format
Sets PAT tag / label format or generic tag / label format. See Appendix C - Print labels and write / read RFID / NFC tags for details.
Reading devices
Type
Sets appropriate reading device (QR or barcode scanner, RFID reader, android device via aMESM application).
Port
Sets/views communication port of selected reading device.
Bluetooth device name
Goes to menu for pairing with selected Bluetooth device.

4.6.9 Devices

In this menu operation with external devices is configured.
Figure 4.11: Device settings menu
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Figure 4.12: Initial settings menu

4.6.10 Initial Settings

In this menu internal Bluetooth module can be initialized and the instrument settings, measurement parameters and limits can be set to initial (factory) values.
Warning! Following customized settings will be lost when setting the instruments to initial settings:
Measurement limits and parameters Global parameters and System settings in General settings menu
Note: Following customized settings will stay:
Profile settings Data in memory Password for HV functions

4.6.11 About

In this menu instrument data (name, serial number, version and date of calibration) can be viewed.
Figure 4.13: Instrument info screen
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Loads the selected profile. The instrument will restart automatically with new profile loaded.
Enters option for deleting a profile.
Before deleting the selected profile user is asked for confirmation.
Loaded profiles can’t be deleted.

4.7 Instrument profiles

In this menu the instrument profile can be selected from the available ones.
Figure 4.14: Instrument profile menu
The instrument uses different specific system and measuring settings in regard to the scope of work or country it is used. These specific settings are stored in instrument profiles. By default each instrument has at least one profile activated. Proper licence keys must be obtained to add more profiles to the instruments. If different profiles are available they can be selected in this menu. Refer to Appendix B - Profile Notes for more information about functions specified by profiles.
Options

4.8 Workspace Manager

The Workspace Manager is intended to manage with different Workspaces and Exports stored on the microSD card.

4.8.1 Workspaces and Exports

The works with CE MultiTesterXA MI 3394 can be organized with help of Workspaces and Exports. Exports and Workspaces contain all relevant data (measurements, parameters, limits, structure objects) of an individual work.
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List of Workspaces.
Displays a list of Exports.
Adds a new Workspace. Refer to chapter 4.8.2.3 Adding a new
Workspace for more information.
List of Exports.
Displays a list of Workspaces.
Figure 4.15: Organization of Workspaces and Exports on microSD card
Workspaces are stored on microSD card on directory WORKSPACES, while Exports are stored on directory EXPORTS. Exports are suitable for making backups of important works or can be used for storage of works if the removable microSD card is used as a mass storage device. To work on the instrument an Export should be imported first from the list of Exports and converted to a Workspace. To be stored as Export data a Workspace should be exported first from the list of Workspaces and converted to an Export.

4.8.2 Workspace Manager main menu

In Workspace manager Workspaces and Exports are displayed in two separated lists.
Options
Figure 4.16: Workspace manager main menu
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Marks the opened Workspace in Memory Organizer. Opens the selected Workspace in Memory Organizer. Refer to chapters 5 Memory Organizer and 4.8.2.4 Opening a Workspace for
more information.
Deletes the selected Workspace. Refer to chapter 4.8.2.5 Deleting a Workspace / Export for more information.
Adds a new Workspace. Refer to chapter 4.8.2.3 Adding a new Workspace for more information.
Exports a Workspace to an Export Refer to chapter 4.8.2.7 Exporting a Workspace for more information.
4.8.2.1 Operations with Workspaces
Only one Workspace can be opened in the instrument at the same time. The Workspace selected in the Workspace Manager will be opened in the Memory Organizer.
Figure 4.17: Workspaces menu
Options
4.8.2.2 Operations with Exports
Figure 4.18: Workspace manager Exports menu
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Deletes the selected Export. Refer to chapter 4.8.2.5 Deleting a Workspace / Export for more information.
Imports a new Workspace from Export. Refer to chapter 4.8.2.6 Importing a Workspace for more information.
New workspaces can be added from the Workspace manager screen.
Enters option for adding a new Workspace.
Keypad for entering name of a new Workspace is displayed after selecting New.
After confirmation a new Workspace is added to the list of workspaces.
Options
4.8.2.3 Adding a new Workspace
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Workspace can be selected from a list in Workspace manager screen.
Opens a Workspace in Workspace manager.
The opened Workspace is marked with a blue dot. The previously opened Workspace will close automatically.
Workspace / Export to be deleted should be selected from the list of Workspaces / Exports.
Enters option for deleting a Workspace / Export.
Before deleting the selected Workspace / Export the user is asked for confirmation.
4.8.2.4 Opening a Workspace
4.8.2.5 Deleting a Workspace / Export
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Workspace / Export is deleted from the Workspace / Export list.
Select an Export file to be imported from Workspace manager Export list.
Enters option Import.
Before the import of the selected Export file the user is asked for confirmation.
The imported Export file is added to the list of Workspaces.
Note:
If a Workspace with the same name already exists the name of the imported Workspace will be changed (name_001, name_002, name_003, …).
4.8.2.6 Importing a Workspace
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Select a Workspace from Workspace manager list to be exported to an Export file.
Enters option for Export.
Before exporting the selected Workspace the user is asked for confirmation.
Workspace is exported to Export file and is added to the list of Exports.
Note:
If an Export file with the same name already exists the name of the Export file will be changed (name_001, name_002, name_003, …).
4.8.2.7 Exporting a Workspace
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Opens the selected group of Auto Sequences®. Previously selected group of Auto Sequences® will be closed automatically.
Refer to chapter 4.9.1.2 Selecting a group of Auto Sequences® for more

4.9 Auto Sequence® groups

The Auto Sequences® in CE MultiTesterXA MI 3394 are organized in Auto Sequence® groups stored in folders on the microSD memory card. Folders are located in Root\__MOS__\AT on the microSD card.
Figure 4.19: Organization of Auto Sequence® groups on microSD card
Each group contain similar Auto Sequences®. The Auto Sequence® groups menu is intended to manage with different Auto Sequences®.

4.9.1 Auto Sequence® groups menu

Auto Sequence® groups menu can be accessed from General settings menu followed by selection of Auto Sequence® groups menu. Another option to access it is from Main Auto Sequences® menu, see chapter 7.1 Selection of Auto Sequences®. In this menu lists of Auto Sequence® groups are displayed. Only one group can be active in the instrument at the same time. The group selected from the Auto Sequence® groups menu will be opened whenever Auto Sequences® menu is selected from the instrument Main menu, see chapter 4.5 Instrument main menu.
Figure 4.20: Auto Sequence® groups menu
4.9.1.1 Operations in Auto Sequence® groups menu
Options
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information.
Deletes the selected list of Auto Sequences®. Refer to chapter 4.9.1.3 Deleting a group of Auto Sequences® for more
information.
A group of Auto Sequences® should be selected first from the list of Auto Sequence® groups.
Enters option for selecting a highlighted group.
Selected group of Auto Sequences® is marked with a blue dot.
Note:
Previously selected group is closed automatically.
A group of Auto Sequences® to be deleted should be selected first from the list of Auto Sequence® groups.
Enters option for deleting the selected group.
Before deleting the selected group of Auto Sequences®, the user is asked for confirmation.
4.9.1.2 Selecting a group of Auto Sequences®
4.9.1.3 Deleting a group of Auto Sequences®
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A group of Auto Sequences® is deleted.
Note:
Selected Auto Sequences® group (marked with blue dot) cannot be deleted, warning message appear on the screen.
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5 Memory Organizer

Memory Organizer is a tool for storing and working with test data.

5.1 Memory Organizer menu

The data is organized in a tree structure with Structure objects and Measurements. CE MultiTesterXA has a fixed three level structure. The hierarchy of Structure objects in the tree is shown on Figure 5.1.
0th level 1st level 2nd level 3rd level
NODE
APPLIANCE FD (full description) measurement
APPLIANCE (short description) measurement
PROJECT
APPLIANCE FD
measurement
APPLIANCE
measurement
LOCATION
APPLIANCE FD
measurement
APPLIANCE
measurement
Figure 5.1: Tree structure and its hierarchy
Figure 5.2: Example of a Tree menu
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or
at least one single test in the Auto Sequence® passed and no single test failed
or
at least one single test in the Auto Sequence® failed
or
at least one single test in the Auto Sequence® was carried out and there were no other passed or failed single tests.
or
empty Auto Sequence® with empty single tests

5.1.1 Measurement statuses

Each measurement has:
a status (Pass or Fail or no status) a name results limits and parameters
A measurement can be a Single test or an Auto Sequence® test. Statuses of single tests:
passed finished single test with test results  failed finished single test with test results
finished single test with test results and no status  empty single test without test results
Overall statuses of Auto Sequence® tests:
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There are no measurement result(s) under selected structure object. Measurements should be made.
Figure 5.4: Example of status - No
measurement result(s)
One or more measurement result(s) under selected structure object has failed. Not all measurements under selected structure object have been made yet.
Figure 5.5: Example of status -
Measurements not completed with fail
result(s)

5.1.2 Structure Objects

Each Structure object has:
an icon a name parameters
Optionally they can have:
an indication of the status of the measurements under the Structure object a comment or a file attached
Structure objects supported in CE MultiTesterXA are described in Appendix A - Structure objects in CE MultiTesterXA.
Figure 5.3: Structure object in tree menu
5.1.2.1 Measurement status indication under the Structure object
Overall status of measurements under each structure element / sub-element can be seen without spreading tree menu. This feature is useful for quick evaluation of test status and as guidance for measurements.
Options
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All measurements under selected structure object are completed but one or more measurement result(s) has failed.
Figure 5.6: Status - Measurements
completed with fail result(s)
Press the active Workspace in Memory Organizer Menu.
Select List of Workspaces in Control panel.
Choose desired Workspace from the list of Workspaces.
Use Select button to confirm selection.
Note:
There is no status indication if all measurement results under each structure element /
sub-element have passed or if there is an empty structure element / sub-element (without measurements).

5.1.3 Selecting an active Workspace in Memory Organizer

Memory Organizer and Workspace Manager are interconnected so an active Workspace can be selected also in the Memory Organizer menu.
Procedure
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New Workspace is selected and displayed on the screen.
Press the active Workspace in Memory Organizer Menu.
Select Add New Structure Element in Control panel.
Press “Create” to confirm.
New Structure Element (Node) is added.
Note:
To change the name of a Node, see chapter 5.1.5.14 Rename a Structure
object.

5.1.4 Adding Nodes in Memory Organizer

Structural Elements (Nodes) are used to ease organization of data in the Memory Organizer. One Node is a must; others are optional and can be created or deleted freely.
Procedure
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Views results of measurement. The instrument goes to the measurement memory screen. Refer to chapters
6.1.1.5 Single test memory screen and 7.2.4 Auto Sequence® memory screen for more information.
Starts a new measurement. The instrument goes to the measurement start screen. Refer to chapters
6.1.1.1 Single test start screen and 7.2.1 Auto Sequence® view menu for more information.
Saves a measurement. Saving of measurement on a position after the selected (empty or finished)
measurement.
Clones the measurement. The selected measurement can be copied as an empty measurement under
the same Structure object. Refer to chapter 5.1.5.7 Clone a measurement for more information.
Copies & Paste a measurement. The selected measurement can be copied and pasted as an empty
measurement to any location in structure tree. Multiple “Paste” is allowed.
Refer to chapter 5.1.5.10 Copy & Paste a measurement for more information.
Adds a new measurement. The instrument goes to the Menu for adding measurements. Refer to chapter

5.1.5 Operations in Tree menu

In the Memory organizer different actions can be taken with help of the control panel at the right side of the display. Possible actions depend on the selected element in the organizer.
5.1.5.1 Operations on measurements (finished or empty measurements)
The measurement must be selected first. Operation options can be selected from the menu on the right side of the screen. Menu options are adapted to measurement status, empty, finished, finished and saved, as presented on Figure 5.7.
Figure 5.7: A measurement is selected in the Tree menu
Options
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5.1.5.5 Add a new measurement for more information.
Views and edit comments. The instrument displays comment attached to the selected measurement or
opens keypad for entering a new comment.
Deletes a measurement. Selected Measurement can be deleted. User is asked for confirmation before
the deleting. Refer to chapter 5.1.5.13 Delete a measurement for more information.
Starts a new measurement. First type of measurement (Single test or Auto Sequence®) should be selected.
After proper type is selected, the instrument goes to single test or Auto Sequence® selection screen. Refer to chapters 6.1 Selection of single tests and 7.1 Selection of Auto Sequences® for more information.
Saves a measurement. Saving of measurement under the selected Structure object.
View / edit parameters and attachments. Parameters and attachments of the Structure object can be viewed or edited.
Refer to chapter 5.1.5.3 View / Edit parameters and attachments of a Structure object for more information.
Adds a new measurement. The instrument goes to the Menu for adding measurement into structure. Refer
to chapter 5.1.5.5 Add a new measurement for more information.
Adds a new Structure object. A new Structure object can be added. Refer to chapter 5.1.5.4 Add a new
Structure Object for more information.
Attachments. Name and link of attachment is displayed.
5.1.5.2 Operations on Structure objects
The structure object must be selected first.
Figure 5.8: A structure object is selected in the tree menu
Options
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Clones a Structure object. Selected Structure object can be copied to same level in structure tree (clone).
Refer to chapter 5.1.5.6 Clone a Structure object for more information.
Copies & Paste a Structure object. Selected Structure object can be copied and pasted to any allowed location in
structure tree. Multiple “Paste” is allowed. Refer to chapter 5.1.5.8 Copy & Paste a Structure object for more information.
Cut & Paste a Structure. Selected Structure with child items (sub-structures and measurements) can be
moved to any allowed location in structure tree. Refer to chapter 5.1.5.11 Cut & Paste a Structure object with sub-items for more information.
Views and edit comments. The instrument displays comment attached to the selected Structure object or
opens keypad for entering a new comment.
Deletes a Structure object. Selected Structure object and sub-elements can be deleted. User is asked for
confirmation before the deleting. Refer to chapter 5.1.5.12 Delete a Structure object for more information.
Renames a Structure object. Selected Structure object can be renamed via keypad. Refer to chapter 5.1.5.14
Rename a Structure object for more information.
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Parameters
Figure 5.9: Example of View / Edit parameters menu
In menu for editing parameters the parameter’s value can
be selected from a dropdown list or entered via keypad. Refer to chapter 4 Instrument operation for more information about keypad operation.
Attachments The name of attachment can be seen. Operation with
attachments is not supported in the instrument.
5.1.5.3 View / Edit parameters and attachments of a Structure object
The parameters and their content are displayed in this menu. To edit the selected parameter tap on it or press Enter key to enter menu for editing parameters.
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Add Structure
Figure 5.10: Add a new Structure Object menu
Tap on a structure type selection window.
A list of available structure items is displayed. Select one from a list. Arrow indicates the position where structure item will be inserted.
Child item to the currently selected structure item.
Structure item located in the same level.
In menu for editing name and parameters the
parameter’s value can be selected from a dropdown
list or entered via keypad. Refer to chapter 4 Instrument operation for more information about
keypad operation.
5.1.5.4 Add a new Structure Object
This menu is intended to add new structure objects in the tree menu. A new structure object can be selected and then added in the tree menu.
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Create new structure item.
Add Measurement
Figure 5.11: Add a new measurement menu
Type of test can be selected from this field. Options: (Single tests, Auto Sequences®) Tap on field or press ENTER key to modify.
Last added single test measurement is offered by default. To select another measurement press Enter to open menu for selecting measurements. Refer to chapters 6.1 Selection of single tests and 7.1 Selection of Auto Sequences® for more information
Tap on field or press ENTER key to open menu for editing parameters of the selected measurement.
Select parameter and modify it as described earlier. Refer to chapter 6.1.1.2 Setting parameters and limits of
single tests for more information. Add a new empty measurement.
Adds the measurement under the selected Structure object in the tree menu.
Returns to the structure tree menu without changes.
5.1.5.5 Add a new measurement
In this menu new empty measurements can be set and then added in the structure tree. The type of measurement, measurement function and its parameters are first selected and then added under the selected Structure object.
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Clone
Figure 5.12: Clone Structure Object menu
Select the structure object to be cloned.
Clone
Select Clone option from control panel.
The Clone Structure object menu is displayed. Sub­elements of the selected structure object can be marked or un-marked for cloning.
Refer to chapter 5.1.5.9 Cloning and Pasting sub- elements of selected structure object for more information.
a
Selected structure object is copied (cloned) to same level in the structure tree.
b
Cloning is cancelled. No changes in the Structure tree.
5.1.5.6 Clone a Structure object
In this menu selected structure object can be copied (cloned) to same level in the structure tree. Cloned structure object have same name as original.
Procedure and options
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The new structure object is displayed.
Select the measurement to be cloned.
Clone
Select Clone option from control panel.
The new empty measurement is displayed.
Select the structure object to be copied.
5.1.5.7 Clone a measurement
By using this function a selected empty or finished measurement can be copied (cloned) as an empty measurement to the same level in the structure tree.
Procedure and options
5.1.5.8 Copy & Paste a Structure object
In this menu selected Structure object can be copied and pasted to any allowed location in the structure tree.
Procedure and options
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Copy
Select Copy option from control panel.
Select location where structure element should be copied.
Paste
Select Paste option from control panel.
The Paste structure object menu is displayed. Before copying it can be set which sub-elements of the selected structure object will be copied too. For more details see chapter 5.1.5.9 Cloning and Pasting sub-elements of selected structure object.
a
The selected structure object and elements are copied (pasted) to selected position in the tree structure.
b
Returns to the tree menu without changes.
The new structure object is displayed.
Note:
The Paste command can be executed one or more times.
Parameters of selected structure object will be
5.1.5.9 Cloning and Pasting sub-elements of selected structure object
When structure object is selected to be cloned, or copied & pasted, additional selection of its sub-elements is needed. The following options are available:
Options
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copied too.
Attachments of selected structure object will be copied too.
Structure objects in sub-levels of selected structure object will be copied too.
Measurements in selected structure object and sub-levels will be copied too.
Select the structure object to be copied.
Copy
Select Copy option from control panel.
Select location where structure element should be copied.
Paste
Select Paste option from control panel.
The new (empty) measurement is displayed in selected Structure object.
5.1.5.10 Copy & Paste a measurement
In this menu selected measurement can be copied to any allowed location in the structure tree. Procedure
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Select the structure item to be moved.
Cut
Select Cut option from Control panel.
Select new location where structure object (with sub-structures and measurements) should be moved.
Paste
Select Paste option from Control panel.
The structure object (with sub-structures and measurements) is moved to selected new location and deleted from previous location in the tree structure.
5.1.5.11 Cut & Paste a Structure object with sub-items
In this menu selected Structure object with sub-items (sub-structures and measurements) can be cut and pasted (moved) to any allowed location in the structure tree.
Procedure
5.1.5.12 Delete a Structure object
In this menu selected Structure object can be deleted. Procedure
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Select the structure object to be deleted.
Delete
Select Delete option from control panel.
A confirmation window will appear.
a
Selected structure object and its sub-elements are deleted.
b
Returns to the tree menu without changes.
Select a measurement to be deleted.
Delete
Select Delete option from control panel.
5.1.5.13 Delete a measurement
In this menu selected measurement can be deleted. Procedure
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A confirmation window will appear.
a
Selected measurement is deleted.
b
Returns to the tree menu without changes.
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Select the structure object to be renamed.
Rename
Select Rename option from control panel.
Virtual keypad will appear on screen. Enter new text and confirm.
Select the measurement to be recalled.
Select Recall results in Control panel.
5.1.5.14 Rename a Structure object
In this menu selected Structure object can be renamed. Procedure
5.1.5.15 Recall and Retest selected measurement
Procedure
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Measurement is recalled. Parameters and limits can be viewed but cannot be edited.
Select Retest in Control panel.
Measurement retest starting screen is displayed.
a
Parameters and limits can be viewed and edited.
Select Run in Control panel to retest the measurement.
Results / sub-results after re-run of recalled measurement.
Select Save results in Control panel.
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Retested measurement is saved under same structure object as original one.
Refreshed memory structure with the new performed measurement is displayed.
Search function is available from the active workspace directory line.
Select Search in control panel to open Search setup menu.
The parameters that can be searched for are displayed in the Search setup menu. Name and status are referred to all structure objects. If searching by status, instrument will display all structure objects that include one or more measurements with searched status. Equipment ID, Test date, Retest date refer only to the following structure objects: Appliance, Appliance FD, Machine and Switchgear.
a
The search can be narrowed by entering a text in the Name and Equipment ID fields.
Strings can be entered using the on-screen keyboard.
Note:
The Search function on Equipment ID is case sensitive.

5.1.6 Searching in Memory Organizer

In Memory organizer it is possible to search for different structure objects and parameters. Procedure
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b
The search can be narrowed on base of statuses.
c
The search can be narrowed on base of test dates / retest dates (from / to).
d
Clear filters
Clears all filters. Sets filters to default value.
Search
Searches through the Memory Organizer for objects according to the set filters. The results are shown in the Search results screen presented on Figure 5.13 and Figure
5.14.
Next page.
Previous page.
Figure 5.13: Search results screen – Page view
Options
Note:
Search result page consist of up to 50 results.
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Goes to selected location in Memory Organizer.
View / edit parameters and attachments. Parameters and attachments of the Structure object can be viewed or edited. Refer to Chapter 5.1.5.3 View / Edit parameters and attachments of a Structure object for more information.
Attachments. Name and link of attachment is displayed.
Renames the selected Structure object. Refer to Chapter 5.1.5.14 Rename a Structure object for more information.
Views comment. The instrument displays comment attached to the selected Structure
object.
Figure 5.14: Search results screen with structure object selected
Options
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All
A single test can be selected from a list of all single tests. The single tests are always displayed in the same (default) order.
Last used
Last 9 made different single tests are displayed.
Groups
The single tests are divided into groups of similar tests.

6 Single tests

6.1 Selection of single tests

Single tests can be selected in the Main single test menu or in Memory Organizer’s main and submenus. In Single test main menu there are four modes for selecting single tests.
Options
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For the selected group a submenu with all single tests that belongs to the selected group is displayed.
Cross selector
This selection mode is the fastest way for working with the keypad. Groups of single tests are organized in a row.
For the selected group all single tests are displayed and accessible with up/down keys.
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Name of function
Main result
Subresult
Parameters (white) and
limits (red)
Statuses, info, warnings
Options
Starts the measurement.
Opens help screens. Refer to chapter 6.1.3 Help screens for more information.
Opens menu for changing parameters and limits. Refer to chapter 6.1.1.2 Setting parameters and
limits of single tests for more information.

6.1.1 Single test screens

In the Single test screens measuring results, sub-results, limits and parameters of the measurement are displayed. In addition on-line statuses, warnings and other information are displayed.
Figure 6.1: Single test screen organisation
6.1.1.1 Single test start screen
Single test screen can be opened from Memory organizer or from Single test main menu.
Figure 6.2: Single test start screen
Options
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on
Selects parameter (white) or limit (red).
Selects value of parameter or limit. In case of many (multiple pages of) parameters or limits:
- The scroll bar on the right side of screen can be used
- With right / left keys it can be jumped page up /
page down
Some of limits can be user defined. Selects Custom and tap on it.
Numeric keyboard with metric prefixes will open. Enters custom limit value and confirm entry.
6.1.1.2 Setting parameters and limits of single tests
Figure 6.3: Screens in menu for setting Single test parameters and limits
Options
6.1.1.3 Single test screen during test
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Stops the single test measurement.
Proceeds to the next step of the measurement (if measurement consists of more steps).
Aborts measurements.
Figure 6.4: Single test screen (during measurement)
Options (during test)
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Starts a new measurement.
Saves the result. A new measurement was selected and started from a Structure object in
the structure tree:
- The measurement will be saved under the selected Structure object.
A new measurement was started from the Single test main menu:
- Saving under the last selected Structure object will be offered by default. The user can select another Structure object or create a
new Structure object. By pressing the key in Memory organizer menu the measurement is saved under selected location.
An empty measurement was selected in structure tree and started:
- The result(s) will be added to the measurement. The measurement will change its status from ‘empty’ to ‘finished’.
An already carried out measurement was selected in structure tree, viewed and then restarted:
- A new measurement will be saved under the selected Structure object.
Adds comment to the measurement. The instrument opens keypad for entering a comment.
Opens help screens. Refer to chapter 6.1.3 Help screens for more information.
6.1.1.4 Single test result screen
Figure 6.5: Single test result screen
Options (after measurement is finished)
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on
Opens screen for changing parameters and limits. Refer to chapter 6.1.1.2 Setting parameters and
limits of single tests for more information.
Retest
Enters screen with “empty” measurement.
on
Opens menu for viewing parameters and limits. Refer to chapter 6.1.1.2 Setting parameters and
limits of single tests for more information.
6.1.1.5 Single test memory screen
Options
Figure 6.6: Single test memory screen
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Starts the inspection
Opens help screens. Refer to chapter 6.1.3 Help screens for more information.

6.1.2 Single test (inspection) screens

Visual and Functional inspections can be treated as a special class of tests. Items to be visually or functionally checked are displayed. In addition on-line statuses and other information are displayed.
Figure 6.7: Inspection screen organisation
6.1.2.1 Single test (inspection) start screen
Figure 6.8: Inspection start screen
Options (inspection screen was opened in Memory organizer or from Single test main menu)
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Selects item
Applies a pass status to the selected item or group of items.
Applies a fail status to the selected item or group of items.
Clears status in selected item or group of items
Applies a checked status to the selected item or group of items.
on
A status can be applied direct to the checkbox; successive tap toggle between statuses.
Power is applied to the mains test socket to power up the tested equipment during a functional inspection. The instrument displays the Power measurement screen, refer to Chapter 6.2.12 Power for details.
Stop the inspection. Enters result screen if all items are checked.
Goes to the result screen, if inspection test running. Goes to the previous menu, if inspection test was stopped before.
6.1.2.2 Single test (Inspection) screen during test
Figure 6.9: Inspection screen (during inspection)
Options (during test)
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Starts a new inspection.
Saves the result. A new inspection was selected and started from a Structure object in
the structure tree:
- The inspection will be saved under the selected Structure object.
A new inspection was started from the Single test main menu:
- Saving under the last selected Structure object will be offered by default. The user can select another Structure object or create a
new Structure object. By pressing the key in Memory organizer menu the inspection is saved under selected location.
An empty inspection was selected in structure tree and started:
- The result(s) will be added to the inspection. The inspection will change its status from ‘empty’ to ‘finished’.
Rules for automatic applying of statuses:
The parent item(s) can automatically get a status on base of statuses in child items.
- the fail status has highest priority. A fail status for any item will result in a fail status in all parent items and an overall fail result.
- if there is no fail status in child items the parent item will get a status only if all child items have a status.
- Pass status has priority over checked status.
The child item(s) will automatically get a status on base of status in the parent item
- All child items will get the same status as applied to the parent item.
Note
Inspections and even inspection items inside one inspection can have different status types.
For example some basic inspections don’t have the ‘checked’ status.
6.1.2.3 Single test (Inspection) result screen
Figure 6.10: Inspection result screen
Options (after inspection is finished)
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An already carried out inspection was selected in structure tree, viewed and then restarted:
- A new measurement will be saved under the selected Structure object.
Opens Help screen, see chapter 6.1.3 Help screens for more information.
Retest
Starts inspection with cleared statuses.
Enters view mode.
6.1.2.4 Single test (inspection) memory screen
Options
Figure 6.11: Inspection memory screen
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on
Goes to previous / next help screen.

6.1.3 Help screens

Help screens contain diagrams for proper connection of the instrument.
Figure 6.12: Examples of help screens
Options
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Figure 6.13: Visual inspection menu
Figure 6.14: Visual inspection test circuit
Select the appropriate Visual inspection. Start the inspection. Perform the visual inspection of the appliance / equipment. Apply appropriate ticker(s) to items of inspection. End inspection. Save results (optional).

6.2 Single test measurements

6.2.1 Visual inspections

Test circuit
Visual inspection procedure
Figure 6.15: Examples of Visual inspection results
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Figure 6.16: Continuity test menu
Output connections
Output [4-wire, P-PE]
Test current
I out [0.2 A, 4 A, 10 A, 25 A]
Duration
Duration [Off, 2 s ... 180 s]
ΔU test*
Enables ΔU test [On, Off]
Wire section*
Wire section for ΔU test [0.5 mm2… 6mm2]
H Limit (R)
H limit [Off, Custom, 0.01 Ω ... 9 Ω]
L Limit (R)
L limit [Off, Custom, 0.01 Ω ... 9 Ω]
H Limit (ΔU)*
H limit [1.0 V … 5.0 V ]
Calibrate - Compensation of test lead resistance. Refer to chapter 6.2.2.1for procedure details.
Lim. Calculator – Continuity resistance H Limit(R) calculator. Refer to chapter 6.2.2.2 for details.

6.2.2 Continuity

Test results / sub-results
R............... Resistance
ΔU………..Voltage drop scaled to 10 A
Test parameters
Test limits
* Applicable only at test current 10 A.
Specific options
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Figure 6.17: Measurement of continuity 4-wire
Figure 6.18: Measurement of Continuity P/S - PE
Select the Continuity function. Set test parameters / limits. Connect test leads to C1, P1, P2 and C2 terminals on the instrument (4 wire), or connect
test lead to P/S terminal (2 wire measurement P/S – PE).
Compensate test leads resistance (optional). Connect test leads to device under test. Start measurement. Measurement can be stopped manually or by timer. Save results (optional).
Test circuit
Continuity measurement procedure
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Figure 6.19: Examples of Continuity measurement results
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Select the Continuity function. Parameter Output must be set to P/S - PE. Connect test leads to the instrument and short the test leads together, see Figure 6.20.
Touch the key to compensate leads resistance. Symbol is displayed if the compensation was carried out successfully.
6.2.2.1 Compensation of test leads resistance
This chapter describes how to compensate the test leads resistance in Continuity (Output = P/S – PE) function. Compensation can be carried out to eliminate the influence of test leads
resistance and the internal resistances of the instrument on the measured resistance.
Connection for compensating the resistance of test leads
Figure 6.20: Shorted test leads
Compensation of test leads resistance procedure
Figure 6.21: Uncompensated and compensated result
Note:
The compensation of test leads is carried out with set test current (I out).
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L wire length
R Limit [Ω]
L <= 5 m
0.3
5 m < L <= 12.5 m
0.4
12.5 m < L <= 20 m
0.5
20 m < L <= 27.5 m
0.6
27.5 m < L <= 35 m
0.7
35 m < L <= 42.5 m
0.8
42.5 m < L <= 50 m
0.9
50 m < L <= 57.5 m
1.0
6.2.2.2 Limit Calculator
It is useful tool to determine continuity resistance high limit, especially when testing mains power extension cords.
Limit calculator is included in Continuity function and can be accessed from options panel. Limit Calculator screens are presented on Figure 6.22.
Figure 6.22: Limit Calculator screens
Three Limit rules are offered: A: VDE / In < 16A
Continuity resistance limit is derived from table on wire length basis. Table is based on VDE 0701-0702 standard for nominal current In < 16A.
B: Calculator
Continuity resistance limit is calculated by the formula:
Where:
ρ ............... specific resistance of copper 1,68×10−8 Ωm
L ............... wire length selected from a list (1 m, 2 m, 3 m, … ,100 m) or Custom numeric entry
A ............... wire cross section selected from a list (0.50 mm2, 0.75 mm2, 1.00 mm2, 1.50 mm2,
2.5 mm2, 4.0 mm2, 10.0 mm2 ) or Custom numeric entry
C: Custom
Continuity resistance limit is directly selected from a list (Off,
0.01 Ω … 0.09 Ω, 0.1 Ω … 0.9 Ω, 1 Ω … 9 Ω) or H Limit Custom numeric entry.
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Select Limit Calculator from options panel of Continuity test screen to open Limit Calculator screen.
Select Limit rule by using on-screen or keyboard arrow keys.
Alternatively, selection is possible from the list. By taping on the Limit rule field, list of available Limit rules is presented. Tap on the chosen rule field and screen returns to Limit Calculator.
Select parameters value for chosen Limit rule by using on-screen or keyboard arrow keys.
By tapping on parameter field, value can be selected from presented list.
Calculator rule allow custom value Length and Cross section entry with on-screen keyboard, when Custom is selected from the value list.
Examples of parameter value lists:
-VDE rule Length parameter list
-Calculator rule Length parameter list
-Calculator rule Cross section parameter list. Speed up parameters selection with:
-using scroll bar on the right side of the screen,
-keyboard right / left keys for page up / down.
Custom rule is intended for direct H Limit entry. Select value from the list:
- by using arrow keys,
- tap on the field to open list and chose value,
-or enter value with on-screen keyboard after Custom value is selected from the list.
Example of on-screen numeric keyboard – direct H Limit custom value entry.
Apply option selection from Limit Calculator options bar automatically overwrite H Limit(R) parameter of selected Continuity single test.
Procedure and parameter selection
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Figure 6.23: HV AC test menu
AC test voltage
U test [100 V ... 5100 V in steps of 10 V]
Duration
t end [Off, 1 s ... 120 s]
High limit (I)
H limit [Custom, 0.5 mA ... 100 mA ]
Low limit (I)
L limit [Off, Custom, 0.5 mA ... 100 mA]
Figure 6.24: HV AC measurement

6.2.3 HV AC

IMPORTANT SAFETY NOTE
Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the instrument.
Test results / sub-results
I ................ test current
U............... measured a.c. test voltage
Ir ............... resistive portion of test current
Ic .............. capacitive portion of test current
Test parameters
Test limits
Test circuit
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Select the HV AC function. Set test parameters / limits. Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument. Connect HV test leads to device under test. Start measurement. Measurement can be stopped manually or by timer. Save results (optional).
Figure 6.25: Examples of HV AC measurement results
Figure 6.26: HV DC test menu
HV AC measurement procedure
Note:
First HV measurement after power on the instrument (if password protection is enabled)
or first HV measurement after enabling or changing password require entering password for enabling HV test. Refer to chapter 4.6.7 Change password for HV functions for more information.

6.2.4 HV DC

IMPORTANT SAFETY NOTE
Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the instrument.
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DC test voltage
U test [500 V ... 6000 V in steps of 50 V]
Duration
t end [Off, 1 s ... 120 s]
High limit (I)
H limit [Custom, 0.05 mA ... 10.0 mA]
Low limit (I)
L limit [Off, Custom, 0.05 mA ... 10.0 mA]
Figure 6.27: HV DC measurement
Select the HV DC function. Set test parameters / limits. Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument. Connect HV test leads to device under test. Start measurement. Measurement can be stopped manually or by timer. Save results (optional).
Test results / sub-results
U............... measured test voltage
I ................ test current
Test parameters
Test limits
Test circuit
HV DC measurement procedure
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Figure 6.28: Examples of HV DC measurement results
Figure 6.30: HV AC programmable test menu
Note:
First HV measurement after power on the instrument (if password protection is enabled)
or first HV measurement after enabling or changing password require entering password for enabling HV test. Refer to chapter 4.6.7 Change password for HV functions for more information.

6.2.5 HV AC programmable

IMPORTANT SAFETY NOTE
Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the instrument.
In the HV AC programmable test the time dependency of high voltage can be set according to diagram on Figure 6.29.
Figure 6.29: Voltage / time diagram of the HV AC programmable test
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Starting AC test voltage
U start [100 V ... 5100 V in steps of 10 V]
AC test voltage
U test [100 V ... 5100 V in steps of 10 V]
Duration of starting voltage
t start [1 s ... 120 s ]
Duration of ramp
t ramp [2 s ... 60 s ]
Duration of test voltage
t end [Off, 1 s ... 120 s ]
High limit (I)
H limit [Custom, 0.5 mA ... 100 mA ]
Low limit (I)
L limit [Off, Custom, 0.5 mA ... 100 mA]
Figure 6.31: HV AC programmable test
Select the HV AC programmable function. Set test parameters / limits. Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument. Connect HV test leads to device under test. Start measurement. Measurement can be stopped manually or by timer. Save results (optional).
Test results / sub-results
I ................ test current
U............... measured test voltage
Ir ............... resistive portion of test current
Ic .............. capacitive portion of test current
Test parameters
Test limits
Test circuit
HV AC programmable test procedure
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Figure 6.32: Examples of HV AC programmable test results
Note:
First HV measurement after power on the instrument (if password protection is enabled)
or first HV measurement after enabling or changing password require entering password for enabling HV test. Refer to chapter 4.6.7 Change password for HV functions for more information.
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Figure 6.33: HV DC programmable test menu
Starting DC test voltage
U start [500 V ... 6000 V in steps of 50 V]
DC test voltage
U test [500 V ... 6000 V in steps of 50 V]
Duration of starting voltage
t start [1 s ... 120 s ]
Duration of ramp
t ramp [2 s ... 60 s ]
Duration of test voltage
t end [Off, 1 s ... 120 s ]
High limit (I)
H limit [Custom, 0.05 mA ... 10.0 mA ]
Low limit (I)
L limit [Off, Custom, 0.05 mA ... 10.0 mA]

6.2.6 HV DC programmable

IMPORTANT SAFETY NOTE
Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the instrument.
In the HV DC programmable test the time dependency of high voltage can be set according to diagram on Figure 6.29.
Test results / sub-results
U............... measured test voltage
I ................ test current
Ic .............. capacitive portion of test current
Ir ............... resistive portion of test current
Test parameters
Test limits
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Figure 6.34: HV DC programmable test
Select the HV DC programmable function. Set test parameters / limits. Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument. Connect HV test leads to device under test. Start measurement. Measurement can be stopped manually or by timer. Save results (optional).
Figure 6.35: Examples of HV DC programmable test results
Test circuit
HV DC programmable test procedure
Note:
First HV measurement after power on the instrument (if password protection is enabled)
or first HV measurement after enabling or changing password require entering password for enabling HV test. Refer to chapter 4.6.7 Change password for HV functions for more information.
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Nominal test voltage
Uiso [50 V, 100 V, 250 V, 500 V, 1000 V]
Duration
Duration [Off, 2 s ... 180 s]
Type of test
Type [Riso, Riso-S, (Riso, Riso-S)]
Output connections (Riso)
[ISO(+), ISO(-), Socket LN-PE, Socket LN-P/S]
Output connections (Riso-S)
[Socket LN-P/S]
H Limit (Riso)
H limit [Off, Custom, 0.10 MΩ ... 10.0 MΩ ]
L Limit (Riso)
L limit [Off, Custom, 0.10 MΩ ... 10.0 MΩ ]
H Limit (Riso-S)
H limit [Off, Custom, 0.10 MΩ ... 10.0 MΩ ]
L Limit (Riso-S)
L limit [Off, Custom, 0.10 MΩ ... 10.0 MΩ ]

6.2.7 Insulation resistance (Riso, Riso-S)

Figure 6.36: Insulation resistance test menus
Test results / sub-results
Riso .......... Insulation resistance
Riso-S ...... Insulation resistance-S
Um ............ Test voltage
Test parameters
Test limits
Test circuits
Figure 6.37: Measurement of insulation resistance (ISO(+), ISO(-))
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Figure 6.38: Measurement of insulation resistance (Socket LN - PE)
Figure 6.39: Measurement of Riso, Riso-S (socket)
Select the Riso function. Set test parameters / limits. Connect test leads to ISO(+), ISO(-) terminals on the instrument, then connect test leads to
device under test, or
Connect device to mains test socket. For Riso-S test, additionally connect test lead to P/S
terminal on instrument, and then connect test lead to device.
Start measurement. Measurement can be stopped manually or by timer. Save results (optional).
RISO measurement procedure
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Figure 6.40: Examples of Insulation resistance measurement results
Type of test
Type [Isub, Isub-S, (Isub, Isub-S)]
Duration
Duration [Off, 2 s ... 180 s]
Output connections (Isub)
[SUB1, SUB2, Socket LN-PE, Socket LN-P/S]
Output connections (Isub-S)
[Socket LN-P/S]
H Limit (Isub)
H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Isub)
L limit [Off, Custom, 0.25 mA ... 15.0 mA ]
H Limit (Isub-S)
H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Isub-S)
L limit [Off, Custom, 0.25 mA ... 15.0 mA ]
Note:
When P/S probe is connected during the Riso measurement, then the current through it
is also considered.

6.2.8 Sub-leakage (Isub, Isub-S)

Figure 6.41: Sub Leakage test menus
Test results / sub-results
Isub .......... Sub-leakage current
Isub-S ....... Sub-leakage current-S
Test parameters
Test limits
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Figure 6.42: Measurement of Sub-leakage (SUB1, SUB2)
Figure 6.43: Measurement of Sub-leakage (socket LN-PE)
Figure 6.44: Measurement of Sub-leakage, Sub-leakage-S (socket)
Test circuits
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Select the Sub-leakage function. Set test parameters / limits. Connect test leads to SUB1,SUB2 terminals on the instrument, then connect test leads to
device under test, or
Connect device under test to mains test socket. For Isub-S test, additionally connect test
lead to P/S terminal on the instrument, and then connect test lead to a device.
Start measurement. Measurement can be stopped manually or by timer. Save results (optional).
Figure 6.45: Examples of Sub-leakage measurement results
Duration
Duration [Off, 2 s ... 180 s]
Change status
Change [YES, NO] YES: The instrument measures leakage current in two sequential
steps with delay* in between. The phase voltage is firstly applied to the right live output of the mains test socket and secondly to the left live output of the mains test socket.
NO: The phase voltage is applied only to the right live output of the
Sub-leakage measurement procedure
Note:
When P/S probe is connected during the Sub-leakage measurement, then the current
through it is also considered.

6.2.9 Differential Leakage

Figure 6.46: Differential Leakage test menu
Test results / sub-results
Idiff ........... Differential Leakage current
P ............... Power
Test parameters
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mains test socket.
*Delay time
Delay [0.2 s … 5 s]
H Limit (Idiff)
H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Idiff)
L limit [Off, Custom, 0.25 mA ... 15.0 mA ]
Output connections
[Socket L,N – PE,P/S ]
Select the Differential Leakage function. Set test parameters / limits. Connect device under test to mains test socket and optionally to P/S terminal. Start measurement. Measurement can be stopped manually or by timer. Save results (optional).
Test limits
Test circuit
Figure 6.47: Measurement of Differential Leakage current
Differential Leakage measurement procedure
Figure 6.48: Examples of Differential Leakage measurement results
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Duration
Duration [Off, 2 s ... 180 s]
Change status
Change [YES, NO] YES: The instrument measures leakage current in two sequential steps
with delay* in between. The phase voltage is firstly applied to the right live output of the mains test socket and secondly to the left live output of the mains test socket.
NO: The phase voltage is applied only to the right live output of the
mains test socket.
*Delay time
Delay [0.2 s … 5 s]
Output connections
[Socket L,N – PE]
H Limit (Ipe)
H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Ipe)
L limit [Off, Custom, 0.25 mA ... 15.0 mA ]

6.2.10 Ipe Leakage

Figure 6.49: Ipe Leakage test menu
Test results / sub-results
Ipe ............ PE current
P ............... Power
Test parameters
Test limits
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Select the Ipe Leakage function. Set test parameters / limits. Connect device under test to mains test socket. Start measurement. Measurement can be stopped manually or by timer. Save results (optional).
Test circuit
Figure 6.50: Measurement of Ipe Leakage current
Ipe Leakage measurement procedure
Figure 6.51: Examples of Ipe Leakage measurement results
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Duration
Duration [Off, 2 s ... 180 s]
Change status
Change [YES, NO] YES: The instrument measures leakage current in two sequential steps
with delay* in between. The phase voltage is firstly applied to the right live output of the mains test socket and secondly to the left live output of the mains test socket.
NO: The phase voltage is applied only to the right live output of the
mains test socket.
*Delay time
Delay [0.2 s … 5 s]
Output connections
[Socket L,N – PE,P/S]
H Limit (Itou)
H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Itou)
L limit [Off, Custom, 0.25 mA ... 15.0 mA ]

6.2.11 Touch Leakage

Figure 6.52: Touch Leakage test menu
Test results / sub-results
Itou ........... Touch Leakage current
P ............... Power
Test parameters
Test limits
Test circuit
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