MAXWELL HSN-500F, HSN-500L Datasheet
HSN-500
Nuclear Event Detector
BIT
FEATURES:
• Detects ionizing radiation pulses
• Tested/certified detection threshold level
• Adjustable circumvention period
• 100% testable with built-in test
• Detection threshold adjustability
• Single +5V operation
• Designed-in radiation hardness
• Compliant to MIL-PRF-38534 Class H
• Flat pack (F) or DIP (L) packages
RADIATION HARDNESS
C
HARACTERISTICS
• Dose Rate (operate-through): 1 x 1012 rad(Si)/sec
• Total Dose: 1 x 10
• Neutron Fluence: 5 x 10
• Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec
6
rad(Si)
13
n/cm
2
V
B
8 9 14 1
Detector
(Pin Diode)
6
LED
Threshold
Adjust
Amplifier Pulse Timer
GND
V
H
457
CRC
Logic Diagram
DESCRIPTION:
Maxwell Technologies’ HSN-500 radiation-hardened Hybrid
Nuclear Event Detector (NED) senses ionizing radiation pulses
generated by a nuclear event, such as the detonation of a nuclear
weapon, and rapidly switches its output from the normal high
state to a low state with a propagation delay time of less than 20
ns. The active low Nuclear Event Detection signal (NED
to initiate a wide variety of circumvention functions, thus preventing upset and burnout of electronic components. The NED
is also used to initiate both hardware and software recovery. This
high-speed, 14-pin hybrid detector is used in electronic systems
as a general-purpose circumvention device to protect memory,
stop data processing, and drive power supply switches as well as
signal clamps.
The HSN-500 is designed to operate through three critical environments: ionizing dose rate [10
6
rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the
[10
device is designed to function throughout the transient neutron
pulse. The hybrid’s discrete design ensures a controlled response
in these radiation environments as well as immunity to latchup.
The detection level and functionality of a sample of each HSN500 production lot are tested in an ionizing dose rate environment. A certificate is provided reporting the test results for the
production lot.
12
rad(Si)/s], gamma total dose
V
L
10 k
Ω
2
NED
Memory
) is used
output
1000555
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com
The detection threshold of the HSN-500 is adjustable within the
5
range of 2 x 10
rad(Si)/s to 2 x 107 rad(Si)/s. This detection level
can be preset by Maxwell or adjusted by the user. Less than a
30% variation in detection threshold can be expected over the
entire operating temperature range.
12.19.01 Rev1
All data sheets are subject to change without notice
©2001 Maxwell Technologies
1
All rights reserved.
Nuclear Event Detector
PIN NUMBER PIN FUNCTION
HSN-500
TABLE 1. PIN DESCRIPTION
1 Load Voltage, V
L
2 Nuclear Event Detector, NED
3 No Connection
4 External Capacitor
5 External Capacitor
6 Built In Test, BIT
7 Package Ground and Case
8 PIN Diode Bias, V
B
9 Threshold Adjust
10 No Connection
11 No Connection
12 No Connection
13 No Connection
14 Hardened Supply Voltage, V
TABLE 2. ELECTRICAL CHARACTERISTICS
PARAMETER SYMBOL CONDITIONS
Hardened Supply Voltage V
Hardened Supply Current
- Standby
- Operational
1
2
H
I
H
°
-55
C < TA < 125°C
VH = 5.5V
Memory
H
IN MAX UNIT GROUP A
M
S
UBGROUP
4.5 5.5 V 1,2,3
--
--
--
30
120
mA 1,2,3
Load Voltage V
Load Current
- Standby
- Operational
PIN Diode Bias Voltage - Standby
PIN Diode Bias Current - Standby
Built-In-Test (BIT)
1
2
1
V
1
3,4
NED
Radiation Propagation Delay Time
1000555
5
L
I
L
B
I
B
V
IH
I
IH
V
IL
I
IL
t
PW
V
OH
V
OL
t
D
VL = 20V
VIH = 4.0V
V
= 0.5V
IL
Pin 9 Open, V
= 4.0V
IH
VL = 20V, IOH = -100 µA
I
= 10 mA
OL
I
= 100 mA
OL
12.19.01 Rev1
All data sheets are subject to change without notice
-- 20 V 1,2,3
1,2,3
--
--
100
2.25
µA
mA
4.5 20 V 1,2,3
-- 100 µA 1,2,3
4.0
--
--
--
10
18.5
--
--
5.5
25
0.5
10
--
--
0.6
1.0
V
mA
V
µA
µs
V 1,2,3
7,8
1,2,3
7,8
1,2,3
9,10,11
1,2,3
-- 20 ns
©2001 Maxwell Technologies
All rights reserved.
2
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