MAXWELL HSN-2000F, HSN-2000L Datasheet

HSN-2000

Nuclear Event Detector

6

BIT

FEATURES:

• Detects ionizing radiation pulses

• Tested/certified detection threshold level

• Adjustable circumvention period

• Flag remembers event occurred

• 100% testable with built-in test

• Detection threshold adjustability

• Single +5V operation

• Designed-in radiation hardness

• Compliant to MIL-PRF-38534 Class H

• Flat pack (F) or DIP (L) packages

RADIATION HARDNESS
C

HARACTERISTICS:

• Dose Rate (operate-through): 1 x 1012 rad(Si)/sec

• Total Dose: 1 x 10

• Neutron Fluence: 5 x 10

• Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec

6

rad(Si)

13

n/cm

2

V

B

8 9 14 1

Detector

(Pin Diode)

LED

Threshold

Adjust

Amplifier Pulse Timer

GND

V

H

CRC

Logic
Latch

12457

Flag

Reset

V

L

Ω

10 k

10 k

Ω

Logic Diagram

DESCRIPTION:

Maxwell Technologies’ HSN-2000 radiation-hardened Hybrid
Nuclear Event Detector (NED) senses ionizing radiation pulses
generated by a nuclear event, such as the detonation of a nuclear
weapon, and rapidly switches its outputs from the normal high
state to a low state with a propagation delay time of less than
20ns. The active low Nuclear Event Detection signal (NED
used to initiate a wide variety of circumvention functions, thus
preventing upset and burnout of electronic components. The NED
output is also used to initiate both hardware and software recov­ery. The Nuclear Evet Flag signal (NEF
occurred and is used to distinguish between an actual event and
power up. The signal input of either Flag Reset or Flag Reset
be used to reset the NEF

output. This high-speed, 14-pin hybrid
detector is used in electronic systems as a general-purpose cir­cumvention device to protect memory, stop data processing, and
drive power supply switches as well as signal clamps.

The HSN-2000 is designed to operate through three critical envi­ronments: ionizing dose rate [10

6

rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the

[10
device is designed to function throughout the transient neutron
pulse. The hybrid’s discrete design ensures a controlled response
in these radiation environments as well as immunity to latchup.
The detection level and functionality of a sample of each HSN­2000 production lot are tested in an ionizing dose rate environ­ment. A certificate is provided reporting the test results for the
production lot.

) remembers the event

12

rad(Si)/s], gamma total dose

2

NED

13

NEF

Flag

11

Reset

Memory

) is

can

1000552

[phone] - Fax: [phone] - www.maxwell.com

The detection threshold of the HSN-2000 is adjustable within the

5

range of 2 x 10

rad(Si)/s to 2 x 107 rad(Si)/s. This detection level
can be preset by Maxwell or adjusted by the user. Less than a
30% variation in detection threshold can be expected over the
entire operating temperature range.

12.19.01 Rev1

All data sheets are subject to change without notice

©2001 Maxwell Technologies

1

All rights reserved.

Nuclear Event Detector

PIN NUMBER PIN FUNCTION

HSN-2000

TABLE 1. PIN DESCRIPTION

1 Load Voltage, V

L

2 Nuclear Event Detector, NED

3 No Connection

4 External Capacitor

5 External Capacitor

6 Built In Test, BIT

7 Package Ground and Case

8 PIN Diode Bias, V

B

9 Threshold Adjust

10 No Connection

11 Flag Reset

12 Flag Reset

13 Nuclear Event Flag, NEF

14 Hardened Supply Voltage, V

TABLE 2. ELECTRICAL CHARACTERISTICS

PARAMETER SYMBOL CONDITIONS

°

-55

C < TA < 125°C

Memory

H

IN MAX UNIT GROUP A

M

S

UBGROUP

Hardened Supply Voltage V

Hardened Supply Current

- Standby

- Flag Set

- Operational

1

2

3

Load Voltage V

Load Current

- Standby

- Operational

PIN Diode Bias Voltage - Standby

PIN Diode Bias Current - Standby

1

3

1

1

FLAG RESET (Pin 12) V

1000552

H

I

H

L

I

L

V

B

I

B

IH

I

IH

V

IL

I

IL

t

PW

VH = 5.5V

VL = 20V

VIH = 4.0V

V

= 0.5V

IL

V

= 4.0V

IH

12.19.01 Rev1

4.5 5.5 V 1,2,3

--

--

--

--

30
60

150

mA 1,2,3

-- 20 V 1,2,3

1,2,3

--

--

100

4.5

µA

mA

4.5 20 V 1,2,3

-- 100 µA 1,2,3

4.0

--

--

--

250

All data sheets are subject to change without notice

--

4.0

0.5

100

--

V

mA

V

µA

ns

7,8

1,2,3

7,8

1,2,3

9,10,11

2

©2001 Maxwell Technologies

All rights reserved.

Nuclear Event Detector

TABLE 2. ELECTRICAL CHARACTERISTICS

HSN-2000

PARAMETER SYMBOL CONDITIONS

°

-55

C < TA < 125°C

FLAG RESET (Pin 11) V

Built-In-Test (BIT)

4,5

NED

Radiation Propagation Delay Time

6

NEF

IL

I

IL

t

PW

V

IH

I

IH

V

IL

I

IL

t

PW

V

OH

V

OL

t

D

V

OH

V

OL

VIL = 0.5V, VH = 5.5V

V

= 0.5V

IL

VIH = 4.0V

V

= 0.5V

IL

Pin 9 Open, V

= 4.0V

IH

VL = 20V, IOH = -100 µA

I

= 10 mA

OL

I

= 100 mA

OL

VL = 20V, IOH = -100 µA

I

= 10 mA

OL

1. Standby mode is the normal state of the device, defined as having both the NED

IN MAX UNIT GROUP A

M

S

UBGROUP

--

--

250

4.0

--

--

--

10

18.5

--

--

0.5

-30

5.5
25

0.5
10

0.6

1.0

V

mA

--

ns

V

mA

V

µA

--

--

µs

V 1,2,3

7,8

1,2,3

9,10,11

7,8

1,2,3

7,8

1,2,3

9,10,11

1,2,3

-- 20 ns

18.5

--

--

0.6

V 1,2,3

1,2,3

and NEF outputs (pins 2 and 13) in the “high”

state.

2. Flag Set mode occurs after an event has been detected or BIT has been initiated and the NED output has timed out (i.e., has
transitioned to the “high” state), leaving the NEF output as the only remaining output in the low state.

3. Operational mode is in effect during the timeout period of the NED signal, characterized by having both the NED and NEF out­puts in the “low” state, causing the greatest current draw of the device.

4. BIT electrical characteristics are not guaranteed over the radiation range.

5. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it is
advised that a series resistor/capacitor combination is used.

6. Guaranteed but not tested over temperature. Time delay, t
pulse to the falling edge of the NED

output at approximately 10 times the detection level.

, is measured at 50% points from the rising edge of the radiation

D

Memory

1000552

12.19.01 Rev1

All data sheets are subject to change without notice

©2001 Maxwell Technologies

All rights reserved.

3

Nuclear Event Detector

HSN-2000

0.600

0.100
TYP

14 13 12 11 10 9 8

1234567

0.015 ± 0.003

0.795

Flatpack Hybrid Package

HSN-2000F

All tolerances are ± 0.005 unless specified

0.500
MIN

0.495

0.010 ± 0.002

0.145 MAX

0.070 ± 0.002

TOP VIEW

0.795

0.600

0.100 TYP

14 13 12 11 10 9 8

1234567

0.016
DIA

0.020

DIP Hybrid Package

HSN-2000L

0.300

0.495

0.145 MAX

0.200

Memory

MECHANICAL DIMENSIONS

Note: All dimensions in inches.

Important Notice:

The specifications presented within these data sheets represent the latest and most accurate information available to
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no
responsibility for the use of this information.

Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems
without express written approval from Maxwell Technologies.

Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Tech­nologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts.

1000552

12.19.01 Rev1

All data sheets are subject to change without notice

©2001 Maxwell Technologies

All rights reserved.

4

Nuclear Event Detector

Product Ordering Options

Model Number

HSN-2000

HSN-2000

X

Feature

Package

Base Product
Nomenclature

Option Details

L = Dual In-line Package (DIP)
F = Flat Pack

Nuclear Event Detector

Memory

1000552

12.19.01 Rev1

All data sheets are subject to change without notice

©2001 Maxwell Technologies

All rights reserved.

5