MAXWELL HSN-2000F, HSN-2000L Datasheet
HSN-2000
Nuclear Event Detector
6
BIT
FEATURES:
• Detects ionizing radiation pulses
• Tested/certified detection threshold level
• Adjustable circumvention period
• Flag remembers event occurred
• 100% testable with built-in test
• Detection threshold adjustability
• Single +5V operation
• Designed-in radiation hardness
• Compliant to MIL-PRF-38534 Class H
• Flat pack (F) or DIP (L) packages
RADIATION HARDNESS
C
HARACTERISTICS:
• Dose Rate (operate-through): 1 x 1012 rad(Si)/sec
• Total Dose: 1 x 10
• Neutron Fluence: 5 x 10
• Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec
6
rad(Si)
13
n/cm
2
V
B
8 9 14 1
Detector
(Pin Diode)
LED
Threshold
Adjust
Amplifier Pulse Timer
GND
V
H
CRC
Logic
Latch
12457
Flag
Reset
V
L
Ω
10 k
10 k
Ω
Logic Diagram
DESCRIPTION:
Maxwell Technologies’ HSN-2000 radiation-hardened Hybrid
Nuclear Event Detector (NED) senses ionizing radiation pulses
generated by a nuclear event, such as the detonation of a nuclear
weapon, and rapidly switches its outputs from the normal high
state to a low state with a propagation delay time of less than
20ns. The active low Nuclear Event Detection signal (NED
used to initiate a wide variety of circumvention functions, thus
preventing upset and burnout of electronic components. The NED
output is also used to initiate both hardware and software recovery. The Nuclear Evet Flag signal (NEF
occurred and is used to distinguish between an actual event and
power up. The signal input of either Flag Reset or Flag Reset
be used to reset the NEF
output. This high-speed, 14-pin hybrid
detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and
drive power supply switches as well as signal clamps.
The HSN-2000 is designed to operate through three critical environments: ionizing dose rate [10
6
rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the
[10
device is designed to function throughout the transient neutron
pulse. The hybrid’s discrete design ensures a controlled response
in these radiation environments as well as immunity to latchup.
The detection level and functionality of a sample of each HSN2000 production lot are tested in an ionizing dose rate environment. A certificate is provided reporting the test results for the
production lot.
) remembers the event
12
rad(Si)/s], gamma total dose
2
NED
13
NEF
Flag
11
Reset
Memory
) is
can
1000552
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com
The detection threshold of the HSN-2000 is adjustable within the
5
range of 2 x 10
rad(Si)/s to 2 x 107 rad(Si)/s. This detection level
can be preset by Maxwell or adjusted by the user. Less than a
30% variation in detection threshold can be expected over the
entire operating temperature range.
12.19.01 Rev1
All data sheets are subject to change without notice
©2001 Maxwell Technologies
1
All rights reserved.
Nuclear Event Detector
PIN NUMBER PIN FUNCTION
HSN-2000
TABLE 1. PIN DESCRIPTION
1 Load Voltage, V
L
2 Nuclear Event Detector, NED
3 No Connection
4 External Capacitor
5 External Capacitor
6 Built In Test, BIT
7 Package Ground and Case
8 PIN Diode Bias, V
B
9 Threshold Adjust
10 No Connection
11 Flag Reset
12 Flag Reset
13 Nuclear Event Flag, NEF
14 Hardened Supply Voltage, V
TABLE 2. ELECTRICAL CHARACTERISTICS
PARAMETER SYMBOL CONDITIONS
°
-55
C < TA < 125°C
Memory
H
IN MAX UNIT GROUP A
M
S
UBGROUP
Hardened Supply Voltage V
Hardened Supply Current
- Standby
- Flag Set
- Operational
1
2
3
Load Voltage V
Load Current
- Standby
- Operational
PIN Diode Bias Voltage - Standby
PIN Diode Bias Current - Standby
1
3
1
1
FLAG RESET (Pin 12) V
1000552
H
I
H
L
I
L
V
B
I
B
IH
I
IH
V
IL
I
IL
t
PW
VH = 5.5V
VL = 20V
VIH = 4.0V
V
= 0.5V
IL
V
= 4.0V
IH
12.19.01 Rev1
4.5 5.5 V 1,2,3
--
--
--
--
30
60
150
mA 1,2,3
-- 20 V 1,2,3
1,2,3
--
--
100
4.5
µA
mA
4.5 20 V 1,2,3
-- 100 µA 1,2,3
4.0
--
--
--
250
All data sheets are subject to change without notice
--
4.0
0.5
100
--
V
mA
V
µA
ns
7,8
1,2,3
7,8
1,2,3
9,10,11
2
©2001 Maxwell Technologies
All rights reserved.
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