MAXWELL HSN-1000F, HSN-1000L Datasheet
HSN-1000
Nuclear Event Detector
BIT
FEATURES:
• Detects ionizing radiation pulses
• 100% tested/certified detection threshold level
• Adjustable circumvention period
• 100% testable with built-in test
• Detection threshold adjustability
• Single +5V operation
• Radiation hardness guaranteed
• Compliant to MIL-PRF-38534 Class H
• Flat pack (F) or DIP (L) packages
RADIATION HARDNESS
C
HARACTERISTICS:
• - Dose Rate (operate-through): 1 x 1012 rad(Si)/sec
• - Total Dose: 1 x 10
• - Neutron Fluence: 5 x 10
• - Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec
6
rad(Si)
13
n/cm
2
V
B
8 9 14 1
Detector
(Pin Diode)
6
LED
Threshold
Adjust
Amplifier Pulse Timer
GND
V
H
457
CRC
Logic Diagram
DESCRIPTION:
Maxwell Technologies’ HSN-1000 radiation-hardened Hybrid
Nuclear Event Detector (NED) senses ionizing radiation pulses
generated by a nuclear event, such as the detonation of a nuclear
weapon, and rapidly switches its output from the normal high
state to a low state with a propagation delay time of less than
20ns. The active low Nuclear Event Detection signal (NED
used to initiate a wide variety of circumvention functions, thus
preventing upset and burnout of electronic components. The NED
output is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic
systems as a general-purpose circumvention device to protect
memory, stop data processing, and drive power supply switches
as well as signal clamps.
The HSN-1000 is guaranteed to operate through three critical
environments: ionizing dose rate [10
6
dose [10
rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the device is designed to function throughout the transient
neutron pulse. The hybrid’s discrete design ensures a controlled
response in these radiation environments as well as immunity to
latchup. Each HSN-1000’s detection level and functionality are
tested in an ionizing dose rate environment. A certificate is provided with each serialized hybrid, reporting the radiation test
results and guaranteeing its performance. The device is also lot
qualified in the total dose and neutron environments to ensure
performance.
12
rad(Si)/s], gamma total
V
L
Ω
10 k
2
NED
Memory
) is
1000554
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com
The detection threshold of the HSN-1000 is adjustable within the
5
range of 2 x 10
rad(Si)/s to 2 x 107 rad(Si)/s. This detection level
can be preset by Maxwell or adjusted by the user. Less than a
30% variation in detection threshold can be expected over the
entire operating temperature range.
12.19.01 Rev1
All data sheets are subject to change without notice
©2001 Maxwell Technologies
1
All rights reserved.
Nuclear Event Detector
PIN NUMBER PIN FUNCTION
HSN-1000
TABLE 1. PIN DESCRIPTION
1 Load Voltage, V
L
2 Nuclear Event Detector, NED
3 No Connection
4 External Capacitor
5 External Capacitor
6 Built In Test, BIT
7 Package Ground and Case
8 PIN Diode Bias, V
B
9 Threshold Adjust
10 No Connection
11 No Connection
12 No Connection
13 No Connection
14 Hardened Supply Voltage, V
TABLE 2. ELECTRICAL CHARACTERISTICS
PARAMETER SYMBOL CONDITIONS
°
-55
C < TA < 125°C
Memory
H
IN MAX UNIT GROUP A
M
S
UBGROUP
Hardened Supply Voltage V
Hardened Supply Current
- Standby
- Operational
1
2
Load Voltage V
Load Current
- Standby
- Operational
PIN Diode Bias Voltage - Standby
PIN Diode Bias Current - Standby
Built-In-Test (BIT)
1
2
1
V
1
3,4
NED
Radiation Propagation Delay Time
1000554
5
H
I
H
L
I
L
B
I
B
V
IH
I
IH
V
IL
I
IL
t
PW
V
OH
V
OL
t
D
VH = 5.5V
VL = 20V
VIH = 4.0V
V
= 0.5V
IL
Pin 9 Open, V
= 4.0V
IH
VL = 20V, IOH = -100 µA
I
= 10 mA
OL
I
= 100 mA
OL
12.19.01 Rev1
All data sheets are subject to change without notice
4.5 5.5 V 1,2,3
--
--
--
30
120
mA 1,2,3
-- 20 V 1,2,3
1,2,3
--
--
100
2.25
µA
mA
4.5 20 V 1,2,3
-- 100 µA 1,2,3
4.0
--
--
--
10
18.5
--
--
5.5
25
0.5
10
--
--
0.6
1.0
V
mA
V
µA
µs
V 1,2,3
7,8
1,2,3
7,8
1,2,3
9,10,11
1,2,3
-- 20 ns
2
©2001 Maxwell Technologies
All rights reserved.
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