Memory
4
All data sheets are subject to change without notice
©2001 Maxwell Technologies
All rights reserved.
12-Bit A/D Converter
7672
12.19.01 Rev 11
1000565
Bipolar Zero Error BZE TA = +25°C
T
A
= -55 to +125°C
--
--
±5
±6
LSB
Bipolar Gain Error BGE T
A
= +25°C
T
A
= -55 to +125°C
--
--
±5
±7
LSB
1. Guaranteed by design.
TABLE 5. 7672 TIMING CHARACTERISTICS
1,2
(VDD = 5V ±5%, VSS = -12V ±10%, V
REF
= -5V, TA = -55 TO 125 °C UNLESS OTHERWISE SPECIFIED)
1. 1LSB = FS/4096; T
A
= 25 °C; Performance over power supply tolerance is guaranteed by power supply rejection test.
2. All inputs are 0V to +5V swing with t
r
= tr = 5ns (10 to 90% of +5V) and timed from a voltage level of +1.6V.
P
ARAMETER TEST CONDITION SYMBOL MIN MAX UNITS
Conversion Time, Synchronous Clk,
3
3. Functionally tested.
12.5 clks, T
A
= -55 to +125 °C t
CONV
-- 5.0 us
-- 10
Conversion Time, Asynchronous Clk, 12-13 clks, T
A
= -55 to +125 °C t
CONV
4.8 5.2 us
9.6 10.4
CS
to RD Setup Time TA = -55 to +125 °C t
1
0--ns
RD
to BUSY Delay CL = 50 pF, TA = +25 °C
C
L
= 50 pF, TA = -55 to +125 °C
t
2
--
--
190
270
ns
Data Access Time
4
4. t3 and t6 are measured with the load circuits of Figure 1 and are defined as the time required for an output to cross +0.8 or
+2.4.
C
L
= 100 pF, TA = +25 °C
C
L
= 100 pF, TA = -55 to +125 °C
t
3
--
--
125
170
ns
RD
Pulse Width TA = -55 to +125 °C t
4
t
3
-- ns
CS
to RD Hold Time TA = -55 to +125 °C t
5
0--ns
Data Setup Time After BUSY
4
CL = 100 pF, TA = +25 °C
C
L
= 100 pF, TA = -55 to +125 °C
t
6
--
--
--
70
100
ns
Bus Relinguish Time
5
5. t7 is defined as the time required for the data lines to change 0.5V when loaded with the circuit of Figure 2.
(T
A
= +25 °C)
(-55 < T
A
< +125 °C)
t
7
--
--
75
90
ns
Delay Between Read Operations (-55 < T
A
< +125 °C) t
8
200 -- ns
TABLE 4. 7672 DC ELECTRICAL CHARACTERISTICS
(VDD = 5V ±5%, VSS = -12V ±10%, V
REF
= -5V, TA = -55 TO 125 °C UNLESS OTHERWISE SPECIFIED)
P
ARAMETER SYMBOL TEST CONDITION MIN MAX UNITS