MAXWELL 54LVTH162244RPFS, 54LVTH162244RPFE, 54LVTH162244RPFB, 54LVTH162244RPFI Datasheet

54LVTH162244
16-Bit Buffers/Drivers with
Memory
FEATURES:
•RAD-PAK® radiation-hardened against natural space radia- tion
• Total dose hardness:
- > 100 krad (Si), depending upon space mission
• Output ports have equivalent 22­external resistors are required
• Support mixed-mode signal operation (5V input and output voltages with 3.3V V
• Support unregulated battery operation down to 2.7V
•Typical V T
= 25°C
A
•I
and power-up 3-state support hot insertion
OFF
• Bus hold on data inputs eliminates the need for external pull-up/pull-down resistors
• Distributed V speed switching noise
• Flow-through architecture optimizes PCB layout
• Package: 48 pin R
(Output ground bounce) < 0.8V at VCC = 3.3V,
OLP
CC
)
CC
and GND pin configuration minimizes high-
AD-PAK flat pack
series resistors, so no
Logic Diagram
DESCRIPTION:
Maxwell Technologies’ 54LVTH162244 devices are 16-bit buff­ers and line drivers designed for low-voltage (3.3V) V ation, but with the capability to provide a TTL interface to a 5V system environment. These devices can be used as four 4-bit buffers, two 8-bit buffers, or one 16-bit buffer. These devices provide true outputs and symmetrical active-low output-enable (OE
) inputs.
The outputs, which are designed to source or sink up to 12 mA, include equivalent 22­shoot and undershoot. Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
Maxwell Technologies' patented R ogy incorporates radiation shielding in the microcircuit pack­age. It eliminates the need for box shielding while providing the required radiation shielding for a lifetime in orbit or space mission. In a GEO orbit, R krad (Si) radiation dose tolerance. This product is available with screening up to Class S.
series resistors to reduce over-
AD-PAK® packaging technol-
AD-PAK provides greater than 100
CC
oper-
1000607
(858) 503-3300 - Fax: (858) 4503-3301 - www.maxwell.com
12.19.01 Rev 1
All data sheets are subject to change without notice
©2001 Maxwell Technologies.
All rights reserved.
1
16-Bit Buffers/Drivers with 3-State Outputs
TABLE 1. PINOUT DESCRIPTION
PIN SYMBOL DESCRIPTION
1, 48, 25, 24 1OE-4OE Output Enable
2, 3, 5, 6 1Y1-1Y4 Output
4, 10, 15, 21, 28, 34,
39, 45
7, 18, 31, 42 V
8, 9, 11, 12 2Y1-2Y4 Output
13, 14, 16, 17 3Y1-3Y4 Output
19, 20, 22, 23 4Y1-4Y4 Output
47, 46, 44, 43 1A1-1A4 Input
41, 40, 38, 37 2A1-2A4 Input
36, 35, 33, 32 3A1-3A4 Input
30, 29, 27, 26 4A1-4A4 Input
GND Ground
CC
Supply Voltage
54LVTH162244
Memory
TABLE 2. 162244 ABSOLUTE MAXIMUM RATINGS
P
ARAMETER SYMBOL MIN MAX UNIT
Supply Voltage Range V
Input Voltage Range
2
Voltage range applied to any output in the high-impedance or power-off state
Voltage range applied to any output in the high state
2
2
Current into any output in the low state I
Current into any output in the high state
3
Input clamp current I
Output clamp current I
Operating Temperature T
Storage Temperature Range T
Operating Temperature Range T
CC
V
I
V
O
V
O
O
I
O
(VI < 0) -- -50 mA
IK
(VO < 0) -- -50 mA
OK
A
S
A
1
-0.5 4.6 V
-0.5 7 V
-0.5 7 V
-0.5 to V
CC
0.5 V
-- 30 mA
30 -- mA
-55 125 °C
-65 150
-55 125 °C
°
C
1. Stresses beyond listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress rat­ings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
3. This current flows only when the output is in the high state and VO > VCC.
1000607
12.19.01 Rev 1
All data sheets are subject to change without notice
©2001 Maxwell Technologies.
All rights reserved.
2
16-Bit Buffers/Drivers with 3-State Outputs
TABLE 3. DELTA LIMITS
PARAMETER VARIATION
54LVTH162244
I
CC(OP)
I
OZH
I
OZL
TABLE 4. 162244 RECOMMENDED OPERATING CONDITIONS
ARAMETER SYMBOL MIN MAX UNIT
P
Supply Voltage V
High-level Input Voltage V
Low-level Input Voltage V
Input Voltage V
High-level output current I
Low-level output current I
Input Transition Rise or Fall Rate Outputs
±10% of specified value on Table 5
±10% of specified value on Table 5
±10% of specified value on Table 5
CC
IH
IL
I
OH
OL
2.7 3.6 V
2--V
-- 0.8 V
-- 5.5 V
-- -12 mA
-- 12 mA
t/v-- 10 ns/V
1
enabled
Power-up ramp rate
t/V
Operating Temperature T
CC
A
200 -- µs/V
-55 125
1. All unused control inputs of the device must be held at high or low to ensure proper device operation.
Memory
°
C
P
ARAMETER SYMBOL TEST CONDITIONS MIN MAX UNIT
Input Clamp Voltage V
High-Level Output Voltage V
Low-Level Output Voltage V
Input Current I
Hold Current I
Output Disabled Leakage Current - High
1000607
TABLE 5. 162244 DC ELECTRICAL CHARACTERISTICS
(VCC = 3.3V ±10%, TA = -55 TO +125°C, UNLESS OTHERWISE SPECIFIED)
VCC = 2.7 II = -18mA -- -1.2 V
IK
OHVCC
OL
I
I(HOLD)VCC
I
OZHVCC
= 3V IOH = -12 mA 2 -- V
VCC = 3V IOL = 12 mA -- 0.8 V
VCC = 0 or 3.6V VI = 5.5V -- 10 µA
V
= 3.6V VI = VCC or
CC
Control inputs -- ±1
GND
V
= 3.6V VI = V
CC
CC
V
= 0 -- -5
I
Data Inputs -- 1
= 3V VI = 0.8V Data Inputs 75 -- µA
V
= 2V -75 --
I
= 3.6V, VO = 3V -- 5 µA
12.19.01 Rev 1
All data sheets are subject to change without notice
3
©2001 Maxwell Technologies.
All rights reserved.
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