MAXIM MAX3394E, MAX3395E, MAX3396E User Manual

General Description
The MAX3394E/MAX3395E/MAX3396E bidirectional level translators provide level shifting required for data transfer in a multivoltage system. Internal slew-rate enhancement circuitry features 10mA current-sink and 15mA current-source drivers to isolate capacitive loads from lower current drivers. In open-drain systems, slew­rate enhancement enables fast data rates with larger pullup resistors and increased bus load capacitance. Externally applied voltages, V
CC
and VL, set the logic­high levels for the device. A logic-low signal on one I/O side of the device appears as a logic-low signal on the opposite I/O side, and vice-versa. Each I/O line is pulled up to V
CC
or VLby an internal pullup resistor, allowing the devices to be driven by either push-pull or open-drain drivers.
The MAX3394E/MAX3395E/MAX3396E feature a tri­state output mode, thermal-shutdown protection, and ±15kV Human Body Model (HBM) ESD protection on the VCCside for greater protection in applications that route signals externally.
The MAX3394E/MAX3395E/MAX3396E accept V
CC
volt-
ages from +1.65V to +5.5V, and V
L
voltages from +1.2V
to V
CC
, making them ideal for data transfer between low voltage ASIC/PLDs and higher voltage systems. The MAX3394E/MAX3395E/MAX3396E operate at a guaran­teed data rate of 6Mbps with push-pull drivers and 1Mbps with open-drain drivers.
The MAX3394E is a dual-level translator available in 9-bump UCSP™ and 8-pin 3mm x 3mm TDFN packages. The MAX3395E is a quad-level translator available in 12­bump UCSP, and 12-pin 4mm x 4mm TQFN packages. The MAX3396E is an octal-level translator available in 20­bump UCSP and 20-pin 5mm x 5mm TQFN packages. The MAX3394E/MAX3395E/MAX3396E operate over the extended -40°C to +85°C temperature range.
Applications
Multivoltage Bidirectional Level Translation
SPI™, MICROWIRE™, and I2C Level Translation
Open-Drain Rise-Time Speed-Up
High-Speed Bus Fan-Out Expansion
Cell Phones
Telecom, Networking, Servers, RAID/SAN
Features
±15kV ESD Protection on I/O V
CC_
Lines
Bidirectional Level Translation Without Direction
Pin
I/O V
L_
and I/O V
CC_
10mA Sink-/15mA Source-
Current Capability
Slew-Rate Enhancement Circuitry Supports
Larger Capacitive Loads or Larger External Pullup Resistors
6Mbps Push-Pull/1Mbps Open-Drain Guaranteed
Data Rate
Wide Supply-Voltage Range: Operation Down to
+1.2V on V
L
and +1.65V on V
CC
Low Supply Current in Tri-State Output Mode
(3µA typ)
Low Quiescent CurrentThermal-Shutdown ProtectionUCSP, TDFN, and TQFN Packages
MAX3394E/MAX3395E/MAX3396E
±15kV ESD-Protected, High-Drive Current, Dual-/Quad-/
Octal-Level Translators with Speed-Up Circuitry
________________________________________________________________
Maxim Integrated Products
1
19-3884; Rev 2; 2/07
For pricing, delivery, and ordering information, please contact Maxim/Dallas Direct! at 1-888-629-4642, or visit Maxim’s website at www.maxim-ic.com.
12
34
8
7
6
5
V
L
I/O V
L
1
I/O V
L
2
GND
*CONNECT EXPOSED PAD TO GROUND
*EP
I/O V
CC
2
I/O V
CC
1
EN
V
CC
MAX3394E
TDFN
TOP VIEW (LEADS ON BOTTOM)
+
Pin Configurations
Ordering Information
MICROWIRE is a trademark of National Semiconductor Corp.
SPI is a trademark of Motorola, Inc.
UCSP is a trademark of Maxim Integrated Products, Inc.
Note: All devices specified over the -40°C to +85°C operating range.
+
Denotes lead(Pb)-free/RoHS-compliant package.
*
Future product—contact factory for availability.
**EP = Exposed paddle.
Pin Configurations continued at end of data sheet.
Selector Guide appears at end of data sheet.
PART PIN-PACKAGE PKG CODE
MAX3394EETA+T 8 TDFN-EP** T833-1
MAX3394EEBL+T 9 UCSP B9-5
MAX3395EETC+ 12 TQFN-EP** T1244-4
MAX3395EEBC+T 12 UCSP B12-1
MAX3396EEBP+T* 20 UCSP B20-1
MAX3396EETP+* 20 TQFN-EP** T2055-4
MAX3394E/MAX3395E/MAX3396E
±15kV ESD-Protected, High-Drive Current, Dual-/Quad-/ Octal-Level Translators with Speed-Up Circuitry
2 _______________________________________________________________________________________
ABSOLUTE MAXIMUM RATINGS
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
(All voltages referenced to GND.) V
CC
......................................................................... -0.3V to +6V
V
L
............................................................................ -0.3V to +6V
I/O V
CC_
...................................................... -0.3V to VCC+ 0.3V
I/O V
L_
........................................................... -0.3V to VL+ 0.3V
EN ........................................................................... -0.3V to +6V
Short-Circuit Duration I/O V
L_
, I/O V
CC_
to GND ..... Continuous
Maximum Continuous Current ........................................ ±50mA
Continuous Power Dissipation (T
A
= +70°C)
8-Pin TDFN (derate 18.2mW/°C above +70°C) ........ 1455mW
9-Bump UCSP (derate 4.7mW/°C above +70°C) ........ 379mW
12-Pin TQFN (derate 16.9mW/°C above +70°C) ........1349mW
12-Bump UCSP (derate 6.5mW/°C above +70°C) ..... 519mW
20-Pin TQFN (derate 20.8mW/°C above +70°C) ........1667mW
20-Bump UCSP (derate 10.0mW/°C above +70°C) .....800mW
Operating Temperature Range ......................... -40°C to +85°C
Storage Temperature Range ........................... -65°C to +150°C
Junction Temperature .....................................................+150°C
Bump Temperature (soldering) ...................................... +235°C
Lead Temperature (soldering, 10s) ............................... +300°C
ELECTRICAL CHARACTERISTICS
(VCC= +1.65V to +5.5V, VL= +1.2V to VCC; C
IOVL
15pF, C
IOVCC
15pF; TA= -40°C to +85°C, unless otherwise noted. Typical val-
ues are at T
A
= +25°C.) (Note 1)
POWER SUPPLY
VL Supply Range V
VCC Supply Range V
Supply Current from V
VCC Tri-State Supply Current I
VL Tri-State Supply Current I
LOGIC I/O
I/O VL_ Input-Voltage High Threshold
I/O VL_ Input-Voltage Low Threshold
I/O VL_ Internal Pullup DC Resistance
I/O VL_ Source Current During Low-to-High Transition
I/O VL_ Sink Current During High­to-Low Transition
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
CC
CC
L
I
CC
I
L
CC-3
L-3
V
IHL
V
ILL
R
I
IHL
I
ILL
L
I/O lines internally pulled up
I/O lines internally pulled up
EN = GND, TA = +25°C 3 6 µA
EN = GND, TA = +25°C 0.7 2 µA
EN = VCC or V
L
VL = +1.2V 15 mA
V
CC
= +1.65V 10 mA
1.2 V
1.65 5.50 V
MAX3394E 150
MAX3395E 300Supply Current from V
MAX3396E 600
MAX3394E 30
MAX3395E 30
MAX3396E 30
0.3 x V
L
L
51020kΩ
CC
0.7 x V
L
V
µA
µA
V
V
MAX3394E/MAX3395E/MAX3396E
±15kV ESD-Protected, High-Drive Current, Dual-/Quad-/
Octal-Level Translators with Speed-Up Circuitry
_______________________________________________________________________________________ 3
ELECTRICAL CHARACTERISTICS (continued)
(VCC= +1.65V to +5.5V, VL= +1.2V to VCC; C
IOVL
15pF, C
IOVCC
15pF; TA= -40°C to +85°C, unless otherwise noted. Typical val-
ues are at T
A
= +25°C.) (Note 1)
I/O VL_ Low-to-High Transition Threshold
I/O VL_ Output-Voltage Low V
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
V
L-TH
OLL
I/O VL_ Tri-State Output Leakage Current
I/O VCC_ Input-Voltage High Threshold
I/O VCC_ Input-Voltage Low Threshold
I/O VCC_ Internal Pullup DC Resistance
I/O VCC_ Source Current During Low-to-High Transition
I/O VCC_ Sink Current During High-to-Low Transition
I/O VCC_ Low-to-High Transition Threshold
I/O VCC_ Output-Voltage Low V
V
V
R
I
IHCC
I
ILCC
V
CC-TH
IHC
ILC
CC
OLC
I/O VCC_ Tri-State Output Leakage Current
EN Input-Voltage High Threshold V
EN Input-Voltage Low Threshold V
IHE
ILE
EN Pin Input Leakage Current TA = +25°C -1 +1 µA
ESD PROTECTION
I/O VCC_ ESD Protection C
V
= +3.3V, VL = +1.8V
CC
I/O VL_ sink current = 5mA, V
I/O VL_ sink current = 10mA, V
0.2 x V
L
EN = GND, T
= +25°C -1 +1 µA
A
(Note 2)
(Note 2)
EN = VCC or V
V
= +1.65V 15 mA
CC
V
= +1.65V 10 mA
CC
V
= +3.3V, VL = +1.8V
CC
L
I/O VCC_ sink current = 5mA, V
I/O VCC_ sink current = 10mA, V or 0.2 x V
EN = GND, T
L
= +25°C -1 +1 µA
A
= 1µF, Human Body Model ±15 kV
VCC
0.3 x V
= 0V 0.25
ILC
0.4V or
ILC
0.5 x
L
V
L
0.3 x
V
CC
51020kΩ
0.3 x
V
= 0V 0.25
ILL
0.4V
ILL
CC
0.5 x V
CC
0.3 x V
L
V
ILC
0.4V
0.7 x V
V
ILL
0.4V
0.7 x
V
+
CC
+
L
V
V
V
V
V
V
V
V
MAX3394E/MAX3395E/MAX3396E
±15kV ESD-Protected, High-Drive Current, Dual-/Quad-/ Octal-Level Translators with Speed-Up Circuitry
4 _______________________________________________________________________________________
TIMING CHARACTERISTICS
(VCC= +1.65V to +5.5V, VL= +1.2V to VCC; C
IOVL
15pF, C
IOVCC
15pF; TA= -40°C to +85°C, unless otherwise noted. Typical val-
ues are at T
A
= +25°C.) (Note 1)
Note 1: All units are 100% production tested at TA= +25°C. Limits over the operating temperature range are guaranteed by design
and not production tested.
Note 2: During a low-to-high transition, the threshold at which the I/O changes state is the lower of V
ILL
and V
ILC
since the two sides
are internally connected by an internal switch while the device is in the logic-low state.
I/O VCC_ Rise Time t
I/O VCC_ Fall Time t
I/O VL_ Rise Time t
I/O VL_ Fall Time t
Propagation Delay
Propagation Delay After EN t
Channel-to-Channel Skew t
Maximum Data Rate
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
RVCC
FVCC
RVL
FVL
t
I/OVL-VCC
t
I/OVCC-VL
EN
SKEW
Push-pull driver, Figure 1 50
Open-drain driver, internal pullup, Figure 2 500
Push-pull driver, Figure 1 50
Open-drain driver, internal pullup, Figure 2 50
Push-pull driver, Figure 3 50
Open-drain driver, internal pullup, Figure 4 500
Push-pull driver, Figure 3 50
Open-drain driver, internal pullup, Figure 4 50
Push-pull driver, Figure 1 50
Open-drain driver, internal pullup, Figure 2 600
Push-pull driver, Figure 3 50
Open-drain driver, internal pullup, Figure 4 600
Push-pull or open-drain driver, Figure 5 5 µs
Push-pull driver 5
Open-drain driver, internal pullup 100
Push-pull driver, Figures 1, 3 6
Open-drain driver, internal pullup, Figures 2, 4
1
ns
ns
ns
ns
ns
ns
Mbps
MAX3394E/MAX3395E/MAX3396E
±15kV ESD-Protected, High-Drive Current, Dual-/Quad-/
Octal-Level Translators with Speed-Up Circuitry
_______________________________________________________________________________________
5
Typical Operating Characteristics
(VCC= +2.5V, VL= +1.8V, CL= 15pF, TA= +25°C, unless otherwise noted.)
VCC SUPPLY CURRENT
vs. SUPPLY VOLTAGE
MAX3394E–96E toc01
VCC SUPPLY VOLTAGE (V)
V
CC
SUPPLY CURRENT (mA)
5.04.54.03.53.02.52.0
0.5
1.0
1.5
2.0
2.5
3.0
0
1.5 5.5
VL = +1.2V DRIVING I/O V
L_
1Mbps OPEN-DRAIN
6Mbps PUSH-PULL
VL SUPPLY CURRENT vs. SUPPLY VOLTAGE
MAX3394E–96E toc02
VL SUPPLY VOLTAGE (V)
V
L
SUPPLY CURRENT (mA)
4.54.03.53.02.52.0
0.5
1.0
1.5
2.0
2.5
3.0
0
1.5 5.0
VCC = +5.0V DRIVING I/O V
L_
1Mbps OPEN-DRAIN
6Mbps PUSH-PULL
VCC SUPPLY CURRENT
vs. TEMPERATURE
MAX3394E–96E toc03
TEMPERATURE (°C)
V
CC
SUPPLY CURRENT (mA)
603510-15
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0
-40 85
DRIVING I/O V
L_
1Mbps OPEN-DRAIN
6Mbps PUSH-PULL
VL SUPPLY CURRENT
vs. TEMPERATURE
MAX3394E–96E toc04
TEMPERATURE (°C)
V
L
SUPPLY CURRENT (mA)
603510-15
0.05
0.10
0.15
0.20
0.25
0.30
0.35
0
-40 85
DRIVING I/O V
L_
1Mbps OPEN-DRAIN
6Mbps PUSH-PULL
0
1.5
1.0
0.5
2.0
2.5
3.0
0403010 20 50 60 70 80 90 100
MAX3394E-96E toc05
LOAD CAPACITANCE (pF)
V
CC
SUPPLY CURRENT (mA)
VCC SUPPLY CURRENT
vs. LOAD CAPACITANCE
DRIVING I/O V
L_
6Mbps PUSH-PULL
1Mbps OPEN-DRAIN
0
0.2
0.1
0.4
0.3
0.6
0.5
0.7
0.9
0.8
1.0
020304010 50 60 70 9080 100
MAX3394E-96E toc06
LOAD CAPACITANCE (pF)
V
L
SUPPLY CURRENT (mA)
VL SUPPLY CURRENT
vs. LOAD CAPACITANCE
DRIVING I/O V
L_
6Mbps PUSH-PULL
1Mbps OPEN-DRAIN
0
100
50
200
150
300
250
350
450
400
500
020304010 50 60 70 9080 100
MAX3394E-96E toc07
CAPACITIVE LOAD (pF)
RISE TIME (ns)
OPEN-DRAIN RISE TIME vs. LOAD CAPACITANCE
DRIVING I/O V
L_
DRIVING I/O V
CC_
OPEN-DRAIN FALL TIME vs. LOAD CAPACITANCE
MAX3394E–96E toc08
LOAD CAPACITANCE (pF)
FALL TIME (ns)
908070605040302010
5
10
15
20
25
30
0
0 100
DRIVING I/O V
CC_
DRIVING I/O V
L_
PUSH-PULL RISE TIME
vs. LOAD CAPACITANCE
MAX3394E–96E toc09
LOAD CAPACITANCE (pF)
RISE TIME (ns)
908070605040302010
5
10
15
20
25
30
0
0 100
DRIVING I/O V
CC_
DRIVING I/O V
L_
MAX3394E/MAX3395E/MAX3396E
±15kV ESD-Protected, High-Drive Current, Dual-/Quad-/ Octal-Level Translators with Speed-Up Circuitry
6 _______________________________________________________________________________________
Typical Operating Characteristics (continued)
(VCC= +2.5V, VL= +1.8V, CL= 15pF, TA= +25°C, unless otherwise noted.)
0
4
2
8
6
12
10
14
04020 60 8010 5030 70 90 100
MAX3394E-96E toc10
LOAD CAPACITANCE (pF)
FALL TIME (ns)
PUSH-PULL FALL TIME
vs. LOAD CAPACITANCE
DRIVING I/O V
L_
DRIVING I/O V
CC_
0
15
10
5
20
25
30
0403010 20 50 60 70 80 90 100
PROPAGATION DELAY
vs. LOAD CAPACITANCE
MAX3394E-96E toc11
LOAD CAPACITANCE (pF)
PROPAGATIN DELAY (ns)
DRIVING I/O V
L_
OPEN-DRAIN
t
PDHL
t
PDLH
0
4
2
8
6
12
10
14
18
16
20
020304010 50 60 70 9080 100
MAX3394E-96E toc12
LOAD CAPACITANCE (pF)
PROPAGATION DELAY (ns)
DRIVING I/O V
CC_
OPEN-DRAIN
PROPAGATION DELAY
vs. LOAD CAPACITANCE
t
PDHL
t
PDLH
PROPAGATION DELAY
vs. LOAD CAPACITANCE
MAX3394E–96E toc13
LOAD CAPACITANCE (pF)
PROPAGATION DELAY (ns)
908060 7020 30 40 5010
5
10
15
20
25
30
35
40
45
50
0
0 100
t
PDHL
DRIVING I/O V
L_
PUSH-PULL
t
PDLH
0
4
2
8
6
12
10
14
18
16
20
020304010 50 60 70 9080 100
MAX3394E-96E toc14
LOAD CAPACITANCE (pF)
PROPAGATION DELAY (ns)
DRIVING I/O V
CC_
PUSH-PULL
SEE FIGURE 3
PROPAGATION DELAY
vs. LOAD CAPACITANCE
t
PDHL
40ns/div
(DRIVING I/O VL_, VCC = +2.5V, VL = +1.8V,
C
L
= 15pF, DATA RATE = 6Mbps)
I/O V
CC_
1V/div
I/O V
L_
1V/div
MAX3394E-96E toc15
200ns/div
(DRIVING I/O VL_, V
CC
= +5.0V, VL = +3.3V,
C
L
= 100pF, DATA RATE = 1Mbps)
MAX3394E-96E toc16
I/O V
CC_
2V/div
I/O V
L_
2V/div
200ns/div
(DRIVING I/O VL_, V
CC
= +5.0V, VL = +3.3V,
C
L
= 400pF, EXTERNAL 4.7kΩ
PULLUPS, DATA RATE = 1Mbps)
MAX3394E-96E toc17
I/O V
CC_
2V/div
I/O V
L_
2V/div
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