The MAX1917 provides a complete power-management solution for DDR memory. It contains a synchronous buck controller and an amplifier to generate
1/2V
DDR
voltage for VTT and VTTR. The VTT and VTTR
voltages are maintained within 1% of 1/2V
DDR
. The
controller operates in synchronous rectification mode to
ensure balanced current sourcing and sinking capability of up to 25A. With a shutdown current of less than
5µA, the MAX1917 is the best choice for low-power
notebook applications, as well as servers and desktop
computers. An all N-FET design optimizes efficiency.
The MAX1917 can also be used for generating V
DDR
and as a general-purpose step-down controller with
variable switching frequency as high as 1MHz with few
additional components.
The MAX1917 uses Maxim’s proprietary Quick-PWM™
architecture for fast transient response up to 96% efficiency, and the smallest external components. Output
current monitoring is achieved without sense resistors
by monitoring the bottom FET’s drain-to-source voltage.
The current-limit threshold is programmable through an
external resistor. The MAX1917 comes in a space-saving 16-pin QSOP package.
Applications
Features
♦ 25A Sourcing and Sinking Current
♦ Automatically Sets VTT to 1/2V
DDR
♦ VTT and VTTR Within 1% of 1/2V
DDR
♦ Smallest Output Capacitors
♦ 4.5V to 14V (or 28V with Resistor-Divider) Input
Voltage Range
♦ 1.5V to 3.6V Input DDR Range
♦ 200kHz/300kHz/400kHz/550kHz Preset Switching
Frequencies
♦ Variable Switching Frequency of Up to 1MHz
♦ Overcurrent Protection Without Current-Sense
Resistor
♦ Internal Soft-Start
♦ VTTR Reference Sources and Sinks Up to 25mA
♦ Quick-PWM Control for Fastest Loop Response
♦ Up to 96% Efficiency
♦ 16-Pin QSOP Package
MAX1917
Tracking, Sinking and Sourcing, Synchronous Buck
Controller for DDR Memory and Termination Supplies
= 0°C to +85°C. Typical values are at TA= +25°C, unless otherwise specified.)
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
V+ to GND ..............................................................-0.3V to +15V
EN/HSD to GND .....................................................-0.3V to +16V
VL to GND ................................................................-0.3V to +6V
PGND to GND .......................................................-0.3V to +0.3V
VTT, DDR, POK to GND ...........................................-0.3V to +6V
REF, VTTR, DL, ILIM, FSEL to GND ................-0.3V to VL + 0.3V
LX to PGND ............................................................-0.3V to +30V
BST to GND ............................................................-0.3V to +36V
DH to LX ......................................................-0.3V to V
BST
+ 0.3V
LX to BST..................................................................-6V to +0.3V
REF Short Circuit to GND ...........................................Continuous
Continuous Power Dissipation (T
A
= +70°C)
16-Pin QSOP (derate up to +70°C)..............................667mW
INDUCTOR PEAK AND VALLEY CURRENT
vs. INPUT VOLTAGE AT CURRENT LIMIT
18
R
= 400kΩ
ILIM
MAX1917 toc16
806020400-20
16
14
12
INDUCTOR CURRENT (A)
10
CIRCUIT OF FIGURE 3
8
115
I
VALLEY
I
PEAK
VIN (V)
MAX1917 toc17
13119753
PINNAMEFUNCTION
1EN/HSD
2DDR
3POK
4VTTVTT Feedback Input. Connect to VTT output.
5ILIM
6FSELFrequency Select. Selects the switching frequency of the MAX1917. See Table 1 for configuration of FSEL.
7REFReference Bypass. Connect a 0.22µF or larger capacitor from REF to GND.
8GNDGround
9VTTR
10V+
11VL
12DLLow-Side MOSFET Gate Drive. Connect to the gate of the low-side N-channel MOSFET.
13PGNDPower Ground
14BST
15DHHigh-Side MOSFET Gate Drive. Connect to the high-side N-channel MOSFET gate.
16LXInductor Switching Node
Enable/High-Side Drain. Connect to the high-side N-FET drain for normal operation. Leave unconnected or
connect to GND for low-power shutdown.
DDR Reference Input. An applied voltage at DDR sets V
VTT
and V
VTTR
to 1/2V
. DDR voltage range is
DDR
from 0 to 3.6V.
Power-OK Output. POK is an open-drain output and is logic high when both VTT and VTTR are within 12%
of regulation. POK is pulled low in shutdown.
Current-Limit Threshold Adjustment. Connect a resistor from ILIM to GND to set the current-limit threshold,
or connect ILIM to VL for default setting. See the Setting the Current Limit section.
VTTR Reference Output. Connect a 1µF or larger capacitor from VTTR to GND. VTTR is capable of
sourcing and sinking up to 25mA.
Input Supply Voltage. Supply input for the VL regulator and the VTTR regulator. Bypass with a 0.22µF or
larger capacitor.
Internal Regulator Output. Connect a 2.2µF or larger capacitor from VL to GND. VL can be connected to
V+ if the operating range is 4.5V to 5.5V.
Bootstrapped Supply to Drive High-Side N-Channel MOSFET. Connect a 0.47µF or larger capacitor from
BST to LX.
MAX1917
Tracking, Sinking and Sourcing, Synchronous Buck
Controller for DDR Memory and Termination Supplies
An internal regulator produces the 5V supply (VL) that
powers the PWM controller, MOSFET driver, logic, reference, and other blocks within the IC. This 5V lowdropout (LDO) linear regulator supplies up to 35mA for
MOSFET gate-drive and external loads. For supply voltages between 4.5V and 5.5V, connect VL to V+. This
bypasses the VL regulator, which improves efficiency,
and allows the IC to function at lower input voltages.
On-Time One-Shot and
Switching Frequency
The heart of the PWM is the one-shot that sets the highside switch on time. This fast, low-jitter, adjustable oneshot includes circuitry that varies the on time in response
to both input and output voltages. The high-side switch
on time is inversely proportional to the input voltage as
measured by the EN/HSD input, and is directly proportional to the VTT output voltage. This algorithm results in
a nearly constant switching frequency despite the lack
of a fixed-frequency clock generator. The switching frequency can be selected to avoid noise-sensitive regions
such as the 455kHz IF band. Also, with a constant
switching frequency, the inductor ripple-current operating point remains relatively constant, resulting in easy
design methodology and predictable output voltage ripple. The general formula for on time (tON) is:
where V
HSD
and V
DDR
are the voltages measured at
EN/HSD and DDR, respectively, and K = 1.7µs. The
value of N depends on the configuration of FSEL and is
listed in Table 1.
The actual switching frequency, which is given by the
following equation, varies slightly due to voltage drop
across the on-resistance of the MOSFETs and the DC
resistance of the output inductor:
where I
O
is the output current, R
DSONH
is the on-resis-
tance of the high-side MOSFET, R
DSONL
is the onresistance of the low-side MOSFET, and RDCis the DC
resistance of the output inductor. The above equation is
valid only when FSEL is connected to ground. The ideal
switching frequency for V
DDR
= 2.5V is about 550kHz.
The switching frequency, which is almost constant,
results in relatively constant inductor ripple current
regardless of input voltage and predictable output voltage ripple. This feature eases design methodology.
Switching frequency increases for positive (sourcing)
load current and decreases for negative (sinking) load
current, due to the changing voltage drop across the
low-side MOSFET, which changes the inductor-current
discharge ramp rate. The on times guaranteed in the
Electrical Characteristics tables are also influenced by
switching delays caused by the loading effect of the
external power MOSFETs.
VTTR Reference
The MAX1917 VTTR output is capable of sourcing or
sinking up to 25mA of current. The V
TTR
output voltage
is one half of the voltage applied to the DDR input.
Bypass VTTR with at least a 1.0µF capacitor.
EN/HSD Function
In order to reduce pin count and package size, the
MAX1917 features a dual-function input pin, EN/HSD.
When EN/HSD is connected to ground, the internal circuitry powers off, reducing current consumption to less
than 5µA typical (circuit of Figure 6). To enable normal
operation, connect EN/HSD to the drain of the high-side
MOSFET. If EN/HSD is not grounded, it becomes an
input that monitors the high-side MOSFET drain voltage
(converter input voltage) and uses that measurement to
calculate the appropriate on time for the converter.
Therefore, EN/HSD must be connected to this node in
order for the controller to operate properly.
The voltage at REF is nominally 2.00V. Connect a 0.22µF
ceramic bypass capacitor between REF and GND.
Overcurrent Protection
The current-limit circuit employs a unique “valley” current-sensing algorithm that uses the on-state resistance
of the low-side MOSFET as a current-sensing element.
If the current-sense signal is greater than the currentlimit threshold, the PWM is not allowed to initiate a new
cycle. The actual peak current is greater than the current-limit threshold by an amount equal to the inductor
ripple current. Therefore, the exact current-limit characteristic and maximum load capability are a function of
the MOSFET on-resistance, inductor value, and input
voltage. The reward for this uncertainty is robust, lossless overcurrent sensing. There is also a negative current limit that prevents excessive reverse inductor
currents when V
OUT
is sinking current. The negative
current-limit threshold is set to approximately 110% of
the positive current limit, and tracks the positive current
limit when ILIM is adjusted. The current-limit threshold
can be adjusted with an external resistor (R
ILIM
) at ILIM.
A precision 5µA pullup current source at ILIM sets a
voltage drop on this resistor, adjusting the current-limit
threshold from <50mV to >200mV. In the adjustable
mode, the current-limit threshold voltage is precisely
1/10th the voltage seen at ILIM.
Therefore, choose R
ILIM
equal to 2kΩ/mV of the cur-
rent-limit threshold. The threshold defaults to 100mV
when ILIM is connected to VL. The logic threshold for
switchover to the 100mV default value is approximately
V
L
- 1V. The adjustable current limit can accommodate
various MOSFETs. A capacitor in parallel with R
ILIM
can
provide a variable soft-start function.
Carefully observe the PC board layout guidelines to
ensure that noise and DC errors do not corrupt the current-sense signals seen by LX and PGND. The IC must
be mounted close to the low-side MOSFET with short,
direct traces making a Kelvin-sense connection to the
source and drain terminals. See the PC Board Layout
section.
Voltage Positioning
The quick-PWM control architecture responds virtually
instantaneously to transient load changes and eliminates the control loop delay of conventional PWM controllers. As a result, a large portion of the voltage
deviation during a step load change is from the equivalent series resistance (ESR) of the output capacitors.
For DDR termination applications, the maximum
allowed voltage deviation is ±40mV for any output load
transition from sourcing current to sinking current.
Passive voltage positioning adjusts the converter’s output voltage based on its load current to optimize transient response and minimize the required output
capacitance. Voltage positioning is implemented by
connecting a 2mΩ resistor as shown in Figure 1.
MOSFET Drivers
The DH and DL drivers are optimized for driving moderate-size, high-side and larger, low-side power
MOSFETs and are optimized for 2.5V and 5V input voltages. The drivers are sized to drive MOSFETs that can
deliver up to 25A output current. An adaptive deadtime circuit monitors the DL output and prevents the
Figure 2. Increasing the On Time of the High-Side MOSFET
Figure 1. Using a Resistor for Voltage Positioning
V
POK
V+
MAX1917
DDR
EN/HSD
REF
ILIM
FSEL
GND
VL
BST
DH
LX
DL
PGND
VTT
VTTR
4 x 270µF
IN
R
2mΩ
BST
PGND
VTT
VTTR
VL
R
BST
DH
LX
DL
POK
V+
MAX1917
DDR
DRP
V
OUT
2V
VTTR
EN/HSD
REF
ILIM
FSEL
GND
MAX1917
Tracking, Sinking and Sourcing, Synchronous Buck
Controller for DDR Memory and Termination Supplies
high-side FET from turning on until DL is fully off. There
must be a low-resistance, low-inductance path from the
DL driver to the MOSFET gate in order for the adaptive
dead-time circuit to work properly. Otherwise, the
sense circuitry in the MAX1917 interprets the MOSFET
gate as off while there is actually still charge left on the
gate. Use very short, wide traces measuring 10
squares to 20 squares (50mils to 100mils wide if the
MOSFET is 1in from the MAX1917). The dead time at
the other edge (DH turning off) is determined by a fixed
35ns (typ) internal delay. The internal pulldown transistor that drives DL low is robust, with a 0.5Ω (typ) on-
resistance. This helps prevent DL from being pulled up
during the fast rise time of the inductor node, due to
capacitive coupling from the drain to the gate of the
massive low-side synchronous-rectifier MOSFET. Some
combinations of high- and low-side FETs may be
encountered that cause excessive gate-drain coupling,
which can lead to efficiency-killing, EMI-producing
shoot-through currents. This can often be remedied by
adding a resistor (R
BST
) in series with BST, which
increases the turn-on time of the high-side FET without
degrading the turn-off time (Figure 2).
Figure 3. Typical Application Circuit for 1.25V at 7A Output
Typical Application Circuits
R2
5.1kΩ
MAX1917
V+
V
DDR
SHDN
POK
2N7002K
VL
R3
20kΩ
5.5V TO 14V
C9
0.47µF/25V
0.47µF/10V
Q3
3
POK
10
V+
2
DDR
1
EN/HSD
C8
7
REF
5
VL
ILIM
6
FSEL
8
GND
BST
PGND
VTT
VTTR
VL
2.5V
V
V
OUT
PGND
VTTR
IN
11
VL
DH
LX
DL
D1
CMPSH-3
14
C4
0.47µF
15
10V
16
12
13
4
9
C7
1µF/6.3V
C3
4.7µF
10V
2.5V
Q1
IRF7463
0.68µH/9A
Q2
IRF7463
C2
2 x 330µF
6V
L1
6 x 270µF
C1
1µF
6.3V
1.25V AT 7A
C6
2V
C5
2 x 10µF
6.3V
OUTPUT CAPACITORS ARE SELECTED TO COMPLY WITH JEDEC SPECIFICATIONS.
MAX1917
Tracking, Sinking and Sourcing, Synchronous Buck
Controller for DDR Memory and Termination Supplies
Firmly establish the input voltage range and maximum
load current before choosing a switching frequency
and inductor operating point (ripple current ratio). The
primary design trade-off is in choosing a good switching frequency and inductor operating point, and the following four factors dictate the rest of the design:
1) Input Voltage Range. The maximum value
(V
IN(MAX)
) must accommodate the worst-case high
input voltage. The minimum value (V
IN(MIN)
) must
account for the lowest input voltage after drops due
to connectors, fuses, and battery selector switches.
If there is a choice at all, lower input voltages result
in better efficiency.
2) Maximum Load Current. There are two values to
consider. The peak load current (I
LOAD(MAX)
)
determines the instantaneous component stresses
and filtering requirements, and thus drives output
capacitor selection, inductor saturation rating, and
the design of the current-limit circuit. The continuous load current (I
LOAD
) determines the thermal
stresses and thus drives the selection of input
capacitors, MOSFETs, and other critical heat-contributing components.
3) Switching Frequency. This determines the basic
trade-off between size and efficiency. The optimal
frequency is largely a function of maximum input
voltage, due to MOSFET switching losses that are
proportional to frequency and V
IN
2
. The optimum
frequency is also a moving target, due to rapid
improvements in MOSFET technology that are making higher frequencies more practical.
4) Inductor Operating Point. This provides trade-offs
between size and efficiency. Low inductor values
cause large ripple currents, resulting in the smallest
size but poor efficiency and high output noise. The
minimum practical inductor value is one that causes
the circuit to operate at the edge of critical conduction (where the inductor current just touches zero
with every cycle at maximum load). Inductor values
lower than this grant no further size-reduction benefit.
The inductor ripple current also impacts transientresponse performance, especially at low V
IN
- V
OUT
differentials. Low inductor values allow the inductor
current to slew faster, replenishing charge removed
from the output filter capacitors by a sudden load step.
The amount of output sag is also a function of the maximum duty factor, which can be calculated from the on
time and minimum off time:
Output Inductor Selection
The switching frequency (on time) and operating point
(% ripple or LIR) determine the inductor value as follows:
Example: I
LOAD(MAX)
= 7A, V
OUT
= 1.25V, f = 550kHz,
50% ripple current or LIR = 0.5:
Find a low-loss inductor having the lowest possible DC
resistance that fits in the allotted dimensions. Ferrite
cores are often the best choice, although powdered
iron is inexpensive and can work well at 200kHz. The
core must be large enough not to saturate at the peak
inductor current:
(I
PEAK
): I
PEAK
= I
LOAD(MAX)
+ (LIR / 2) (I
LOAD(MAX)
)
Output Capacitor Selection
The output filter capacitor must have low enough ESR
to meet output ripple and load-transient requirements,
yet have high enough ESR to satisfy stability requirements. Also, the capacitance value must be high
enough to absorb the inductor energy going from a
positive full-load to negative full-load condition or vice
versa without incurring significant over/undershoot. In
DDR termination applications where the output is subject to violent load transients, the output capacitor’s
size depends on how much ESR is needed to prevent
the output from dipping too low under a load transient.
Ignoring the sag due to finite capacitance:
In DDR applications, V
DIP
= 40mV, the output capacitor’s size depends on how much ESR is needed to
maintain an acceptable level of output voltage ripple:
2
IL
∆
()
LOAD MAX
V
SAG
=
×××−
CDUTYVV
2
fIN MINOUT
()
L
=
L
5500 57
kHzA
fLIRI
125
V
OUT
××
V
.
××
.
R
ESR
R
≤
ESR
V
DIP
≤==Ω
I
LOAD MAX
()
V
PP
−
×
LIR I
LOAD MAX
()
×
()
()
LOAD MAX
()
065068
=µ µ
..
mV
40
A
14
mV
9
=
×
.
05 7
kHz
HH=
()
.
m
285
=Ω
.
m
257
A
MAX1917
Tracking, Sinking and Sourcing, Synchronous Buck
Controller for DDR Memory and Termination Supplies
The actual microfarad capacitance value required
relates to the physical size needed to achieve low ESR,
as well as to the chemistry of the capacitor technology.
As a result, the capacitor is usually selected by ESR
and voltage rating rather than by capacitance value
(this is true of tantalums, OS-CONs, POSCAPs, and
other electrolytics).
Input Capacitor Selection
The input capacitor must meet the ripple current
requirement (I
RMS
) imposed by the switching currents.
Nontantalum chemistries (ceramic, aluminum, or OSCON) are preferred due to their superior surge current
capacity:
Setting the Current Limit
The minimum current-limit threshold must be great
enough to support the maximum load current when the
current limit is at the minimum tolerance value. The valley of the inductor current occurs at I
LOAD(MAX)
minus
half of the ripple current. For example:
I
LIMIT(LOW)
> I
LOAD(MAX)
- (LIR / 2) ✕ I
LOAD(MAX)
where I
LIMIT(LOW)
= minimum current-limit threshold
voltage divided by the R
DS(ON)
of Q2. For the
MAX1917, the minimum current-limit threshold (100mV
default setting) is 50mV. Use the worst-case maximum
value for R
DS(ON)
from the MOSFET Q2 data sheet, and
add some margin for the rise in R
DS(ON)
with temperature. A good general rule is to allow 0.5% additional
resistance for each °C of temperature rise.
When adjusting the current limit, use a 1% tolerance
R
ILIM
resistor to prevent a significant increase of errors
in the current-limit tolerance.
Setting the Voltage Positioning
The droop resistor, R
DRP
, in series with the output
inductor before the output capacitor, sets the droop
voltage, V
DRP
. Choose R
DRP
such that the output voltage at the maximum load current, including ripple, is
just above the lower limit of the output tolerance:
R
DRP
introduces some power dissipation, which is
given by:
PD(DRP) = R
DRP
✕ I
OUT(MAX)
2
R
DRP
should be chosen to handle this power dissipation.
MOSFET Power Dissipation
Worst-case conduction losses occur at the duty-factor
extremes. For the high-side MOSFET, the worst-case
power dissipation due to resistance occurs at minimum
input voltage:
PD(Q1) = (V
OUT
/ V
IN(MIN)
) ✕ (I
LOAD
2
) ✕ (R
DS(ON)
)
Generally, a small high-side MOSFET is desired in order
to reduce switching losses at high input voltages.
However, the R
DS(ON)
required to stay within package
power-dissipation limits often limits how small the
MOSFET can be. Again, the optimum occurs when the
switching (AC) losses equal the conduction (R
DS(ON)
)
losses. Calculating the power dissipation in Q1 due to
switching losses is challenging because it must allow for
difficult-to-quantify factors that influence the turn-on and
turn-off times. These factors include the internal gate
resistance, gate charge, threshold voltage, source
inductance, and PC board layout characteristics. The following switching loss calculation provides only a very
rough estimate and is no substitute for breadboard evaluation, preferably including a check using a thermocouple mounted on Q1:
where C
RSS
is the reverse transfer capacitance of Q1
and I
GATE
is the peak gate-drive source/sink current.
For the low-side MOSFET, Q2, the worst-case power
dissipation always occurs at maximum input voltage:
PD(Q2) = (1 - V
OUT
/ V
IN(MAX)
) ✕ I
LOAD
2
✕ R
DS(ON)
II
RMSLOAD
VVV
OUTINOUT
=×
×−
()
V
IN
R
VVV
OUT TYPOUT MINRIPPLE
<
DRP
−−
()()
I
()
OUT MAX
/2
PD SWITCHING
()
CVfI
×××
RSSIN MAXLOAD
=
2
()
I
GATE
MAX1917
Tracking, Sinking and Sourcing, Synchronous Buck
Controller for DDR Memory and Termination Supplies
The absolute worst case for MOSFET power dissipation
occurs under heavy overloads that are greater than or
equal to I
LOAD(MAX)
. To protect against this condition,
design the circuit to tolerate:
I
LOAD
= I
LIMIT(HIGH)
+ (LIR / 2) (I
LOAD
(MAX))
where I
LIMIT(HIGH)
is the maximum valley current
allowed by the current-limit circuit, including threshold
tolerance and on-resistance variation. If short-circuit
protection without overload protection is enough, a normal I
LOAD
value can be used for calculating compo-
nent stresses.
Control IC Power Dissipation
MAX1917 has on-chip MOSFETs drivers (DH and DL)
that dissipate the power loss due to driving the external
MOSFETs. Power dissipation due to a MOSFET driver is
given by:
where QGHand QGLare the total gate charge of the
high-side and low-side MOSFETs, respectively. Select
the switching frequency and V+ correctly to ensure the
power dissipation does not exceed the package power
dissipation requirement.
Applications Information
PC Board Layout
Careful PC board layout is critical to achieving low
switching losses and clean, stable operation. The
switching power stage requires particular attention. If
possible, mount all of the power components on the top
side of the board with their ground terminals flush
against one another. Follow these guidelines for good
PC board layout:
1) Keep the high-current paths short, especially at the
ground terminals. This practice is essential for stable, jitter-free operation.
2) Connect GND and PGND together as close to the
IC as possible.
3) Keep the power traces and load connections short.
This practice is essential for high efficiency. The
use of thick copper PC boards (2oz vs. 1oz) can
enhance full-load efficiency by 1% or more.
Correctly routing PC board traces is a difficult task
that must be approached in terms of fractions of
centimeters, where a single mΩ of excess trace
resistance causes a measurable efficiency penalty.
4) LX and PGND connections to Q2 for current limiting
must be made using Kelvin-sense connections in
order to guarantee the current-limit accuracy. With
8-pin SO MOSFETs, this is best done by routing
power to the MOSFETs from outside using the top
copper layer, while tying in PGND and LX inside
(underneath) the 8-pin SO package.
5) When trade-offs in trace lengths must be made, it is
preferable to allow the inductor charging path to be
made longer than the discharge path. For example,
it is better to allow some extra distance between the
input capacitors and the high-side MOSFET than to
allow distance between the inductor and the lowside MOSFET or between the inductor and the output filter capacitor.
6) Ensure that the VTT feedback connection to C
OUT
is short and direct. In some cases, it may be desirable to deliberately introduce some trace length
(droop resistance) between the FB inductor node
and the output filter capacitor.
7) VTT feedback sense point should also be as close
as possible to the load connection.
8) Route high-speed switching nodes away from sensitive analog nodes (DDR, EN/HSD, REF, ILIM).
9) Make all pin-strap control input connections (ILIM,
etc.) to GND or VL close to the chip, and do not
connect to PGND.
Chip Information
TRANSISTOR COUNT: 2708
PROCESS: BiCMOS
PVfQQ I
=+
××+
()
DRSGHGLVTTR
()
()
+
MAX1917
Tracking, Sinking and Sourcing, Synchronous Buck
Controller for DDR Memory and Termination Supplies
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
18 ____________________Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600
(The package drawing(s) in this data sheet may not reflect the most current specifications. For the latest package outline information,
go to www.maxim-ic.com/packages.)
QSOP.EPS
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