The MAX14548E/MAX14548AE 16-channel, bidirectional
level translators (LLTs) provide the level shifting necessary for 100Mbps data transfer in multivoltage systems.
Externally applied voltages, VCC and VL, set the logic
levels on either side of the device. Logic signals present
on the VL side of the device appear as a high-voltage
logic signal on the VCC side of the device and vice versa.
The devices feature a programming frequency input (PF)
that adjusts the one-shot accelerator on-time to guarantee a bit rate of 100Mbps with a load capacitance < 15pF
and VL > 1.1V (MAX14548E) or VL > 1.4V (MAX14548AE)
when driven low. The MAX14548E can drive capacitive
loads up to 50pF with a guaranteed bit rate of 40Mbps
when VL R 1.1V and PF is driven high. The MAX14548AE
can drive capacitive loads up to 50pF with a guaranteed
bit rate of 40Mbps when VL R 1.1V and PF is driven high.
The device operate at full speed with external drivers
that source as low as 4mA output current. Each I/O channel is pulled up to VCC or VL by an internal 35FA current
source, allowing both devices to be driven by either
push-pull or open-drain drivers.
The devices feature multiple power-saving features
including an enable input (EN) that places the device
into a low-power shutdown mode when driven low and
an automatic shutdown mode that disables the part
when VCC is less than VL. The MAX14548AE output driver is designed to operate at full speed (100Mbps) with
VL > 1.4V, which reduces the dynamic supply current vs.
the MAX14548E. The state of I/O V
high-impedance state during shutdown.
The devices operate with VCC voltages from +1.7V to
+3.6V and VL voltages from +1.1V to +3.6V, making
them ideal for data transfer between low-voltage ASICs/
PLDs and higher voltage systems. The devices are available in a 40-bump WLP (2.16mm x 3.46mm) package
with 0.4mm ball pitch, and operate over the extended
-40NC to +85NC temperature range.
and I/O VL_are in
CC_
Features
S Bidirectional Level Translation
S 100Mbps Guaranteed Data Rate
S +1.7V to +3.6V Supply Voltage Range for V
S +1.1V to +3.6V Supply Voltage Range for V
(VCC > VL)
S -40NC to +85NC Extended Operating Temperature
Range
CC
L
Applications
CMOS Logic-Level Translation
Low-Voltage ASIC Level Translation
Smart Card Readers
Portable Communication Devices
Cell Phones
GPS
Telecommunications Equipment
Typical Operating Circuit appears at end of data sheet.
Note 1: Package thermal resistances were obtained using the method described in JEDEC specification JESD51-7, using a four-
layer board. For detailed information on package thermal considerations, refer to www.maxim-ic.com/thermal-tutorial.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(VCC = +1.7V to +3.6V, VL = +1.1V to +3.6V, VCC > VL, EN = VL, C
noted. Typical values are at VCC = +2.8V, VL = +1.8V and TA = +25NC.) (Notes 2, 3)
PARAMETERSYMBOLCONDITIONSMINTYPMAXUNITS
POWER SUPPLIES
VL Supply Range V
MAX14548E/MAX14548AE
VCC Supply RangeV
Supply Current from V
Supply Current from V
CC
L
VCC Shutdown Supply
Current
VL Shutdown Mode Supply
Current
Dynamic Supply CurrentI
I/O V
, I/O VL_ Three-State
CC_
Leakage Current
EN, PF Input Leakage CurrentI
VL Shutdown Threshold V
VL - VCC Shutdown Threshold
High
VL - VCC Shutdown Threshold
Low
I/O VL_ Pullup CurrentI
I/O V
I/O VL_ to I/O V
Pullup CurrentI
CC_
DC
CC_
Resistance
L
CC
I
QVCC
I
QVL
I
SHDN-VCC
I
SHDN-VL
D
I
LEAK
LEAK_EN_PF
TH_VL
V
TH_H
V
TH_L
VL_PU_
VCC_PU_
R
IOVL_IOVCC
I/O V
CC_
I/O V
CC_
TA = +25NC, EN = GND, unconnected
I/O pins
TA = +25NC, EN = GND, unconnected
I/O pins
TA = +25NC, EN = VL, VCC = GND,
unconnected I/O pins
One I/O switching at
25MHz; all other I/O
connected to VCC or
VL; C
= 1FF, CVL = 1FF, TA = -40NC to +85NC, unless otherwise
VCC
Unpowered
device
Powered device
On rising edge2.65
On falling edge2.5
On rising edge4
On falling edge3.7
VL -
0.2
VCC -
0.4
VL -
0.25
VL -
0.4
4/5 x
V
4/5 x
V
CC
MAX14548E/MAX14548AE
Q12
kV
Q5
Q2
L
1/3 x
V
L
1/3 x
V
CC
kV
V
V
V
V
V
V
V
V
ns
ns
I
I
I
I
3
100Mbps, 16-Channel LLTs
HIGH-SPEED TIMING CHARACTERISTICS—MAX14548E
(VCC = +1.7V to +3.6V, VL = +1.1V to +3.6V, VCC > VL, EN = VL, PF = low, C
TA = -40NC to +85NC, unless otherwise noted. Typical values are at VCC = +2.8V, VL = +1.8V and TA = +25NC.) (Notes 2, 3)
PARAMETERSYMBOLCONDITIONSMINTYPMAXUNITS
I/O V
I/O V
I/O VL_ Rise Timet
I/O VL_ Fall Timet
Propagation Delay
(Driving I/O VL_)
Propagation Delay
(Driving I/O V
Channel-to-Channel Skewt
Propagation Delay from
I/O VL_ to I/O V
Propagation Delay from
I/O V
Maximum Data Rate
MAX14548E/MAX14548AE
HIGH-SPEED TIMING CHARACTERISTICS—MAX14548AE
Rise Timet
CC_
Fall Timet
CC_
)
CC_
After EN
CC_
to I/O VL_ After EN
CC_
RVCC
FVCC
RVL
FVL
t
PVL-VCC
t
PVCC-VL
SKEW
t
EN-VCC
t
EN-VL
Input rise time < 2ns, Figure 12ns
Input fall time < 2ns, Figure 12ns
Input rise time < 2ns, Figure 22ns
Input fall time < 2ns, Figure 22ns
Input rise time < 2ns, Figure 12.75ns
Input rise time < 2ns, Figure 22.26ns
Input rise time/fall time < 2ns0.2ns
R
= 1MI, Figure 3
LOAD
R
= 1MI, Figure 3
LOAD
Push-pull operation100
Open-drain operation0.3
(VCC = +1.7V to +3.6V, VL = +1.4V to +3.6V, VCC > VL, EN = VL, PF = low, C
TA = -40NC to +85NC, unless otherwise noted. Typical values are at VCC = +2.8V, VL = +1.8V and TA = +25NC.) (Notes 2, 3)
PARAMETERSYMBOLCONDITIONSMINTYPMAXUNITS
I/O V
I/O V
I/O VL_ Rise Timet
I/O VL_ Fall Timet
Propagation Delay
(Driving I/O VL_)
Propagation Delay
(Driving I/O V
Channel-to-Channel Skewt
Propagation Delay from
I/O VL_ to I/O V
Propagation Delay from
I/O V
Maximum Data Rate
Rise Timet
CC_
Fall Timet
CC_
)
CC_
After EN
CC_
to I/O VL_ After EN
CC_
RVCC
FVCC
RVL
FVL
t
PVL-VCC
t
PVCC-VL
SKEW
t
EN-VCC
t
EN-VL
Input rise time < 2ns, Figure 12ns
Input fall time < 2ns, Figure 12ns
Input rise time < 2ns, Figure 22ns
Input rise time < 2ns, Figure 22ns
Input rise time < 2ns, Figure 12.75ns
Input rise time < 2ns, Figure 22.26ns
Input rise time/fall time < 2ns0.2ns
R
= 1MI, Figure 3
LOAD
R
= 1MI, Figure 3
LOAD
Push-pull operation100
Open-drain operation0.3
= 1FF, CVL = 1FF, C
VCC
= 1FF, CVL = 1FF, C
VCC
IOVL
27
0.05
IOVL
27
0.05
P 15pF, C
P 15pF, C
IOVCC
IOVCC
P 15pF,
Fs
Fs
Mbps
P 15pF,
Fs
Fs
Mbps
4
100Mbps, 16-Channel LLTs
LOW-SPEED TIMING CHARACTERISTICS—MAX14548E
(VCC = +1.7V to +3.6V, VL = +1.1V to +3.6V, VCC > VL, EN = VL, PF = high, C
TA = -40NC to +85NC, unless otherwise noted. Typical values are at VCC = +2.8V, VL = +1.8V and TA = +25NC.) (Notes 2, 3)
PARAMETERSYMBOLCONDITIONSMINTYPMAXUNITS
I/O V
I/O V
I/O VL_ Rise Timet
I/O VL_ Fall Timet
Propagation Delay
(Driving I/O VL_)
Propagation Delay
(Driving I/O V
Channel-to-Channel Skewt
Propagation Delay from
I/O V
Propagation Delay from
I/O V
Maximum Data Rate
Rise Timet
CC_
Fall Timet
CC_
)
CC_
to I/O V
L_
to I/O VL_ After EN
CC_
CC_
After EN
RVCC
FVCC
RVL
FVL
t
PVL-VCC
t
PVCC-VL
SKEW
t
EN-VCC
t
EN-VL
Input rise time < 6ns, Figure 16ns
Input fall time < 6ns, Figure 16ns
Input rise time < 6ns, Figure 26ns
Input rise time < 6ns, Figure 26ns
Input rise time < 6ns, Figure 14ns
Input rise time < 6ns, Figure 23.37ns
Input rise time/fall time < 6ns0.20.5ns
R
= 1MI, Figure 3
LOAD
R
= 1MI, Figure 3
LOAD
Push-pull operation40
Open-drain operation0.3
LOW-SPEED TIMING CHARACTERISTICS—MAX14548AE
(VCC = +1.7V to +3.6V, VL = +1.1V to +3.6V, VCC > VL, EN = VL, PF = high, C
TA = -40NC to +85NC, unless otherwise noted. Typical values are at VCC = +2.8V, VL = +1.8V and TA = +25NC.) (Notes 2, 3)
PARAMETERSYMBOLCONDITIONSMINTYPMAXUNITS
I/O V
I/O V
I/O VL_ Rise Timet
I/O VL_ Fall Timet
Propagation Delay
(Driving I/O VL_)
Propagation Delay
(Driving I/O V
Channel-to-Channel Skewt
Propagation Delay from
I/O VL_ to I/O V
Propagation Delay from
I/O V
Maximum Data Rate
Note 2: All units are 100% production tested at TA = +25°C. Limits over the operating temperature range are guaranteed by
Note 3: VL must be less than or equal to VCC during normal operation. However, VL can be greater than VCC during startup and
Note 4: When VCC is below VL by more than the VL - VCC shutdown threshold, the device turns off its pullup generators and
Note 5: Guaranteed by design.
Note 6: Input thresholds are referenced to the boost circuit.
Rise Timet
CC_
Fall Timet
CC_
)
CC_
After EN
CC_
to I/O VL_ After EN
CC_
design and not production tested.
shutdown conditions.
I/O V
CC_
and I/O V
enter their respective shutdown states.
L_
RVCC
FVCC
RVL
FVL
t
PVL-VCC
t
PVCC-VL
SKEW
t
EN-VCC
t
EN-VL
Input rise time < 6ns, Figure 16ns
Input fall time < 6ns, Figure 16ns
Input rise time < 6ns, Figure 26ns
Input rise time < 6ns, Figure 26ns
Input rise time < 6ns, Figure 14ns
Input rise time < 6ns, Figure 23.37ns
Input rise time/fall time < 6ns0.2ns
R
= 1MI, Figure 3
LOAD
R
= 1MI, Figure 3
LOAD
Push-pull operation40
Open-drain operation0.3
= 1FF, CVL = 1FF, C
VCC
= 1FF, CVL = 1FF, C
VCC
IOVL
27
0.06
IOVL
27
0.06
P 50pF, C
P 50pF, C
IOVCC
IOVCC
P 50pF,
Fs
Fs
Mbps
P 50pF,
Fs
Fs
Mbps
MAX14548E/MAX14548AE
5
100Mbps, 16-Channel LLTs
V
L
V
EN
L
V
CC
V
CC
MAX14548E
MAX14548AE
I/O V
V
L
L_
V
CC
I/O V
CC_
C
IOVCC
NOTE: THE INPUT RISE/FALL TIMES ARE < 2ns FOR HIGH SPEED AND < 6ns FOR LOW SPEED.
Figure 1. Push-Pull Driving I/O VL_ Test Circuit and Timing
V
MAX14548E/MAX14548AE
L
V
EN
L
V
CC
MAX14548E
MAX14548AE
C
IOVCC
I/O V
V
L
L_
V
CC
I/O V
CC_
V
CC
I/O V
CC_
10%
50%
50%
10%
I/O V
t
PLH
t
RVCC
90%
L_
t
PVL-VCC
t
RVL
50%
50%
= t
I/O V
90%
PLH
CC_
OR t
PHL
50%
t
50%
90%
50%
PLH
t
FVCC
t
90%
FVL
50%
10%
I/O V
10%
L_
NOTE: THE INPUT RISE/FALL TIMES ARE < 2ns FOR HIGH SPEED AND < 6ns FOR LOW SPEED.
Figure 2. Push-Pull Driving I/O V
6
Test Circuit and Timing
CC_
t
PLH
t
PVCC-VL = tPLH OR tPHL
t
PLH
Loading...
+ 11 hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.