The MAX12528 is a dual 80Msps, 12-bit analog-to-digital converter (ADC) featuring fully differential wideband
track-and-hold (T/H) inputs, driving internal quantizers.
The MAX12528 is optimized for low power, small size,
and high dynamic performance in intermediate frequency (IF) and baseband sampling applications. This dual
ADC operates from a single 3.3V supply, consuming
only 726mW while delivering a typical 69.8dB signal-tonoise ratio (SNR) performance at a 175MHz input frequency. The T/H input stages accept single-ended or
differential inputs up to 400MHz. In addition to low operating power, the MAX12528 features a 330µW powerdown mode to conserve power during idle periods.
A flexible reference structure allows the MAX12528 to
use the internal 2.048V bandgap reference or accept
an externally applied reference and allows the reference to be shared between the two ADCs. The reference structure allows the full-scale analog input range
to be adjusted from ±0.35V to ±1.15V. The MAX12528
provides a common-mode reference to simplify design
and reduce external component count in differential
analog input circuits.
The MAX12528 supports either a single-ended or differential input clock. User-selectable divide-by-two (DIV2)
and divide-by-four (DIV4) modes allow for design flexibility and help eliminate the negative effects of clock jitter.
Wide variations in the clock duty cycle are compensated
with the ADC’s internal duty-cycle equalizer (DCE).
The MAX12528 features two parallel, 12-bit-wide,
CMOS-compatible outputs. The digital output format is
pin-selectable to be either two’s complement or Gray
code. A separate power-supply input for the digital outputs accepts a 1.7V to 3.6V voltage for flexible interfacing with various logic levels. The MAX12528 is available
in a 10mm x 10mm x 0.8mm, 68-pin thin QFN package
with exposed paddle (EP), and is specified for the
extended (-40°C to +85°C) temperature range.
+85°C, unless otherwise noted. Typical values are at T
A
= +25°C.) (Note 1)
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
VDDto GND ................................................................-0.3V to +3.6V
OV
DD
to GND............-0.3V to the lower of (VDD+ 0.3V) and +3.6V
INAP, INAN to GND ...-0.3V to the lower of (V
DD
+ 0.3V) and +3.6V
INBP, INBN to GND ...-0.3V to the lower of (V
DD
+ 0.3V) and +3.6V
CLKP, CLKN to
GND ........................-0.3V to the lower of (V
DD
+ 0.3V) and +3.6V
REFIN, REFOUT
to GND ..................-0.3V to the lower of (V
DD
+ 0.3V) and +3.6V
REFAP, REFAN,
COMA to GND ......-0.3V to the lower of (V
DD
+ 0.3V) and +3.6V
REFBP, REFBN,
COMB to GND ......-0.3V to the lower of (V
DD
+ 0.3V) and +3.6V
DIFFCLK/SECLK, G/T, PD, SHREF, DIV2,
DIV4 to GND .........-0.3V to the lower of (V
DD
+ 0.3V) and +3.6V
D0A–D11A, D0B–D11B, DAV,
DORA, DORB to GND..............................-0.3V to (OV
+85°C, unless otherwise noted. Typical values are at T
A
= +25°C.) (Note 1)
Note 1: Specifications ≥+25°C guaranteed by production test, <+25°C guaranteed by design and characterization.
Note 2: Two-tone intermodulation distortion measured with respect to a single-carrier amplitude, and not the peak-to-average input
power of both input tones.
Note 3: During power-down, D0A–D11A, D0B–D11B, DORA, DORB, and DAV are high impedance.
Note 4: Guaranteed by design and characterization.
Typical Operating Characteristics
(VDD= 3.3V, OVDD= 2.0V, GND = 0, REFIN = REFOUT (internal reference mode), CL≈ 5pF at digital outputs, AIN= -0.5dBFS,
DIFFCLK/SECLK = OVDD, PD = GND, G/T = GND, f
6COMAChannel A Common-Mode Voltage I/O. Bypass COMA to GND with a 0.1µF capacitor.
7REFAP
8REFAN
10REFBN
11REFBP
12COMBChannel A Common-Mode Voltage I/O. Bypass COMB to GND with a 0.1µF capacitor.
15INBNChannel B Negative Analog Input
16INBPChannel B Positive Analog Input
18
19CLKN
20CLKP
21DIV2Divide-by-Two Clock-Divider Digital Control Input. See Table 2 for details.
22DIV4Divide-by-Four Clock-Divider Digital Control Input. See Table 2 for details.
23–26, 61,
62, 63
27, 43, 60OV
28, 29, 45,
46
GNDConverter Ground. Connect all ground pins and the exposed paddle (EP) together.
DIFFCLK/
SECLK
V
DD
DD
N.C.No Connection
Channel A Positive Reference I/O. Channel A conversion range is ±2/3 x (V
REFAP with a 0.1µF capacitor to GND. Connect a 10µF and a 1µF bypass capacitor between REFAP
and REFAN. Place the 1µF REFAP-to-REFAN capacitor as close to the device as possible on the
same side of the PC board.
Channel A Negative Reference I/O. Channel A conversion range is ±2/3 x (V
REFAN with a 0.1µF capacitor to GND. Connect a 10µF and a 1µF bypass capacitor between REFAP
and REFAN. Place the 1µF REFAP-to-REFAN capacitor as close to the device as possible on the
same side of the PC board.
Channel B Negative Reference I/O. Channel B conversion range is ±2/3 x (V
REFBN with a 0.1µF capacitor to GND. Connect a 10µF and a 1µF bypass capacitor between REFBP
and REFBN. Place the 1µF REFBP-to-REFBN capacitor as close to the device as possible on the
same side of the PC board.
Channel B Positive Reference I/O. Channel B conversion range is ±2/3 x (V
REFBP with a 0.1µF capacitor to GND. Connect a 10µF and a 1µF bypass capacitor between REFBP
and REFBN. Place the 1µF REFBP-to-REFBN capacitor as close to the device as possible on the
same side of the PC board.
Differential/Single-Ended Input Clock Drive. This input selects between single-ended or differential clock
input drives.
DIFFCLK/SECLK = GND: Selects single-ended clock input drive.
DIFFCLK/SECLK = OV
Negative Clock Input. In differential clock input mode (DIFFCLK/SECLK = OV
clock signal between CLKP and CLKN. In single-ended clock mode (DIFFCLK/SECLK = GND), apply the
clock signal to CLKP and connect CLKN to GND.
Positive Clock Input. In differential clock input mode (DIFFCLK/SECLK = OV
clock signal between CLKP and CLKN. In single-ended clock mode (DIFFCLK/SECLK = GND), apply
the single-ended clock signal to CLKP and connect CLKN to GND.
Analog Power Input. Connect VDD to a 3.15V to 3.60V power supply. Bypass VDD to GND with a parallel
capacitor combination of ≥10µF and 0.1µF. Connect all V
Output-Driver Power Input. Connect OVDD to a 1.7V to VDD power supply. Bypass OVDD to GND with a
parallel capacitor combination of ≥10µF and 0.1µF.
Channel B Data Out-of-Range Indicator. The DORB digital output indicates when the channel B analog
42DORB
44DAV
47D0AChannel A CMOS Digital Output, Bit 0 (LSB)
48D1AChannel A CMOS Digital Output, Bit 1
49D2AChannel A CMOS Digital Output, Bit 2
50D3AChannel A CMOS Digital Output, Bit 3
51D4AChannel A CMOS Digital Output, Bit 4
52D5AChannel A CMOS Digital Output, Bit 5
53D6AChannel A CMOS Digital Output, Bit 6
54D7AChannel A CMOS Digital Output, Bit 7
55D8AChannel A CMOS Digital Output, Bit 8
56D9AChannel A CMOS Digital Output, Bit 9
57D10AChannel A CMOS Digital Output, Bit 10
58D11AChannel A CMOS Digital Output, Bit 11 (MSB)
59DORA
64G/T
65PD
input voltage is out of range.
DORB = 1: Digital outputs exceed full-scale range.
DORB = 0: Digital outputs are within full-scale range.
Data-Valid Digital Output. The rising edge of DAV indicates that data is present on the digital outputs.
The MAX12528 evaluation kit (MAX12528 EV kit) utilizes DAV to latch data into any external back-end
digital logic.
Channel A Data Out-of-Range Indicator. The DORA digital output indicates when the channel A analog
input voltage is out of range.
DORA = 1: Digital outputs exceed full-scale range.
DORA = 0: Digital outputs are within full-scale range.
Output Format Select Digital Input.
G/T = GND: Two’s-complement output format selected.
G/T = OV
Power-Down Digital Input.
PD = GND: ADCs are fully operational.
PD = OV
: Gray-code output format selected.
DD
: ADCs are powered down.
DD
MAX12528
Detailed Description
The MAX12528 uses a 10-stage, fully differential,
pipelined architecture (Figure 1) that allows for highspeed conversion while minimizing power consumption. Samples taken at the inputs move progressively
through the pipeline stages every half clock cycle.
From input to output the total latency is 8 clock cycles.
Each pipeline converter stage converts its input voltage
to a digital output code. At every stage, except the last,
the error between the input voltage and the digital output code is multiplied and passed along to the next
pipeline stage. Digital error correction compensates for
ADC comparator offsets in each pipeline stage and
ensures no missing codes. Figure 2 shows the
MAX12528 functional diagram.
Shared Reference Digital Input.
SHREF = V
SHREF = GND: Shared reference disabled.
When sharing the reference, externally connect REFAP and REFBP together to ensure that V
equals V
ensure that V
Internal Reference Voltage Output. The REFOUT output voltage is 2.048V and REFOUT can deliver 1mA.
For internal reference operation, connect REFOUT directly to REFIN or use a resistive divider from
REFOUT to set the voltage at REFIN. Bypass REFOUT to GND with a ≥0.1µF capacitor.
For external reference operation, REFOUT is not required and must be bypassed to GND with a ≥0.1µF
capacitor.
Single-Ended Reference Analog Input. For internal reference and buffered external reference operation,
apply a 0.7V to 2.3V DC reference voltage to REFIN. Bypass REFIN to GND with a 4.7µF capacitor.
Within its specified operating voltage, REFIN has a >50MΩ input impedance, and the differential
reference voltage (V
operation, connect REFIN to GND. In this mode REF_P, REF_N, and COM_ are high-impedance inputs
that accept the external reference voltages.
Exposed Paddle. EP is internally connected to GND. Externally connect EP to GND to achieve specified
dynamic performance.
: Shared reference enabled.
DD
. Similarly, when sharing the reference, externally connect REFAN to REFBN together to
REFBP
MAX12528
REFAN
= V
REF_P
REFBN
- V
.
) is generated from REFIN. For unbuffered external reference
Figure 3 displays a simplified functional diagram of the
input T/H circuit. This input T/H circuit allows for high
analog input frequencies of 175MHz and beyond and
supports a VDD/ 2 common-mode input voltage.
The MAX12528 sampling clock controls the switchedcapacitor input T/H architecture (Figure 3) allowing the
analog input signals to be stored as charge on the
sampling capacitors. These switches are closed (track
mode) when the sampling clock is high and open (hold
mode) when the sampling clock is low (Figure 4). The
analog input signal source must be able to provide the
dynamic currents necessary to charge and discharge
the sampling capacitors. To avoid signal degradation,
these capacitors must be charged to one-half LSB
accuracy within one-half of a clock cycle. The analog
input of the MAX12528 supports differential or singleended input drive. For optimum performance with differential inputs, balance the input impedance of IN_P
and IN_N and set the common-mode voltage to midsupply (VDD/ 2). The MAX12528 provides the optimum
common-mode voltage of VDD/ 2 through the COM
output when operating in internal reference mode and
buffered external reference mode. This COM output
voltage can be used to bias the input network as shown
in Figures 9, 10, and 11.
Reference Output
An internal bandgap reference is the basis for all the
internal voltages and bias currents used in the
MAX12528. The power-down logic input (PD) enables
and disables the reference circuit. REFOUT has approximately 17kΩ to GND when the MAX12528 is powered
down. The reference circuit requires 10ms to power up
and settle to its final value when power is applied to the
MAX12528 or when PD transitions from high to low.
The internal bandgap reference produces a buffered
reference voltage of 2.048V ±1% at the REFOUT pin
with a ±50ppm/°C temperature coefficient. Connect an
external ≥0.1µF bypass capacitor from REFOUT to
GND for stability. REFOUT sources up to 1mA and
sinks up to 0.1mA for external circuits with a 35mV/mA
load regulation. Short-circuit protection limits I
REFOUT
to a 2.1mA source current when shorted to GND and a
0.24mA sink current when shorted to VDD. Similar to
REFOUT, REFIN should be bypassed with a 4.7µF
capacitor to GND.
Reference Configurations
The MAX12528 full-scale analog input range is ±2/3 x
V
REF
with a VDD/ 2 ±0.5V common-mode input range.
V
REF
is the voltage difference between REFAP (REFBP)
and REFAN (REFBN). The MAX12528 provides three
modes of reference operation. The voltage at REFIN
(V
REFIN
) selects the reference operation mode (Table 1).
Connect REFOUT to REFIN either with a direct short or
through a resistive divider to enter internal reference
mode. COM_, REF_P, and REF_N are low-impedance
outputs with V
COM_
= VDD/ 2, V
REFP
= VDD/ 2 + 3/8 x
V
REFIN
, and V
REF_N
= VDD/ 2 - 3/8 x V
REFIN
. Bypass
REF_P, REF_N, and COM_ each with a 0.1µF capacitor
to GND. Bypass REF_P to REF_N with a 10µF capacitor.
*THE EFFECTIVE RESISTANCE OF THE
SWITCHED SAMPLING CAPACITORS IS:
DD
MAX12528
x C
1
SAMPLE
*C
4.5pF
*C
4.5pF
SAMPLE
SAMPLE
C
PAR
2pF
V
DD
C
PAR
2pF
RIN =
f
CLK
V
REFIN
Internal Reference Mode.
35% V
REFOUT
to 100%
V
REFOUT
0.7V to 2.3V
<0.5V
REFIN is driven by REFOUT either through a
direct short or a resistive divider.
V
= VDD / 2
COM_
= VDD / 2 + 3/8 x V
V
REF_P
V
= VDD / 2 - 3/8 x V
REF_N
Buffered External Reference Mode.
An external 0.7V to 2.3V reference voltage is
applied to REFIN.
V
= VDD / 2
COM_
= VDD / 2 + 3/8 x V
V
REF_P
V
= VDD / 2 - 3/8 x V
REF_N
U nb uffer ed E xter nal Refer ence M od e.
RE F_P , RE F_N , and C O M _ ar e d r i ven b y
exter nal r efer ence sour ces. The ful l - scal e
anal og i np ut r ang e i s ± ( V
REFERENCE MODE
REFIN
REFIN
REFIN
REFIN
- V
R E F _P
R E F _N
) x 2/3.
Bypass REFIN and REFOUT to GND with a 0.1µF capacitor. The REFIN input impedance is very large (>50MΩ).
When driving REFIN through a resistive divider, use
resistances ≥10kΩ to avoid loading REFOUT.
Buffered external reference mode is virtually identical to
the internal reference mode except that the reference
source is derived from an external reference and not the
MAX12528’s internal bandgap reference. In buffered
external reference mode, apply a stable reference voltage source between 0.7V to 2.3V at REFIN. Pins COM_,
REF_P, and REF_N are low-impedance outputs with
V
COM_
= VDD/ 2, V
REF_P
= VDD/ 2 + 3/8 x V
REFIN
, and
V
REF_N
= VDD/ 2 - 3/8 x V
REFIN
. Bypass REF_P, REF_N,
and COM_ each with a 0.1µF capacitor to GND. Bypass
REF_P to REF_N with a 10µF capacitor.
Connect REFIN to GND to enter unbuffered external reference mode. Connecting REFIN to GND deactivates
the on-chip reference buffers for COM_, REF_P, and
REF_N. With their buffers deactivated, COM_, REF_P,
and REF_N become high-impedance inputs and must
be driven with separate, external reference sources.
Drive V
COM_
to VDD/ 2 ±5%, and drive REF_P and
REF_N so V
COM_
= (V
REF_P_
+ V
REF_N_
) / 2. The analog
input range is ±(V
REF_P_
- V
REF_N
) x 2/3. Bypass
REF_P, REF_N, and COM_ each with a 0.1µF capacitor
to GND. Bypass REF_P to REF_N with a 10µF capacitor.
For all reference modes, bypass REFOUT with a 0.1µF
and REFIN with a 4.7µF capacitor to GND.
The MAX12528 also features a shared reference mode,
in which the user can achieve better channel-to-channel matching. When sharing the reference (SHREF =
VDD), externally connect REFAP and REFBP together to
ensure that V
REFAP
= V
REFBP
. Similarly, when sharing
the reference, externally connect REFAN to REFBN
together to ensure that V
REFAN
= V
REFBN
.
Connect SHREF to GND to disable the shared reference mode of the MAX12528. In this independent reference mode, a better channel-to-channel isolation is
achieved.
For detailed circuit suggestions and how to drive the
ADC in buffered/unbuffered external reference mode,
see the Applications Information section.
Clock Duty-Cycle Equalizer
The MAX12528 has an internal clock duty-cycle equalizer, which makes the converter insensitive to the duty
cycle of the signal applied to CLKP and CLKN. The converters allow clock duty-cycle variations from 25% to 75%
without negatively impacting the dynamic performance.
The clock duty-cycle equalizer uses a delay-locked
loop (DLL) to create internal timing signals that are
duty-cycle independent. Due to this DLL, the
MAX12528 requires approximately 100 clock cycles to
acquire and lock to new clock frequencies.
Clock Input and Clock Control Lines
The MAX12528 accepts both differential and singleended clock inputs with a wide 25% to 75% input clock
duty cycle. For single-ended clock input operation,
connect DIFFCLK/SECLK and CLKN to GND. Apply an
external single-ended clock signal to CLKP. To reduce
clock jitter, the external single-ended clock must have
sharp falling edges. For differential clock input operation, connect DIFFCLK/SECLK to OVDD. Apply an
external differential clock signal to CLKP and CLKN.
Consider the clock input as an analog input and route it
away from any other analog inputs and digital signal
lines. CLKP and CLKN enter high impedance when the
MAX12528 is powered down (Figure 4).
Low clock jitter is required for the specified SNR performance of the MAX12528. The analog inputs are sampled on the falling (rising) edge of CLKP (CLKN),
requiring this edge to have the lowest possible jitter.
Jitter limits the maximum SNR performance of any ADC
according to the following relationship:
where fINrepresents the analog input frequency and t
J
is the total system clock jitter. Clock jitter is especially
critical for undersampling applications. For instance,
assuming that clock jitter is the only noise source, to
obtain the specified 69.8dB of SNR with an input frequency of 175MHz the system must have less than
0.29ps of clock jitter. However, in reality there are other
noise sources such as thermal noise and quantization
noise that contribute to the system noise requiring the
clock jitter to be less than 0.14ps to obtain the specified 69.8dB of SNR at 175MHz.
Clock-Divider Control Inputs (DIV2, DIV4)
The MAX12528 features three different modes of sampling/clock operation (see Table 2). Pulling both control
lines low, the clock-divider function is disabled and the
converters sample at full clock speed. Pulling DIV4 low
and DIV2 high enables the divide-by-two feature, which
sets the sampling speed to one-half the selected clock
frequency. In divide-by-four mode, the converter sampling speed is set to one-fourth the clock speed of the
MAX12528. Divide-by-four mode is achieved by applying
a high level to DIV4 and a low level to DIV2. The option to
select either one-half or one-fourth of the clock speed for
sampling provides design flexibility, relaxes clock
requirements, and can minimize clock jitter.
System Timing Requirements
Figure 5 shows the timing relationship between the
clock, analog inputs, DAV indicator, DOR_ indicators,
and the resulting output data. The analog input is sampled on the falling (rising) edge of CLKP (CLKN) and
the resulting data appears at the digital outputs 8 clock
cycles later.
The DAV indicator is synchronized with the digital output and optimized for use in latching data into digital
back-end circuitry. Alternatively, digital back-end cir-
cuitry can be latched with the rising edge of the conversion clock (CLKP - CLKN).
Data-Valid Output
DAV is a single-ended version of the input clock that is
compensated to correct for any input clock duty-cycle
variations. The MAX12528 output data changes on the
falling edge of DAV, and DAV rises once the output
data is valid. The falling edge of DAV is synchronized
to have a 5.4ns delay from the falling edge of the input
clock. Output data at D0A/B–D11A/B and DORA/B are
valid from 7ns before the rising edge of DAV to 7ns
after the rising edge of DAV.
DAV enters high impedance when the MAX12528 is
powered down (PD = OVDD). DAV enters its highimpedance state 10ns after the rising edge of PD and
becomes active again 10ns after PD transitions low.
DAV is capable of sinking and sourcing 600µA and has
three times the driving capabilities of D0A/B–D11A/B
and DORA/B. DAV is typically used to latch the
MAX12528 output data into an external digital back-end
circuit. Keep the capacitive load on DAV as low as possible (<15pF) to avoid large digital currents feeding back
into the analog portion of the MAX12528, thereby
degrading its dynamic performance. Buffering DAV
SWITCHES S1_ AND S2_ ARE OPEN
DURING POWER-DOWN MAKING
S
2L
CLKP AND CLKN HIGH IMPEDANCE.
SWITCHES S
SINGLE-ENDED CLOCK MODE.
10kΩ
MAX12528
DUTY-CYCLE
EQUALIZER
ARE OPEN IN
2_
(V
(V
REF_P
REF_N
- V
REF_N
- V
REF_P
DAV
D0_–D11_
DOR
DIFFERENTIAL ANALOG INPUT (IN_P–IN_N)
) x 2/3
N - 3
N - 2
) x 2/3
CLKN
CLKP
t
DAV
N
N - 1
t
AD
N + 1
N + 3
N +2
t
CL
t
SETUP
8.0 CLOCK-CYCLE DATA LATENCY
N + 4
t
N + 5
CH
DIV4DIV2FUNCTION
00
01
10
Clock Divider Disabled
f
SAMPLE
Divide-by-Two Clock Divider
f
SAMPLE
Divide-by-Four Clock Divider
f
SAMPLE
11Not Allowed
N + 6
t
HOLD
N + 7
N + 9
N + 8
NN + 1 N + 2 N + 3N + 5 N + 6 N + 7N - 1N - 2N - 3N + 9N + 8
N + 4
t
SETUP
= f
CLK
= f
/ 2
CLK
= f
/ 4
CLK
t
HOLD
externally isolates it from heavy capacitive loads. Refer
to the MAX12557 EV kit schematic for recommendations
of how to drive the DAV signal through an external buffer.
Data Out-of-Range Indicator
The DORA and DORB digital outputs indicate when the
analog input voltage is out of range. When DOR_ is high,
the analog input is out of range. When DOR_ is low, the
analog input is within range. The valid differential input
range is from (V
REF_P
- V
REF_N
) x 2/3 to (V
REF_N
-
V
REF_P
) x 2/3. Signals outside of this valid differential
range cause DOR_ to assert high as shown in Table 1.
DOR is synchronized with DAV and transitions along
with the output data D11–D0. There is an 8 clock-cycle
latency in the DOR function as is with the output data
(Figure 5). DOR_ is high impedance when the
MAX12528 is in power-down (PD = high). DOR_ enters
a high-impedance state within 10ns after the rising edge
of PD and becomes active 10ns after PD’s falling edge.
Digital Output Data and Output Format Selection
The MAX12528 provides two 12-bit, parallel, tri-state
output buses. D0A/B–D11A/B and DORA/B update on
the falling edge of DAV and are valid on the rising edge
of DAV.
The MAX12528 output data format is either Gray code
or two’s complement depending on the logic input G/T.
With G/T high, the output data format is Gray code.
With G/T low, the output data format is set to two’s complement. See Figure 8 for a binary-to-Gray and Gray-tobinary code conversion example.
The following equations, Table 3, Figure 6, and Figure 7
define the relationship between the digital output and
the analog input.
Gray Code (G/T = 1):
V
IN_P
- V
IN_N
= 2/3 x (V
REF_P
- V
REF_N
) x 2 x
(CODE10- 2048) / 4096
Two’s Complement (G/T = 0):
V
IN_P
- V
IN_N
= 2/3 x (V
REF_P
- V
REF_N
) x 2 x
CODE10/ 4096
where CODE10is the decimal equivalent of the digital
output code as shown in Table 3.
The digital outputs D0A/B–D11A/B are high impedance
when the MAX12528 is in power-down (PD = 1) mode.
D0A/B–D11A/B enter this state 10ns after the rising
edge of PD and become active again 10ns after PD
transitions low.
Keep the capacitive load on the MAX12528 digital outputs D0A/B–D11A/B as low as possible (<15pF) to
avoid large digital currents feeding back into the analog portion of the MAX12528 and degrading its dynamic performance. Adding external digital buffers on the
digital outputs helps isolate the MAX12528 from heavy
capacitive loads. To improve the dynamic performance
of the MAX12528, add 220Ω resistors in series with the
digital outputs close to the MAX12528. Refer to the
MAX12557 EV kit schematic for guidelines of how to
drive the digital outputs through 220Ω series resistors
and external digital output buffers.
Power-Down Input
The MAX12528 has two power modes that are controlled with a power-down digital input (PD). With PD
low, the MAX12528 is in its normal operating mode.
With PD high, the MAX12528 is in power-down mode.
The power-down mode allows the MAX12528 to efficiently use power by transitioning to a low-power state
when conversions are not required. Additionally, the
MAX12528 parallel output bus goes high-impedance in
power-down mode, allowing other devices on the bus
to be accessed.
In power-down mode all internal circuits are off, the
analog supply current reduces to less than 100µA, and
the digital supply current reduces to less than 1µA. The
following list shows the state of the analog inputs and
digital outputs in power-down mode:
1) INAP/B and INAN/B analog inputs are disconnected from the internal input amplifier (Figure 3).
2) REFOUT has approximately 17kΩ to GND.
3) REFAP/B, COMA/B, and REFAN/B enter a highimpedance state with respect to VDDand GND, but
there is an internal 4kΩ resistor between REFAP/B
and COMA/B, as well as an internal 4kΩ resistor
between REFAN/B and COMA/B.
4) D0A–D11A, D0B–D11B, DORA, and DORB enter a
high-impedance state.
5) DAV enters a high-impedance state.
6) CLKP and CLKN clock inputs enter a high-impedance state (Figure 4).
The wake-up time from power-down mode is dominated
by the time required to charge the capacitors at REF_P,
REF_N, and COM. In internal reference mode and
buffered external reference mode the wake-up time is
typically 10ms. When operating in the unbuffered external reference mode the wake-up time is dependent on
the external reference drivers.
Figure 8. Binary-to-Gray and Gray-to-Binary Code Conversion
BINARY-TO-GRAY CODE CONVERSION
1) THE MOST SIGNIFICANT GRAY-CODE BIT IS THE SAME
AS THE MOST SIGNIFICANT BINARY BIT.
D11D7D3D0
0111 0100 1100BINARY
2) SUBSEQUENT GRAY-CODE BITS ARE FOUND ACCORDING
TO THE FOLLOWING EQUATION:
GRAYX = BINARYX +BINARY
+
WHERE IS THE EXCLUSIVE OR FUNCTION (SEE TRUTH
TABLE BELOW) AND X IS THE BIT POSITION:
GRAY
= BINARY10BINARY
10
+
GRAY10 = 1 0
GRAY
= 1
10
D11D7D3D0
+
0 111 0100 1100 BINARY
1
3) REPEAT STEP 2 UNTIL COMPLETE:
GRAY
= BINARY9BINARY
9
+
GRAY9 = 1 1
= 0
GRAY
9
X + 1
+
11
+
10
BIT POSITION
GRAY CODE0
BIT POSITION
GRAY CODE0
GRAY-TO-BINARY CODE CONVERSION
1) THE MOST SIGNIFICANT BINARY BIT IS THE SAME AS THE
MOST SIGNIFICANT GRAY-CODE BIT.
D11D7D3D0
0BINARY
2) SUBSEQUENT BINARY BITS ARE FOUND ACCORDING TO
THE FOLLOWING EQUATION:
BINARYX = BINARY
+
WHERE IS THE EXCLUSIVE OR FUNCTION (SEE TRUTH
TABLE BELOW) AND X IS THE BIT POSITION:
= BINARY11GRAY
BINARY
10
BINARY10 = 01
BINARY
= 1
10
D11D7D3D0
0 100 1110 1010
+
0
1
3) REPEAT STEP 2 UNTIL COMPLETE:
BINARY
= BINARY10GRAY
9
BINARY9 = 10
= 1
BINARY
9
+
GRAY
X+1
+
+
X
+
10
+
9
BIT POSITION
GRAY CODE0100 11 011010
BIT POSITION
GRAY CODE
BINARY
D11D7D3D0
+
01 11 0100 1100 BINARY
10
4) THE FINAL GRAY-CODE CONVERSION IS:
D11D7D3D0
0111 0100 1100BINARY
10011011010
FIGURE 8 SHOWS THE GRAY-TO-BINARY AND BINARY-TO-GRAY
CODE CONVERSION IN OFFSET BINARY FORMAT. THE OUTPUT
FORMAT OF THE MAX12528 IS TWO'S-COMPLEMENT BINARY,
HENCE EACH MSB OF THE TWO'S-COMPLEMENT OUTPUT CODE
MUST BE INSERTED TO REFLECT TRUE OFFSET BINARY FORMAT.
BIT POSITION
GRAY CODE0
BIT POSITION
GRAY CODE0
EXCLUSIVE OR TRUTH TABLE
AB Y=AB
00
01
10
11
D11D7D3D0
01 00 1110 1010
+
11
0
4) THE FINAL BINARY CONVERSION IS:
D11D7D3D0
0100 1110 1010
0111 0100 1100
+
0
1
1
0
BIT POSITION
GRAY CODE
BINARY
BIT POSITION
GRAY CODE
BINARY
MAX12528
Applications Information
Using Transformer Coupling
In general, the MAX12528 provides better SFDR and
THD with fully differential input signals than singleended input drive, especially for input frequencies
above 125MHz. In differential input mode, even-order
harmonics are lower as both inputs are balanced, and
each of the ADC inputs only requires half the signal
swing compared to single-ended input mode.
An RF transformer (Figure 9) provides an excellent
solution to convert a single-ended input source signal
to a fully differential signal, required by the MAX12528
for optimum performance. Connecting the center tap of
the transformer to COM provides a V
DD
/ 2 DC level
shift to the input. Although a 1:1 transformer is shown, a
step-up transformer can be selected to reduce the
drive requirements. A reduced signal swing from the
input driver, such as an op amp, can also improve the
overall distortion. The configuration of Figure 9 is good
for frequencies up to Nyquist (f
CLK
/ 2).
The circuit of Figure 10 converts a single-ended input
signal to fully differential just as Figure 9. However,
Figure 10 utilizes an additional transformer to improve
the common-mode rejection allowing high-frequency
signals beyond the Nyquist frequency. A set of 75Ω
and 113Ω termination resistors provide an equivalent
50Ω termination to the signal source. The second set of
termination resistors connects to COM_ providing the
correct input common-mode voltage. Two 0Ω resistors
in series with the analog inputs allow high IF input frequencies. These 0Ω resistors can be replaced with lowvalue resistors to limit the input bandwidth.
Single-Ended AC-Coupled Input Signal
Figure 11 shows an AC-coupled, single-ended input
application. The MAX4108 provides high speed, high
bandwidth, low noise, and low distortion to maintain the
input signal integrity.
Figure 9. Transformer-Coupled Input Drive for Input Frequencies
Up to Nyquist
Figure 10. Transformer-Coupled Input Drive for Input Frequencies beyond Nyquist
Figure 11. Single-Ended, AC-Coupled Input Drive
24.9Ω
5.6pF
0.1µF
1
V
IN
N.C.
MINICIRCUITS
6
T1
5
2
24.9Ω
0.1µF
5.6pF
3
4
TT1-6
OR
T1-1T
IN_P
MAX12528
COM_
IN_N
V
IN
MAX4108
100Ω
100Ω
0.1µF
0Ω
24.9Ω
24.9Ω
IN_P
5.6pF
MAX12528
COM_
0.1µF
IN_N
5.6pF
0Ω*
0.1µF
1
V
IN
N.C.
6
T1
5
2
3
4
MINICIRCUITS
ADT1-1WT
N.C.
75Ω
1%
75Ω
1%
*0Ω RESISTORS CAN BE REPLACED WITH
LOW-VALUE RESISTORS TO LIMIT THE INPUT BANDWIDTH.
N.C.
MINICIRCUITS
1
T2
5
3
ADT1-1WT
6
2
N.C.
4
113Ω
0.5%
113Ω
0.5%
5.6pF
0.1µF
0Ω*
5.6pF
IN_P
MAX12528
COM_
IN_N
Buffered External Reference Drives
Multiple ADCs
The buffered external reference mode allows for more
control over the MAX12528 reference voltage and
allows multiple converters to use a common reference.
The REFIN input impedance is >50MΩ.
Figure 12 shows the MAX6029 precision 2.048V bandgap
reference used as a common reference for multiple converters. The 2.048V output of the MAX6029 passes
through a single-pole 10Hz LP filter to the MAX4230.
The MAX4250 buffers the 2.048V reference and provides additional 10Hz LP filtering before its output is
applied to the REFIN input of the MAX12528.
Unbuffered External Reference Drives
Multiple ADCs
The unbuffered external reference mode allows for precise control over the MAX12528 reference and allows
multiple converters to use a common reference.
Connecting REFIN to GND disables the internal reference,
Figure 12. External Buffered (MAX4230) Reference Drive Using a MAX6029 Bandgap Reference
3.3V
0.1µF
1
16.2kΩ
5
MAX6029
(EUK21)
2
NOTE: ONE FRONT-END REFERENCE CIRCUIT IS
CAPABLE OF SOURCING UP TO 15mA AND
SINKING UP TO 30mA OF OUTPUT CURRENT.
1µF
0.1µF
V
DD
GND
V
REF_P
REF_N
COM_
0.1µF
DD
REF_P
2.048V
0.1µF
3
4
MAX4230
5
1
2
47Ω
1.47kΩ
300µF
6V
0.1µF
REFIN
MAX12528
REFOUT
REFIN
MAX12528
10µF
10µF
2.2µF
0.1µF
0.1µF
0.1µF
0.1µF
3.3V
2.2µF
0.1µF
0.1µF
REFOUT
0.1µF
GND
REF_N
0.1µF
COM_
0.1µF
MAX12528
allowing REF_P, REF_N, and COM_ to be driven directly
by a set of external reference sources.
Figure 13 uses a MAX6029 precision 3.000V bandgap
reference as a common reference for multiple converters. A seven-component resistive divider chain follows
the MAX6029 voltage reference. The 0.47µF capacitor
along this chain creates a 10Hz LP filter. Three
MAX4230 amplifiers buffer taps along this resistor
chain providing 2.413V, 1.647V, and 0.880V to the
MAX12528 REF_P, REF_N, and COM_ reference
inputs. The feedback around the MAX4230 op amps
provides additional 10Hz LP filtering. Reference voltages 2.413V and 0.880V set the full-scale analog input
range for the converter to ±1.022V (±[V
REF_P
- V
REF_N
]
x 2/3).
Note that one single power supply for all active circuit
components removes any concern regarding powersupply sequencing when powering up or down.
Grounding, Bypassing, and
Board Layout
The MAX12528 requires high-speed board layout
design techniques. Refer to the MAX12528 EV kit data
sheet for a board layout reference. Locate all bypass
capacitors as close to the device as possible, preferably on the same side as the ADC, using surface-
mount devices for minimum inductance. Bypass VDDto
GND with a 220µF ceramic capacitor in parallel with at
least one 10µF, one 4.7µF, and one 0.1µF ceramic
capacitor. Bypass OVDDto GND with a 220µF ceramic
capacitor in parallel with at least one 10µF, one 4.7µF,
and one 0.1µF ceramic capacitor. High-frequency
bypassing/decoupling capacitors should be located as
close as possible to the converter supply pins.
Multilayer boards with ample ground and power planes
produce the highest level of signal integrity. All grounds
and the exposed backside paddle of the MAX12528
package (package code: T6800-2) must be connected
to the same ground plane. The MAX12528 relies on the
exposed backside paddle connection for a low-inductance ground connection. Isolate the ground plane
from any noisy digital system ground planes such as a
DSP or output buffer ground.
Route high-speed digital signal traces away from the
sensitive analog traces. Keep all signal lines short and
free of 90° turns.
Ensure that the differential, analog input network layout
is symmetric and that all parasitic components are balanced equally. Refer to the MAX12528 EV kit data
sheet for an example of symmetric input layout.
Parameter Definitions
Integral Nonlinearity (INL)
INL is the deviation of the values on an actual transfer
function from a straight line. For the MAX12528, this
straight line is between the endpoints of the transfer
function, once offset and gain errors have been nullified. INL deviations are measured at every step of the
transfer function and the worst-case deviation is reported in the Electrical Characteristics table.
Differential Nonlinearity (DNL)
DNL is the difference between an actual step width and
the ideal value of 1 LSB. A DNL error specification of
less than 1 LSB guarantees no missing codes and a
monotonic transfer function. For the MAX12528, DNL
deviations are measured at every step of the transfer
function and the worst-case deviation is reported in the
Electrical Characteristics table.
Offset Error
Offset error is a figure of merit that indicates how well
the actual transfer function matches the ideal transfer
function at a single point. Ideally, the midscale
MAX12528 transition occurs at 0.5 LSB above midscale. The offset error is the amount of deviation
between the measured midscale transition point and
the ideal midscale transition point.
Gain Error
Gain error is a figure of merit that indicates how well the
slope of the actual transfer function matches the slope of
the ideal transfer function. The slope of the actual transfer function is measured between two data points: positive full scale and negative full scale. Ideally, the positive
full-scale MAX12528 transition occurs at 1.5 LSBs below
positive full scale, and the negative full-scale transition
occurs at 0.5 LSB above negative full scale. The gain
error is the difference of the measured transition points
minus the difference of the ideal transition points.
Small-Signal Noise Floor (SSNF)
SSNF is the integrated noise and distortion power in the
Nyquist band for small-signal inputs. The DC offset is
excluded from this noise calculation. For this converter,
a small signal is defined as a single tone with an amplitude of -35dBFS. This parameter captures the thermal
and quantization noise characteristics of the data converter and can be used to help calculate the overall
noise figure of a digital receiver signal path.
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantization error only and results directly from the ADC’s resolution (N bits):
SNR
[max]
= 6.02 × N + 1.76
In reality, there are other noise sources besides quantization noise: thermal noise, reference noise, clock jitter,
etc. SNR is computed by taking the ratio of the RMS
signal to the RMS noise. RMS noise includes all spectral components to the Nyquist frequency excluding the
fundamental, the first six harmonics (HD2 through
HD7), and the DC offset.
SNR = 20 x log (SIGNAL
RMS
/ NOISE
RMS
)
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS signal to the RMS noise plus distortion. RMS noise plus
distortion includes all spectral components to the
Nyquist frequency excluding the fundamental and the
DC offset.
THD is the ratio of the RMS sum of the first six harmonics of the input signal to the fundamental itself. This is
expressed as:
where V1is the fundamental amplitude, and V2through
V7are the amplitudes of the 2nd- through 7th-order
harmonics (HD2 through HD7).
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio expressed in decibels of the RMS
amplitude of the fundamental (maximum signal component) to the RMS value of the next largest spurious
component, excluding DC offset.
Intermodulation Distortion (IMD)
IMD is the total power of the IM2 to IM5 intermodulation
products to the Nyquist frequency relative to the total
input power of the two input tones f
IN1
and f
IN2
. The
individual input tone levels are at -7dBFS. The intermodulation products are as follows:
2nd-Order Intermodulation products (IM2):
f
IN1
= f
IN2
, f
IN2
- f
IN1
3rd-Order Intermodulation products (IM3):
2 x f
IN1
- f
IN2
, 2 x f
IN2
- f
IN1
, 2 x f
IN1
+ f
IN2
,
2 x f
IN2
+ f
IN1
4th-Order Intermodulation products (IM4):
3 x f
IN1
- f
IN2
, 3 x f
IN2
- f
IN1
, 3 x f
IN1
+ f
IN2
,
3 x f
IN2
+ f
IN1
, 2 x f
IN1
- 2 x f
IN2
, 2 x f
IN1
+ 2 x f
IN2
,
2 x f
IN2
- 2 x f
IN1
5th-Order Intermodulation products (IM5):
3 x f
IN1
- 2 x f
IN2
, 3 x f
IN2
- 2 x f
IN1
, 3 x f
IN1
+ 2 x f
IN2
,
3 x f
IN2
+ 2 x f
IN1
, 4 x f
IN1
- f
IN2
, 4 x f
IN2
- f
IN1
,
4 x f
IN1
+ f
IN2
, 4 x f
IN2
+ f
IN1
Note that the two-tone intermodulation distortion is measured with respect to a single-carrier amplitude and not
the peak-to-average input power of both input tones.
3rd-Order Intermodulation (IM3)
IM3 is the total power of the 3rd-order intermodulation
product to the Nyquist frequency relative to the total
input power of the two input tones f
IN1
and f
IN2
. The
individual input tone levels are at -7dBFS. The 3rdorder intermodulation products are 2 x f
IN1
- f
IN2
, 2 x
f
IN2
- f
IN1
, 2 x f
IN1
+ f
IN2
, 2 x f
IN2
+ f
IN1
.
Aperture Jitter
Figure 14 shows the aperture jitter (tAJ), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (tAD) is the time defined between the
rising edge of the sampling clock and the instant when
an actual sample is taken (Figure 14).
Full-Power Bandwidth
A large -0.2dBFS analog input signal is applied to an
ADC and the input frequency is swept up to the point
where the amplitude of the digitized conversion result
has decreased by -3dB. This point is defined as fullpower input bandwidth frequency.
Output Noise (n
OUT
)
The output noise (n
OUT
) parameter is similar to thermal
plus quantization noise and is an indication of the converter’s overall noise performance.
No fundamental input tone is used to test for n
OUT
.
IN_P, IN_N, and COM_ are connected together and
1024k data points are collected. n
OUT
is computed by
taking the RMS value of the collected data points after
the mean is removed.
Overdrive Recovery Time
Overdrive recovery time is the time required for the
ADC to recover from an input transient that exceeds the
full-scale limits. The MAX12528 specifies overdrive
recovery time using an input transient that exceeds the
full-scale limits by ±10%. The MAX12528 requires one
clock cycle to recover from an overdrive condition.
Crosstalk
Coupling onto one channel being driven by a
(-0.5dBFS) signal when the adjacent interfering channel
is driven by a full-scale signal. Measurement includes
all spurs resulting from both direct coupling and mixing
components.
Gain matching is a figure of merit that indicates how
well the gains between the two channels are matched
to each other. The same input signal is applied to both
channels and the maximum deviation in gain is reported (typically in dB) as gain matching.
Offset Matching
Like gain matching, offset matching is a figure of merit
that indicates how well the offsets between the two channels are matched to each other. The same input signal is
applied to both channels and the maximum deviation in
offset is reported (typically in %FSR) as offset matching.
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
28 ____________________Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600
(The package drawing(s) in this data sheet may not reflect the most current specifications. For the latest package outline information,
go to www.maxim-ic.com/packages
.)
68L QFN THIN.EPS
PACKAGE OUTLINE
68L THIN QFN, 10x10x0.8mm
21-0142
1
C
2
PACKAGE OUTLINE
68L THIN QFN, 10x10x0.8mm
21-0142
2
C
2
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