7.5Msps analog-to-digital converter (ADC). The device
features two fully differential wideband track-and-hold
(T/H) inputs. These inputs have a 440MHz bandwidth
and accept fully differential or single-ended signals.
The MAX1191 delivers a typical signal-to-noise and distortion (SINAD) of 48.6dB at an input frequency of
1.875MHz and a sampling rate of 7.5Msps while consuming only 12mW. This ADC operates from a 2.7V to
3.6V analog power supply. A separate 1.8V to 3.6V
supply powers the digital output driver. In addition to
ultra-low operating power, the MAX1191 features three
power-down modes to conserve power during idle periods. Excellent dynamic performance, ultra-low power,
and small size make the MAX1191 ideal for applications in imaging, instrumentation, and digital communications.
An internal 1.024V precision bandgap reference sets
the full-scale range of the ADC to ±0.512V. A flexible
reference structure allows the MAX1191 to use its internal reference or accept an externally applied reference
for applications requiring increased accuracy.
The MAX1191 features parallel, multiplexed, CMOScompatible tri-state outputs. The digital output format is
offset binary. A separate digital power input accepts a
voltage from 1.8V to 3.6V for flexible interfacing to different logic levels. The MAX1191 is available in a 5mm
× 5mm, 28-pin thin QFN package, and is specified for
the extended industrial (-40°C to +85°C) temperature
range.
For higher sampling frequency applications, refer to the
MAX1195–MAX1198 dual 8-bit ADCs. Pin-compatible
versions of the MAX1191 are also available. Refer to the
MAX1192 data sheet for 22Msps, and the MAX1193
data sheet for 45Msps.
Applications
Ultrasound and Medical Imaging
IQ Baseband Sampling
Battery-Powered Portable Instruments
Low-Power Video
WLAN, Mobile DSL, WLL Receiver
Features
♦ Ultra-Low Power
12mW (Normal Operation: 7.5Msps)
0.3µW (Shutdown Mode)
♦ Excellent Dynamic Performance
48.7dB SNR at f
IN
= 1.875MHz
69dBc SFDR at f
IN
= 1.875MHz
♦ 2.7V to 3.6V Single Analog Supply
♦ 1.8V to 3.6V TTL/CMOS-Compatible Digital
Outputs
♦ Fully Differential or Single-Ended Analog Inputs
= VDD(internal reference), CL≈ 10pF at digital outputs, f
CLK
= 7.5MHz, C
REFP
= C
REFN
= C
COM
= 0.33µF, TA = -40°C to +85°C, unless otherwise noted. Typical values are at TA= +25°C.) (Note 1)
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
VDD, OVDDto GND ...............................................-0.3V to +3.6V
OGND to GND.......................................................-0.3V to +0.3V
INA+, INA-, INB+, INB- to GND .................-0.3V to (V
DD
+ 0.3V)
CLK, REFIN, REFP, REFN, COM to GND ...-0.3V to (V
DD
+ 0.3V)
PD0, PD1 to OGND .................................-0.3V to (OV
DD
+ 0.3V)
Digital Outputs to OGND.........................-0.3V to (OV
DD
+ 0.3V)
Continuous Power Dissipation (T
A
= +70°C)
28-Pin Thin QFN (dera te d 20.8mW/°C above +70°C) ...1667mW
Operating Temperature Range ...........................-40°C to +85°C
= VDD(internal reference), CL≈ 10pF at digital outputs, differential input at -0.5dB FS, f
CLK
=
7.500567MHz at 50% duty cycle, T
A
= +25°C, unless otherwise noted.)
ELECTRICAL CHARACTERISTICS (continued)
(VDD= 3.0V, OVDD= 1.8V, V
REFIN
= VDD(internal reference), CL≈ 10pF at digital outputs, f
CLK
= 7.5MHz, C
REFP
= C
REFN
= C
COM
= 0.33µF, TA = -40°C to +85°C, unless otherwise noted. Typical values are at TA= +25°C.) (Note 1)
Note 1: Specifications ≥+25°C guaranteed by production test, <+25°C guaranteed by design and characterization.
Note 2: SNR, SINAD, SFDR, HD3, and THD are based on a differential analog input voltage of -0.5dB FS referenced to the
amplitude of the digital output. SNR and THD are calculated using HD2 through HD6.
Note 3: The power consumption of the output driver is proportional to the load capacitance (CL).
Note 4: Guaranteed by design and characterization. Not production tested.
Note 5: SINAD settles to within 0.5dB of its typical value.
Note 6: Crosstalk rejection is measured by applying a high-frequency test tone to one channel and a low-frequency tone to the
second channel. FFTs are performed on each channel. The parameter is specified as power ratio of the first and second
channel FFT test tone bins.
Note 7: Amplitude/phase matching is measured by applying the same signal to each channel, and comparing the magnitude and
phase of the fundamental bin on the calculated FFT.