MAXIM MAX1186 User Manual

General Description
The MAX1186 is a 3V, dual 10-bit analog-to-digital con­verter (ADC) featuring fully-differential wideband track­and-hold (T/H) inputs, driving two pipelined, nine-stage ADCs. The MAX1186 is optimized for low-power, high dynamic performance applications in imaging, instru­mentation, and digital communication applications. This ADC operates from a single 2.7V to 3.6V supply, con­suming only 105mW while delivering a typical signal-to­noise ratio (SNR) of 59.4dB at an input frequency of 20MHz and a sampling rate of 40Msps. Digital outputs A and B are updated alternating on the rising (CHA) and the falling (CHB) edge of the clock. The T/H driven input stages incorporate 400MHz (-3dB) input ampli­fiers. The converters may also be operated with single­ended inputs. In addition to low operating power, the MAX1186 features a 2.8mA sleep mode as well as a 1µA power-down mode to conserve power during idle periods.
An internal 2.048V precision bandgap reference sets the full-scale range of the ADCs. A flexible reference structure allows the use of this internal or an externally derived reference, if desired for applications requiring increased accuracy or a different input voltage range.
The MAX1186 features parallel, multiplexed, CMOS­compatible three-state outputs. The digital output for­mat can be set to two’s complement or straight offset binary through a single control pin. The device provides for a separate output power supply of 1.7V to 3.6V for flexible interfacing. The MAX1186 is available in a 7mm x 7mm, 48-pin TQFP-EP package, and is speci­fied for the extended industrial (-40°C to +85°C) tem­perature range.
Pin-compatible, nonmultiplexed, high-speed versions of the MAX1186 are also available. Please refer to the MAX1180 data sheet for 105Msps, the MAX1181 data sheet for 80Msps, the MAX1182 data sheet for 65Msps, the MAX1183 data sheet for 40Msps, and the MAX1184 data sheet for 20Msps. For a pin-compatible lower speed version (20Msps) of the MAX1186, please refer to the MAX1185 data sheet.
Applications
Features
Single 3V OperationExcellent Dynamic Performance:
59.4dB SNR at fIN= 20MHz 72dBc SFDR at fIN= 20MHz
Low Power:
35mA (Normal Operation)
2.8mA (Sleep Mode) 1µA (Shutdown Mode)
0.02dB Gain and 0.25° Phase MatchingWide ±1V
P-P
Differential Analog Input Voltage
Range
400MHz, -3dB Input BandwidthOn-Chip 2.048V Precision Bandgap ReferenceSingle 10-Bit Bus for Multiplexed, Digital OutputsUser-Selectable Output Format—Two’s
Complement or Offset Binary
48-Pin TQFP Package with Exposed Paddle For
Improved Thermal Dissipation
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
________________________________________________________________ Maxim Integrated Products 1
D1A/B D0A/B OGND OV
DD
OV
DD
OGND A/B N.C. N.C. N.C. N.C. N.C.
COM
V
DD
GND
INA+
INA-
V
DD
GND INB-
INB+
GND
V
DD
CLK
1
2
3
4
5
6
7
8
9
10
11
12
36
35
34
33
32
31
30
29
28
27
26
25
48 TQFP-EP
GND
V
DD
GND
V
DD
T/B
SLEEP
PD
OE
N.C.
N.C.
N.C.
N.C.
1314151617181920212223
24
4847464544434241403938
37
REFN
REFP
REFIN
REFOUT
D9A/B
D8A/B
D7A/B
D6A/B
D5A/B
D4A/B
D3A/B
D2A/B
MAX1186
EP
NOTE: THE PIN 1 INDICATOR FOR LEAD-FREE PACKAGES IS REPLACED BY A "+" SIGN.
Pin Configuration
19-2263; Rev 1; 4/06
Ordering Information
PART
TEMP RANGE
PIN­PACKAGE
PKG CODE
MAX1186ECM
C48E-7
MAX1186ECM+
C48E-7
For pricing, delivery, and ordering information, please contact Maxim/Dallas Direct! at 1-888-629-4642, or visit Maxim’s website at www.maxim-ic.com.
Functional Diagram appears at end of data sheet.
High-Resolution Imaging
I/Q Channel Digitization
Multichannel IF Sampling
Instrumentation
Video Application
Ultrasound
+Denotes lead-free package. *EP = Exposed paddle.
Pin-Compatible Versions table at end of data sheet.
-40°C to +85°C 48 TQFP-EP*
-40°C to +85°C 48 TQFP-EP*
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
2 _______________________________________________________________________________________
ABSOLUTE MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
(VDD= 3V, OVDD= 2.5V, 0.1µF and 1µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a 10kresistor, V
IN
= 2V
P-P
(differential w.r.t. COM), CL= 10pF at digital outputs (Note 1), f
CLK
= 40MHz, TA= T
MIN
to T
MAX
, unless
otherwise noted. Typical values are at T
A
= +25°C.) (Note 2)
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
VDD, OVDDto GND ...............................................-0.3V to +3.6V
OGND to GND.......................................................-0.3V to +0.3V
INA+, INA-, INB+, INB- to GND ...............................-0.3V to V
DD
REFIN, REFOUT, REFP, REFN, COM,
CLK to GND............................................-0.3V to (V
DD
+ 0.3V)
OE, PD, SLEEP, T/B, D9A/B–D0A/B,
A/B to OGND .......................................-0.3V to (OV
DD
+ 0.3V)
Continuous Power Dissipation (T
A
= +70°C)
48-Pin TQFP-EP (derate 30.4mW/°C
above +70°C).........................................................2430mW
Operating Temperature Range ...........................-40°C to +85°C
Junction Temperature......................................................+150°C
Storage Temperature Range .............................-60°C to +150°C
Lead Temperature (soldering, 10s) .................................+300°C
PARAMETER
CONDITIONS
UNITS
DC ACCURACY
Resolution 10 Bits
Integral Nonlinearity INL fIN = 7.5MHz
LSB
Differential Nonlinearity DNL fIN = 7.5MHz, no missing codes guaranteed
LSB
Offset Error
% FS
Gain Error 0 ±2
% FS
ANALOG INPUT
Differential Input Voltage Range
V
DIFF
Differential or single-ended inputs ±1V
Common-Mode Input Voltage Range
V
CM
V
D D
/ 2
V
Input Resistance R
IN
Switched capacitor load 100 k
Input Capacitance C
IN
5pF
CONVERSION RATE
Maximum Clock Frequency f
CLK
40
MHz
CHA 5
Data Latency
CHB 5.5
Clock
cycles
DYNAMIC CHARACTERISTICS
f
INA or B
= 7.5MHz, TA = +25°C
Signal-to-Noise Ratio (Note 3)
SNR
f
INA or B
= 20MHz, TA = +25°C
dB
f
INA or B
= 7.5MHz, TA = +25°C57
Signal-to-Noise and Distortion (Note 3)
f
INA or B
= 20MHz, TA = +25°C
dB
f
INA or B
= 7.5MHz, TA = +25°C6474
Spurious-Free Dynamic Range (Note 3)
SFDR
f
INA or B
= 20MHz, TA = +25°C6472
dBc
SYMBOL
MIN TYP MAX
±0.5 ±1.7
±0.25 ±1.0
< ±1 ±2.3
SINAD
± 0.5
57.3 59.5
56.8 59.4
56.5 59.2
59.4
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
_______________________________________________________________________________________ 3
ELECTRICAL CHARACTERISTICS (continued)
(VDD= 3V, OVDD= 2.5V, 0.1µF and 1µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a 10kresistor, V
IN
= 2V
P-P
(differential w.r.t. COM), CL= 10pF at digital outputs (Note 1), f
CLK
= 40MHz, TA= T
MIN
to T
MAX
, unless
otherwise noted. Typical values are at T
A
= +25°C.) (Note 2)
PARAMETER
CONDITIONS
UNITS
f
INA or B
= 7.5MHz, TA = +25°C -72 -64
Total Harmonic Distortion (First 4 Harmonics) (Note 3)
THD
f
INA or B
= 20MHz, TA = +25°C -71 -63
dBc
f
INA or B
= 7.5MHz -74
Third-Harmonic Distortion (Note 3)
HD3
f
INA or B
= 20MHz -72
dBc
f
INA or B
= 11.6066MHz at -6.5dBFS
Intermodulation Distortion IMD
f
I N A o r B
= 13.3839M H z at - 6.5d BFS ( N ote 4)
-76
dBc
Small-Signal Bandwidth Input at -20dBFS, differential inputs
MHz
Full-Power Bandwidth
Input at -0.5dBFS, differential inputs
MHz
Aperture Delay t
AD
1ns
Aperture Jitter t
AJ
2
ps
RMS
Overdrive Recovery Time For 1.5x full-scale input 2 ns
Differential Gain ±1%
Differential Phase
D egr ees
Output Noise INA+ = INA- = INB+ = INB- = COM 0.2
LSB
RMS
INTERNAL REFERENCE
Reference Output Voltage
V
Reference Temperature Coefficient
60
ppm/°C
Load Regulation
mV/mA
BUFFERED EXTERNAL REFERENCE (V
REFIN
= 2.048V)
REFIN Input Voltage
V
Positive Reference Output Voltage
V
Negative Reference Output Voltage
V
Differential Reference Output Voltage Range
V
REF
= V
REFP
- V
REFN
V
REFIN Resistance
M
SYMBOL
FPBW
REFOUT
TC
REF
V
REFIN
V
REFP
V
REFN
V
REF
R
REFIN
MIN TYP MAX
0.95 1.024 1.10
500
400
±0.25
2.048 ±3%
1.25
2.048
2.012
0.988
> 50
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
4 _______________________________________________________________________________________
ELECTRICAL CHARACTERISTICS (continued)
(VDD= 3V, OVDD= 2.5V, 0.1µF and 1µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a 10kresistor, V
IN
= 2V
P-P
(differential w.r.t. COM), CL= 10pF at digital outputs (Note 1), f
CLK
= 40MHz, TA= T
MIN
to T
MAX
, unless
otherwise noted. Typical values are at T
A
= +25°C.) (Note 2)
PARAMETER
CONDITIONS
UNITS
Maximum REFP, COM Source Current
5
mA
Maximum REFP, COM Sink Current
I
SINK
µA
Maximum REFN Source Current
µA
Maximum REFN Sink Current I
SINK
-5
mA
UNBUFFERED EXTERNAL REFERENCE (V
REFIN
= GND, reference voltage applied to REFP, REFN, and COM)
REFP, REFN Input Resistance
R
REFP
,
Measured between REFP and COM, and REFN and COM
4k
Differential Reference Input Voltage
V
REF
= V
REFP
- V
REFN
V
COM Input Voltage V
COM
VDD / 2
V
REFP Input Voltage
V
COM
+
V
REF
/ 2
V
REFN Input Voltage
V
COM
-
V
REF
/ 2
V
DIGITAL INPUTS (CLK, PD, OE, SLEEP, T/B)
CLK
0.8
Input High Threshold V
IH
PD, OE, SLEEP, T/B
0.8
V
CLK
0.2
Input Low Threshold V
IL
PD, OE, SLEEP, T/B
0.2
V
Input Hysteresis
0.1 V
I
IH
VIH = OV
DD
or V
DD
(CLK) ±5
Input Leakage
I
IL
VIL = 0 ±5
µA
Input Capacitance C
IN
5pF
DIGITAL OUTPUTS (D0A/B–D9A/B, A/B)
Output-Voltage Low V
OL
I
SINK
= -200µA 0.2 V
Output-Voltage High V
OH
I
SOURCE
= 200µA
- 0.2
V
Three-State Leakage Current I
LEAK
OE = OV
DD
±10 µA
Three-State Output Capacitance
C
OUT
OE = OV
DD
5pF
SYMBOL
I
SOURCE
MIN TYP MAX
I
SOURCE
R
REFN
V
REF
V
REFP
V
REFN
V
HYST
V
DD
x OV
DD
-250
250
1.024 ±10%
±10%
x V
x OV
DD
DD
OV
DD
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
_______________________________________________________________________________________ 5
ELECTRICAL CHARACTERISTICS (continued)
(VDD= 3V, OVDD= 2.5V, 0.1µF and 1µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a 10kresistor, V
IN
= 2V
P-P
(differential w.r.t. COM), CL= 10pF at digital outputs (Note 1), f
CLK
= 40MHz, TA= T
MIN
to T
MAX
, unless
otherwise noted. Typical values are at T
A
= +25°C.) (Note 2)
PARAMETER
CONDITIONS
UNITS
POWER REQUIREMENTS
Analog Supply Voltage Range V
DD
2.7 3.0 3.6 V
Output Supply Voltage Range OV
DD
1.7 2.5 3.6 V
Operating, f
INA or B
= 20MHz at -0.5dBFS 35 50
Sleep mode 2.8
mA
Analog Supply Current I
VDD
Shutdown, clock idle, PD = OE = OV
DD
11A
Operating, CL = 15pF, f
INA or B
= 20MHz at
-0.5dBFS
9mA
Sleep mode
Output Supply Current
Shutdown, clock idle, PD = OE = OV
DD
210
µA
Operating, f
INA or B
= 20MHz at -0.5dBFS
Sleep mode 8.4
mW
Power Dissipation
Shutdown, clock idle, PD = OE = OV
DD
34W
Offset
mV/V
Power-Supply Rejection Ratio PSRR
Gain
%/V
TIMING CHARACTERISTICS
CLK Rise to CHA Output Data Valid
t
DOA
Figure 3 (Note 5) 5 8 ns
CLK Fall to CHB Output Data Valid
t
DOB
Figure 3 (Note 5) 5 8 ns
Clock Rise/Fall to A/B Rise/Fall Time
t
DA/B
6ns
Output Enable Time
Figure 4 10 ns
Output Disable Time
Figure 4 1.5 ns
CLK Pulse Width High t
CH
Figure 3, clock period: 25ns
12.5 ±3.8
ns
CLK Pulse Width Low t
CL
Figure 3, clock period: 25ns
12.5 ±3.8
ns
Wake-up from sleep mode (Note 6)
Wake-Up Time
Wake-up from shutdown (Note 6) 1.5
µs
CHANNEL-TO-CHANNEL MATCHING
Crosstalk f
INA or B
= 20MHz at -0.5dBFS -70 dB
Gain Matching f
INA or B
= 20MHz at -0.5dBFS
dB
Phase Matching f
INA or B
= 20MHz at -0.5dBFS
D eg r ees
Note 1: Equivalent dynamic performance is obtainable over full OVDDrange with reduced CL. Note 2: Specifications at +25°C are guaranteed by production test and < +25°C guaranteed by design and characterization. Note 3: SNR, SINAD, THD, SFDR, and HD3 are based on an analog input voltage of -0.5dB FS referenced to a ±1.024V full-scale
input voltage range.
Note 4: Intermodulation distortion power of the intermodulation products relative to the individual carrier. This number is 6dB or bet-
ter, if referenced to the two-tone envelope.
Note 5: Digital outputs settle to V
IH
and VIL. Parameter guaranteed by design.
Note 6: With REFIN driven externally, REFP, COM, and REFN are left floating while powered down.
SYMBOL
I
OVDD
PDISS
t
ENABLE
t
DISABLE
t
WAKE
MIN TYP MAX
100
105 150
±0.2
±0.1
0.41
0.02 ±0.2
0.25
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
6 _______________________________________________________________________________________
Typical Operating Characteristics
(VDD= 3V, OVDD= 2.5V, V
REFIN
= 2.048V, differential input at -0.5dBFS, f
CLK
= 40MHz, CL≈ 10pF, TA= +25°C, unless otherwise noted.)
-100
-80
-90
-60
-70
-40
-50
-30
-10
-20
0
046821012141816 20
FFT PLOT CHA (DIFFERENTIAL INPUT,
8192-POINT DATA RECORD)
MAX1186 toc01
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHA
f
CLK
= 40.0005678MHz
f
INA
= 6.1475482MHz
f
INB
= 7.5342866MHz
A
INA
= -0.552dBFS
HD3
HD2
-100
-80
-90
-60
-70
-40
-50
-30
-10
-20
0
046821012141816 20
FFT PLOT CHB (DIFFERENTIAL INPUT,
8192-POINT DATA RECORD)
MAX1186 toc02
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHB
f
CLK
= 40.0005678MHz
f
INA
= 6.1475482MHz
f
INB
= 7.5342866MHz
A
INB
= -0.534dBFS
HD3
HD2
-100
-80
-90
-60
-70
-40
-50
-30
-10
-20
0
0 46821012141816 20
FFT PLOT CHA (DIFFERENTIAL INPUT,
8192-POINT DATA RECORD)
MAX1186 toc03
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHAf
CLK
= 40.0005678MHz
f
INA
= 19.8879776MHz
f
INB
= 24.9661747MHz
A
INA
= -0.516dBFS
HD3
HD2
-100
-80
-90
-60
-70
-40
-50
-30
-10
-20
0
0 46821012141816 20
FFT PLOT CHB (DIFFERENTIAL INPUT,
8192-POINT DATA RECORD)
MAX1186 toc04
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHBf
CLK
= 40.0005678MHz
f
INA
= 19.8879776MHz
f
INB
= 24.9661747MHz
A
INB
= -0.498dBFS
HD3
HD2
-100
-80
-90
-60
-70
-40
-50
-30
-10
-20
0
0 46821012141816 20
TWO-TONE IMD PLOT (DIFFERENTIAL INPUT,
8192-POINT DATA RECORD)
MAX1186 toc05
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
IM2
IM3
IM3
f
CLK
= 40.0005678MHz
f
IN1
= 11.606610MHz
f
IN2
= 13.383979MHz
A
IN
= -6.5dBFS
IM2
f
IN2
f
IN1
57
56
55
59
58
60
61
0 102030405060708090100110
SIGNAL-TO-NOISE RATIO
vs. ANALOG INPUT FREQUENCY
MAX1186 toc06
ANALOG INPUT FREQUENCY (MHz)
SNR (dB)
CHB
CHA
62
61
60
59
58
57
54
56
55
0102030 5040 60 8070 90 100 110
SIGNAL-TO-NOISE AND DISTORTION
vs. ANALOG INPUT FREQUENCY
MAX1186 toc07
ANALOG INPUT FREQUENCY (MHz)
SINAD (dB)
CHB
CHA
-72
-76
-80
-68
-64
-60
TOTAL HARMONIC DISTORTION
vs. ANALOG INPUT FREQUENCY
MAX1186 toc08
ANALOG INPUT FREQUENCY (MHz)
THD (dBc)
0102030405060708090100110
CHA
CHB
60
64
72
68
76
80
SPURIOUS-FREE DYNAMIC RANGE
vs. ANALOG INPUT FREQUENCY
MAX1186 toc09
ANALOG INPUT FREQUENCY (MHz)
SFDR (dBc)
0 102030405060708090100110
CHA
CHB
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
_______________________________________________________________________________________ 7
-8
-4
-6
0
-2
4
2
6
1 10 100 1000
FULL-POWER INPUT BANDWIDTH
vs. ANALOG INPUT FREQUENCY, SINGLE-ENDED
MAX1186 toc10
ANALOG INPUT FREQUENCY (MHz)
GAIN (dB)
-8
-4
-6
0
-2
4
2
6
1 10 100 1000
SMALL-SIGNAL INPUT BANDWIDTH
vs. ANALOG INPUT FREQUENCY, SINGLE-ENDED
MAX1186 toc11
ANALOG INPUT FREQUENCY (MHz)
GAIN (dB)
VIN = 100mV
P-P
35
45
40
55
50
60
65
-20 0
SIGNAL-TO-NOISE RATIO
vs. ANALOG INPUT POWER (f
IN
= 19.89MHz)
MAX1186 toc12
ANALOG INPUT POWER (dBFS)
SNR (dB)
-12-16 -8 -4
35
45
40
55
50
60
65
-20 0
SIGNAL-TO-NOISE PLUS DISTORTION
vs. ANALOG INPUT POWER (f
IN
= 19.89MHz)
MAX1186 toc13
ANALOG INPUT POWER (dBFS)
SINAD (dB)
-12-16 -8 -4
-80
-75
-65
-70
-60
-55
-20 -12-16 -8 -4 0
TOTAL HARMONIC DISTORTION
vs. ANALOG INPUT POWER (f
IN
= 19.89MHz)
MAX1186 toc14
ANALOG INPUT POWER (dBFS)
THD (dBc)
65
60
75
70
80
-20 -12-16 -8 -4 0
SPURIOUS-FREE DYNAMIC RANGE
vs. ANALOG INPUT POWER (f
IN
= 19.89MHz)
MAX1186 toc15
ANALOG INPUT POWER (dBFS)
SFDR (dBc)
-0.3
-0.2
-0.1
0
0.1
0.2
0.3
0 256128 384 512 640 768 896 1024
INTEGRAL NONLINEARITY
(BEST ENDPOINT FIT)
MAX1186 toc16
DIGITAL OUTPUT CODE
INL (LSB)
-0.3
-0.2
-0.1
0
0.1
0.2
0.3
0 256128 384 512 640 768 896 1024
DIFFERENTIAL NONLINEARITY
MAX1186 toc17
DIGITAL OUTPUT CODE
DNL (LSB)
-0.1
-0.2
0.1
0
0.3
0.2
0.4
-40 85
GAIN ERROR vs. TEMPERATURE
EXTERNAL REFERENCE (V
REFIN
= 2.048V)
MAX1186 toc18
TEMPERATURE (°C)
GAIN ERROR (%FS)
10-15 35 60
CHB
CHA
Typical Operating Characteristics (continued)
(VDD= 3V, OVDD= 2.5V, V
REFIN
= 2.048V, differential input at -0.5dBFS, f
CLK
= 40MHz, CL≈ 10pF, TA= +25°C, unless otherwise noted.)
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
8 _______________________________________________________________________________________
-0.4
-0.2
-0.3
0
-0.1
0.1
0.2
-40 85
OFFSET ERROR vs. TEMPERATURE
EXTERNAL REFERENCE (V
REFIN
= 2.048V)
MAX1186 toc19
TEMPERATURE (°C)
OFFSET ERROR (%FS)
10-15 35 60
CHB
CHA
35
37
41
39
43
45
2.70 3.002.85 3.15 3.30 3.45 3.60
ANALOG SUPPLY CURRENT
vs. ANALOG SUPPLY VOLTAGE
MAX1186 toc20
VDD (V)
I
VDD
(mA)
36
38
37
40
39
41
42
-40 10-15 35 60 85
ANALOG SUPPLY CURRENT
vs. TEMPERATURE
MAX1186 toc21
TEMPERATURE (°C)
I
VDD
(mA)
0
0.08
0.24
0.16
0.32
0.40
2.70 3.002.85 3.15 3.30 3.45 3.60
ANALOG POWER-DOWN CURRENT
vs. ANALOG SUPPLY VOLTAGE
MAX1186 toc22
VDD (V)
I
VDD
(µA)
OE = PD = OV
DD
50
56
68
62
74
80
30 35 4540 5550 60 65 70
SNR/SINAD, -THD/SFDR
vs. CLOCK DUTY CYCLE
MAX1186 toc23
CLOCK DUTY CYCLE (%)
SNR/SINAD, -THD/SFDR (dB, dBc)
SFDR
f
INA/B
= 7.53MHz
SNR
SINAD
-THD
2.0000
2.0020
2.0060
2.0040
2.0080
2.0100
2.70 3.002.85 3.15 3.30 3.45 3.60
INTERNAL REFERENCE VOLTAGE
vs. ANALOG SUPPLY VOLTAGE
MAX1186 toc24
VDD (V)
V
REFOUT
(V)
1.994
2.002
1.998
2.006
2.010
2.014
-40 85
INTERNAL REFERENCE VOLTAGE
vs. TEMPERATURE
MAX1186 toc25
TEMPERATURE (°C)
V
REOUT
(V)
10-15 35 60
0
21,000
14,000
7,000
28,000
35,000
42,000
49,000
56,000
63,000
70,000
OUTPUT NOISE HISTOGRAM (DC INPUT)
MAX1186 toc26
DIGITAL OUTPUT CODE
COUNTS
64,515
N
869
N-1
152
N+1
0
N+2
0
N-2
Typical Operating Characteristics (continued)
(VDD= 3V, OVDD= 2.5V, V
REFIN
= 2.048V, differential input at -0.5dBFS, f
CLK
= 40MHz, CL≈ 10pF, TA= +25°C, unless otherwise noted.)
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
_______________________________________________________________________________________ 9
Pin Description
PIN NAME FUNCTION
1 COM Common-Mode Voltage Input/Output. Bypass to GND with a 0.1µF capacitor.
2, 6, 11, 14, 15
V
DD
Analog Supply Voltage. Bypass each supply pin to GND with a 0.1µF capacitor. Analog
supply accepts a 2.7V to 3.6V input range.
3, 7, 10, 13, 16
GND Analog Ground
4 INA+ Channel A Positive Analog Input. For single-ended operation, connect signal source to INA+.
5 INA- Channel A Negative Analog Input. For single-ended operation, connect INA- to COM.
8 INB- Channel B Negative Analog Input. For single-ended operation, connect INB- to COM.
9 INB+ Channel B Positive Analog Input. For single-ended operation, connect signal source to INB+.
12 CLK Converter Clock Input
17 T/B
T/B selects the ADC digital output format. High: Twos complement. Low: Straight offset binary.
18 SLEEP
Sleep Mode Input. High: Deactivates the two ADCs, but leaves the reference bias circuit active. Low: Normal operation.
19 PD
Power-Down Input. High: Power-down mode. Low: Normal operation.
20 OE
Output Enable Input. High: Digital outputs disabled. Low: Digital outputs enabled.
21–29 N.C. No Connection
30 A/B
A/B Data Indicator. This digital output indicates CHA data (A/B = 1) or CHB data (A/B = 0) to
be present on the output. A/B follows the external clock signal with typically 6ns delay.
31, 34 OGND Output Driver Ground
32, 33 OV
DD
Output Driver Supply Voltage. Bypass each supply pin to OGND with a 0.1µF capacitor.
Output driver supply accepts a 1.7V to 3.6V input range.
35 D0A/B
Three-State Digital Output, Bit 0 (LSB). Depending on status of A/B, output data reflects
channel A or channel B data.
36 D1A/B
Three-State Digital Output, Bit 1. Depending on status of A/B, output data reflects channel A or channel B data.
37 D2A/B
Three-State Digital Output, Bit 2. Depending on status of A/B, output data reflects channel A or channel B data.
38 D3A/B
Three-State Digital Output, Bit 3. Depending on status of A/B, output data reflects channel A or channel B data.
39 D4A/B
Three-State Digital Output, Bit 4. Depending on status of A/B, output data reflects channel A or channel B data.
40 D5A/B
Three-State Digital Output, Bit 5. Depending on status of A/B, output data reflects channel A or channel B data.
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
10 ______________________________________________________________________________________
Pin Description (continued)
PIN NAME FUNCTION
41 D6A/B
Three-State Digital Output, Bit 6. Depending on status of A/B, output data reflects channel A or channel B data.
42 D7A/B
Three-State Digital Output, Bit 7. Depending on status of A/B, output data reflects channel A or channel B data.
43 D8A/B
Three-State Digital Output, Bit 8. Depending on status of A/B, output data reflects channel A or channel B data.
44 D9A/B
Three-State Digital Output, Bit 9 (MSB). Depending on status of A/B, output data reflects channel A or channel B data.
45 REFOUT
Internal Reference Voltage Output. Maybe connected to REFIN through a resistor or a resistor­divider.
46 REFIN Reference Input. V
REFIN
= 2 x (V
REFP
- V
REFN
). Bypass to GND with a > 1nF capacitor.
47 REFP
Positive Reference Input/Output. Conversion range is ±(V
REFP
- V
REFN
). Bypass to GND with a
> 0.1µF capacitor.
48 REFN
Negative Reference Input/Output. Conversion range is ±(V
REFP
- V
REFN
). Bypass to GND with
a > 0.1µF capacitor.
EP Exposed Paddle. Connect to analog ground.
Detailed Description
The MAX1186 uses a nine-stage, fully-differential, pipelined architecture (Figure 1) that allows for high­speed conversion while minimizing power consumption. Samples taken at the inputs move progressively through the pipeline stages every one-half clock cycle. Including the delay through the output latch, the total clock-cycle latency is five clock cycles.
1.5-bit (2-comparator) flash ADCs convert the held input voltages into a digital code. The digital-to-analog con­verters (DACs) convert the digitized results back into analog voltages, which are then subtracted from the original held input signals. The resulting error signals are then multiplied by two and the residues are passed along to the next pipeline stages, where the process is repeated until the signals have been processed by all nine stages. Digital error correction compensates for ADC comparator offsets in each of these pipeline stages and ensures no missing codes.
Both input channels are sampled on the rising edge of the clock and the resulting data is multiplexed at the output. CHA data is updated on the rising edge (5 clock cycles later) and CHB data is updated on the falling edge (5.5 clock cycles later) of the clock signal. The A/B indicator follows the clock signal with a typical delay
time of 6ns and remains high when CHA data is updat­ed and low when CHB data is updated.
Input Track-and-Hold (T/H) Circuits
Figure 2 displays a simplified functional diagram of the input track-and-hold (T/H) circuits in both track- and hold­mode. In track mode, switches S1, S2a, S2b, S4a, S4b, S5a, and S5b are closed. The fully-differential circuits sample the input signals onto the two capacitors (C2a and C2b) through switches S4a and S4b. S2a and S2b set the common mode for the amplifier input, and open simultaneously with S1, sampling the input waveform. Switches S4a and S4b are then opened before switches S3a and S3b connect capacitors C1a and C1b to the out­put of the amplifier and switch S4c is closed. The result­ing differential voltages are held on capacitors C2a and C2b. The amplifiers are used to charge capacitors C1a and C1b to the same values originally held on C2a and C2b. These values are then presented to the first stage quantizers and isolate the pipelines from the fast-chang­ing inputs. The wide input bandwidth T/H amplifiers allow the MAX1186 to track and sample/hold analog inputs of high frequencies (> Nyquist). Both ADC inputs (INA+, INB+, INA-, and INB-) can be driven either differentially or single-ended. Match the impedance of INA+ and INA-, as well as INB+ and INB-, and set the common-mode voltage to midsupply (V
DD
/ 2) for optimum performance.
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
______________________________________________________________________________________ 11
T/H
V
OUT
x2
Σ
FLASH
ADC
DAC
1.5 BITS
10
V
INA
V
IN
STAGE 1 STAGE 2
DIGITAL CORRECTION LOGIC
STAGE 8 STAGE 9
2-BIT FLASH
ADC
T/H
T/H
V
OUT
x2
Σ
FLASH
ADC
DAC
1.5 BITS
10
V
INB
V
IN
STAGE 1 STAGE 2
DIGITAL CORRECTION LOGIC
STAGE 8 STAGE 9
2-BIT FLASH
ADC
T/H
OUTPUT
MULTIPLEXER
10
D0A/B–D9A/B
Figure 1. Pipelined Architecture—Stage Blocks
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
12 ______________________________________________________________________________________
S3b
S3a
COM
S5b
S5a
INB+
INB-
S1
OUT
OUT
C2a
C2b
S4c
S4a
S4b
C1b
C1a
INTERNAL
BIAS
INTERNAL
BIAS
COM
HOLD
HOLD
CLK
INTERNAL NONOVERLAPPING CLOCK SIGNALS
TRACK
TRACK
S2a
S2b
S3b
S3a
COM
S5b
S5a
INA+
INA-
S1
OUT
OUT
C2a
C2b
S4c
S4a
S4b
C1b
C1a
INTERNAL
BIAS
INTERNAL
BIAS
COM
S2a
S2b
MAX1186
Figure 2. MAX1186 T/H Amplifiers
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
______________________________________________________________________________________ 13
Analog Inputs and Reference
Configurations
The full-scale range of the MAX1186 is determined by the internally generated voltage difference between REFP (V
DD
/ 2 + V
REFIN
/ 4) and REFN (V
DD
/ 2 - V
REFIN
/ 4). The full-scale range for both on-chip ADCs is adjustable through the REFIN pin, which is provided for this purpose.
REFOUT, REFP, COM (V
DD
/ 2), and REFN are internally
buffered low-impedance outputs.
The MAX1186 provides three modes of reference operation:
Internal reference mode
Buffered external reference mode
Unbuffered external reference mode
In internal reference mode, connect the internal reference output REFOUT to REFIN through a resistor (e.g., 10kΩ) or resistor-divider, if an application requires a reduced full-scale range. For stability and noise filtering purposes, bypass REFIN with a > 10nF capacitor to GND. In internal reference mode, REFOUT, COM, REFP, and REFN become low-impedance outputs.
In buffered external reference mode, adjust the reference voltage levels externally by applying a stable and accu­rate voltage at REFIN. In this mode, COM, REFP, and REFN become outputs. REFOUT may be left open or con­nected to REFIN through a > 10kresistor.
In unbuffered external reference mode, connect REFIN to GND. This deactivates the on-chip reference buffers for REFP, COM, and REFN. With their buffers shut down, these nodes become high impedance and may be driven through separate, external reference sources.
Clock Input (CLK)
The MAX1186s CLK input accepts CMOS-compatible clock signals. Since the interstage conversion of the device depends on the repeatability of the rising and falling edges of the external clock, use a clock with low jit­ter and fast rise and fall times (< 2ns). In particular, sam­pling occurs on the rising edge of the clock signal, requiring this edge to provide lowest possible jitter. Any significant aperture jitter would limit the SNR performance of the on-chip ADCs as follows:
SNRdB= 20 x log10(1 / [2π x fINx tAJ])
where fINrepresents the analog input frequency and t
AJ
is the time of the aperture jitter.
Clock jitter is especially critical for undersampling appli­cations. The clock input should always be considered as an analog input and routed away from any analog input or other digital signal lines.
The MAX1186 clock input operates with a voltage thresh­old set to VDD/2. Clock inputs with a duty cycle other than 50%, must meet the specifications for high and low periods as stated in the Electrical Characteristics.
System Timing Requirements
Figure 3 shows the relationship between clock and ana­log input, A/B indicator, and the resulting CHA/CHB data output. CHA and CHB data are sampled on the rising edge of the clock signal. Following the rising edge of the 5th clock cycles, the digitized value of the original CHA sample is presented at the output. This followed one-half clock cycle later by the digitized value of the original CHB sample.
A channel selection signal (A/B indicator) allows the user to determine which output data represents which input channel. With A/B = 1, digitized data from CHA is present at the output and with A/B = 0 digitized data from CHB is present.
Digital Output Data, Output Data Format
Selection (T/B), Output Enable (
OE
), Channel
Selection (A/B)
All digital outputs, D0A/B–D9A/B (CHA or CHB data) and A/B are TTL/CMOS logic-compatible. The output coding can be chosen to be either offset binary or two’s comple­ment (Table 1) controlled by a single pin (T/B). Pull T/B low to select offset binary and high to activate two’s com­plement output coding. The capacitive load on the digital outputs D0A/B–D9A/B should be kept as low as possible (< 15pF), to avoid large digital currents that could feed back into the analog portion of the MAX1186, thereby degrading its dynamic performance. Using buffers on the digital outputs of the ADCs can further isolate the digital outputs from heavy capacitive loads. To further improve the dynamic performance of the MAX1186, small-series resistors (e.g., 100) may be added to the digital output paths, close to the MAX1186.
Figure 4 displays the timing relationship between output enable and data output valid as well as power­down/wake-up and data output valid.
Power-Down (PD) and Sleep
(SLEEP) Modes
The MAX1186 offers two power-save modessleep and full power-down mode. In sleep mode (SLEEP = 1), only the reference bias circuit is active (both ADCs are disabled), and current consumption is reduced to
2.8mA. To enter full power-down mode, pull PD high. With OE
simultaneously low, all outputs are latched at the last value prior to the power-down. Pulling OE high, forces the digital outputs into a high-impedance state.
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
14 ______________________________________________________________________________________
Applications Information
Figure 5 depicts a typical application circuit containing two single-ended to differential converters. The internal reference provides a V
DD
/ 2 output voltage for level shifting purposes. The input is buffered and then split to a voltage follower and inverter. One lowpass filter per ADC suppresses some of the wideband noise associat­ed with high-speed operational amplifiers that follows
the amplifiers. The user may select the R
ISO
and C
IN
values to optimize the filter performance, to suit a par­ticular application. For the application in Figure 5, a R
ISO
of 50is placed before the capacitive load to pre-
vent ringing and oscillation. The 22pF CINcapacitor acts as a small bypassing capacitor.
Using Transformer Coupling
An RF transformer (Figure 6) provides an excellent solution to convert a single-ended source signal to a fully differential signal, required by the MAX1186 for optimum performance. Connecting the center tap of the transformer to COM provides a V
DD
/ 2 DC level shift to the input. Although a 1:1 transformer is shown, a step­up transformer may be selected to reduce the drive requirements. A reduced signal swing from the input driver, such as an op amp, may also improve the over­all distortion.
In general, the MAX1186 provides better SFDR and THD with fully differential input signals than single­ended drive, especially for very high input frequencies. In differential input mode, even-order harmonics are lower as both inputs (INA+, INA- and/or INB+, INB-) are balanced, and each of the ADC inputs only requires half the signal swing compared to single-ended mode.
t
DOB
t
CL
t
CH
t
CLK
t
DOA
t
DA/B
5 CLOCK-CYCLE LATENCY (CHA), 5.5 CLOCK-CYCLE LATENCY (CHB)
A/B CHB
D0A/B–D9A/B D0B
CHA
D1A
CHB
D1B
CHA
D2A
CHB
D2B
CHA
D3A
CHB
D3B
CHA
D4A
CHB
D4B
CHA
D5A
CHB
D5B
CHA
D6A
CHB
D6B
CHA
CHB
CLK
Figure 3. Timing Diagram for Multiplexed Outputs
Figure 4. Output Timing Diagram
OE
t
DISABLE
VALID DATA
OUTPUT
D0A/B–D9A/B
HIGH
IMPEDANCE
t
ENABLE
HIGH
IMPEDANCE
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
______________________________________________________________________________________ 15
Table 1. MAX1186 Output Codes For Differential Inputs
*V
REF
= V
REFP
- V
REFN
DIFFERENTIAL INPUT
VOLTAGE*
DIFFERENTIAL
INPUT
STRAIGHT OFFSET
BINARY
T/B = 0
TWOS COMPLEMENT
T/B = 1
V
REF
x 511/512 +FULL SCALE - 1 LSB 11 1111 1111 01 1111 1111
V
REF
x 1/512 +1 LSB 10 0000 0001 00 0000 0001
0 Bipolar Zero 10 0000 0000 00 0000 0000
-V
REF
x 1/512 -1 LSB 01 1111 1111 11 1111 1111
-V
REF
x 511/512 -FULL SCALE + 1 LSB 00 0000 0001 10 0000 0001
-V
REF
x 512/512 -FULL SCALE 00 0000 0000 10 0000 0000
Single-Ended AC-Coupled Input Signal
Figure 7 shows an AC-coupled, single-ended applica­tion. Amplifiers like the MAX4108 provide high speed, high bandwidth, low noise, and low distortion to maintain the integrity of the input signal.
Typical QAM Demodulation Application
The most frequently used modulation technique for digital communications applications is probably the Quadrature Amplitude Modulation (QAM). Typically found in spread­spectrum based systems, a QAM signal represents a carrier frequency modulated in both amplitude and phase. At the transmitter, modulating the baseband sig­nal with quadrature outputs, a local oscillator followed by subsequent up-conversion can generate the QAM signal. The result is an in-phase (I) and a quadrature (Q) carrier component, where the Q component is 90 degree phase­shifted with respect to the in-phase component. At the receiver, the QAM signal is divided down into its I and Q components, essentially representing the modulation process reversed. Figure 8 displays the demodulation process performed in the analog domain, using the dual matched 3V, 10-bit ADC MAX1186, and the MAX2451 quadrature demodulator to recover and digitize the I and Q baseband signals. Before being digitized by the MAX1186, the mixed-down signal components may be fil­tered by matched analog filters, such as Nyquist or pulse-shaping filters. These remove any unwanted images from the mixing process, thereby enhancing the overall signal-to-noise (SNR) performance and minimizing intersymbol interference.
Grounding, Bypassing, and
Board Layout
The MAX1186 requires high-speed board layout design techniques. Locate all bypass capacitors as close to the device as possible, preferably on the same side as the ADC, using surface-mount devices for minimum inductance. Bypass VDD, REFP, REFN, and COM with two parallel 0.1µF ceramic capacitors and a 2.2µF bipolar capacitor to GND. Follow the same rules to bypass the digital supply (OVDD) to OGND. Multilayer boards with separated ground and power planes pro­duce the highest level of signal integrity. Consider the use of a split ground plane arranged to match the physical location of the analog ground (GND) and the digital output driver ground (OGND) on the ADC’s package. The two ground planes should be joined at a single point such that the noisy digital ground currents do not interfere with the analog ground plane. The ideal location of this connection can be determined experi­mentally at a point along the gap between the two ground planes, which produces optimum results. Make this connection with a low-value, surface-mount resistor (1to 5), a ferrite bead, or a direct short. Alternatively, all ground pins could share the same ground plane, if the ground plane is sufficiently isolated from any noisy, digital systems ground plane (e.g., downstream output buffer or DSP ground plane). Route high-speed digital signal traces away from the sensitive analog traces of either channel. Make sure to isolate the analog input lines to each respective converter to minimize channel-to-channel crosstalk. Keep all signal lines short and free of 90 degree turns.
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
16 ______________________________________________________________________________________
Figure 5. Typical Application for Single-Ended-to-Differential Conversion
INPUT
300
-5V
+5V
0.1µF
0.1µF
0.1µF
-5V
600
300
300
INA+
INA-
LOWPASS FILTER
COM
600
+5V
-5V
0.1µF
600
300
600
300
0.1µF
0.1µF
0.1µF
+5V
0.1µF
300
MAX4108
MAX1186
INB+
INB-
MAX4108
MAX4108
LOWPASS FILTER
INPUT
300
-5V
+5V
0.1µF
0.1µF
0.1µF
C
IN
22pF
-5V
600
300
300
LOWPASS FILTER
600
+5V
-5V
0.1µF
600
300
600
300
0.1µF
0.1µF
0.1µF
+5V
0.1µF
300
MAX4108
MAX4108
MAX4108
300
LOWPASS FILTER
R
IS0
50
C
IN
22pF
R
IS0
50
C
IN
22pF
R
IS0
50
C
IN
22pF
R
IS0
50
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
______________________________________________________________________________________ 17
Figure 6. Transformer-Coupled Input Drive
MAX1186
T1
N.C.
V
IN
6
1
5
2
43
22pF
22pF
0.1µF
0.1µF
2.2µF
25
25
MINICIRCUITS
TT1–6
T1
N.C.
V
IN
6
1
5
2
4
3
22pF
22pF
0.1µF
0.1µF
2.2µF
25
25
MINICIRCUITS
TT1–6
INA-
INA+
INB-
INB+
COM
Static Parameter Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an actual transfer function from a straight line. This straight line can be either a best straight-line fit or a line drawn between the endpoints of the transfer function, once offset and gain errors have been nullified. The static lin­earity parameters for the MAX1186 are measured using the best straight-line fit method.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an actual step width and the ideal value of 1 LSB. A DNL error specification of less than 1 LSB guarantees no missing codes and a monotonic transfer function.
Dynamic Parameter Definitions
Aperture Jitter
Figure 9 depicts the aperture jitter (tAJ), which is the sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (tAD) is the time defined between the falling edge of the sampling clock and the instant when an actual sample is taken (Figure 9).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital samples, the theoretical maximum SNR is the ratio of the full-scale analog input (RMS value) to the RMS quantization error (residual error). The ideal, theoretical minimum analog-to-digital noise is caused by quantiza-
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
18 ______________________________________________________________________________________
tion error only and results directly from the ADCs reso­lution (N-Bits):
SNR
dB[max]
= 6.02 x N + 1.76
In reality, there are other noise sources besides quanti­zation noise: thermal noise, reference noise, clock jitter, etc. SNR is computed by taking the ratio of the RMS signal to the RMS noise, which includes all spectral
components minus the fundamental, the first five har­monics, and the DC offset.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS sig­nal to all spectral components minus the fundamental and the DC offset.
MAX1186
0.1µF
1k
1k
100
100
C
IN
22pF
C
IN
22pF
INB+
INB-
COM
INA+
INA-
0.1µF
R
ISO
50
R
ISO
50
REFP
REFN
V
IN
MAX4108
0.1µF
1k
1k
100
100
C
IN
22pF
C
IN
22pF
0.1µF
R
ISO
50
R
ISO
50
REFP
REFN
V
IN
MAX4108
Figure 7. Using an Op Amp for Single-Ended, AC-Coupled Input Drive
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
______________________________________________________________________________________ 19
Total Harmonic Distortion (THD)
THD is typically the ratio of the RMS sum of the first four harmonics of the input signal to the fundamental itself. This is expressed as:
where V1is the fundamental amplitude, and V2through V5are the amplitudes of the 2nd- through 5th-order harmonics.
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio expressed in decibels of the RMS amplitude of the fundamental (maximum signal compo­nent) to the RMS value of the next largest spurious component, excluding DC offset.
Intermodulation Distortion (IMD)
The two-tone IMD is the ratio expressed in decibels of either input tone to the worst 3rd-order (or higher) inter­modulation products. The individual input tone levels are backed off by 6.5dBFS from full scale.
THD
VVVV
V
+++
 
 
20
10
22324
252
1
log
0°
90°
÷
8
DOWNCONVERTER
MAX2451
INA+
A/B
CHA AND CHB DATA ALTERNATINGLY AVAILABLE ON 10-BIT, MULTIPLEXED OUTPUT BUS
MAX1186
INA-
INB+ INB-
DSP
POST
PROCESSING
Figure 8. Typical QAM Application, Using the MAX1186
HOLD
ANALOG
INPUT
SAMPLED
DATA (T/H)
T/H
t
AD
t
AJ
TRACK TRACK
CLK
Figure 9. T/H Aperture Timing
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs
GND
REFERENCE
OUTPUT
DRIVERS
CONTROL
T/H
T/H
PIPELINE
ADC
DEC
MUX
REFOUT
REFN
COM
REFP
REFIN
INA+
INA-
CLK
INB+
INB-
V
DD
DEC
PIPELINE
ADC
OGND
OV
DD
A/B
OE
D0A/B–D9A/B
T/B
PD SLEEP
MAX1186
10
10
Functional Diagram
20 ______________________________________________________________________________________
PART
RESOLUTION
(Bits)
SPEED GRADE
(Msps)
OUTPUT BUS
MAX1190 10 120 Full duplex
MAX1180 10 105 Full duplex
MAX1181 10 80 Full duplex
MAX1182 10 65 Full duplex
MAX1183 10 40 Full duplex
MAX1186 10 40 Half duplex
MAX1184 10 20 Full duplex
MAX1185 10 20 Half duplex
MAX1198 8 100 Full duplex
MAX1197 8 60 Full duplex
MAX1196 8 40 Half duplex
MAX1195 8 40 Full duplex
Pin-Compatible Versions
MAX1186
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
Package Information
48L,TQFP.EPS
G
1
2
21-0065
PACKAGE OUTLINE, 48L TQFP, 7x7x1.0mm EP OPTION
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2
2
21-0065
PACKAGE OUTLINE, 48L TQFP, 7x7x1.0mm EP OPTION
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
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