Maxim MAX1151AIZS, MAX1151BIZS Datasheet

19-1170; Rev 0; 12/96
EVALUATION KIT
AVAILABLE
8-Bit, 750Msps Flash ADC
_______________General Description
The MAX1151 is a parallel flash analog-to-digital con­verter (ADC) capable of digitizing full-scale (0V to -2V) inputs into 8-bit digital words at an update rate of 750Msps. The ECL-compatible outputs are demuxed into two separate output banks, each with differential data-ready outputs to ease the task of data capture. The MAX1151’s wide input bandwidth and low capaci-
____________________________Features
1:2 Demuxed ECL-Compatible OutputsWide Input Bandwidth: 900MHzLow Input Capacitance: 15pFMetastable Errors Reduced to 1LSBSingle -5.2V Supply
tance eliminate the need for external track/hold amplifi­ers for most applications. A proprietary decoding scheme reduces metastable errors to 1LSB. This device operates from a single -5.2V supply, with a nominal power dissipation of 5.5W.
________________________Applications
Digital Oscilloscopes Data Acquisition Transient-Capture Applications
______________Ordering Information
PART
MAX1151AIZS MAX1151BIZS -20°C to +85°C
TEMP. RANGE PIN-PACKAGE
-20°C to +85°C
80 MQUAD 80 MQUAD
Radar, EW, ECM Direct RF/IF Downconversion
Pin Configuration appears on last page.
_________________________________________________________Functional Diagram
CLK NCLK
CLOCK  BUFFER
ANALOG
VRT
INPUT
COMPARATOR
PREAMP
255
DEMUX
CLOCK BUFFER
MAX1151
MAX1151
VRM
254
152
151
128
127
64
63
2
1
VFB
D8
(OVR)
D7
(MSB)
D6
D5
D4
256-BIT TO 8-BIT DECODER
WITH METASTABLE ERROR CORRECTION
D3
D2
D1
D0
(LSB)
________________________________________________________________
1:2 DEMULTIPLEXER
D8B
D7B
D5B
•
•
D2B
D1B
D0B
D8A
D7A
•
•
•
D5A
•
•
•
D2A
D1A
D0A
ECL OUTPUT BUFFERS AND LATCHES
NDRB (NOT DATA READY) DRB (DATA READY) D8B (OVR) D7B (MSB) D6B D5B D4B D3B D2B D1B D0B (LSB) NDRA (NOT DATA READY) DRA (DATA READY) D8A (OVR) D7A (MSB) D6A D5A D4A D3A D2A D1A D0A (LSB)
BANK B
BANK A
Maxim Integrated Products
For the latest literature: http://www.maxim-ic.com, or phone 1-800-998-8800
1
8-Bit, 750Msps Flash ADC
ABSOLUTE MAXIMUM RATINGS
Supply Voltages
Negative Supply Voltage (V
Ground Voltage Differential.................................-0.5V to +0.5V
Input Voltages
Analog Input Voltage.............................................+0.5V to V
Reference Input Voltage........................................+0.5V to V
Digital Input Voltage ..............................................+0.5V to V
Reference Current (VRTto VRB)........................................35mA
MAX1151
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
to GND) .............-7.0V to +0.5V
EE
EE EE EE
ELECTRICAL CHARACTERISTICS
(VEE= -5.2V, V
= TC= TA= +25°C.) (Note 1)
T
j
DC ACCURACY
Integral Nonlinearity
ANALOG INPUT
Input Voltage Range
Input Capacitance Input Bandwidth
REFERENCE INPUT
TIMING CHARACTERISTICS
CLK to DATA READY Delay
= -2.00V, VRM= -1.00V, VRT= 0.00V, f
RB
CONDITIONSPARAMETER
= 100kHz
CLK
= 100kHzDifferential Nonlinearity
CLK
Small signal Large signal V 500 500
RT RB
= 750MHz, duty cycle = 50%, typical thermal impedance (θJC) = 4°C/W,
CLK
TEST
LEVEL
I I
I
I V V V
IV IV mV-30 30Offset Error V
V V/ns5Input Slew Rate 5
I V
I V V
IV IV
Digital Output Current ...........................................0mA to -28mA
Operating Temperature Range ...........................-20°C to +85°C
Case Temperature...........................................................+125°C
Junction Temperature......................................................+150°C
Lead Temperature (soldering, 10sec).............................+300°C
Storage Temperature Range.............................-65°C to +150°C
MAX1151A
MIN TYP MAX
GuaranteedNo Missing Codes
RB
900
V
RT
MAX1151B
MIN TYP MAX
8
-1.5 1.5
-0.95 1.5 Guaranteed
V
RB
0.75 2.0 15 15
900
-30 30
-30 30
60 80
30
750
2
250
0.9 1.4 1.9
1.25 1.75 2.25
V
UNITS
RT
Bits8Resolution
LSB-1.0 1.0f LSB-0.85 0.95f
VV
mA0.75 2.0VIN= 0VInput Bias Current
k15Input Resistance
pF15Over full input range
MHz
mV-30 30Offset Error V
60 80Ladder Resistance
MHz30Reference Bandwidth
MHz750Maximum Sample Rate
ps2Aperture Jitter ps250Acquisition Time ns0.9 1.4 1.9 ns1.25 1.75 2.25Clock to Data Delay
2 _______________________________________________________________________________________
8-Bit, 750Msps Flash ADC
ELECTRICAL CHARACTERISTICS (continued)
(VEE= -5.2V, V
= TC= TA= +25°C.) (Note 1)
T
j
DYNAMIC PERFORMANCE
Signal-to-Noise Ratio (without harmonics)
Total Harmonic Distortion
Signal-to-Noise and Distortion
Spurious-Free Dynamic Range
DIGITAL INPUTS
Input High Voltage (CLK, NCLK)
Input Low Voltage (CLK, NCLK)
Clock Pulse Width High (t
)
PWH
Clock Pulse Width Low (t
)
PWL
Clock Synchronous Input Currents
DIGITAL OUTPUTS
POWER-SUPPLY REQUIREMENTS
= -2.00V, VRM= -1.00V, VRT= 0.00V, f
RB
CONDITIONSPARAMETER
fIN= 250MHz
= 750MHz, duty cycle = 50%, typical thermal impedance (θJC) = 4°C/W,
CLK
TEST
LEVEL
I I I I I
I I
I
I
I
I 0.67 0.5 0.67 0.5 ns
V µA2
I I
V
IV
I I W5.5 6.25Power Dissipation 5.5 6.25
MAX1151A
MIN TYP MAX
46fIN= 50MHz 44
-45fIN= 50MHz
-37fIN= 250MHz 43fIN= 50MHz
48fIN= 50MHz 40fIN= 250MHz
2.4
MAX1151B
MIN TYP MAX
44 42
-43
-35 41 3436IfIN= 250MHz 44 36
-1.1 -0.7
-1.8 -1.5
0.67 0.5
2
-1.1 -0.9
-1.8 -1.5
2.4
-4.95 -5.2 -5.45
1.05 1.2
MAX1151
UNITS
dB
dBc
dB
dB
V-1.1 -0.7
V-1.8 -1.5
ns0.67 0.5
V-1.1 -0.9Logic "1" Voltage V-1.8 -1.5Logic "0" Voltage
V-4.95 -5.2 -5.45Supply Voltage (VEE)
A1.05 1.2Supply Current (IEE)
Note 1: All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific device testing actually
performed during production and Quality Assurance inspection. Unless otherwise noted, all tests are pulsed tests; therefore,
= TC = TA.
T
j
TEST LEVEL
I
II III IV
V VI
TEST PROCEDURE
100% production tested at the specified temperature. 100% production tested at T QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design and characterization data. Parameter is a typical value for information purposes only. 100% production tested at T
_______________________________________________________________________________________ 3
= +25°C, and sample tested at the specified temperatures.
A
= +25°C. Parameter is guaranteed over specified temperature range.
A
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