The MAX1151 is a parallel flash analog-to-digital converter (ADC) capable of digitizing full-scale (0V to -2V)
inputs into 8-bit digital words at an update rate of
750Msps. The ECL-compatible outputs are demuxed
into two separate output banks, each with differential
data-ready outputs to ease the task of data capture.
The MAX1151’s wide input bandwidth and low capaci-
tance eliminate the need for external track/hold amplifiers for most applications. A proprietary decoding
scheme reduces metastable errors to 1LSB. This device
operates from a single -5.2V supply, with a nominal
power dissipation of 5.5W.
________________________Applications
Digital Oscilloscopes
Data Acquisition
Transient-Capture Applications
For the latest literature: http://www.maxim-ic.com, or phone 1-800-998-8800
1
8-Bit, 750Msps Flash ADC
ABSOLUTE MAXIMUM RATINGS
Supply Voltages
Negative Supply Voltage (V
Ground Voltage Differential.................................-0.5V to +0.5V
Input Voltages
Analog Input Voltage.............................................+0.5V to V
Reference Input Voltage........................................+0.5V to V
Digital Input Voltage ..............................................+0.5V to V
Reference Current (VRTto VRB)........................................35mA
MAX1151
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
V-1.1-0.9Logic "1" Voltage
V-1.8-1.5Logic "0" Voltage
V-4.95-5.2-5.45Supply Voltage (VEE)
A1.051.2Supply Current (IEE)
Note 1: All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific device testing actually
performed during production and Quality Assurance inspection. Unless otherwise noted, all tests are pulsed tests; therefore,
= TC = TA.
T
j
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characterization data.
Parameter is a typical value for information purposes only.
100% production tested at T