The MAX1127 quad, 12-bit analog-to-digital converter
(ADC) features fully differential inputs, a pipelined
architecture, and digital error correction. This ADC is
optimized for low-power, high-dynamic performance for
medical imaging, communications, and instrumentation
applications. The MAX1127 operates from a 1.7V to
1.9V single supply and consumes only 563mW while
delivering a 69.6dB signal-to-noise ratio (SNR) at a
19.3MHz input frequency. In addition to low operating
power, the MAX1127 features a 675µA power-down
mode for idle periods.
An internal 1.24V precision bandgap reference sets the
ADC’s full-scale range. A flexible reference structure
allows the use of an external reference for applications
requiring increased accuracy or a different input voltage range.
A single-ended clock controls the conversion process.
An internal duty-cycle equalizer allows for wide variations in input-clock duty cycle. An on-chip phaselocked loop (PLL) generates the high-speed serial
low-voltage differential signaling (LVDS) clock.
The MAX1127 provides serial LVDS outputs for data,
clock, and frame alignment signals. The output data is
presented in two’s complement or binary format.
Refer to the MAX1126 data sheet for a pin-compatible
40Msps version of the MAX1127.
The MAX1127 is available in a small, 10mm x 10mm x
0.9mm, 68-pin QFN package with exposed paddle and
is specified for the extended industrial (-40°C to +85°C)
temperature range.
Applications
Ultrasound and Medical Imaging
Positron Emission Tomography (PET) Imaging
Multichannel Communication Systems
Instrumentation
Features
♦ Four ADC Channels with Serial LVDS/SLVS
Outputs
♦ Excellent Dynamic Performance
69.6dB SNR at fIN= 19.3MHz
92dBc SFDR at f
IN
= 19.3MHz
-87dB Channel Isolation
♦ Ultra-Low Power
135mW per Channel (Normal Operation)
1.2mW Total (Shutdown Mode)
♦ Accepts 20% to 80% Clock Duty Cycle
♦ Self-Aligning Data-Clock to Data-Output Interface
, unless otherwise noted. Typical values are at TA= +25°C.) (Note 1)
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
AVDDto GND.........................................................-0.3V to +2.0V
CV
DD
to GND ........................................................-0.3V to +3.6V
OV
DD
to GND ........................................................-0.3V to +2.0V
IN_P, IN_N to GND...................................-0.3V to (AV
DD
+ 0.3V)
CLK to GND.............................................-0.3V to (CV
DD
+ 0.3V)
OUT_P, OUT_N, FRAME_,
CLKOUT_ to GND................................-0.3V to (OV
DD
+ 0.3V)
DT, SLVS/LVDS to GND...........................-0.3V to (AV
DD
+ 0.3V)
PLL0, PLL1, PLL2, PLL3 to GND .............-0.3V to (AV
DD
+ 0.3V)
PD0, PD1, PD2, PD3, PDALL to GND......-0.3V to (AV
DD
+ 0.3V)
T/B, LVDSTEST to GND ...........................-0.3V to (AV
DD
+ 0.3V)
REFIO, REFADJ, CMOUT to GND ...........-0.3V to (AV
DD
+ 0.3V)
I.C. to GND...............................................-0.3V to (AV
Note 1: Specifications at TA≥ +25°C are guaranteed by production testing. Specifications at TA< +25°C are guaranteed by design
and characterization and not subject to production testing.
Note 2: See definition in the Parameter Definitions section.
Note 3: The MAX1127 internally sets the common-mode voltage to 0.76V (typ) (see Figure 1). The common-mode voltage can be
overdriven to between 0.55V and 0.85V.
Note 4: Limited by MAX1127EVKIT input circuitry.
Note 5: Connect REFADJ to GND directly to enable internal reference mode. Connect REFADJ to AV
DD
directly to disable the inter-
nal bandgap reference and enable external reference mode.
Note 6: Data valid to CLKOUT rise/fall timing is measured from 50% of data output level to 50% of clock output level.
Note 7: Guaranteed by design and characterization. Not subject to production testing.
Note 8: Sample CLK rise to FRAME rise timing is measured from 50% of sample clock input level to 50% of FRAME output level.
= 1.24V, REFADJ = AVDD, differential input at -0.5dBFS,
f
CLK
= 65MHz (50% duty cycle), DT = low, C
LOAD
= 10pF, TA= +25°C, unless otherwise noted.)
CMOUT VOLTAGE
vs. SUPPLY VOLTAGE
MAX1127 toc37
SUPPLY VOLTAGE (V)
V
CMOUT
(V)
2.01.91.8
0.757
0.759
0.761
0.763
0.765
0.755
1.72.1
AVDD = OV
DD
CMOUT VOLTAGE
vs. TEMPERATURE
MAX1127 toc38
TEMPERATURE (°C)
V
CMOUT
(V)
603510-15
0.757
0.759
0.761
0.763
0.765
0.755
-4085
AVDD = OV
DD
CMOUT VOLTAGE
vs. LOAD CURRENT
MAX1127 toc39
I
CMOUT
(µA)
V
CMOUT
(V)
2500200015001000500
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
0
03000
NEGATIVE CURRENT
FLOWS INTO CMOUT
Pin Description
PINNAMEFUNCTION
1, 4, 7, 11,
14, 17, 22,
24, 65, 68
2IN0PChannel 0 Positive Analog Input
3IN0NChannel 0 Negative Analog Input
5IN1PChannel 1 Positive Analog Input
6IN1NChannel 1 Negative Analog Input
8, 9, 10, 18,
20, 25, 26,
27, 58–62
12IN2PChannel 2 Positive Analog Input
13IN2NChannel 2 Negative Analog Input
15IN3PChannel 3 Positive Analog Input
16IN3NChannel 3 Negative Analog Input
19CMOUTCommon-Mode Reference Voltage Output. Bypass CMOUT to GND with a 0.1µF capacitor
21CV
23CLKSingle-Ended CMOS Clock Input
28DT
GNDGround. Connect all GND pins to the same potential.
Analog Power Input. Connect AVDD to a 1.7V to 1.9V power supply. Bypass each AVDD to GND with
AV
DD
a 0.1µF capacitor as close to the device as possible. Bypass the AV
ground plane with a bulk ≥ 2.2µF capacitor as close to the device as possible. Connect all AV
to the same potential.
Clock Power Input. Connect CVDD to a 1.7V to 3.6V supply. Bypass CVDD to GND with a 0.1µF
DD
capacitor in parallel with a ≥ 2.2µF capacitor. Install the bypass capacitors as close to the device as
possible.
Double Termination Select Input. Drive DT high to select the internal 100Ω termination between the
differential output pairs. Drive DT low to select no internal output termination.
30PLL0PLL Control Input 0. PLL0 is reserved for factory testing only and must always be connected to GND.
31PLL1PLL Control Input 1. See Table 1 for details.
32PLL2PLL Control Input 2. See Table 1 for details.
33PLL3PLL Control Input 3. See Table 1 for details.
34, 37, 40,
43, 46, 49,
52
35OUT3NChannel 3 Negative LVDS/SLVS Output
36OUT3PChannel 3 Positive LVDS/SLVS Output
38OUT2NChannel 2 Negative LVDS/SLVS Output
39OUT2PChannel 2 Positive LVDS/SLVS Output
41FRAMEN
42FRAMEP
44CLKOUTNNegative LVDS/SLVS Serial Clock Output
45CLKOUTPPositive LVDS/SLVS Serial Clock Output
47OUT1NChannel 1 Negative LVDS/SLVS Output
48OUT1PChannel 1 Positive LVDS/SLVS Output
50OUT0NChannel 0 Negative LVDS/SLVS Output
51OUT0PChannel 0 Positive LVDS/SLVS Output
53PD0
54PD1
55PD2
56PD3
57PDALL
63T/B
OV
DD
Differential Output Signal Format Select Input. Drive SLVS/LVDS high to select SLVS outputs. Drive
SLVS/LVDS low to select LVDS outputs.
Output-Driver Power Input. Connect OVDD to a 1.7V to 1.9V power supply. Bypass each OVDD to
GND with a 0.1µF capacitor as close to the device as possible. Bypass the OV
GND ground plane with a bulk ≥ 2.2µF capacitor as close to the device as possible. Connect all
pins to the same potential.
OV
DD
Negative Frame Alignment LVDS/SLVS Output. A rising edge on the differential FRAME output aligns
to a valid D0 in the output data stream.
Positive Frame Alignment LVDS/SLVS Output. A rising edge on the differential FRAME output aligns to
a valid D0 in the output data stream.
Channel 0 Power-Down Input. Drive PD0 high to power-down channel 0. Drive PD0 low for normal
operation.
Channel 1 Power-Down Input. Drive PD1 high to power-down channel 1. Drive PD1 low for normal
operation.
Channel 2 Power-Down Input. Drive PD2 high to power-down channel 2. Drive PD2 low for normal
operation.
Channel 3 Power-Down Input. Drive PD3 high to power-down channel 3. Drive PD3 low for normal
operation.
Global Power-Down Input. Drive PDALL high to power-down all channels and reference. Drive PDALL
low for normal operation.
Output Format Select Input. Drive T/B high to select binary output format. Drive T/B low to select two’s
complement output format.
power plane to the
DD
64LVDSTEST
LVDS Test Pattern Enable Input. Drive LVDSTEST high to enable the output test pattern
(000010111101 MSB→LSB). As with the analog conversion results, the test pattern data is output
LSB first. Drive LVDSTEST low for normal operation.
MAX1127
Quad, 12-Bit, 65Msps, 1.8V ADC with
Serial LVDS Outputs
Reference Input/Output. For internal reference operation (REFADJ = GND), the reference output
66REFIO
67REFADJ
voltage is 1.24V. For external reference operation (REFADJ = AV
at REFIO. Bypass to GND with a 0.1µF capacitor.
Internal/External Reference Mode Select Input. For internal reference mode, connect REFADJ directly
to GND. For external reference mode, connect REFADJ directly to AVDD. For reference-adjust mode,
see the Full-Scale Range Adjustments Using the Internal Reference section.
), apply a stable reference voltage
DD
—EP
CMOUT
IN0P
IN0N
IN1P
IN1N
IN2P
IN2N
Exposed Paddle. EP is internally connected to GND. Externally connect EP to GND to achieve
specified performance.
REFADJ
REFIO
REFERENCE
SYSTEM
PDALL PD0 PD1 PD2 PD3
POWER CONTROL
ICMV*
T/H
T/H
T/H
12-BIT
PIPELINE
12-BIT
PIPELINE
12-BIT
PIPELINE
ADC
ADC
ADC
AV
DD
MAX1127
SERIALIZER
SERIALIZER
SERIALIZER
OV
12:1
12:1
12:1
DT
DD
SLVS/LVDS
OUTPUT
CONTROL
LVDS/SLVS
OUTPUT
DRIVERS
LVDSTEST
T/B
OUT0P
OUT0N
OUT1P
OUT1N
OUT2P
OUT2N
OUT3P
OUT3N
IN3P
IN3N
CLK
*ICMV = INPUT COMMON-MODE VOLTAGE (INTERNALLY GENERATED)
The MAX1127 ADC features fully differential inputs, a
pipelined architecture, and digital error correction for
high-speed signal conversion. The ADC pipeline architecture moves the samples taken at the inputs through
the pipeline stages every half clock cycle. The converted digital results are serialized and sent through the
LVDS/SLVS output drivers. The total latency from input
to output is 6.5 input clock cycles.
The MAX1127 offers four separate fully differential
channels with synchronized inputs and outputs.
Configure the outputs for binary or two’s complement
with the T/B digital input. Power-down each channel
individually or globally to minimize power consumption.
Input Circuit
Figure 1 displays a simplified functional diagram of the
input T/H circuits. In track mode, switches S1, S2a, S2b,
S4a, S4b, S5a, and S5b are closed. The fully differential
circuits sample the input signals onto the two capacitors
(C2a and C2b) through switches S4a and S4b. S2a and
S2b set the common mode for the operational transcon-
ductance amplifier (OTA), and open simultaneously with
S1, sampling the input waveform. Switches S4a, S4b,
S5a, and S5b are then opened before switches S3a and
S3b connect capacitors C1a and C1b to the output of
the amplifier and switch S4c is closed. The resulting differential voltages are held on capacitors C2a and C2b.
The amplifiers charge capacitors C1a and C1b to the
same values originally held on C2a and C2b. These values are then presented to the first-stage quantizers and
isolate the pipelines from the fast-changing inputs.
Analog inputs IN_P to IN_N are driven differentially. For
differential inputs, balance the input impedance of IN_P
and IN_N for optimum performance.
The MAX1127 analog inputs are self-biased at a common-mode voltage of 0.76V (typ) and allow a differential input voltage swing of 1.4V
P-P
. The common-mode
voltage can be overdriven to between 0.55V to 0.85V.
Drive the analog inputs of the MAX1127 in AC-coupled
configuration to achieve best dynamic performance.
See the Using Transformer Coupling section for a
detailed discussion of this configuration.
Figure 1. Internal Input Circuitry
INTERNAL
COMMON-MODE
BIAS*
SWITCHES SHOWN IN TRACK MODE
INTERNALLY
GENERATED
INTERNAL
BIAS*
COMMON-MODE
LEVEL*
AV
DD
IN_P
IN_N
GND
*NOT EXTERNALLY ACCESSIBLE
S4a
S4b
INTERNAL
COMMON-MODE
BIAS*
MAX1127
C2a
S4cS1
C2b
S2a
S2b
INTERNAL
BIAS*
S5a
C1a
S3a
OUT
OTA
OUT
C1b
S3b
S5b
INTERNALLY
GENERATED
COMMON-MODE
LEVEL*
MAX1127
Quad, 12-Bit, 65Msps, 1.8V ADC with
Serial LVDS Outputs
The MAX1127 provides an internal 1.24V bandgap reference or can be driven with an external reference voltage. The MAX1127 full-scale analog differential input
range is ±FSR. Full-scale range (FSR) is given by the
following equation:
where V
REFIO
is the voltage at REFIO, generated inter-
nally or externally. For a V
REFIO
= 1.24V, the full-scale
input range is ±700mV (1.4V
P-P
).
Internal Reference Mode
Connect REFADJ to GND to use the internal bandgap
reference directly. The internal bandgap reference generates REFIO to be 1.24V with a 100ppm/°C temperature coefficient in internal reference mode. Connect an
external ≥ 0.1µF bypass capacitor from REFIO to GND
for stability. REFIO sources up to 200µA and sinks up
to 200µA for external circuits, and REFIO has a load
regulation of 83mV/mA. The global power-down input
(PDALL) enables and disables the reference circuit.
REFIO has > 1MΩ resistance to GND when the
MAX1127 is in power-down mode. The internal reference circuit requires 132µs to power-up and settle
when power is applied to the MAX1127 or when PDALL
transitions from high to low.
To compensate for gain errors or to decrease or
increase the ADC’s full-scale range (FSR), add an
external resistor between REFADJ and GND or REFADJ
and REFIO. This adjusts the internal reference value of
the MAX1127 by up to ±5% of its nominal value. See
the Full-Scale Range Adjustments Using the InternalReference section.
External Reference Mode
The external reference mode allows for more control
over the MAX1127 reference voltage and allows multiple converters to use a common reference. Connect
REFADJ to AV
DD
to disable the internal reference and
enter external reference mode. Apply a stable 1.18V to
1.30V source at REFIO. Bypass REFIO to GND with a
0.1µF capacitor. The REFIO input impedance is >1MΩ.
Clock Input (CLK)
The MAX1127 accepts a CMOS-compatible clock signal with a wide 20% to 80% input-clock duty cycle.
Drive CLK with an external single-ended clock signal.
Figure 2 shows the simplified clock input diagram.
Low clock jitter is required for the specified SNR performance of the MAX1127. Analog input sampling occurs
on the rising edge of CLK, requiring this edge to provide the lowest possible jitter. Jitter limits the maximum
SNR performance of any ADC according to the following relationship:
where fINrepresents the analog input frequency and t
J
is the total system clock jitter. Clock jitter is especially
critical for undersampling applications. For example,
assuming that clock jitter is the only noise source, to
obtain the specified 69.4dB of SNR with an input frequency of 30.3MHz, the system must have less than
1.8ps of clock jitter. In actuality, there are other noise
sources, such as thermal noise and quantization noise,
that contribute to the system noise requiring the clock
jitter to be less than 0.5ps to obtain the specified
69.4dB of SNR at 30.3MHz.
Figure 2. Clock Input Circuitry
Table 1. PLL1, PLL2, and PLL3 Configuration
*PLL0 is reserved for factory testing and must always be connected to GND.
The MAX1127 features a PLL that generates an output
clock signal with six times the frequency of the input
clock. The output clock signal is used to clock data out
of the MAX1127 (see the System Timing Requirements
section). Set the PLL1, PLL2, and PLL3 bits according
to the input clock range provided in Table 1. PLL0 is
reserved for factory testing and must always be connected to GND.
System Timing Requirements
Figure 3 shows the relationship between the analog
inputs, input clock, frame alignment output, serial clock
output, and serial data output. The differential analog
input (IN_P and IN_N) is sampled on the rising edge of
the CLK signal and the resulting data appears at the
digital outputs 6.5 clock cycles later. Figure 4 provides
a detailed, two-conversion timing diagram of the relationship between the inputs and the outputs.
(V
Figure 3. Global Timing Diagram
Figure 4. Detailed Two-Conversion Timing Diagram
V
(V
CLKOUTP
V
(V
(V
IN_P
V
IN_N
FRAMEP
FRAMEN
CLKOUTN
OUT_P
V
OUT_N
CLK
N
)
-
)*
)
)
t
SAMPLE
N + 1
N + 2
N + 3
N + 4
6.5 CLOCK-CYCLE DATA LATENCY
N + 5
N + 6
N + 7
N + 8
N + 9
OUTPUT
DATA FOR
SAMPLE
N - 6
*DUTY CYCLE VARIES DEPENDING ON INPUT CLOCK FREQUENCY.
The MAX1127 provides a differential clock output that
consists of CLKOUTP and CLKOUTN. As shown in
Figure 4, the serial output data is clocked out of the
MAX1127 on both edges of the clock output. The frequency of the output clock is 6 times the frequency
of CLK.
Frame Alignment Output (FRAMEP, FRAMEN)
The MAX1127 provides a differential frame alignment
signal that consists of FRAMEP and FRAMEN. As shown
in Figure 4, the rising edge of the frame alignment signal corresponds to the first bit (D0) of the 12-bit serial
data stream. The frequency of the frame alignment signal is identical to the frequency of the sample clock.
Serial Output Data (OUT_P, OUT_N)
The MAX1127 provides its conversion results through
individual differential outputs consisting of OUT_P and
OUT_N. The results are valid 6.5 input clock cycles
after the sample is taken. As shown in Figure 3, the output data is clocked out on both edges of the output
clock, LSB (D0) first. Figure 5 provides the detailed serial output timing diagram.
Output Data Format (
T
/B), Transfer Functions
The MAX1127 output data format is either offset binary or
two’s complement, depending on the logic input T/B.
With T/B low, the output data format is two’s complement. With T/B high, the output data format is offset binary. The following equations, Table 2, Figure 6, and Figure
7 define the relationship between the digital output and
the analog input. For two’s complement (T/B = 0):
and for offset binary (T/B = 1):
where CODE
10
is the decimal equivalent of the digital
output code as shown in Table 2. FSR is the full-scale
range as shown in Figures 6 and 7.
Keep the capacitive load on the MAX1127 digital outputs as low as possible.
LVDS and SLVS Signals (SLVS/
LVDS
)
Drive SLVS/LVDS low for LVDS or drive SLVS/LVDS
high for scalable low-voltage signaling (SLVS) levels at
the MAX1127 outputs (OUT_P, OUT_N, CLKOUT_P,
CLKOUT_N, FRAMEP_, and FRAMEN_). For SLVS levels, enable double termination by driving OT high. See
the Electrical Characteristics table for LVDS and SLVS
output voltage levels.
Drive LVDSTEST high to enable the output test pattern
on all LVDS or SLVS output channels. The output test
pattern is 0000 1011 1101 MSB→LSB. As with the analog conversion results, the test pattern data is output
LSB first. Drive LVDSTEST low for normal operation
(test pattern disabled).
Common-Mode Output Voltage (CMOUT)
CMOUT provides a common-mode reference for DCcoupled analog inputs. If the input is DC-coupled,
match the output common-mode voltage of the circuit
driving the MAX1127 to the output voltage at V
CMOUT
to within ±50mV. It is recommended that the output
common-mode voltage of the driving circuit be derived
from CMOUT.
Double Termination (DT)
As shown in Figure 8, the MAX1127 offers an optional,
internal 100Ω termination between the differential output
pairs (OUT_P and OUT_N, CLKOUTP and CLKOUTN,
FRAMEP and FRAMEN). In addition to the termination
at the end of the line, a second termination directly at
the outputs helps eliminate unwanted reflections down
the line. This feature is useful in applications where
trace lengths are long (> 5in) or with mismatched
impedance. Drive DT high to select double termination,
or drive DT low to disconnect the internal termination
resistor (single termination). Selecting double termination increases the OVDDsupply current (see the
Electrical Characteristics table).
Power-Down Modes
The MAX1127 offers two types of power-down inputs,
PD0–PD3 and PDALL. The power-down modes allow
the MAX1127 to use power efficiently by transitioning to
a low-power state when conversions are not required.
Figure 6. Bipolar Transfer Function with Two’s Complement
Output Code (
T
/B = 0)
Figure 7. Bipolar Transfer Function with Offset Binary Output
Code (
T
/B = 1)
Figure 8. Double Termination
2 x FSR
1 LSB =
4096
0x7FF
0x7FE
0x7FD
0x001
0x000
0xFFF
0x803
0x802
0x801
TWO'S COMPLEMENT OUTPUT CODE (LSB)
0x800
-2045+2047+2045-1 0 +1-2047
DIFFERENTIAL INPUT VOLTAGE (LSB)
FSR = 700mV x
FSRFSR
V
REFIO
1.24V
Z
0
= 50Ω
V
REFIO
1.24V
2 x FSR
1 LSB =
4096
0xFFF
0xFFE
0xFFD
0x801
0x800
0x7FF
0x003
0x002
OFFSET BINARY OUTPUT CODE (LSB)
0x800
0x000
-2045+2047+2045-1 0 +1-2047
DIFFERENTIAL INPUT VOLTAGE (LSB)
DT
OUT_P/
CLKOUTP/
FRAMEP
FSR = 700mV x
FSRFSR
100Ω100Ω
= 50Ω
Z
OUT_N/
MAX1127
SWITCHES ARE CLOSED WHEN DT IS HIGH.
SWITCHES ARE OPEN WHEN DT IS LOW.
CLKOUTN/
FRAMEN
0
MAX1127
Quad, 12-Bit, 65Msps, 1.8V ADC with
Serial LVDS Outputs
PD0–PD3 control the power-down mode of each channel independently. Drive a power-down input high to
power down its corresponding input channel. For example, to power down channel 1, drive PD1 high. Drive a
power-down input low to place the corresponding input
channel in normal operation. The differential output
impedance of a powered-down output channel is
approximately 378Ω, when DT is low. The output impedance of OUT_P, with respect to OUT_N, is 100Ω when
DT is high. See the Electrical Characteristics table for
typical supply currents with powered-down channels.
The state of the internal reference is independent of the
PD0–PD3 inputs. To power down the internal reference
circuitry, drive PDALL high (see the Global Power-Down (PDALL) section).
Global Power-Down (PDALL)
PDALL controls the power-down mode of all channels
and the internal reference circuitry. Drive PDALL high to
enable global power-down. In global power-down mode,
the output impedance of all the LVDS/SLVS outputs is
approximately 378Ω, if DT is low. The output impedance
of the differential LVDS/SLVS outputs is 100Ω when DT is
high. See the Electrical Characteristics table for typical
supply currents with global power-down. The following list
shows the state of the analog inputs and digital outputs in
global power-down mode:
• IN_P, IN_N analog inputs are disconnected from the
internal input amplifier.
• REFIO has > 1MΩ resistance to GND.
• OUT_P, OUT_N, CLKOUTP, CLKOUTN, FRAMEP,
and FRAMEN have approximately 378Ω between the
output pairs when DT is low. When DT is high, the differential output pairs have 100Ω between each pair.
When operating from the internal reference, the wakeup time from global power-down is typically 132µs.
When using an external reference, the wake-up time is
dependent on the external reference drivers.
Applications Information
Full-Scale Range Adjustments Using the
Internal Reference
The MAX1127 supports a full-scale adjustment range of
10% (±5%). To decrease the full-scale range, add a
25kΩ to 250kΩ external resistor or potentiometer
(R
ADJ
) between REFADJ and GND. To increase the full-
scale range, add a 25kΩ to 250kΩ resistor between
REFADJ and REFIO. Figure 9 shows the two possible
configurations.
The following equations provide the relationship between
R
ADJ
and the change in the analog full-scale range:
for R
ADJ
connected between REFADJ and REFIO, and
for R
ADJ
connected between REFADJ and GND.
Figure 9. Circuit Suggestions to Adjust the ADC’s Full-Scale
Range
An RF transformer (Figure 10) provides an excellent
solution to convert a single-ended input source signal
to a fully differential signal, required by the MAX1127
for optimum performance. The MAX1127 input common-mode voltage is internally biased to 0.76V (typ)
with f
CLK
= 65MHz. Although a 1:1 transformer is
shown, a step-up transformer can be selected to
reduce the drive requirements. A reduced signal swing
from the input driver, such as an op amp, can also
improve the overall distortion.
Grounding, Bypassing, and Board Layout
The MAX1127 requires high-speed board layout design
techniques. Refer to the MAX1127 EV kit data sheet for
a board layout reference. Locate all bypass capacitors
as close to the device as possible, preferably on the
same side as the ADC, using surface-mount devices
for minimum inductance. Bypass AVDDto GND with a
0.1µF ceramic capacitor in parallel with a ≥ 2.2µF
ceramic capacitor. Bypass OVDDto GND with a 0.1µF
ceramic capacitor in parallel with a ≥ 2.2µF ceramic
capacitor. Bypass CVDDto GND with a 0.1µF ceramic
capacitor in parallel with a ≥ 2.2µF ceramic capacitor.
Multilayer boards with ample ground and power planes
produce the highest level of signal integrity. Connect
MAX1127 ground pins and the exposed backside paddle to the same ground plane. The MAX1127 relies on
the exposed backside paddle connection for a low-
inductance ground connection. Isolate the ground
plane from any noisy digital system ground planes.
Route high-speed digital signal traces away from the
sensitive analog traces. Keep all signal lines short and
free of 90° turns.
Ensure that the differential analog input network layout
is symmetric and that all parasitics are balanced equally. Refer to the MAX1127 EV kit data sheet for an example of symmetric input layout.
Parameter Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. For the
MAX1127, this straight line is between the end points of
the transfer function, once offset and gain errors have
been nullified. INL deviations are measured at every
step and the worst-case deviation is reported in the
Electrical Characteristics table.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an
actual step width and the ideal value of 1 LSB. A DNL
error specification of less than 1 LSB guarantees no
missing codes and a monotonic transfer function. For
the MAX1127, DNL deviations are measured at every
step and the worst-case deviation is reported in the
Electrical Characteristics table.
Offset Error
Offset error is a figure of merit that indicates how well
the actual transfer function matches the ideal transfer
function at a single point. For the MAX1127, the ideal
midscale digital output transition occurs when there is
-1/2 LSB across the analog inputs (Figures 6 and 7).
Bipolar offset error is the amount of deviation between
the measured midscale transition point and the ideal
midscale transition point.
Gain Error
Gain error is a figure of merit that indicates how well the
slope of the actual transfer function matches the slope
of the ideal transfer function. For the MAX1127, the gain
error is the difference of the measured full-scale and
zero-scale transition points minus the difference of the
ideal full-scale and zero-scale transition points.
Figure 10. Transformer-Coupled Input Drive
10
0.1µF
1
V
IN
2
N.C.
3
MINICIRCUITS
T1
ADT1-1WT
6
5
4
Ω
39pF
0.1µF
10
Ω
39pF
IN_P
MAX1127
IN_N
MAX1127
Quad, 12-Bit, 65Msps, 1.8V ADC with
Serial LVDS Outputs
For the bipolar devices (MAX1127), the full-scale transition point is from 0x7FE to 0x7FF for two’s complement
output format (0xFFE to 0xFFF for offset binary) and the
zero-scale transition point is from 0x800 to 0x801 for
two’s complement (0x000 to 0x001 for offset binary).
Crosstalk
Crosstalk indicates how well each analog input is isolated from the others. For the MAX1127, a 5.3MHz,
-0.5dBFS analog signal is applied to one channel while
a 30.3MHz, -0.5dBFS analog signal is applied to all
other channels. An FFT is taken on the channel with the
5.3MHz analog signal. From this FFT, the crosstalk is
measured as the difference in the 5.3MHz and
30.3MHz amplitudes.
Aperture Delay
Aperture delay (tAD) is the time defined between the
rising edge of the sampling clock and the instant when
an actual sample is taken. See Figure 11.
Aperture Jitter
Aperture jitter (tAJ) is the sample-to-sample variation in
the aperture delay. See Figure 11.
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantization error only and results directly from the ADC’s resolution (N bits):
SNR
dB[max]
= 6.02dBx N x 1.76
dB
In reality, there are other noise sources besides quantization noise: thermal noise, reference noise, clock jitter, etc.
For the MAX1127, SNR is computed by taking the ratio
of the RMS signal to the RMS noise. RMS noise
includes all spectral components to the Nyquist frequency excluding the fundamental, the first six harmonics (HD2–HD7), and the DC offset.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS signal to the RMS noise plus distortion. RMS noise plus
distortion includes all spectral components to the
Nyquist frequency, excluding the fundamental and the
DC offset.
Effective Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC
at a specific input frequency and sampling rate. An
ideal ADC’s error consists of quantization noise only.
ENOB for a full-scale sinusoidal input waveform is
computed from:
Total Harmonic Distortion (THD)
THD is the ratio of the RMS sum of the first six harmonics of the input signal to the fundamental itself. This is
expressed as:
Figure 11. Aperture Jitter/Delay Specifications
THD
CLK
ANALOG
INPUT
SAMPLED
DATA
T/H
HOLDTRACKHOLD
ENOB
⎡
⎢
log
=×
20
⎢
⎢
⎣
t
AD
t
AJ
⎛
SINAD=−
⎜
602..
⎝
VVVVVV
+++++
22324
⎞
176
⎟
⎠
2526272
V
1
⎤
⎥
⎥
⎥
⎦
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio expressed in decibels of the RMS
amplitude of the fundamental (maximum signal component) to the RMS value of the next-largest spurious
component, excluding DC offset. SFDR is specified in
decibels relative to the carrier (dBc).
Intermodulation Distortion (IMD)
IMD is the total power of the IM2 to IM5 intermodulation
products to the Nyquist frequency relative to the total
input power of the two input tones, f1 and f2. The individual input tone levels are at -6.5dBFS. The intermodulation products are as follows:
• 2nd-order intermodulation products (IM2): f1 + f2,
f2 - f1
• 3rd-order intermodulation products (IM3): 2 x f1 - f2,
2 x f2 - f1, 2 x f1 + f2, 2 x f2 + f1
• 4th-order intermodulation products (IM4): 3 x f1 - f2,
3 x f2 - f1, 3 x f1 + f2, 3 x f2 + f1
• 5th-order intermodulation products (IM5): 3 x f1 - 2 x
f2, 3 x f2 - 2 x f1, 3 x f1 + 2 x f2, 3 x f2 + 2 x f1
Third-Order Intermodulation (IM3)
IM3 is the total power of the 3rd-order intermodulation
product to the Nyquist frequency relative to the total
input power of the two input tones f1 and f2. The individual input tone levels are at -6.5dBFS. The 3rd-order
intermodulation products are 2 x f1 - f2, 2 x f2 - f1, 2 x
f1 + f2, 2 x f2 + f1.
Small-Signal Bandwidth
A small -20dBFS analog input signal is applied to an
ADC so the signal’s slew rate does not limit the ADC’s
performance. The input frequency is then swept up to
the point where the amplitude of the digitized conversion result has decreased by -3dB.
Full-Power Bandwidth
A large -0.5dBFS analog input signal is applied to an
ADC, and the input frequency is swept up to the point
where the amplitude of the digitized conversion result
has decreased by -3dB. This point is defined as fullpower input bandwidth frequency.
Gain Matching
Gain matching is a figure of merit that indicates how
well the gain of all four ADC channels is matched to
each other. For the MAX1127, gain matching is measured by applying the same 30.3MHz, -0.5dBFS analog
signal to all analog input channels. These analog inputs
are sampled at 65MHz and the maximum deviation in
amplitude is reported in dB as gain matching in the
Electrical Characteristics table.
Phase Matching
Phase matching is a figure of merit that indicates how
well the phase of all four ADC channels is matched to
each other. For the MAX1127, phase matching is measured by applying the same 30.3MHz, -0.5dBFS analog
signal to all analog input channels. These analog inputs
are sampled at 65MHz and the maximum deviation in
phase is reported in degrees as phase matching in the
Electrical Characteristics table.
Quad, 12-Bit, 65Msps, 1.8V ADC with
Serial LVDS Outputs
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
26 ____________________Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600
(The package drawing(s) in this data sheet may not reflect the most current specifications. For the latest package outline information,
go to www.maxim-ic.com/packages
.)
Note: For the MAX1127 Exposed Pad Variation,
the package code is G6800-4.
68L QFN.EPS
PACKAGE OUTLINE, 68L QFN, 10x10x0.9 MM
21-0122
PACKAGE OUTLINE, 68L QFN, 10x10x0.9 MM
21-0122
C
C
1
2
1
2
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