I/O Voltage to GND -0.5V, +6V
I/O Sink Current 20mA
Operating Temperature Range -40°C to +85°C
Junction Temperature +150°C
Storage Temperature Range -40°C to +85°C
Soldering Temperature See IPC/JEDEC J-STD-020A
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is
not implied. Exposure to the absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(V
= 2.8V to 5.25V, T
PUP
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
I/O PIN GENERAL DATA
1-Wire Pullup Resistance
Input Capacitance CIO (Notes 3, 4) 100 800 pF
Input Load Current I
High-to-Low Switching
Threshold
Input Low Voltage V
Low-to-High Switching
Threshold
Switching Hysteresis V
Output Low Voltage V
Recovery Time
(Notes 1,11)
Rising-Edge Hold-off Time t
Timeslot Duration (Note 1) t
I/O PIN, 1-WIRE RESET, PRESENCE DETECT CYCLE
Reset Low Time (Note 1) t
Presence Detect High
Time
Presence Detect Fall Time
(Notes 4, 14)
Presence Detect Low
Time
Presence Detect Sample
Time (Note 1)
= -40°C to +85°C.)
A
R
PUP
L
V
TL
IL
V
TH
HY
OL
t
REC
REH
SLOT
RSTL
t
PDH
t
FPD
t
PDL
t
MSP
(Notes 1, 2)
I/O pin at V
0.05 2.2 µA
PUP
0.3 2.2
kΩ
(Notes 4, 5, 6) 0.46 4.4 V
(Notes 1, 7) 0.3 V
(Notes 4, 5, 8) 1.0 4.9 V
(Notes 4, 5, 9) 0.21 1.70 V
At 4mA (Note 10) 0.4 V
Standard speed, R
Overdrive speed, R
PUP
PUP
= 2.2kΩ
= 2.2kΩ
Overdrive speed, directly prior to reset
pulse; R
PUP
= 2.2kΩ
Standard speed (Note 12) 0.5 5.0
Overdrive speed Not applicable (0)
Standard speed 65
Overdrive speed (Note 13) 9
5
2
5
µs
µs
µs
Standard speed, V
Standard speed (Note 12) 504 640
Overdrive speed, V
Overdrive speed (Note 13)
Standard speed, V
Standard speed (Note 13) 15 63
Overdrive speed (Note 13) 2
Standard speed, V
Standard speed 1.1 7
> 4.5V 480 640
PUP
> 4.5V 48 80
PUP
53 80
> 4.5V 15 60
PUP
> 4.5V 1.1 3.75
PUP
µs
µs
7
µs
Overdrive speed 1.1
Standard speed 60 240
Overdrive speed, V
Overdrive speed (Note 13) 8
Standard speed, V
> 4.5V 8 24
PUP
> 4.5V 64 75
PUP
26
Standard speed 70 75
µs
µs
Overdrive speed 8.1 10
2 of 24
DS2431: 1024 位 1-Wire EEPROM
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
I/O PIN, 1-Wire WRITE
Write-0 Low Time (Note 1) t
Write-1 Low Time
(Notes 1, 15)
I/O PIN, 1-Wire READ
Read Low Time
(Notes 1, 16)
Read Sample Time
(Notes 1, 16)
EEPROM
Programming Current I
Programming Time t
(Endurance)
W0L
t
W1L
t
RL
t
MSR
PROG
PROG
N
CY
Standard speed 60 120
Overdrive speed (Note 13) 7 16
Standard speed 5
Overdrive speed 1
Standard speed 5
Overdrive speed 1
Standard speed
Overdrive speed
(Note 17) 1 mA
(Note 18) 12.5 ms
At 25°C 200k Write/Erase Cycles
At 85°C (worst case) 50k
µs
15 - ε
2 - ε
µs
15 - δ
2 - δ
t
+ δ
RL
t
+ δ
RL
15
2
µs
µs
---
Data Retention tDR At 85°C (worst case) 10 years
Note 1: System requirement.
Note 2: Maximum allowable pullup resistance is a function of the number of 1-Wire devices in the system and 1-Wire recovery times. The
Note 3:
Note 4: Guaranteed by design, simulation only. Not production tested.
Note 5: V
Note 6: Voltage below which, during a falling edge on I/O, a logic 0 is detected.
Note 7: The voltage on I/O needs to be less or equal to V
Note 8: Voltage above which, during a rising edge on I/O, a logic 1 is detected.
Note 9: After V
Note 10: The I-V characteristic is linear for voltages less than 1V.
Note 11: Applies to a single DS2431 attached to a 1-Wire line.
Note 12: The earliest recognition of a negative edge is possible at t
Note 13: Highlighted numbers are NOT in compliance with legacy 1-Wire product standards. See comparison table below.
Note 14: Interval during the negative edge on I/O at the beginning of a Presence Detect pulse between the time at which the voltage is
Note 15:
Note 16:
Note 17: Current drawn from I/O during the EEPROM programming interval. The pullup circuit on I/O during the programming interval
Note 18: Interval begins t
LEGACY VALUES DS2431 VALUES
MIN MAX MIN MAX MIN MAX MIN MAX
t
SLOT
t
RSTL
t
PDH
t
PDL
t
W0L
1)
Intentional change, longer recovery time requirement due to modified 1-Wire front end.
specified value here applies to systems with only one device and with the minimum 1-Wire recovery times. For more heavily
loaded systems, an active pullup such as that found in the DS2482-x00, DS2480B, or DS2490 may be required.
Capacitance on the data pin could be 800pF when V
after V
80% of V
ε represents the time required for the pullup circuitry to pull the voltage on I/O up from V
δ represents the time required for the pullup circuitry to pull the voltage on I/O up from V
master.
should be such that the voltage at I/O is greater than or equal to Vpup(min). If Vpup in the system is close to Vpup(min) then a
low impedance bypass of Rpup which can be activated during programming may need to be added.
sequence. Interval ends once the device's self-timed EEPROM programming cycle is complete and the current drawn by the
device has returned from I
has been applied the parasite capacitance will not affect normal communications.
PUP
, VTH, and V
TL
TH
are a function of the internal supply voltage.
HY
is crossed during a rising edge on I/O, the voltage on I/O has to drop by at least VHY to be detected as logic '0'.
and the time at which the voltage is 20% of V
PUP
after the leading negative edge on IO for the last timeslot of the E/S byte for a valid Copy Scratchpad
WiLMIN
to IL.
PROG
is first applied. If a 2.2kΩ resistor is used to pull up the data line, 2.5µs
PUP
whenever the master drives the line low.
ILMAX
after VTH has been previously reached.
REH
.
PUP
to VTH.
IL
to the input high threshold of the bus
IL
PARAMETER STANDARD SPEED OVERDRIVE SPEEDSTANDARD SPEED OVERDRIVE SPEED