M A COM MRF177 Datasheet

SEMICONDUCTOR TECHNICAL DATA
The RF MOSFET Line
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by MRF177/D
RF Power Field Effect Transistors
N–Channel Enhancement Mode MOSFET
Designed for broadband commercial and military applications up to 400 MHz frequency range. Primarily used as a driver or output amplifier in push–pull configurations. Can be used in manual gain control, ALC and modulation circuits.
Output Power — 100 W Gain — 12 dB Efficiency — 60%
Low Thermal Resistance
Low C
— 10 pF Typ @ VDS = 28 Volts
rss
Ruggedness Tested at Rated Output Power
Nitride Passivated Die for Enhanced Reliability
Excellent Thermal Stability; Suited for Class A
Operation
6
5, 8
7
2
1, 4
3
MRF177
100 W, 28 V, 400 MHz
N–CHANNEL
BROADBAND
RF POWER MOSFET
CASE 744A–01, STYLE 2
MAXIMUM RATINGS
Rating Symbol Value Unit
Drain–Source Voltage V Drain–Gate Voltage (RGS = 1.0 MΩ) V Gate–Source Voltage V Drain Current — Continuous I Total Device Dissipation @ TC = 25°C (1)
Derate above 25°C Storage Temperature Range T Operating Temperature Range T
DSS
DGR
GS
D
P
D
stg
J
THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
Thermal Resistance, Junction–to–Case R
(1) Total device dissipation rating applies only when the device is operated as an RF push–pull amplifier.
NOTE — CAUTION packaging MOS devices should be observed.
— MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
θJC
65 Vdc 65 Vdc
±40 Vdc
16 Adc
270
1.54
–65 to +150 °C
200 °C
0.65 °C/W
Watts
W/°C
REV 9
1
ELECTRICAL CHARACTERISTICS (T
Characteristic (1) Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage
(VGS = 0, ID = 50 mA)
Zero Gate Voltage Drain Current
(VDS = 28 V, VGS = 0)
Gate–Source Leakage Current
(VGS = 20 V, VDS = 0)
ON CHARACTERISTICS (1)
Gate Threshold Voltage
(VDS = 10 V, ID = 50 mA)
Drain–Source On–Voltage
(VGS = 10 V, ID = 3.0 A)
Forward Transconductance
(VDS = 10 V, ID = 2.0 A)
DYNAMIC CHARACTERISTICS (1)
Input Capacitance
(VDS = 28 V, VGS = 0, f = 1.0 MHz)
Output Capacitance
(VDS = 28 V, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance
(VDS = 28 V, VGS = 0, f = 1.0 MHz)
= 25°C unless otherwise noted)
C
V
(BR)DSS
I
DSS
I
GSS
V
GS(th)
V
DS(on)
g
fs
C
iss
C
oss
C
rss
65 Vdc
2.0 mAdc
1.0 µAdc
1.0 3.0 6.0 Vdc
1.4 Vdc
1.8 2.2 mhos
100 pF
105 pF
10 pF
FUNCTIONAL CHARACTERISTICS (Figure 8) (2)
Common Source Power Gain
(VDD = 28 Vdc, P
Drain Efficiency
(VDD = 28 Vdc, P
Electrical Ruggedness
(VDD = 28 Vdc, P Load VSWR = 30:1, All Phase Angles At Frequency of Test)
(1) Note each transistor chip measured separately (2) Both transistor chips operating in push–pull amplifier
= 100 W, f = 400 MHz, IDQ = 200 mA)
out
= 100 W, f = 400 MHz, IDQ = 200 mA)
out
= 100 W, f = 400 MHz, IDQ = 200 mA,
out
G
PS
η 55 60 %
ψ No Degradation
10 12 dB
in Output Power
Before & After Test
REV 9
2
TYPICAL CHARACTERISTICS
140
f = 150 MHz
120
100
80
60 40
out
P , OUTPUT POWER (WATTS)
20
0
024 8106
225 MHz
400 MHz
Pin, INPUT POWER (WA TTS)
Figure 1. Output Power versus Input Power
140
120
100
80
60 40
out
P , OUTPUT POWER (WATTS)
20
0
10 12 14 18 20 22 26 2816 24
IDQ = 200 mA f = 400 MHz
VDD, SUPPLY VOLTAGE (VOLTS)
VDD = 28 V IDQ = 200 mA
Pin = 10 W
6.3 W
4 W
50
40
30
20
10
out
P , OUTPUT POWER (WATTS)
0
02 68104
f = 225 MHz
400 MHz
VDD = 13.5 V IDQ = 200 mA
Pin, INPUT POWER (WA TTS)
Figure 2. Output Power versus Input Power
100
f = 400 MHz VDS = 28 V
90
Pin = CONSTANT IDQ = 200 mA
80 70 60 50 40 30 20
out
P , OUTPUT POWER (WATTS)
10
30
0
–5 –4 –3 –1 0 1 3 5–2 2 4
VGS, GATE–SOURCE VOLT AGE (VOLTS)
REV 9
3
Figure 3. Output Power versus Supply Voltage
420
360
300
240
180
, CAPACITANCE (pF)
120
oss
C
60
0
04812162024
VDS, DRAIN–SOURCE VOLTAGE (VOLTS)
C
rss
C
iss
VGS = 0 V f = 1 MHz
C
oss
Figure 5. Capacitance versus Drain V oltage
28
140
120
100
80
60
40
20
0
, CAPACITANCE (pF)
iss
, C
rss
C
Figure 4. Output Power versus Gate Voltage
100
20 10
4 2 1
D
I , DRAIN CURRENT (AMPS)
0.4
0.2
0.1 124 106 20 40 10060
TC = 25° C
VDS, DRAIN–SOURCE VOLTAGE (VOLTS)
Figure 6. DC Safe Operating Area
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