LSI/CSI
U
L
®
A3800
LSI Computer Systems, Inc. 1235 Walt Whitman Road, Melville, NY 11747 (631) 271-0400 FAX (631) 271-0405
LS7030
8 DECADE MULTIPLEXED COUNTER
FEATURES:
• DC to 7.5 MHz Count Frequency
• Multiplexed BCD and 7 Segment Outputs
• DC to 500 kHz Scan Frequency
• +4.75V to +15V Operation (VDD-VSS)
• Compatible with CMOS Logic
• High Input Noise Immunity
• Counter Output Latches
• Leading Zero Blanking
• Low Power Dissipation
• All inputs protected
• 40 Pin DIP- See Figure 1
DESCRIPTION:
The LS7030 is a monolithic, ion implanted MOS Silicon Gate, 8
decade up counter. The circuit includes latches, multiplexer,
leading zero blanking and 7 segment data outputs.
8 DECADE UP COUNTER
The eight decade ripple through counter increments on the negative edge of the input count pulse. Maximum ripple time is 12µs
(99999999 to 00000000). Maximum count frequency is 7.5MHz.
RESET
All decades are reset to zero when Reset input is brought low for
a minimum of 4µs. The Overflow flip-flop is reset at the same
time. Reset must be high for a minimum of 1µs before next valid
count can be recorded.
SCAN RESET INPUT
MSD STROBE 8
DIGIT
STROBE
OUTPUTS
LSD STROBE 1
DECIMAL POINT INPUT
BLANK OUTPUT
OVERFLOW OUTPUT
OVERFLOW INPUT
DECADE 6 OUTPUT, D8
DECADE 7 OUTPUT, D7
DECADE 6 OUTPUT, D6
BCD
DATA
OUTPUTS
STROBE 7
STROBE 6
STROBE 5
STROBE 4
STROBE 3
STROBE 2
B8
B4
B2
B1
CONNECTION DIAGRAM - TOP VIEW
LSI
1
2
3
4
5
6
7
8
LS7030
9
10
11
12
13
14
15
16
17
18
19
20
40
OSC. INPUT
SCAN INPUT
39
38
LAMP TEST INPUT
37
a
36
N.C.
35
c
34
33
COUNT INPUT
32
31
30
29
28
TEST COUNT INPUT, DIGITS 3 - 8
27
VSS
26
VGG
25
N.C.
24
N.C.
23
VDD
RESET COUNTER INPUT
22
LOAD LATCH INPUT
21
December 2002
SEGMENT
OUTPUTS
SEGMENT
OUTPUTS
LATCHES
Contents of counter are transferred to latches when LOAD signal
is brought low for a minimum of 4µs and kept low until a minimum
of 12µs has elapsed from previous negative edge of count pulse
(ripple time). Storage of valid data occurs when LOAD signal is
high for a minimum of 1µs before next negative edge of count
pulse or reset. Data is transferred for Overflow flip-flop to Overflow latch at the same time.
SCAN OSCILLATOR AND COUNTER
The scan counter is driven by an internal oscillator whose frequency is determined by a capacitor connected between Oscillator input and Scan input. An external scan clock applied to
Scan input can also drive the scan counter. Scan counter advances on negative edge of scan clock.
The counter scans from MSD to LSD. When Scan Reset input is
brought high the scan counter is forced to MSD state. Internal
synchonization guarantees proper scanning no matter when Scan
Reset is brought low relative to scan clock. Maximum scan
frequency is 500kHz.
DECIMAL POINT
A high at the Decimal Point input resets the Blanking flip-flop
causing the display to unblank. Decimal Point should be brought
high at start of digit time which has active Decimal Point.
7030-121102-1
FIGURE 1
DIGIT STROBES
Timing of Digit Strobes is arranged such that both edges of strobe
are guardbanded by a minimum 400ns within valid BCD data when
scan frequency is 100kHz or less. The guardband is a minimum of
200ns at 250kHz scan frequency. At 500kHz only negative edge of
Strobe is guaranteed to be within valid BCD data by a minimum
200ns.
OVERFLOW
The Overflow flip-flop sets on the first negative transition of the Overflow Input and remains set until Reset is brought low. Data is transferred from Overflow flip-flop to Overflow Latch when Load is brought
low. A high at the Overflow Latch causes display to unblank. Overflow Output is output of Overflow Latch. MSB outputs of Decades
6, 7, 8 are available for use as Overflow Input.
BLANKING
Leading zero blanking is employed. At start of each MSD to LSD
scan, display is blanked until a nonzero digit or active decimal point is
encountered. Displaly unblanks during LSD time and for a whole
scan when Overflow output is high. When Scan Reset is applied, display blanks to prevent display damage.
Blanking information is available at Blank output and is incorporated
into 7 segment information.
BCD and 7 SEGMENT DATA
Data is available in BCD and 7 segment format. BCD data can be
demultiplexed using Digit Strobes as latch enable signals.
POWER SUPPLIES
+4.75 Volts to +15 Volts single power supply operation is obtained
when VGG and VDD are tied together. Inputs and outputs are
CMOS compatible and Minimum Input Noise Immunity of 25% of
power supply is guaranteed except for Test Count Input. (Inputs
are TTL compatible at +4.75V to +5.25V operation.)
MAXIMUM RATINGS
PARAMETER SYMBOL VALUE UNITS
Storage Temperature Tstg -65 to +150 °C
Operating Temperature TA -25 to +70 °C
Voltage (any pin to Vss) Vmax -30 to +0.5 V
DC ELECTRICAL CHARACTERISTICS
(VDD = VGG= OV, Vss = +4.75 to +15V, -25°C ≤ TA ≥ +70°C unless otherwise specified.)
PARAMETER SYMBOL MIN MAX UNITS
Operating Supply Current Idds - 15 mA
(fC = 7.5MHz)
Input Noise Immunity
Low and High Vni 25% - V
Test Count Input Vil Vss - 20 Vss - 3.95 V
Vih Vss - 1.0 Vss V
D6, D7, D8
OF, BCD
Blank
(See Note 1)
Segment
and
Strobe
Outputs
(See Note 2)
Output Voltage “0" Vol - +0.2 V
{
Output Voltage “1" Voh Vss - 1.0 - V
Output Voltage “0"
(sinking 10µA) Vol - +0.5 V
Output Voltage “1"
Vss = 4.75 (Voh = Vss - 0.5V) - 0.05 - mA
(Voh = Vss - 1V) - 0.25 - mA
(Voh = Vss - 4V) - 0.90 - mA
Vss = 10V (Voh = Vss - 2V) - 2.0 - mA
(Voh = Vss - 3V) - 3.0 - mA
Vss = 15V (Voh = Vss - 2V) - 3.0 - mA
(Voh = Vss - 3V) - 4.5 - mA
With VGG at -12V, VDD at OV and Vss at +5V, all inputs are TTL
and CMOS compatible. All outputs are CMOS compatible and
BCD and BLANK outputs also provide standard TTL compatibility. In addition, Overflow Output is low power TTL compatible.
In either mode outputs swing between VDD and Vss.
(Vss-VDD)
SCAN OSCILLATOR
7030-110201-2
NOTE 1: Current Sink = Same as segment and strobe outputs.
Current Source = N/A at Voh = Vss -.5V for Vss = +4.75V
35µA at Voh = Vss -1V for Vss = +4.75V
40% of segment and strobe outputs at all other specified operating points.
NOTE 2: Limit segment current to 4.5mA maximum.
Limit strobe current to 6mA maximum.
The following inputs have internal pull down resistors to VDD with maximum sink current of 5µA at Vss input.
Scan Reset Test Count Count
Decimal Point Overflow Lamp Test
CAPACITANCE TYPICAL OSCILLATOR FREQUENCY
4.75V 10V 15V
50pF 40.0 kHz 24.2kHz 22.2 kHz
100pF 22.2 kHz 14.8kHz 13.8 kHz
470pF 5.0 kHz 3.6kHz 3.5 kHz
750pF 3.3 kHz 2.4kHz 2.2 kHz
2000pF 1.3 kHz 0.91kHz 0.85 kHz