The LMA1010 and LMA2010 are
high-speed, low power 16-bit
multiplier-accumulators. The LMA1010
and LMA2010 are functionally identical;
they differ only in packaging. Full military ambient temperature range operation is achieved with advanced CMOS
technology.
The LMA1010 and LMA2010 produce
the 32-bit product of two 16-bit numbers.
The results of a series of multiplications
may be accumulated to form the sum of
products. Accumulation is performed to
35-bit precision with the multiplier product sign extended as appropriate.
Data present at the A and B input registers is latched on the rising edges of
CLK A and CLK B respectively. RND,
LMA1010/2010 BLOCK DIAGRAM
15-0
A
16
CLK A
CLK B
A REGISTERB REGISTER
TC, ACC, and SUB controls are latched
on the rising edge of the logical OR of
CLK A and CLK B. TC specifies the
input as two’s complement
(TC HIGH) or unsigned magnitude
(TC LOW). RND, when HIGH, adds ‘1’
to the most significant bit position of
the least significant half of the product.
Subsequent truncation of the 16 least
significant bits produces a result
correctly rounded to 16-bit precision.
ACC and SUB control accumulator
operation. ACC HIGH results in
addition of the multiplier product and
the accumulator contents, with the result
stored in the accumulator register on the
rising edge of CLK R. ACC and SUB
HIGH results in subtraction of the
accumulator contents from the
multiplier product, with the result stored
B
15-0
R
15-0
16
in the accumulator register. With ACC
LOW and SUB LOW, no accumulation
occurs and the next product is loaded
directly into the accumulator register.
ACC LOW and SUB HIGH is undefined.
RND
TC
ACC
SUB
OEX
OEM
OEL
PREL
CLK RACCUMULATOR
PRELOAD
CONTROL
LOGIC
REGISTER
3
3
OEX
OEM
OEL
LEX
LEM
LEL
35
LEMLELLEX
31616
OEX
3
R
34-32
R
R + A
R – A
PASS R
16
R
31-16
32
OEM
A
35
REGISTER
1
16
OEL
The LMA1010/2010 output register
(accumulator register) is divided into
three independently controlled sections. The least significant result
(LSR) and most significant result
(MSR) registers are 16 bits in length.
The extended result register (XTR) is
3 bits long. The output signals R15-0
and input signals B15-0 share the same
bidirectional pins.
Each output register has an independent output enable control. In addition
to providing three-state control of the
output buffers, when OEX, OEM, or OEL
are HIGH and PREL is HIGH, data can be
preloaded via the bidirectional output
pins into the respective output registers.
Data present on the output pins is
latched on the rising edge of CLK R. The
interrelation of PREL and the enable
controls is summarized in Table 1.
Multiplier-Accumulators
08/16/2000–LDS.10/2010-P
DEVICES INCORPORATED
LMA1010/2010
16 x 16-bit Multiplier-Accumulator
TABLE 1. PRELOAD TRUTH TABLE
PREL OEX OEM OEL XTR MSR LSR
LLLLOUT OUT OUT
LLLHOUT OUTZ
LLHLOUTZOUT
LLHHOUTZZ
LHLLZOUT OUT
LHLHZOUTZ
LHHLZZOUT
PREL= Preload data to appropriate register
OUT = Register available on output pins
Z= High impedance state
FIGURE 1A.INPUT FORMATS
A
IN
Fractional Two’s Complement (TC = 1)
15 14 13210
0
–2
(Sign)
15 14 13210
15
–2
(Sign)
15 14 13210
–12–22–3
2
15 14 13210
15214213
2
2–12
2142
–2
–132–142–15
2
Integer Two’s Complement (TC = 1)
13
22212
Unsigned Fractional (TC = 0)
–142–152–16
2
Unsigned Integer (TC = 0)
22212
B
IN
15 14 13210
–2
(Sign)
0
2–12
–2
–132–142–15
2
15 14 13210
0
15
–2
(Sign)
2142
13
22212
0
15 14 13210
–12–22–3
2
–142–152–16
2
15 14 13210
0
15214213
2
22212
0
FIGURE 1B.OUTPUT FORMATS
XTR
34 33 32
4
–2
(Sign)
34 33 32
34
–2
(Sign)
34 33 32
22120
2
34 33 32
34233232
2
232
2332
2
32
MSRLSR
Fractional Two’s Complement
31 30 2918 17 16
1202–1
2
–122–132–14
2
Integer Two’s Complement
31 30 2918 17 16
31230229
2
2182172
Unsigned Fractional
31 30 2918 17 16
–12–22–3
2
–142–152–16
2
Unsigned Integer
31 30 2918 17 16
31230229
2
2182172
15 14 13210
–152–162–17
2
–282–292–30
2
15 14 13210
16
15214213
2
22212
0
15 14 13210
–172–182–19
2
–302–312–32
2
15 14 13210
16
15214213
2
22212
0
Multiplier-Accumulators
2
08/16/2000–LDS.10/2010-P
DEVICES INCORPORATED
LMA1010/2010
16 x 16-bit Multiplier-Accumulator
MAXIMUM RATINGS
Storage temperature ........................................................................................................... –65°C to +150°C
Operating ambient temperature........................................................................................... –55°C to +125°C
VCC supply voltage with respect to ground............................................................................ –0.5 V to +7.0V
Input signal with respect to ground ........................................................................................ –3.0 V to +7.0 V
Signal applied to high impedance output ............................................................................... –3.0 V to +7.0 V
Output current into low outputs............................................................................................................. 25 mA
Latchup current ............................................................................................................................... > 400 mA
OPERATING CONDITIONS
Active Operation, Commercial 0°C to +70°C4.75 V ≤VCC≤ 5.25V
Active Operation, Military –55°C to +125°C4.50 V ≤VCC≤ 5.50 V
ELECTRICAL CHARACTERISTICS
Above which useful life may be impaired (Notes 1, 2, 3, 8)
To meet specified electrical and switching characteristics
1. Maximum Ratings indicate stress
specifications only. Functional operation of these products at values beyond
those indicated in the Operating Conditions table is not implied. Exposure to
maximum rating conditions for extended periods may affect reliability.
2. The products described by this specification include internal circuitry designed to protect the chip from damaging substrate injection currents and accumulations of static charge. Nevertheless, conventional precautions should
be observed during storage, handling,
and use of these circuits in order to
avoid exposure to excessive electrical
stress values.
3. This device provides hard clamping of
transient undershoot and overshoot. Input levels below ground or above VCC
will be clamped beginning at –0.6 V and
VCC + 0.6 V. The device can withstand
indefinite operation with inputs in the
range of –0.5 V to +7.0 V. Device operation will not be adversely affected, however, input current levels will be well in
excess of 100 mA.
9. AC specifications are tested with
input transition times less than 3 ns,
output reference levels of 1.5 V (except
tDIS test), and input levels of nominally
0 to 3.0 V. Output loading may be a
resistive divider which provides for
specified IOH and IOL at an output
voltage of VOHmin and VOL max
respectively. Alternatively, a diode
bridge with upper and lower current
sources of IOH and IOL respectively,
and a balancing voltage of 1.5 V may be
used. Parasitic capacitance is 30 pF
minimum, and may be distributed.
This device has high-speed outputs capable of large instantaneous current
pulses and fast turn-on/turn-off times.
As a result, care must be exercised in the
testing of this device. The following
measures are recommended:
a. A 0.1 µF ceramic capacitor should be
installed between VCCand Ground
leads as close to the Device Under Test
(DUT) as possible. Similar capacitors
should be installed between device VCC
and the tester common, and device
ground and tester common.
11. For the tENA test, the transition is
measured to the 1.5 V crossing point
with datasheet loads. For the tDIS test,
the transition is measured to the
±200mV level from the measured
steady-state output voltage with
±10mA loads. The balancing voltage, VTH, is set at 3.5 V for Z-to-0
and 0-to-Z tests, and set at 0 V for Zto-1 and 1-to-Z tests.
12. These parameters are only tested at
the high temperature extreme, which is
the worst case for leakage current.
FIGURE A. OUTPUT LOADING CIRCUIT
FIGURE B. THRESHOLD LEVELS
4. Actual test conditions may vary from
those designated but operation is guaranteed as specified.
5. Supply current for a given application can be accurately approximated by:
2
NCV F
where
4
N = total number of device outputs
C = capacitive load per output
V = supply voltage
F = clock frequency
6. Tested with all outputs changing every cycle and no load, at a 5 MHz clock
rate.
7. Tested with all inputs within 0.1 V of
VCCor Ground, no load.
8. These parameters are guaranteed
but not 100% tested.
b. Ground and VCCsupply planes
must be brought directly to the DUT
socket or contactor fingers.
c. Input voltages should be adjusted to
compensate for inductive ground and VCC
noise to maintain required DUT input
levels relative to the DUT ground pin.
10. Each parameter is shown as a minimum or maximum value. Input requirements are specified from the point
of view of the external system driving
the chip. Setup time, for example, is
specified as a minimum since the external system must supply at least that
much time to meet the worst-case requirements of all parts. Responses from
the internal circuitry are specified from
the point of view of the device. Output
delay, for example, is specified as a
maximum since worst-case operation of
any device always provides data within
that time.