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The HYS[64/72]D64x20HU-[5/6]-C, HYS[64/72]D32x00HU-[5/6]-C, and HYS64D16x01HU-[5/6]-C are industry
standard 184-Pin Unbuffered Dual-In-Line Memory Modules (Reg DIMM) organized as 16M × 64, 32M × 64 and
64M × 64 for non-parity and 32M × 72 and 64M × 72 for ECC main memory applications. The memory array is
designed with 256Mbit Double Data Rate Synchron ous DRA Ms . A var i ety of d ecoupling capacitors ar e mo unte d
on the printed circ uit board. T he DIM Ms feature serial prese nc e d etec t (SPD ) bas ed on a se rial E
using the 2-pin I
are available to the customer
2
C protocol. The first 128 bytes are programmed with configuration data and the second 128 bytes
HYS64D16301HU-5-CPC3200U-30330-C0one rank 128MB DIMM256 Mb it (× 16)
HYS64D32300HU-5-CPC3200U-30330-A0one ran k 256MB DIMM256 Mbit (× 8)
HYS72D32300HU-5-CPC3200U-30330-A0one ran k 256MB ECC-DIMM256 Mb it (× 8)
HYS64D64320HU-5-CPC3200U-30330-B0two ranks 512MB DIMM256 Mbit (×8)
HYS72D64320HU-5-CPC3200U-30330-B0two ranks 512MB ECC-DIMM 256 Mbit (×8)
PC2700 (CL=2.5)
HYS64D16301HU-6-CPC2700U-25330-C0one rank 128MB DIMM256 Mb it (× 16)
HYS64D32300HU-6-CPC2700U-25330-A0one ran k 256MB DIMM256 Mbit (× 8)
HYS72D32300HU-6-CPC2700U-25330-A0one ran k 256MB ECC-DIMM256 Mb it (× 8)
HYS64D64320HU-6-CPC2700U-25330-B0two ranks 512MB DIMM256 Mbit (×8)
HYS72D64320HU-6-CPC2700U-25330-B0two ranks 512MB ECC-DIMM 256 Mbit (×8)
Note:All part numbers end with a place code designating the silicon-die revision. Reference information available
on request. Example: HYS72D32000HU-6-C, indicating rev. C dies are used for SDRAM components. The
Compliance Code is printe d on the module labels describin g the speed sort (for example “PC2700”), the
latencies and SPD code definition (for example “20330” means CAS latency of 2.0 clocks, RCD
3 clocks, Row Precharge latency of 3 clocks, and JEDEC SPD code definiton version 0), and the Raw Card
used for this module.
Table 6Absolute Maximum Ratings
ParameterSymbolValuesUnit Note/ Test
min.typ.max.
Voltage on I/O pins relative to
V
SS
V
, V
IN
–0.5–V
OUT
DDQ
+
0.5
Voltage on inputs relative to
Voltage on
Voltage on
V
supply relative to V
DD
V
supply relative to V
DDQ
V
SS
SS
SS
Operating temperature (ambient)
Storage temperature (plastic)
Power dissipation (per SDRAM component)P
Short circuit output current
V
V
V
T
T
I
IN
DD
DDQ
A
STG
D
OUT
–1–+3.6V–
–1–+3.6V–
–1–+3.6V–
0–+70°C–
-55–+150°C–
–1–W–
–50–mA–
Attention: Permanent damage to the device may occur if “Absolute Maximum Ratings” are exceeded. This
is a stress rating only, and functional oper ation should be restricted to recommended o peration
conditions. Exposure to absolute maximum rating conditions for extended periods of time may
affect device reliability and exceeding only one of the values may cause irreversible damage to
the integrated circuit.
Condition
V–
Table 7Electrical Characteristics and DC Operating Conditions
ParameterSymbolValuesUnit Note/Test Condition
Min.Typ.Max.
Device Supply Voltage
Device Supply Voltage
Output Supply VoltageV
Output Supply VoltageV
EEPROM supply voltageV
Supply Voltage, I/O Supply
Voltage
Input Ref erence Voltage
Input Ref erence VoltageV
I/O Termination Voltage
V
DD
V
DD
DDQ
DDQ
DDSPD
V
SS
V
SSQ
V
REF
REF
V
TT
2.32.52.7Vf
≤166 MHz
CK
2.52.62.7VfCK>166MHz
2.32.52.7Vf
≤166 MHz
CK
2.52.62.7VfCK>166MHz
2.32.53.6V—
,
00V—
0.49 × V
V
/ 2
DDQ
– 50 mV
V
– 0.04V
REF
DDQ
0.5 × V
V
/ 2V
DDQ
DDQ
0.51 × V
/ 2
DDQ
+ 50 mV
+ 0.04 V
REF
DDQ
Vf
≤166 MHz
CK
VfCK>166MHz
5)
2)
3)
2)3)
4)
2)4)
(System)
Input High (Logic1) Voltage V
Input Low (Logic0) Voltage V
Input Voltage Level,
CK and CK
Inputs
Input Differential Voltage,
CK and CK
Inputs
V
V
IH(DC)
IL(DC)
IN(DC)
ID(DC)
V
+ 0.15V
REF
–0.3V
–0.3V
0.36V
+ 0.3V
DDQ
– 0.15 V
REF
+ 0.3V
DDQ
+ 0.6V
DDQ
8)
8)
8)
8)6)
1)
Data Sheet17V1.0, 2003-07
HYS[64/72]D[16x01/32x00/64x20]HU-[5/6]-C
Unbuffered DDR SDRAM Modules
Electrical Characteristics
Table 7Electrical Characteristics and DC Operating Conditions (cont’d)
ParameterSymbolValuesUnit Note/Test Condition
1)
Min.Typ.Max.
VI-Matching Pull-up
VI
Ratio
0.711.4—
7)
Current to Pull-down
Current
Input Leakage CurrentI
I
–22µAAny input 0 V ≤VIN≤VDD;
All other pins not under test
8)9)
=0V
Output Leakage CurrentI
Output High Current,
OZ
I
OH
–55µADQs are disabled;
0V ≤
V
≤ V
—–16.2mAV
OUT
=
OUT
1.95 V
DDQ
8)
8)
Normal Strength Driver
Output Low
I
OL
16.2—mAV
= 0.35 V
OUT
8)
Current, Normal Strength
Driver
1) 0 °C ≤ TA ≤ 70 °C
2) DDR400 conditions apply for all clock frequencies above 166 MHz
V
3) Under all conditions,
4) Peak to peak AC noise on
V
is not applied directly to the dev ic e. VTT is a system supply fo r signal term in ation resistors, is expected to be set equal
5)
TT
to
V
, and must track variations in the DC level of V
REF
V
is the magnitude of the difference between the input level on CK and the input level on CK.
6)
ID
7) The ration of the pull-up current to th e p ul l-do w n c urre nt is s pecified for the same tem pe ratu r e and v olta ge , o ver th e e nti re
temperature and voltage range, for device drain to source voltage from 0.25 to 1.0 V. For a given output, it represents the
maximum difference between pull-up and pull-down drivers due to process variation.
8) Inputs are not recognized as valid until
9) Values are shown per DDR SDRAM component
must be less than or equal to VDD.
DDQ
V
may not exceed ±2% V
REF
V
stabilizes.
REF
REF
REF (DC)
.
. V
is also expected to track noise variations in V
REF
DDQ
.
Data Sheet18V1.0, 2003-07
HYS[64/72]D[16x01/32x00/64x20]HU-[5/6]-C
Unbuffered DDR SDRAM Modules
Electrical Characteristics
3.2Current Conditions and Specification
Table 8IDD Conditions
ParameterSymbol
Operating Current 0
one bank; active/ precharge; DQ, DM, and DQS inputs changing once per clock cycle;
address and control inputs changing once every two clock cycles.
Operating Current 1
one bank; active/read/precharge; Burst Length = 4; see component data sheet.
Precharge Power-Down Standby Current
all banks idle; power-down mode; CKE ≤
V
IL,MAX
Precharge Floating Standby Current
CS
≥V
address and other control inputs changing once per clock cycle;
, all banks idle; CKE ≥ V
IH,,MIN
IH,MIN
;
V
IN
= V
for DQ, DQS and DM.
REF
Precharge Quiet Standby Current
CS
≥V
address and other control inputs stable at ≥
, all banks idle; CKE ≥ V
IHMIN
IH,MIN
; VIN = V
V
IH,MIN
for DQ, DQS and DM;
REF
or ≤ V
IL,MAX
.
Active Power-Down Standby Current
one bank active; power-down mode; CKE ≤
V
ILMAX
; VIN = V
for DQ, DQS and DM.
REF
Active Standby Curre nt
one bank active; CS
≥V
IH,MIN
; CKE ≥ V
IH,MIN
; tRC= t
RAS,MAX
;
DQ, DM and DQS inputs changing twice per clock cycle;
address and control inputs changing once per clock cycle.
Operating Current Read
one bank active; Burst Length = 2; reads; continuous burst;
address and control inputs changing once per clock cycle;
50% of data outputs changing on every clock edge;
CL = 2 for DDR266(A), CL = 3 for DDR333 and DDR400B;
I
OUT
=0mA
Operating Current Write
one bank active; Burst Length = 2; writes; continuous burst;
address and control inputs changing once per clock cycle;
50% of data outputs changing on every clock edge;
CL = 2 for DDR266(A), CL = 3 for DDR333 and DDR400B
Auto-Refresh Current
t
RC
= t
, distributed refresh
RFCMIN
Self-Refresh Current
CKE ≤ 0.2 V; external clock on
Operating Current 7
four bank interleaving with Burst Length = 4; see component data sheet.
) currents are not included in the calculations (see note 1)
DDQ
values are calculated from the corrponent I
DDx
[component] with m and n number of components of rank 1 and 2; n=0 for 1 rank modules
DD3N
values of the component data sheet as follows:
DDx
data sheet values as: (m + n) × I
DDx
[component]
DDx
3)
3)4)
5)
5)
5)
5)
5)
3)4)
3)
3)
5)
3)4)
Data Sheet21V1.0, 2003-07
HYS[64/72]D[16x01/32x00/64x20]HU-[5/6]-C
Unbuffered DDR SDRAM Modules
Electrical Characteristics
3.3AC Characteristics
Table 11AC Timing - Absolute Specifications –6/–5
ParameterSymbol–6–5Unit Note/ Test
CK
CK
CK
CK
CK
CK
CK
CK
CK
Condition
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)6)
2)3)4)5)6)
2)3)4)5)7)
2)3)4)5)7)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)8)
2)3)4)5)9)
2)3)4)5)
3)4)5)6)10)
DQ output access time from CK/CK
DQS output access time from CK/CKt
CK high-level widtht
CK low-level widtht
Clock Half Periodt
Clock cycle timet
DQ and DM input hold timet
DQ and DM input setup timet
Control and Addr. input pulse width (ea ch
input)
DQ and DM input pulse width (each input)t
Data-out high-impedance time from CK/CKt
Data-out low-impedance time from CK/CKt
Write command to 1st DQS latching transitiont
DQS-DQ skew (DQS and associated DQ
signals)
Data hold skew factort
DQ/DQS output hold timet
DQS input low (high) pulse width (write cycle) t
DQS falling edge to CK setup time (write cycle) t
DQS falling edge hold time from CK (write
cycle)
Mode register set command cycle timet
Write preamble setup timet
Write postamblet
Write preamblet
Address and control input setup timet
t
AC
DQSCK
CH
CL
HP
CK
DH
DS
t
IPW
DIPW
HZ
LZ
DQSS
t
DQSQ
QHS
QH
DQSL,H
DSS
t
DSH
MRD
WPRES
WPST
WPRE
IS
DDR333DDR400B
Min.Max.Min.Max.
–0.7+0.7–0.6+0.6ns
–0.6+0.6–0.5+0.5ns
0.450.550.450.55t
0.450.550.450.55t
min. (tCL, tCH)min. (tCL, tCH)ns
Read postamble
Active to Precharge commandt
Active to Active/Auto-refresh command period t
Auto-refresh to Active/Auto-refresh command
t
RPST
RAS
RC
t
RFC
0.400.600.400.60t
4270E+3 4070E+3 ns
60—55—ns
72—65—ns
CK
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
period
Active to Read or Write delayt
Precharge command periodt
Active to Autoprecharge delayt
Active bank A to Active bank B commandt
Write recovery timet
Auto precharge write recovery + precharge
RCD
RP
RAP
RRD
WR
t
DAL
18—15—ns
18—15—ns
18—15—ns
12—10—ns
15—15—ns
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)11)
t
CK
time
Internal write to read command delayt
Exit self-refresh to non-read commandt
Exit self-refresh to read commandt
Average Periodic Refresh Intervalt
1) 0 °C ≤ TA ≤ 70 °C; V
= 2.5 V ± 0.2 V, VDD = +2.5 V ± 0.2 V (DDR333); V
DDQ
WTR
XSNR
XSRD
REFI
1—1—t
75—75—ns
200—200—t
—7.8—7.8µs
= 2.6 V ± 0.1 V, VDD = +2.6 V ±0.1 V (DDR400)
DDQ
2) Input slew rate ≥ 1 V/ns for DDR400, DDR333
3) The CK/CK
level for signals other than CK/CK
4) Inputs are not recognized as valid until
input reference level (f or timing refere nce to CK/CK) is th e point at wh ich CK and CK cross: the in put reference
, is V
. CK/CK slew rate are ≥ 1.0 V/ns.
REF
V
stabilizes.
REF
5) The Output timing reference level , as measured a t the timing r eference poin t indicated i n AC Characteris tics (note 3) i s
6) These parameters guarantee device timing, but they are not necessarily tested on each device.
t
and tLZ transitions occur in the s am e a cc ess tim e wind ow s as v al id data transitions. The se pa ram ete rs are no t re ferre d
7)
HZ
to a specific voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).
8) The specific req ui rem ent is th at D QS b e v al id (H IG H, L OW , or some point on a va lid tra ns itio n) on or b efo re this CK edge.
A valid transition is d efined as monoton ic and meeting the input slew rate specificatio ns of the devi ce. When no writ es were
previously in progress on the bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress,
t
DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on
DQSS
.
9) The maximum limi t for th is paramet er is not a devic e limit . The devi ce ope rates with a greater v alue for th is para meter, bu t
system performance (bus turnaround) degrades accordingly.
10) Fast slew rate ≥ 1.0 V/ns , slow slew rate ≥ 0.5 V/ns and < 1 V/ns for co mmand/ad dress and CK & CK
V
measured between
OH(ac)
and V
11) For each of the terms, if not already an integer, round to the next highest integer.
OL(ac)
.
t
is equal to the actual system clock
CK
cycle time.
12) A maximum o f eight Autorefresh commands can be posted to any given DDR SDRAM device.
Location
73 Part Number, Char 1—3636373637
74 Part Number, Char 2—3434323432
75 Part Number, Char 3—4444444444
76 Part Number, Char 4—3133333636
77 Part Number, Char 5—3632323434
78 Part Number, Char 6—3333333333
79 Part Number, Char 7—3030303232
80 Part Number, Char 8—3130303030
81 Part Number, Char 9—4848484848
82 Part Number, Char 10—5555555555
83 Part Number, Char 11—3636363636
84 Part Number, Char 12—4343434343
85 Part Number, Char 13—2020202020
86 Part Number, Char 14—2020202020
87 Part Number, Char 15—2020202020
88 Part Number, Char 16—2020202020
89 Part Number, Char 17—2020202020
90 Part Number, Char 18—2020202020
91 Module Revision Code—xxxxxxxxxx
92 Test Program Revision
Code
93 Module Manufacturing Date
Year
94 Module Manufacturing Date
Week
95 to 98Module Serial Number—xxxxxxxxxx
99 to 127 not used—0000000000
0 Programmed SPD Bytes in E2PROM1288080808080
1 Total number of Bytes in E2PROM2560808080808
2 Memory Type DDR-I = 07hDDR SDRAM 0707070707
3 # of Row Addresses130D0D0D0D0D
4 # Number of Column Addresses9/10090A0A0A0A
5 # of DIMM Banks1/20101010202
6 Data Width (LSB)×64/×724040484048
7 Data Width (MSB)00000000000
8 Interface Voltage LevelsSSTL_2.50404040404
9 tCK @ CLmax (Byte 18) [ns]5 ns5050505050
10 tAC SDRAM @ CLmax (Byte 18) [ns]0.50 ns5050505050
11 DIMM Configuration Type (non- / ECC) non-
12 Refresh RateSelf-Refresh
13 Primary SDRAM width×16/×8 10080808 08
14 Error Checking SDRAM widthna/×800000800 08
15 tCCD [cycles]
16 Burst Length Supported2, 4 & 80E0E0E0E0E
17 Number of Banks on SDRAM40404040404
18 CAS LatencyCAS
78 Part Number, Char 6—3333333333
79 Part Number, Char 7—3030303232
80 Part Number, Char 8—3130303030
81 Part Number, Char 9—4848484848
82 Part Number, Char 10—5555555555
83 Part Number, Char 11—3535353535
84 Part Number, Char 12—4343434343
85 Part Number, Char 13—2020202020
86 Part Number, Char 14—2020202020
87 Part Number, Char 15—2020202020
88 Part Number, Char 16—2020202020
89 Part Number, Char 17—2020202020
90 Part Number, Char 18—2020202020
91 Module Revision Code—xxxxxxxxxx
92 Test Program Revision Code—xxxxxxxxxx
93 Module Manufacturing Date Year—xxxxxxxxxx
94 Module Manufacturing Date Week—xxxxxxxxxx
95 to 98Module Serial Number—xxxxxxxxxx
99 to 127not used—0000 0
–5–5–5–5–5
HYS64D32300HU–5–C
HYS72D32300HU–5–C
SPD Contents
HYS64D64320HU–5–C
HYS72D64320HU–5–C
Data Sheet29V1.0, 2003-07
HYS[64/72]D[16x01/32x00/64x20]HU-[5/6]-C
Unbuffered DDR SDRAM Modules
5Package Outlines
BC
A
0.1
±0.1
4
1
±0.1
2.36
ø0.1
ACB
64.77
133.35
128.95
6.62
2.175
Package Outlines
0.15
1)
A
±0.13
31.75
92
6.35
49.53
B
0.4
B
AC
2.7 MAX.
C
±0.1
1.27
±0.13
3.8
93
3 MIN.
Detail of contacts
0.2
±0.2
2.5
95
1.8
=1.27x120.65
±0.1
0.1
BAC
184
10
17.8
1.27
1) On ECC modules only
Burr max. 0.4 allowed
Figure 7Package Outlines - Raw Card C (128 MByte, 1 Rank Module)
Data Sheet30V1.0, 2003-07
1
±0.05
0.1
BAC
L-DIM-184-18
HYS[64/72]D[16x01/32x00/64x20]HU-[5/6]-C
L-DIM
Unbuffered DDR SDRAM Modules
133.35
1)
128.95
A
±0.1
4
ACB
0.1
Package Outlines
0.15
±0.13
BAC
2.7 MAX.
31.75
92
1
1
2.36
±0.1
ø0.1
A B
64.77
C
6.62
2.175
6.35
49.53
1.27x95120.65=
92
B
0.4
C
1.27
±0.1
±0.13
3.8
93
3 MIN.
Detail of contacts
0.2
1.27
1) On ECC modules only
Burr max. 0.4 allowed
1
±0.05
±0.2
2.5
0.1
BAC
1.8
±0.1
0.1
CA
B
184
10
17.8
-184-30
Figure 8Package Outline - Raw Card A (256 MByte, 1 Rank Module, –5 and –6, ECC)
Data Sheet31V1.0, 2003-07
HYS[64/72]D[16x01/32x00/64x20]HU-[5/6]-C
L-DIM-184-31
Unbuffered DDR SDRAM Modules
133.35
128.95
1)
6.62
2.175
95 x 1.27 = 120.65
A
6.35
92
±0.1
4
ACB
0.1
1
2.36
±0.1
ø0.1
BAC
64.7749.53
Package Outlines
0.15
ACB
4 MAX.
±0.13
31.75
B
C
0.4
1.27
±0.1
±0.1
ACB
1.8
1)
0.1
A B C
±0.13
3.8
93184
3 MIN.
Detail of contacts
±0.2
1
2.5
±0.05
0.1
0.2
1.27
1) On ECC modules only
Burr max. 0.4 allowed
10
17.8
Figure 9Package Outline - Raw Card B (512 MByte, 2 Rank Module, –5 and –6, ECC)
Data Sheet32V1.0, 2003-07
HYS[64/72]D[16x01/32x00/64x20]HU-[5/6]-C
Unbuffered DDR SDRAM Modules
133.35
128.95
6.62
2.175
A
92
92
92
6.35
49.53
±0.1
4
A BC
0.1
1
1
2.36
±0.1
ø0.1
CBA
64.77
Package Outlines
0.15
±0.13
31.75
B
0.4
B
AC
2.7 MAX.
C
±0.1
1.27
±0.13
3.8
93
3 MIN.
Detail of contacts
0.2
±0.2
2.5
95 x
1.8
±0.1
120.651.27 =
0.1
A
CB
184
10
17.8
1.27
Burr max. 0.4 allowed
Figure 10Package Outline - Raw Card A (256 MByte, 1 Rank Module, –5 and –6, Non ECC)
Data Sheet33V1.0, 2003-07
±0.05
1
0.1
BAC
L-DIM-184-32
HYS[64/72]D[16x01/32x00/64x20]HU-[5/6]-C
Unbuffered DDR SDRAM Modules
133.35
128.95
6.62
2.175
1.27x=
95
A
92
6.35
49.53
120.65
±0.1
4
CB
A
0.1
1
2.36
±0.1
ø0.1
A B
64.77
C
Package Outlines
0.15
±0.13
31.75
B
0.4
AC
4 MAX.
C
1.27
B
±0.1
±0.13
3.8
93
3 MIN.
Detail of contacts
0.2
1.27
Burr max. 0.4 allowed
1
±0.05
±0.2
2.5
0.1
ACB
1.8
±0.1
0.1
BAC
184
10
17.8
L-DIM-184-33
Figure 11Package Outline - Raw Card B (512 MByte, 2 Rank Module, –5 and –6, Non ECC)
Data Sheet34V1.0, 2003-07
www.infineon.com
Published by Infineon Technologies AG
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