Linear Technology RH1009 Datasheet

DUESCRIPTIO
A
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W
A
WUW
ARB
S
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LUTEXI T
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PACKAGE
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BOTTOM VIEW
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H PACKAGE
3-LEAD TO-46 METAL CAN
RH1009
2.5V Reference
The RH1009 is a general purpose 2.5V shunt regulator diode designed to operate over a wide current range while maintaining good stability with time and temperature. The adjust terminal allows either temperature coefficient to be minimized or the reference voltage to be adjusted without changing the temperature coefficient. Because it operates as a shunt regulator it can be used equally well as a positive or negative reference.
The wafer lots are processed to Linear Technology’s in­house Class S flow to yield circuits usable in stringent military applications.
U U
BUR -I CIRCUIT
20V
2k
NC
Reverse Breakdown Current ................................ 20mA
Forward Current................................................... 10mA
Operating Temperature Range ............. –55°C to 125°C
Storage Temperature Range ................. –65°C to 150°C
Lead Temperature (Soldering, 10 sec)..................300°C
, LTC and LT are registered trademarks of Linear Technology Corporation.
TABLE 1: ELECTRICAL CHARACTERISTICS (Preirradiation)
V
Z
V
Z
I
R
r
Z
V
Z
V
Z
Time I
RH1009 BI
TJ = 25°C SUB- SUB-
Reverse Breakdown IR = 1mA 2.495 2.505 1 V Voltage
Reverse Breakdown 400µA ≤ IR 10mA 6 1 10 2,3 mV Voltage Change with Current
Reverse Dynamic IR = 1mA 1 0.6 1 Impedance
Temperature Stability 1 15 mV Long Term Stability TA = 25°C±0.1°C, 20 ppm/kHr
= 1mA
R
Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen­tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
–55°C TJ 150°C
1
RH1009
TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation) (Note 2)
20KRAD(Si)10KRAD(Si)
SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
V
V I
r
Z
Note 1: Guaranteed by design, characterization or correlation to other tested parameters.
TOTAL DOSE BIAS CIRCUIT
Reverse Breakdown IR = 1mA 2.495 2.505 2.495 2.505 2.495 2.505 2.495 2.505 2.495 2.505 V
Z
Voltage Reverse Breakdown Voltage 400µA IR 10mA 6 6 8 10 12 mV
Z
Change with Current
Z
Reverse Dynamic IR = 1mA 1 0.6 0.6 0.8 1.0 1.4 Impedance
Note 2: T
15V
12.4k
= 25°C unless otherwise noted.
A
RH1009 TDBC
U
W
50KRAD(Si)
100KRAD(Si) 200KRAD(Si)
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS SUBGROUP
Final Electrical Test Requirements (Method 5004) 1*,2,3 Group A Test Requirements (Method 5005) 1,2,3 Group C and D End Point Electrical Parameters 1
(Method 5005) * PDA Applies to subgroup 1. See PDA Test Notes.
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup 1, after burn-in divided by the total number of devices submitted for burn­in in that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits than those given.
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TYPICAL PERFORMANCE CHARACTERISTICS
Reverse Breakdown Voltage
2
Reverse Breakdown Voltage
2.502 IR = 1mA
2.501
2.500
2.499
REVERSE BREAKDOWN VOLTAGE (V)
2.498
1
10 100 1000
TOTAL DOSE KRAD (Si)
RH1009 G01
Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417 ● (408) 432-1900 FAX: (408) 434-0507
TELEX: 499-3977 ● www.linear-tech.com
Change with Current
0
–2
–4
–6
–8
–10
CHANGE WITH CURRENT (mV)
REVERSE BREAKDOWN VOLTAGE
–12
–14
1
600µA IR 10mA
10 100 1000
TOTAL DOSE KRAD (Si)
RH1009 G02
I.D. No. 66-10-0174 Rev. B 0497
LT/HP 0497 500 REV B • PRINTED IN USA
LINEAR TECHNOLOGY CORPORATION 1990
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