Electrically erasable CMOS technology provides reconfigurable logic and full testability
◆
◆
High-speed CMOS technology
— 5-ns propagation delay for “-5” version
— 7.5-ns propagation delay for “-7” version
◆
Direct plug-in replacement for a wide range of 24-pin PAL devices
◆
Programmable enable/disable control
◆
Outputs individually programmable as registered or combinatorial
Peripheral Component Interconnect (PCI) compliant
◆
◆
Preloadable output registers for testability
◆
Automatic register reset on power-up
Cost-effective 24-pin plastic SKINNY DIP and 28-pin PLCC packages
◆
Extensive third-party software and programmer support
◆
◆
Fully tested for 100% programming and functional yields and high reliability
◆
Programmable output polarity
5-ns version utilizes a split leadframe for improved performance
◆
20V8 devices
GENERAL DESCRIPTION
The PALCE20V8 is an advanced PAL
erasable CMOS technology. Its macrocells provide a universal device architecture. The
PALCE20V8 is fully compatible with the GAL20V8 and can directly replace PAL20R8 series
devices and most 24-pin combinatorial PAL devices.
device built with low-power, high-speed, electrically-
Device logic is automatically configured according to the user’s design specification. A design is
implemented using any of a number of popular design software packages, allowing automatic
creation of a programming file based on Boolean or state equations. Design software also verifies
the design and can provide test vectors for the finished device. Programming can be
accomplished on standard PAL device programmers.
The P ALCE20V8 utilizes the familiar sum-of-products (AND/OR) architecture that allows users to
implement complex logic functions easily and efficiently. Multiple levels of combinatorial logic
can always be reduced to sum-of-products form, taking advantage of the very wide input gates
available in PAL devices. The equations are programmed into the device through floating-gate
cells in the AND logic array that can be erased electrically.
Publication# 16491Rev: E
Amendment/0Issue Date: November 1998
The fixed OR array allows up to eight data product terms per output for logic functions. The
sum of these products feeds the output macrocell. Each macrocell can be programmed as
registered or combinatorial with an active-high or active-low output. The output configuration
is determined by two global bits and one local bit controlling four multiplexers in each
macrocell.
BLOCK DIAGRAM
– I
I
1
10
10
CLK/I
0
OE/I
Input
Mux.
11
Programmable AND Array
MACRO
MC
0
I
12
I/O
0
MACRO
MC
1
I/O
1
MACRO
MC
2
I/O
2
MACRO
MC
3
I/O
40 x 64
3
MACRO
MC
4
I/O
MACRO
MC
5
4
I/O
5
MACRO
MC
6
I/O
MACRO
MC
7
6
I/O
Input
Mux.
7
I
13
16491E
FUNCTIONAL DESCRIPTION
The PALCE20V8 is a universal PAL device. It has eight independently configurable macrocells
-MC
(MC
0
combinatorial I/O, or dedicated input. The programming matrix implements a programmable
AND logic array, which drives a fixed OR logic array. Buffers for device inputs have
complementary outputs to provide user-programmable input signal polarity. Pins 1 and 13 serve
either as array inputs or as clock (CLK) and output enable (OE
). Each macrocell can be configured as a registered output, combinatorial output,
7
) for all flip-flops.
Unused input pins should be tied directly to V
or GND. Product terms with all bits
CC
unprogrammed (disconnected) assume the logical HIGH state, and product terms with both true
and complement of any input signal connected assume a logical LOW state.
The programmable functions on the PALCE20V8 are automatically configured from the user’s
design specification, which can be in a number of formats. The design specification is processed
2PALCE20V8 Family
by development software to verify the design and create a programming file. This file, once
downloaded to a programmer, configures the device according to the user’s desired function.
The user is given two design options with the PALCE20V8. First, it can be programmed as an
emulated PAL device. This includes the PAL20R8 series and most 24-pin combinatorial PAL
devices. The PAL device programmer manufacturer will supply device codes for the standard
P AL architectures to be used with the P ALCE20V8. The programmer will program the P ALCE20V8
to the corresponding PAL device architecture. This allows the user to use existing standard PAL
device JEDEC files without making any changes to them. Alternatively, the device can be
programmed directly as a P ALCE20V8. Here the user must use the PALCE20V8 device code. This
option provides full utilization of the macrocells, allowing non-standard architectures to be built.
To
Adjacent
Macrocell
1 1
0 X
1 0
OE
V
CC
1 1
1 0
0 0
0 1
SL0
X
SG1
DQ
SL1
X
*In macrocells MC0 and MC7, SG1 is replaced by SG0 on the feedback multiplexer.
CLK
Q
Figure 1. PALCE20V8 Macrocell
*SG1
1 1
0 X
1 0
1 0
1 1
0 X
SL0
I/O
X
From
X
Adjacent
Pin
16491E
PALCE20V8 Family3
CONFIGURATION OPTIONS
Each macrocell can be configured as one of the following: registered output, combinatorial
output, combinatorial I/O or dedicated input. In the registered output configuration, the output
buffer is enabled by the OE
by a product term or always enabled. In the dedicated input configuration, the buffer is always
disabled. A macrocell configured as a dedicated input derives the input signal from an adjacent
I/O.
The macrocell configurations are controlled by the configuration control word. It contains 2
global bits (SG0 and SG1) and 16 local bits (SL0
determines whether registers will be allowed. SG1 determines whether the PALCE20V8 will
emulate a P AL20R8 family or a combinatorial device. Within each macrocell, SL0
with SG1, selects the configuration of the macrocell and SL1
or active high.
The configuration bits work by acting as control inputs for the multiplexers in the macrocell.
There are four multiplexers: a product term input, an enable select, an output select, and a
feedback select multiplexer. SG1 and SL0
and MC
, SG0 replaces SG1 on the feedback multiplexer.
7
These configurations are summarized in Table 1 and illustrated in Figure 2.
pin. In the combinatorial configuration, the buffer is either controlled
through SL0
0
are the control signals for all four multiplexers. In MC
x
and SL1
7
sets the output as either active low
x
through SL1
0
, in conjunction
x
). SG0
7
0
If the P ALCE20V8 is configured as a combinatorial device, the CLK and OE pins may be available
as inputs to the array. If the device is configured with registers, the CLK and OE
pins cannot be
used as data inputs.
Registered Output Configuration
The control bit settings are SG0 = 0, SG1 = 1 and SL0
= 0. There is only one registered
x
configuration. All eight product terms are available as inputs to the OR gate. Data polarity is
. SL1
determined by SL1
flop. SL1
is programmed as 1 for inverted output or 0 for non-inverted output. The flip-flop is
x
x
loaded on the LOW-to-HIGH transition of CLK. The feedback path is from Q
output buffer is enabled by OE
is an input to the exclusive-OR gate which is the D input to the flip-
x
on the register. The
.
Combinatorial Configurations
The PALCE20V8 has three combinatorial output configurations: dedicated output in a nonregistered device, I/O in a non-registered device and I/O in a registered device.
Dedicated Output in a Non-Registered Device
The control settings are SG0 = 1, SG1 = 0, and SL0
= 0. All eight product terms are available to
x
the OR gate. Although the macrocell is a dedicated output, the feedback is used, with the
exception of pins 18(21) and 19(23). Pins 18(21) and 19(23) do not use feedback in this mode.
Note:
1. The pin number without parentheses refers to the SKINNY DIP package. The pin number in parentheses refers to the PLCC
package.
4PALCE20V8 Family
Dedicated Input in a Non-Registered Device
The control bit settings are SG0 = 1, SG1 = 0 and SL0
= 1. The output buffer is disabled. The
x
feedback signal is an adjacent I/O pin.
Combinatorial I/O in a Non-Registered Device
The control settings are SG0 = 1, SG1 = 1, and SL0
= 1. Only seven product terms are available
x
to the OR gate. The eighth product term is used to enable the output buffer. The signal at the
I/O pin is fed back to the AND array via the feedback multiplexer. This allows the pin to be used
as an input.
Combinatorial I/O in a Registered Device
The control bit settings are SG0=0,SG1=1 and SL0
=1. Only seven product terms are available
x
to the OR gate. The eighth product term is used as the output enable. The feedback signal is the
corresponding I/O signal.
Table 1. Macrocell Configuration
Cell
SG0SG1SL0
Device Uses RegistersDevice Uses No Registers
010Registered Output
011
X
Configuration
Combinatorial
I/O
Devices
EmulatedSG0SG1SL0
PAL20R8, 20R6,
20R4
PAL20R6, 20R4101InputPAL20L2, 18L4, 16L6
100
X
Cell
Configuration
Combinatorial
Output
Devices
Emulated
PAL20L2, 18L4,
16L6, 14L8
111
Combinatorial
I/O
PAL20L8
PALCE20V8 Family5
OE
CLK
a. Registered active Low
DQQ
OE
DQQ
CLK
b. Registered active high
c. Combinatorial I/O active lowd. Combinatorial I/O active high
V
CC
Note 1Note 1
e. Combinatorial output active low
Notes:
1. Feedback is not available on pins 18 (21) and 19 (23) in
the combinatorial output mode.
2. This macrocell configuration is not available on pins
18 (21) and 19 (23).
Figure 2. Macrocell Configurations
V
CC
f. Combinatorial output active high
Note 2
Adjacent I/O Pin
g. Dedicated input
16491E
6PALCE20V8 Family
Power-Up Reset
All flip-flops power up to a logic LOW for predictable system initialization. Outputs of the
PALCE20V8 depend on whether they are selected as registered or combinatorial. If registered is
selected, the output will be HIGH. If combinatorial is selected, the output will be a function of
the logic.
Register Preload
The register on the PALCE20V8 can be preloaded from the output pins to facilitate functional
testing of complex state machine designs. This feature allows direct loading of arbitrary states,
making it unnecessary to cycle through long test vector sequences to reach a desired state. In
addition, transitions from illegal states can be verified by loading illegal states and observing
proper recovery.
Security Bit
A security bit is provided on the P ALCE20V8 as a deterrent to unauthorized copying of the array
configuration patterns. Once programmed, this bit defeats readback and verification of the
programmed pattern by a device programmer, securing proprietary designs from competitors.
The bit can only be erased in conjunction with the array during an erase cycle.
Electronic Signature Word
An electronic signature word is provided in the PALCE20V8. It consists of 64 bits of
programmable memory that can contain any user-defined data. The signature data is always
available to the user independent of the security bit.
Programming and Erasing
The PALCE20V8 can be programmed on standard logic programmers. It also may be erased to
reset a previously configured device back to its unprogrammed state. Erasure is automatically
performed by the programming hardware. No special erase operation is required.
Quality and Testability
The P ALCE20V8 offers a very high level of built-in quality. The erasability of the device provides
a direct means of verifying performance of all AC and DC parameters. In addition, this verifies
complete programmability and functionality of the device to provide the highest programming
and post-programming functional yields in the industry.
Technology
The high-speed P ALCE20V8H is fabricated with V antis’ advanced electrically erasable (EE) CMOS
process. The array connections are formed with proven EE cells. Inputs and outputs are
designed to be compatible with TTL devices. This technology provides strong input clamp
diodes, output slew-rate control, and a grounded substrate for clean switching.
PCI Compliance
PALCE20V8H devices in the -5/-7/-10 speed grades are fully compliant with the PCI Local Bus
Specification
published by the PCI Special Interest Group. The P ALCE20V8H’s predictable timing
ensures compliance with the PCI AC specifications independent of the design. On the other
hand, in CPLD and FPGA architectures without predictable timing, PCI compliance is dependent
upon routing and product term distribution.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
= 0°
C to 75°C) . . . . . . . . . 100 mA
A
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Input HIGH Leakage CurrentVIN = 5.25 V, V
Input LOW Leakage CurrentVIN = 0 V, V
Off-State Output Leakage Current HIGH
Off-State Output Leakage Current LOW
Output Short-Circuit CurrentV
Supply Current for -5
Supply Current for -7 and -10
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
= Max (Note 2) 10µA
CC
= Max (Note 2)–100µA
CC
= 5.25 V, VCC = Max
V
OUT
V
= V
or VIL (Note 2)
IN
IH
= 0 V, V
V
OUT
V
= V
IN
= 0.5 V, VCC = Max (Note 3)–30–150mA
OUT
Outputs Open (I
V
= Max
CC
Outputs Open (I
V
= Max, f = 25 MHz
CC
= Max
CC
or VIL (Note 2)
IH
OUT
OUT
= 0 mA), V
= 0 mA),
IN
= 0 V
2.0V
0.8V
10µA
–100µA
125mA
115mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
and I
IL
(or IIH and I
OZL
OZH
).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
V
OUT
10PALCE20V8H-5/7/10 (Com’l)
CAPACITANCE
1
Parameter
SymbolParameter DescriptionTest ConditionsTypUnit
C
C
IN
OUT
Input CapacitanceV
Output CapacitanceV
= 2.0 V
IN
= 2.0 V8pF
OUT
= 5.0 V, TA = 25°C,
V
CC
f = 1 MHz
5pF
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
SWITCHING CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Parameter
SymbolParameter Description
t
PD
t
S
t
H
t
CO
t
SKEWR
t
WL
t
WH
Input or Feedback to Combinatorial Output1537.5310ns
Setup Time from Input or Feedback to Clock357.5ns
Hold Time000ns
Clock to Output141537.5ns
Skew Between Registered Outputs (Note 3)111ns
LOW346ns
Clock Width
HIGH346ns
External Feedback1/(t
f
MAX
Maximum
Frequency
(Note 4)
Internal Feedback
(f
)
CNT
No Feedback1/(t
t
PZX
t
PXZ
t
EA
t
ER
OE to Output Enable1616210ns
OE to Output Disable1516210ns
Input to Output Enable Using Product Term Control2639310ns
Input to Output Disable Using Product Term Control2539310ns
)142.810066.7MHz
S+tCO
) (Note 5)16612571.4MHz
1/(t
S+tCF
)16612583.3MHz
WH+tWL
-5-7-10
2
MaxMin
2
MaxMin
2
Max
1
UnitMin
Notes:
1. See “Switching Test Circuit” for test conditions.
2. Output delay minimums for t
PD
, tCO, t
PZX
, t
, tEA, and tER are defined under best case conditions. Future process improvements
PXZ
may alter these values; therefore, minimum values are recommended for simulation purposes only.
3. Skew testing takes into account pattern and switching direction differences between outputs that have equal loading.
4. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where
frequency may be affected.
is a calculated value and is not guaranteed. tCF can be found using the following equation:
Latchup Current (TA = 0°C to 75°C) . . . . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Output HIGH VoltageIOH = -3.2 mA, VIN = VIH or VIL, VCC = Min2.4V
Output LOW VoltageIOL = 24 mA, VIN = VIH or VIL, VCC = Min0.5V
Input HIGH Voltage
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
2.0V
V
IL
I
IH
I
IL
I
OZH
I
OZL
I
SC
I
CC
(Dynamic)
Input LOW Voltage
Input HIGH Leakage CurrentVIN = 5.25 V, V
Input LOW Leakage CurrentVIN = 0 V, V
Off-State Output Leakage Current HIGH
Off-State Output Leakage Current LOW
Output Short-Circuit CurrentV
Supply Current for -10
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
= Max (Note 2) 10µA
CC
= Max (Note 2)–100µA
CC
= 5.25 V, VCC = Max
V
OUT
V
= V
or VIL (Note 2)
IN
IH
= 0 V, V
V
OUT
V
= V
IN
= 0.5 V, VCC = Max (Note 3)–30–150mA
OUT
Outputs Open (I
V
= Max, f = 15 MHz (Note 4)
CC
= Max
CC
or VIL (Note 2)
IH
OUT
= 0 mA),
0.8V
10µA
–100µA
55mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
and I
IL
(or IIH and I
OZL
OZH
).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
V
OUT
4. This parameter is guaranteed worst case under test conditions. Refer to the I
vs. frequency graph for typical measurements.
CC
12PALCE20V8Q-10 (Com’l)
CAPACITANCE
1
Parameter
SymbolParameter DescriptionTest ConditionsTypUnit
C
C
IN
OUT
Input CapacitanceV
Output CapacitanceV
= 2.0 V
IN
= 2.0 V8pF
OUT
= 5.0 V, TA = 25°C,
V
CC
f = 1 MHz
5pF
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
SWITCHING CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Parameter
SymbolParameter Description
t
PD
t
S
t
H
t
CO
t
WL
t
WH
Input or Feedback to Combinatorial Output310ns
Setup Time from Input or Feedback to Clock7.5ns
Hold Time0ns
Clock to Output37.5ns
LOW6ns
Clock Width
HIGH6ns
External Feedback1/(t
f
MAX
Maximum Frequency
(Note 3)
Internal Feedback (f
)1/(tS+tCF) (Note 4)71.4MHz
CNT
)66.7MHz
S+tCO
-10
2
Max
1
UnitMin
No Feedback1/(tWH+tWL)83.3MHz
t
PZX
t
PXZ
t
EA
t
ER
OE to Output Enable210ns
OE to Output Disable210ns
Input to Output Enable Using Product Term Control310ns
Input to Output Disable Using Product Term Control310ns
Notes:
1. See “Switching Test Circuit” for test conditions.
2. Output delay minimums for t
PD
, tCO, t
PZX
, t
, tEA, and tER are defined under best case conditions. Future process improvements
PXZ
may alter these values; therefore, minimum values are recommended for simulation purposes only.
3. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where
frequency may be affected.
is a calculated value and is not guaranteed. tCF can be found using the following equation:
Latchup Current (TA = 0°C to 75°C) . . . . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Output HIGH VoltageIOH = -3.2 mA, VIN = VIH or VIL, VCC = Min2.4V
Output LOW VoltageIOL = 24 mA, VIN = VIH or VIL, VCC = Min0.5V
Input HIGH Voltage
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
2.0V
V
I
I
I
I
I
I
IL
IH
IL
OZH
OZL
SC
CC
Input LOW Voltage
Input HIGH Leakage CurrentVIN = 5.25 V, V
Input LOW Leakage CurrentVIN = 0 V, V
Off-State Output Leakage Current HIGH
Off-State Output Leakage Current LOW
Output Short-Circuit CurrentV
Supply Current
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
= Max (Note 2) 10µA
CC
= Max (Note 2)–100µA
CC
= 5.25 V, VCC = Max
V
OUT
V
= V
or VIL (Note 2)
IN
IH
= 0 V, V
V
OUT
V
= V
IN
= 0.5 V, VCC = Max (Note 3)–30–150mA
OUT
Outputs Open (I
V
= Max, f = 15 MHz
CC
= Max
CC
or VIL (Note 2)
IH
OUT
= 0 mA),
H90
Q55
0.8V
10µA
–100µA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
and I
IL
(or IIH and I
OZL
OZH
).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
V
OUT
mA
14PALCE20V8H-15/25 Q-15/25 (Com’l)
CAPACITANCE
1
Parameter
SymbolParameter DescriptionTest ConditionsTypUnit
C
C
IN
OUT
Input CapacitanceV
Output CapacitanceV
= 2.0 V
IN
= 2.0 V8pF
OUT
= 5.0 V, TA = 25°C,
V
CC
f = 1 MHz
5pF
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
SWITCHING CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Parameter
SymbolParameter Description
t
t
t
t
t
t
f
PD
S
H
CO
WL
WH
MAX
Input or Feedback to Combinatorial Output1525ns
Setup Time from Input or Feedback to Clock1215ns
Hold Time00ns
Clock to Output1012ns
LOW812ns
Clock Width
HIGH812ns
Maximum
Frequency
(Note 2)
External Feedback1/(t
Internal Feedback (f
)1/(tS+tCF) (Note 3)5040MHz
CNT
No Feedback1/(tWH+tWL)62.541.6MHz
)45.537MHz
S+tCO
-15-25
1
UnitMin MaxMin Max
t
PZX
t
PXZ
t
EA
t
ER
OE to Output Enable1520ns
OE to Output Disable1520ns
Input to Output Enable Using Product Term Control1525ns
Input to Output Disable Using Product Term Control1525ns
Notes:
1. See “Switching Test Circuit” for test conditions.
2. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where
frequency may be affected.
is a calculated value and is not guaranteed. tCF can be found using the following equation:
Latchup Current (TA = -40°C to +85°C) . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES
Output HIGH VoltageIOH = -3.2 mA, VIN = VIH or VIL, VCC = Min2.4V
Output LOW VoltageIOL = 24 mA, VIN = VIH or VIL, VCC = Min0.5V
Input HIGH VoltageGuaranteed Input Logical HIGH Voltage for all Inputs (Note 1)2.0V
Input LOW VoltageGuaranteed Input Logical LOW Voltage for all Inputs (Note 1)0.8V
Input HIGH Leakage CurrentVIN = 5.5 V, V
Input LOW Leakage CurrentVIN = 0 V, V
Off-State Output Leakage Current HIGHV
Off-State Output Leakage Current LOWV
Output Short-Circuit CurrentV
Supply Current
= 5.5 V, VCC = Max , VIN = V
OUT
= 0 V, V
OUT
= 0.5 V, VCC = Max (Note 3)–30–150mA
OUT
Outputs Open (I
V
= Max, f = 15 MHz
CC
= Max (Note 2) 10µA
CC
= Max (Note 2)–100µA
CC
or VIL (Note 2) 10µA
IH
= Max , VIN = V
CC
= 0 mA),
OUT
or VIL (Note 2)–100µA
IH
H130
Q65
mA
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
and I
IL
(or IIH and I
OZL
OZH
).
3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
V
OUT
16PALCE20V8H-15/25 Q-20/25 (ind)
CAPACITANCE
1
Parameter
SymbolParameter DescriptionTest ConditionsTypUnit
C
C
IN
OUT
Input CapacitanceV
Output CapacitanceV
= 2.0 V
IN
= 2.0 V8pF
OUT
= 5.0 V, TA = 25°C,
V
CC
f = 1 MHz
5pF
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where
capacitance may be affected.
SWITCHING CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES
Parameter
SymbolParameter Description
t
PD
t
S
t
H
t
CO
t
WL
t
WH
Input or Feedback to Combinatorial Output152025ns
Setup Time from Input or Feedback to Clock121315ns
Hold Time000ns
Clock to Output101112ns
LOW81012ns
Clock Width
HIGH81012ns
External Feedback1/(t
f
MAX
Maximum
Frequency
(Note 2)
Internal Feedback
(f
)
CNT
No Feedback1/(t
t
PZX
t
PXZ
t
EA
t
ER
OE to Output Enable151820ns
OE to Output Disable151820ns
Input to Output Enable Using Product Term Control151825ns
Input to Output Disable Using Product Term Control151825ns
)45.541.637MHz
S+tCO
) (Note 3)5045.440MHz
1/(t
S+tCF
)62.550.041.6MHz
WH+tWL
-15-20-25
1
UnitMin MaxMin MaxMin Max
Notes:
1. See “Switching Test Circuit” for test conditions.
2. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where
frequency may be affected.
is a calculated value and is not guaranteed. tCF can be found using the following equation:
3. t
CF
t
CF
= 1/f
(internal feedback) – tS.
MAX
PALCE20V8H-15/25 Q-20/25 (ind)17
SWITCHING WAVEFORMS
V
T
Input or
Feedback
Registered
Output
b. Registered output
t
S
t
CO
V
T
t
H
V
T
Clock
16491E-6
V
T
V
T
Input
Output
d. Input to output disable/enable
t
ER
t
EA
V
OH
– 0.5V
V
OL
+ 0.5V
16491E-8
Input or
Feedback
Combinatorial
Output
Clock
V
T
t
PD
a. Combinatorial output
t
WH
t
WL
c. Clock width
V
T
16491E-5
V
T
16491E-7
OE
t
PXZ
Output
e. OE to output disable/enable
Notes:
1. V
= 1.5 V
T
2. Input pulse amplitude 0 V to 3.0 V.
3. Input rise and fall times 2 ns to 5 ns typical.
18PALCE20V8 Family
V
V
OH
OL
– 0.5V
+ 0.5V
V
T
t
PZX
V
T
16491E-9
KEY TO SWITCHING WAVEFORMS
WAVEFORMINPUTSOUTPUTS
SWITCHING TEST CIRCUIT
5 V
Must be
Steady
May
Change
from H to L
May
Change
from L to H
Don’t Care,
Any Change
Permitted
Does Not
Apply
Will be
Steady
Will be
Changing
from H to L
Will be
Changing
from L to H
Changing,
State
Unknown
Center
Line is HighImpedance
“Off” State
KS000010-PAL
S
1
SpecificationS
tPD, t
CO
t
, t
PZX
EA
t
, t
PXZ
ER
R
1
Output
C
L
R
2
Commercial
1
C
L
1
R
2
Measured Output ValueR
Closed
Z → H: Open
Z → L: Closed
H → Z: Open
50 pF
390 Ω
200 Ω
H → Z: VOH – 0.5 V
5 pFH-5: 200 Ω
L → Z: ClosedL → Z: V
16491E-10
1.5 V
1.5 V
+ 0.5 V
OL
PALCE20V8 Family19
TYPICAL ICC CHARACTERISTICS
VCC = 5 V, TA = 25°C
150
(mA)
CC
I
125
100
75
50
25
20V8H-5
20V8H-7
20V8H-10
20V8H-15/25
20V8Q-15/25
0
01020304050
Frequency (MHz)
16491E-11
ICC vs. Frequency
The selected “typical” pattern utilized 50% of the device resources. Half of the macrocells were programmed as registered, and the
other half were programmed as combinatorial. Half of the available product terms were used for each macrocell. On any vector, half
of the outputs were switching.
By utilizing 50% of the device, a midpoint is defined for I
estimate the I
requirements for a particular design.
CC
. From this midpoint, a designer may scale the ICC graphs up or down to
CC
20PALCE20V8 Family
ENDURANCE CHARACTERISTICS
The P ALCE20V8 is manufactured using Vantis’ advanced electrically-erasable (EE) CMOS process.
This technology uses an EE cell to replace the fuse link used in bipolar parts. As a result, the
device can be erased and reprogrammed—a feature which allows 100% testing at the factory.
Max Storage Temperature10Years
Max Operating Temperature20Years
ROBUSTNESS FEATURES
The PALCE20V8X-X/5 have some unique features that make them extremely robust, especially
when operating in high-speed design environments. Pull-up resistors on inputs and I/O pins
cause unconnected pins to default to a known state. Input clamping circuitry limits negative
overshoot, eliminating the possibility of false clocking caused by subsequent ringing. A special
noise filter makes the programming circuitry completely insensitive to any positive overshoot
that has a pulse width of less than about 100 ns for the /5 versions.
PALCE20V8 Family21
INPUT/OUTPUT EQUIVALENT SCHEMATICS FOR PALCE20V8H-7
AND PALCE20V8H-5
V
CC
> 50 kΩ
V
CC
ESD
Protection
and
Clamping
Programming
Pins only
Provides ESD
Protection and
Clamping
V
CC
Programming
Voltage
Detection
Typical Input
V
CC
> 50 kΩ
Preload
Circuitry
Positive
Overshoot
Filter
Feedback
Programming
Circuitry
Input
16491E-12
Typical Output
DeviceRev Letter
PALCE20V8H-7A
PALCE20V8H-5A
22PALCE20V8 Family
INPUT/OUTPUT EQUIVALENT SCHEMATICS FOR /4 VERSIONS
V
CC
100 kΩ
V
0.5 kW
ESD
Protection
Input
CC
DeviceRev Letter
PALCE20V8H-10M
PALCE20V8H-15L, M
PALCE20V8H-15M
PALCE20V8H--25M
V
CC
Preload
Circuitry
V
CC
100 kΩ
0.5 kΩ
Feedback
Input
I/O
Topside Marking:
Lattice/Vantis CMOS PLDs are marked on top of the
package in the following manner:
PALCEXXX
Datecode (3 numbers) Lot ID (4 characters)––(Rev Letter)
The Lot ID and Rev Letter are separated by two spaces.
16491E-13
PALCE20V8H-25M
PALCE20V8 Family23
POWER-UP RESET
The PALCE20V8 has been designed with the capability to reset during system power-up.
Following power-up, all flip-flops will be reset to LOW. The output state will be HIGH
independent of the logic polarity. This feature provides extra flexibility to the designer and is
especially valuable in simplifying state machine initialization. A timing diagram and parameter
table are shown below. Due to the synchronous operation of the power-up reset and the wide
range of ways V
can rise to its steady state, two conditions are required to ensure a valid
CC
power-up reset. These conditions are:
◆ The V
rise must be monotonic.
CC
◆ Following reset, the clock input must not be driven from LOW to HIGH until all applicable input
and feedback setup times are met.
Parameter SymbolParameter DescriptionsMinMaxUnit
t
PR
t
S
t
WL
Power
Registered
Output
Clock
Power-Up Reset Time1000ns
Input or Feedback Setup Time
Clock Width LOW
4 V
t
PR
t
S
t
WL
See Switching Characteristics
V
CC
Figure 2. Power-Up Reset Waveform
24PALCE20V8 Family
16491E-15
TYPICAL THERMAL CHARACTERISTICS
Measured at 25°C ambient. These parameters are not tested.
Parameter
SymbolParameter Description
θ
jc
θ
ja
θ
jma
Plastic
The data listed for plastic
heat-flow paths in plastic-encapsulated devices are complex, making the
age surface. Tests indicate this measurement reference point is directly below the die-attach area on the bottom center of the package.
Furthermore,
perature. Therefore, the measurements can only be used in a similar environment.
θ
Thermal impedance, junction to case 1919°C/W
Thermal impedance, junction to ambient 7355°C/W
200 lfpm air6145°C/W
Thermal impedance, junction to ambient with air flow
Considerations
jc
θ
are for reference only and are not recommended for use in calculating junction temperatures. The
jc
θ
tests on packages are performed in a constant-temperature bath, keeping the package surface at a constant tem-
Lattice/V antis programmable logic products for commercial and industrial applications are available with several ordering options.
The order number (Valid Combination) is formed by a combination of:
FAMILY TYPE
PAL = Programmable Array Logic
TECHNOLOGY
CE = CMOS Electrically Erasable
NUMBER OF
ARRAY INPUTS
OUTPUT TYPE
V = Versatile
NUMBER OF FLIP-FLOPS
OR OUTPUTS
POWER
H = Half Power (90–125 mA I
Q = Quarter Power (55 mA I
CC
CC
)
SPEED
-5 = 5 ns t
-7 = 7.5 ns t
-10 = 10 ns t
-12 = 12 ns t
-15 = 15 ns t
-20 = 20 ns t
-25 = 25 ns t
PD
PD
PD
PD
PD
PD
PD
PALCE20 V 8 H -5 J C
)
/5
PROGRAMMING DESIGNATOR
Blank = Initial Algorithm
/4 = First Revision
/5 = Second Revision
(Same Algorithm as /4)
OPERATING CONDITIONS
C= Commercial (0
I= Industrial (-40
°C to +75°C)
°C to +85°C)
PACKAGE TYPE
P= 24-Pin 300 mil Plastic SKINNY
DIP (PD3024)
J= 28-Pin Plastic Leaded Chip
Carrier (PL 028)
Valid Combinations
PALCE20V8H-5JC
/5
PALCE20V8H-7
PC, JC
PALCE20V8H-10/4
PALCE20V8H-15PC, JC, PI, JI
PALCE20V8Q-15PC, JC
PALCE20V8Q-20PI, JI
/4
PALCE20V8H-25
PC, JC, PI, JI
PALCE20V8Q-25
Valid Combinations
V alid Combinations list configurations planned to be supported in volume for this device. Consult the local Lattice/V antis sales office
to confirm availability of specific valid combinations and to check on newly released combinations.
PALCE20V8 Family27
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