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— Complete Programmable Device Can Combine Glue
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2
USE ispLSI 1032E FOR NEW
2
CMOS® TECHNOLOGY
CMOS Technology
COMMERCIAL & INDUSTRIAL
Functional Block Diagram
Output Routing Pool
D7 D6 D5 D4 D3 D2 D1 D0
A0
Logic
Array
DQ
DQ
DQ
DQ
GLB
A1
A2
A3
A4
A5
Output Routing Pool
A6
Global Routing Pool (GRP)
A7
B0 B1 B2 B3 B4 B5 B6 B7
Output Routing Pool
Description
The ispLSI 1032 is a High-Density Programmable Logic
Device containing 192 Registers, 64 Universal I/O pins,
eight Dedicated Input pins, four Dedicated Clock Input
pins and a Global Routing Pool (GRP). The GRP provides complete interconnectivity between all of these
elements. The ispLSI 1032 features 5-Volt in-system
programming and in-system diagnostic capabilities. It is
the first device which offers non-volatile reprogrammability
of the logic, as well as the interconnect to provide truly
DESIGNS
reconfigurable systems.
The basic unit of logic on the ispLSI 1032 device is the
Generic Logic Block (GLB). The GLBs are labeled A0, A1
.. D7 (see figure 1). There are a total of 32 GLBs in the
ispLSI 1032 device. Each GLB has 18 inputs, a programmable AND/OR/XOR array, and four outputs which can
be configured to be either combinatorial or registered.
Inputs to the GLB come from the GRP and dedicated
inputs. All of the GLB outputs are brought back into the
GRP so that they can be connected to the inputs of any
other GLB on the device.
The device also has 64 I/O cells, each of which is directly
connected to an I/O pin. Each I/O cell can be individually
programmed to be a combinatorial input, registered input, latched input, output or bi-directional I/O pin with
3-state control. Additionally, all outputs are polarity selectable, active high or active low. The signal levels are
TTL compatible voltages and the output drivers can
source 4 mA or sink 8 mA.
Eight GLBs, 16 I/O cells, two dedicated inputs and one
ORP are connected together to make a Megablock (see
figure 1). The outputs of the eight GLBs are connected to
a set of 16 universal I/O cells by the ORP. The I/O cells
within the Megablock also share a common Output
Enable (OE) signal. The ispLSI 1032 device contains four
of these Megablocks.
The GRP has as its inputs the outputs from all of the GLBs
and all of the inputs from the bi-directional I/O cells. All of
these signals are made available to the inputs of the
GLBs. Delays through the GRP have been equalized to
minimize timing skew.
Clocks in the ispLSI 1032 device are selected using the
Clock Distribution Network. Four dedicated clock pins
(Y0, Y1, Y2 and Y3) are brought into the distribution
network, and five clock outputs (CLK 0, CLK 1, CLK 2,
IOCLK 0 and IOCLK 1) are provided to route clocks to the
GLBs and I/O cells. The Clock Distribution Network can
also be driven from a special clock GLB (C0 on the ispLSI
1032 device). The logic of this GLB allows the user to
create an internal clock from a combination of internal
signals within the device.
2
Specifications ispLSI 1032
Absolute Maximum Ratings
1
Supply Voltage Vcc.................................. -0.5 to +7.0V
Input Voltage Applied........................-2.5 to VCC +1.0V
Off-State Output Voltage Applied .....-2.5 to VCC +1.0V
Storage Temperature................................ -65 to 150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
Military10pfV
I/O and Clock Capacitance10pfVCC=5.0V, V
Data Retention Specifications
PARAMETER
Data Retention
Erase/Reprogram Cycles
MINIMUMMAXIMUMUNITS
20
10000
2.0
1
UNITSTEST CONDITIONS
—
—
Vcc + 1
=5.0V, VIN=2.0V
CC
V
Table 2- 0005Aisp w/mil.eps
, VY=2.0V
I/O
Table 2- 0006
Years
Cycles
Table 2- 0008B
3
Switching Test Conditions
Specifications ispLSI 1032
Input Pulse LevelsGND to 3.0V
Input Rise and Fall Time≤ 3ns 10% to 90%
Input Timing Reference Levels1.5V
Output Timing Reference Levels1.5V
Output LoadSee figure 2
3-state levels are measured 0.5V from steady-state
active level.
-
Output Load Conditions (see figure 2)
Test ConditionR1R2CL
A470Ω390Ω35pF
BActive High390Ω35pF
Active Low470Ω390Ω35pF
Active High to Z390Ω5pF
Cat V
- 0.5V
OH
Active Low to Z470Ω390Ω5pF
+ 0.5V
at V
OL
∞
∞
Figure 2. Test Load
+ 5V
R
1
Device
Output
R
2
*
CL includes Test Fixture and Probe Capacitance.
C
Test
Point
*
L
DC Electrical Characteristics
Over Recommended Operating Conditions
–
–
–
–
–
–
–
130
135
3
MAX.TYP.
0.4
–
-10
10
-150
-150
-200
190
220
UNITS
V
V
µA
µA
µA
µA
mA
mA
mA
Table 2- 0007A-32-isp
SYMBOL
V
OL
V
OH
I
IL
I
IH
I
IL-isp
I
IL-PU
1
I
OS
2,4
I
CC
PARAMETERCONDITION
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
isp Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
IOL =8 mA
=-4 mA
I
OH
0V ≤ V
3.5V ≤ V
≤ VIL (MAX.)
IN
≤ V
IN
CC
0V ≤ VIN ≤ VIL (MAX.)
0V ≤ V
VCC = 5V, V
V
f
≤ V
IN
IL
= 0.5V
OUT
= 0.5V, V
IL
= 1 MHzIndustrial/Military
TOGGLE
= 3.0V Commercial
IH
MIN.
–
2.4
–
–
–
–
–
–
–
1. One output at a time for a maximum duration of one second.
2. Measured using eight 16-bit counters.
3. Typical values are at V
4. Maximum I
varies widely with specific device configuration and operating frequency . Refer to the Power Consumption sec-
CC
= 5V and TA = 25oC.
CC
tion of this datasheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate maximum
.
I
CC
4
External Timing Parameters
Over Recommended Operating Conditions
Specifications ispLSI 1032
5
PARAMETER#
t
pd1
t
pd2
f
max (Int.)
f
max (Ext.)
f
max (Tog.)
t
su1
t
co1
t
h1
t
su2
t
co2
t
h2
t
r1
t
rw1
t
en
t
dis
t
wh
t
wl
t
su5
t
h5
1. Unless noted otherwise, all parameters use a GRP load of 4 GLBs, 20 PTXOR path, ORP and Y0 clock.
2. Refer to Timing Model in this data sheet for further details.
3. Standard 16-Bit counter using GRP feedback.
4. fmax (Toggle) may be less than 1/(twh + twl). This is to allow for a clock duty cycle of other than 50%.
5. Reference Switching Test Conditions section.
TEST
COND.
2
DESCRIPTION
A
1
Data Propagation Delay, 4PT bypass, ORP bypass
A
2
Data Propagation Delay, Worst Case Path
A
3
Clock Frequency with Internal Feedback
–
4
Clock Frequency with External Feedback
–
5
Clock Frequency, Max Toggle
–
6
GLB Reg. Setup Time before Clock, 4PT bypass
A
7
GLB Reg. Clock to Output Delay, ORP bypass
–
8
GLB Reg.
–
9
GLB Reg. Setup Time before Clock
–
10
GLB Reg. Clock to Output Delay
–
11
GLB Reg. Hold Time after Clock
A
12
Ext. Reset Pin to Output Delay
–
13
Ext. Reset Pulse Duration
B
14
Input to Output Enable
C
15
Input to Output Disable
–
16
Ext. Sync. Clock Pulse Duration, High
–
17
Ext. Sync. Clock Pulse Duration, Low
–
18
I/O Reg. Setup Time before Ext. Sync. Clock (Y2, Y3)
–
19
I/O Reg. Hold Time after Ext. Sync. Clock (Y2, Y3)
1
3
( )
4
Hold Time after Clock, 4 PT bypass
tsu2 + tco1
1
-90
MIN. MAX.
–
–
90.9
58.8
125
6
–
0
9
–
0
–
10
USE 1032E-100
–
–
4
4
2
6.5
MIN. MAX.
12
17
–
–
–
100
–
8
–
–
10
–
15
–
15
FOR NEW DESIGNS
15
–
–
–
–
6.5
-80-60
MIN. MAX.
–
15
–
–
20
–
60
–
80
38
–
50
83
–
9
–
7
–
10
–
0
–
0
13
–
10
–
12
–
0
–
0
–
17
–
13
–
10
USE 1032E-70
18
–
FOR NEW DESIGNS
18
–
–
5
–
5
–
2
–
USE 1032E-70
–
–
6
6
2.5
8.5
Table 2-0030-32/90,80,60C
UNITS
20
ns
25
ns
–
MHz
–
MHz
–
MHz
–
ns
13
ns
–
ns
–
ns
16
ns
–
ns
22.5
ns
–
ns
24
ns
FOR NEW DESIGNS
24
ns
–
ns
–
ns
–
ns
–
ns
5
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