Lattice ispPAC-POWR604 User Manual

ispPAC-POWR604
Sequencing Controller and Monitor
August 2004 Data Sheet

Features

Monitor and Control Multiple Power Supplies
• Simultaneously monitors and sequences up to six power supplies
• Sequence controller for power-up conditions
• Provides four output control signals
• Programmable digital and analog circuitry
Embedded PLD for Sequence Control
• Implements state machine and input conditional events
• In-System Programmable (ISP™) through JTAG and on-chip E2CMOS
Embedded Programmable Timers
•Two Programmable 8-bit timers (32µs to 524ms)
• Programmable time delay for pulse stretching or other power supply management
Analog Comparators for Monitoring
• Six analog comparators for monitoring
• 192 precise programmable threshold levels spanning 1.03V to 5.72V
• Each comparator can be independently cong­ured around standard logic supply voltages of
1.2V, 1.5V, 1.8V, 2.5V, 3.3V, 5V
• Other user-dened voltages possible
• Six direct comparator outputs
Embedded Oscillator
• Built-in clock generator, 250kHz
• Programmable clock frequency
• Programmable timer pre-scaler
• External clock support
Programmable Open-Drain Outputs
•Four digital outputs for logic and power supply control
• Expandable with ispMACH™ 4000 CPLD
2.25V to 5.5V Supply Range
• In-system programmable at 3.0V to 5.5V
• Industrial temperature range: -40°C to +85°C
•Automotive temperature range: -40°C to +125°C
• 44-pin TQFP package
• Lead-free package option
®

Application Block Diagram

Voltage Monitor 6 Voltage Monitor 5
2.5-5V Supply
OUT5 OUT6 OUT7 OUT8
Comp1 Comp2 Comp3 Comp4 Comp5 Comp6
POR
CREF
0.1uF1.0uF
Digital Logic
CPU_RESETN
BROWNOUT_INT
LOAD_ENABLE
POWER_OK
0.1uF
CPU/ASIC
Card etc.
V
DD
CARD_RESETN
WDT_IN
INT_ACK
DONE
6 Analog Inputs
VMON1 VMON2 VMON3 VMON4 VMON5 VMON6
CLK
RESET
IN1 IN2 IN3 IN4
VDD VDDINP
ispPAC-POWR604
Power Sequence
Controller

Description

The Lattice ispPAC system programmable logic and in-system programma­ble analog circuits to perform special functions for power supply sequencing and monitoring. The ispPAC­POWR604 device has the capability to be configured through software to control up to four outputs for power supply sequencing and six comparators monitoring sup­ply voltage limits, along with four digital inputs for inter­facing to other control circuits or digital logic. Once congured, the design is downloaded into the device through a standard JTAG interface. The circuit configu- ration and routing are stored in non-volatile E PAC-Designer, software package, gives users the ability to design the logic and sequences that control the power supplies or regulator circuits. The user has control over timing func­tions, programmable logic functions and comparator threshold values as well as I/O congurations.
®
-POWR604 incorporates both in-
2
®
an easy-to-use Windows-compatible
CMOS.
© 2004 Lattice Semiconductor Corp. All Lattice trademarks, registered trademarks, patents, and disclaimers are as listed at www.latticesemi.com/legal. All other brand or product names are trademarks or registered trademarks of their respective holders. The specications and information herein are subject to change without notice.
www.latticesemi.com
1
pwr604_02.1
Lattice Semiconductor ispPAC-POWR604 Data Sheet

Power Supply Sequence Controller and Monitor

The ispPAC-POWR604 device is specically designed as a fully-programmable power supply sequencing controller and monitor for managing up to four separate power supplies, as well as monitoring up to six analog inputs or sup­plies. The ispPAC-POWR604 device contains an internal PLD that is programmable by the user to implement digi­tal logic functions and control state machines. The internal PLD connects to two programmable timers, special purpose I/O and the programmable monitoring circuit blocks. The internal PLD and timers can be clocked by either an internal programmable clock oscillator or an external clock source.
The voltage monitors are arranged as six independent comparators each with 192 programmable trip point set­tings. Monitoring levels are set around the following standard voltages: 1.2V, 1.5V, 1.8V, 2.5V, 3.3V or 5.0V.
All six voltages can be monitored simultaneously (i.e., continuous-time operation). Other non-standard voltage lev­els can be accounted for using various scale factors.
For added robustness, the comparators feature a variable hysteresis that scales with the voltage they monitor. Generally, a larger hysteresis is better. However, as power supply voltages get smaller, that hysteresis increasingly affects trip-point accuracy. Therefore, the hysteresis is +/-16mV for 5V supplies and scales down to +/-3mV for 1.2V supplies, or about 0.3% of the trip point.
The programmable logic functions consist of a block of 20 inputs with 41 product terms and eight macrocells. The architecture supports the sharing of product terms to enhance the overall usability.
The four output pins are open-drain outputs. These outputs can be used to drive enable lines for DC/DC converters or other control logic associated with power supply control. The four outputs are driven from the macrocells.
Figure 1. ispPAC-POWR604 Block Diagram
ispPAC-POWR604
VMON1 VMON2 VMON3
VMON4 VMON5 VMON6
IN1 IN2
IN3 IN4
RESET
Analog
Inputs
Digital Inputs
5
6
6
Sequence Controller
CPLD
20 I/P & 8
Macrocell
GLB
250kHz
Internal
OSC
2 Timers
Comparator
Outputs
4
Logic
Outputs
COMP1 COMP2 COMP3 COMP4 COMP5 COMP6
OUT5 OUT6 OUT7 OUT8
CLKIO
2
Lattice Semiconductor ispPAC-POWR604 Data Sheet
Pin Descriptions
Number Name Pin Type Voltage Range Description
1NC— No Connect
2NC— No Connect
3NC— No Connect
4NC— No Connect
5 VDD Power 2.25V-5.5V Main Power Supply
6 IN1 CMOS Input VDDINP
7 IN2 CMOS Input VDDINP
8 IN3 CMOS Input VDDINP
9 IN4 CMOS Input VDDINP
10 RESET
CMOS input VDD
11 VDDINP Power 2.25V-5.5V
12 OUT5
13 OUT6
14 OUT7
15 OUT8
8
O/D Output 2.25V-5.5V
8
O/D Output 2.25V-5.5V
8
O/D Output 2.25V-5.5V
8
O/D Output 2.25V-5.5V
1, 3
1, 3
1, 3
1, 3
6
3
2
2
2
2
16 NC No Connect
17 NC No Connect
18 COMP6 O/D Output 2.25V-5.5V
19 COMP5 O/D Output 2.25V-5.5V
20 COMP4 O/D Output 2.25V-5.5V
21 COMP3 O/D Output 2.25V-5.5V
22 COMP2 O/D Output 2.25V-5.5V
23 COMP1 O/D Output 2.25V-5.5V
2
2
2
2
2
2
24 TCK TTL/LVCMOS Input VDD Test Clock (JTAG Pin)
25 POR
26 CLK Bi-directional I/O VDD
O/D Output 2.25V-5.5V Power-On-Reset Output
2, 5
27 GND Ground Ground
28 TDO TTL/LVCMOS Output VDD Test Data Out (JTAG Pin)
29 TRST
TTL/LVCMOS Input VDD
30 TDI TTL/LVCMOS Input VDD Test Data In, 50k Ohm Pull-up (JTAG Pin)
31 TMS TTL/LVCMOS Input VDD
32 VMON1 Analog Input 0V-5.72V
33 VMON2 Analog Input 0V-5.72V
34 VMON3 Analog Input 0V-5.72V
35 VMON4 Analog Input 0V-5.72V
36 VMON5 Analog Input 0V-5.72V
37 VMON6 Analog Input 0V-5.72V
4
4
4
4
4
4
38 NC No Connect
39 CREF Reference 1.17V
7
40 NC No Connect
41 NC No Connect
Input 1
Input 2
Input 3
Input 4
PLD Reset Input, Active Low
Digital Inputs Power Supply
Open-Drain Output
Open-Drain Output
Open-Drain Output
Open-Drain Output
VMON6 Comparator Output (Open-Drain)
VMON5 Comparator Output (Open-Drain)
VMON4 Comparator Output (Open-Drain)
VMON3 Comparator Output (Open-Drain)
VMON2 Comparator Output (Open-Drain)
VMON1 Comparator Output (Open-Drain)
Clock Output (Open-Drain) or Clock Input
Test Reset, Active Low, 50k Ohm Internal Pull-up (JTAG Pin, Optional Use)
Test Mode Select, 50k Ohm Internal Pull-up (JTAG Pin)
Voltage Monitor Input 1
Voltage Monitor Input 2
Voltage Monitor Input 3
Voltage Monitor Input 4
Voltage Monitor Input 5
Voltage Monitor Input 6
Reference for Internal Use, Decoupling Capacitor (.1uf Required, CREF to GND)
3
Lattice Semiconductor ispPAC-POWR604 Data Sheet
Pin Descriptions (Continued)
Number Name Pin Type Voltage Range Description
42 NC No Connect
43 NC No Connect
44 NC No Connect
1. IN1...IN4 are digital inputs to the PLD. The thresholds for these pins are referenced by the voltage on VDDINP.
2. The open-drain outputs can be powered independently of VDD and pulled up as high as +6.0V (referenced to ground). Exception, CLK pin 26 can only be pulled as high as VDD.
3. VDDINP can be chosen independent of V
4. The six VMON inputs can be biased independently of VDD. The six VMON inputs can be as high as 7.0V Max (referenced to ground).
5. CLK is the PLD clock output in master mode. It is re-routed as an input in slave mode. The clock mode is set in software during design time. In output mode it is an open-drain type pin and requires an external pull-up resistor (pullup voltage must be POWR604 devices can be tied together with one acting as the master, the master can use the internal clock and the slave can be clocked by the master. The slave needs to be set up using the clock as an input.
6. RESET
7. The CREF pin requires a 0.1µF capacitor to ground, near the device pin. This reference is used internally by the device. No additional
8. The four digital outputs (pins 12-15) are named OUT5-OUT8 to match ispPAC-POWR1208 pin names and to allow easy design migration.
is an active low INPUT pin, external pull-up resistor required. When driven low it resets all internal PLD ip-ops to zero, and may turn “ON” or “OFF” the output pins, depending on the polarity conguration of the outputs in the PLD. If a reset function is needed for the other devices on the board, the PLD inputs and outputs can be used to generate these signals. The RESET connected to the POR pin can be used if multiple ispPAC-POWR604 devices are cascaded together in expansion mode or if a manual reset button is needed to reset the PLD logic to the initial state. While using the ispPAC-POWR604 in hot-swap applications it is recommended that either the RESET pin be connected to the POR pin, or connect a capacitor to ground (such that the time constant is 10 ms with the pull-up resistor) from the RESET pin.
external circuitry should be connected to this pin.
It applies only to the four logic inputs IN1-IN4.
DD.
). Multiple ispPAC-
V
DD

Absolute Maximum Ratings

Absolute maximum ratings are shown in the table below. Stresses above those listed values may cause permanent damage to the device. Functional operation of the device at these or any other conditions above those indicated in the operating sections of this specication is not implied.
Symbol Parameter Conditions Min. Max. Units
VDD Core supply voltage at pin -0.5 6.0 V
VDD
V
VMON Input voltage applied, V
V
T
T
T
1. V
2. Digital inputs are tolerant up to 5.5V, independent of the V
1
INP
2
IN
TRI
S
A
SOL
DDINP
supply voltage for the given input logic range.
Digital input supply voltage for IN1-IN4 -0.5 6.0 V
Input voltage applied, digital inputs -0.5 6.0 V
MON
Tr istated or open drain output, external voltage applied
(CLK pin 26 pull-up
VDD).
Storage temperature -65 150 °C
Ambient temperature with power applied -55 125 °C
Maximum soldering temperature (10 sec. at 1/16 in.) 260 °C
is the supply pin that controls logic inputs IN1-IN4 only. Place 0.1µF capacitor to ground and supply the V
voltage monitor inputs -0.5 7.0 V
-0.5 6.0 V
pin with appropriate
DDINP
voltage.
DDINP
4
Lattice Semiconductor ispPAC-POWR604 Data Sheet

Recommended Operating Conditions

Symbol Parameter Conditions Min. Max. Units
V
DD
V
DDPROG
V
DDINP
V
IN
V
MON
1
2
3
Erase/Program Cycles
T
APROG
T
A
1. The ispPAC-POWR604 device must be powered from 3.0V to 5.5V during programming of the E
2. V
3. Digital inputs are tolerant up to 5.5V, independent of the V
is the supply pin that controls logic inputs IN1-IN4 only. Place 0.1µF capacitor to ground and supply the V
DDINP
supply voltge for the given input logic range.
Core supply voltage at pin 2.25 5.5 V
Core supply voltage at pin During E
2
cell programming 3.0 5.5 V
Digital input supply voltage for IN1-IN4 2.25 5.5 V
Input voltage digital inputs 0 5.5 V
Voltage monitor inputs V
MON1
- V
MON6
0 6.0 V
EEPROM, programmed at V
Ambient temperature during programming
Ambient temperature
DDINP
= 3.0V to 5.5V
DD
-40°C to +85°C
Power applied - Industrial -40 +85 °C
Power applied - Automotive -40 +125 °C
2
CMOS memory.
voltage.
1000 Cycles
-40 +85 °C
pin with appropriate
DDINP
Analog Specications
Over Recommended Operating Conditions
Symbol Parameter Conditions Min. Typ. Max. Units
I
DD
Supply Current Internal Clock = 250kHz 5 10 mA

Reference

Symbol Parameter Conditions Min. Typ. Max. Units
1
V
REF
1. CREF pin requires a 0.1µF capacitor to ground.
Reference voltage at CREF pin T = 25°C 1.17 V

Voltage Monitors

Symbol Parameter Conditions Min. Typ. Max. Units
R
IN
V
Range Programmable voltage monitor trip
MON
V
Accuracy Absolute accuracy of any trip point T = 25 °C,
MON
V
Tempco
MON
HYST Hysteresis of V
PSR Trip point sensitivity to V
1. See typical performance curves.
Input impedance 70 100 130 k
point (192 steps)
V
= 3.3V
1
Temperature drift of any trip point -40°C to +85°C 50 ppm/ °C
DD
1.03 5.72 V
-0.9 +0.9 %
-40°C to +125°C 76 ppm/ °C
V
HYST
= HYST*V
MON
input,
(+/-3 to +/-13mV)
MON
DD
V
= 3.3V, 25°C +/- 0.3% of
DD
trip point
setting
V
= 3.3V 0.06 %/V
DD
%
5
Lattice Semiconductor ispPAC-POWR604 Data Sheet

Power-on-Reset

Symbol Parameter Conditions Min. Typ. Max. Units
V
supply threshold beyond which POR
V
LPOR
V
HPOR
1. POR tests run with 10k
DD
output is guaranteed to be driven low
V
supply threshold above which POR
DD
output is guaranteed driven high, and device initializes
resistor pulled up to V
DD.
V
ramping up
DD
ramping up
V
DD
1
1
——1.15 V
——2.1 V

AC/Transient Characteristics

Over Recommended Operating Conditions
Symbol Parameter Conditions Min. Typ. Max. Units.
Voltage Monitors
t
PD5
t
PD20
Propagation Delay. Output transitions after a step input.
Propagation Delay. Output transitions after a step input.
Oscillators
f
CLK
PLDCLK Range
Internal master clock frequency Note 2 230 330 kHz
Programmable frequency range of PLD clock (8 binary steps)
PLDCLKext Max frequency of applied
external clock source
Timers
Timeout Range
1. See Typical Performance Graphs.
2. f
frequency deviation with respect to VDD, 0.4%/volt, typical.
CLK
Range of programmable time-out duration (15 steps)
Glitch lter set to 5µs. Input V
+ 100mV to V
TRIP
Glitch lter set to 20us. Input V
+ 100mV to V
TRIP
Internal Osc 250kHz
External clock applied
Internal Osc 250kHz
1
1
TRIP
TRIP
- 100mV
- 100mV
—5—µs
—20—µs
1.95 250 kHz
—— 1MHz
0.03 524 ms
Digital Specications
Over Recommended Operating Conditions
Symbol Parameter Conditions Min. Typ. Max. Units
V
I
I
IL,
IH
I
PU
V
OL
I
SINKOUT
Input or I/O leakage current, no pull-up0V
25 °C
Input pull-up current (TMS, TDI, TRST
)
Open-drain output set LOW I
Maximum sink current for logic out-
25 °C 70 µA
SINKOUT
(Note 1) puts [OUT5-OUT8], [COMP1­COMP6]
I
SINKTOTAL
1. [OUT5-OUT8] and [COMP1-COMP6] can sink up to 20mA max. per pin for LEDs, etc. However, output voltage levels may exceed VOL. Total combined sink currents from all outputs (OUT, COMP) should not exceed I
Total combined sink currents from all outputs [OUT, COMP]
(Note 1)
V
IN
DDINP
or V
DD
+/-10 µA
= 4mA 0.4 V
20 mA
80 mA
SINKTOTAL
.
6
Lattice Semiconductor ispPAC-POWR604 Data Sheet

DC Input Levels: IN1-IN4

VIL (V) VIH (V)
Standard
Min. Max. Min. Max.
CMOS, LVCMOS3.3, LVTTL, TTL -0.3 0.8 2.0 5.5
LVCMOS2.5 -0.3 0.7 1.7 5.5
Note: V V
DDINP.
is the input supply pin for IN1-IN4 digital logic input pins. The logic threshold trip point of IN1-IN4 is dependent on the voltage at
DDINP

Transient Characteristics

Over Recommended Operating Conditions
Symbol Parameter Conditions Min. Typ. Max. Units
PLD Timing
Digital Glitch Filter
t
CO
t
SU
t
H
t
PD
t
RST
1. External clock 1MHz. Open drain outputs with 2k pull-up resistor to VDD.
Note: All the above parameters apply to signal paths from the digital inputs [IN1-IN4].
Minimum pulse width to transition through glitch lter.
Clock to Out Delay. Rising edge of clock to output transition.
Time that input needs to be present when using a registered function with the clock.
Time that input needs to be held valid after the clock edge when using a registered
Applied to IN1-IN4
Stable input before clock edge (Note 1)
Data valid before clock (Note 1)
Hold data after clock
20 µs
300 ns
20 µs
0 µs
function with the clock.
Propagation delay internal to the embedded PLD
90 ns
RESET pulse width 25 µs
7
Lattice Semiconductor ispPAC-POWR604 Data Sheet

Timing for JTAG Operations

Symbol Parameter Conditions Min Typ. Max Units
t
CKMIN
t
CKH
t
CKL
t
MSS
t
MSH
t
DIS
t
DIH
t
DOZX
t
DOV
t
DOXZ
t
RSTMIN
t
PWP
t
PWE
1. t
represents programming pulse width for a single row of E2CMOS cells.
PWP
Minimum clock period 1 µs
TCK high time 200 ns
TCK low time 200 ns
TMS setup time 15 ns
TMS hold time 50 ns
TDI setup time 15 ns
TDI hold time 50 ns
TDO oat to valid delay 200 ns
TDO valid delay 200 ns
TDO valid to oat delay 200 ns
Minimum reset pulse width 40 ns
Time for a programming operation
1
40 100 ms
Time for an erase operation 40 100 ms
t
t
CKH
CKL
t
CK
t
MSS
MSH
t
MS
t
DIStDIH
t
DI
t
DOZH
t
DO
t
DOV
t
CKMIN
t
DOXZ
t
CK
t
MSS
t
MS
Program and Erase cycles
executed in Run-Test/Idle
t
PWP, tPWE
t
MSSt
8
Lattice Semiconductor ispPAC-POWR604 Data Sheet

Typical Performance Graphs

7000
6000
5000
4000
Count
3000
2000
1000
0
Trip Point Error 25°C
MON
3
Typical V
Accuracy vs. Temperature
Comparator Trip Point
MON
Propagation Delay vs. OverdriveV
125
100
Glitch Filter = 20µs
75
50
Propagation Delay (µs)
25
Glitch Filter = 5µs
0
10-1 -0.8 -0.6 -0.4 -0.2 0 10.2 0.4 0.6 0.8 20 50 100 200
Input Overdrive (mV)Trip Point Error %
Note: Typical propagation delay of V as a function of overdrive beyond selected trip point.
inputs to outputs
MON
2.5
2
1.5
% Error
1
0.5
0
-0.5
-50 0 50 100 150
Temperature (°C)
9
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