Lattice ispLSI 2032E User Manual

ispLSI® 2032E
In-System Programmable
SuperFAST™ High Density PLD

Features

• SuperFAST HIGH DENSITY IN-SYSTEM PROGRAMMABLE LOGIC — 1000 PLD Gates — 32 I/O Pins, Two Dedicated Inputs — 32 Registers — High Speed Global Interconnect — Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc. — Small Logic Block Size for Random Logic — 100% Functionally and JEDEC Upward Compatible
with ispLSI 2032 Devices
2
• HIGH PERFORMANCE E
fmax = 225 MHz Maximum Operating Frequency — tpd = 3.5 ns Propagation Delay — TTL Compatible Inputs and Outputs — 5V Programmable Logic Core — ispJTAG™ In-System Programmable via IEEE 1149.1
(JTAG) Test Access Port — User-Selectable 3.3V or 5V I/O (48-Pin Package Only)
Supports Mixed Voltage Systems — PCI Compatible Outputs (48-Pin Package Only) — Open-Drain Output Option — Electrically Erasable and Reprogrammable — Non-Volatile — Unused Product Term Shutdown Saves Power
• ispLSI OFFERS THE FOLLOWING ADDED FEATURES — Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
— Reprogram Soldered Devices for Faster Prototyping
• OFFERS THE EASE OF USE AND FAST SYSTEM SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY OF FIELD PROGRAMMABLE GATE ARRAYS
— Complete Programmable Device Can Combine Glue
Logic and Structured Designs — Enhanced Pin Locking Capability — Three Dedicated Clock Input Pins — Synchronous and Asynchronous Clocks — Programmable Output Slew Rate Control to
Minimize Switching Noise — Flexible Pin Placement — Optimized Global Routing Pool Provides Global
Interconnectivity
CMOS® TECHNOLOGY

Functional Block Diagram

GLB
Global Routing Pool
(GRP)
DQ
DQ
Logic Array
DQ
DQ
A7
A6
A5
A4
Input Bus
Output Routing Pool (ORP)
0139Bisp/2000
A0
A1
Input Bus
A2
Output Routing Pool (ORP)
A3

Description

The ispLSI 2032E is a High Density Programmable Logic Device. The device contains 32 Registers, 32 Universal I/O pins, two Dedicated Input Pins, three Dedicated Clock Input Pins, one dedicated Global OE input pin and a Global Routing Pool (GRP). The GRP provides com­plete interconnectivity between all of these elements. The ispLSI 2032E features 5V in-system programmabil­ity and in-system diagnostic capabilities. The ispLSI 2032E offers non-volatile reprogrammability of the logic, as well as the interconnect to provide truly reconfigurable systems.
The basic unit of logic on the ispLSI 2032E device is the Generic Logic Block (GLB). The GLBs are labeled A0, A1 .. A7 (see Figure 1). There are a total of eight GLBs in the ispLSI 2032E device. Each GLB is made up of four macrocells. Each GLB has 18 inputs, a programmable AND/OR/Exclusive OR array, and four outputs which can be configured to be either combinatorial or registered. Inputs to the GLB come from the GRP and dedicated inputs. All of the GLB outputs are brought back into the GRP so that they can be connected to the inputs of any GLB on the device.
The device also has 32 I/O cells, each of which is directly connected to an I/O pin. Each I/O cell can be individually
Copyright © 2003 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
2032e_05 1
November 2003
Functional Block Diagram
E
Figure 1. ispLSI 2032E Functional Block Diagram
GOE 0
Specifications ispLSI 2032E
I/O 0 I/O 1 I/O 2 I/O 3
I/O 4 I/O 5 I/O 6 I/O 7
I/O 8
I/O 9 I/O 10 I/O 11
I/O 12 I/O 13 I/O 14 I/O 15
TDI/IN 0
TDO/IN 1
TMS
BSCAN
Notes: *Y1 and RESET are multiplexed on the same pin
A0
A1
Input Bus
A2
Output Routing Pool (ORP)
A3
Global Routing Pool
programmed to be a combinatorial input, output or bi­directional I/O pin with 3-state control. The signal levels are TTL compatible voltages and the output drivers can source 4 mA or sink 8 mA. Each output can be pro­grammed independently for fast or slow output slew rate to minimize overall output switching noise. By connecting the VCCIO pins to a common 5V or 3.3V power supply, I/O output levels can be matched to 5V or 3.3V compat­ible voltages. When connected to a 5V supply, the I/O pins provide PCI-compatible output drive (48-pin device only).
Eight GLBs, 32 I/O cells, two dedicated inputs and two ORPs are connected together to make a Megablock (see Figure 1). The outputs of the eight GLBs are connected to a set of 32 universal I/O cells by the ORP. Each ispLSI 2032E device contains one Megablock.
The GRP has as its inputs, the outputs from all of the GLBs and all of the inputs from the bi-directional I/O cells. All of these signals are made available to the inputs of the GLBs. Delays through the GRP have been equalized to minimize timing skew.
I/O 31
Input Bus
0139/2032
I/O 30 I/O 29 I/O 28
I/O 27 I/O 26 I/O 25 I/O 24
I/O 23 I/O 22 I/O 21 I/O 20
I/O 19 I/O 18 I/O 17 I/O 16
(GRP)
Y1*
TCK/Y2
A7
A6
A5
Output Routing Pool (ORP)
A4
CLK 1
CLK 2
CLK 0
Y0
Clocks in the ispLSI 2032E device are selected using the dedicated clock pins. Three dedicated clock pins (Y0, Y1, Y2) or an asynchronous clock can be selected on a GLB basis. The asynchronous or Product Term clock can be generated in any GLB for its own clock.
Programmable Open-Drain Outputs
In addition to the standard output configuration, the outputs of the ispLSI 2032E are individually program­mable, either as a standard totem-pole output or an open-drain output. The totem-pole output drives the specified Voh and Vol levels, whereas the open-drain output drives only the specified Vol. The Voh level on the open-drain output depends on the external loading and pull-up. This output configuration is controlled by a pro­grammable fuse. The default configuration when the device is in bulk erased state is totem-pole configuration. The open-drain/totem-pole option is selectable through the Lattice software tools.
2
Specifications ispLSI 2032E

Absolute Maximum Ratings

1
Supply Voltage Vcc.................................. -0.5 to +7.0V
Input Voltage Applied........................-2.5 to VCC +1.0V
Off-State Output Voltage Applied .....-2.5 to VCC +1.0V
Storage Temperature................................ -65 to 150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).
DC Recommended Operating Condition
SYMBOL
V
CC CCIO
IL IH
1
V V
V
1. 3.3V I/O operation not available for 44-pin packages.
Supply Voltage: Logic Core, Input Buffers Supply Voltage: Output Drivers
Input Low Voltage Input High Voltage
PARAMETER
5V
3.3V
TA = 0°C to +70°C
MIN. MAX. UNITS
4.75
4.75 5.25 V
3.0 3.6 V 0
2.0
5.25
0.8
V
cc
+1
V
V V
Table 2-0005/2032E
Capacitance (TA=25°C, f=1.0 MHz)
SYMBOL
C
1
C
2
C
3
Dedicated Input Capacitance I/O Capacitance Clock Capacitance
PARAMETER

Erase/Reprogram Specification

PARAMETER MINIMUM MAXIMUM UNITS
Erase/Reprogram Cycles
TYP
10
10,000 Cycles
UNITS TEST CONDITIONS
6 7
pf pf pf V = 5.0V, V = 2.0V
V = 5.0V, V = 2.0V
CC
V = 5.0V, V = 2.0V
CC I/O
CC Y
IN
Table 2-0006/2032E
Table 2-0008/2032E
3

Switching Test Conditions

Specifications ispLSI 2032E
Input Pulse Levels Input Rise and Fall Time 10% to 90%
Input Timing Reference Levels Output Timing Reference Levels Output Load 3-state levels are measured 0.5V from
steady-state active level.
GND to 3.0V
1.5 ns
1.5V
1.5V
See Figure 2
Table 2-0003/2032E
Figure 2. Test Load
Device Output
+ 5V
R
1
R
2
*
C
L
Output Load Conditions (see Figure 2)
*
TEST CONDITION R1 R2 CL
CL includes Test Fixture and Probe Capacitance.
A 470 390 35pF
Active High
B
Active Low Active High to Z
at V -0.5V
C
Active Low to Z at V +0.5V
OH
OL
390 35pF
470 390 35pF
390 5pF
470 390 5pF
Table 2 - 0004A

DC Electrical Characteristics

Over Recommended Operating Conditions
SYMBOL
VOL VOH IIL
IIH
IIL-PU
1
IOS
2,4,6
ICC
Output Low Voltage Output High Voltage Input or I/O Low Leakage Current
Input or I/O High Leakage Current
I/O Active Pull-Up Current, non-PCI I/O Active Pull-Up Current, PCI
Output Short Circuit Current, non-PCI Output Short Circuit Current, PCI
Operating Power Supply Current
PARAMETER
I
= 8 mA
OL
= -4 mA
I
OH
0V V
IN
- 0.2)V VIN V
(V
CCIO
V
V
CCIO
0V V
5
5
IN
0V VIN 2.0V -10 -250 µA
= 5V, V
V
CCIO
V
= 5.0V or 3.3V, V
CCIO
V
= 0.0V, VIH = 3.0V
IL
f
TOGGLE
1. One output at a time for a maximum duration of one second (V
2. Meaured using two 16-bit counters.
3. Typical values are at V
= 5V and TA = 25°C.
CC
4. Unused inputs held at 0.0V.
5. Available in 48-pin package only.
6. Maximum I
varies widely with specific device configuration and operating frequency. Refer to the
CC
Power Consumption section of this data sheet and the Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate maximum I
CC
.
CONDITION MIN. TYP.
VIL (Max.)
CCIO
5.25V
IN
2.0V
= 0.5V
OUT
= 0.5V -240 mA
OUT
-225/-200
= 1 MHz
= 0.5V). Characterized, but not 100% tested.
OUT
Others mA
1
2.4 – – –
-10
–85 mA– –65
3
– – – – – –
MAX. UNITS
0.4 –
-10
10 10
-150
-200
Table 2-0007/2032E
Test
Point
0213A
V V
µA µA µA µA
mA
4

External Timing Parameters

Over Recommended Operating Conditions
Specifications ispLSI 2032E
PARAMETER
tpd1 tpd2 fmax
fmax (Ext.) fmax (Tog.) tsu1 tco1 th1 tsu2 tco2 th2 tr1 trw1 tptoeen tptoedis tgoeen tgoedis twh twl
1. Unless noted otherwise, all parameters use a GRP load of four GLBs, 20 PTXOR path, ORP and Y0 clock.
2. Refer to Timing Model in this data sheet for further details.
3. Standard 16-bit counter using GRP feedback.
4. Reference Switching Test Conditions section.
TEST
COND.
A1Data Prop. Delay, 4PT Bypass, ORP Bypass 3.5 5.0 ns A2Data Prop. Delay ns A3Clk Frequency with Int. Feedback
–4Clk Frequency with Ext. Feedback MHz –5Clk Frequency, Max. Toggle MHz –6GLB Reg. Setup Time before Clk, 4 PT Bypass ns A7GLB Reg. Clk to Output Delay, ORP Bypass ns –8GLB Reg. Hold Time after Clk, 4 PT Bypass 0.0 ns –9GLB Reg. Setup Time before Clk 3.5 ns –10GLB Reg. Clk to Output Delay ns –11GLB Reg. Hold Time after Clk 0.0 ns A12Ext. Reset Pin to Output Delay, ORP Bypass ns –13Ext. Reset Pulse Duration 3.5 ns B14Input to Output Enable ns C15Input to Output Disable ns B16Global OE Output Enable ns C17Global OE Output Disable ns –18Ext. Synch. Clk Pulse Duration, High 2.0 ns –19Ext. Synch. Clk Pulse Duration, Low 2.0 ns
2
4
DESCRIPTION#
1
3
( )
1 tsu2 + tco1
-225
MIN. MAX.
3.5 –
5.5
225
2.5 –
2.5
0.0
3.5 –
3.5
0.0 –
5.0
3.5 –
7.0
7.0
3.5
3.5
2.0
2.0
– – –
– –
167 250
-200
MIN.
200 180 MHz 167 250
2.5
USE 2032E-225 FOR
MIN.MAX. MAX.
5.5
125 200
3.0
2.5 –
0.0
4.0
3.5 –
0.0
5.0 –
4.0
7.0
NEW DESIGNS
7.0
3.5
3.5
2.5
2.5
-180 UNITS
7.5
4.0
4.5
6.5
10.0
10.0
5.0
5.0
Table 2-0030A/2032E
5
External Timing Parameters
Over Recommended Operating Conditions
Specifications ispLSI 2032E
PARAMETER
tpd1 tpd2 fmax
fmax (Ext.) fmax (Tog.) tsu1 tco1 th1 tsu2 tco2 th2 tr1 trw1 tptoeen tptoedis tgoeen tgoedis twh twl
1. Unless noted otherwise, all parameters use a GRP load of four GLBs, 20 PTXOR path, ORP and Y0 clock.
2. Refer to Timing Model in this data sheet for further details.
3. Standard 16-bit counter using GRP feedback.
4. Reference Switching Test Conditions section.
TEST
COND.
A1Data Propagation Delay, 4PT Bypass, ORP Bypass 7.5 10.0 ns A2Data Propagation Delay ns A3Clock Frequency with Internal Feedback
–4Clock Frequency with External Feedback MHz –5Clock Frequency, Max. Toggle MHz –6GLB Register Setup Time before Clock, 4 PT Bypass ns A7GLB Register Clock to Output Delay, ORP Bypass ns –8GLB Register Hold Time after Clock, 4 PT Bypass 0.0 ns –9GLB Register Setup Time before Clock 5.5 ns –10GLB Register Clock to Output Delay ns –11GLB Register Hold Time after Clock 0.0 ns A12External Reset Pin to Output Delay, ORP Bypass ns –13External Reset Pulse Duration 5.0 ns B14Input to Output Enable ns C15Input to Output Disable ns B16Global OE Output Enable ns C17Global OE Output Disable ns –18External Synchronous Clock Pulse Duration, High 3.0 ns –19External Synchronous Clock Pulse Duration, Low 3.0 ns
2
4
DESCRIPTION#
1
3
1
( )
tsu2 + tco1
-135
10.0
4.5 –
5.5 –
9.0 –
12.0
12.0
6.0
6.0
MIN.MAX. MAX.
77.0 125
5.5
0.0
7.5
0.0
6.5
4.0
4.0
MIN.
137 111 MHz 100 167
4.0
-110 UNITS
13.0
5.5
6.5
12.5
14.5
14.5
7.0
7.0
Table 2-0030B/2032E
6
Specifications ispLSI 2032E

Internal Timing Parameters

PARAMETER
Inputs
tio tdin
GRP
tgrp
GLB
t4ptbpc t4ptbpr t1ptxor t20ptxor txoradj tgbp tgsu tgh tgco tgro tptre tptoe tptck
ORP
torp torpbp
Outputs
tob tsl
toen todis tgoe
Clocks
tgy0 tgy1/2
Global Reset
tgr
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR adjacent path can only be used by hard macros.
2
20 Input Buffer Delay 0.6 ns 21 Dedicated Input Delay 1.3 ns
22 GRP Delay 0.7 ns
23 4 Product Term Bypass Path Delay (Combinatorial) 1.8 ns 24 4 Product Term Bypass Path Delay (Registered) 2.8 ns 25 1 Product Term/XOR Path Delay 3.8 ns 26 20 Product Term/XOR Path Delay 3.8 ns 27 XOR Adjacent Path Delay 3.8 ns 28 GLB Register Bypass Delay 0.0 ns 29 GLB Register Setup Time before Clock 0.3 ns 30 GLB Register Hold Time after Clock 2.7 ns 31 GLB Register Clock to Output Delay 0.7 ns 32 GLB Register Reset to Output Delay 1.1 ns 33 GLB Product Term Reset to Register Delay 2.9 ns 34 GLB Product Term Output Enable to I/O Cell Delay 5.9 ns 35 GLB Product Term Clock Delay 1.5 3.7 ns
36 ORP Delay 1.1 ns 37 ORP Bypass Delay 0.6 ns
38 Output Buffer Delay 1.3 ns 39 Output Slew Limited Delay Adder 1.5 ns
40 I/O Cell OE to Output Enabled 2.8 ns 41 I/O Cell OE to Output Disabled 2.8 ns 42 Global Output Enable 2.2 ns
43
Clock Delay, Y0 to Global GLB Clock Line (Ref. clock) 1.2 1.4 1.4 ns
44 Clock Delay, Y1 or Y2 to Global GLB Clock Line 1.4 1.6 1.6 ns
45
Global Reset to GLB
1
Over Recommended Operating Conditions
DESCRIPTION#
3
-225
MIN. MAX.
0.6
1.3
0.7
1.2
1.2
2.2
2.2
2.2
0.0
0.8 –
1.7
0.7
1.3
2.5
4.2
0.3 2.8
––1.0
0.0
1.0
1.5
1.5
1.5
2.0
0.8
0.8
1.0
1.0
2.7
-200
MIN.
0.4
1.3
0.7
1.8
1.8
2.8
2.8
2.8
0.0
0.8
1.7
0.7
2.9
2.5
4.4
0.7 3.2
1.0
0.0
0.6
1.5
1.5
1.5
USE 2032E-225 FOR NEW DESIGNS
2.0
1.2
1.4
––3.5 ns
2.7
-180
MIN.MAX. MAX.
Table 2-0036A/2032E
UNITS
7
Specifications ispLSI 2032E
Internal Timing Parameters
PARAMETER
Inputs
t
io
t
din
GRP
t
grp
GLB
t
4ptbpc
t
4ptbpr
t
1ptxor
t
20ptxor
t
xoradj
t
gbp
t
gsu
t
gh
t
gco
t
gro
t
ptre
t
ptoe
t
ptck
ORP
t
orp
t
orpbp
Outputs
t
ob
t
sl
t
oen
t
odis
t
goe
Clocks
t
gy0
t
gy1/2
Global Reset
t
gr
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR adjacent path can only be used by hard macros.
2
20 Input Buffer Delay 1.7 ns 21 Dedicated Input Delay 3.4 ns
22 GRP Delay 1.7 ns
23 4 Product Term Bypass Path Delay (Combinatorial) 4.9 ns 24 4 Product Term Bypass Path Delay (Registered) 4.8 ns 25 1 Product Term/XOR Path Delay 6.2 ns 26 20 Product Term/XOR Path Delay 6.8 ns 27 XOR Adjacent Path Delay 7.5 ns 28 GLB Register Bypass Delay 0.1 ns 29 GLB Register Setup Time before Clock 0.5 ns 30 GLB Register Hold Time after Clock 4.0 ns 31 GLB Register Clock to Output Delay 0.6 ns 32 GLB Register Reset to Output Delay 1.8 ns 33 GLB Product Term Reset to Register Delay 5.9 ns 34 GLB Product Term Output Enable to I/O Cell Delay 7.1 ns 35 GLB Product Term Clock Delay 4.0 7.0 ns
36 ORP Delay 1.5 ns 37 ORP Bypass Delay 0.5 ns
38 Output Buffer Delay 1.2 ns 39 Output Slew Limited Delay Adder 10.0 ns
40 I/O Cell OE to Output Enabled 4.0 ns 41 I/O Cell OE to Output Disabled 4.0 ns 42 Global Output Enable 3.0 ns
43
Clock Delay, Y0 to Global GLB Clock Line (Ref. clock) 2.3 3.2 3.2 ns
44 Clock Delay, Y1 or Y2 to Global GLB Clock Line 2.3 3.2 3.2 ns
45
Global Reset to GLB
1
DESCRIPTION#
3
-135
MIN.
1.1
2.4
1.3
3.6
3.6
5.0
5.1
5.6
0.0
0.3
3.0
0.7
1.1
4.4
6.4
2.9 5.2
1.3
0.3
1.2
10.0
3.2
3.2
2.8
2.3
2.3
––9.0 ns
6.4
-110
MIN.MAX. MAX.
Table 2-0036B/2032E
UNITS
8

ispLSI 2032E Timing Model

Specifications ispLSI 2032E
I/O CellORPGLBGRPI/O Cell
Feedback
Ded. In
I/O Pin (Input)
Reset
Y0,1,2
GOE 0
#21
I/O Delay
#20
GRP
#22
#45
#43, 44
#42
Comb 4 PT Bypass #23
Reg 4 PT Bypass
#24
20 PT
XOR Delays
#25, 26, 27
Control
RE
PTs
OE CK
#33, 34,
35
Derivations of tsu, th and tco from the Product Term Clock
tsu Logic + Reg su - Clock (min)
th Clock (max) + Reg h - Logic
tco Clock (max) + Reg co + Output
=
tio + tgrp + t20ptxor) + (tgsu) - (tio + tgrp + tptck(min))
=
( (#20 + #22 + #26) + (#29) - (#20 + #22 + #35)
=
(0.6 + 0.7 + 2.2) + (0.8) - (0.6 + 0.7 + 0.3)
=
2.7 =
tio + tgrp + tptck(max)) + (tgh) - (tio + tgrp + t20ptxor)
(
=
(#20 + #22 + #35) + (#30) - (#20 + #22 + #26)
=
(0.6 + 0.7 + 2.8) + (1.7) - (0.6 + 0.7 + 2.2)
=
2.3 =
tio + tgrp + tptck(max)) + (tgco) + (torp + tob)
(
=
(#20 + #22 + #35) + (#31) + (#36 + #38)
=
(0.6 + 0.7 + 2.8) + (0.7) + (1.0 + 1.0)
=
6.8
GLB Reg Bypass ORP Bypass
#28
GLB Reg
Delay
DQ RST
#29, 30,
31, 32
#37
ORP
Delay
#36
#40, 41
0491/2032E
#38, #39
I/O Pin
(Output)
Note: Calculations are based upon timing specifications for the ispLSI 2032E-225L
Table 2-0042/2032E
9

Power Consumption

Specifications ispLSI 2032E
Power consumption in the ispLSI 2032E device depends on two primary factors: the speed at which the device is operating and the number of Product Terms used.
Figure 3. Typical Device Power Consumption vs fmax
150 140 130 120 110
100
90
CC (mA)
I
80 70
60 50
Figure 3 shows the relationship between power and operating speed.
ispLSI 2032E-225 and -200
ispLSI 2032E-180 and Slower
40
120406080100 120 140 160 180 200 220 240
f
max (MHz)
Notes: Configuration of two 16-bit counters
Typical current at 5V, 25°C
ICC can be estimated for the ispLSI 2032E using the following equation: For 2032E-225 and -200: ICC = 4.5 + (# of PTs * 1.3) + (# of nets * Max freq * 0.0035)
For 2032E-180 and Slower: I
= 4.5 + (# of PTs * 1.02) + (# of nets * Max freq * 0.0035)
CC
Where: # of PTs = Number of Product Terms used in design # of nets = Number of Signals used in device Max freq = Highest Clock Frequency to the device (in MHz)
The I loads on average exists. These values are for estimates only. Since the value of I conditions and the program in the device, the actual I
estimate is based on typical conditions (VCC = 5.0V, room temperature) and an assumption of two GLB
CC
is sensitive to operating
CC
should be verified.
CC
0127A/2032E
10
Pin Description
Specifications ispLSI 2032E
44-PIN PLCC
NAME
I/O 0 - I/O 3 I/O 4 - I/O 7 I/O 8 - I/O 11 I/O 12 - I/O 15 I/O 16 - I/O 19 I/O 20 - I/O 23 I/O 24 - I/O 27 I/O 28 - I/O 31
Y0
RESET/Y1
BSCAN
1
TDI/IN 0
TMS/NC
TDO/IN 1
TCK/Y2
VCC VCCIO
1. Pins have dual function capability.
2. NC pins are not to be connected to any active signals, V
2
1
1
PIN NUMBERS
15,
16, 20, 26, 30, 38, 42, 4, 8,
17, 21, 27, 31, 39, 43, 5, 9,
19, 25, 29, 37, 41, 3, 7,
11
35
13
14
36
24
33
1, 23GND 12, 34
PIN NUMBERS
18,
9,
22,
13,
28,
19,
32,
23,
40,
31
44,
35,
6,
41,
10
1, 40 5
29
7
8
30
18
27
17, 39 6, 28
44-PIN TQFP
10,
11,
14,
15,
20,
21,
24,
25,
32,
33,
36,
37,
42,
43,
2,
3,
48-PIN TQFP
PIN NUMBERS
9,
12,
14,
16,
20,
22,
25,
26,
33,
34,
38,
38,
44,
44,
1,
4
43 5
31
7
8
32
19
29
12, 18, 36, 42 6, 30
24, 48
or GND.
CC
10, 15, 21, 26, 34, 39, 45, 2,
11, 16, 22, 27, 35, 40, 46, 3,
DESCRIPTION
13,
Input/Output Pins — These are the general purpose
17,
I/O pins used by the logic array. 23, 28, 37, 41, 47, 4
Global Output Enable input pin.2GOE 0
Dedicated Clock input. This clock input is connected to
one of the clock inputs of all the GLBs on the device.
This pin performs two functions:
- Dedicated clock input. This clock input is brought
into the Clock Distribution Network, and can optionally
be routed to any GLB and/or I/O cell on the device.
- Active Low (0) Reset pin which resets all of the GLB
and I/O registers in the device.
Input — Dedicated in-system programming enable
input pin. This pin is brought low to enable the
programming mode. The TMS, TDI, TDO and TCK
controls become active.
Input — This pin performs two functions. When BSCAN is logic low, it functions as an input pin to load programming data into the device. TDI/IN0 also is used as one of the two control pins for the ISP state machine. When BSCAN is high, it functions as a dedicated input pin.
Input — When in ISP mode, controls operation of ISP
state machine.
Output/Input — This pin performs two functions. When
BSCAN is logic low, it functions as an output pin to
read serial shift register data. When BSCAN is high, it
functions as a dedicated input pin.
Input — This pin performs two functions. When
BSCAN is logic low, it functions as a clock pin for the
Serial Shift Register. When BSCAN is high, it
functions as a dedicated clock input. This clock input
is brought into the Clock Distribution Network and
can be routed to any GLB and/or I/O cell on the
device.
Ground (GND)
V
CC
Supply voltage for output drivers, 5V or 3.3V. All
VCCIO pins must be connected to the same voltage
level.
Table 2-0002/2032E
11
Pin Configuration
ispLSI 2032E 44-Pin PLCC Pinout Diagram
618519420321222123442443254226412740
I/O 27
I/O 26
I/O 25
I/O 24
GOE 0
GND
Specifications ispLSI 2032E
I/O 23
I/O 22
I/O 21
I/O 20
I/O 19
I/O 28 I/O 29 I/O 30 I/O 31
BSCAN
1
TDI/IN 0
1. Pins have dual function capability.
2. NC pins are not to be connected to any active signals, V
Y0
VCC
I/O 0 I/O 1 I/O 2
7 8 9 10 11 12 13 14 15 16 17
ispLSI 2032E 44-Pin TQFP Pinout Diagram
441243134214411540163917381837193620352134
ispLSI 2032E
Top View
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
GND
I/O 27
I/O 26
I/O 25
I/O 24
GOE 0
GND
I/O 8
TDO/IN 1
1
I/O 23
I/O 22
I/O 9
I/O 10
I/O 21
I/O 20
28
I/O 11
I/O 19
39 38 37 36 35 34 33 32 31 30 29
or GND.
CC
I/O 18 I/O 17 I/O 16 TMS/NC RESET/Y1 VCC
1
TCK/Y2 I/O 15 I/O 14 I/O 13 I/O 12
44PLCC/2032E
2
1
I/O 28 I/O 29 I/O 30 I/O 31
BSCAN
1
TDI/IN 0
1 2 3 4 5
Y0
VCC
6 7 8
I/O 0
9
I/O 1
10
I/O 2
11
1. Pins have dual function capability.
2. NC pins are not to be connected to any active signals, VCC or GND.
ispLSI 2032E
Top View
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
GND
I/O 8
TDO/IN 1
1
I/O 9
22
I/O 10
I/O 11
33 32 31 30 29 28 27 26 25 24 23
12
I/O 18 I/O 17 I/O 16 TMS/NC RESET/Y1 VCC
1
TCK/Y2 I/O 15 I/O 14 I/O 13 I/O 12
44TQFP/2032E
2
1
Pin Configuration
ispLSI 2032E 48-Pin TQFP Pinout Diagram
VCCIO
471346144515441643174218411940203921382237
48
I/O 28 I/O 29 I/O 30 I/O 31
BSCAN
1
TDI/IN 0
1 2 3 4 5
Y0
6
VCC
7 8 9
I/O 0
10
I/O 1
11
I/O 2 GND 12
I/O 27
I/O 26
I/O 25
I/O 24
GOE 0
GND
I/O 23
ispLSI 2032E
Top View
Specifications ispLSI 2032E
I/O 22
I/O 21
I/O 20
I/O 19
GND36
35
I/O 18
34
I/O 17
33
I/O 16
2
TMS/NC RESET/Y1 VCC
1
TCK/Y2 I/O 15 I/O 14 I/O 13 I/O 12
1
23
32 31 30 29 28 27 26 25
24
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
1. Pins have dual function capability.
2. NC pins are not to be connected to any active signals, V
GND
TDO/IN 1
1
I/O 8
I/O 9
I/O 10
I/O 11
VCCIO
or GND.
CC
48TQFP/2032E
13

Part Number Description

Specifications ispLSI 2032E
ispLSI 2032E XXX X XXX
Device Family
Device Number Speed
225 = 225 MHz fmax 200 = 200 MHz fmax 180 = 180 MHz fmax 135 = 135 MHz fmax 110 = 110 MHz fmax
ispLSI 2032E Ordering Information
FAMILY fmax (MHz)
225 225 225
200 3.5 180 44-Pin PLCC5.0 ispLSI 2032E-180LJ44
180
ispLSI
*2032E-225 recommended for new designs.
180 135 135 135 110 44-Pin PLCC10.0 110 110
tpd (ns)
3.5
3.5
3.5
5.0
7.5
7.5
7.5
10.0
COMMERCIAL
ORDERING NUMBER PACKAGE
ispLSI 2032E-225LJ44
ispLSI 2032E-225LT44
ispLSI 2032E-200LT48*
ispLSI 2032E-180LT44
ispLSI 2032E-135LJ44
ispLSI 2032E-135LT44
ispLSI 2032E-110LJ44 ispLSI 2032E-110LT44
X
Grade
Blank = Commercial
Package
J44 = PLCC T44 = TQFP T48 = TQFP
Power
L = Low
0212/2032E
44-Pin PLCC 44-Pin TQFP 48-Pin TQFPispLSI 2032E-225LT48
48-Pin TQFP
44-Pin TQFP5.0 48-Pin TQFPispLSI 2032E-180LT48 44-Pin PLCC 44-Pin TQFP 48-Pin TQFPispLSI 2032E-135LT48
44-Pin TQFP10.0 48-Pin TQFPispLSI 2032E-110LT48
Table 2-0041/2032E
14
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