The ispLSI 1048E is a High-Density Programmable Logic
Device containing 288 Registers, 96 Universal I/O pins,
12 Dedicated Input pins, four Dedicated Clock Input pins,
two dedicated Global OE input pins, and a Global Routing
Pool (GRP). The GRP provides complete interconnectivity
between all of these elements. The ispLSI 1048E features 5V in-system programmability and in-system
diagnostic capabilities. The ispLSI 1048E offers nonvolatile reprogrammability of the logic, as well as the
interconnect to provide truly reconfigurable systems. A
functional superset of the ispLSI 1048 architecture, the
ispLSI 1048E device adds two new global output enable
pins and two additional dedicated inputs.
The basic unit of logic on the ispLSI 1048E device is the
Generic Logic Block (GLB). The GLBs are labeled A0,
A1…F7 (see Figure 1). There are a total of 48 GLBs in the
ispLSI 1048E device. Each GLB has 18 inputs, a programmable AND/OR/Exclusive OR array, and four outputs
which can be configured to be either combinatorial or
registered. Inputs to the GLB come from the GRP and
dedicated inputs. All of the GLB outputs are brought back
into the GRP so that they can be connected to the inputs
of any other GLB on the device.
The device also has 96 I/O cells, each of which is directly
connected to an I/O pin. Each I/O cell can be individually
programmed to be a combinatorial input, registered input, latched input, output or bi-directional
I/O pin with 3-state control. The signal levels are TTL
compatible voltages and the output drivers can source 4
mA or sink 8 mA. Each output can be programmed
independently for fast or slow output slew rate to minimize overall output switching noise.
Eight GLBs, 16 I/O cells, two dedicated inputs and one
ORP are connected together to make a Megablock (see
figure 1). The outputs of the eight GLBs are connected to
a set of 16 universal I/O cells by the ORP. Each ispLSI
1048E device contains six Megablocks.
The GRP has, as its inputs, the outputs from all of the
GLBs and all of the inputs from the bi-directional I/O cells.
All of these signals are made available to the inputs of the
GLBs. Delays through the GRP have been equalized to
minimize timing skew.
Clocks in the ispLSI 1048E device are selected using the
Clock Distribution Network. Four dedicated clock pins
(Y0, Y1, Y2 and Y3) are brought into the distribution
network, and five clock outputs (CLK 0, CLK 1, CLK 2,
IOCLK 0 and IOCLK 1) are provided to route clocks to the
GLBs and I/O cells. The Clock Distribution Network can
also be driven from a special clock GLB (D0). The logic
of this GLB allows the user to create an internal clock
from a combination of internal signals within the device.
2
Specifications ispLSI 1048E
Absolute Maximum Ratings
1
Supply Voltage Vcc. ................................. -0.5 to +7.0V
Input Voltage Applied........................-2.5 to VCC +1.0V
Off-State Output Voltage Applied .....-2.5 to VCC +1.0V
Storage Temperature................................ -65 to 150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
Input Pulse Levels
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
3-state levels are measured 0.5V from
steady-state active level.
GND to 3.0V
≤ 3 ns 10% to 90%
1.5V
1.5V
See Figure 2
Table 2-0003/1048E
Output Load Conditions (see Figure 2)
TEST CONDITIONR1R2CL
A470Ω390Ω35pF
Active High
B
Active Low
Active High to Z
at V -0.5V
C
Active Low to Z
at V +0.5V
OH
OL
∞390Ω35pF
470Ω390Ω35pF
∞390Ω5pF
470Ω390Ω5pF
Table 2-0004a
Figure 2. Test Load
+ 5V
R
1
Device
Output
R
2
*
CL includes Test Fixture and Probe Capacitance.
*
C
L
Test
Point
0213a
DC Electrical Characteristics
Over Recommended Operating Conditions
–
–
–
–
–
–
–
175
175
3
0.4
–
-10
10
-150
-150
-200
–
–
Table 2-0007/1048E
µA
µA
µA
µA
mA
mA
mA
SYMBOL
V
OL
V
OH
I
IL
I
IH
I
IL-isp
I
IL-PU
1
I
OS
2, 4
I
CC
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
PARAMETER
I = 8 mA
OL
I = -4 mA
OH
0V ≤ V ≤ V (Max.)
IN IL
3.5V ≤ V ≤ V
0V ≤ V ≤ V
0V ≤ V ≤ V
V = 5V, V = 0.5V
V = 0.0V, V = 3.0V
f = 1 MHz
CLOCK
IN CC
IN
IN IL
CC OUT
IL
1. One output at a time for a maximum duration of one second. V = 0.5V was selected to avoid test problems
CONDITIONMIN.TYP.MAX. UNITS
–
2.4
–
–
IL
–
–
–
IH
Commercial
Industrial
OUT
–
–
by tester ground degradation. Characterized but not 100% tested.
2. Measured using twelve 16-bit counters.
3. Typical values are at V = 5V and T = 25°C.
4. Maximum I varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
CC
CCA
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum I .
A1Data Propagation Delay, 4PT Bypass, ORP Bypass–10.0ns
A2Data Propagation Delay, Worst Case Path–ns
A3Clock Frequency with Internal Feedback90.9–MHz
–4Clock Frequency with External Feedback–MHz
–5Clock Frequency, Max. Toggle–MHz
–6GLB Reg. Setup Time before Clock,4 PT Bypass–ns
A7GLB Reg. Clock to Output Delay, ORP Bypass–ns
–8GLB Reg. Hold Time after Clock, 4 PT Bypass–ns
–9GLB Reg. Setup Time before Clock–ns
–10 GLB Reg. Clock to Output Delay–ns
–11 GLB Reg. Hold Time after Clock–ns
A12 Ext. Reset Pin to Output Delay–ns
–13 Ext. Reset Pulse Duration–ns
B14 Input to Output Enable–ns
C15 Input to Output Disable–ns
B16 Global OE Output Enable–ns9.0
C17 Global OE Output Disable–ns
A1Data Propagation Delay, 4PT Bypass, ORP Bypass–20.0ns
A2Data Propagation Delay, Worst Case Path–ns
A3Clock Frequency with Internal Feedback50.0–MHz
–4Clock Frequency with External Feedback–MHz
–5Clock Frequency, Max. Toggle–MHz
–6GLB Reg. Setup Time before Clock,4 PT Bypass–ns
A7GLB Reg. Clock to Output Delay, ORP Bypass–ns
–8GLB Reg. Hold Time after Clock, 4 PT Bypass–ns
–9GLB Reg. Setup Time before Clock–ns
–10 GLB Reg. Clock to Output Delay–ns
–11 GLB Reg. Hold Time after Clock–ns
A12 Ext. Reset Pin to Output Delay–ns
–13 Ext. Reset Pulse Duration–ns
B14 Input to Output Enable–ns
C15 Input to Output Disable–ns
B16 Global OE Output Enable–ns16.0
C17 Global OE Output Disable–ns16.0
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR adjacent path can only be used by hard macros.
#
22 I/O Register Bypass––0.5ns
23 I/O Latch Delay––2.5ns
24 I/O Register Setup Time before Clock3.54.0–ns–
25 I/O Register Hold Time after Clock0.0-0.5–ns–
26 I/O Register Clock to Out Delay––5.0ns5.0
27 I/O Register Reset to Out Delay––5.0ns5.0
28 Dedicated Input Delay––2.9ns2.7
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR adjacent path can only be used by hard macros.
#
22 I/O Register Bypass––0.7ns
23 I/O Latch Delay––4.7ns
24 I/O Register Setup Time before Clock4.16.5–ns–
25 I/O Register Hold Time after Clock-0.6-0.7–ns–
26 I/O Register Clock to Out Delay––7.0ns6.0
27 I/O Register Reset to Out Delay––7.0ns6.0
28 Dedicated Input Delay––6.1ns4.3
34 4 Product Term Bypass Path Delay (Combinatorial)––10.7ns
35 4 Product Term Bypass Path Delay (Registered)––9.2ns7.4
36 1 Product Term/XOR Path Delay––10.5ns
37 20 Product Term/XOR Path Delay––10.5ns
38 XOR Adjacent Path Delay––11.7ns
39 GLB Register Bypass Delay––2.2ns
40 GLB Register Setup Time before Clock–0.0–ns
41 GLB Register Hold Time after Clock–11.5–ns
42 GLB Register Clock to Output Delay––3.0ns
43 GLB Register Reset to Output Delay––7.3ns
44 GLB Product Term Reset to Register Delay––7.9ns
45 GLB Product Term Output Enable to I/O Cell Delay––10.0ns
46 GLB Product Term Clock Delay6.98.3ns
47 ORP Delay––2.5ns
48 ORP Bypass Delay––0.0ns
1
DESCRIPTION
3
-70
MIN.
0.1
8.5
5.16.4
0.6
3.6
3.5
3.7
4.1
4.8
7.5
8.5
8.4
8.4
9.4
1.6
2.0
6.3
6.1
6.8
2.0
0.0
-50
MIN.MAX.MAX.
UNITS
USE 1048E-70 FOR NEW DESIGNS
Table 2-0036B/1048E
8
Specifications ispLSI 1048E
Internal Timing Parameters
PARAMETER
Outputs
t
ob
t
sl
t
oen
t
odis
t
goe
Clocks
t
gy0
t
gy1/2
t
gcp
t
ioy2/3
t
iocp
Global Reset
t
gr
1. Internal timing parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
#
49 Output Buffer Delay––1.7ns
50 Output Slew Limited Delay Adder––12.0ns10.0
51 I/O Cell OE to Output Enabled––6.4ns
52 I/O Cell OE to Output Disabled––6.4ns5.1
53 Global OE––2.6ns3.9
54 Clock Delay, Y0 to Global GLB Clock Line (Ref. clock)2.02.82.8ns
55 Clock Delay, Y1 or Y2 to Global GLB Clock Line2.02.82.8ns2.0
56 Clock Delay, Clock GLB to Global GLB Clock Line0.80.81.8ns1.8
57 Clock Delay, Y2 or Y3 to I/O Cell Global Clock Line0.00.00.5ns0.0
58 Clock Delay, Clock GLB to I/O Cell Global Clock Line0.80.81.8ns1.8
59 Global Reset to GLB and I/O Registers––4.5ns4.3
1
DESCRIPTION
-125
MIN. MAX.
–
1.3
–10.0
–
4.3
–4.3
–2.7
0.9
0.9
0.90.9
0.81.8
0.00.0
0.81.8
–2.8
MIN.
-100
2.0
5.1
2.0
-90
MIN.MAX.MAX.
UNITS
NEW DESIGNS
USE 1048E-100 FOR
Table 2-0037A/1048E
9
Specifications ispLSI 1048E
Internal Timing Parameters
PARAMETER
Outputs
t
ob
t
sl
t
oen
t
odis
t
goe
Clocks
t
gy0
t
gy1/2
t
gcp
t
ioy2/3
t
iocp
Global Reset
t
gr
1. Internal timing parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
#
49 Output Buffer Delay––3.2ns
50 Output Slew Limited Delay Adder––12.0ns12.0
51 I/O Cell OE to Output Enabled––7.9ns
52 I/O Cell OE to Output Disabled––7.9ns6.9
53 Global OE––8.1ns5.1
54 Clock Delay, Y0 to Global GLB Clock Line (Ref. clock)2.83.33.3ns
55 Clock Delay, Y1 or Y2 to Global GLB Clock Line2.83.33.3ns2.8
56 Clock Delay, Clock GLB to Global GLB Clock Line0.80.81.8ns1.8
57 Clock Delay, Y2 or Y3 to I/O Cell Global Clock Line0.10.00.7ns0.6
58 Clock Delay, Clock GLB to I/O Cell Global Clock Line0.80.81.8ns1.8
59 Global Reset to GLB and I/O Registers––7.5ns4.5
1
DESCRIPTION
MIN.
-70
2.2
6.9
2.8
-50
MIN.MAX.MAX.
UNITS
NEW DESIGNS
USE 1048E-70 FOR
Table 2-0037B/1048E
10
ispLSI 1048E Timing Model
Specifications ispLSI 1048E
I/O CellORPGLBGRPI/O Cell
Feedback
Ded. In
I/O Pin
(Input)
Reset
Y1,2,3
Y0
GOE 0,1
#59
#28
I/O Reg Bypass
#22
Input
Register
D
RST
Q
#23 - 27
GRP4
#30
GRP Loading
Delay
#29, 31-33
Clock
Distribution
#55 - 58
#54
#53
#34 Comb 4 PT Bypass
Reg 4 PT Bypass
#35
20 PT
XOR Delays
#36 - 38
#59
Control
RE
PTs
OE
CK
#44 - 46
Derivations of tsu, th and tco from the Product Term Clock
1. Calculations are based upon timing specifications for the ispLSI 1048E-125.
Table 2-0042/1048E
11
Maximum GRP Delay vs. GLB Loads
Specifications ispLSI 1048E
10
9
8
7
6
5
4
GRP Delay (ns)
3
2
1
1
4
8
16
GLB Loads
Power Consumption
Power Consumption in the ispLSI 1048E device depends
on two primary factors: the speed at which the device is
operating and the number of Product Terms used. Figure
Figure 3. Typical Device Power Consumption vs fmax
380
ispLSI 1048E-50
ispLSI 1048E-70
ispLSI 1048E-90/100
ispLSI 1048E-125
32
48
0127A/1048E
3 shows the relationship between power and operating
speed.
340
300
260
CC (mA)
I
220
180
020406080100120140
ispLSI 1048E
fmax (MHz)
Notes: Configuration of twelve 16-bit counters,
ICC can be estimated for the ispLSI 1048E using the following equation:
ICC = 20 + (# of PTs * 0.42) + (# of nets * Max. freq * 0.010)
Where:
# of PTs = Number of Product Terms used in design
# of nets = Number of Signals used in device
Max. freq = Highest Clock Frequency to the device
The I
average exists. These values are for estimates only. Since the value of I
program in the device, the actual I
estimate is based on typical conditions (VCC = 5.0V, room temperature) and an assumption of 4 GLB loads on
Global Output Enable input pins.GOE0, GOE1
Dedicated input pins to the device.IN 2, IN 4
Input - Dedicated in-system programming enable input pin. This pin is
brought low to enable the programming mode. When low, the MODE,
SDI, SDO and SCLK controls become active.
Input - This pin performs two functions. When ispEN is logic low, it
functions as an input pin to load programming data into the device.
SDI/IN 0 also is used as one of the two control pins for the ISP state
machine. When ispEN is high, it functions as a dedicated input pin.
Input - This pin performs two functions. When ispEN is logic low, it
functions as pin to control the operation of the isp state machine. When
ispEN is high, it functions as a dedicated input pin.
Output/Input - This pin performs two functions. When ispEN is logic low,
it functions as an output pin to read serial shift register data. When
ispEN is high, it functions as a dedicated input pin.
Input - This pin performs two functions. When ispEN is logic low, it
functions as a clock pin for the Serial Shift Register. When ispEN is
high, it functions as a dedicated input pin.
19RESET
15Y0
83Y1
80Y2
79Y3
1,
17,
GND
VCC
1. NC pins are not to be connected to any active signals, VCC or GND.
97,
16,48,82,113
33,49,65,81,
112
Active Low (0) Reset pin which resets all of the GLB and I/O registers in
the device.
Dedicated Clock input. This clock input is connected to one of the clock
inputs of all of the GLBs on the device.
Dedicated Clock input. This clock input is brought into the clock
distribution network, and can optionally be routed to any GLB on the
device.
Dedicated Clock input. This clock input is brought into the clock
distribution network, and can optionally be routed to any GLB and/or
any I/O cell on the device.
Dedicated Clock input. This clock input is brought into the clock
distribution network, and can optionally be routed to any I/O cell on the
For the ispLSI 1048E-125LT, it is strongly recommended
that the actual Icc be verified to ensure that the maximum
junction temperature (TJ) with power supplied is not
exceeded. Depending on the specific logic design and
clock speed, airflow may be required to satisfy the maxi-
Part Number Description
Specifications ispLSI 1048E
mum allowable junction temperature (TJ) specification.
Please refer to the Thermal Management section of the
Lattice Semiconductor Data Book or CD-ROM for additional information on calculating TJ.