• HIGH DENSITY PROGRAMMABLE LOGIC
— 6000 PLD Gates
— 64 I/O Pins, Eight Dedicated Inputs
— 192 Registers
— High Speed Global Interconnect
— Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
— Small Logic Block Size for Random Logic
• HIGH PERFORMANCE E
—
fmax = 125 MHz Maximum Operating Frequency
— tpd = 7.5 ns Propagation Delay
— TTL Compatible Inputs and Outputs
— Electrically Erasable and Reprogrammable
— Non-Volatile
— 100% Tested at Time of Manufacture
— Unused Product Term Shutdown Saves Power
• ispLSI OFFERS THE FOLLOWING ADDED FEATURES
— In-System Programmable (ISP™) 5-Volt Only
— Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
— Reprogram Soldered Devices for Faster Prototyping
• OFFERS THE EASE OF USE AND FAST SYSTEM
SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY
OF FIELD PROGRAMMABLE GATE ARRAYS
— Complete Programmable Device Can Combine Glue
Logic and Structured Designs
— Enhanced Pin Locking Capability
— Four Dedicated Clock Input Pins
— Synchronous and Asynchronous Clocks
— Programmable Output Slew Rate Control to
Minimize Switching Noise
— Flexible Pin Placement
— Optimized Global Routing Pool Provides Global
The ispLSI and pLSI 1032E are High Density Programmable Logic Devices containing 192 Registers, 64
Universal I/O pins, eight Dedicated Input pins, four Dedicated Clock Input pins and a Global Routing Pool (GRP).
The GRP provides complete interconnectivity between
all of these elements. The ispLSI 1032E features 5-Volt
in-system programmability and in-system diagnostic capabilities. The ispLSI 1032E device offers non-volatile
reprogrammability of the logic, as well as the interconnects to provide truly reconfigurable systems. It is
architecturally and parametrically compatible to the pLSI
1032E device, but multiplexes four input pins to control
in-system programming. A functional superset of the
ispLSI and pLSI 1032 architecture, the ispLSI and pLSI
1032E devices add two new global output enable pins.
The basic unit of logic on the ispLSI and pLSI 1032E
devices is the Generic Logic Block (GLB). The GLBs are
labeled A0, A1…D7 (see Figure 1). There are a total of 32
GLBs in the ispLSI and pLSI 1032E devices. Each GLB
has 18 inputs, a programmable AND/OR/Exclusive OR
array, and four outputs which can be configured to be
either combinatorial or registered. Inputs to the GLB
come from the GRP and dedicated inputs. All of the GLB
outputs are brought back into the GRP so that they can
be connected to the inputs of any GLB on the device.
Figure 1. ispLSI and pLSI 1032E Functional Block Diagram
I/O 63
I/O 62
I/O 61
I/O 60
I/O 59
I/O 58
I/O 57
I/O 56
I/O 55
RESET
Input Bus
Generic
Logic Blocks
(GLBs)
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
*SDI/IN 0
*MODE/IN 1
Megablock
*ispEN/NC
*ISP Control Functions for ispLSI 1032E Only
A7
A6
A5
A4
A3
lnput Bus
A2
Output Routing Pool (ORP)
A1
A0
*SDO/IN 2
B0 B1 B2B3 B4B5 B6 B7
I/O 16
I/O 17
*SCLK/IN 3
Output Routing Pool (ORP)
D7 D6 D5 D4 D3 D2 D1 D0
Global
Routing
Pool
(GRP)
Output Routing Pool (ORP)
Input Bus
I/O 18
I/O 19
I/O 20
I/O 21
I/O 22
I/O 23
I/O 24
I/O 25
I/O 26
I/O 54
I/O 27
I/O 53
I/O 52
I/O 28
I/O 29
I/O 51
I/O 30
I/O 50
I/O 31
I/O 49
I/O 48
IN 7
IN 6
C7
C6
C5
C4
C3
C2
Output Routing Pool (ORP)
C1
C0
CLK 0
CLK 1
Clock
Network
Y0Y1Y2
Y3
CLK 2
IOCLK 0
IOCLK 1
Distribution
lnput Bus
GOE 1/IN 5
GOE 0/IN 4
I/O 47
I/O 46
I/O 45
I/O 44
I/O 43
I/O 42
I/O 41
I/O 40
I/O 39
I/O 38
I/O 37
I/O 36
I/O 35
I/O 34
I/O 33
I/O 32
The devices also have 64 I/O cells, each of which is
directly connected to an I/O pin. Each I/O cell can be
individually programmed to be a combinatorial input,
registered input, latched input, output or bi-directional
I/O pin with 3-state control. The signal levels are TTL
compatible voltages and the output drivers can source 4
mA or sink 8 mA. Each output can be programmed
independently for fast or slow output slew rate to minimize overall output switching noise.
Eight GLBs, 16 I/O cells, two dedicated inputs and one
ORP are connected together to make a Megablock (see
figure 1). The outputs of the eight GLBs are connected to
a set of 16 universal I/O cells by the ORP. Each ispLSI
and pLSI 1032E device contains four Megablocks.
The GRP has, as its inputs, the outputs from all of the
GLBs and all of the inputs from the bi-directional I/O cells.
All of these signals are made available to the inputs of the
GLBs. Delays through the GRP have been equalized to
minimize timing skew.
Clocks in the ispLSI and pLSI 1032E devices are selected using the Clock Distribution Network. Four
dedicated clock pins (Y0, Y1, Y2 and Y3) are brought into
the distribution network, and five clock outputs (CLK 0,
CLK 1, CLK 2, IOCLK 0 and IOCLK 1) are provided to
route clocks to the GLBs and I/O cells. The Clock Distribution Network can also be driven from a special clock
GLB (C0 on the ispLSI and pLSI 1032E devices). The
logic of this GLB allows the user to create an internal
clock from a combination of internal signals within the
device.
2
Specifications ispLSI and pLSI 1032E
Absolute Maximum Ratings
1
Supply Voltage Vcc...................................-0.5 to +7.0V
Input Voltage Applied........................ -2.5 to VCC +1.0V
Off-State Output Voltage Applied ..... -2.5 to VCC +1.0V
Storage Temperature................................ -65 to 150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
DC Recommended Operating Conditions
V
V
V
CC
IL
IH
SYMBOL
Supply Voltage
Input Low Voltage
Input High Voltage
PARAMETER
Commercial
Industrial
TA = 0°C to + 70°C
= -40°C to + 85°C
T
A
MIN.MAX.UNITS
4.75
4.5
0
2.0
5.25
5.5
0.8
V
+1
cc
Table 2-0005/1032E
V
V
V
V
Capacitance (TA=25oC, f=1.0 MHz)
SYMBOL
C
1
C
2
(Commercial/Industrial)
Y0 Clock Capacitance
PARAMETER
Data Retention Specifications
PARAMETER
Data Retention
ispLSI Erase/Reprogram Cycles
pLSI Erase/Reprogram Cycles
3-state levels are measured 0.5V from
steady-state active level.
GND to 3.0V
-125
Others
1.5V
1.5V
See Figure 2
≤ 2 ns
≤ 3 ns
Table 2-0003/1032E
Figure 2. Test Load
Device
Output
+ 5V
R
1
Test
Point
R
2
C
*
L
Output Load Conditions (see Figure 2)
TEST CONDITIONR1R2CL
*
A470Ω390Ω35pF
Active High
B
Active Low
Active High to Z
at V -0.5V
C
Active Low to Z
at V +0.5V
OH
OL
∞390Ω35pF
470Ω390Ω35pF
∞390Ω5pF
470Ω390Ω5pF
Table 2-0004/1032E
CL includes Test Fixture and Probe Capacitance.
DC Electrical Characteristics
Over Recommended Operating Conditions
–
–
–
–
–
–
–
190
190
3
0.4
–
-10
10
-150
-150
-200
–
–
Table 2-0007/1032E
µA
µA
µA
µA
mA
mA
mA
SYMBOL
V
OL
V
OH
I
IL
I
IH
I
IL-isp
I
IL-PU
1
I
OS
2, 4
I
CC
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
PARAMETER
I = 8 mA
OL
I = -4 mA
OH
0V ≤ V ≤ V (Max.)
3.5V ≤ V ≤ V
0V ≤ V ≤ V
0V ≤ V ≤ V
V = 5V, V = 0.5V
CC OUT
V = 0.5V, V = 3.0V
IL
f = 1 MHz
CLOCK
1. One output at a time for a maximum duration of one second. V = 0.5V was selected to avoid test problems
CONDITIONMIN.TYP.MAX. UNITS
–
2.4
IN IL
IN CC
IL
IN
IN IL
–
–
–
–
–
IH
OUT
Commercial
Industrial
–
–
by tester ground degradation. Characterized but not 100% tested.
2. Measured using eight 16-bit counters.
3. Typical values are at V = 5V and T = 25°C.
4. Maximum I varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
CC
CCA
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum I .
1. Unless noted otherwise, all parameters use the GRP, 20 PTXOR path, ORP and Y0 clock.
2. Refer to Timing Modelin this data sheet for further details.
3. Standard 16-bit counter using GRP feedback.
4. Reference Switching Test Conditions section.
TEST
COND.
A1Data Propagation Delay, 4PT Bypass, ORP Bypass–10.0ns
A2Data Propagation Delay, Worst Case Path–ns
A3Clock Frequency with Internal Feedback100–MHz
–4Clock Frequency with External Feedback–MHz
–5Clock Frequency, Max. Toggle–MHz
–6GLB Reg. Setup Time before Clock,4 PT Bypass–ns
A7GLB Reg. Clock to Output Delay, ORP Bypass–ns
–8GLB Reg. Hold Time after Clock, 4 PT Bypass–ns
–9GLB Reg. Setup Time before Clock–ns
–10 GLB Reg. Clock to Output Delay–ns
–11 GLB Reg. Hold Time after Clock–ns
A12 Ext. Reset Pin to Output Delay–ns
–13 Ext. Reset Pulse Duration–ns
B14 Input to Output Enable–ns
C15 Input to Output Disable–ns
B16 Global OE Output Enable–ns9.0
C17 Global OE Output Disable–ns9.0
–19 External Synchronous Clock Pulse Duration, Low4.0ns
–20 I/O Reg. Setup Time before Ext. Sync Clock (Y2, Y3)–ns
–21 I/O Reg. Hold Time after Ext. Sync. Clock (Y2, Y3)–ns
1. Unless noted otherwise, all parameters use the GRP, 20 PTXOR path, ORP and Y0 clock.
2. Refer to Timing Modelin this data sheet for further details.
3. Standard 16-bit counter using GRP feedback.
4. Reference Switching Test Conditions section.
TEST
COND.
A1Data Propagation Delay, 4PT Bypass, ORP Bypass–15.0ns
A2Data Propagation Delay, Worst Case Path–ns
A3Clock Frequency with Internal Feedback70.0–MHz
–4Clock Frequency with External Feedback–MHz
–5Clock Frequency, Max. Toggle–MHz
–6GLB Reg. Setup Time before Clock,4 PT Bypass–ns
A7GLB Reg. Clock to Output Delay, ORP Bypass–ns
–8GLB Reg. Hold Time after Clock, 4 PT Bypass–ns
–9GLB Reg. Setup Time before Clock–ns
–10 GLB Reg. Clock to Output Delay–ns
–11 GLB Reg. Hold Time after Clock–ns
A12 Ext. Reset Pin to Output Delay–ns
–13 Ext. Reset Pulse Duration–ns
B14 Input to Output Enable–ns
C15 Input to Output Disable–ns
B16 Global OE Output Enable–ns12.0
C17 Global OE Output Disable–ns
–19 External Synchronous Clock Pulse Duration, Low5.0ns
–20 I/O Reg. Setup Time before Ext. Sync Clock (Y2, Y3)–ns
–21 I/O Reg. Hold Time after Ext. Sync. Clock (Y2, Y3)–ns
2
DESCRIPTION#
1
1
( )
twh + tw1
3
1
( )
tsu2 + tco1
-90
MIN. MAX.
–10.0
–
12.5
90.0–
69.0
125
–
–
–
7.5
–
6.0
0.0
–
8.5
–
–
7.0
0.0
–
–
13.5
6.5
–
–
15.0
–
15.0
USE 1032E-100 FOR
–9.0
–9.012.0
4.0
–
4.0
–
3.5–
0.0–
-80
MIN. MAX.
–12.0
–
15.0
80.0–
8.5
6.5
–
0.0
7.5
–
0.0
14.0
–
8.0
16.5
–
16.5
–
–10.0
–10.0
4.5
4.5
3.5
0.0
–
–
–
–
–
–
–
–
–
–
–
61.0
111
10.0
NEW DESIGNS
-70
MIN. MAX.
17.5
56.0
100
9.0
7.0
0.0
11.0
8.0
0.0
15.0
10.0
18.0
18.0
–
–
4.0
0.0
Table 2-0030B/1032E
UNITS
6
Specifications ispLSI and pLSI 1032E
Internal Timing Parameters
PARAM.
2
1
DESCRIPTION#
Inputs
t
iobp
t
iolat
t
iosu
t
ioh
t
ioco
t
ior
t
din
22 I/O Register Bypassns
23 I/O Latch Delayns
24 I/O Register Setup Time before Clockns
25 I/O Register Hold Time after Clockns
26 I/O Register Clock to Out Delayns
27 I/O Register Reset to Out Delayns
28 Dedicated Input Delayns
41 GLB Register Hold Time after Clockns
42 GLB Register Clock to Output Delayns
43 GLB Register Reset to Output Delayns
44 GLB Prod.Term Reset to Register Delayns
45 GLB Prod. Term Output Enable to I/O Cell Delayns
46 GLB Prod. Term Clock Delayns
3
ORP
t
orp
t
orpbp
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR adjacent path can only be used by hard macros.
47 ORP Delayns
48 ORP Bypass Delayns
MIN.
–
–
3.0
0.0
–
–
–
–
–
–
–
–
–
–
–
–
–
–
0.1
4.5
–
–
–
–
2.9
–
–
-125
0.3
1.9
–
–
4.6
4.6
2.3
1.8
2.0
2.3
2.8
3.8
3.9
4.0
3.6
5.0
5.0
0.4
–
–
2.3
4.9
3.9
5.4
4.0
1.0
0.0
-100
MIN.MAX.MAX.
–
0.3
–
2.3
3.5
–
0.0
–
–
5.0
–
5.0
–
2.7
–
1.9
–
2.4
–
2.4
–
3.0
–
4.2
–
5.3
–
5.3
–
4.6
–
5.8
–
6.3
–
1.0
0.5
–
5.8
–
–
2.5
–
6.2
–
4.5
–
7.2
3.5
4.7
–
1.0
–
0.0
Table 2-0036A/1032E
UNITS
ns
7
Specifications ispLSI and pLSI 1032E
Internal Timing Parameters
PARAM.
2
1
DESCRIPTION#
Inputs
t
iobp
t
iolat
t
iosu
t
ioh
t
ioco
t
ior
t
din
22 I/O Register Bypass–ns
23 I/O Latch Delay–ns
24 I/O Register Setup Time before Clock3.5ns
25 I/O Register Hold Time after Clock0.0ns
26 I/O Register Clock to Out Delay–ns
27 I/O Register Reset to Out Delay–ns
28 Dedicated Input Delay–ns
41 GLB Register Hold Time after Clockns
42 GLB Register Clock to Output Delay–ns
43 GLB Register Reset to Output Delay–ns
44 GLB Prod.Term Reset to Register Delay–ns
45 GLB Prod. Term Output Enable to I/O Cell Delay–ns
46 GLB Prod. Term Clock Delayns
3
ORP
t
orp
t
orpbp
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR adjacent path can only be used by hard macros.
47 ORP Delay–ns
48 ORP Bypass Delay–0.0ns
-90
MIN. MAX.
–
0.3
–
2.3
3.5
–
0.0
–
–
5.0
–
5.0
–
2.6
–
2.1
–
2.3
–
2.6
–
3.2
–
4.4
–
5.7
–
6.1
–
5.6
–
6.8
–
7.1
–
0.4
USE 1032E-100 FOR
0.2
–
6.8
–
–
2.9
–
6.3
–
5.1
–
7.1
4.1
5.3
–
1.0
0.0
–
-80
MIN.
0.3
2.7
–
–
5.4
5.4
2.8
2.2
2.5
2.8
3.5
4.8
7.1
6.7
6.6
7.8
NEW DESIGNS
8.2
–ns
1.3
0.5
–
7.9
–
2.9
6.4
5.5
8.0
4.5
5.8
1.0
0.0
-70
MIN.MAX.MAX.
–
0.3
–
3.3
4.0
0.0
0.5
8.8
4.8
–
–
–
6.1
–
6.0
–
2.8
–
2.5
–
2.5
–
3.2
–
4.0
–
5.6
–
8.8
–
7.2
–
8.3
–
8.7
–
9.2
–
1.6
–
–
–
2.9
–
6.8
–
5.8
–
9.0
6.2
–
1.0
–
Table 2-0036B/1032E
UNITS
8
Specifications ispLSI and pLSI 1032E
Internal Timing Parameters
1
DESCRIPTION#PARAM.
Outputs
t
t
t
t
t
ob
sl
oen
odis
goe
49 Output Buffer Delayns
50 Output Buffer Delay, Slew Limited Adderns
51 I/O Cell OE to Output Enabledns
52 I/O Cell OE to Output Disabledns
53 Global OEns
Clocks
t
gy0
t
gy1/2
t
gcp
t
ioy2/3
t
iocp
54 Clk Delay, Y0 to Global GLB Clk Line (Ref. clk)ns
55 Clk Delay, Y1 or Y2 to Global GLB Clk Linens
56 Clk Delay, Clock GLB to Global GLB Clk Linens
57 Clk Delay, Y2 or Y3 to I/O Cell Global Clk Linens
58 Clk Delay, Clk GLB to I/O Cell Global Clk Linens
Global Reset
t
gr
1. Internal Timing Parameters are not tested and are for reference only.
59 Global Reset to GLB and I/O Registersns
MIN.
–
–
–
–
–
1.4
1.4
0.8
0.0
0.8
–
-125
1.3
9.9
4.3
4.3
2.7
1.4
1.4
1.8
0.0
1.8
2.8
-100
MIN.MAX.MAX.
2.0
–
10.0
–
5.1
–
5.1
–
3.9
–
1.5
1.5
1.5
1.5
1.8
0.8
0.0
0.0
1.8
0.8
4.3
–
Table 2-0037A/1032E
UNITS
9
Specifications ispLSI and pLSI 1032E
Internal Timing Parameters
1
DESCRIPTION#PARAM.
Outputs
t
t
t
t
t
ob
sl
oen
odis
goe
49 Output Buffer Delay–ns
50 Output Buffer Delay, Slew Limited Adder–ns
51 I/O Cell OE to Output Enabled–ns
52 I/O Cell OE to Output Disabled–ns
53 Global OE–ns
Clocks
t
gy0
t
gy1/2
t
gcp
t
ioy2/3
t
iocp
54 Clock Delay, Y0 to Global GLB Clock Line (Ref. clock)1.5ns
55 Clock Delay, Y1 or Y2 to Global GLB Clock Line2.6ns
56 Clock Delay, Clock GLB to Global GLB Clock Line0.8ns
57 Clock Delay, Y2 or Y3 to I/O Cell Global Clock Line0.0ns
58 Clock Delay, Clock GLB to I/O Cell Global Clock Line0.8ns
Global Reset
t
gr
1. Internal Timing Parameters are not tested and are for reference only.
59 Global Reset to GLB and I/O Registers–ns
-90
MIN. MAX.
1.7
–
10.0
–
5.3
–
5.3
–
3.7
–
1.4
1.4
2.9
2.4
1.8
0.8
0.0
0.0
1.8
0.8
USE 1032E-100 FOR
4.5
–
-80
MIN.
2.1
10.0
5.7
5.7
4.3
1.5
3.1
1.8
0.0
NEW DESIGNS
1.8
4.5
-70
MIN.MAX.MAX.
–
2.6
–
10.0
–
6.2
–
6.2
–
5.8
1.5
1.5
1.5
1.5
0.8
1.8
0.0
0.0
0.8
1.8
–
4.6
Table 2-0037B/1032E
UNITS
10
Specifications ispLSI and pLSI 1032E
ispLSI and pLSI 1032E Timing Model
I/O CellORPGLBGRPI/O Cell
Feedback
Ded. In
I/O Pin
(Input)
Reset
Y1,2,3
Y0
GOE 0,1
#59
#28
I/O Reg Bypass
#22
Input
Register
D
RST
Q
#23 - 27
GRP4
#30
GRP Loading
Delay
#29, 31 - 33
Clock
Distribution
#55 - 58
#54
#53
#34 Comb 4 PT Bypass
Reg 4 PT Bypass
#35
20 PT
XOR Delays
#36 - 38
#59
Control
RE
PTs
OE
CK
#44 - 46
Derivations of tsu, th and tco from the Product Term Clock
1. Calculations are based upon timing specifications for the ispLSI and pLSI 1032E-125.
Table 2-0042a/1032E
11
Specifications ispLSI and pLSI 1032E
Maximum GRP Delay vs GLB Loads
6.0
5.0
4.0
GRP Delay (ns)
3.0
2.0
1.0
181632
4
Power Consumption
ispLSI and pLSI 1032E-70
ispLSI and pLSI 1032E-80
ispLSI and pLSI 1032E-90/100
ispLSI and pLSI 1032E-125
GLB Load
GRP/GLB/1032E
Power consumption in the ispLSI and pLSI 1032E device
depends on two primary factors: the speed at which the
used. Figure 3 shows the relationship between power
and operating speed.
device is operating, and the number of product terms
Figure 3. Typical Device Power Consumption vs fmax
350
300
250
200
CC (mA)
I
150
100
20
0
I can be estimated for the ispLSI and pLSI 1032E using the following equation:
CC
I (mA) = 15 + (# of PTs * 0.59) + (# of nets * Max freq * 0.0078)
CC
Where:
# of PTs = Number of Product Terms used in design
# of nets = Number of Signals used in device
Max freq = Highest Clock Frequency to the device (in MHz)
40
Notes: Configuration of eight 16-bit counters
6080
f
max (MHz)
Typical current at 5V, 25°C
ispLSI and pLSI 1032E
100
125150
The I estimate is based on typical conditions (VCC = 5.0V, room temperature) and an assumption of four GLB
CC
loads on average exists. These values are for estimates only. Since the value of I is sensitive to operating
conditions and the program in the device, the actual I should be verified.
This is a dual function pin. It can be used either as Global Output Enable for
GOE 0/IN 4
all I/O cells or it can be used as a dedicated input pin.
This is a dual function pin. It can be used either as Global Output Enable for
all I/O cells or it can be used as a dedicated input pin.
Dedicated input pins to the device.
Input - Dedicated in-system programming enable input pin. This pin is
brought low to enable the programming mode. The MODE, SDI, SDO and
SCLK options become active.
Input - This pin performs two functions. When ispEN is logic low, it functions
as an input pin to load programming data into the device. SDI/IN 0 is also
used as one of the two control pins for the isp state machine. It is a
dedicated input pin when ispEN is logic high.
Input - This pin performs two functions. When ispEN is logic low, it functions
as pin to control the operation of the isp state machine. It is a dedicated
input pin when ispEN is logic high.
Output/Input - This pin performs two functions. When ispEN is logic low, it
functions as an output pin to read serial shift register data. It is a dedicated
input pin when ispEN is logic high.
Input - This pin performs two functions. When ispEN is logic low, it functions
as a clock pin for the Serial Shift Register. It is a dedicated input pin when
ispEN is logic high.
Active Low (0) Reset pin which resets all of the GLB and I/O registers in the
device.
Dedicated Clock input. This clock input is connected to one of the clock
inputs of all of the GLBs on the device.
Dedicated Clock input. This clock input is brought into the clock distribution
network, and can optionally be routed to any GLB on the device.
63Y2
62Y3
GND
VCC 21, 65
NC
* ispLSI 1032E only
** ispEN for ispLSI 1032E; NC for pLSI 1032E, must be left floating or tied to V , must not be grounded or tied
to any other signal.
1, 22, 43, 64
62
61
13, 38, 63, 88
64
12,
2, 24, 25, No connect.
1,
27, 49, 50,
26,
52, 74, 75,
51,
77, 99, 100
76,
Dedicated Clock input. This clock input is brought into the clock distribution
network, and can optionally be routed to any GLB and/or any I/O cell on the
device.
Dedicated Clock input. This clock input is brought into the clock distribution
network, and can optionally be routed to any I/O cell on the device.
Semiconductor Corp., L (stylized) and Lattice (design) are registered trademarks of Lattice Semiconductor Corporation.
Generic Array Logic, ISP, ispATE, ispCODE, ispDOWNLOAD, ispDS, ispDS+, ispGDS, ispGDX, ispHDL, ispJTAG, ispStarter,
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