Lattice ispLSI, pLSI 1032E User Manual

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• HIGH DENSITY PROGRAMMABLE LOGIC — 6000 PLD Gates
— 64 I/O Pins, Eight Dedicated Inputs — 192 Registers — High Speed Global Interconnect — Wide Input Gating for Fast Counters, State
— Small Logic Block Size for Random Logic
• HIGH PERFORMANCE E —
fmax = 125 MHz Maximum Operating Frequency
tpd = 7.5 ns Propagation Delay — TTL Compatible Inputs and Outputs — Electrically Erasable and Reprogrammable — Non-Volatile — 100% Tested at Time of Manufacture — Unused Product Term Shutdown Saves Power
• ispLSI OFFERS THE FOLLOWING ADDED FEATURES — In-System Programmable (ISP™) 5-Volt Only — Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
— Reprogram Soldered Devices for Faster Prototyping
• OFFERS THE EASE OF USE AND FAST SYSTEM
SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY OF FIELD PROGRAMMABLE GATE ARRAYS
— Complete Programmable Device Can Combine Glue
Logic and Structured Designs — Enhanced Pin Locking Capability — Four Dedicated Clock Input Pins — Synchronous and Asynchronous Clocks — Programmable Output Slew Rate Control to
Minimize Switching Noise — Flexible Pin Placement — Optimized Global Routing Pool Provides Global
Interconnectivity
• ispLSI DEVELOPMENT TOOLS ispVHDL™ Systems
— VHDL/Verilog-HDL/Schematic Design Options — Functional/Timing/VHDL Simulation Options
ispDS™ Software — Lattice HDL or Boolean Logic Entry
— Functional Simulator and Waveform Viewer ispDS+™ HDL Synthesis-Optimized Logic Fitter — Supports Leading Third-Party Design Environments
for Schematic Capture, Synthesis and Timing
Simulation — Static Timing Analyzer ISP Daisy Chain Download Software
2
CMOS® TECHNOLOGY
ispLSI® and pLSI® 1032E
High-Density Programmable Logic
Functional Block DiagramFeatures
Output Routing Pool
D7 D6 D5 D4 D3 D2 D1 D0
GLB
C7 C6 C5 C4 C3 C2
Output Routing Pool
C1 C0
CLK
0139A(A1)-isp
A0 A1 A2 A3 A4 A5
Output Routing Pool
A6
Global Routing Pool (GRP)
A7
B0 B1 B2 B3 B4 B5 B6 B7
Output Routing Pool
Logic Array
DQ
DQ
DQ
DQ
Description
The ispLSI and pLSI 1032E are High Density Program­mable Logic Devices containing 192 Registers, 64 Universal I/O pins, eight Dedicated Input pins, four Dedi­cated Clock Input pins and a Global Routing Pool (GRP). The GRP provides complete interconnectivity between all of these elements. The ispLSI 1032E features 5-Volt in-system programmability and in-system diagnostic ca­pabilities. The ispLSI 1032E device offers non-volatile reprogrammability of the logic, as well as the intercon­nects to provide truly reconfigurable systems. It is architecturally and parametrically compatible to the pLSI 1032E device, but multiplexes four input pins to control in-system programming. A functional superset of the ispLSI and pLSI 1032 architecture, the ispLSI and pLSI 1032E devices add two new global output enable pins.
The basic unit of logic on the ispLSI and pLSI 1032E devices is the Generic Logic Block (GLB). The GLBs are labeled A0, A1…D7 (see Figure 1). There are a total of 32 GLBs in the ispLSI and pLSI 1032E devices. Each GLB has 18 inputs, a programmable AND/OR/Exclusive OR array, and four outputs which can be configured to be either combinatorial or registered. Inputs to the GLB come from the GRP and dedicated inputs. All of the GLB outputs are brought back into the GRP so that they can be connected to the inputs of any GLB on the device.
Copyright © 1997 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. July 1997 Tel. (503) 681-0118; 1-800-LATTICE; FAX (503) 681-3037; http://www.latticesemi.com
1032E_05
1
Specifications ispLSI and pLSI 1032E
Functional Block Diagram
Figure 1. ispLSI and pLSI 1032E Functional Block Diagram
I/O 63
I/O 62
I/O 61
I/O 60
I/O 59
I/O 58
I/O 57
I/O 56
I/O 55
RESET
Input Bus
Generic
Logic Blocks
(GLBs)
I/O 0 I/O 1 I/O 2 I/O 3
I/O 4 I/O 5 I/O 6 I/O 7
I/O 8
I/O 9 I/O 10 I/O 11
I/O 12 I/O 13 I/O 14 I/O 15
*SDI/IN 0
*MODE/IN 1
Megablock
*ispEN/NC
*ISP Control Functions for ispLSI 1032E Only
A7
A6
A5
A4
A3
lnput Bus
A2
Output Routing Pool (ORP)
A1
A0
*SDO/IN 2
B0 B1 B2 B3 B4 B5 B6 B7
I/O 16
I/O 17
*SCLK/IN 3
Output Routing Pool (ORP)
D7 D6 D5 D4 D3 D2 D1 D0
Global
Routing
Pool
(GRP)
Output Routing Pool (ORP)
Input Bus
I/O 18
I/O 19
I/O 20
I/O 21
I/O 22
I/O 23
I/O 24
I/O 25
I/O 26
I/O 54
I/O 27
I/O 53
I/O 52
I/O 28
I/O 29
I/O 51
I/O 30
I/O 50
I/O 31
I/O 49
I/O 48
IN 7
IN 6
C7
C6
C5
C4
C3
C2
Output Routing Pool (ORP)
C1
C0
CLK 0 CLK 1
Clock
Network
Y0Y1Y2
Y3
CLK 2 IOCLK 0 IOCLK 1
Distribution
lnput Bus
GOE 1/IN 5 GOE 0/IN 4
I/O 47 I/O 46 I/O 45 I/O 44
I/O 43 I/O 42 I/O 41 I/O 40
I/O 39 I/O 38 I/O 37 I/O 36
I/O 35 I/O 34 I/O 33 I/O 32
The devices also have 64 I/O cells, each of which is directly connected to an I/O pin. Each I/O cell can be individually programmed to be a combinatorial input, registered input, latched input, output or bi-directional I/O pin with 3-state control. The signal levels are TTL compatible voltages and the output drivers can source 4 mA or sink 8 mA. Each output can be programmed independently for fast or slow output slew rate to mini­mize overall output switching noise.
Eight GLBs, 16 I/O cells, two dedicated inputs and one ORP are connected together to make a Megablock (see figure 1). The outputs of the eight GLBs are connected to a set of 16 universal I/O cells by the ORP. Each ispLSI and pLSI 1032E device contains four Megablocks.
The GRP has, as its inputs, the outputs from all of the GLBs and all of the inputs from the bi-directional I/O cells. All of these signals are made available to the inputs of the GLBs. Delays through the GRP have been equalized to minimize timing skew.
Clocks in the ispLSI and pLSI 1032E devices are se­lected using the Clock Distribution Network. Four dedicated clock pins (Y0, Y1, Y2 and Y3) are brought into the distribution network, and five clock outputs (CLK 0, CLK 1, CLK 2, IOCLK 0 and IOCLK 1) are provided to route clocks to the GLBs and I/O cells. The Clock Distri­bution Network can also be driven from a special clock GLB (C0 on the ispLSI and pLSI 1032E devices). The logic of this GLB allows the user to create an internal clock from a combination of internal signals within the device.
2
Specifications ispLSI and pLSI 1032E
Absolute Maximum Ratings
1
Supply Voltage Vcc...................................-0.5 to +7.0V
Input Voltage Applied........................ -2.5 to VCC +1.0V
Off-State Output Voltage Applied ..... -2.5 to VCC +1.0V
Storage Temperature................................ -65 to 150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).
DC Recommended Operating Conditions
V V
V
CC
IL IH
SYMBOL
Supply Voltage
Input Low Voltage Input High Voltage
PARAMETER
Commercial Industrial
TA = 0°C to + 70°C
= -40°C to + 85°C
T
A
MIN. MAX. UNITS
4.75
4.5 0
2.0
5.25
5.5
0.8
V
+1
cc
Table 2-0005/1032E
V V V V
Capacitance (TA=25oC, f=1.0 MHz)
SYMBOL
C
1
C
2
(Commercial/Industrial) Y0 Clock Capacitance
PARAMETER
Data Retention Specifications
PARAMETER
Data Retention ispLSI Erase/Reprogram Cycles pLSI Erase/Reprogram Cycles
UNITSTYPICAL TEST CONDITIONS
8Dedicated Input, I/O, Y1, Y2, Y3, Clock Capacitance
15
MINIMUM MAXIMUM UNITS
20
10000
100
pf
pf
– – –
V = 5.0V, V = 2.0V
CC
V = 5.0V, V = 2.0V
CC PIN
PIN
Table 2-0006/1032E
Years Cycles Cycles
Table 2-0008/1032E
3
Switching Test Conditions
Specifications ispLSI and pLSI 1032E
Input Pulse Levels Input Rise and Fall Time
10% to 90% Input Timing Reference Levels
Ouput Timing Reference Levels Output Load
3-state levels are measured 0.5V from steady-state active level.
GND to 3.0V
-125
Others
1.5V
1.5V
See Figure 2
2 ns 3 ns
Table 2-0003/1032E
Figure 2. Test Load
Device Output
+ 5V
R
1
Test
Point
R
2
C
*
L
Output Load Conditions (see Figure 2)
TEST CONDITION R1 R2 CL
*
A 470 390 35pF
Active High
B
Active Low Active High to Z
at V -0.5V
C
Active Low to Z at V +0.5V
OH
OL
390 35pF
470 390 35pF
390 5pF
470 390 5pF
Table 2-0004/1032E
CL includes Test Fixture and Probe Capacitance.
DC Electrical Characteristics
Over Recommended Operating Conditions
– – – – – –
– 190 190
3
0.4 –
-10
10
-150
-150
-200 – –
Table 2-0007/1032E
µA µA µA µA
mA mA mA
SYMBOL
V
OL
V
OH
I
IL
I
IH
I
IL-isp
I
IL-PU
1
I
OS
2, 4
I
CC
Output Low Voltage Output High Voltage Input or I/O Low Leakage Current Input or I/O High Leakage Current ispEN Input Low Leakage Current I/O Active Pull-Up Current Output Short Circuit Current
Operating Power Supply Current
PARAMETER
I = 8 mA
OL
I = -4 mA
OH
0V V V (Max.)
3.5V V V 0V V V 0V V V V = 5V, V = 0.5V
CC OUT
V = 0.5V, V = 3.0V
IL
f = 1 MHz
CLOCK
1. One output at a time for a maximum duration of one second. V = 0.5V was selected to avoid test problems
CONDITION MIN. TYP. MAX. UNITS
2.4
IN IL
IN CC
IL
IN
IN IL
– – – – –
IH
OUT
Commercial Industrial
– –
by tester ground degradation. Characterized but not 100% tested.
2. Measured using eight 16-bit counters.
3. Typical values are at V = 5V and T = 25°C.
4. Maximum I varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
CC
CC A
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate maximum I .
CC
0213a
V V
4
External Timing Parameters
Over Recommended Operating Conditions
Specifications ispLSI and pLSI 1032E
4
PARAMETER
t
pd1
t
pd2
f
max (Int.)
f
max (Ext.)
f
max (Tog.)
t
su1
t
co1
t
h1
t
su2
t
co2
t
h2
t
r1
t
rw1
t
ptoeen
t
ptoedis
t
goeen
t
goedis
t
wh 18 External Synchronous Clock Pulse Duration, High 4.0 ns
t
wl
t
su3
t
h3
1. Unless noted otherwise, all parameters use the GRP, 20 PTXOR path, ORP and Y0 clock.
2. Refer to Timing Model in this data sheet for further details.
3. Standard 16-bit counter using GRP feedback.
4. Reference Switching Test Conditions section.
TEST
COND.
A 1 Data Propagation Delay, 4PT Bypass, ORP Bypass 10.0 ns A 2 Data Propagation Delay, Worst Case Path ns A 3 Clock Frequency with Internal Feedback 100 MHz – 4 Clock Frequency with External Feedback MHz – 5 Clock Frequency, Max. Toggle MHz – 6 GLB Reg. Setup Time before Clock,4 PT Bypass ns
A 7 GLB Reg. Clock to Output Delay, ORP Bypass ns – 8 GLB Reg. Hold Time after Clock, 4 PT Bypass ns – 9 GLB Reg. Setup Time before Clock ns
10 GLB Reg. Clock to Output Delay ns – 11 GLB Reg. Hold Time after Clock ns A 12 Ext. Reset Pin to Output Delay ns – 13 Ext. Reset Pulse Duration ns B 14 Input to Output Enable ns C 15 Input to Output Disable ns B 16 Global OE Output Enable ns9.0 C 17 Global OE Output Disable ns9.0
19 External Synchronous Clock Pulse Duration, Low 4.0 ns – 20 I/O Reg. Setup Time before Ext. Sync Clock (Y2, Y3) ns
21 I/O Reg. Hold Time after Ext. Sync. Clock (Y2, Y3) ns
2
DESCRIPTION#
( )
1 twh + tw1
1
3
1
( )
tsu2 + tco1
-125
MIN. MAX.
7.5
10.0
125
5.0 –
0.0
6.0 –
0.0
10.0
5.0
12.0
12.0
– – 7.0 – 7.0
3.0
3.0
3.0
0.0
– – –
5.0 – –
6.0 –
– –
– –
91.0 167
-100
MIN. MAX.
12.5
71.0 125
7.0
6.0
0.0
8.0
7.0
0.0
13.5
6.5
15.0
15.0
– –
3.5
0.0
Table 2-0030A/1032E
UNITS
5
External Timing Parameters
Over Recommended Operating Conditions
Specifications ispLSI and pLSI 1032E
4
PARAMETER
t
pd1
t
pd2
f
max (Int.)
f
max (Ext.)
f
max (Tog.)
t
su1
t
co1
t
h1
t
su2
t
co2
t
h2
t
r1
t
rw1
t
ptoeen
t
ptoedis
t
goeen
t
goedis
t
wh 18 External Synchronous Clock Pulse Duration, High 5.0 ns
t
wl
t
su3
t
h3
1. Unless noted otherwise, all parameters use the GRP, 20 PTXOR path, ORP and Y0 clock.
2. Refer to Timing Model in this data sheet for further details.
3. Standard 16-bit counter using GRP feedback.
4. Reference Switching Test Conditions section.
TEST
COND.
A 1 Data Propagation Delay, 4PT Bypass, ORP Bypass 15.0 ns A 2 Data Propagation Delay, Worst Case Path ns A 3 Clock Frequency with Internal Feedback 70.0 MHz – 4 Clock Frequency with External Feedback MHz – 5 Clock Frequency, Max. Toggle MHz – 6 GLB Reg. Setup Time before Clock,4 PT Bypass ns
A 7 GLB Reg. Clock to Output Delay, ORP Bypass ns – 8 GLB Reg. Hold Time after Clock, 4 PT Bypass ns – 9 GLB Reg. Setup Time before Clock ns
10 GLB Reg. Clock to Output Delay ns – 11 GLB Reg. Hold Time after Clock ns A 12 Ext. Reset Pin to Output Delay ns – 13 Ext. Reset Pulse Duration ns B 14 Input to Output Enable ns C 15 Input to Output Disable ns B 16 Global OE Output Enable ns12.0 C 17 Global OE Output Disable ns
19 External Synchronous Clock Pulse Duration, Low 5.0 ns – 20 I/O Reg. Setup Time before Ext. Sync Clock (Y2, Y3) ns
21 I/O Reg. Hold Time after Ext. Sync. Clock (Y2, Y3) ns
2
DESCRIPTION#
1
1
( )
twh + tw1
3
1
( )
tsu2 + tco1
-90
MIN. MAX.
10.0
12.5
90.0
69.0 125
– – –
7.5 –
6.0
0.0
8.5
7.0
0.0
13.5
6.5
15.0
15.0
USE 1032E-100 FOR
9.0 – 9.0 12.0
4.0
4.0
3.5
0.0
-80
MIN. MAX.
12.0
15.0
80.0
8.5
6.5
0.0
7.5
0.0
14.0
8.0
16.5
16.5
– – 10.0 – 10.0
4.5
4.5
3.5
0.0
– – –
– –
– –
– –
61.0 111
10.0
NEW DESIGNS
-70
MIN. MAX.
17.5
56.0 100
9.0
7.0
0.0
11.0
8.0
0.0
15.0
10.0
18.0
18.0
– –
4.0
0.0
Table 2-0030B/1032E
UNITS
6
Specifications ispLSI and pLSI 1032E
Internal Timing Parameters
PARAM.
2
1
DESCRIPTION#
Inputs
t
iobp
t
iolat
t
iosu
t
ioh
t
ioco
t
ior
t
din
22 I/O Register Bypass ns 23 I/O Latch Delay ns 24 I/O Register Setup Time before Clock ns 25 I/O Register Hold Time after Clock ns 26 I/O Register Clock to Out Delay ns 27 I/O Register Reset to Out Delay ns 28 Dedicated Input Delay ns
GRP
t
grp1
t
grp4
t
grp8
t
grp16
t
grp32
29 GRP Delay, 1 GLB Load ns 30 GRP Delay, 4 GLB Loads ns 31 GRP Delay, 8 GLB Loads ns 32 GRP Delay, 16 GLB Loads ns 33 ns
GRP Delay, 32 GLB Loads
GLB
t
4ptbpc
t
4ptbpr
t
1ptxor
t
20ptxor
t
xoradj
t
gbp
t
gsu
t
gh
t
gco
t
gro
t
ptre
t
ptoe
t
ptck
34 4 Prod.Term Bypass Path Delay (Combinatorial) ns 35 4 Prod. Term Bypass Path Delay (Registered) ns 36 1 Prod.Term/XOR Path Delay ns 37 20 Prod. Term/XOR Path Delay ns 38 XOR Adjacent Path Delay ns 39 GLB Register Bypass Delay 40 GLB Register Setup Time before Clock ns
41 GLB Register Hold Time after Clock ns 42 GLB Register Clock to Output Delay ns 43 GLB Register Reset to Output Delay ns
44 GLB Prod.Term Reset to Register Delay ns 45 GLB Prod. Term Output Enable to I/O Cell Delay ns
46 GLB Prod. Term Clock Delay ns
3
ORP
t
orp
t
orpbp
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR adjacent path can only be used by hard macros.
47 ORP Delay ns 48 ORP Bypass Delay ns
MIN.
– –
3.0
0.0 – – –
– – –
– – – – –
0.1
4.5 – –
– –
2.9
– –
-125
0.3
1.9 – –
4.6
4.6
2.3
1.8
2.0
2.3
2.8
3.8
3.9
4.0
3.6
5.0
5.0
0.4 –
2.3
4.9
3.9
5.4
4.0
1.0
0.0
-100
MIN.MAX. MAX.
0.3
2.3
3.5
0.0
5.0
5.0
2.7
1.9
2.4
2.4
3.0
4.2
5.3
5.3
4.6
5.8
6.3
1.0
0.5
5.8
2.5
6.2
4.5
7.2
3.5
4.7
1.0
0.0
Table 2-0036A/1032E
UNITS
ns
7
Specifications ispLSI and pLSI 1032E
Internal Timing Parameters
PARAM.
2
1
DESCRIPTION#
Inputs
t
iobp
t
iolat
t
iosu
t
ioh
t
ioco
t
ior
t
din
22 I/O Register Bypass ns 23 I/O Latch Delay ns 24 I/O Register Setup Time before Clock 3.5 ns 25 I/O Register Hold Time after Clock 0.0 ns 26 I/O Register Clock to Out Delay ns 27 I/O Register Reset to Out Delay ns 28 Dedicated Input Delay ns
GRP
t
grp1
t
grp4
t
grp8
t
grp16
t
grp32
29 GRP Delay, 1 GLB Load ns 30 GRP Delay, 4 GLB Loads ns 31 GRP Delay, 8 GLB Loads ns 32 GRP Delay, 16 GLB Loads ns 33 –ns
GRP Delay, 32 GLB Loads
GLB
t
4ptbpc
t
4ptbpr
t
1ptxor
t
20ptxor
t
xoradj
t
gbp
t
gsu
t
gh
t
gco
t
gro
t
ptre
t
ptoe
t
ptck
34 4 Prod.Term Bypass Path Delay (Combinatorial) ns 35 4 Prod. Term Bypass Path Delay (Registered) ns 36 1 Prod.Term/XOR Path Delay ns 37 20 Prod. Term/XOR Path Delay ns 38 XOR Adjacent Path Delay ns 39 GLB Register Bypass Delay 40 GLB Register Setup Time before Clock ns
41 GLB Register Hold Time after Clock ns 42 GLB Register Clock to Output Delay ns 43 GLB Register Reset to Output Delay ns
44 GLB Prod.Term Reset to Register Delay ns 45 GLB Prod. Term Output Enable to I/O Cell Delay ns
46 GLB Prod. Term Clock Delay ns
3
ORP
t
orp
t
orpbp
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR adjacent path can only be used by hard macros.
47 ORP Delay ns 48 ORP Bypass Delay 0.0 ns
-90
MIN. MAX.
0.3
2.3
3.5
0.0
5.0
5.0
2.6
2.1
2.3
2.6
3.2
4.4
5.7
6.1
5.6
6.8
7.1
0.4
USE 1032E-100 FOR
0.2
6.8
2.9
6.3
5.1
7.1
4.1
5.3
1.0
0.0
-80
MIN.
0.3
2.7 – –
5.4
5.4
2.8
2.2
2.5
2.8
3.5
4.8
7.1
6.7
6.6
7.8
NEW DESIGNS
8.2
–ns
1.3
0.5
7.9
2.9
6.4
5.5
8.0
4.5
5.8
1.0
0.0
-70
MIN.MAX. MAX.
0.3
3.3
4.0
0.0
0.5
8.8
4.8
– –
6.1
6.0
2.8
2.5
2.5
3.2
4.0
5.6
8.8
7.2
8.3
8.7
9.2
1.6 –
2.9
6.8
5.8
9.0
6.2
1.0
Table 2-0036B/1032E
UNITS
8
Specifications ispLSI and pLSI 1032E
Internal Timing Parameters
1
DESCRIPTION#PARAM.
Outputs
t t t t t
ob sl oen odis goe
49 Output Buffer Delay ns 50 Output Buffer Delay, Slew Limited Adder ns 51 I/O Cell OE to Output Enabled ns 52 I/O Cell OE to Output Disabled ns 53 Global OE ns
Clocks
t
gy0
t
gy1/2
t
gcp
t
ioy2/3
t
iocp
54 Clk Delay, Y0 to Global GLB Clk Line (Ref. clk) ns 55 Clk Delay, Y1 or Y2 to Global GLB Clk Line ns 56 Clk Delay, Clock GLB to Global GLB Clk Line ns 57 Clk Delay, Y2 or Y3 to I/O Cell Global Clk Line ns 58 Clk Delay, Clk GLB to I/O Cell Global Clk Line ns
Global Reset
t
gr
1. Internal Timing Parameters are not tested and are for reference only.
59 Global Reset to GLB and I/O Registers ns
MIN.
– – – – –
1.4
1.4
0.8
0.0
0.8
-125
1.3
9.9
4.3
4.3
2.7
1.4
1.4
1.8
0.0
1.8
2.8
-100
MIN.MAX. MAX.
2.0
10.0
5.1
5.1
3.9
1.5
1.5
1.5
1.5
1.8
0.8
0.0
0.0
1.8
0.8
4.3
Table 2-0037A/1032E
UNITS
9
Specifications ispLSI and pLSI 1032E
Internal Timing Parameters
1
DESCRIPTION#PARAM.
Outputs
t t t t t
ob sl oen odis goe
49 Output Buffer Delay ns 50 Output Buffer Delay, Slew Limited Adder ns 51 I/O Cell OE to Output Enabled ns 52 I/O Cell OE to Output Disabled ns 53 Global OE ns
Clocks
t
gy0
t
gy1/2
t
gcp
t
ioy2/3
t
iocp
54 Clock Delay, Y0 to Global GLB Clock Line (Ref. clock) 1.5 ns 55 Clock Delay, Y1 or Y2 to Global GLB Clock Line 2.6 ns 56 Clock Delay, Clock GLB to Global GLB Clock Line 0.8 ns 57 Clock Delay, Y2 or Y3 to I/O Cell Global Clock Line 0.0 ns 58 Clock Delay, Clock GLB to I/O Cell Global Clock Line 0.8 ns
Global Reset
t
gr
1. Internal Timing Parameters are not tested and are for reference only.
59 Global Reset to GLB and I/O Registers ns
-90
MIN. MAX.
1.7
10.0
5.3
5.3
3.7
1.4
1.4
2.9
2.4
1.8
0.8
0.0
0.0
1.8
0.8
USE 1032E-100 FOR
4.5
-80
MIN.
2.1
10.0
5.7
5.7
4.3
1.5
3.1
1.8
0.0
NEW DESIGNS
1.8
4.5
-70
MIN.MAX. MAX.
2.6
10.0
6.2
6.2
5.8
1.5
1.5
1.5
1.5
0.8
1.8
0.0
0.0
0.8
1.8
4.6
Table 2-0037B/1032E
UNITS
10
Specifications ispLSI and pLSI 1032E
ispLSI and pLSI 1032E Timing Model
I/O CellORPGLBGRPI/O Cell
Feedback
Ded. In
I/O Pin (Input)
Reset
Y1,2,3
Y0
GOE 0,1
#59
#28
I/O Reg Bypass
#22
Input
Register
D RST
Q
#23 - 27
GRP4
#30
GRP Loading
Delay
#29, 31 - 33
Clock
Distribution
#55 - 58
#54
#53
#34 Comb 4 PT Bypass
Reg 4 PT Bypass
#35
20 PT
XOR Delays
#36 - 38
#59
Control
RE
PTs
OE CK
#44 - 46
Derivations of tsu, th and tco from the Product Term Clock
tsu
2.2 ns
th Clock (max) + Reg h - Logic
3.5 ns
=
Logic + Reg su - Clock (min)
tiobp + tgrp4 + t20ptxor) + (tgsu) – (tiobp + tgrp4 + tptck(min))
=
( (#22 + #30 + #37) + (#40) – (#22 + #30 + #46)
=
(0.3 + 2.0 + 5.0) + (0.1) – (0.3 + 2.0 + 2.9)
=
=
tiobp + tgrp4 + tptck(max)) + (tgh) – (tiobp + tgrp4 + t20ptxor)
=
( (#22 + #30 + #46) + (#41) - (#22 + #30 + #37)
=
(0.3 + 2.0 + 4.0) + (4.5) – (0.3 + 2.0 + 5.0)
=
GLB Reg Bypass ORP Bypass
#39
GLB Reg
Delay
DQ RST
#40 - 43
1
#48
ORP
Delay
#47
#49, 50
#51, 52
0491
I/O Pin
(Output)
tco
10.9 ns
Derivations of tsu, th and tco from the Clock GLB
tsu
2.9 ns
th
2.7 ns
tco
5.5 ns
Clock (max) + Reg co + Output
=
tiobp + tgrp4 + tptck(max)) + (tgco) + (torp + tob)
(
=
(#22 + #30 + #46) + (#42) + (#47 + #49)
=
(0.3 + 2.0 + 4.0) + (2.3) + (1.0 + 1.3)
=
1
=
Logic + Reg su - Clock (min)
tiobp + tgrp4 + t20ptxor) + (tgsu) – (tgy0(min) + tgco + tgcp(min))
=
( (#22 + #30 + #37) + (#40) – (#54 + #42 + #56)
=
(0.3 + 2.0 + 5.0) + (0.1) – (1.4 + 2.3 + 0.8)
=
Clock (max) + Reg h - Logic
=
tgy0(max) + tgco + tgcp(max)) + (tgh) – (tiobp + tgrp4 + t20ptxor)
(
=
(#54 + #42 + #56) + (#41) – (#22 + #30 + #37)
=
(1.4 + 2.3 + 1.8) + (4.5) – (0.3 + 2.0 + 5.0)
=
Clock (max) + Reg co + Output
=
tgy0(max) + tgco + tgcp(max)) + (tgco) + (torp + tob)
(
=
(#54 + #42 + #56) + (#42) + (#47 + #49)
=
(1.4 + 2.3 + 1.8) + (2.3) + (1.0 + 1.3)
=
1. Calculations are based upon timing specifications for the ispLSI and pLSI 1032E-125.
Table 2-0042a/1032E
11
Specifications ispLSI and pLSI 1032E
Maximum GRP Delay vs GLB Loads
6.0
5.0
4.0
GRP Delay (ns)
3.0
2.0
1.0 1 8 16 32
4
Power Consumption
ispLSI and pLSI 1032E-70 ispLSI and pLSI 1032E-80
ispLSI and pLSI 1032E-90/100 ispLSI and pLSI 1032E-125
GLB Load
GRP/GLB/1032E
Power consumption in the ispLSI and pLSI 1032E device depends on two primary factors: the speed at which the
used. Figure 3 shows the relationship between power and operating speed.
device is operating, and the number of product terms
Figure 3. Typical Device Power Consumption vs fmax
350 300
250
200
CC (mA)
I
150 100
20
0
I can be estimated for the ispLSI and pLSI 1032E using the following equation:
CC
I (mA) = 15 + (# of PTs * 0.59) + (# of nets * Max freq * 0.0078)
CC
Where: # of PTs = Number of Product Terms used in design # of nets = Number of Signals used in device Max freq = Highest Clock Frequency to the device (in MHz)
40
Notes: Configuration of eight 16-bit counters
60 80
f
max (MHz)
Typical current at 5V, 25°C
ispLSI and pLSI 1032E
100
125 150
The I estimate is based on typical conditions (VCC = 5.0V, room temperature) and an assumption of four GLB
CC
loads on average exists. These values are for estimates only. Since the value of I is sensitive to operating conditions and the program in the device, the actual I should be verified.
CC
CC
0127/1032E
12
Pin Description
Specifications ispLSI and pLSI 1032E
NAME
I/O 0 - I/O 3 I/O 4 - I/O 7 I/O 8 - I/O 11 I/O 12 - I/O 15 I/O 16 - I/O 19 I/O 20 - I/O 23 I/O 24 - I/O 27 I/O 28 - I/O 31 I/O 32 - I/O 35 I/O 36 - I/O 39 I/O 40 - I/O 43 I/O 44 - I/O 47 I/O 48 - I/O 51 I/O 52 - I/O 55 I/O 56 - I/O 59 I/O 60 - I/O 63
GOE 1/IN 5
IN 6, IN 7
PLCC PIN
NUMBERS
27,
26,
31,
30,
35,
34,
39,
38,
46,
45,
50,
49,
54,
53,
58,
57,
69,
68,
73,
72,
77,
76,
81,
80,
4,
3,
8,
7,
12,
11,
16,
15, 67
84
2,
19
23ispEN**/NC
25SDI*/IN 0
42MODE*/IN 1
44SDO*/IN 2
61SCLK*/IN 3
24RESET
20Y0
66Y1
28, 32, 36, 40, 47, 51, 55, 59, 70, 74, 78, 82, 5, 9, 13, 17,
29, 33, 37, 41, 48, 52, 56, 60, 71, 75, 79, 83, 6, 10, 14, 18
TQFP PIN
NUMBERS
18,
17,
22,
21,
30,
29,
34,
33,
41,
40,
45,
44,
53,
48,
57,
56,
68,
67,
72,
71,
80,
79,
84,
83,
91,
90,
95,
94,
3,
98,
7,
6, 66
87
89,
10
14
16
37
39
60
15
11
65
19, 23, 31, 35, 42, 46, 54, 58, 69, 73, 81, 85, 92, 96, 4, 8,
DESCRIPTION
Input/Output Pins - These are the general purpose I/O pins used by the logic
20,
array.
28, 32, 36, 43, 47, 55, 59, 70, 78, 82, 86, 93, 97, 5, 9
This is a dual function pin. It can be used either as Global Output Enable for
GOE 0/IN 4
all I/O cells or it can be used as a dedicated input pin.
This is a dual function pin. It can be used either as Global Output Enable for all I/O cells or it can be used as a dedicated input pin.
Dedicated input pins to the device. Input - Dedicated in-system programming enable input pin. This pin is
brought low to enable the programming mode. The MODE, SDI, SDO and SCLK options become active.
Input - This pin performs two functions. When ispEN is logic low, it functions as an input pin to load programming data into the device. SDI/IN 0 is also used as one of the two control pins for the isp state machine. It is a dedicated input pin when ispEN is logic high.
Input - This pin performs two functions. When ispEN is logic low, it functions as pin to control the operation of the isp state machine. It is a dedicated input pin when ispEN is logic high.
Output/Input - This pin performs two functions. When ispEN is logic low, it functions as an output pin to read serial shift register data. It is a dedicated input pin when ispEN is logic high.
Input - This pin performs two functions. When ispEN is logic low, it functions as a clock pin for the Serial Shift Register. It is a dedicated input pin when ispEN is logic high.
Active Low (0) Reset pin which resets all of the GLB and I/O registers in the device.
Dedicated Clock input. This clock input is connected to one of the clock inputs of all of the GLBs on the device.
Dedicated Clock input. This clock input is brought into the clock distribution network, and can optionally be routed to any GLB on the device.
63Y2
62Y3
GND VCC 21, 65
NC
* ispLSI 1032E only ** ispEN for ispLSI 1032E; NC for pLSI 1032E, must be left floating or tied to V , must not be grounded or tied to any other signal.
1, 22, 43, 64
62
61
13, 38, 63, 88
64
12,
2, 24, 25, No connect.
1,
27, 49, 50,
26,
52, 74, 75,
51,
77, 99, 100
76,
Dedicated Clock input. This clock input is brought into the clock distribution network, and can optionally be routed to any GLB and/or any I/O cell on the device.
Dedicated Clock input. This clock input is brought into the clock distribution network, and can optionally be routed to any I/O cell on the device.
Ground (GND) Vcc
CC
13
Table 2-0002A/1032E
Specifications ispLSI and pLSI 1032E
Pin Configurations
ispLSI and pLSI 1032E 84-Pin PLCC Pinout Diagram
I/O 56
I/O 55
I/O 54
I/O 53
I/O 52
I/O 51
I/O 50
I/O 49
I/O 48
111098765432184838281807978777675
IN 6
GND
**GOE 1/IN 5
I/O 47
I/O 46
I/O 45
I/O 44
I/O 43
I/O 42
I/O 41
I/O 40
I/O 39
I/O 57 I/O 58 I/O 59 I/O 60 I/O 61 I/O 62 I/O 63
IN 7
Y0
VCC
GND
*ispEN/NC
RESET
*SDI/IN 0
I/O 0 I/O 1 I/O 2
I/O 3 I/O 4 I/O 5 I/O 6
12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
ispLSI 1032E
pLSI 1032E
Top View
74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54
I/O 38 I/O 37 I/O 36 I/O 35 I/O 34 I/O 33 I/O 32 **GOE 0/IN 4 Y1 VCC GND Y2 Y3 *SCLK/IN 3 I/O 31 I/O 30 I/O 29 I/O 28 I/O 27 I/O 26 I/O 25
33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53
I/O 7
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
*MODE/IN 1
GND
*SDO/IN 2
I/O 16
I/O 17
I/O 18
I/O 19
I/O 20
I/O 21
I/O 22
I/O 23
I/O 24
* Pins have dual function capability for ispLSI 1032E only (except pin 23, which is ispEN only).
** Pins have dual function capability which is software selectable.
0123-32-isp
14
Specifications ispLSI and pLSI 1032E
Pin Configurations
ispLSI 1032E 100-Pin TQFP Pinout Diagram
NC
NC I/O 57 I/O 58 I/O 59 I/O 60 I/O 61 I/O 62 I/O 63
IN 7
Y0
VCC
GND
ispEN
RESET
*SDI/IN 0
I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6
NC
NC
NCNCI/O 56
100
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
26272829303132333435363738394041424344454647484950
I/O 55
I/O 54
I/O 53
I/O 52
I/O 51
I/O 50
I/O 49
I/O 48
IN 6
GND
**GOE 1/IN 5
I/O 47
I/O 46
I/O 45
I/O 44
I/O 43
I/O 42
I/O 41
9998979695949392919089888786858483828180797877
ispLSI 1032E
Top View
I/O 40
I/O 39NCNC
76
75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
NC NC I/O 38 I/O 37 I/O 36 I/O 35 I/O 34 I/O 33 I/O 32 **GOE 0/IN 4 Y1 VCC GND Y2 Y3 *SCLK/IN 3 I/O 31 I/O 30 I/O 29 I/O 28 I/O 27 I/O 26 I/O 25 NC NC
NC
NC
I/O 7
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
GND
I/O 15
*MODE/IN1
I/O 16
I/O 17
I/O 18
*SDO/IN 2
I/O 19
I/O 20
* Pins have dual function capability. ** Pins have dual function capability which is software selectable.
15
I/O 21
I/O 22
I/O 23
I/O 24
NC
NC
0766A-32E-isp
Part Number Description
Specifications ispLSI and pLSI 1032E
(is)pLSI
1032E XXX X X X
Device Family
Device Number
Speed
f f
f
max
f
max
f
max
max max
125 = 125 MHz 100 = 100 MHz 90 = 90 MHz 80 = 80 MHz 70 = 70 MHz
ispLSI and pLSI 1032E Ordering Information
COMMERCIAL
FAMILY fmax (MHz)
125 125 100-Pin TQFP7.5 ispLSI 1032E-125LT
100
ispLSI
pLSI
*ispLSI 1032E-100 recommended for new designs.
100
90 90 80 12
80 70 70
125 100
90 84-Pin PLCC10 pLSI 1032E-90LJ* 80
70
7.5
10
10
12 15 15
10
15
ORDERING NUMBER PACKAGEtpd (ns)
ispLSI 1032E-100LJ
ispLSI 1032E-90LJ*
ispLSI 1032E-80LT*
ispLSI 1032E-70LJ
pLSI 1032E-125LJ
pLSI 1032E-80LJ*
Grade
Blank = Commercial I = Industrial
Package
J = PLCC T = TQFP
Power
L = Low
0212/1032E
84-Pin PLCCispLSI 1032E-125LJ
84-Pin PLCC10
100-Pin TQFPispLSI 1032E-100LT
84-Pin PLCC10
100-Pin TQFPispLSI 1032E-90LT*
84-Pin PLCCispLSI 1032E-80LJ*
100-Pin TQFP
84-Pin PLCC
100-Pin TQFPispLSI 1032E-70LT
84-Pin PLCC7.5 84-Pin PLCCpLSI 1032E-100LJ
84-Pin PLCC12
84-Pin PLCCpLSI 1032E-70LJ
Table 2-0041A/1032E
FAMILY fmax (MHz)
ispLSI
70 70
Note: Use ispLSI for all new designs.
tpd (ns)
15 15
INDUSTRIAL
ORDERING NUMBER PACKAGE
ispLSI 1032E-70LJI ispLSI 1032E-70LTI
84-Pin PLCC
100-Pin TQFP
16
Table 2-0041B/1032E
Copyright © 1997 Lattice Semiconductor Corporation. E2CMOS, GAL, ispGAL, ispLSI, pLSI, pDS, Silicon Forest, UltraMOS, Lattice Semiconductor, L (stylized) Lattice
Semiconductor Corp., L (stylized) and Lattice (design) are registered trademarks of Lattice Semiconductor Corporation. Generic Array Logic, ISP, ispATE, ispCODE, ispDOWNLOAD, ispDS, ispDS+, ispGDS, ispGDX, ispHDL, ispJTAG, ispStarter, ispSTREAM, ispTEST, ispTURBO, ispVECTOR, ispVerilog, ispVHDL, Latch-Lock, LHDL, pDS+, RFT, Total ISP and Twin GLB are trademarks of Lattice Semiconductor Corporation. ISP is a service mark of Lattice Semiconductor Corporation. All brand names or product names mentioned are trademarks or registered trademarks of their respective holders.
Lattice Semiconductor Corporation (LSC) products are made under one or more of the following U.S. and international patents: 4,761,768 US, 4,766,569 US, 4,833,646 US, 4,852,044 US, 4,855,954 US, 4,879,688 US, 4,887,239 US, 4,896,296 US, 5,130,574 US, 5,138,198 US, 5,162,679 US, 5,191,243 US, 5,204,556 US, 5,231,315 US, 5,231,316 US, 5,237,218 US, 5,245,226 US, 5,251,169 US, 5,272,666 US, 5,281,906 US, 5,295,095 US, 5,329,179 US, 5,331,590 US, 5,336,951 US, 5,353,246 US, 5,357,156 US, 5,359,573 US, 5,394,033 US, 5,394,037 US, 5,404,055 US, 5,418,390 US, 5,493,205 US, 0194091 EP, 0196771B1 EP, 0267271 EP, 0196771 UK, 0194091 GB, 0196771 WG, P3686070.0-08 WG. LSC does not represent that products described herein are free from patent infringement or from any third-party right.
The specifications and information herein are subject to change without notice. Lattice Semiconductor Corporation (LSC) reserves the right to discontinue any product or service without notice and assumes no obligation to correct any errors contained herein or to advise any user of this document of any correction if such be made. LSC recommends its customers obtain the latest version of the relevant information to establish, before ordering, that the information being relied upon is current.
LSC warrants performance of its products to current and applicable specifications in accordance with LSC’s standard warranty. Testing and other quality control procedures are performed to the extent LSC deems necessary. Specific testing of all parameters of each product is not necessarily performed, unless mandated by government requirements.
LSC assumes no liability for applications assistance, customer’s product design, software performance, or infringements of patents or services arising from the use of the products and services described herein.
LSC products are not authorized for use in life-support applications, devices or systems. Inclusion of LSC products in such applications is prohibited.
LATTICE SEMICONDUCTOR CORPORATION 5555 Northeast Moore Court Hillsboro, Oregon 97124 U.S.A. Tel.: (503) 681-0118 FAX: (503) 681-3037 http://www.latticesemi.com July 1997
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