Lattice GAL16V8-883 User Manual

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I/CLK
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查询GAL16V8D供应商查询GAL16V8D供应商
GAL16V8/883
High Performance E2CMOS PLD
Generic Array Logic™
Features
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY — 7.5 ns Maximum Propagation Delay — Fmax = 100 MHz — 6 ns Maximum from Clock Input to Data Output — TTL Compatible 12 mA Outputs — UltraMOS
• 50% REDUCTION IN POWER FROM BIPOLAR — 75mA Typ Icc
• ACTIVE PULL-UPS ON ALL PINS (GAL16V8D-7 and
GAL16V8D-10)
CELL TECHNOLOGY
•E — Reconfigurable Logic — Reprogrammable Cells — 100% Tested/100% Y ields — High Speed Electrical Erasure (<100ms) — 20 Year Data Retention
• EIGHT OUTPUT LOGIC MACROCELLS — Maximum Flexibility for Complex Logic Designs — Programmable Output Polarity — Also Emulates 20-pin PAL
Fuse Map/Parametric Compatibility
• PRELOAD AND POWER-ON RESET OF ALL REGISTERS — 100% Functional Testability
• APPLICATIONS INCLUDE: — DMA Control — State Machine Control — High Speed Graphics Processing — Standard Logic Speed Upgrade
• ELECTRONIC SIGNA TURE FOR IDENTIFICATION
®
Advanced CMOS Technology
®
Devices with Full Function/
Functional Block Diagram
I/CLK
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(64 X 32)
AND-ARRAY
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PROGRAMMABLE
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8
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CLK
OLMC
OLMC
OLMC
OLMC
OLMC
OLMC
OLMC
OLMC
I/O/Q
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OE
I/OE
Description
Pin Configuration
The GAL16V8/883 is a high performance E2CMOS program­mable logic device processed in full compliance to MIL-STD-883. This military grade device combines a high performance CMOS process with Electrically Erasable (E
) floating gate technology to
LCC
CERDIP
provide the highest speed/power performance available in the 883 qualified PLD market. The GAL16V8D/883, at 7.5ns maxi­mum propagation delay time, is the world's fastest military quali­fied CMOS PLD.
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The generic GAL architecture provides maximum design flexibil­ity by allowing the Output Logic Macrocell (OLMC) to be config­ured by the user. The GAL16V8/883 is capable of emulating all standard 20-pin PAL metric compatibility.
Unique test circuitry and reprogrammable cells allow complete AC, DC, and functional testing during manufacture. Therefore, Lattice Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and data retention in excess of 20 years are specified.
Copyright © 1999 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. February 1999 Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
16v8mil_03
®
devices with full function/fuse map/para-
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I/CLKII
Vcc
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220
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GAL16V8
T op View
91113
I GND
I/OE
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I/O/Q I/O/Q
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I/O/Q
I/O/Q
16
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GAL
16V8
Specifications GAL16V8D-7/10/883
Absolute Maximum Ratings
(1)
Supply voltage VCC...................................... –0.5 to +7V
Input voltage applied .......................... –2.5 to V
+1.0V
CC
Off-state output voltage applied .........–2.5 to VCC +1.0V
Recommended Operating Conditions
Case T emperature (TC)..............................–55 to 125°C
Supply voltage (V
with Respect to Ground ..................... +4.50 to +5.50V
CC
)
Storage Temperature ................................–65 to 150°C
Case T emperature with
Power Applied........................................–55 to 125°C
1.Stresses above those listed under the “Absolute Maximum Rat­ings” may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL PARAMETER CONDITION MIN. TYP.
MAX. UNITS
VIL Input Low Voltage Vss – 0.5 0.8 V
VIH Input High Voltage 2.0 Vcc+1 V
IIL
Input or I/O Low Leakage Current 0V VIN VIL (MAX.) 100 µA
IIH Input or I/O High Leakage Current 3.5V VIN VCC ——10µA VOL Output Low Voltage IOL = MAX. Vin = VIL or VIH 0.5 V VOH Output High Voltage IOH = MAX. Vin = VIL or VIH 2.4 V
IOL Low Level Output Current 12 mA
IOH High Level Output Current –2 mA
IOS
Output Short Circuit Current VCC = 5V VOUT = 0.5V TA= 25°C –30 –150 mA
ICC Operating Power VIL = 0.5V VIH = 3.0V L-7/-10 75 130 mA
Supply Current f
1) The leakage current is due to the internal pull-up on all pins. See Input Buffer section for more information.
2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Characterized but not 100% tested.
3) Typical values are at Vcc = 5V and TA = 25 °C
toggle = 15MHz Outputs Open
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AC Switching Characteristics
Specifications GAL16V8D-7/10/883
Over Recommended Operating Conditions
PARAMETER UNITS
TEST
COND
DESCRIPTION
.
-7
MIN. MAX.
-10
MIN. MAX.
tpd A Input or I/O to Combinational Output 1 7.5 2 10 ns tco A Clock to Output Delay 1617ns
tcf
Clock to Feedback Delay 6 7 ns
tsu Setup Time, Input or Feedback before Clock 7—10—ns
th Hold Time, Input or Feedback after Clock 0—0—ns
A Maximum Clock Frequency with 76.9 58.8 MHz
External Feedback, 1/(tsu + tco)
fmax
A Maximum Clock Frequency with 76.9 58.8 MHz
Internal Feedback, 1/(tsu + tcf)
A Maximum Clock Frequency with 100 62.5 MHz
No Feedback
twh Clock Pulse Duration, High 5 8 ns
twl Clock Pulse Duration, Low 5 8 ns
ten B Input or I/O to Output Enabled 1 9 10 ns
B OE to Output Enabled 1 7 10 ns
tdis C Input or I/O to Output Disabled 1 9 10 ns
C OE to Output Disabled 1 7 10 ns
1) Refer to Switching T est Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
3) Refer to fmax Descriptions section.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS
C
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C
I/O
*Characterized but not 100% tested.
Input Capacitance 10 pF VCC = 5.0V , VI = 2.0V
I/O Capacitance 10 pF VCC = 5.0V , V
= 2.0V
I/O
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