HP 8960 Series 10 E5515A Wireless Communications Test Set
Test at the Speed
of the Revolution
Breakthrough speed and throughput for GSM mobile phone testing
in high-volume manufacturing
A next-generation test set that delivers
dramatic breakthroughs in speed and throughput
oday’s GSM mobile phone manufacturing market is mature and highly
competitive. To be successful, manufacturers have to produce high
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volumes of quality phones at the lowest possible cost.
The HP 8960 Series 10 wireless communications test set (model E5515A)
will help manufacturers meet these manufacturing goals. This new test set
has been designed from the start to deliver breakthrough speed and
flexibility for high-volume, automated production-test environments.
Featuring the HP E1960A GSM mobile test application, the HP 8960
Series 10 test set has all the features and functionality needed for fast,
accurate, automated testing of today’s GSM 900, DCS 1800, and PCS 1900
mobile phones. It will help GSM mobile manufacturers move manufacturing volumes up and the cost of
testing down.
The flexible design of the test
set ensures an easy upgrade
path to other wireless formats
and enhancements. This makes
the HP 8960 Series 10 the one
manufacturing test set that can
deliver a competitive advantage today and in the future.
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Gain instant competitive advantage with a
test platform designed for measurement speed
he phenomenal speed and
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concurrent measurement
capability of the HP 8960 Series 10
test set provide immediate benefits
that translate into a competitive
advantage for GSM mobile manufacturers.
Designed for speed, the HP 8960
Series 10 dramatically cuts test
times to help reduce the manufacturing cost-per-phone. The test set
runs individual tests from ten to
thirty times faster than first- or
second-generation GSM test sets.
With dramatic speed improvement,
your production lines will require
fewer test sets, lower test costs
and save floor space. The HP 8960
Series 10 also gives you the option
to further enhance reliability and
quality of your GSM mobile phones
by running tests that were once
considered too time consuming to
execute in a high-volume manufacturing environment.
By taking advantage of the
breakthroughs in measurement
speed, you will likely be able to
boost the overall throughput of
your production-test system by as
much as 200 to 300 percent!
Concurrent measurements
The HP 8960 Series 10 GSM mobile
phone test set is HP’s first product
to use HP’s new Reduced Instruction Parallel Processing (RIPP)
architecture. The RIPP architecture allows the test set to run
concurrent measurements using
independent hardware and firmware. In addition to enabling faster
measurements, the RIPP architecture significantly simplifies remote
programming of complex, parallel
measurements.
You can launch a suite of
transmitter and receiver
measurements to be executed
simultaneously. Because of
parallel hardware, and an
operating system that allows
concurrent processes, the total test
time is significantly shorter than
running the same tests
sequentially. Simultaneous
measurement doesn’t stop
you from retrieving the results
of each measurement as it
is completed.
For example, a phase error
measurement (typical 5-burst
average), which takes 5 seconds to
run on a previous-generation test
set, takes only 150 milliseconds on
the HP 8960 Series 10 GSM test set.
An output RF spectrum measurement, also requiring 5 seconds on
an older test set, takes only 200
milliseconds. Transmitter and
receiver measurements can be
made concurrently, reducing test
time even further.
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