5
Eyeline Mode
Eyeline Mode is a new feature only available in the
86100C that provides insight into the effects of specific
bit transitions within a data pattern. The unique view
assists diagnosis of device or system failures do to
specific transitions or sets of transitions within a
pattern. When combined with mask limit tests, Eyeline
Mode can quickly isolate the specific bit that caused a
mask violation.
Traditional triggering methods on an equivalent time
sampling scope are quite effective at generating eye
diagrams. However, these eye diagrams are made up of
samples whose timing relationship to the data pattern is
effectively random, so a given eye will be made up of
samples from many different bits in the pattern taken
with no specific timing order. The result is that
amplitude versus time trajectories of specific bits in
the pattern are not visible. Also, averaging of the eye
diagram is not valid, as the randomly related samples
will effectively average to zero.
Eyeline Mode uses PatternLock triggering to build up an
eye diagram from samples taken sequentially through
the data pattern. This maintains a specific timing
relationship between samples and allows Eyeline Mode
to draw the eye based on specific bit trajectories.
Effects of specific bit transitions can be investigated,
and averaging can be used with the eye diagram.
Measurement speed
Measurement speed has been increased with both fast
hardware and a user-friendly instrument. In the lab,
don’t waste time trying to figure out how to make a
measurement. With the simple-to-use 86100C, you don’t
have to relearn how to make a measurement each time
you use it.
Manufacturers are continually forced to reduce the cost
per test. Solution: Fast PC-based processors, resulting in
high measurement throughput and reduced test time.
Measurements
The following measurements are available from the tool
bar, as well as the pull down menus. The available
measurements depend on the DCA-J operating mode.
Oscilloscope mode
Time
Rise Time, Fall Time, Jitter RMS, Jitter p-p, Period,
Frequency, + Pulse Width, - Pulse Width, Duty Cycle,
Delta Time, [T
max
, T
min
, T
edge
—remote commands only]
Amplitude
Overshoot, Average Power, V amptd, V p-p, V rms,
V top, V base, V max, V min, V avg
Eye/mask mode
NRZ eye measurements
Extinction Ratio, Jitter RMS, Jitter p-p, Average Power,
Crossing Percentage, Rise Time, Fall Time, One Level,
Zero Level, Eye Height, Eye Width, Signal to Noise
(Q-Factor), Duty Cycle Distortion, Bit Rate,
Eye Amplitude
RZ Eye Measurements
Extinction Ratio, Jitter RMS, Jitter p-p, Average Power,
Rise Time, Fall Time, One Level, Zero Level, Eye Height,
Eye Amplitude, Opening Factor, Eye Width, Pulse
Width, Signal to Noise (Q-Factor), Duty Cycle, Bit Rate,
Contrast Ratio
Mask Test
Open Mask, Start Mask Test, Exit Mask Test, Filter,
Mask Test Margins, Mask Test Scaling, Create NRZ Mask
Jitter Mode
Jitter Mode requires Option 001 Enhanced Trigger hardware.
There are two analysis software packages for the DCA-J.
Option 200 is the enhanced jitter analysis software, and
Option 201 is the advanced waveform analysis software.
Measurements (Option 200 Jitter Analysis)
Total Jitter (TJ), Random Jitter (RJ), Deterministic
Jitter (DJ), Periodic Jitter (PJ), Data Dependent
Jitter (DDJ), Duty Cycle Distortion (DCD), Intersymbol
Interference (ISI), Sub-Rate Jitter (SRJ)
Data Displays (Option 200 Jitter Analysis)
TJ histogram, RJ/PJ histogram, DDJ histogram,
Composite histogram, DDJ versus Bit position,
Bathtub curve, SRJ analysis
Measurements (Option 201 Advanced
Waveform Analysis)
Pattern waveform
Data Displays (Option 201 Advanced
Waveform Analysis)
Equalized waveform
TDR/TDT Mode (requires TDR module)
Quick TDR, TDR/TDT Setup, Normalize, Response,
Rise Time, Fall Time, ∆ Time, Minimum Impedance,
Maximum Impedance, Average Impedance,
Single-ended and Mixed-mode S-parameters.