A high precision pulse generator enhanced with versatile signal
generation, modulation and distortion capabilities for:
•
•
Accurate signals to test your device and not your signal source
Versatile waveform and noise generation to be ready for today‘s
and tommorrow‘s stress test challenges
•
Integrated into one instrument to minimize cabling, space and
test time.
F
unction
se
Arbitrar y
81150A
A
u
N
oise
Pulse
When signal fi delity matters — test with confi dence.
Accurate and accelerated insight into your device
through ideal and real-world signals.
The 81150A
Pulse Function Arbitrary
Noise Generator at a Glance
•
•
•
1 µHz—120 MHz pulse generation with variable rise/fall time
1 µHz—240 MHz sine waveform output
14-bit, 2 GSa/s arbitrary waveforms
•
•
•
of 26 days
•
•
•
•
512k samples deep arbitrary waveform memory per channel
Pulse, sine, square, ramp, noise and arbitrary waveforms
Noise, with an adjustable crest factor, and signal repetition time
FM, AM, PM, PWM, FSK modulation capabilities
1 or 2 channel, coupled and uncoupled
Differential outputs
Two selectable output amplifi ers:
High bandwidth amplifi er
Amplitude: 50 mVpp to 5 Vpp; 50 Ω into 50 Ω
•
100 mVpp to 10 Vpp; 50 Ω into open
Voltage window: ± 5 V; 50 Ω into 50 Ω
•
± 10 V; 50 Ω into open
± 9 V; 5 Ω into 50 Ω
High voltage amplifi er
Amplitude: 100 mVpp to 10 Vpp; 50 Ω into
•
50 Ω, 200 m pp to 20 Vpp; 5 Ω into 50 Ω , or 50 Ω into open
Voltage window: ± 10 V; 50 Ω into 50Ω
•
± 20 V; 5 Ω into 50 Ω or 50 Ω into open
•
time, width, duty cycle)
•
81105A
•
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Glitch free change of timing, parameters (delay, frequency, transition
Programming language compatible with Agilent 81101A, 81104A,
ISO 17025 and Z540 calibration
LXI class C compliant
2
Agilent 81150A Pulse Function Arbitrary Noise Generator
Data Sheet
Front Panel:
Couple / uncouple channels
USB 2.0A
External In
Trigger mode
Channel 2:
Trigger out
Strobe out
Differential output
Waveform type
Channel 1:
Trigger out
Strobe out
Differential output
Advanced mode
Back panel:
USB 2.0A
USB 2.0 B
10 MHz Ref In
LAN
10 MHz Ref Out
Modulation in 1, 2
GPIB
3Agilent 81150A Pulse Function Arbitrary Noise Generator
Data Sheet
Today‘s Challenges Require a
New Generation of Test
Instruments
You are under pressure to get products to market faster and faster, with
shrinking design schedules and increasing quality goals. The pressure is never
ending. Because differentiation means survival in the marketplace, you often
have to test unique functionality. Being confi dent in your results takes highly
adaptable and effi cient testing.
Such challenges require a new generation of test instruments, which are:
•
Accurate, to test your device and not your source
Agilent’s offering
•
•
Versatile, to be ready for today’s and tomorrows test challenges
Plug and play solutions, with minimal cabling, low space overhead and
have many functions built-in.
Whichever way you look at it, this starts with accurate, versatile and uncompromising signal sources.
Just test — with the signal you need.
The Agilent 81150A Pulse Function Arbitrary Noise Generator sets the standard for the next generation of lab: for fast, accurate insight into your design or
device under test.
•
A pulse generator with precise signals for performance verifi cation
and characterization
•
A function arbitrary generator
- for versatile signal generation to optimize testing
- for modulation to shape the signal the DUT needs
•
A noise generator to distort signals to build up worst case scenarios.
Agilent 81150A Pulse Function Arbitrary Noise Generator
Pulse Generator
Pulse Width = 10 ns
From Ideal
Precise
To any real-world
Noise Generator
and
Versatile
... the foundation for an accurate insight into your device
The new Agilent 81150A Pulse Function Arbitrary Noise Generator is an
indispensable contributor to accelerate ideal and real-world testing.
3.3 V
0.0 V
Sweep Time
Period = 20 ns
Function Arbitrary
Generator
4
Agilent 81150A Pulse Function Arbitrary Noise Generator
Data Sheet
Pulse Generator—Test your
device and not your source
81150A Channel 1 Pulse Setup
Superior precision pulses with unbeatable timing stability guarantee reproducible tests. The signal quality and trigger functionality provide everything
you need for trigger or system clock applications.
You can change the timing parameters (delay, frequency, transition time,
width, duty cycle) without dropouts or glitches. This patented, industry-leading feature means continuous operation without having to reboot or reset your
device under test, for example when you are characterizing a device by sweeping the clock frequency.
Apart from full control of the timing parameters, you can also adjust levels
and edges as needed.
Set up complex measurements
Measurement using Strobe
and Trigger
The Agilent 81150A Pulse Function Arbitrary Noise Generator is available in
a 1 or 2 channel version. On the two channel version, the channels can be uncoupled, to work independently, or coupled, for example, with a defi ned delay
between them.
Each channel provides trigger out, strobe out and differential outputs: the
basis for many complex test set ups.
Gated Burst of 4
External In
Trigger Out
Strobe Out
Out
Data Sheet
5Agilent 81150A Pulse Function Arbitrary Noise Generator
Function Arbitrary Generator
— Stress your device to its limit
Amplitude Modulation
Frequency Shift Key Modulation
If you need further signal conditioning, the Agilent 81150A Pulse Function
Arbitrary Noise Generator provides versatile waveforms and modulation
capabilities to adapt your signal to your device’s requirements. AM, FM, FSK,
PM and PWM are available at modulation frequencies up to 10 MHz.
The Agilent 81150A Pulse Function Arbitrary Noise Generator can use internal or external modulation sources.
Internal modulation can be generated from the 2nd channel or the internal
modulation source of the modulated channel.
Pulse Width Modulation
Frequency Sweep
6
Strobe Out
Out1
Agilent 81150A Pulse Function Arbitrary Noise Generator
Sweep Time
Data Sheet
Setting Up a Measurement Using
Trigger, Strobe, Modulation and
Carrier
Con tinuous P M
Phase Deviation 180 deg.
Car rier Sin ewave 0. 04 MHz
Modulated by Sinewave 0.02 MHz
Modulation
Signa l
Tr igger Out
Strobe Out
Out
Noise Generator— Repeatable
and Stochastic Noise
Gaussian curve and distribution
Jitter and noise cause misalignment of edges and levels, resulting in data errors. Noise is by its nature unpredictable because it can have many different
causes, from signal interference caused by sudden voltage changes, to distortions introduced during transmission.
It is important to be able to simulate noise-based malfunctions, for example,
to identify the additive noise produced by receiving systems — it is cheaper
to lower the noise fi gure than to increase the transmitter power! The Agilent
81150A Pulse Function Arbitrary Noise Generator lets you control the quality
of the noise, to test different cases, and according to various specifi cations.
Gaussian white noise is a good approximation to many real-world situations,
and creates mathematically traceable models, with statistical independent values. The Agilent 81150A Pulse Function Arbitrary Noise Generator provides
deterministic Gaussian white noise, with a signal repetition of 26 days. You
can decide on any arbitrary distribution, and trigger the noise to start when
you need it.
7Agilent 81150A Pulse Function Arbitrary Noise Generator
Voltage Level Crest Factor
You can also select the crest factor out of 4 values — an indicator of signal
quality — using Vp/V
which you are testing. The 81150A uses the defi nition: Crest Factor = Vp/V
or Vpp/V
RMS
scales, depending on the standard to
RMS
Voltage Level Crest Factor
Voltage Level CrestFactor
Vpp
V
P
V
RMS
RMS
The result is noise that combines two extremes:
•
•
Random and repeatable noise, for stress tests on one side
While still being suffi ciently random.
Voltage
voltage
8
Agilent 81150A Pulse Function Arbitrary Noise Generator
Data Sheet
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