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Keysight Technologies
M9080B & M9082B LTE
& LTE-Advanced FDD/TDD
X-Series Measurement Applications
for PXIe Vector Signal Analyzers
Technical Overview
– Perform LTE plus LTE-Advanced FDD and TDD
base station (eNB) and user equipment (UE)
transmitter tests
– Accelerate measurements with one-button
RF conformance tests as dened by 3GPP TS
36.141 and 36.521 specication
– Analyze carrier-aggregated signal of up to 5
contiguous/non-contiguous component carriers
– PC-based SCPI remote interface and manual
user interface
– Leverage built-in, context-sensitive help with
SCPI command reference
– Transportable license supports up to four PXI
VSA channels in one mainframe
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LTE/LTE-Advanced FDD and TDD Measurement Applications
Expand the capabilities of your M9391A and M9393A PXIe
vector signal analyzers (PXI VSAs) with Keysight Technologies' library of measurement applications - the same applications used to increase the capability and functionality
of its X-Series signal analyzers. Eleven of the most popular
applications are now available for use with Keysight's
new M9393A PXIe performance VSA and the M9391A PXI
VSA. When you combine the raw hardware speeds of the
PXI VSAs and the X-Series measurement applications for
modular instruments, you can test more products in less
time, while ensuring measurement continuity from design
to manufacturing.
The LTE/LTE-Advanced FDD and TDD measurement
applications transform the PXI VSAs into 3GPP LTE/LTEAdvanced standard-based RF transmitter testers. The
applications provide fast, one-button RF conformance
measurements to help you design, evaluate, and manufacture your LTE and LTE-Advanced base stations (eNB)
and user equipment (UE). The measurement applications
closely follow the 3GPP standard, allowing you to stay on
the leading edge of your design and manufacturing challenges.
Figure 1. LTE downlink modulation analysis measurement showing constellation, detected allocation, frame summary, and error
summary information. Measurements are color-coded based on
channel type for ease of troubleshooting.
Proven algorithms and a common user inter face across
the X-Series analyzers and modular PXI VSAs create a
consistent measurement framework for signal analysis
that ensures repeatable results and measurement integrity
so you can leverage your test system software through all
phases of product development. The LTE/LTE-Advanced
measurement applications are two in a common library of
several measurement applications. You can further extend
your test assets by utilizing up to four PXI VSAs with one
software license.
Keysight's X-Series applications for modular instruments
also include a unique "Resource Manager" that provides
direct access to PXI VSA hardware drivers for the fastest
power and spectrum-based measurements, while simultaneously using the X-Series applications for fast modulation quality measurements and the 89600 VSA software
for fast spectrum measurements.
Figure 2. Resource manager included with all X-Series measurement
applications for modular instruments.
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LTE/LTE-Advanced FDD and TDD Overview
LTE is the long term evolution of 3GPP’s universal mobile
telephone system (UMTS). The aim of LTE is to provide a
new radio access technology focused on packet-switched
data only. Multiple requirements are set to achieve
increased downlink and uplink peak data rates, scalable
channel bandwidths, spectral efciency improvements,
control/user-plane latency, and co-existence with legacy
standards while evolving towards an all-IP network. LTE
accommodates both paired spectrum for frequency division duplex (FDD) and unpaired spectrum for time division
duplex (TDD) operation. There is a high degree of commonality between FDD and TDD modes. These two modes
are coordinated in the sense that they both share the same
underlying framework including radio access schemes
orthogonal frequency division multiple access (OFDMA) for
the downlink, and single-carrier frequency division multiple access (SC-FDMA) for the uplink. Both modes share
a single radio-access specication, equally applicable to
paired and unpaired spectrum. There are some signicant
differences in specications between FDD and TDD, most
notably on the physical layer in the frame structure. There
are few dif ferences on the higher layers.
LTE-Advanced is not a new technology, instead it is an
evolution step in the continuing development of LTE. It
was initially specied as part of Release 10 of the 3GPP
standard with continued evolution with additional features
in Release 11 and more upcoming features in Release 12
and beyond. The three key LTE-Advanced technologies
that are essential for meeting the ITU 4G requirements
are: carrier aggregation, enhanced uplink multiple access,
and enhanced multiple antenna transmission. Carrier
aggregation is one of the key features of LTE-Advanced
and the earliest deployed technologies of LTE-Advanced.
It allows two or more (up to 5) component carriers to be
aggregated in both contiguous and non-contiguous congurations in order to support up to 100 MHz transmission
bandwidth.
Table 1. Physical layer comparisons of LTE and LTE-Advanced FDD/TDD
LTE FDD
(3GPP Rel 8/9)
Radio access mode FDD TDD FDD TDD
Radio frame length 10 ms (20 slots, 10 sub-frames)
Transmission
scheme
Channel bandwidth
(BW)
Data type Packet switched for both voice and data, no circuit switched
Data modulation Downlink: QPSK, 16QAM, 64 QAM
Peak data rate Downlink – 300 Mbps
MIMO technology Downlink: Up to 4x4 spatial multiplexing; transmit
Downlink: OFDMA
Uplink: SC-FDMA
Maximum: 20 MHz
1.4 MHz, 3 MHz, 5 MHz, 10 MHz, 15 MHz, 20 MHz
Uplink: QPSK, 16 QAM; 64 QAM for UE category 5 only
Uplink – 75 Mbps
diversity; multi-user (MU) MIMO; beamforming
Uplink: MU-MIMO - more than one UE transmit in the
same time-frequency resource
LTE TDD
(3GPP Rel 8/9)
LTE-Advanced FDD
(3GPP Rel 10/11)
Downlink: OFDMA
Uplink: SC-FDMA, clustered SC-FDMA
Maximum: 100 MHz with carrier aggregation;
BW per component carrier (CC): 1.4 MHz, 3 MHz,
5 MHz, 10 MHz, 15 MHz, 20 MHz
Downlink: QPSK, 16QAM, 64 QAM
Uplink: QPSK, 16 QAM; 64 QAM for UE categories 5, 7,
and 8 only
Downlink – 1 Gbps
Uplink – 500 Mbps
Downlink: Up to 8x8 spatial multiplexing; transmit
diversity; MU-MIMO; beamforming
Uplink: Up to 4x4 spatial multiplexing for data (PUSCH);
transmit diversity for control (PUCCH); MU-MIMO
LTE-Advanced TDD
(3GPP Rel 10/11)
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RF Transmitter Tests
With the LTE/LTE-Advanced FDD and TDD measurement
applications, you can perform RF transmitter measurements on eNB and UE devices in time, frequency, and
modulation domains. Measurement setups are simplied with automatic detection of downlink channels and
signals. For eNB conformance testing, measurement is
simplied by recalling E-TM presets according to 3GPP TS
36.141 specication.
For LTE-Advanced demodulation measurements, such as
EVM and frequency error, the measurement application
uses an automatic sequencing function, instead of a single
wideband capture of the multi-carrier signal, eliminating the need for the wide analysis bandwidth option on
the signal analyzer and thereby reducing the overall test
equipment cost. The measured results of up to 5 CCs for
LTE-Advanced can be viewed side-by-side and represented in multiple domains such as resource block, sub-carrier, slot, or symbol. Graphical displays with color coding
and marker coupling allows you to search for problems
faster and troubleshoot the found problems quicker. For
manufacturing, “conformance EVM” measurement provides signicant speed improvement over the traditional
EVM measurement.
In addition, the measurement applications allow you to
test beyond physical layer by using the transport layer
decoding functionality. Troubleshoot transport layer problems and verify the channel encoding is correct by accessing data at dif ferent points in the receiver chain such as
demapped, deinterleaved, descrambled, deratematched,
and decoded data.
For unwanted emissions, 3GPP Release 11 adds LTEAdvanced RF conformance requirements for intra-band,
non-contiguous carrier aggregation because the spectrum
in the sub-block gap can be deployed by another service
provider, perhaps using a different technology. These new
RF requirements are cumulative adjacent channel leakage
power (CACLR), to measure the contributions from carriers on both sides of the sub-block gap, and cumulative
spectrum emissions mask (SEM) measurement where a
new special limit mask is dened for unwanted emissions
within a sub-block gap calculated as the cumulative sum
of contribution from each sub-block. The LTE-Advanced
embedded measurement application provides limits for
both CACLR and SEM in non-contiguous carrier aggregation.
Choosing between X-Series embedded applications and 89600 VSA software
X-Series measurement applications provide format-specic, one-button measurements for X-Series analyzers
and modular PXI VSAs. With fast measurement speed, SCPI programmability, pass/fail testing and simplicity of
operation, these applications are ideally suited for design verication and manufacturing. The 89600 VSA is the
industry-leading measurement software for evaluating and troubleshooting signals for R&D and design validation.
Supporting numerous measurement platforms and multiple measurement channels, the 89600 VSA provides exibility and sophisticated measurements tools essential to nd and x signal problems. Recent enhancements for
the modular PXI VSA platforms (89601B-SSA) provide fast spectrum measurements with benchtop analyzer SCPI
programming compatibility.
www.keysight.com/nd/89600_vsa
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Standard-Based RF Transmitter Tests
The RF transmitter conformance test requirements for LTE/LTE-Advanced FDD and TDD are dened in 3GPP 36.141 (eNB)
and 36.521-1 (UE) of the 3GPP standard. Table 2 shows the required eNB RF transmitter tests along with the corresponding measurements available in the X-Series and 89600 LTE/LTE-Advanced applications. Table 3 shows similar information
for UE transmitter tests.
Table 2. Required base station (eNB) RF transmitter measurements and the corresponding measurements
in M9080B/M9082B and 89600 VSA
3GPP
TS3 6.141
paragraph #
6.2 Base station output power E-T M1.1 Channel power
6.3.2 Total power dynamic range E-TM 2
Transmitter test E-TM required M9080B (FDD)
M9082B (TDD)
measurement applications
OFDM symbol Tx. power (OSTP)3OFDM symbol Tx. power
89601B
Option BHD/BHG (FDD) Option
1
BHE/BHH (TDD)
2
Channel power using band
power marker
1
2
3
E-TM 3.1
6.4 Transmit ON/OFF power
(TDD only)
6.5.1 Frequency error E-TM 2
E-TM1.1 Transmit ON/OFF power
(M9082B only)
Frequency error
4
3
Not available
Frequency error
3
E-TM 3.1
6.5.2 Error vector magnitude E-TM 3.2
EVM
3
EVM
3
E-TM3.3
6.5.3 Time alignment error (TAE) E-TM 1.1 MIMO summary or time offset5MIMO info table or cross-carrier
5
3
6.5.4 DL RS power E-TM 1.1 RS Tx power (RSTP)
summary
3
RS Tx power
6.6.1 Occupied bandwidth E-TM 1.1 Occupied BW 89600-based solutions of fer
6.6.2 Adjacent channel leakage
power ratio (ACLR)
6.6.2.6 Cumulative ACLR
(LTE-Advanced only)
6.6.3 Operating band unwanted
emissions (SEM)
6.6.3 Cumulative mask for SEM
(LTE-Advanced only)
6.6.4 Transmitter spurious emis-
E-TM 1.1
ACP
E-TM 1.2
E-TM 1.1
ACP
E-TM 1.2
E-TM 1.1
Spectrum emission mask
E-TM 1.2
E-TM 1.1
Spectrum emission mask
E-TM 1.2
E-TM 1.1 Spurious emissions
modulation-quality measurements; for one-button, nondemodulation measurements
such as ACLR and spectrum
emission mask, the embedded
application should be used
sion
6.7 Transmitter intermodulation E-TM 1.1 ACP, SEM, spurious emissions
1. All of the measurements are available for single carrier (LTE) or multiple-carrier LTE-Advanced with up to 5 component carriers. M9080B/
M9082B option 1FP is LTE, option 2FP is LTE-Advanced.
2. These are pre-demodulation channel power measurements. Channel power reading is also available after demodulation under “Error Summary” trace.
3. For M9080B/M9082B, these measurements are available under “Error Summary” trace in Mod Analysis as well as under “Conformance
EVM” measurement. For 89600, they are available under “Error Summar y” trace.
4. For LTE-Advanced, this measurement is suppor ted for contiguous carrier aggregation and requires analysis bandwidth on PXI VSA wide
enough to cover the aggregated bandwidth.
5. “MIMO Summar y”/”MIMO Info Table” traces are used to measure TAE for MIMO and Tx diversity signals. For carrier aggregation, time offset
reading under “Error Summar y” trace is used for M9080B/M9 082B and “Cross-carrier Summary” trace is used for 89600 VSA Version 18 or
higher.
For uplink, LTE-Advanced added transmitter RF conformance test for carrier aggregation (CA) and uplink MIMO (UL-MIMO) as shown in Table 3. Even though demodulation of UL-MIMO spatial multiplexing is not supported in the M9080B and
M9082B embedded applications, the transmitter conformance test for UL-MIMO only requires testing the DUT at each
antenna port using UL RMC (same as LTE), so the applications can also be used for UL-MIMO RF conformance test.
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Table 3. Required user equipment (UE) RF transmitter measurements and the corresponding measurements
in M9080B/M9082B and 89600 VSA
3GPP TS 36.521-1 paragraph # Transmitter test M9080B(FDD) M9082B(TDD)
measurement applications
89601B Option BHD/
BHG(FDD) Option BHE/BHH
(TDD)
LTE Rel 8
& up
6.2.2 6.2.2A 6.2.2B UE maximum output power
LTEAdvanced
CA
LTEAdvanced
UL-MIMO
(MOP)
Channel power Channel power using band
power marker
6.2.3 6.2.3A 6.2.3B Maximum power reduction
(MPR)
6.2.4 6.2.4A 6.2.4B Additional maximum power
reduction (A-MPR)
6.2.5 6.2.5A 6.2.5B Congured UE transmitted
output power
6.3.2 6.3.2A 6.3.2B Minimum output power
6.3.3 6.3.3A 6.3.3B Transmit off power Channel power or transmit on/
off power
6.3.4 6.3.4A 6.3.4B On/off time mask Transmit on/off power Not available
6.3.5 6.3.5A 6.3.5B Power control Not available Not available
6.5.1 6.5.1A 6.5.1B Frequency error Frequency error1 and fre-
quency error per slot2
EVM
1
1
6.5.2.1 6.5.2A.1 6.5.2B.1 Error vector magnitude (EVM) EVM
6.5.2.1A N/A N/A PUSCH-EVM with exclusion
Frequency error & frequency
error per slot trace
EVM
EVM
period
6.5.2.2 6.5.2A.2 6.5.2B.2 Carrier leakage IQ offset1 & IQ offset per slot2IQ offset & IQ offset per slot
6.5.2.3 6.5.2A.3 6.5.2B.3 In-band emissions for nonallocated RB
6.5.2.4 N/A 6.5.2B.4 EVM equalizer spectrum
atness
In-band emissions
(not available for CA)
Equalizer channel frequency
response per slot
2
In-band emissions
(not available for CA)
Per slot equalizer channel
3
frequency response
6.6.1 6.6.1A 6.6.1B Occupied bandwidth Occupied BW 89600-based solutions of fer
6.6.2.1 6.6.2.1A 6.6.2.1B Spectrum emission mask
SEM
(SEM)
6.6.2.2 6.6.2.2A 6.6.2.2B Additional SEM SEM
6.6.2.3 6.6.2.3A 6.6.2.3B Adjacent channel leakage
ACP
power ratio (ACLR)
modulation-quality measurements. For one-button, nondemodulation, measurements
such as ACLR and spectrum
emission mask, the embedded
application should be used.
6.6.3.1 6.6.3.1A 6.6.3B.1 Transmitter spurious emission Spurious emissions
6.6.3.2 6.6.3.2A 6.6.3B.2 Spurious emission band UE
Spurious emissions
co-existence
6.6.3.3 6.6.3.3A 6.6.3B.3 Additional spurious emissions Spurious emissions
6.7 6.7A 6.7B Transmit intermodualtion ACP
N/A N/A 6.8B Time alignment Time offset
1
Time offset
1. These values are found in “Error Summary” table under Mod Analysis measurement or under Conformance EVM measurement for M9080B
and M9082B.
2. These measurements are part of the Mod Analysis measurement. Once in Mod Analysis, they are found under [Trace/Detector] -> {Data} >
{Demod Error}.
3. This measurement is part of the Mod Analysis measurement. Once in Mod Analysis, it is found under [Trace/Detector] -> {Data} > {Response}.
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Measurement Details
All of the RF transmitter measurements as dened by the
3GPP standard, as well as a wide range of additional measurements and analysis tools are available with a press of
a button (Table 4 and 5). These measurements are fully
remote controllable via the IEC/IEEE bus or LAN, using
SCPI commands.
It is important to note that the measurements shown in Tables 4-5
for LTE FDD and TDD are available for a single carrier, while the
measurements for LTE-Advanced FDD and TDD columns are available for multiple carriers with up to 5 component carriers.
eNB Transmitter Test
Table 4. List of eNB measurements provided by M9080B and M9082B measurement applications
Technology LTE FDD LTE-Advanced
FDD
X-Series measurement application M90 80B-1FP M9080B-2FP M9082B -1F P M9082B-2FP
PXI VSA M9391A, M9393A
Modulation quality (error summary table):
EVM (RMS, peak, data, RS) -- -- -- --
Channel power -- -- -- --
RS Tx. power (RSTP) -- -- -- --
OFDM symbol Tx. power (OSTP) -- -- -- --
RS Rx. power (RSRP) -- -- -- --
RSSI -- -- -- --
RS Rx. quality (RSRQ) -- -- -- --
Frequency error -- -- -- --
Common tracking error -- -- -- --
Symbol clock error -- -- -- --
Time offset -- -- -- --
IQ (Offset, gain imbalance, quad error, timing skew) -- -- -- --
Conformance EVM -- -- -- --
Demodulated error traces:
EVM vs. frequency (sub-carrier) -- -- -- --
EVM vs. time (symbol) -- -- -- --
EVM vs. resource block -- -- -- --
EVM vs. slot -- -- -- --
Frequency error per slot -- -- -- --
Power vs. resource block -- -- -- --
Power vs. slot -- -- -- --
Symbols table:
Numerical values of demodulated symbols (encoded) -- -- -- --
Decoded symbol table:
Numerical values of demodulated data include
demapped, deinterleaved, descrambled,
deratematched, and decoded data
Downlink decode table:
Decode information from PBCH, PDCCH, PHICH,
and PCFICH
Frame summary table:
EVM, power, modulation format, and number of allocated
RB and RNTI for all active channels and signals
-- -- -- --
-- -- -- --
-- -- -- --
LTE TDD LTE-Advanced
TDD
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Table 4. List of eNB measurements provided by M9080B and M9082B measurement applications (continued)
Technology LTE FDD LTE-Advanced
FDD
LTE TDD LTE-Advanced
TDD
X-Series measurement application M90 80B-1FP M9080B-2FP M9082B -1F P M9082B-2FP
PXI VSA M9391A, M9393A
TX diversity MIMO (up to 4 Tx antenna) traces:
Info table
RS power -- -- -- --
RS EVM -- -- -- --
RS CTE -- -- -- --
RS timing -- -- -- --
RS phase -- -- -- --
RS symbol clock -- -- -- --
RS frequency -- -- -- --
IQ gain imbalance -- -- -- --
IQ quadrature error -- -- -- --
IQ time skew -- -- -- --
Channel frequency response -- -- -- --
Channel frequency response difference -- -- -- --
Equalizer impulse response -- -- -- --
Common tracking error -- -- -- --
Detected allocations trace (resource block vs. symbol) -- -- -- --
Response:
Equalizer channel frequency response -- -- -- --
Instantaneous equalizer channel frequency response
-- -- -- --
Equalizer channel frequency response difference
Instantaneous equalizer channel frequency response
-- -- -- --
difference
Equalizer impulse response -- -- -- --
Channel power -- -- -- --
ACP -- -- -- --
Cumulative ACLR (CACLR) -- --
Transmit on/off power -- --
Spectrum emission mask (SEM) -- -- -- --
Cumulative SEM -- --
Spurious emissions -- -- -- --
Occupied bandwidth -- -- -- --
CCDF -- -- -- --
Monitor spectrum -- -- -- --
I/Q waveform -- -- -- --
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Table 5. List of UE measurements provided by M9080B and M9082B measurement applications
Technology LTE FDD LTE-Advanced
FDD
LTE TDD LTE-Advanced
TDD
X-Series measurement application M90 80B-1FP M9080B-2FP M9082B -1F P M9082B-2FP
PXI VSA M9391A, M9393A
Modulation quality (error summary trace):
EVM (RMS, peak, data, RS) -- -- -- --
Frequency error -- -- -- --
Common tracking error -- -- -- --
Symbol clock error -- -- -- --
Time offset -- -- -- --
IQ (offset, gain imbalance, quad error, timing skew) -- -- -- --
Channel power -- -- -- --
In-band emissions result -- --
Not available
for CA
-- -Not available
for CA
Spectral atness result -- -- -- --
-- -- -- --
-- -- -- --
-- -- -- --
Conformance EVM -- -- -- --
In-band emissions -- --
Not available
for CA
-- -Not available
for CA
Spectrum atness (eq. ch freq response per slot) -- -- -- --
Demodulated error traces:
EVM vs. frequency (sub-carrier) -- -- -- --
EVM vs. time (symbol) -- -- -- --
EVM vs. resource block -- -- -- --
EVM vs. slot -- -- -- --
IQ offset per slot -- -- -- --
Frequency error per slot -- -- -- --
Power vs. resource block -- -- -- --
Power vs. slot -- -- -- --
Symbols table:
Numerical values of demodulated symbols (encoded) -- -- -- --
Decoded symbol table:
Numerical values of demodulated data and descrambled data
-- -- -- --
for PUSCH
Frame summary table:
EVM, power, modulation format and number
-- -- -- --
of allocated RB for all active channels and signals
Detected allocations trace (resource block vs. symbol) -- -- -- --
Table continued on next page
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Table 5 continued. List of UE measurements provided by M9080B and M9082B measurement applications
Response:
Equalizer channel frequency response
Instantaneous equalizer channel frequency response
Equalizer channel frequency response difference
Instantaneous equalizer channel frequency response difference
Equalizer impulse response
-- -- -- --
-- -- -- --
-- -- -- --
-- -- -- --
-- -- -- --
-- -- -- --
Equalizer channel frequency response per slot -- -- -- --
Channel power -- -- -- --
ACP -- -- -- --
Transmit on/off power -- -- -- --
Spectrum emission mask (SEM) -- -- -- --
Spurious emissions -- -- -- --
Occupied bandwidth -- -- -- --
CCDF -- -- -- --
Monitor spectrum -- -- -- --
I/Q waveform -- -- -- --
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Figure 3. LTE-Advanced downlink modulation analysis showing
constellation of ve component carriers side-by-side.
Figure 4. Uplink modulation analysis measurement showing constellation, EVM vs. subcarrier, detected allocation, and EVM vs.
symbol information for two component carriers. Measurements
are color-coded based on channel type and up to 12 markers with
marker coupling between measurements are available for easier
troubleshooting.
Figure 5. Conformance EVM measurement showing all required
modulation quality metrics. This measurement is optimized for
manufacturing because of its fast measurement speed.
Figure 6. Downlink transpor t layer channel decoding measurement showing decoded information for PBCH, PDCCH, PCFICH,
and PHICH channels. Similar capability is also available for
uplink.
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Figure 7. LTE-Advanced ACLR measurement with 5 contiguous
component carriers.
Figure 8. LTE-Advanced cumulative ACLR (CACLR) for non-contiguous carrier aggregation.
Figure 9. Transmit ON/OFF power measurement of an LTE-Advanced TDD downlink signal with two component carriers.
Figure 11. LTE-Advanced non-contiguous carrier aggregation
SEM measurement with special cumulative mask inside the subblock gap.
Figure 10. SEM measurement can be made on single carrier LTE
or up to 5 component carrier LTE-Advanced signal.
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Key Specications
Denitions
– Specications describe the per-
formance of parameters covered
by the product warranty.
– The specications apply to single
carrier case only, unless otherwise stated.
– 95th percentile values indicate
the breadth of the population
(≈2σ) of performance tolerances
expected to be met in 95% of
cases with a 95% condence.
These values are not covered by
the product warranty.
– Typical values are designated
with the abbreviation "typ."
These are performance beyond
specication that 80% of the
units exhibit with a 95% condence. These values are not
covered by the product warranty.
– Nominal values are designated
with the abbreviation "nom."
These values indicate expected
performance, or describe prod-
uct performance that is useful in
the application of the product,
but is not covered by the product
warranty.
Note: Data subject to change
Supported devices and standards
Device type LTE FDD/TDD
M90 80B-1FP/ M908 2B-1FP
3GPP standards
supported
Signal structure FDD Frame Structure Type 1
Signal direction Uplink and downlink
Signal bandwidth 1.4 MHz (6 RB), 3 MHz (15 RB),
Number of component carriers
Physical signals
Downlink PBCH, PCFICH, PHICH, PDCCH, PDSCH, PMCH
Uplink PUCCH, PUSCH, PRACH
Physical channels
Downlink P-SS, S-SS, C-RS, UE-RS, P-PS
Uplink PUCCH-DMRS, PUSCH-DMRS,
36.211 V9.1.0 (March 2010)
36.212 V9.4.0 (September 2011)
36.213 V9.3.0 (September 2010)
36.214 V9.2.0 (June 2010)
36.141 V9.10.0 (July 2012)
36.521-1 V9.8.0 (March 2012)
TDD Frame Structure Type 2
Special subframe congurations
0-8
UL/DL congurations 0-6
5 MHz (25 RB), 10 MHz (50 RB),
15 MHz (75 RB), 20 MHz
(100 RB)
1 1, 2, 3, 4, or 5
(positioning), MBSFN-RS
S-RS (sounding)
LTE-Advanced FDD/TDD
M9080B-2FP/ M9082B-2FP
36.211 V10.7.0 (March 2013)
36.212 V10.7.0 (December 2012)
36.213 V10.9.0 (March 2013)
36.214 V10.12.0 (March 2013)
36.141 V11.4.0 (March 2013)
36.521-1 V10.5.0 (March 2013)
FDD Frame Structure Type 1
TDD Frame Structure Type 2
Special subframe congurations
0-8
Uplink and Downlink
UL/DL congurations 0-6
Bandwidth per component
carrier: 1.4 MHz (6 RB), 3 MHz
(15 RB),
5 MHz (25 RB), 10 MHz (50 RB),
15 MHz (75 RB), 20 MHz (100
RB)
P-SS, S-SS, C-RS, UE-RS,
P-PS (positioning), MBSFN-RS,
CSI-RS
PUCCH-DMRS, PUSCH-DMRS,
S-RS (sounding)
For a complete list of specifications, please refer to the M9391A data sheet, literature number 59912603EN.
Performance specications
Description M9391A PXI VSA, nominal
Demodulation
LTE FDD E-TM, 10 MHz BW, 2 GHz -52 dB
LTE FDD E-TM, 10 MHz BW, <1 GHz -51 dB
LTE TDD E-TM, 10 MHz BW, 2 GHz -49 dB
LTE TDD E-TM, 10 MHz BW, <1 GHz -50 dB
Adjacent Channel Power
Adjacent channel -64.9 dB
Alternate channel -66.4 dB
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Ordering Information
Software licensing
and conguration
Transportable, perpetual license
This allows you to run the application
using an embedded PXI PC controller or
external PC, plus it may be transferred
from one controller or PC to another.
One software license supports up to four
modular PXI VSA channels in one PXI
mainframe.
M9080B LTE/LTE-Advanced FDD measurement application
Model-Option Description Additional information
M9080B-1TP LTE FDD measurement application, transportable perpetual license
M9080B-2TP
Note: M9080B application requires Windows 7 operating system.
LTE-Advanced FDD measurement application, transportable perpetual license Requires 1TP
Try before you buy!
Free 30-day trials of X-Series
measurement applications provide
unrestricted use of each application’s
features and functionality on your
modular PXI VSA. See
www.keysight.com/nd/M90XA
for more information.
You can upgrade!
Options can be added
after your initial purchase.
All of our X-Series ap-
plication options are
license-key upgradeable.
M9082B LTE/LTE-Advanced TDD measurement application
Model-Option Description Additional information
M9082B -1TP LTE TDD measurement application, transportable perpetual license
M9082B-2TP LTE-Advanced TDD measurement application, transportable perpetual license Requires 1TP
Note: M9082B application requires Windows 7 operating system.
Hardware Conguration
M9391A PXIe vector signal analyzer conguration
Model-Option Description Notes
M9391A-F03, -F06 3 GHz or 6 GHz frequency range One required
M9391A-B04, -B10, or -B16 40 MHz, 100 MHz or 160 MHz analysis bandwidth One required. -B16 recommended for fast-
est spectrum measurements with 89600 VSA
software Option SSA.
M9391A-300 PXIe frequency reference Recommended.
M9391A-UNZ Fast tuning Recommended. Highly recommended for fastest
spectrum measurements with 89600 VSA software Option SSA.
M9391A-M01, -M05, or -M10 Memory options (512 MB, 2 GB, or 4 GB) Recommend 1 Gsa /4 GB memory
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M9393A PXIe performance vector signal analyzer conguration
Model-Option Description Notes
M9393A-F08, -F14, -F18, or
-F27
M9393A-B04, -B10, or -B16 40 MHz, 100 MHz or 160 MHz analysis bandwidth One required. -B16 recommended for fast-
M9393A-300 PXIe frequency reference Recommended
M9393A-UNZ Fast tuning Recommended. Highly recommended for fastest
M9393A-M01, -M05, or -M10 Memory options (512 MB, 2 GB, or 4 GB) Recommend 1 Gsa /4 GB memory
Related Literature
– N9080B LTE/LTE-Advanced FDD Measurement Application
Measurement Guide, Part Number N9080-90008
– N9082B LTE/LTE-Advanced TDD Measurement Application
Measurement Guide, Part Number N9082-90004
– 3GPP Long Term Evolution: System Overview, Product Devel-
opment, and Test Challenges, Application Note, Literature
Number 5989-8139EN
– Introducing LTE-Advanced, Application Note, Literature
Number 5990-6706EN
– Stimulus-Response Testing for LTE Components, Application
Note, Literature Number 5990-5149EN
– Measuring ACLR Performance in LTE Transmitters, Application
Note, Literature Number 5990-5089EN
– TD-LTE E-UTRA Base Station Transmit ON/OFF Power Mea-
surement Using a Keysight X-Series Signal Analyzer, Application Note, Literature Number 5990-5989EN
– User’s and Programmer’s Reference Guide is avail-
able in the library section of the N9080A, W9080A,
N9082A and W9082A product pages.
– M9391A Data Sheet, Literature Number 5991-2603EN
– X-Series Measurement Applications for Modular Instruments
Brochure, Literature Number 5991-2604EN
8 GHz, 14 GHz, 18 GHz, or 27 GHz frequency range One required
est spectrum measurements with 89600 VSA
software Option SSA.
spectrum measurements with 89600 VSA software Option SSA.
Web
– Product pages:
www.keysight.com/nd/M9080B
www.keysight.com/nd/M9082B
– X-Series measurement applications:
www.keysight.com/nd/M90XA
– M9391A PXIe vector signal analyzer
www.keysight.com/nd/M9391A
– M9393A PXIe performance vector signal analyzer
www.keysight.com/nd/M9393A
– X-Series signal analyzers:
www.keysight.com/nd/X-Series
– Application pages:
www.keysight.com/nd/lte
www.keysight.com/nd/lteadvanced
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16 | Keysight | M9080B & M9082B LTE & LTE-Advanced FDD/TDD - Technical Overview
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© Keysight Technologies, 2014
Published in USA, August 4, 2014
5991-4610EN
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