Keysight E6567F Datasheet

Keysight E6567F

cdma2000/1xEV-DO/LTE/LTE-A
Wireless Test Manager

Technical Overview

02 | Keysight | E6567F cdma2000/1xEV-DO/LTE/LTE-A Wireless Test Manager - Technical Overview

Reduce wireless devices test cost for manufacturing and acceler­ate production by using powerful, easy-to-use test automation
software

Tests Supported

LTE/LTE-A transmitter tests

– Minimum output power
– Maximum output power
– Aggregate power control tolerance
– EVM equalizer spectrum atness
– Occupied bandwidth
– Additional maximum power reduction
– Congured UE transmit ted output power
– Spectrum emission mask
– Additional spectrum emission mask
– PRACH time mask
– SRS time mask
– Power control absolute power tolerance
– PUSCH-EVM with exclusion period
– In-band emissions for non-allocated RB
– Maximum power reduction
– Frequency error
– Error vector magnitude
– Carrier leakage
– Adjacent channel leakage power ratio
– General ON/OFF time mask

CDMA transmitter tests

– Waveform quality
– Code domain power
– Trafc channel open loop power control
– Closed loop power control
– Time response of open loop power control
– Maximum RF output power
– Minimum controlled output power
– Access probe open loop power
– Gated power
– Code channel timing and phase error
– Transmitter spurious emissions
– Handoff waveform quality
– Code channel power accuracy
– Spurious emission

CDMA receiver tests

– Trafc channel FER with AWGN
– Supplemental channel FER with AWGN
– Receiver sensitivity FER
– Receiver sensitivity level search

CDMA Rx/Tx tests

– Quick general test

AMPS transmitter tests

LTE/LTE-A receiver tests

– Reference sensitivity level
– Maximum input level
– Adjacent channel selectivity (ACS)
– In-band blocking
– Reference sensitivity level for CA
– Maximum input level for CA
– LTE tiered Rx sensitivity search
– LTE tiered Rx sensitivity search at UE

CDMA call processing

– MEID supported (Yes/No)
– Public long code mask type (ESN based,
– BS assigned, MEID based)
– Registration
– Page (base station origination)
– MS (mobile station) origination
– Base station release
– Voice quality analog quick audio
– functionalit y
– Talk time
– IMT-2000, Japan CDMA, NMT-450,
– Korean PCS, US PCS, AWS, US cellular, Upper 700 MHz,

400 MHz European PAMR, and 800 MHz PAMR bands
– Hard handoff (system, band, channel, and PN offset)
– CDMA AMPS interband handoff

– Frequency error
– RF power output
– Audio frequency response
– Audio distortion
– FM hum and noise
– SAT deviation and frequency error
– Compressor response
– Analog DTMF
– Analog signaling tone

AMPS receiver tests

– SINAD
– Audio frequency response
– Audio distortion
– Hum and noise
– Expandor response

1xEV-DO calling processing
(Applies to Release 0, A, and B)

– Open/end session
– Open data connection
– IMT-2000, Japan CDMA, NMT 450, Korean PCS, US PCS,

AWS, US cellular, Upper 700 MHz, 400 MHz European PAMR,

and 800 MHz PAMR bands
– Handoff (interband and channel)
– CDMA AMPS interband handoff

03 | Keysight | E6567F cdma2000/1xEV-DO/LTE/LTE-A Wireless Test Manager - Technical Overview

1xEV-DO transmitter test
(Applies to Release 0, A, and B)

– Waveform quality
– Code domain accuracy
– Transmitter spurious emissions
– Data, RRI, DRC, and ACK channel output power
– Maximum output power
– Access probe open loop power
– Minimum controlled output power
– Closed loop power control
– Time response for open loop power control

1xEV-DO receiver tests
(Applies to Release 0, A, and B)

– Trafc channel PER with AWGN
– Receiver sensitivity and dynamic range

General tests

– Current drain
– Star t loop
– End loop
– Send/Receive GPIB command
– Data analyzer
– Send/Receive DUT command
– Keysight 14565B device characterization software control

Hardware Supported

Test instruments

– E7515A UXM wireless communications test set
– E7530A LTE test application and E7630A LTE lab application
– Keysight 8960 Series 10 wireless communications test set

– E5515E or E5515C mainframe (or equivalent E5515B/T)

with Option 003

– E1962B cdma2000®/IS-95/AMPS mobile test application

(revision B.15.18 or later)

– E1966A 1xEV-DO test application (revision A.10.18 or

later)

– E1987A GSM/GPRS/EGPRS, AMPS/136, cdma2000,

1xEV-DO, W-CDMA fast switching mobile test application

(revision A.09.21 or later)
– Keysight 66311B, 66319B, and 66321B power supplies
– Keysight 34970A with 34901A, 34903A, and 34907A data

acquisition/switch unit

Fixtures

Tescom TC-5941, TC-5942, and TC-5952B

Adapters

– Keysight 82357A USB/GPIB interface
– National Instruments GPIB-USB-A external controller

PC cards

– Keysight GPIB
– National Instruments GPIB
– Advantech PCI 1750 E6567F-1TP
– Control RocketPort 95870-3 and 99096-3 multi-port

serial card

Peripherals

– Symbol LS-1220-1200A xed bar code reader
– Symbol LS-3603MX-1200A, P300FZY, and LS40041-I100

handheld bar code reader
– HP printers
– Epson TM-U200D and TM-U200D strip printer

PC requirements

– Operating system: Microsoft Windows 7 Professional and

Enterprise
– Microsof t Visual Studio.NET
– Microsof t Internet Explorer Version 6.0 or later
– 600 MHz Pentium III or higher (1 GHz Pentium III or higher for

extended capability)
– 512 MB RAM minimum (1024 MB is recommended for normal

development and is required for extended capability operation)
– 200 MB free hard drive space
– CD-ROM
– GPIB card or converter with VISA drives (one per test system)
– LAN port for remote control of UXM
– Serial por ts for xtures, device control, and bar code reader

Order Information

– E6567F cdma2000/1xEV-DO/LTE/LTE-A Wireless Test Manager
– E6567F-1TP transportable perpetual license, development, and

run time version for E6567F

– E6569F Wireless Test Manager suite, including E6567F and

E6568F

– E6569F-1TP transportable perpetual license, development, and

run time version for E6567F and E6568F

– E6571F Wireless Test Manager run-time license
– E6571F-1TP transportable perpetual license, run time only ver

sion for both E6567F and E6568F

– E6567FU upgrade existing E6567x to E6567F
– E6567FU-1TP transportable perpetual license, development, and

run time version for E6567x upgrade to E6567F

– E6571FU upgrade existing E6571x to E6571F
– E6571FU-1TP transportable perpetual license, run time only

version for upgrade E6567x and E6568X to E6567F and E6568F

respectively

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04 | Keysight | E6567F cdma2000/1xEV-DO/LTE/LTE-A Wireless Test Manager - Technical Overview

For More Information

E6567E Wireless Test Manager specifications and product literature are available at

www.keysight.com/find/e6567f

8960 test set specifications, product literature, application notes, and configuration
guide are available at

www.keysight.com/find/8960

E7515A UXM test set specifications, product literature, application notes,
and configuration guide are available at

www.keysight.com/find/e7515a

myKeysight

www.keysight.com/find/mykeysight

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www.keysight.com/go/quality

Keysight Technologies, Inc.
DEKRA Certified ISO 9001:2008
Quality Management System

cdma2000 is a US registered certification mark of the Telecommunication Industry

Association.

For more information on Keysight
Technologies’ products, applications or
services, please contact your local Keysight
office. The complete list is available at:
www.keysight.com/find/contactus

Americas

Canada [phone]
Brazil 55 11 3351 7010
Mexico 001 800 254 2440

United States [phone]

Asia Pacic

Australia 1 800 629 485
China 800 810 0189
Hong Kong 800 938 693
India 1 800 112 929
Japan 0120 (421) 345
Korea 080 769 0800
Malaysia 1 800 888 848
Singapore 1 800 375 8100
Taiwan 0800 047 866
Other AP Countries (65) 6375 8100

Europe & Middle East

Austria 0800 001122
Belgium 0800 58580
Finland 0800 523252
France 0805 980333
Germany 0800 6270999
Ireland 1800 832700
Israel 1 809 343051
Italy 800 599100
Luxembourg [phone]
Netherlands 0800 0233200
Russia 8800 5009286
Spain 0800 000154
Sweden 0200 882255
Switzerland 0800 805353

Opt. 1 (DE)
Opt. 2 (FR)
Opt. 3 (IT)

United Kingdom 0800 0260637

For other unlisted countries:
www.keysight.com/find/contactus

(BP-09-04-14)

This information is subject to change without notice.
© Keysight Technologies, 2012 - 2014

Published in USA, October 1, 2014

5989-5082EN

www.keysight.com