Keysight E4991B Selection Guide

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LCR Meters, Impedance Analyzers and Test Fixtures
Material, Semiconductor, Component and In-Circuit Measurement Solutions
SELECTION GUIDE
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Achieve Success with The Industry Standard for Impedance Measurements
Superior product performance: Keysight products
provide the best in class accuracy and the repeatability with the fast measurement speed. Three types of impedance measure­ment solutions as shown in Table 1 are available meeting the various measurement needs.
Complete solution: Covering frequencies from 5 Hz
to 3 GHz along with the wide variety of test accessories, Key­sight’s impedance product line offers you the widest selection of equipment for your application. This selection guide gives an overview of all the products and accessories you can choose from.
Appropriate frequency range for your application:
Keysight products provide the best performance in the industry with frequency options to meet your needs at an affordable price. You can select the most appropriate frequency range for your application. Flexible frequency upgrade options are also available. You can choose just what you require today with the least amount of investment and upgrade later as needs arise.
Technical expertise: Keysight has decades of experience
providing impedance measurement solutions. Years of experi­ence and continuing technical innovations go into the
design and manufacturing of each Keysight LCR meter and im­pedance analyzer. Keysight also has a list of technical publication to assist you in many different applications (see page 15 for full listing.)
Advanced measurement techniques for a wide range of applications
Figure 1 is a comparison of different measurement techniques used in Keysight’s LCR meters and impedance ana­lyzers. As you can see, each technique has special measurement advantages:
– Auto-balancing bridge offers widest impedance
measurement range with typical frequency range of 20 Hz to 120 MHz. This technique is best for low-frequency, general-purpose testing.
Keysight's impedance analyzers/LCR meters measuremant
technique comparison 10% accuracy range
100M
10M
1M
100K
10K
1K
100
10
1
100m
Impedance measurement range (ohms)
10m
1m
1 10 100 1K 10K 100K 1M 10M 100M 1G 10G
Auto-balancing
bridge
I-V
RF I-V
Measurement frequency range (Hz)
Figure 1. Impedance measurement techniques of impedance analyzers/ LCR meters
Table 1. Impedance measurement product type
Product Type
Product Highlights LCR Meter Impedance Analyzer Network Analyzer
Frequency Sweep Capability
Spot/List Continuous
(Start/Stop, Center/Span)
Continuous (Start/Stop, Center/Span)
Display Numeric Only Graphics Graphics
Others Handler interface,
comparator
Equivalent circuit analysis built in, material measure­ments, in-circuit measure-
Equivalent circuit analysis built in, multiple function in one instrument
ments
Advantages Low-cost solution,
ease of use, high speed
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Widest measurement range, resonant analysis, circuit modeling
Cost-effective, versatile
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– I-V technique covers from 20 Hz to 120 MHz with a more
focused impedance measurement range. I-V technique also allows probing for in-circuit testing.
– RF I-V, an enhancement of the I-V technique, offers some
of the high-frequency benefit of network analysis while retaining some of the impedance measurement range of the I-V technique. Designed for accuracy and high-frequen­cy performance, the RF I-V technique is excellent for RF component analysis, especially for small inductance and capacitance values.
– In addition, Keysight’s network analyzer offers an impedance
measurement solution using the combination of three mea­surement techniques (reflection, series-thru, and shunt-thru) based on the S-parameter and gain-phase measurements.
Table 2. Keysight impedance measurement products
Product Type
Freq.
Positioning Model Frequency
range
range (Hz)
Basic Z accuracy (%)
Impedance analyzer
RF High peformance/
material/high
E49 91B 1 M to 3 G 0.65 (0.45
typical) temperature Multi function E5 0 61B
5 to 3 G 2 (typical) 1 to 2 k/5 to Option 3L3/3L4/ 3L5 w/005
LF/HF High peformance/
material/C-V
E4990A 20 to 120 M 0.08
(0.045
typical) In-circuit (ground­ed), C-V
E4990A with
20 to 120 M 1 50 m to 4 M 3A,B IV In-circuit, semiconductor
42941A
LCR meter RF High perfor-
mance/high
E4982A 1M to 3G 0.8 (0.45
typical) speed measure­ment
LF High perfor-
E4980A /AL 20 to 2 M 0.05 4 m to 100 M 3D ABB LCR component, material, semi­mance/materi­al/C-V
Application
specic
LF For capacitor/high
speed measure-
E4981A2120, 1 k and
1M only
0.07 (0.042 typical)
ment
How to use this selection guide
Table 2 is a summary of all of Keysight’s impedance products. It is designed to assist you in better comparing Keysight’s wide range of instrumentation and in choosing possible solutions for your applications, depending on your requirements in the following areas:
– Test frequency range – Device type or application type – Accuracy requirement (measurement technique) – Any other special needs
If you find several possible solutions for your application, go to the corresponding pages to find more details about each product.
Measurement
1
display range
(Ω)
120 m to 52 k 3A,B RF-IV LCR component, material, semi-
20 k/1 m to 5 (typical)
25 m to 40 M 3A,B ABB LCR component, material, semi-
140 m to 4.8 k 3C RF I-V LCR component
10 fF to 2 mF 3D ABB MLCC
Feature 4Measurement
technique
5
Main application
conductor
A,B Ref/Series/Shunt LCR component, PDN
3
conductor
conductor
1. Basic Z accuracies are best-case values and var y depending on measurement conditions. See product data sheet for detail.
2. Capacitance measurement only.
3. Z range shows the 10% accuracy range.
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4. Feature code:
A: Built-in equivalent circuit analysis B: Frequency sweep with color LCD display C: Spot frequency with color LCD display D: Spot frequency with LCD display
5. Measurement technique code:
ABB: Auto-balancing bridge I-V: I-V method RF I-V: RF I-V method
Ref: Reection method
Series: Series-thru method Shunt: Shunt-thru method
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Impedance Analyzers
Only Keysight impedance analyzers provide unparalleled accu­racy from mOhm to Mohm, from 5 Hz to 3 GHz. You can select the appropriate frequency range for your application.
– Frequency, DC bias, and AC voltage/current sweep capabili-
ty lets you customize where and how test data will be taken.
– Built-in equivalent-circuit analysis computes a multi-
element circuit model of the device under test.
– Advanced calibration and compensation methods reduce
measurement errors.
– Accessories for permittivity & permeability of materials,
high-temperature characterization, various passive compo­nents, and impedance probe for grounded measurements available
E4991B impedance analyzer
– Three frequency options: 1 MHz to 500 M/1 G/3 GHz,
upgradable
±0.65% (typical ±0.45%) basic accuracy and 120 mΩ to 52
kΩ impedance range (10% measurement accuracy range)
– Measurement parameters: |Z|, |Y|, θ, R, X, G, B, L, C, D, Q,
|Γ|, Γx, Γy, θΓ, Vac, Iac, Vdc 1, Idc
– Built-in DC bias (Option 001): 0 V to ±40 V, 0 A to
±10 0 m A
– 4-chnannel & 4-trace on 10.4 inch color LCD with touch
screen
– Data analysis function: Equivalent circuit analysis, limit line
test
– Dielectric/magnetic material measurement (Option 002):
|εr|, εr', εr'', tanδ(ε), |μr|, μr', μr'', tanδ(μ)
– Temperature characteristics measurement (Option 007) and
reliable on -wafer measurement (Option 010) capabilities
1
E4990A impedance analyzer
– Five frequency options; 20 Hz to 10/20/30/50/120 MHz,
upgradable
– ±0.08% (typical ±0.045%) basic impedance
measurement accuracy
25 mΩ to 40 MΩ wide impedance measurement range
(10% measurement accuracy range)
– Measurement parameters: |Z|, |Y|, θ, R, X, G, B, L, C, D, Q,
Complex Z, Complex Y, Vac, Iac, Vdc, Idc – Built-in DC bias range: 0 V to ±40 V, 0 A to ±100 mA – 4-chnannel & 4-trace on 10.4 inch color LCD with touch
screen – Data analysis function: Equivalent circuit analysis, limit line
test – In-circuit or grounded measurement with the 42941A
impedance probe (Option 120 only) – 7-mm test fixtures combined with 42942A Terminal Adapter
(Option 120 only) – Measurement speed: 3 ms~ / point (Option 120, and
010/020/030/050 with option 001)
1. Option 001 is required.
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Network Analyzer
E5061B-3L3/3L4/3L5 LF-RF network analyzer
The E5061B-3L3/3L4/3L5 LF-RF network analyzer with the option 005 impedance analysis function offers the network and impedance analysis capabilities in a single instrument. The E5061B-3L3/3L4/3L5 with option 005 is a versatile and cost-ef­fective solution suitable for general R&D use where various kinds of electronic components and circuits need to be evaluated:
– Three frequency options; 5 Hz to 500 M/1.5 G/3 GHz,
upgradable
– S-parameter test port (5 Hz to 3 GHz) and gain-phase test
port (5 Hz to 30 MHz, 1 M Ω/50 Ω inputs)
– The E5061B-005 supports reflection, series-thru, and
shunt-thru methods using the S-parameter test port or gain-phase test port. These methods are suitable for low­to-middle, middle-to-high, and very low milliohm imped­ance ranges, respectively.
– Keysight’s 7 mm type and 4-terminal pair type
component test fixtures can be used in the reflection meth­od (at the S-parameter test port) and the series-thru method (at the gain-phase test port).
– Impedance measurement parameters:
|Z|, |Y|, θ, R, X, G, B, C, L, D, Q
– Built-in DC voltage bias source (0 to ±40 V,
max ±100 mA)
1
1. For details about each method’s impedance measurement range, refer to “E5061B-3L3/3L4/3L5 LF-RF Network Analyzer with Option 005
2. Impedance Analysis Function, Data Sheet” (5990-7033EN).
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LCR Meters
The Keysight LCR meters provide the best combination of accuracy, speed, and versatility at an affordable price for both R&D and production applications.
– Wide frequency range from 20 Hz to 3 GHz – Frequency list sweep for continuous testing at multiple
frequency points
– Unparalleled measurement accuracy at both high and low
impedance range
– With the widest variety of accessories, great for testing of
leaded components, surface-mount components, semi­conductors, and materials
– Fast measurement speed with superior measurement
repeatability
– Handler interface with BIN sorting function for easy test
automation in production environment
E4982A LCR meter
– 1 MHz to 300 M/500 M/1 G/3 GHz with 100 kHz reso-
lution
– High speed measurement: selectable from 0.9 ms
(Mode 1), 2.1 ms (Mode 2), and 3.7 ms (Mode 3) – 0.8% (typical ±0.45%) basic accuracy – RF I-V technique provides a wide impedance range
(0.14 Ω to 4.8 kΩ, 10% measurement accuracy)
– Highly stable measurement of low-inductance and
excellent Q accuracy for meeting chip inductor test
requirements – Handler interface suitable for production testing – Measurement parameter |Z|, |Y|, θ, R, X, G, B, L, C, D,
Q, Rdc, Idc, Vdc, in user-definable combinations of
parameters (up to 4 parameters) – Versatile PC connectivity – GPIB, LAN, USB
E4980A precision LCR meter
– 20 Hz to 2 MHz with 4-digit resolution
– 0.05% basic accuracy with superior measurement
repeatability at low and high impedance
– Measurement time (at 1MHz): 5.6 ms (SHORT), 88 ms
(MED), 220 ms(LONG)
– Option E4980A-001 adds ±20 Vrms/±100 mArms test signal,
±40 V/±100 mA internal dc bias, 2nd DC source, and Vdc/Idc measuremnet
– Option 201 and 301 add handler interface and scanner
interface respectively
– Measurement parameters:
|Z|, |Y|, θ, R, X, G, B, L, C, D, Q, Rdc, Vdc 1, Idc
– Versatile PC connectivity, LAN, USB (memory/USBTMC), GPIB
1
E4980AL precision LCR meter
– 20 Hz to 300 kHz/500 kHz/1 MHz with 4-digit resolution – 0.05% basic accuracy with superior measurement
repeatability at low and high impedance
– Measurement time (at 1MHz): 12 ms (SHORT), 118 ms
(MED), 343 ms(LONG)
– Option 201 and 301 add handler interface and scanner inter-
face respectively
– Measurement parameters:
|Z|, |Y|, θ, R, X, G, B, L, C, D, Q, Rdc
– Versatile PC connectivity, LAN, USB (memory/USBTMC), GPIB
1. Option E4980A-001 is required.
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E4981A 120 Hz/1 kHz/1 MHz capacitance meter
– 120 Hz, 1 kHz and 1 MHz test frequencies – High speed measurement: 2.3 ms (1 MHz), 3.0 ms (1 kHz),
11.0 ms (120 Hz)
– Basic accuracy C: 0.07%, (typical ±0.042%) D: 0.0005 (typical
±0.0003) – Handler and scanner interfaces suitable for production testing – Measurement parameters: C, D, Q, ESR, G – SLC feature provides constant test voltage for high-value
capacitor measurements.
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Test Fixtures and Accessories (Four-Terminal-Pair)
Basic test fixtures
16034E SMD/chip test fixture
Frequency: ≤ 40 MHz Maximum Voltage: ±42 V peak max. (AC+DC)
16334A SMD/chip tweezers test fixture
Frequency: ≤ 15 MHz Maximum Voltage: ±42 V peak max. (AC+DC)
16034G small SMD/chip test fixture
Frequency: ≤ 120 MHz Maximum Voltage: ±42 V peak max. (AC+DC)
16047A axial & radial test fixture
Frequency: ≤ Maximum Voltage: ±42 V peak max. (AC+DC)
13 MHz (Kelvin contact)
16034H SMD/chip test fixture
Frequency: ≤ 120 MHz Maximum Voltage: ±42 V peak max. (AC+DC) Suitable for array-type devices
16047E test fixture
Frequency: ≤ 120 MHz Maximum Voltage: ±42 V peak max. (AC+DC)
16089A/B/C clip leads
Clip type: A/B/C: Kelvin Frequency: 5 Hz to 100 kHz Cable length: A/B/C: 0.94 m Maximum Voltage: ±42 V peak max. (AC+DC)
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Test Fixtures and Accessories (Four-Terminal-Pair)
External DC bias fixtures
16065A axial and radial test fixture with safety cover
Frequency: 50 Hz to 2 MHz Maximum external dc bias: ±200 V Blocking capacitor of 5.6 µF is connected in series with the Hc terminal
Test leads
16065C ex ternal bias adapter
Frequency: 100 Hz to 1 MHz Maximum external dc bias: ±40 V Blocking capacitor of 100 µF is connected in series with the Hc terminal
Terminal adapters
42942A four-terminal-pair to 7 mm terminal adapter
Frequency: ≤ 120 MHz Maximum Voltage: ±42 V peak max. (AC+DC) Use with only E4990A-120
16048A/D/E BNC test leads
Frequency: A: ≤ 30 MHz, D: ≤ 30 MHz,
E: ≤ 2 MHz
Cable length: A: 0.94 m, D: 1.89 m, E: 3.8 m Maximum Voltage: ±42 V peak max. (AC+DC)
16048G/H BNC test leads
Frequency: ≤ 120 MHz Cable length: G: 1 m, H: 2 m Maximum Voltage: ±42 V peak max. (AC+DC) Use with only E4990A
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Test Fixtures and Accessories (Four-Terminal-Pair)
Material measurements
16451B dielectric test fixture
Measurement parameters: capacitance (C), dissipation factor (D), and dielectric constant (εr', εr'') Material-under-test size:
thickness: ≤ 10 mm
diameter: 10 to 56 mm Frequency: ≤ 30 MHz
16452A liquid test fixture
Measurement parameter: capacitance (C), dielectric constant (εr', εr'') Liquid sample Quantity: ≤ 6.8 ml Frequency: 20 Hz to 30 MHz
Test Fixtures and Accessories (7-mm Terminal)
RF SMD/chip components
Others
42941A impedance probe kit
Frequency: 120 MH z Maximum Voltage: ±42 V peak max. (AC+DC) Probe cable length: 1.5 m Use with only E4990A-120
16196A/B/C/D SMD test fixture
Coaxial fixture for parallel electrode SMDs. Frequency: dc to 3 GHz Maximum Voltage: ±42 V peak max. (AC+DC) Applicable SMD size: 16196A: 1.6 mm x 0.8 mm 16196B: 1.0 mm x 0.5 mm 16196C: 0.6 mm x 0.3 mm 16196D: 0.4 mm x 0.2 mm
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16197A bottom-electrode SMD test fixture
Frequency: dc to 3 GHz Maximum Voltage: ±42 V peak max. (AC+DC) Applicable SMD size: from 1005 (mm)/ 0402 (inch) to 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with Op t ion 001.
16092A axial, radial, and SMD test fixture
Frequency: ≤ 500 MHz Maximum Voltage: ±42 V peak max. (AC+DC)
16198A bottom-electrode SMD test fixture
Frequency: dc to 3 GHz Maximum Voltage: ±42 V peak max. (AC+DC) Applicable SMD size: 0201 (mm)/008004 (inch) and 0402 (mm)/01005 (inch).
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16192A parallel-electrode SMD test fixture
Frequency: dc to 2 GHz Maximum Voltage: ±42 V peak max (AC+DC)
Material measurements
16194A high temperature component test fixture
Frequency: dc to 2 GHz Maximum Voltage: ±42 V peak max (AC+DC) Operating temperature: -55 °C to +200 °C
16200B external DC bias adapter
Frequency: 1 MHz to 1 GHz Maximum ex ternal dc bias: Up to 5 A, ±40 V
16453A dielectric test fixture
Frequency: 1 MHz to 1 GHz Sample size (smooth sheets only): thickness: 0.3 mm to 3 mm
diameter: ≥ 15 mm
16454A magnetic test fixtures
Frequency: 1 kHz to 1 GHz Sample size (toroids only):
height: ≤ 8.5 mm inner diameter: ≥ 3.1 mm outer diameter: ≤ 20 mm
Test Fixtures and Accessories (E5061B)
16201A N-type to 7 mm terminal adapter
Frequency: ≤ 3 GHz Maximum Voltage: ±42 V peak max (AC+DC) Use with only E5061B
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Simplify and Improve Your Measurements with Keysight's Test Accessories
Selecting a test fixture is as important as selecting the right in­strument. Keysight offers a wide range of accessories for axial, radial, and SMD/Chip devices. In addition, a variety of test leads are available to simplif y remote testing and systems applications. External test fixtures with safety covers are also available.
You will improve your measurement results with the proper test fixture.
– more reliable and repeatable measurement – higher through-put – fewer handling errors – tighter test limits – better measurement accuracy
For additional product information and literature, visit our Accessories Web site: www.keysight.com/find/impedance-accessory
E4980A/AL
E4981A
E4982A
E499 0A Option 120
E4990A Option 010/020/030/050
• •
E4 991B
3
3
3
3
3
3
3
4
4
Table 3. Test accessories/fixtures
16034E SMD/chip test fixture DC-40 MHz • • • • • 16034G SMD/chip test fixture, small DC-120 MHz • • • • • 16034H SMD/chip test fixture, for Array-type DC-120 MHz • • • • • 16047A Axial and radial test fixture DC-13 MHz • • • • 16047E Axial and radial test fixture DC-120 MHz • • • • • 16048A One meter test leads, BNC DC-30 MHz • • 16048D Two meter test leads, BNC DC-30 MHz • • 16048E Four meter test leads, BNC DC-2 MHz • 16048G One meter test leads, BNC DC-120 MHz • 16048H Two meter test leads, BNC DC-120 MHz • 16065A Ext. voltage bias with safety cover ( 200 Vdc) 50 Hz-2 MHz • • • • 16065C External bias adapter ( 40 Vdc) 100 Hz-1 MHz •5 • 16089A/B/C Kelvin clip leads 5 Hz-100 kHz • • • • 16092A RF spring clip: axial, radial and SMD DC-500 MHz •1 •2 • • 16192A Parallel electrode SMD test fixture DC-2 GHz •1 •2 • • 16194A High temperature component test fixture DC-2 GHz •1 •2 • • 16196A/B/C/D Parallel electrode SMD test fixture DC-3 GHz •1 •2 • • 16197A Bottom electrode SMD test fixture DC-3 GHz •1 •2 • • 16198A Bottom electrode SMD test fixture DC - 3 GHz • 16200B External DC bias adapter 1 MHz-1 GHz •1 •2 • • 16201A N-type to 7 mm terminal adapter 5 Hz to 3 GHz • 16334A SMD/chip tweezers test fixture DC-15 MHz • • • • 16451B Dielectric material test fixture DC-30 MHz • • • • 16452A Liquid test fixture 20 Hz-30 MHz • • • 16453A Dielectric material test fixture 1 MHz-1 GHz • 16454A Magnetic material test fixture 1 kHz-1 GHz •2 • 42941A Impedance probe kit DC-120 MHz • 42942A Four-terminal pair to 7-mm adapter DC-120 MHz
1
E5061B Option 3L3/3L4/3L5 w/005
Note: Refer to the accessor y descriptions for frequency and operational limits.
1. 3.5-mm (M) to 7-mm adapter is required
2. 42942A is required.
3. Compatible when used in conjunction with 16201A.
4. E4991B-0 02 is required
5. E4980AL only
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Helping You Make Better Measurements
Keysight's application knowledge can help you make better measurements.
Impedance Measurement Handbook (P/N 5950-3000) is a comprehensive guide to impedance measurements. The handbook covers from basics to applications and you can learn valuable measurement techniques to support your test challenges.
1. Impedance Measurement Basics
2. Impedance Measurement Instruments
3. Fixturing and Cabling
4. Measurement Error and Compensation
5. Impedance Measurement Applications and Enhancements
Complementary Products and Accessories
To help you find a complete solution, we have listed the following companies that make complementary products or special­ized accessories for Keysight's impedance measurement products. Please contact each company directly if you are interested in its products. (Keysight does not make any special endorsement of these companies’ products; this list is for reference only.)
Company name Product specialty/expertise Web site address
All-Ring Tech (ART) Component testing, sorting and taping machine www.allring-tech.com.tw
ArumoTech Custom test xtures www.arumotech.co.jp
Axisnet Impedance measurement system under high power condition www.axisnetinc.com
Beta LaserMike Automated LAN cable test system www.betalasermike.com
BH Electronics Wideband transformers www.bhelectronics.com
Cascade Microtech RF and microwave probers and accessories for semiconductor and
IC applications.
Electro Scientic Industries (ESI) Component testing, sorting and taping machine www.esi.com
ESPEC Temperature chamber for component and material testing. www.espec.com
HCUNI Material measurement solutions www.hcuni.com
Humo Laboratory Capacitor and crystal device testing and sorting machine www.humo.co.jp
Inter-Continental Microwave (ICM) Automated device handling systems, RF and microwave test
xtures and non-coaxial calibration standards.
Kanto Electronic Application and Development (KEAD)
KEYCOM Materials measurement solutions www.keycom.co.jp
Material-Wave Interactions (MWI) Laboratories
North Hills Signal Processing Wide-band transformers (baluns) for balanced measurement. www.northhills-sp.com
Seiwa Giken Energy and battery test solution www.seiwa-giken.co.jp
Systemhouse Sunrise C-V test solution for solar cells www.ssunrise.co.jp
SUMTEC Materials measurement solutions www.sumtec.biz
Sine Yo Feng (SYF) Component testing and taping machine www.syfpt.com.tw
TOKYO WELD Component testing, sorting and taping machine www.tokyoweld.com
Materials measurement solutions www.kead.co.jp
Material measurement solutions www.mwilab.com
www.cascademicrotech.com
www.icmicrowave.com
Find us at www.keysight.com
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www.keysight.com/find/impedance
www.keysight.com/find/impedance-accessory
www.keysight.com/find/mta
Learn more at: www.keysight.com
For more information on Keysight Technologies’ products, applications or services,
please contact your local Keysight office. The complete list is available at:
www.keysight.com/find/contactus
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This information is subject to change without notice. © Keysight Technologies, 2013 - 2018, Published in USA, December 10, 2018, 5952-1430E
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