(2) Calibration Preparations
Because the LE-200C • LH-200C • LZ-200C are used for comparative
measurements of various materials, it must always be calibrated
before use.
However, if the same materials are to be measured, calibration
parameters (up to four sets each for both the electromagnetic and
high-frequency measurement formats) will remain in the unit's
microcomputer memory even if the power is turned off so
measurement can be made immediately when the power is turned
on again. Please take note of the following items when calibrating
the unit and making measurements.
1 Use a substrate of the same material, shape and thickness
as the object of actual measurement when calibrating the
LE-200C • LH-200C • LZ-200C.
2 Prepare a substrate that has not been painted or plated (a
"zero substrate").
3 Although there a several different types of calibration methods,
calibration is performed using the zero substrate and
standard sheets (or samples of known thickness) that can
be measured most accurately.
Diagram 6
13
4 Using the Probe
The probe features a fixed-pressure type design so that a fixed
load is applied to the top chip. Hold the metal fitting near the
surface to be measured as shown in Diagram 6 and quickly
press the probe vertically against the surface.
To make the next measurement, move the top of the probe
10mm or more from the measurement surface, then press it
down against the surface again.
Measurement Range Standard Sheet 4-point Calibration
0 ~ 100µm Zero substrate, 10µm, 40µm, 100µm
100 ~ 400µm Zero substrate, 40µm, 100µm, 400µm
400 ~ 800µm Zero substrate,100µm, 400µm, 750µm
*800 ~1500µm Zero substrate, 750µm, 1000µm, 1400µm
【Example】
* This calibration cannot be done for the high-frequency mode as it
exceeds the measurement range.