Series 2600 System SourceMeter
• Combines a precision power
supply, true current source,
DMM, arbitrary waveform
generator, V or I pulse generator
with measurement, electronic
load, and trigger controller—all
in one instrument
• Contact check function ensures
high integrity measurements
• 10,000 readings/s and 5,500
source-measure points/s to
memory provide faster test
times
• The embedded Test Script
Processor (TSP™) offers
unparalleled system automation
and two to four times the test
throughput of competitive
products in I-V functional test
applications
• Family of products offers wide
dynamic range: 1pA to 10A and
1µV to 200V
• TSP-Link™ master/slave
connection seamlessly inte-
Scalable, integrated source and measure solutions
grates multiple Series 2600
SourceMeter channels into a
system that can be programmed
and controlled as a single
instrument
• Free Test Script Builder software
simplifies creating powerful test
scripts for programming custom
test functions
• Free LabTracer
®
2.0 software
available for curve tracing and
fast, easy startup
• Each SourceMeter channel is
electrically isolated for high
integrity measurements and
wiring flexibility
• Industry’s highest SMU rack
density for automated test
applications
®
Multi-Channel I-V Test Solutions
Series 2600 System SourceMeter instruments
offer electronic component and semiconductor
device manufacturers a scalable, high throughput, highly cost-effective solution for precision
DC, pulse, and low frequency AC sourcemeasure testing. Building on the tightly integrated source-measure technology originally developed for Keithley’s popular Series 2400
SourceMeter line, Series 2600 instruments provide from two to four times the test speed of
competitive solutions in I-V functional test applications. They also offer higher source-measure
channel density and a significantly lower cost
of ownership than competing products. The
analog-to-digital converters provide simultaneous I and V measurements in less than 100µs
(10,000 rdgs/s) and source-measure sweep
speeds of less than 200µs per point (5,500
points/s). This high speed source-measure capability, plus advanced automation features and
time-saving software tools make Series 2600
SourceMeter instruments an ideal solution for
I-V testing of a wide range of devices.
System scalability
without a mainframe
Series 2600 instruments incorporate an innovative technology that makes it possible to create
multi-channel I-V test systems economically, but
without sacrificing test throughput. TSP-Link is a
high speed system expansion interface, which
test system builders can use to connect multiple
Master
Master
TSP-Link makes it easy to scale the system's
channel count to match the application.
2 Channel System
SMU A
SMU B
2602
3 Channel System
SMU A
SMU B
2602
SMU C
Slave
2601
16+ Channel System
SMU A
SMU B
2602
SMU C
Slave
SMU D
2602
Slave
SMU E
2601
GPIB
TSP-Link In
TSP-Link Out
GPIB
TSP-Link In
TSP-Link Out
GPIB
TSP-Link In
TSP-Link Out
GPIB
TSP-Link In
TSP-Link Out
GPIB
TSP-Link In
TSP-Link Out
GPIB
TSP-Link In
TSP-Link Out
•
•
•
To PC
To PC
To PC
1.888.KEITHLEY (U.S. only)
SOURCE AND MEASURE
www.keithley.com
A GREATER MEASURE OF CONFIDENCE
Series 2600 System SourceMeter
Multi-Channel I-V Test Solutions
Series 2600 instruments in a master/slave configuration. Once connected, all the Series 2600 instru-
Ordering Information
2601 Single-channel System
2602 Dual-channel System
2611 Single-channel System
2612 Dual-channel System
Accessories Supplied
2600-IAC Safety Interlock Adapter
Connector (one supplied with 2611/2612)
Test Script Builder software
LabTracer Software (downloadable)
IVI/VISA drivers for Visual Basic, VC/C++,
LabVIEW, TestPoint, and LabWindows™/CVI
Mating screw terminal connectors with
strain relief and covers (2600-Kit)
TSP-Link cable (CA-180-3A)
Factory and custom TSP test scripts
The Test Script Processor is programmed
with a simple BASIC-style programming
language that runs in real time on the
instrument. Keithley provides built-in test
scripts for:
• Sweeping
• Pulsing
• Waveform generation
• Common component tests like binary
search, V
current/voltage)
A number of test scripts are included in
the instrument, while others can be downloaded at no charge from www.keithley.
com. These pre-written factory test scripts
can be used as provided or easily customized for a given application, so production
users can get their systems up and running faster than ever before.
Users can also create custom test scripts
in several different ways, including a programming tool called Test Script Builder.
Custom scripts can be downloaded from
the PC to the master SourceMeter unit
and saved in non-volatile memory. All four
models provide 16 megabytes of nonvolatile memory for storing up to 50,000
lines of TSP code and more than 100,000
readings.
SourceMeter Instrument
(High Current)
SourceMeter Instrument
(High Current)
SourceMeter Instrument
(200V)
SourceMeter Instrument
(200V)
, VTH, LIV (light intensity/
F
ments in a system can be programmed and operated under the control of the master unit, just as if
they were housed in the same chassis. By eliminating the need for a chassis/mainframe, the TSP-Link
provides virtually unlimited flexibility to scale a test system’s channel count up or down as the application requires, while ensuring seamless integration.
New capabilities for increasing test speed and lowering test cost
The Test Script Processor (TSP)
Any Series 2600-based system can run high speed, embedded test scripts on the master unit’s Test
Script Processor (TSP), the other major new technology on which the Series 2600 is based. The test
sequence is processed and run on the embedded computer in the instrument, rather than from an
external PC controller, so delays due to GPIB traffic congestion are eliminated. TSP test scripts allow
throughput gains of up to 10× over equivalent PC-based programs controlling the same instruments
via GPIB. TSP test scripts can be loaded and run from the front panel or over the system’s GPIB interface. A single TSP test script, running on the master unit, can control all the SourceMeter channels in
the system and acquire data from any Series 2600 instrument connected to the TSP-Link, which supports connections for up to 64 Series 2600 instruments.
TSP for advanced automation
A Series 2600-based system can stand alone as a complete measurement and automation solution for
semiconductor device or component testing, with the master unit controlling sourcing, measuring,
pass/fail decisions, test sequence flow control, binning, and the component handler or prober. In
contrast with existing embedded test sequencers for instrumentation, the TSP test scripts offer far
greater programming flexibility, including support for:
• Instr ument command queuing
• Modular subroutines with passable parameters
• Pass/fail and limit testing
• A wide range of math operations
• Flexible branching and looping capability
• Flexible external triggering
• Intelligent digital I/O read and write capability
• RS-232 communication
ACCESSORIES AVAILABLE
CABLES AND CONNECTORS
2600-BAN Banana Test Leads/Adapter Cable. For a single
Series 2600 SMU channel
2600-KIT Extra screw terminal connector, strain relief, and
cover for a single SourceMeter channel (one
supplied with 2601/2611, two with 2602/2612)
2600-TRIAX Triax Adapter. For a single Series 2600 Source-
Meter (two needed for use with 2602/2612)
7078-TRX-* 3-Slot, Low Noise Triax Cable. For use with
2600-TRIAX Adapter
8606 High Performance Modular Probe Kit. For use
with 2600-BAN
SC-200 Shielded Twisted Pair Cable. Recommended for
general-purpose use with Series 2600 System
SourceMeter instruments
2600-IAC Safety Interlock Adapter Connector (one supplied
with 2611/2612)
DIGITAL I/O, TRIGGER LINK, AND TPS-LINK
2600-TLINK Digital I/O to TLINK Adapter Cable, 1m
CA-126-1 Digital I/O and Trigger Cable, 1.5m
CA-180-3A CAT5 Crossover Cable for TSP-Link (one supplied)
Scalable, integrated source and measure solutions
GPIB INTERFACES AND CABLES
7007-1 Double Shielded GPIB Cable, 1m (3.3 ft.)
7007-2 Double Shielded GPIB Cable, 2m (6.6 ft.)
KPCI-488LP IEEE-488 Interface/Controller for the PCI Bus
KPXI-488 IEEE-488 Interface Board for the PXI Bus
KUSB-488A IEEE-488 USB-to-GPIB Interface Adapter
SWITCHING
7002-HD High Density Switch Mainframe
7002-HD-MTX1 Differential 6×32 Matrix Card
7002-HD-MUX1 Differential Quad 1×40 Multiplexer Card
RACK MOUNT KITS
4299-1 Single Rack Mount Kit with front and rear support
4299-2 Dual Rack Mount Kit with front and rear support
SOFTWARE
LabTracer™ 2.0 Curve Tracing Software (downloadable)
EXTENDED WARRANTIES
2601-EW 1 Year Extended Warranty for Model 2601
2602-EW 1 Year Extended Warranty for Model 2602
2611-EW 1 Year Extended Warranty for Model 2611
2612-EW 1 Year Extended Warranty for Model 2612
1.888.KEITHLEY (U.S. only)
www.keithley.com
SOURCE AND MEASURE
A GREATER MEASURE OF CONFIDENCE
Series 2600
FeedbackSource
Series vs. parallel ranging topologies
+3A
+1A
+6V–6V
–1A
–3A
Models 2601 and 2602 I-V capability
Scalable, integrated source and measure solutions
+10A
+1.5A
+1A
+0.1A
–5V +5V
+20V–20V
System SourceMeter
Multi-Channel I-V Test Solutions
Third-generation SMU design ensures faster test times
The Series 2600's new SMU design enhances test speed in several ways.
For example, while earlier designs used a parallel current ranging topology, the Series 2600 uses a series ranging topology (patent pending), which
provides faster and smoother range changes and outputs that settle more
FeedbackSource
+40V–40V
DC
+200V–200V
quickly. It also allows the current output limit to be programmed independently of the measurement current range for fast charging of capacitive
loads and more intuitive operation during bench use.
Each Series 2600 SourceMeter channel offers a highly flexible, fourquadrant source coupled with precision voltage and current meters/
limiters. Each channel can be configured as a:
• Precision power supply (up to 200V and 3A DC/10A pulsed output with
1pA readback resolution)
• True current source
• DMM (DCV, DCI, ohms, power, with 5
1
⁄2-digit resolution)
• Power V or I pulse generator (Pulse width: 200µs and longer—source
and measure)
• Power V or I waveform generator (20-point sine wave up to 400Hz in a
TSP test script)
• Electronic load (with sink mode capability)
High speed and precision A/Ds with simultaneous source-readback
All Series 2600 instruments provide four-quadrant operation and can be
connected in series or in parallel to extend their dynamic range. In the
first and third quadrants, they operate as a source, delivering power to a
load. In the second and fourth quadrants, they operate as a sink, dissipating power internally. They measure voltage and current simultaneously
with up to 5
1
⁄2-digit resolution, and they display voltage, current, resist-
ance, or power readings.
Two analog-to-digital converters per channel (one for I, one for V) can run
simultaneously, providing precise source-readback without sacrificing test
throughput. These A/D converters offer the flexibility of programmable
integration rates, allowing the user to optimize for either high speed
(>10,000 rdgs/s at 0.001 NPLC setting) or for high resolution (up to 24
bits at 10 NPLC setting) to make high accuracy measurements.
Models 2611 and 2612 I-V capability
1.888.KEITHLEY (U.S. only)
SOURCE AND MEASURE
www.keithley.com
–0.1A
–1A
–1.5A
–10A
Digital I/O Interface
A back panel port on every Series 2600 instrument provides 14 bits of uni-
DC
Pulse Mode,
duty cycle
limited
versal digital I/O to link the instrument to a variety of popular handlers for
sorting and binning components after testing. These I/O lines are also
backward-compatible with Keithley’s earlier Trigger Link instrument triggering technology. These lines simplify integrating Series 2600 instr uments
into systems that employ other external instrumentation, including Series
2400 SourceMeter instruments, Series 7000 switch mainframes, and Series
2700 Integra data acquisition/multimeter systems.
Built-in Contact Check Function
The Contact Check function makes it simple to verify good connections
quickly and easily before an automated test sequence begins. This eliminates measurement errors and false product failures associated with contact fatigue, breakage, contamination, loose or broken connection, relay
failures, etc.
A GREATER MEASURE OF CONFIDENCE
Series 2600
System SourceMeter
Multi-Channel I-V Test Solutions
Graphical instrument setup. LabTracer 2.0 supports up to eight Series
2600 SourceMeter channels. Model 2400 and Model 2410 SourceMeter
instruments are also supported for extended voltage capability. Dropdown menus in LabTracer 2.0’s instrument setup window allow configuring any channel of a SourceMeter instrument for fixed point or
sweeping operation. Once the instrument is configured, a single key
press is all it takes to execute a test.
Spanning I-V test applications
from R&D to functional test
The Series 2600 SourceMeter Instruments provide simple-to-use yet powerful solutions for R&D testing. At the same time, they offer the speed and
reliability needed for volume production testing.
High power and simplicity for R&D applications
In R&D and device characterization environments, Series 2600 instruments
offer high testing versatility for both interactive and automated testing. The
free downloadable LabTracer 2.0 software allows users to configure and
control up to eight Series 2600 or 2400 SourceMeter channels quickly and
easily for curve tracing or device characterization. It provides a simple
graphical user interface for setup, control, data acquisition, and graphing
of DUT data from SourceMeter instruments. When used together,
LabTracer and SourceMeter instruments offer lab users a powerful, easy-touse, and economical alternative to chassis-based solutions.
Once a test is complete, data is displayed in the spreadsheet panel and
graphing panel. Measurement data can be manipulated in the spreadsheet by applying a formula to the results. For more detailed analysis,
data can also be exported to Microsoft
paste.
®
Excel with a simple cut and
Scalable, integrated source and measure solutions
1.888.KEITHLEY (U.S. only)
www.keithley.com
SOURCE AND MEASURE
A GREATER MEASURE OF CONFIDENCE
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