Scalable, integrated source and measure solutions
GPIB
TSP-Link In
TSP-Link Out
SMU A
2602
SMU B
GPIB
TSP-Link In
TSP-Link Out
SMU C
2601
Master
Slave
3 Channel System
To PC
GPIB
TSP-Link In
TSP-Link Out
SMU A
2602
SMU B
2 Channel System
To PC
GPIB
TSP-Link In
TSP-Link Out
SMU A
2602
SMU B
GPIB
TSP-Link In
TSP-Link Out
SMU E
2601
Master
Slave
16+ Channel System
To PC
GPIB
TSP-Link In
TSP-Link Out
SMU C
2602
SMU D
Slave
•
•
•
S OURCE AND MEASUR E
Series 2600 System SourceMeter
Multi-Channel I-V Test Solutions
Combines a precision power
•
upply, true current source,
s
DMM, arbitrary waveform
generator, V or I pulse generator
with measurement, electronic
load, and trigger controller—all
in one instrument
• >10,000 readings/s and >5,000
source-measure points/s to
memory provide faster test
times
• The embedded Test Script
Processor (TSP™) offers
unparalleled system automation
and two to four times the test
throughput of competitive
products in I-V functional test
applications
• TSP-Link™ master/slave
connection seamlessly integrates multiple Series 2600
SourceMeter channels into a
system that can be programmed
and controlled as a single
instrument
• Free Test Script Builder software
simplifies creating powerful test
scripts for programming custom
test functions
• Free LabTracer™ 2.0 software
available for curve tracing and
fast, easy startup
• Each 40W, 3A channel is
electrically isolated for high
integrity measurements and
wiring flexibility
• Industry’s highest SMU rack
density for automated test
applications
1.888.KEITHLEY (U.S. only)
www.keithley.com
Series 2600 System SourceMeter instruments
offer electronic component and semiconductor
device manufacturers a scalable, high throughput, highly cost-effective solution for precision
DC, pulse, and low frequency AC sourcemeasure testing. Building on the tightly integrated source-measure technology originally developed for Keithley’s popular Series 2400
SourceMeter line, Series 2600 instruments provide from two to four times the test speed of
competitive solutions in I-V functional test applications. They also offer higher source-measure
channel density and a significantly lower cost of
ownership than competing products. Patented
analog-to-digital converters provide simultane
ous I and V measurements in less than 100µs
(10,000 rdgs/s) and source-measure sweep
speeds of less than 200µs per point (5,000
points/s). This high speed source-measure capa-
, plus advanced automation features and
bility
time-saving software tools make Series 2600
SourceMeter instruments an ideal solution for
V testing of a wide range of devices.
I-
System scalability without a
mainframe
Series 2600 instruments incorporate an innovative technology that makes it possible to create
multi-channel I-V test systems economically, but
without sacrificing test throughput. TSP-Link is a
high speed system expansion interface, which
test system builders can use to connect multiple
A GREATER MEASURE OF CONFIDENCE
®
-
TSP-Link makes it easy to scale the system's
channel count to match the application.
Series 2600 System SourceMeter
Multi-Channel I-V Test Solutions
Series 2600 instruments in a master/slave configuration. Once connected, all the Series 2600 instru-
Ordering Information
2601 Single-channel System
2602 Dual-channel System
ACCESORIES SUPPLIED
Test Script Builder software
IVI/VISA drivers for Visual Basic,
VC/C++, LabVIEW, TestPoint, and
LabWindows™/CVI
Mating screw terminal connectors with strain relief and covers
(2600-Kit)
TSP-Link cable (CA-180-3A)
Factory and custom
TSP test scripts
The Test Script Processor is programmed
with a simple BASIC-style programming
language that runs in real time on the
instrument. Keithley provides built-in test
scripts for:
• Sweeping
• Pulsing
• Waveform generation
• Common component tests like binary
search, V
current/voltage)
A number of test scripts are included in
the instrument, while others can be downloaded at no charge from www.keithley.
com. These pre-written factory test scripts
can be used as provided or easily customized for a g
users can get their systems up and running faster than ever before.
Users can also create custom test scripts
in several different ways, including a programming tool called Test Script Builder.
Custom scripts can be downloaded from
the PC to the master SourceMeter unit
and saved in non-volatile memory. Both
models provide 1
non-volatile memory for storing up to
50,000 lines of TSP code and more than
100,000 readings.
ourceMeter Instrument
S
SourceMeter Instrument
, V
, LIV (light intensity/
H
F
T
iven application, so production
6 megaby
tes of
ments in a system can be programmed and operated under the control of the master unit, just as if
they were housed in the same chassis. By eliminating the need for a chassis/mainframe, the TSP-Link
provides virtually unlimited flexibility to scale a test system’s channel count up or down as the application requires, while ensuring seamless integration.
New capabilities for increasing test speed and lowering test cost
The Test Script Processor (TSP)
Any Series 2600-based system can run high speed, embedded test scripts on the master unit’s Test
Script Processor (TSP), the other major new technology on which the Series 2600 is based. The test
sequence is processed and run on the embedded computer in the instrument, rather than from an
external PC controller, so delays due to GPIB traffic congestion are eliminated. TSP test scripts allow
throughput gains of up to 10
× over equivalent PC-based programs controlling the same instruments
via GPIB. TSP test scripts can be loaded and r
face. A single TSP test script, running on the master unit, can control all the SourceMeter channels in
the system and acquire data from any Series 2600 instrument connected to the TSP-Link, which supports connections for up to 64 Series 2600 instruments.
TSP for advanced automation
A Series 2600-based system can stand alone as a complete measurement and automation solution for
semiconductor device or component testing, with the master unit controlling sourcing, measuring,
pass/fail decisions, test sequence flow control, binning, and the component handler or prober. In
contrast with existing embedded test sequencers for instrumentation, the TSP test scripts offer far
greater programming flexibility, including support for:
• Instrument command queuing
• Modular subroutines with passable parameters
• Pass/fail and limit testing
• A wide range of math operations
• Flexible branching and looping capability
• Flexible external triggering
• Intelligent digital I/O read and write capability
• RS-232 communication
ACCESSORIES AVAILABLE
CABLES AND CONNECTORS
2600-BAN Banana Test Leads/Adapter Cable. For a single
2600-KIT Extra screw terminal connector, strain relief, and
2600-TRIAX Triax Adapter. For a single Series 2600 Source-
7078-TRX-* 3-Slot, Low Noise Triax Cable. For use with
8606 High Performance Modular Probe Kit. For use
SC-200 Shielded Twisted Pair Cable. Recommended for
DIGIT
2600CA-126-1 Digital I/O and Trigger Cable, 1.5m
CA-180-3A
Series 2600 SMU channel
cover for a single SourceMeter channel (two
needed for use with Model 2602)
Meter (two needed for use with Model 2602)
2600-TRIAX adapter
with 2600-BAN
general-purpose use with Series 2600 System
SourceMeter instruments.
NK AND TPS-LINK
GER LI
AL I/O, TR
TLINK Digital I/O to TLINK Adapter Cable, 1m
IG
T5 Crossover Cable for TSP
CA
-Link
®
un from the front panel or over the system’s GPIB inter-
GPIB INTERFACES AND CABLES
7007-1 Double Shielded GPIB Cable, 1m (3.3 ft.)
7007-2
KPCI-488 GPIB/IEEE-488 Interface Board for the PCI Bus
KUSB-488 GPIB/IEEE-488 Interface Module for the USB Bus
SWITCHING
7002-HD High Density Switch Mainframe
7002-HD-MTX1 Differential 6
7002-HD-MUX1 Differential Quad 1
RACK MOUNT KITS
4299-1
4299-2 Dual Rack Mount Kit with front and rear support
SOFTWARE
racer™ 2.0
LabT
EXTEN
2601-EW
2602-EW 1 Year Extended Warranty for Model 2602
Double Shielded GPIB Cable, 2m (6.6 ft.)
×32 Matrix Card
×40 Multiplexer Card
ack Mount Kit with front and rear support
Single R
racing Software (downloadable)
ve T
Cur
S
E
ANTI
R
AR
DED W
ear Extended W
1 Y
arranty for Model 2601
Scalable, integrated source and measure solutions
1.888.KEITHLEY (U.S. only)
www.keithley.com
A GR
TER M
EA
EASU
S OURCE AND MEASUR E
RE OF CONFIDENCE
Series 2600
GPIB
SMU A
SMU B
Needed only
to preload
test scripts
TSP-Link
SMU C
SMU D
Other
Instruments
Digital I/O to
trigger external
instruments
and read
pass/fail status
Digital I/O or RS-232 for
binning, handshake
Prober or
component
handler
DUT
+3A
–3A
+6V–6V
+1A
–1A
+40V–40V
F
eedback
S
ource
FeedbackSource
System SourceMeter
Multi-Channel I-V Test Solutions
Third-generation SMU design ensures faster test times
The Series 2600's new SMU design enhances test speed in several ways.
For example, while earlier designs used a parallel current ranging topology, the Series 2600 uses a series ranging topology (patent pending), which
provides faster and smoother range changes and outputs that settle more
quickly. It also allows the current output limit to be programmed independently of the measurement current range for fast charging of capacitive
loads and more intuitive operation during bench use.
Each Series 2600 SourceMeter channel offers a highly flexible, fourquadrant source coupled with precision voltage and current meters/
limiters. Each channel can be configured as a:
• Precision power supply (6V @ 3A, 40V @ 1A output with 1pA readback
resolution)
• True current source (3A @ 6V, 1A @ 40V)
• DMM (DCV, DCI, ohms, power, with 5
• Power V or I pulse generator (Pulse width: 150µs and longer—source
only; 250µs and longer—source and measure)
• Power V or I waveform generator (20-point sine wave up to 400Hz in a
TSP test script)
• Electronic load (with sink mode capability)
1
⁄2-digit resolution)
®
Series vs. parallel ranging topologies
High speed and precision A/Ds with simultaneous source-readback
All Series 2600 instruments provide four-quadrant operation and can be
connected in series or in parallel to extend their dynamic range. In the
first and third quadrants, they operate as a source, delivering power to a
load. In the second and fourth quadrants, they operate as a sink, dissipat-
Scalable, integrated source and measure solutions
ing power internally. They measure voltage and current simultaneously
with up to 5
1
⁄2-digit resolution, and they display voltage, current, resist-
ance, or power readings.
Two analog-to-digital converters per channel (one for I, one for V) can run
simultaneously, providing precise source-readback without sacrificing test
throughput. These A/D converters offer the flexibility of programmable
integration rates, allowing the user to optimize for either high speed
(>10,000 rdgs/s at 0.001 NPLC setting) or for high resolution (up to 24
bits at 10 NPLC setting) to make high accuracy measurements.
Digital I/O Inter
face
A back panel port on every Series 2600 instrument provides 14 bits of universal digital I/O to link the instrument to a variety of popular handlers for
sorting and binning components after testing. These I/O lines are also
backward-compatible with Keithley’s earlier Trigger Link instrument triggering technology
. These lines simplify integrating Series 2600 instr
into systems that employ other external instrumentation, including Series
2400 SourceMeter instruments, Series 7000 switch mainframes, and Series
2700 Integra data acquisition/multimeter systems.
Dramatic throughput improvements for production test
Series 2600 instruments help component manufacturers improve their test
throughput dramatically, as well as provide test solutions that can handle
today’s devices, which often have higher pin counts and more analog circuitry than earlier designs. In the past, manufacturers have been forced by
the lack of optimized test solutions for multi-channel source-measure
applications to choose between bulky, expensive mainframe-based systems,
slow instrument-based systems employing PC control, or fast instr
1.888.KEITHLEY (U.S. only)
S OURCE AND MEASUR E
www.keithley.com
Models 2601 and 2602 I-V capability
uments
Automated testing. With all the capability available in a TSP test script, a
Series 2600-based system can run high throughput I-V functional test
routines, completely independent of PC operating system and
ument-
A GREATER MEASURE OF CONFIDENCE
communications delays.
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