Keithley Instruments 2400 Data Sheet

SOURCEMETER LINE

2400, 2410, 2420, 2425, and 2430 SourceMeter®Line

• New class of instruments
designed for high-speed DC
testing

• Choose from standard, high
voltage, high current,high power,
or pulse mode source and
measurement capabilities

• 20W (Model 2400 and 2410),
60W (Model 2420),
100W (Model 2425 and 2430) units

• 0.012% basic accuracy with

1

5

⁄2

-digit resolution

• 6-wire Ω measurement with
programmable I-Source and

V-Clamp

• 1000 rdgs/s at 4

• Built-in comparator for fast
pass/fail testing

• Digital I/O for fast binning or
connection to component
handlers

• Optional Contact Check function

• IEEE-488 and RS-232 interfaces

• TestPoint and LabVIEW drivers

1

⁄2 digits via GPIB

Keithley’s new SourceMeter®family is the first series of instruments designed specifically for test
applications that demand tightly coupled precision voltage and current sourcing and measure­ment. They build upon many of the technologies originally developed for Keithley’s popular line of
Source-Measurement Units (SMUs). All four SourceMeter models combine a precision, low-noise,
highly stable DC power supply with readback and a low-noise, highly repeatable, high impedance,

1

⁄2-digit multimeter. The result is a compact, single-channel, DC parametric tester. In operation,

5
these instruments can act as a V-Source, an I-Source, a V-Meter, an I-Meter, and an ohmmeter.
Manufacturers of communications, computer, automotive, and consumer electronics products
will find them invaluable for a wide range of design and production test applications.

By linking source and measurement circuitry in a single unit, these instruments offer a variety of
advantages over systems configured with separate source and measurement instruments. For
example, their compact half-rack size conserves precious “real estate” in the test rack or bench.
They also minimize the test station development, set-up, and maintenance time required, while
lowering the overall cost of system ownership. In addition, SourceMeters simplify the test process
itself by eliminating many of the complex synchronization and connection issues associated with
using multiple instruments.

ORDERING INFORMATION

Model 2400 SourceMeter
Model 2410 High Voltage SourceMeter
Model 2420 High Current SourceMeter
Model 2425 100W SourceMeter
Model 2430 Pulse Mode SourceMeter
Model 2400-C SourceMeter with Contact

Check

Model 2410-C High Voltage SourceMeter

with Contact Check

Model 2420-C High Current SourceMeter

with Contact Check

Model 2425-C 100W SourceMeter

with Contact Check

Model 2430-C Pulse Mode SourceMeter

with Contact Check

These products are available with an
Extended Warranty. See page 635 for com­plete ordering information.

Five Source and Measurement Range Choices

The SourceMeter family offers a choice of five sets of source and measurement ranges, so test sys­tem developers can select the instrument best suited for the types of components to be tested.

• The Model 2400 SourceMeter is a 20W instrument that allows sourcing and measuring voltage
from ±1µV to ±200V DC and current from ±10pA to ±1A. It’s well-suited for testing a wide range
of devices, including diodes, resistors, resistor networks, active circuit protection devices, and
portable battery-powered devices and components. It’s also useful for systems power sourcing
and I

testing applications.

DDQ

• The Model 2410 High Voltage SourceMeter is a 20W instrument that sources and measures volt­age from ±1µV to ±1100V and current from ±10pA to ±1A. The higher voltage sourcing range
makes it a good choice for resistors and voltage coefficient testing, varistors, and high voltage
diodes, including switching, zener, RF diodes, and rectifiers. A 20mA measurement range gives
the Model 2410 the extra resolution needed for precision testing of high voltage varistors.

• The Model 2420 High Current SourceMeter is a 60W instrument designed to source and measure
voltage from ±1µV to ±60V and current from ±100pA to ±3A. Production test applications for the
Model 2420 include resistors and resistor network devices that must be tested at higher current
levels, thermistors, solar cells, batteries, and high current or medium power diodes, including
switching and Schottky diodes. The Model 2420 is also suitable for I

testing of CMOS inte-

DDQ

grated circuits and monitoring the current consumption of battery-powered medical devices
such as pacemakers.

• The Model 2425 100W SourceMeter extends the voltage range of the 2420 to 100V, enabling 100W
capability in the 1A range. Like the 2420, it also offers a 3A range with 60W power capability. The

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SOURCEMETER LINE

+1A

+100mA

–100mA

–1A

–200V –20V +20V +200V

= duty cycle limited

+1A

+200mA

+20mA

–1100V –200V –20V +20V +200V +1100V

= duty cycle limited

–20mA

–200mA

–1A

2400, 2410, 2420, 2425, and 2430 SourceMeter®Line

Model 2425 was designed for production testing of medium-power devices
like DC-to-DC converters, power supplies, and other components requiring
between 60W and 100W of total DC power.

• The Model 2430 1kW Pulse SourceMeter offers the same DC source and
measurement ranges as the 2425, plus a unique 1kW pulse mode that
extends the upper current limit to 10A. This mode makes the Model 2430
ideal for measuring the breakdown voltage of many types of high-power
devices, including multi-layer varistors (MLVs) and semiconductor compo­nents. During production testing of these devices, breakdown voltage is
often measured under a high current pulse of up to 10A. The Model 2430
combines programmable bipolar voltage and current sourcing of up to 10A
@ 100V (pulsed) with all the high-speed testing capabilities common to the
Series 2400 family. The Model 2430 can be programmed to produce individ­ual pulses or pulse trains up to 5ms wide and with varying duty cycle on
most source ranges. Pulses up to 2.5ms long and an 8% duty cycle can be
programmed on the instrument’s 1kW range. When combined with a PC
controller and the appropriate switching hardware, the Model 2430 pro­vides an economical, high-throughput solution for high-power varistor test­ing, all in one compact, half-rack box. Other solutions offering compatible
capabilities, such as discrete semiconductor component testers, typically
cost four times as much as the Model 2430 and required significantly more
rack space.

All five SourceMeter instruments are suitable for making a wide range of DC
measurements, including resistance at a specified current or voltage, break­down voltage, leakage current, insulation resistance, and electrical character­ization.

Model 2400 Dynamic Range

High throughput for production testing

The 2400 line lets you perform high-speed single or multi-point pass/fail
testing on a wide range of components, such as network devices, circuit
protection devices, active discrete devices, and sensors. The line’s 1000
rdgs/s at 4½ digits through a GPIB (IEEE-488) connection ensures higher
throughput. The buffer memory can store up to 5000 5½-digit readings. An
on-board comparator simplifies high-speed pass/fail tests without the
delay of computer/ IEEE-488 interaction.

Existing system – 196ms per part

total process time (18,367 parts/hr)

Handler movement

100ms

Keithley system – 132ms per part

total process time (27,272 parts/hr)

Handler movement Electrical

The timing diagram above shows a typical production system throughput improvement
of nearly 50% achieved by a 2400 based test system with a 7001 switching system and a
handler with a 100ms handling time.

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100ms 8x4ms

Electrical

test

8x12ms

SOT EOT

SOT EOT

per element

test

per element

Model 2410 Dynamic Range

+10A

+3A

+1A

+100mA

+20–20–60 +100V–100V

+60

–100mA

–1A

–3A

–10A

Model 2420/2425/2430 Dynamic Range

1-800-552-1115 (U.S. only)

Call toll free for technical assistance,

product support or ordering information, or

visit our website at www.keithley.com.

Model 2430
Pulse Mode only

Model 2425/2430

Models 2420/2425/2430

Model 2430
Pulse Mode only

= duty cycle limited

QUESTIONS?

SOURCEMETER LINE

2400, 2410, 2420, 2425, and 2430 SourceMeter®Line

QUESTIONS?

1-800-552-1115 (U.S. only)

Call toll free for technical assistance,

product support or ordering information, or

visit our website at www.keithley.com.

Contact Check Design Schematic

To

Microprocessor

Pulse Amplifier

Signal Comparators

Timing Generator

Computer Interface

Test 2

Test 1

Test 3

The 2400 line has built-in, user-definable math functionality to compute derived parameters such
as power dissipation, voltage coefficient, % deviation, alpha, ratio, and other mathematical formu­las, such as mX+b.

A digital I/O interface lets you link the 2400 family to many popular component handlers, includ­ing Aetrium, Aseco, and Robotronics, for tight systems integration in binning, sorting, and similar
applications, which speeds up the production process. Included are start of test and end of test sig­nals, three category bits, and a 5V, 300mA supply. A new digital I/O expander accessory provides 16
digital I/O lines for greater binning capacity, and can be used with any of the SourceMeter models.

A Source Memory List allows up to 100 instrument configurations to be stored in memory, each
containing source settings, sense (measurement) settings, and pass/fail criteria.

The 2400 line also has our unique Trigger-Link interface to provide seamless integration with
Keithley Series 7000 switching hardware for complete multi-point test solutions.

The 2400 family’s half-rack size saves valuable space, providing increased test capacity within a
given area. It is ruggedly designed for non-stop production environments with 75,000-hour MTBF.
It also has certification to CE and a full one-year warranty.

Optional Contact Check Function

In the production test environment, measurement errors
and false product failures can often be traced to a variety

C1

S1

Hi Force

of problems, including contact fatigue, breakage, or con­tamination, loose or broken connections, or relay failures.
Keithley’s optional Contact Check function, now available

T1

Hi Sense

for the Series 2400 SourceMeter line, makes it simple to
verify good connections quickly and easily, before an
automated test sequence begins.

The Contact Check function completes the verification
and notification process in just 350µs; comparable capa­bilities in other test equipment can require up to 5ms to

T2

C2

S2

Lo Force

Lo Sense

perform the same function. Contact Check can be
enabled with the controls on the instrument’s front panel
or remotely via the GPIB. Contact is verified simply by
making a differential measurement of the unknown resis­tance between a force lead and its sense lead (Kelvin con-

T3

C3

Guard Force

Guard Sense

tacts) to a programmable reference resistance in an equiv­alent circuit; in other words, only the difference between
the two resistances is measured and no energy passes
through the DUT during the operation. If the value of that
differential measurement is too high, the contact has

T4

C4

50Ω

22Ω 2.1Ω

S4S3

failed the check. Three reference value choices are offered
to accommodate different system configurations.

The software that controls the Contact Check function offers three methods of fault notification.
The instrument’s front panel display indicates “Open Lead” and a flag is set in a register that can be
queried through the GPIB port. Once a part has failed the contact check, the instrument’s digital
I/O can also be used to synchronize with an automatic handler to index to the next part or to retest
the same part. The output of the SourceMeter is automatically shut off when a part fails the con­tact check and is not re-activated until good contact is verified. This feature protects the device
under test (DUT) from damage and the operator from potential safety hazards.

Source memory list for sequenced testing

The source memory list is a key 2400 family feature for production testing. This built-in “pro­grammable test sequencer” lets you configure a sequence of up to 100 different tests. Each test can
contain totally different test conditions, measurements, math, pass/fail, or binning criteria. The
tests are executed sequentially without additional external commands. Conditional branching leads
to different points on the test list, depending on results. The source memory list resides in battery­backed memory and can be accessed with or without a computer. The example shows a three-step
diode test. The setup for each test would be stored in a separate source memory location. One IEEE
trigger would initiate the execution of the sequence of three tests.

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