JDS Uniphase SmartClass E1, SmartClass E1/Datacom User Manual

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SmartClass

E1 and E1/Datacom Testers

User’s Guide

SmartClass

E1 and E1/Datacom Testers

User’s Guide

Notice

Every effort was made to ensure that the information in this document was accurate at the time of printing. However, information is subject to change without notice, and JDSU reserves the right to provide an addendum to this document with information not available at the time that this document was created.

Copyright

Trademarks

© Copyright 2009, JDS Uniphase Corporation. All rights reserved. JDSU, Enabling Broadband and Optical Innovation, Communications Test and Measurement Solutions, and the JDSU logo are trademarks of JDS Uniphase Corporation (“JDS Uniphase”). All other trademarks are the property of their respective owners. No part of this guide may be reproduced or transmitted electronically or otherwise without written permission of the publisher.

JDS Uniphase, JDSU, and SmartClass are trademarks or registered trademarks of JDS Uniphase Corporation in the United States and/or other countries.

Microsoft and Excel are either trademarks or registered trademarks of Microsoft Corporation in the United States and/or other countries.

PDF is a trademark of Adobe Systems in the United States and/or other countries.

Energizer is either a trademark or registered trademark of Eveready Battery Company, Inc. in the United States and/or other countries.

Specifications, terms, and conditions are subject to change without notice. All trademarks and registered trademarks are the property of their respective companies.

Ordering information

Federal Communications

Commission (FCC) Notice

Industry Canada Requirements

EMC Directive Compliance

This guide is a product of JDSU's Technical Information Development Department, issued as part of the SmartClass E1 and E1/Datacom Testers. The catalog number for a printed guide is ML-21107607. The catalog number for a CD-ROM containing all user documentation and utilities is CML-21104331.

This product was tested and found to comply with the limits for a Class B digital device, pursuant to Part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference when the equipment is operated in a commercial or residential environment. This product generates, uses, and can radiate radio frequency energy and, if not installed and used in accordance with the instruction manual, may cause harmful interference to radio communications.

The authority to operate this product is conditioned by the requirements that no modifications be made to the equipment unless the changes or modifications are expressly approved by JDSU.

This Class B digital apparatus complies with Canadian ICES-003.

Cet appareil numérique de la classe B est conforme à la norme NMB-003 du Canada.

This product was tested and conforms to the EMC Directive, 89/336/EEC as amended by 92/31/EEC and 93/68/EEC for electromagnetic compatibility.

ii SmartClass E1 Tester User’s Guide

Low Voltage Directive Compliance

This product was tested and conforms to the Low Voltage Directive, 73/23/ EEC as amended by 93/68/EEC. Conformity with this directive is based upon compliance with the harmonized safety standard, UL61010-1.

WEEE and Battery Directive

Compliance

JDSU has established processes in compliance with the Waste Electrical and Electronic Equipment (WEEE) Directive, 2002/96/EC, and the Battery Directive, 2006/66/EC.

This product, and the batteries used to power the product, should not be disposed of as unsorted municipal waste and should be collected separately and disposed of according to your national regulations. In the European Union, all equipment and batteries purchased from JDSU after 2005-08-13 can be returned for disposal at the end of its useful life. JDSU will ensure that all waste equipment and batteries returned are reused, recycled, or disposed of in an environmentally friendly manner, and in compliance with all applicable national and international waste legislation.

It is the responsibility of the equipment owner to return equipment and batteries to JDSU for appropriate disposal. If the equipment or battery was imported by a reseller whose name or logo is marked on the equipment or battery, then the owner should return the equipment or battery directly to the reseller.

Instructions for returning waste equipment and batteries to JDSU can be found in the Environmental section of JDSU’s web site at www.jdsu.com. If you have questions concerning disposal of your equipment or batteries, contact JDSU’s WEEE Program Management team at WEEE.EMEA@jdsu.com.

SmartClass E1 Tester User’s Guide iii

iv SmartClass E1 Tester User’s Guide

About this Guide xi

Purpose and scope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xii

Assumptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xii

Safety and compliance information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xii

Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xii

Chapter 1 Getting Started 1

Ship list. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

Features and capabilities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

Configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

Software options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

Optional accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

Preparation for use . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

General preparation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

Charging the batteries . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

Exploring the front panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

Status LEDs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

LCD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Cancel key . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

OK key . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Arrow keys . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Keypad . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

*Action key . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

#Start key . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Backlight key . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Power key . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Exploring the side panels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Left side panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Right side panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Exploring the bottom panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

Powering ON your unit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

Powering OFF your unit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

SmartClass E1 Tester User’s Guide v

Table of Contents

Navigating the user interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

Menu screens . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

Data entry screens. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

Result screens . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

Using the keypad . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

Selecting a menu option or a configuration setting . . . . . . . . . . . . . . . . 14

Returning to a previous menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

Entering numeric values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

Typing text . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

Chapter 2 Instrument Settings 17

Setting the language . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18

Viewing the software and hardware information . . . . . . . . . . . . . . . . . . 18

Setting the date and time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

Changing the date or time format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

Setting the date or time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

Adjusting the contrast and brightness . . . . . . . . . . . . . . . . . . . . . . . . . . 20

Determining the specified battery type . . . . . . . . . . . . . . . . . . . . . . . . . . 20

Managing files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

Specifying DB9 port usage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

Setting options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

Restoring factory defaults. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

Chapter 3 Basic Testing 23

Managing test configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

Saving a configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

Restoring a configuration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

Viewing a configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

Starting or restarting a test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25

Stopping a test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25

Timed testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25

Viewing test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

Remote Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

Chapter 4 E1 Testing 27

About E1 testing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

Launching an E1 test application . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

Specifying test application settings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29

Specifying a test mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29

Configuring test settings automatically . . . . . . . . . . . . . . . . . . . . . . . . . 30

Specifying interface settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

Specifying E1 framing settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

Specifying E1 signaling (ABCD/Sa) settings . . . . . . . . . . . . . . . . . . . . . 32

Specifying a BERT pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

Specifying Error/Alarm settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

Specifying performance settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36

Specifying VF settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

Monitoring a circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38

Measuring timing slips . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39

Terminate testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40

Line loopback testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41

Pulse shape analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

vi SmartClass E1 Tester User’s Guide

Table of Contents

Measuring Jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43

Configuring test settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43

Connecting to the circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45

Running the test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45

Testing MFC-R2 Signaling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

Configuring test settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

Connecting to the line . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49

Running the test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49

Chapter 5 Datacom Testing 51

About data communications testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52

Launching the datacom application . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52

Specifying test settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53

Specifying the test mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53

Specifying the interface standard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53

Specifying timing parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54

Specifying the timing mode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54

Specifying transmit and receive timing . . . . . . . . . . . . . . . . . . . . . . 54

Specifying polarity settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55

Specifying a BERT pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55

Specifying data parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57

Specifying the data rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57

Enabling/disabling data loss detection . . . . . . . . . . . . . . . . . . . . . . 58

Specifying the Rx input . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58

Specifying the clock loss threshold. . . . . . . . . . . . . . . . . . . . . . . . . 58

Specifying async settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58

Specifying flow control settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

Specifying G.821 performance settings . . . . . . . . . . . . . . . . . . . . . . . . 60

Specifying error settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60

Performing a self test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

Connecting the E1/Datacom Tester to the circuit. . . . . . . . . . . . . . . . . . 61

Connecting for X.21 testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62

Connecting for RS-232/V.24 and EIA-530 testing. . . . . . . . . . . . . . . . . 62

Connecting for V.35 testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62

Connecting for RS-449/V.36 testing . . . . . . . . . . . . . . . . . . . . . . . . . . . 62

BER Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63

Monitoring a Datacom interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64

Frame Relay testing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64

Launching the Frame Relay application . . . . . . . . . . . . . . . . . . . . . . . . 64

Configuring the test mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

Specifying datacom settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

Configuring the frame load settings. . . . . . . . . . . . . . . . . . . . . . . . . . . . 66

Configuring the frame header settings . . . . . . . . . . . . . . . . . . . . . . . . . 68

Configuring the LMI Settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69

Configuring the trace settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70

Specifying flow control settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70

Specifying polarity settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71

Monitoring traffic on Datacom interfaces. . . . . . . . . . . . . . . . . . . . . . . . 71

Transmitting traffic over a Datacom interface . . . . . . . . . . . . . . . . . . . . 72

Chapter 6 VT100 Terminal Emulation 73

About VT100. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74

VT100 cabling. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74

Emulating a VT100 terminal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74

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Table of Contents

Chapter 7 Test Results 77

E1 Results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78

E1 Summary results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78

Statistics results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79

Signal results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79

Interface results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80

Frame Data results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81

Timeslot results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81

BERT results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81

Performance results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82

G.821 results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82

G.826 ISM results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83

G.826 OOS results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84

M.2100 ISM results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84

M.2100 OOS results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85

VF results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86

Freezing test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86

Pulse shape results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86

Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86

Pulse Shape . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88

Jitter results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88

Summary results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88

Jitter results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

Graphical and Tabular jitter results . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

Jitter Graph . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

MTJ Graph and Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

JTF Graph . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

Signal results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

Interface results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

BERT results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

Event Log. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

Event Histogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89

MFC-R2 results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90

Datacom results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90

Summary results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90

Clock results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91

Control Signal results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91

Data results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92

BERT results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93

G.821 performance results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94

Event Log. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94

Event Histogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94

Frame relay results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94

Summary results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94

Clock results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96

Control Signal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96

Data Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96

DLCI results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96

Link results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97

Ping results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99

LMI results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

DLCI list results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

Trace results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

Event Log. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

Event Histogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101

Saving results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101

Viewing saved results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101

viii SmartClass E1 Tester User’s Guide

Table of Contents

Chapter 8 Maintaining the Batteries 103

Prolonging battery life. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104

Recharging the batteries. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104

Replacing the batteries . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105

Chapter 9 Troubleshooting 107

Getting Technical Assistance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108

Resolving problems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108

General testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108

E1 testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109

Datacom testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110

Appendix A Signal Lead Names 111

Appendix B Specifications 113

E1 interface connector specifications. . . . . . . . . . . . . . . . . . . . . . . . . . 114

Physical interface specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114

Transmitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114

Receivers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114

E1 circuit testing specifications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115

Pulse shape specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116

Jitter specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116

Standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117

Manual Jitter Measurement. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117

MTJ and FMTJ Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117

Jitter Transfer Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117

Datacom specifications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118

Supported interface standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118

About pin assignments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118

RS-232/V.24 pin assignments. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118

X.21 pin assignments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119

EIA-530 pin assignments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120

V.35 pin assignments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121

RS-449/V.36 pin assignments. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122

Signal Lead Names. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123

Physical specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124

Environmental specifications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124

Power specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124

Warranty information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125

SmartClass E1 Tester User’s Guide ix

Table of Contents

x SmartClass E1 Tester User’s Guide

About this Guide

This chapter describes how to use this guide. Topics discussed in this chapter include the following:

– “Purpose and scope” on page xii

– “Assumptions” on page xii

– “Safety and compliance information” on page xii

– “Conventions” on page xii

SmartClass E1 Tester User’s Guide xi

About this Guide

Purpose and scope

Assumptions

The purpose of this guide is to help you successfully use the features and capabilities of the SmartClass E1Tester.

This guide includes task-based instructions that describe how to configure, use, and troubleshoot the general functions of the SmartClass E1Tester. Additionally, this guide provides a description of JDSU’s warranty.

This guide is intended for novice, intermediate, and experienced users who want to use the SmartClass E1Tester effectively and efficiently. We are assuming that you have basic computer experience and are familiar with basic telecommunication concepts, terminology, and safety.

Safety and compliance information

Safety and compliance information are contained in a separate guide and are provided in printed format with the product.

Conventions

This symbols and safety terms used in this guide are described in the following tables.

Table 1 Symbol conventions

This symbol represents a general hazard.

This symbol represents a risk of electrical shock.

This symbol represents a risk of explosion

This symbol represents a Note indicating related information or tip.

This symbol, located on the equipment, battery, or packaging indicates that the equipment or battery must not be disposed of in a land-fill site or as municipal waste, and should be disposed of according to your national regulations.

xii SmartClass E1 Tester User’s Guide

About this Guide

Conventions

Table 2 Safety definitions

DANGER Indicates an imminently hazardous situation which, if not

avoided, will result in death or serious injury.

WARNING

CAUTION

Indicates a potentially hazardous situation which, if not avoided, could result in death or serious injury.

Indicates a potentially hazardous situation which, if not avoided, may result in minor or moderate injury.

SmartClass E1 Tester User’s Guide xiii

About this Guide

Conventions

xiv SmartClass E1 Tester User’s Guide

Chapter1

Getting Started

This chapter provides a general description of the SmartClass E1 Tester. Topics discussed in this chapter include the following:

– “Ship list” on page 2

– “Features and capabilities” on page 2

– “Options” on page 3

– “Preparation for use” on page 5

– “Exploring the front panel” on page 6

– “Exploring the side panels” on page 9

– “Exploring the bottom panel” on page 10

– “Powering ON your unit” on page 10

– “Powering OFF your unit” on page 10

– “Navigating the user interface” on page 11

– “Using the keypad” on page 14

SmartClass E1 Tester User’s Guide 1

Chapter 1 Getting Started

Ship list

The E1 Tester typically ships in anti-static packing material to stabilize the unit inside the box. The following items ship standard with the SmartClass E1 Tester:

– SmartClass E1 Tester unit.

– AC Power Adapter with Plug Kit (USA, UK, Australia, Europe) — A power

adapter designed specifically for the SmartClass Tester is included. When supplying power to the SmartClass Tester using an adapter, you must use the adapter supplied with your unit. (catalog no. SC1WALLCHARGER)

– Small Carrying Bag (catalog no. 7522/90.03)

– 4 AA Rechargeable NiMH Batteries

(catalog no. BATTAA25AHNIMH4PCK)

– RJ-48 (M) to RJ-48 (M/F) Cable (catalog no. K1599)

– USB Cable (catalog no. CB-50759)

– Documentation CD. The SmartClass E1 Tester User’s Guide and the

Download Manager and Upgrade Instructions are included on the CD. (catalog no. CML-21104331)

The latest version of the Download Manager utility is available on JDSU’s Communications Test & Measurement Customer Care site at

http://www.jdsu.com/test_and_measurement/products/descriptions/ SmartClass_E1/index.html.

Safety and compliance information is provided separately, in printed format.

Features and capabilities

When unpacking the unit, verify that each of the standard items, and any optional items you ordered, are included in the package.

Features and capabilities of the SmartClass E1 Tester include the following:

– General features

– Color display

– Supported languages: Simplified Chinese, Deutsche, English, French,

Italian, Japanese, Korean, Portuguese, Russian, and Spanish.

– Field replaceable batteries

– Remote control (optional)

– VT-100 terminal emulation (option)

– E1 Testing features

– Dual E1 RJ-48 interfaces (Port 1 Rx/Tx, Port 2 Rx only).

– Analysis for contiguous and non-contiguous timeslots in 64 kbit/s

format.

– Supported framing formats: PCM30C, PCM30, PCM31C, PCM31, and

unframed.

– Insertion of code errors, TSE (bit errors), pattern slips, CRCs, E-bit

errors, FAS, and MFAS errors.

2 SmartClass E1 Tester User’s Guide

Chapter 1 Getting Started

– Physical layer defects (alarms), anomalies (errors), and statistics are

collected during the test.

– Auto configure to automatically select the interface, framing, and

pattern.

– Line rate throughput testing

– Line loopback testing

– Round trip delay measurement

– Terminate, Monitor, Bridge, and Loopback testing

– Pulse shape (option)

– MFC-R2 Signaling (option)

– Datacom Testing features

– DTE emulate, DCE emulate and monitor mode

– X.21, V.24 (RS-232), V.35, V.36 (RS-449), EIA-530

–V. delay

–Frame Relay

– G.703 Co-directional, Contra-directional and Centralized interface

testing

Options

Configurations

The SmartClass E1 Tester has factory-configurable options as well as options available for field upgrade. You can expand your testing capability by purchasing optional software or accessories.

The SmartClass E1 Tester is factory configurable with or without Datacomm.

Table 3 describes the available configurations.

Table 3 SmartClass E1 Tester configurations

Catalog Number Option

CSC-E1-P1 SmartClass

CSC-E1-P2 SmartClass E1 Tester with the PS option. Allows you to

test E1 services, including Pulse Shape.

CSC-E1-P3 SmartClass

test E1 services, including Jitter.

CSC-E1-P4 SmartClass

test E1 services, including Pulse Shape and Jitter.

CSC-E1DC-P1 SmartClass E1 Datacomm Tester. Allows you to test E1

and Data communication services.

E1 Tester. Allows you to test E1 services.

E1 Tester with the JIT option. Allows you to

E1 Tester complete package. Allows you to

CSC-E1DC-P2 SmartClass E1 Datacomm Tester with PS and FR

options

Shape, and Data communication services, including Frame Relay.

CSC-E1DC-P3 SmartClass

VT100 options

Pulse Shape, MFC-R2 signaling, and VT100, as well as Data communication services, including Frame Relay.

. Allows you to test E1 services, including Pulse

E1 Datacomm Tester with PS, SIG, and

. Allows you to test E1 services including

SmartClass E1 Tester User’s Guide 3

Chapter 1 Getting Started

Options

Table 3 SmartClass E1 Tester configurations (Continued)

Catalog Number Option

CSC-E1DC-P4 SmartClass E1 Datacomm Tester with PS and JIT

options

Shape and Jitter, and Data communication services.

CSC-E1DC-P5 SmartClass E1 Datacomm Tester complete package.

Allows you to test E1 services including Pulse Shape, Jitter, MFC-R2 signaling, and VT100, as well as Data communication services, including Frame Relay.

. Allows you to test E1 services, including Pulse

Software options

Table 5 lists the software options offered for the E1 Tester.

Table 4 SmartClass E1 Tester software options

Catalog Number Option

CSC-E1-PS SmartClass Pulse Shape SW Option. Allows measuring of

displaying a graphical representation of the E1

and

pulse

. (Applicable to CSC-E1 and CSC-E1DC)

CSC-E1-FR SmartClass Frame Relay option. Allows you to test frame

relay services over Datacomm interfaces. (Applicable to

CSC-E1DC only)

CSC-E1-SIG SmartClass Signaling option. Allows you to test MFC-R2 sig-

naling. (Applicable to CSC-E1DC only)

CSC-E1-VT100 SmartClass VT100 option. Allows emulation of a VT100 ter-

minal. (Applicable to CSC-E1DC only)

CSC-E1-JIT SmartClass Jitter option. Allows measurement of jitter.

(Applicable to CSC-E1DC only)

CSC-E1-RC SmartClass Remote Control Option. Allows remote

access and control of the instrument using specific commands. A command guide is available with this option. (Applicable to CSC-E1 and CSC-E1DC)

Optional accessories

Table 5 lists the optional accessories offered for the E1 Tester.

Table 5 SmartClass E1 Tester optional accessories

Catalog Number Accessory

General

CC-120101 Large Carrying Bag

AC-009801 Large Strand Hook

SCACARCHARGER SmartClass 12V car adapter

ML-21107607 Printed

ML-21121114 Printed SmartClass E1 Tester Remote Control Ref-

erence Guide (English)

E1 testing

K1597 Balanced RJ-48 to balanced CF Y-cable

CB-44995 RJ-48 (balanced) to dual BNC (unbalanced) cable

4 SmartClass E1 Tester User’s Guide

SmartClass E1 Tester User’s Guide (English)

Chapter 1 Getting Started

Preparation for use

Table 5 SmartClass E1 Tester optional accessories (Continued)

Catalog Number Accessory

CB-0045402 External 2M Reference Clock cable

Datacom testing

CB-44391 X.21 10 MHz DTE/DCE Emulate

CB-44346 X.21 Monitor

CB-44385 V.24 DTE/DCE Emulate

CB-44348 V.24 Monitor

CB-44389 V.35 DTE/DCE Emulate

CB-44341 V.35 Monitor

CB-44388 V.36 DTE/DCE Emulate

CB-44347 V.36 Monitor

CB-21128081 68-pin MDR to DB-15 cable (DTE emulation, for inter-

face to network)

Preparation for use

General preparation

CB-21118474 68-pin MDR to Bananas (for Co-directional, Contra-

directional and Centralized testing)

To order accessories for your E1 Tester, contact JDSU Customer Care, your JDSU TAC representative, or your local JDSU sales office. You can also contact JDSU through the company web site, www.jdsu.com.

This section explains how to start using your E1 Tester.

When you unpack the E1 Tester, do the following:

– Inspect the tester for damage.

– If undamaged, save the box and packing materials in case you need to

ship the tester in the future.

Before using the E1 Tester for the first time, do the following:

– If you are using alkaline batteries, verify that your unit is OFF, and then

install fresh batteries in the tester.

– If you are using rechargeable batteries, verify that your unit is OFF, and

then install the batteries in the tester. Before testing, make sure the batteries have been fully charged (see “Recharging the batteries” on

page 104).

– Turn the unit ON (see “Powering ON your unit” on page 10).

– When prompted, specify the type of battery you installed.

– Verify that your unit is operating properly by navigating through a few

menus.

SmartClass E1 Tester User’s Guide 5

Chapter 1 Getting Started

Exploring the front panel

– If the Batt LED is red, replace the batteries (see “Replacing the batteries”

on page 105). If you suspect that the batteries are fine, and the batteries

are fully charged, it’s possible the charger has detected a fault condition. See “Resolving problems” on page 108 for details.

Charging the batteries

Exploring the front panel

The SmartClass Tester uses an AC adapter or four (4) AA batteries (alkaline or rechargeable NiMH batteries). The first time you use the SmartClass Tester, or after prolonged storage, use the AC adapter to power the unit and charge NiMH batteries only. For details on charging and maintaining batteries, see

Chapter 8 “Maintaining the Batteries”.

The controls and LEDs on the SmartClass front panel, shown in Figure 1, are used to operate the unit, set up tests, and view data.

Status LEDs

LCD

Arrow keys

OK key

Cancel key

Keypad (includes *Action and #Start keys)

Backlight key

Power key

Figure 1 SmartClass front panel

The label near the top will say “SmartClass E1/Data”, if you have the E1/Datacomm configuration.

The following paragraphs describe each of the controls and LEDs on the front panel.

6 SmartClass E1 Tester User’s Guide

Chapter 1 Getting Started

Exploring the front panel

Status LEDs

These indicators report the status of the unit. The function of the LEDs change depending on the application. Table 6 describes each of the Status LEDs.

Table 6 Status LEDs

Status LED Description

Sync For E1 testing:

Green – Solid—A signal is present and synchronization is established

on all active receivers.

– Flashing—Auto-framing is running on at least one active

receiver. Red – At least one of the active receivers does not have frame syn-

chronization. Off – No signal has been detected on any receiver.

For Datacom testing:

Green – Solid—A receive clock is present. Red – Solid—A receive clock was present at some point in the past,

but was lost. Off – No receive clock has been detected on any receiver.

Data/LpBK Green

– Solid—Synchronization is established with BERT pattern for all

active receivers. – Flashing—Auto-pattern is running on at least one active

receiver. Red – At least one of the active receivers does not have pattern syn-

chronization. Amber – For E1 testing: The E1 Tester has been placed in a line loop-

back mode. Off – The E1 Tester is not in a line loopback mode, which means the

selected traffic pattern is live on all active receivers, or no pat-

tern synchronization has been detected on the receiver.

Err/Alm Red

– Flashing —The LED flashes for one second when an error or

alarm occurs. Or, for E1 testing, flashes when the unit is

searching for framing or a pattern during Auto Config. Amber – At least one error or alarm has occurred since that last reset. Off – All Summary results are OK. No error or alarm has been

received.

SmartClass E1 Tester User’s Guide 7

Chapter 1 Getting Started

Exploring the front panel

Table 6 Status LEDs

Status LED Description

Batt Green

– Solid—An external source is powering the unit. Red – Low battery, or the charger has detected a fault condition. Amber – The battery is charging. Off – A battery is powering the unit.

LCD

Cancel key

OK key

Arrow keys

Keypad

*Action key

The LCD is a 320 x 240 pixel color display with contrast control and backlight.

Use the Cancel key to exit a data entry screen without changing your settings, or to return to the previous menu.

Use OK to accept a changed setting or to proceed to the next menu.

Use the arrow keys to navigate through menu selections. For E1 testing, when viewing the test results, use the left or right arrow key to switch between Rx1 and Rx2 result screens. For Datacom testing, in monitor mode use the left or right arrow to switch between DCE and DTE.

Use the keypad to enter numbers, make menu selections, enter alphabetic characters, and so on. Throughout the menus, the numbers associated with each function provide a quick way to perform tests with simple number sequences.

Use the *Action key to insert errors or alarms during testing.

#Start key

Backlight key

Power key

8 SmartClass E1 Tester User’s Guide

Use the #Start key to restart your test and transmit traffic immediately after you configure your test. After starting the test, the unit automatically displays test results associated with your application.

Use the backlight key to adjust the brightness level on your LCD. The SmartClass E1 provides four brightness levels on the LCD. Pressing the backlight key once increases the brightness by one level. The brightness level returns to the original level when you press the backlight key the fourth time.

Use the power key to turn power ON (see “Powering ON your unit” on

page 10), put the unit into sleep mode, or turn power OFF (see “Powering OFF your unit” on page 10).

Exploring the side panels

Chapter 1 Getting Started

Exploring the side panels

The connectors located on the side panels are used to connect the E1 Tester to the circuit for testing.

Left side panel

Right side panel

Figure 2 shows the left side panel.

RS232 Connector

RJ-48 Connectors

Figure 2 SmartClass E1 Tester left side panel

Use the RJ-48 jacks (labeled RX1/TX1 and RX2/Ext Clk) to connect to E1 circuits. See Table 5 on page 4 for cables that are available for the SmartClass E1 Tester.

The RS232 connector is only used on the SmartClass E1/Datacomm configuration. It is used to connect to network elements when using the optional VT-100 emulation feature.

The right side panel has a universal connector, shown in Figure 3, that is used to connect to Datacom circuits

universal connector

Figure 3 SmartClass E1 Tester right side panel

The universal connector supports several interface standards. Use the connector and adaptor cables (see Table 5 on page 4) to connect to the appropriate test interface. For pin assignments for the supported interface standards, see Appendix A on page 111.

SmartClass E1 Tester User’s Guide 9

Chapter 1 Getting Started

Exploring the bottom panel

The SmartClass AC adapter and USB device ports are located on the bottom panel. The USB device port is used to establish connections that allow you to run reports from a remote device (typically a PC or laptop) or update the software using the Download Manager utility.

Powering ON your unit

Powering OFF your unit

USB device portAC adapter port

Figure 4 SmartClass bottom panel

The following procedure describes how to power ON the E1 Tester.

To power ON your unit

– Press and hold the Power key for a few seconds.

The SmartClass E1 splash screen appears for a few seconds, and then the Main Menu appears.

The following procedure describes how to power OFF the E1 Tester.

To power OFF your unit

1 Press and hold the Power key for a few seconds.

The Power Control menu appears.

2 Do one of the following:

– If you want to be able to restart the unit quickly, select Enter Sleep

Mode. The test stops, and then the user interface disappears. If the backlight is ON, the unit automatically turns it OFF. When you are ready to resume testing, press the Power key for a few seconds to redisplay the user interface.

NOTE: If your unit is in sleep mode for more than two hours, it will automatically turn itself OFF.

10 SmartClass E1 Tester User’s Guide

Navigating the user interface

Chapter 1 Getting Started

Navigating the user interface

– To conserve power and completely power OFF your unit, select Shut

Down. A message briefly appears informing you that the unit is shut-

ting down.

Power is OFF.

The user interface of the SmartClass is designed to be intuitive and easy to use. Using the LCD and keypad, you can set up the unit, configure test parameters, and view test results. This section describes the user interface, and explains how to navigate through the menus and screens.

When you power up the SmartClass E1 Tester, the Main Menu of the user interface appears. Figure 5 illustrates the Main menu for the SmartClass E1/ Datacom tester.

Figure 5 SmartClass E1/Datacom Tester Main Menu

There are 3 types of screens on the user interface:

– Menus

– Data entry screens

– Results screens

SmartClass E1 Tester User’s Guide 11

Chapter 1 Getting Started

Navigating the user interface

Menu screens

Figure 6 illustrates the Configuration menu screen for the SmartClass E1

tester.

Figure 6 SmartClass E1 Tester Configuration menu screen

Menu screens provide a series of selections that take you to another menu screen, a data entry screen, or a results screen.

Figure 7 illustrates the Error/Alarm settings menu screen listing each of the

available error or alarm settings.

Figure 7 SmartClass E1 Tester Error/Alarm Settings menu screen

12 SmartClass E1 Tester User’s Guide

Chapter 1 Getting Started

Navigating the user interface

Data entry screens

Result screens

Data entry screens provide a list of selectable options, or allow you to enter data or specify settings using the keypad. Figure 8 illustrates the Timeslots screen, used to specify the timeslots you want to use to transmit traffic in.

Figure 8 SmartClass E1 Tester Data Entry screen

Figure 9 illustrates a Result screen.

Figure 9 SmartClass E1 Tester Result screen

These screens display test results. The results are split into categories. Press the arrow keys to navigate through the result categories (screens).

SmartClass E1 Tester User’s Guide 13

Chapter 1 Getting Started

Using the keypad

Use the keypad to enter alpha-numeric values, or to navigate to different screens by specifying the menu number corresponding to the screen. When entering alpha-numeric values for a test setting:

– The left arrow positions the cursor one position to the left.

– The down arrow operates as a Backspace key, and typically clears the

character one position to the left of the cursor. If the cursor is on the first character of a text entry field, the down arrow deletes the first character.

– If you are entering text, the up arrow serves as a Caps Lock key.

Selecting a menu option or a

configuration setting

Returning to a previous menu

Entering numeric values

There are three ways to select a menu option or configuration setting.

– Use the arrow keys to scroll to the desired option then press the OK key.

– Press the number associated with the menu option.

– Change on/off or enable/disable values using the left and right arrow keys

on your keypad. For example, if the current value is ON, pressing the left arrow a single time changes the value to OFF. Pressing it a second time changes it back to ON.

Use the Cancel key to return to the previous menu.

To enter numeric values

1 Use the arrow keys to scroll to and highlight the setting you want to

specify.

2 Press OK.

3 Use the keypad to type the numeric value.

4 If you want to move to the next field, use the right arrow key.

5 If you want to enter a minus sign (-), and the setting accepts negative

values, press the # key.

6 If you want to enter a decimal point, and the setting accepts floating

decimal values, press the asterisk (*) key.

Typing text

14 SmartClass E1 Tester User’s Guide

To type text

1 Use the arrow keys to scroll to and highlight the setting you want to

specify.

2 Press OK.

Chapter 1 Getting Started

Using the keypad

3 Use the keypad to type the text.

– Repeatedly pressing a key scrolls through the selections for that key.

For example, repeatedly pressing the 2 key will scroll through A, B, C and 2.

– To toggle between upper and lower case, press the up arrow.

– To delete the previous character, press the down arrow.

– Use the left and right arrow to navigate through typed text.

– To enter a space between characters, press the 0 (zero) key once.

– To scroll through and select a special character such as:

. @ / , ‘ - ? ! _ 1

press the 1 (one) key.

NOTE

You can not enter a space when specifying a filename.

SmartClass E1 Tester User’s Guide 15

Chapter 1 Getting Started

Using the keypad

16 SmartClass E1 Tester User’s Guide

Chapter2

Instrument Settings

This chapter describes how to configure the basic settings of the instrument. Topics discussed in this chapter include the following:

– “Setting the language” on page 18

– “Viewing the software and hardware information” on page 18

– “Setting the date and time” on page 19

– “Adjusting the contrast and brightness” on page 20

– “Determining the specified battery type” on page 20

– “Managing files” on page 20

– “Setting options” on page 21

– “Restoring factory defaults” on page 21

SmartClass E1 Tester User’s Guide 17

Chapter 2 Instrument Settings

Setting the language

The following instructions explain how to specify the language for your SmartClass E1Tester.

To specify the language for the SmartClass E1 tester

1 Power ON your tester by pressing and holding the key for a few

seconds.

The SmartClass E1 splash screen appears briefly, and then the SmartClass E1 main menu appears.

2 Select System Settings. A menu appears listing each of the system

settings.

3 Select Language. A menu appears listing the available languages.

4 Select the language. After a brief moment, the main menu appears, and

options appear in the language you selected.

The language for the E1 Tester is specified.

NOTE:

If you select the wrong language by mistake, you can return to the language selection menu by selecting the last item on the Main Menu, and then the last menu on the System Settings menu.

Viewing the software and hardware information

The Version Info screen displays the current version of the software loaded on your unit, whether your hardware is jitter capable, and the factory-assigned SCE ID number.

To view the software and hardware information

1 Select System Settings from the Main Menu.

2 Select Version Info.

The software version and SCE ID Number appear. The screen may also display “Jitter-capable hardware”.

NOTE:

The jitter option requires both newer hardware and an option code. Thus, having hardware that is jitter capable does not guarantee that the option is enabled. To verify whether your unit includes the jitter option, view the E1 Measurement menu. If it includes a selection for E1 Jitter, the option is enabled.

18 SmartClass E1 Tester User’s Guide

Setting the date and time

Chapter 2 Instrument Settings

Setting the date and time

The E1 Tester has an internal clock that you can set to provide accurate time stamps for test results. By default, the clock uses a 12-hour format and presents dates in a MM/DD/YYYY format. You can optionally configure your unit to use a 24-hour time format or a DD/MM/YYYY date format. For example, you can configure the E1 Tester to display midnight, January 15th in the following manner:

Time format Time displayed Date format Date displayed

Changing the date or time

format

Setting the date or time

12-hour 12:00:00 AM

24-hour 00:00:00 DD/MM/YYYY 15/01/2007

The following procedure describes how to change the date or time format on your unit.

To change the date or time format

1 Select System Settings from the Main Menu.

2 Select Set Time/Date Format.

3 Do one of the following:

– To change the format used to display the time, select Time Format,

and then select the new format.

– To change the format used to display the date, select Date Format,

and then select the new format.

The format is changed.

The following procedure describes how to set the date or time.

MM/DD/YYYY 01/15/2007

To set the date or time

1 Select System Settings from the Main Menu.

2 Select Set Time/Date.

3 Do one of the following:

– To set the time, select Set Time, and then enter the time.

– To set the date, select Set Date, and then enter the date.

The date or time is set.

SmartClass E1 Tester User’s Guide 19

Chapter 2 Instrument Settings

Adjusting the contrast and brightness

The following procedure describes how to adjust the contrast and brightness.

To adjust the contrast and brightness

1 Select System Settings from the Main Menu.

2 Select Contrast/Brightness.

3 Change the contrast level using the left or right arrow key.

4 Change the brightness using the up or down arrow key.

5 Press the Cancel key to return to the previous Menu.

The contrast and brightness are set. You can also press and hold the Backlight key, and then press the right and left arrows to adjust contrast of the display.

Determining the specified battery type

Managing files

The following procedure describes how to determine the type of battery you specified when you installed batteries in your unit (see “Replacing the

batteries” on page 105).

To determine the specified battery type

1 Select System Settings from the Main Menu.

2 Select Battery Selection.

A screen briefly appears indicating the type of battery you specified, and then the System Settings menu appears.

The following procedure describes how to view or delete test configuration or test result files.

To view or delete files

1 Select File Manager from the Main Menu.

The File Manager menu appears.

2 Select Config Files or Result Files.

A list of files appears.

3 Use the down arrow to scroll to the desired file, and then do one of the

following:

– If you want to view the file, press the OK key.

– If you want to delete the file, press the left arrow key.

A menu appears asking you to verify whether or not you want to delete the file.

To delete the file, select Yes.

The file is deleted.

20 SmartClass E1 Tester User’s Guide

Specifying DB9 port usage

The E1 Tester has one DB9 RS232 serial port but both the VT100 and remote control options use this port. This menu specifies which option will use the port. This menu only appears if your unit has both options.

To specify the DB9 port usage

1 Select System Settings from the Main Menu.

2 Select RS232 DB9 port usage.

3 Choose which option will use the DB9 port.

The port usage is specified.

Setting options

The Set Options item on the System Settings menu allows you to add optional functionality to your SmartClass E1 Tester. If the options were ordered at the same time the unit was ordered, they will be installed at the factory. If you order a field upgrade, you will receive a package with an option code to enter here, along with additional instructions.

Chapter 2 Instrument Settings

Specifying DB9 port usage

The default is VT100.

Restoring factory defaults

The following procedure describes how to restore the E1 Tester to use factory default test application and system settings.

To restore factory default settings

1 Select System Settings from the Main Menu.

2 Select Restore Defaults.

3 Select Yes to restore the settings, or No to keep the current settings.

Factory defaults are restored.

SmartClass E1 Tester User’s Guide 21

Chapter 2 Instrument Settings

Restoring factory defaults

22 SmartClass E1 Tester User’s Guide

Chapter3

Basic Testing

This chapter provides instructions for basic tests or procedures that are common among testing applications. Topics discussed in this chapter include the following:

– “Managing test configurations” on page 24

– “Starting or restarting a test” on page 25

– “Stopping a test” on page 25

– “Timed testing” on page 25

SmartClass E1 Tester User’s Guide 23

Chapter 3 Basic Testing

Managing test configurations

After specifying test settings, you can save the configuration, and then restore it at a later time when you want to run a test using the same settings. You can also view a stored test configuration to verify it matches the desired settings before using it. If you no longer need the configuration, you can delete it.

Saving a configuration

Restoring a configuration

To save a test configuration

1 If you haven’t already done so, launch your test application (see

“Launching an E1 test application” on page 28), and configure the test

(see “Specifying test application settings” on page 29).

2 On the Configuration menu, select Save/Restore-View.

A menu appears.

3 Select Save Config.

A screen appears prompting you for a filename for the configuration file.

4 Enter a filename, and then press OK.

The configuration file is saved.

To restore a saved test configuration

1 On the Configuration menu, select Save/Restore-View.

A menu appears.

2 Select Restore/View.

A menu appears listing all saved configurations.

3 Use the up and down arrows to highlight the configuration you want to

restore, and then the right arrow.

Viewing a configuration

The configuration is restored.

To view a saved test configuration

1 On the Configuration menu, select Save/Restore-View.

A menu appears.

2 Select Restore/View.

A menu appears listing all saved configurations.

3 Use the up and down arrows to highlight the configuration you want to

restore, and then press OK.

The configuration is displayed on the screen.

24 SmartClass E1 Tester User’s Guide

Starting or restarting a test

Chapter 3 Basic Testing

Starting or restarting a test

After you configure your test, you are ready to start or restart the test.

To start or restart the test

1 If you haven’t already done so, launch your test application (see

“Launching an E1 test application” on page 28 or “Launching the datacom application” on page 52), and configure the test (see “Specifying test application settings” on page 29 or page 53).

2 Press the # Start key.

The unit clears your test results, the test restarts, and the unit transmits the traffic you configured.

The test starts or restarts.

NOTE

You can also start or restart a test by pressing the Cancel key until you get to the BERT menu, and then select Action, and then selecting the corresponding option on the Action menu.

Stopping a test

Timed testing

You can stop a test any time.

To stop a test

1 Press Cancel until you get to the main test menu, and then select Action.

A menu of actions applicable to you test appears.

2 Select Stop Test.

A message appears indicating the tester is stopping the test.

The test stops.

If you wish to run a test for a specific amount of time, you can do a timed test.

To do a timed test

1 If you haven’t already done so, launch your test application (see

2 On the Configuration menu, select Timed Test.

3 Select Enabled, and then select either On or Off.

4 Select Duration, and then enter the number of seconds to run the test.

The test runs for the specified duration.

SmartClass E1 Tester User’s Guide 25

Chapter 3 Basic Testing

Viewing test results

After the E1 tester is connected to the circuit and test is started, the unit immediately accumulates and displays results in the Summary and Signal result categories. After you start a test and transmit traffic, additional test results populate the remaining categories.

To view test results

1 If you haven’t already done so, launch a test application (see “Launching

an E1 test application” on page 28 or “Launching the datacom application” on page 52).

2 Start the test.

3 On the Main menu for the test, select Results.

A menu of result categories applicable to you test appears.

4 Select a result category.

5 If necessary, use the up / down arrow keys or the OK key to select Rx1 or

Rx2 results.

Remote Control

Test results appear for the category you selected. After the test is complete and all results have accumulated, the status bar at the bottom of the results display blinks and indicates that the results are complete.

You can clear existing result values and then accumulate new values using the Restart action.

The test results for the category appear. For descriptions of test results, see

Chapter 7 “Test Results”.

With the remote control option, you can connect to a E1 Tester in order to control it remotely using command lines via the serial interface. A command guide is available with the option.

26 SmartClass E1 Tester User’s Guide

Chapter4

E1 Testing

This chapter provides task-based instructions for turning up and troubleshooting E1 service using the SmartClass E1 Tester. Topics discussed in this chapter include the following:

– “About E1 testing” on page 28

– “Launching an E1 test application” on page 28

– “Specifying test application settings” on page 29

– “Monitoring a circuit” on page 38

– “Measuring timing slips” on page 39

– “Terminate testing” on page 40

– “Line loopback testing” on page 41

– “Pulse shape analysis” on page 42

– “Measuring Jitter” on page 43

– “Testing MFC-R2 Signaling” on page 46

SmartClass E1 Tester User’s Guide 27

Chapter 4 E1 Testing

About E1 testing

The SmartClass E1 tester is intended to be used to commission and maintain E1 circuits. Typically this involves out-of-service testing to ensure that the physical layer is clean and there are no problems with network equipment or improper provisioning.

You can use the SmartClass E1 in the following ways:

– To terminate a circuit, and then loop back to another SmartClass unit or

piece of network equipment to perform BER testing.

– To perform BER analysis end-to-end between two SmartClass units (typi-

cally requires two technicians) with analysis performed in both directions. This allows you to easily isolate faults on the circuit.

– To passively monitor one or two E1 circuits (in-service testing) by exam-

ining transmission layer metrics such as CRC and frame errors or timing slips.

– To perform BER testing on individual timeslots within an E1 circuit.

– To perform line loopback testing to monitor the circuit.

– To measure an E1 pulse and display a graph of the pulse shape

Launching an E1 test application

The following procedure describes how to launch an E1 test.

To launch an E1 test

1 Power ON your tester by pressing and holding the key for a few

seconds.

The SmartClass E1 splash screen appears for a few seconds, and then the SmartClass E1 main menu appears.

2 Select E1 Measurements. The E1 Measurements menu appears.

3 Select an application; for example, E1 BERT.

A message briefly appears stating that the unit is launching the test application.

A test menu appears for the application, listing the following options:

– Configuration. Select this option to configure your test.

– Results. Select this option to observe test results associated with your

test.

– Error/Alarm. Select this option to insert errors or alarms as you test.

This is only available in the E1 BERT application.

– Action. Select this option to perform key actions required for your test,

such as starting or restarting a test, starting traffic or looping up a unit. You can also press the Action button at any time to view a menu of actions applicable to your test.

The E1 test application is launched.

28 SmartClass E1 Tester User’s Guide

Specifying test application settings

Before transmitting traffic over a link, you can specify interfaces and settings that filter received traffic for analysis.

Chapter 4 E1 Testing

Specifying test application settings

Specifying a test mode

The SmartClass E1 can operate in the following test modes:

– Terminate Mode: This mode separates the Transmit and Receive side of

an E1 path. The received E1 signal is terminated and a completely independent signal is transmitted.

Use this mode to test out of service lines using the RX1/TX1 port. You can generate and send test patterns on TX1 and receive patterns on RX1. RX2/Ext Clk is not used in this mode.

– Monitor Mode (PMP Monitor): This mode measures signal parameters

and monitors traffic at an E1 access point (the PMP – Protected Monitor Point). The PMP typically has a resistive loss of -26dB. The tester applies gain to the input signal to compensate for the reduced PMP amplitude. Both of the receivers are monitored simultaneously. However, the E1 tester does not transmit any traffic in this mode. This permits simultaneous non-intrusive monitoring of the E1 line.

– Bridge Mode (HI-Z Monitor): This mode allows you to bridge onto a

terminated E1 line with a high impedance (Hi-Z). This permits simultaneous non-intrusive monitoring on the E1 line. The transmitter on the E1 line is not used in this mode.

– Line Loopback: This mode loops the entire E1 circuit. This configuration

will loop the incoming data back out the transmitter yet still allow the receiver to monitor the incoming signal.

Table 7 lists the transmitter/receiver used in the test modes supported by the

SmartClass E1 tester:

Table 7 SmartClass E1 Tester Test Modes

Test Mode Rx1 Tx1 Rx2 Rx1 VF

Terminate X X X

Monitor X X X

Bridge X X X

Line Loopback X X X

To specify a test mode

1 If you haven’t already done so, launch an E1 application (see “Launching

an E1 test application” on page 28).

2 On the Configuration menu, select Test Mode, and then use the up or

down arrow to specify one of the following:

– Terminate

–Monitor

– Bridge

– Line Loopback

SmartClass E1 Tester User’s Guide 29

Chapter 4 E1 Testing

Specifying test application settings

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The test mode is specified.

Configuring test settings

automatically

You can use the Auto Configure feature to configure the interface, framing, and pattern settings automatically.

To configure the interface, framing, and pattern settings automatically

1 If you haven’t already done so, launch your test application (see

“Launching an E1 test application” on page 28).

2 Connect the E1Tester to the circuit.

3 On the test menu, select Action.

The Action menu appears.

4 On the Action menu, select Auto Configure.

The SmartClass E1 will attempt to automatically configure the interface, framing, and pattern. If this attempt fails, the E1 tester will set the framing to Unframed and the pattern to Live. You can also configure the framing and pattern settings manually. See “Specifying E1 framing settings” on

page 31 and “Specifying a BERT pattern” on page 33.

The interface, framing, and pattern settings are automatically configured. Proceed to configure the following settings for the test:

– VF settings, see “Specifying VF settings” on page 37.

– E1 signaling settings, see “Specifying E1 signaling (ABCD/Sa) settings” on

page 32.

– Defect and anomaly settings, see “Specifying Error/Alarm settings” on

page 35.

– Performance settings, see “Specifying performance settings” on page 36.

Specifying interface settings

Before you transmit E1 traffic, you can specify the characteristics of the interface you want to transmit the traffic on, such as the line coding for the signal you want to transmit, the transmit clock, and the slip reference for the receiver.

To specify interface settings

1 If you haven’t already done so, launch an E1 BERT application (see

“Launching an E1 test application” on page 28).

2 On the Configuration menu, select Interface Settings, and then specify

values for the following settings:

Setting Parameter

Line Coding Select one of the following line coding

options: – HDB3: High Density Bipolar 3 – AMI: Alternate mark inversion

30 SmartClass E1 Tester User’s Guide

Chapter 4 E1 Testing

Specifying test application settings

Setting Parameter

Tx Clock Select one of the following:

– Internal – Rx1 – Rx2 – Ext. BNC NOTE: If timing is lost, the SmartClass reverts

to internal timing.

Tx Clk Offset (ppm) Enter a value, from -100 through 100 ppm, to

indicate the offset frequency generated by the 2048 kbit/s internal clock.

To specify negative numbers, press the # key. To delete a single character, press the down

arrow key.

Slip Reference Select one of the following slip reference

options: – Rx2 – Ext. BNC

Specifying E1 framing

settings

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The interface settings are configured.

Before transmitting E1 traffic, you can specify the framing format and payload of the traffic you want to transmit.

To specify E1 framing settings

1 If you haven’t already done so, launch an E1 application (see “Launching

an E1 test application” on page 28).

2 On the Configuration menu, select E1 Frame Settings, and then specify

values for the settings listed below:

Setting Parameter

Framing Select the framing format for the signal:

– PCM31C – PCM31 – PCM30C – PCM30 – Unframed

Payload Select the payload:

– Bulk: full E1 circuit – nx64k: individual timeslot(s) from an E1

circuit

SmartClass E1 Tester User’s Guide 31

Chapter 4 E1 Testing

Specifying test application settings

Setting Parameter

Timeslots

nx64k payload only)

(

Idle Byte

nx64k payload only)

(

Do one of the following: – To turn all the available channels on,

press 1.

– To turn all the available channels off,

press 0.

– To turn on only the selected channels, use

the arrow keys to point at the channels you want to turn on, and then press the # key to select the channel. You can select multiple channels.

When you have finished selecting timeslots, press OK. At least one timeslot must be selected.

Specify the idle byte pattern you want to insert into the selected timeslots. For example, (MSB) 10101010 (LSB), the MSB is sent first.

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The framing settings are configured.

Specifying E1 signaling

(ABCD/Sa) settings

Before transmitting E1 traffic, you can specify settings for E1 signaling.

To specify E1 signaling settings

1 If you haven’t already done so, launch an E1 test application (see

“Launching an E1 test application” on page 28).

2 On the Configuration menu, select ABCD/Sa Settings, and then specify

values for the following settings:

Setting Parameters

Sa4 Set the 8-digit Sa4 bit sequence.

Sa5 Set the 8-digit Sa5 bit sequence.

Sa6 Set the 8-digit Sa6 bit sequence.

Sa7 Set the 8-digit Sa7 bit sequence.

Sa8 Set the 8-digit Sa8 bit sequence.

A Bit (Remote Alarm) Select whether the NFAS A Bit is On or Off.

Si Bit Select whether the Si Bit is ITU-T (default) or USER.

Signaling Bits (BERT) Set the 4-digit active signaling word.

Signaling Bits (Idle) Set the 4-digit idle signaling word.

NMFAS (XYXX) Set the 4-digit NMFAS word.

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The E1 signaling settings are configured.

32 SmartClass E1 Tester User’s Guide

Chapter 4 E1 Testing

Specifying test application settings

Specifying a BERT pattern

You can specify a BERT pattern for your test.

To specify a BERT pattern

1 If you haven’t already done so, launch an E1 test application (see

“Launching an E1 test application” on page 28).

2 On the Configuration menu, select BERT Pattern Settings, and then

select Pattern.

3 Select one of the following BERT patterns:

Pattern Description

63 (2^6-1) Selects the 2

erates a maximum of 5 sequential 0s and 6 sequential 1s.

511 (2^9-1) Selects the 2

erates a maximum of 8 sequential 0s and 9 sequential 1s.

2047 (2^11-1) Simulates live E1 data. A pseudorandom pattern

based on an 11-bit shift register. Selects the 2 Pseudorandom pattern, which generates a maximum of 10 sequential 0s and 11 sequential 1s.

2^15-1 ITU Selects the 2

erates a maximum of 14 sequential 0s and 15 sequential 1s. Simulates live data for 56 kbit/s to 2 Mbit/s circuits. This is the default pattern for E1.

2^15-1 INV ITU Selects the inverted 2

which generates a maximum of 14 sequential 1s and 15 sequential 0s.

-1 pseudorandom pattern, which gen-

-1 pseudorandom pattern,

-1

2^20-1 Selects the 220 -1 pseudorandom pattern, which gen-

erates a maximum of 19 sequential 0s and 20 sequential 1s.

2^20-1INV Selects the inverted 2

-1 pseudorandom pattern, which generates a maximum of 19 sequential 1s and 20 sequential 0s.

2^23-1 ITU Selects the 2

-1 pseudorandom pattern, which generates a maximum of 22 sequential 0s and 23 sequential 1s.

2^23-1 INV ITU Selects the inverted 2

-1 pseudorandom pattern, which generates a maximum of 22 sequential 1s and 23 sequential 0s.

Delay Used for measuring round trip delay. Delay pattern

measurement requires a transmitter/receiver loopback, with the transmit rate equal to the receive rate. This test measures round trip delay once per second (or until the previous delay measurement is complete) for the length of the test, provided pattern sync is present. Normal BER test results (such as bit errors and pattern sync) are not available during delay testing

QRSS Simulates live E1 data. E1 QRSS is a modified 2

pseudorandom pattern that allows a maximum of 15 sequential zeros and 20 sequential ones. 2

-1

-1 pseu-

dorandom pattern with 14-zero suppression.

SmartClass E1 Tester User’s Guide 33

Chapter 4 E1 Testing

Specifying test application settings

Pattern Description

All Ones Provides a fixed test pattern of all ones (AMI pulses).

It can be used as an AIS in unframed circuits, a keep alive signal, or an idle code. This pattern is required to accurately measure the E1 signal power in dBnom.

All Zeros Provides a fixed test pattern of all ones. The Line

Code should be set for HDB3 when sending the All Zeros pattern or the network will lose timing. This pattern can be transmitted framed or unframed.

QBF The Quick Brown Fox message (all uppercase: THE

QUICK BROWN FOX JUMPS OVER THE LAZY DOG 0123456789).

NOTE: For Datacom testing, this pattern is only available when testing in synchronous mode.

QBF1 The Quick Brown Fox message (see “QBF”) followed

by CR LF. NOTE: This pattern is only available for Datacom

testing and when testing in asynchronous mode. The QBF message is encoded according to the number of data bits you specified in the character format.

QBF2 The Quick Brown Fox message (see “QBF”) followed

by LF CR LF CR. NOTE: This pattern is only available for Datacom

testing and when testing in asynchronous mode. The QBF message is encoded according to the number of data bits you specified in the character format.

QBF3 The Quick Brown Fox message (see “QBF”) followed

by LF CR. NOTE: This pattern is only available for Datacom

testing and when testing in asynchronous mode. The QBF message is encoded according to the number of data bits you specified in the character format.

1:1 A one followed by a zero, the minimum stress on

clock recovery circuits.

1:3 A one followed by 3 zeros.

1:4 A one followed by 4 zeros.

1:7 A one followed by 7 zeroes. Stresses the minimum

ones density requirement for E1 circuits using AMI coding. This pattern is used to test timing clock recovery and can be transmitted framed and unframed.

Live Used in monitor mode to avoid false “errors” when

the monitored circuit contains live traffic rather than BERT patterns.

User Bit Pattern Selects a user-defined pattern from 3 to 32 bits long.

User Byte Pattern Selects a user-defined pattern from 1 to 64 bytes

long.

If you selected User Bit Pattern or User Byte Pattern, proceed to step 4. Otherwise, proceed to step 5.

34 SmartClass E1 Tester User’s Guide

Chapter 4 E1 Testing

Specifying test application settings

4 Do one of the following:

– If you selected User Bit Pattern, in the BERT Pattern Settings menu,

select User Bit Pattern, and then specify the bit pattern you want to use.

– If you selected User Byte Pattern, in the BERT Pattern Settings menu,

select User Byte Pattern, and then specify the byte pattern you want to use.

5 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The BERT pattern is specified.

Specifying Error/Alarm

settings

You can specify the error or alarm to be inserted into the traffic you are transmitting.This is only available in the E1 BERT application.

To specify defects or anomalies

1 If you haven’t already done so, launch the E1 BERT application (see

“Launching an E1 test application” on page 28).

2 On the Error/Alarm menu, select Error/Alarm Settings, and then do one

of the following:

– To specify defects or alarms, select Defects/Alarms, and then proceed

to step 3.

– To specify anomalies or errors, select Anomalies/Errors, and then

proceed to step 4.

3 On the Defects/Alarms menu, select one of the following defects or

alarms:

Defect/Alarm Description

LOS Loss of signal

LOF Loss of framing

AIS Alarm indication signal

RDI Remote defect indication

MF AIS Multi frame AIS

MF RDI Multi frame RDI

Proceed to step 5.

SmartClass E1 Tester User’s Guide 35

Chapter 4 E1 Testing

Specifying test application settings

4 On the Anomalies/Errors menu, select one of the following anomalies or

errors:

Anomalies/Errors Description/Additional Settings

TSE Test Sequence Errors (bit error).

If you selected TSE, on the Error/Alarm Settings menu, select TSE Rate Type, and then select one of the following:

Single.

Multiple. Select TSE Error Count, and then specify

the number of TSE error count (1~50).

Rate. Select TSE Error Rate, and then specify one of the following:

– 1e-2 – 1e-3 – 1e-4 – 1e-5 – 1e-6 – 1e-7

Specifying performance

settings

Pattern Slip One or more bits of the test pattern are deleted or

repeated

Code Error Violation of the selected encoding method

CRC Error Cyclical redundancy check error

FAS Errors Frame alignment signal error.

On the Error/Alarm Settings menu, select FAS Error Count, and then specify the number of FAS error count (1~4).

MFAS Error Multi frame alignment signal error.

On the Error/Alarm Settings menu, select MFAS Error Count, and then specify the number of MFAS error count (1~2).

E-bit Error Remote CRC errors

5 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The defect or anomaly settings are configured.

You can configure settings for ITU performance analysis. This is only available in the E1 BERT application.

To configure performance settings

1 If you haven’t already done so, launch an E1 BERT test application (see

“Launching an E1 test application” on page 28).

36 SmartClass E1 Tester User’s Guide

Chapter 4 E1 Testing

Specifying test application settings

2 On the Configuration menu, select Perf. Settings, and then specify values

for the settings listed below:

Setting Parameters

Perf. Spec Select the performance specification:

– G.821 – G.826 – M.2100

Path Allocation Enter a value, from 0.0% to 100%, to indicate the

percentage of the end-to-end target values that must be met for the test path to be acceptable. The end-to-end target values are based on the “Hypothetical Reference Configuration” (HRX) of length 27,500 km.

Specifying VF settings

UAS Limit Enable (G.826 and M.2100 only)

UAS Limit (G.826 and M.2100 only)

Select whether the Unavailable Seconds limit is Enabled (On) or not (Off).

If UAS Limit Enable is On, specify the number of

seconds, between 10 and 100000.

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The performance settings are configured.

You can specify the VF tone pattern as the signal you want to transmit, and the VF timeslot for the receiver. You can also turn the speaker on or off and adjust the speaker volume. This is only available in the E1 BERT application.

To specify VF settings

1 If you haven’t already done so, launch the E1 BERT test application (see

“Launching an E1 test application” on page 28).

2 On the Configuration menu, select VF Settings, and then specify values

for the following settings:

Setting Parameters

VF Timeslot Do the following:

a To select a timeslot, use the arrow

keys to point at the timeslot, and then press the # key.

b After you finish selecting the

timeslot, press OK to return to the VF Settings menu.

VF Tones Specify the VF tones pattern for the

signal you want to transmit.

Speaker State Specify whether the speaker is

turned on or off.

Volume Control Use the right or left arrow keys to

increase or decrease the speaker volume.

SmartClass E1 Tester User’s Guide 37

Chapter 4 E1 Testing

Monitoring a circuit

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The VF settings are configured.

The SmartClass E1 allows you to monitor both E1 receivers simultaneously. You can analyze full E1 and n x 64k circuits and examine transmission layer results, such as CRC and frame errors, or code errors for a single side of the traffic or in both directions.

The following procedure describes how to monitor a circuit.

NOTE:

The transmitter (Tx) is turned off in Monitor mode.

To monitor a circuit

1 Launch the BERT application. See “Launching an E1 test application” on

page 28.

2 Connect the E1 Tester to the test access point:

– Connect the 2M Reference Clock cable from the SmartClass E1 RX2/

Ext Clk jack to an E1 BITS clock or a known good reference signal.

– Connect a cable from the SmartClass E1 RX1/TX1 jack to the signal to

be tested.

3 To set the test configuration, do one of the following:

– On the test menu, select Action, and then select Auto Configure.

The unit will attempt to automatically configure the interface, framing, and pattern. Go to step 9.

– On the test menu, select Configuration, and then proceed with step 4.

4 On the Configuration menu, select Test Mode.

A list of test modes appears.

5 Select Monitor.

6 Configure the interface settings. See “Specifying interface settings” on

page 30.

7 Configure the Framing settings. If you selected the n x 64k payload, you

can select specific timeslots to monitor. See “Specifying E1 framing

settings” on page 31.

8 Specify a BERT pattern. See “Specifying a BERT pattern” on page 33.

NOTE:

If you select the All Zeros BERT pattern, the line coding should be set to HDB3. Using AMI is not recommended because the network will lose timing and signal. To change the line coding see “Line Coding” on page 30.

9 To monitor VF channel, configure the VF settings. See “Specifying VF

settings” on page 37.

10 To configure settings for ITU performance analysis, configure the perfor-

mance settings. See “Specifying performance settings” on page 36.

38 SmartClass E1 Tester User’s Guide

Measuring timing slips

Chapter 4 E1 Testing

Measuring timing slips

11 Restart the test.

12 To view other results, see “E1 Results” on page 78.

You have finished monitoring the circuit.

The SmartClass E1 allows you to monitor the timing between two E1 signals for timing slips. For example, you can check customer premises equipment against a master clock at the central office, or you can compare two lines of network equipment. The SmartClass measures the difference, in bits per second (bit/s), between the opposite receiver (Rx) or the external 2M Reference clock.

The following procedure describes how to measure timing slips.

To measure timing slips

1 Launch the E1 BERT application. See “Launching an E1 test application”

on page 28.

2 On the Configuration menu, select Test Mode.

A list of test modes appears.

3 Select Monitor.

4 Connect the E1 Tester to a reference signal and to the test signal:

– Connect the 2M Reference Clock cable from the E1 Tester’s RX2/

Ext Clk jack to an E1 BITS clock or a known good reference signal.

– Connect a cable from the E1 Tester RX1/TX1 jack to the signal to be

tested.

5 On the Configuration menu, select Interface Settings.

6 Select Slip Reference and then select the clock reference for timing slips.

See “Slip Reference” on page 31.

7 Restart the test.

This will clear all alarms and begin a new test.

8 On the test menu, select Results, and then select Signal Results.

The Signal Results window appears.

9 Check the timing slips result.

For a description of the result, see “Timing Slips” on page 80.

You have finished measuring timing slips.

SmartClass E1 Tester User’s Guide 39

Chapter 4 E1 Testing

Terminate testing

In Terminate mode, you can use the SmartClass E1 to perform bit error rate testing (BERT or BER testing) on E1 circuits, and timeslots within the E1 circuit. You can test for bit errors, code errors, frame errors, and CRC errors (if applicable).

In Terminate mode, it is assumed that there is either a far-end loopback or another test set terminating the far end. This allows you to qualify E1 circuit error performance by testing for bit errors, code errors, CRC errors, FAS errors, MFAS errors, and E-BIT errors (if applicable) on E1 lines.

The following procedure describes how to perform a BER test.

To perform a BER test

1 Launch the BERT application. See “Launching an E1 test application” on

page 28.

2 On the Configuration menu, select Test Mode.

A list of test modes appears.

3 Select Terminate.

4 If you are performing an end-to-end test, you can connect a test set at

each end, or you can connect a single test set at the near end and establish a physical loop on the far end device.

For this test, use only the RX/TX1 connector.

5 To configure the test, do one of the following:

– If you want the E1 Tester to configure the interface, framing, and

pattern settings automatically, on the test menu, select Action, and then select Auto Configure.

The unit will attempt to automatically configure the interface, framing, and pattern. If the Auto Configure succeeds, proceed to step 8.

If this attempt fails, the E1 Tester will continue it’s attempt to configure the framing settings, and the pattern will default to Live. You can also configure the setting manually by selecting Configuration, and then proceed with step 6.

– If you want to configure the interface, framing, and pattern settings

manually, on the test menu, select Configuration, and then proceed with step 6.

6 Configure the interface settings. See “Specifying interface settings” on

page 30.

7 Specify the following settings for the test:

–Framing, see “Specifying E1 framing settings” on page 31.

– Pattern, see “Specifying a BERT pattern” on page 33.

– Performance settings, see “Specifying performance settings” on

page 36.

8 Configure the E1 ABCD/Sa settings. See “Specifying E1 signaling (ABCD/

Sa) settings” on page 32.

9 Configure the defect or anomaly settings. See “Specifying Error/Alarm

settings” on page 35.

40 SmartClass E1 Tester User’s Guide

Chapter 4 E1 Testing

Line loopback testing

10 Restart the test.

This will clear all alarms/defects and begin a new test.

11 To insert defects or anomalies, press the Action key, and then select the

anomaly or defect. The selections depend on your selection on the Error Settings menu.

NOTE:

The SmartClass E1 Tester will first attempt to insert a clean code error (without a bit error). If, after a time-out period of 256 bits, this is not possible, the unit will insert a code plus a bit error (a line error). This timeout would occur if an unframed all zeros pattern is currently being transmitted.

12 If the circuit is physically looped back, check to see that the inserted errors

are received in the Summary test result category (For instructions on viewing results, see “E1 Results” on page 78). If you are performing an end-to-end test, verify that the SmartClass E1 units at each end of the circuit received the inserted errors.

BER testing is complete.

Line loopback testing

Line loopback testing allows you to loop the entire E1 circuit. This configuration will loop the incoming data back out the transmitter yet still allow the receiver to monitor the incoming signal. Line code errors will not be corrected, jitter will not be cleaned up, and the signal will be regenerated but data will not be inserted on the line. While in this mode, the E1 Tester will present minimal delay. You must use the RX1/TX1 port for Line Loopback testing.

The following procedure describes how to perform a line loopback test.

To perform a line loopback test

1 Launch the E1 BERT application. See “Launching an E1 test application”

on page 28.

2 On the test menu, select Configuration.

The Configuration menu appears.

3 On the Configuration menu, select Test Modes.

A list of test modes appears.

4 Select

Line Loopback.

5 Connect the E1 Tester to the test access point, using the RX/TX1

connector.

6 Restart the test.

This will clear all alarms and begin a new test.

7 To view results, see “E1 Results” on page 78.

Line loopback testing is complete.

SmartClass E1 Tester User’s Guide 41

Chapter 4 E1 Testing

Pulse shape analysis

You can use the Pulse Shape feature to measure the height, width, rise time, fall time, overshoot and undershoot, and signal level of an E1 pulse. The results are displayed as text or as a graph of the pulse shape. You can also measure the pulse for conformance to ITU G.703 specifications.

NOTE:

Pulse Shape is an optional feature. It only appears if you have purchased the pulse shape software option.

To perform pulse shape analysis

1 If you haven’t already done so, launch the E1 Pulse Shape test application

(see “Launching an E1 test application” on page 28).

2 From the E1 Pulse Shape menu, select Configuration.

The Configuration menu appears.

3 Connect the E1 Tester to the test access point, using the RX/TX1

connector.

4 To configure the test, do one of the following:

– If you want the E1 Tester tester to configure the interface, framing, and

pattern settings automatically, on the test menu, select Action, and then select Auto Configure.

The unit will attempt to automatically configure the interface, framing, and pattern. If the Auto Configure succeeds, proceed to step 7.

– If you want to configure the interface, framing, and pattern settings

manually, on the test menu, select Configuration, and then proceed with step 5.

5 Configure the interface settings. See “Specifying interface settings” on

page 30.

6 Configure the E1 framing settings. See “Specifying E1 framing settings” on

page 31.

7 Configure the E1 ABCD/Sa settings. See “Specifying E1 signaling (ABCD/

Sa) settings” on page 32.

8 From the E1 Pulse Shape menu, select Results and then select one of the

following:

– Summary displays a large “All Summary Results OK” message if no

anomalies or defects have been detected. If anomalies are detected, results are displayed.

– Pulse Shape displays a graphical representation of the pulse.

42 SmartClass E1 Tester User’s Guide

Chapter 4 E1 Testing

Measuring Jitter

9 To measure conformance to G.703 specifications, do the following:

Measuring Jitter

a Press the asterisk [

] key to go to the Action menu.

b Select View Mask.

The pulse should fall between the maximum and minimum mask.

c To hide the mask, press the asterisk [

] key to go to the Action menu,

and then select Hide Mask.

10 To restart the test, press the asterisk [

] key to go to the Action menu, and

then do one of the following:

– Restart Capture. This captures the pulse in the current configuration.

If the configuration is Capture Positive Pulses, it will capture a positive pulse; if the configuration is Capture Negative Pulses, it will capture negative pulses.

– Capture Positive Pulses

– Capture Negative Pulses

For more information about pulse shape results, see “Pulse shape results” on

page 86.

You have completed pulse shape analysis.

Configuring test settings

The jitter test is used to verify the integrity of circuits by qualifying the jitter characteristics. The jitter option allows you to measure jitter manually or using automatic sequences to measure Maximum Tolerable Jitter (MTJ), Fast MTJ, and the Jitter Transfer Function (JTF).

NOTE:

Jitter is an optional feature. It only appears if you have purchased the Jitter option. In addition, jitter requires newer hardware. To verify whether your hardware is jitter capable, see “Viewing the software and hardware

information” on page 18.

This test involves three basic steps:

– Configuring test settings

– Connecting to the circuit

– Running the test

Before running any tests, you should configure the E1 Tester with the appropriate settings for the line under test.

To configure test settings

1 From the E1 Measurement menu, launch the E1 Jitter application.

2 From the E1 Jitter menu, select Configuration.

The Configuration menu appears.

SmartClass E1 Tester User’s Guide 43

Chapter 4 E1 Testing

Measuring Jitter

3 Specify the test settings. The following table describes the settings.

Setting Parameter

Test Mode Select one of the following:

– Terminate

–Monitor

– Bridge (HI-Z)

AMS Jitter Mode Select one of the following:

– MTJ - maximum tolerable jitter – FMTJ - fast maximum tolerable jitter – JTF- jitter transfer function

AMS Jitter Settings Specify the following automated measure-

ment sequences (AMS) settings: – Settling Time - The amount of time a

DUT is allowed to settle and adjust to a change in the frequency or amplitude of a received signal. The E1 Tester resumes error measurement after the specified time elapses.

– Gate Time - Time duration for error mea-

surement. During this period the error source is accumulated if it is an error or recorded if it is an alarm. (not selectable if Jitter Mode is “JTF”.)

– Sensor Threshold - The number of

alarms or errors allowed by the MTJ/Fast MTJ sensor that will result in a pass status for a particular transmit amplitude and frequency point. (not selectable if Jitter Mode is “JTF”.)

– Sensor - The alarm or error source used

to determine the jitter tolerance at a particular transmit amplitude and frequency point. (not selectable if Jitter Mode is “JTF”.)

Manual Jitter Settings (only selectable if the Test Mode is “Terminate”.)

Interface Settings Specify the Tx Clock Source, TX Line Code,

Frame Settings Specify the Framing, Payload, Time Slots,

Pattern Settings Specify the pattern as described in “Specify-

Error/Alarm Settings Specify the settings as described in “Specify-

Performance Settings Specify the settings as described in “Specify-

Specify the following: – Modulation: On or Off – Jitter Tx Frequency – Jitter Tx Amplitude (UI) NOTE: Manual jitter is the default jitter mode.

It begins running when you enter the jitter application.

and Rx Line Code as described in “Specifying

interface settings” on page 30.

and Sa bits as described in “Specifying E1

framing settings” on page 31.

ing a BERT pattern” on page 33.

ing Error/Alarm settings” on page 35.

ing performance settings” on page 36.

44 SmartClass E1 Tester User’s Guide

(Hz)

Chapter 4 E1 Testing

Setting Parameter

Timed Test Settings Specify whether timed test is enabled and if

On, specify the duration.

The settings are configured.

Measuring Jitter

Connecting to the circuit

Running the test

After specifying test settings, connect the E1 Tester to the line under test at the test access point.

To connect to the line

1 Connect the E1 Tester to the test access point:

– Connect the 2M Reference Clock cable from the SmartClass E1 RX2/

Ext Clk jack to an E1 BITS clock or a known good reference signal.

– Connect a cable from the SmartClass E1 RX1/TX1 jack to the signal to

be tested.

After specifying test settings and connecting to the line, you can run the test and view the results.

To run the test

1 From the E1 Jitter menu, select Action, and then select one of the

following:

If using Jitter mode... select...

Manual Restart

MTJ MTJ Start

FMTJ FMTJ Start

JTF JTF Calibration Start

then after it completes, JTF Start

NOTE:

Manual jitter is the default jitter mode. It begins running when you enter the jitter application. Selecting an MTJ, FMTJ, or JTF start will close the manual jitter application, and selecting stop will restart manual jitter.

2 From the E1 Jitter menu, select Results and then select a result category.

For more information about Jitter results, see “MFC-R2 results” on

page 90.

You have completed the test.

SmartClass E1 Tester User’s Guide 45

Chapter 4 E1 Testing

Testing MFC-R2 Signaling

The SmartClass E1’s MFC-R2 signaling option allows testing of line signaling (supervisory signals) and inter-register signaling (call control signals).

This test involves three basic steps:

– Configuring test settings

– Connecting to the circuit

– Running the test

NOTE:

MFC-R2 Signaling is an optional feature. It only appears if you have purchased the MFC-R2 software option.

Configuring test settings

Before running any tests, you should configure the E1 Tester with the appropriate settings for the line under test.

To configure test settings

1 From the E1 Measurement menu, launch the E1 R2 application.

2 From the E1 R2 menu, select Configuration.

The Configuration menu appears.

3 Specify values for the Test Mode and Country, as described below:

Setting Parameter

Test Mode Select one of the following:

– Simulate

–Monitor

– Bridge (HI-Z)

Country Select one of the following:

–ITU-T – Mexico – Brazil – Brazil (San Paolo) –India – Philippines – China –User Defined

4 Select Interface, and then specify the values as described below:

Setting Parameter

Line Code Select one of the following line coding

options: – HDB3: High Density Bipolar 3 – AMI: Alternate mark inversion

46 SmartClass E1 Tester User’s Guide

Setting Parameter

Chapter 4 E1 Testing

Testing MFC-R2 Signaling

Clock Source (selectable only in Simulate test mode)

Framing Select one of the following:

MF Channel Select the MF channel or channels.

Idle Code (selectable only in Simulate test mode)

Select one of the following: – Internal – Rx1 – Rx2 – Ext. BNC NOTE: If timing is lost, the SmartClass reverts

to internal timing.

– PCM30C – PCM30

– To turn on the selected channels, use the

arrow keys to point at the channels/ timeslots you want to turn on, and then press the # key to select it.

– If in Monitor/Bridge mode, you can select

multiple channels.

– If in Simulate mode, select only one chan-

nel.

When you have finished selecting channels, press OK.

Enter an 8-bit binary string

5 From the Configuration menu, select Simulate Settings, and then specify

the values as described below:

Setting Parameter

Sequence Generation Select one of the following:

– Express – Advanced

Direction Select one of the following:

– Forward – Backward

DID Number (selectable only for Forward Direction and Express Sequence Generation)

ANI Number (selectable only for Forward Direction and Express Sequence Generation)

Category (selectable only for Forward Direction and Express Sequence Generation)

Enter the Direct Inward Dial (DID) number. This is the phone number to be called.

Enter the Automatic Number Identification (ANI) number. This is the caller's number, typically the E1Tester’s own number.

Select a category. This is the E1Tester’s own category, from II-1 to II-15.

Number of DIDs (selectable only for Backward Direction and Express Sequence Generation)

Specify the number of DIDs on the circuit.

SmartClass E1 Tester User’s Guide 47

Chapter 4 E1 Testing

Testing MFC-R2 Signaling

Setting Parameter

Number of ANIs (selectable only for Backward Direction and Express Sequence Generation)

Final Status (selectable only for Backward Direction and Express Sequence Generation)

Clear First Select which end should be cleared first:

User Defined Signalings (selectable only with Advanced Sequence Generation)

Delay Btwn. Signals Specify the time to wait (delay) between sig-

Pause Before Dial/Answer Specify whether to pause before dialing or

Specify the number of ANIs on the circuit.

Select the Final Status signal, between and B-1 and B-15.

–Home – Opposite End

Enter a signal between 1 and 30.

nals.

answering.

6 Select User Defined Settings, and then specify the values as described

below. These settings are only definable if the Country is set to “User Defined”.

Setting Parameter

ANI Calling Party Category Select a category. This is the E1Tester’s own

category, from II-1 to II-15.

ANI Category Select a category. This is the E1Tester’s own

category, from II-1 to II-15.

ANI Category Req. Tone Select a tone, from A1 to A15

ANI Request Type Select one of the following:

– Do not request ANI – After first DNIS Digit (default) – After second DNIS Digit – After complete DNIS

ANI Tone Request Select a tone, from A1 to A15

Answer Tone Select a tone, from A1 to A15

DNIS Tone Request Select a tone, from A1 to A15

CD Bits Specify the CD bits.

GroupB Rcv Busy Tone Select a timeslot between 0 and 15.

GroupB Rcv Idle Tone Select a timeslot between 0 and 15.

7 Optional. To save the test configuration, Save/Restore-View. For more

information on saving test configurations, see “Managing test configura-

tions” on page 24.

The settings are specified

48 SmartClass E1 Tester User’s Guide

Chapter 4 E1 Testing

Testing MFC-R2 Signaling

Connecting to the line

Running the test

After specifying test settings, connect the E1 Tester to the line under test at the test access point.

To connect to the line

1 If using Simulate mode, connect to the RX/TX1 connector.

If using Simulate mode, the backward end should be ready first.

This means that if the E1 Tester acts as the forward end, the opposite end should act as the backward end and run before the E1 Tester starts simulating.

If the E1 Tester acts as the backward end, after it starts simulating, the opposite end starts running.

2 If using any other mode, connect the network side to RX/TX1 connector

and then the customer side to the RX2 connector.

You are connected to the line.

After specifying test settings and connecting to the line, you can run the test and view the results.

To run the test

1 From the E1 R2 menu, select Action and then select Start Simulation.

2 From the E1 R2 menu, select Results and then select one of the following:

– Survey Display displays the forward and backward signaling bits

decoded to line state labels (for example, seize, clear forward, etc.).

– Call States displays call statistics for each channel.

– Line Display displays the current line signaling and/or register

signaling for each receive channel with its associated time stamp.

For more information about R2 results, see “MFC-R2 results” on page 90.

You have completed the test.

SmartClass E1 Tester User’s Guide 49

Chapter 4 E1 Testing

Testing MFC-R2 Signaling

50 SmartClass E1 Tester User’s Guide

Chapter5

Datacom Testing

This chapter provides information about using the E1/Datacom Tester for data communications testing. Topics discussed in this chapter include the following:

– “About data communications testing” on page 52

– “Launching the datacom application” on page 52

– “Specifying test settings” on page 53

– “Connecting the E1/Datacom Tester to the circuit” on page 61

– “BER Testing” on page 63

– “Monitoring a Datacom interface” on page 64

– “Frame Relay testing” on page 64

SmartClass E1 Tester User’s Guide 51

Chapter 5 Datacom Testing

About data communications testing

The SmartClass E1/Datacom Tester provides the tools you need to turn up and maintain data services. The Data Communications option offers the following features and capabilities:

– End-to-End Testing—Using the E1/Datacom Tester, you can analyze the

performance of an entire digital link in both directions, allowing you to isolate problems to a specific direction.

– BER testing—Using the E1/Datacom Tester, you can BER test a variety of

data communication interfaces to verify error free performance and transmission by transmitting ANSI, ITU, and user programmable test patterns.

– Asynchronous timing— You can set up the E1/Datacom Tester to use

asynchronous timing when testing the RS-232/V.24 standard.

– Synchronous timing—You can set up the E1/Datacom Tester to use

synchronous timing, and then specify a valid clock source for the interface.

– Flow control—You can set up the E1/Datacom Tester to use out of band

flow control by interpreting signals from selected leads on the E1/Datacom Tester and its link partner. You can also specify inband flow control by transmitting XON/XOFF characters.

– Round trip delay measurement—Using the E1/Datacom Tester, you can

transmit and loop back a Delay pattern, and then measure the time it takes to receive the pattern.

– Self Loop—Before you start testing, you can perform a self loop to validate

the unit and the selected test interface on the E1/Datacom Tester.

– User specified test intervals—You can set up the E1/Datacom Tester to run

a test continuously, or to run a test for a specific timed interval lasting up to seven days.

Launching the datacom application

The following procedure describes how to launch the datacom application.

To launch the datacom application

1 Power ON your tester by pressing and holding the key for a few

seconds.

The SmartClass E1/Datacom splash screen appears for a few seconds, and then the SmartClass E1/Datacom main menu appears.

2 Select Data Communication. The Data Communication menu appears.

3 Select DataCom BERT.

NOTE:

Datacom is a factory-installed option. It only appears if you have purchased the E1/Datacom configuration (see “Configurations” on page 3).

A message briefly appears stating that the unit is launching the test application.

52 SmartClass E1 Tester User’s Guide

Specifying test settings

Chapter 5 Datacom Testing

Specifying test settings

A test menu appears for the application, listing the following options:

– Configuration. Select this option to configure your test.

– Results. Select this option to observe test results associated with your

test.

– Error (*). Select this option to specify errors to insert or to begin

inserting errors.

– Action. Select this option to perform key actions required for your test,

such as starting or restarting a test, starting traffic or looping up a unit. You can also press the Action button at any time to view a menu of actions applicable to your test.

The datacom application is launched.

Before you begin testing with the SmartClass E1/Datacom Tester, you should specify the characteristics of the circuit that you will connect to the tester.

Specifying the test mode

You can operate the SmartClass E1/Datacom Tester in three different test modes: Monitor, DTE Emulation, or DCE Emulation. The following procedure describes how to set the test mode.

To specify the test mode

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select Test Mode, and then select one of the

following:

–DTE –

should configure the

– DCE – If the E1/Datacom Tester is establishing a link directly to a DTE you

should configure the

If your network is secured using an encrypting device (located in between the E1/Datacom Tester and the device on the far end), the encrypting device represents a DTE to a DCE, and a DCE to a DTE. Therefore, you should determine the emulation mode for the encrypting device, and then configure the E1/Datacom Tester to emulate the opposite type of device.

– Monitor – To non-intrusively monitor performance in both directions on

a circuit, select Monitor. A Y-cable is needed.

You have finished specifying the test mode.

If the E1/Datacom Tester is establishing a link directly to a DCE you

E1/Datacom Tester to emulate a DTE.

E1/Datacom Tester to emulate a DCE.

Specifying the interface

standard

The Datacom application supports the following interface standards: RS-232/ V.24, X.21, EIA-530, V.35, RS-449/V.36, Codirectional Timing, Contradirectional Timing, and Centralized Timing. The following procedure describes how to select an interface standard for the test.

To specify the interface standard

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

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Chapter 5 Datacom Testing

Specifying test settings

2 On the Configuration menu, select Interface, and then select one of the

following:

– RS-232/V.24

–X.21

–EIA-530

–V.35

– RS-449/V.36

– Codirectional Timing

– Contradirectional Timing

– Centralized Timing

3 Also determine what cables you will need to connect the E1/Datacom

Tester to the test circuit. See Table 5 on page 4.

You have finished specifying the interface standard.

Specifying timing parameters

Specifying the timing mode

Specifying transmit and receive

timing

The following sections describe how to configure the timing mode and the timing source for transmitted and received data.

If you are testing an RS-232 interface, you can configure the E1/Datacom Tester to use either synchronous or asynchronous timing.

To specify the timing mode

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select Timing Settings.

3 Select Timing Mode, and then select either Asynchronous or Synchro-

nous.

After you specify the timing mode, you should specify the transmit and receive timing.

You have completed specifying the timing mode.

The following procedure describes how to specify the clock source for received and transmitted data.

To specify the clock source for received and transmitted data

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select Timing Settings.

3 Select the appropriate transmit and receive options:

– Tx Timing (only available in DTE or DCE emulation modes)

– DTE Rx Timing (only available in DTE emulation or monitor mode)

– DCE Rx Timing (only available in DCE emulation or monitor mode)

A menu of timing options appears.

4 Select the appropriate timing.

You have finished specifying the clock source for transmit and receive timing.

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Chapter 5 Datacom Testing

Specifying test settings

Specifying polarity settings

The following procedure describes how to configure clock and data polarity settings.

To specify polarity settings

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select Polarity, and then specify values for

the following settings:

Setting Parameter

RxClock Polarity Specify the polarity for the Rx Clock:

– Normal. Uses the phasing specified by the inter-

face standard.

– Inverted. Uses the inverse of the phasing specified

by the interface standard.

TxClock Polarity Specify the polarity for the Tx Clock:

– Normal. Uses the phasing specified by the inter-

face standard.

– Inverted. Uses the inverse of the phasing specified

by the interface standard.

RxData Polarity Specify the polarity for the received data:

– Normal. Uses the phasing specified by the inter-

face standard.

– Inverted. Uses the inverse of the phasing specified

by the interface standard.

Specifying a BERT pattern

TxData Polarity Specify the polarity for the transmitted data:

– Normal. Uses the phasing specified by the inter-

face standard.

– Inverted. Uses the inverse of the phasing specified

by the interface standard.

You have finished specifying the polarity settings.

You can specify a specific BERT pattern for your test.

To specify a BERT pattern

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select BERT Pattern Settings, and then

choose a pattern:

Pattern Description

PRBS 63 Selects the 2

generates a maximum of 5 sequential 0s and 6 sequential 1s.

PRBS 511 Selects the 2

generates a maximum of 8 sequential 0s and 9 sequential 1s.

-1 pseudorandom pattern, which

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Chapter 5 Datacom Testing

Specifying test settings

Pattern Description

PRBS 2047 Simulates live E1 data. A pseudorandom pattern

based on an 11-bit shift register. Selects the 2

Pseudorandom pattern, which generates a maximum of 10 sequential 0s and 11 sequential 1s.

PRBS 2 15 ITU Selects the 215-1 pseudorandom pattern, which

generates a maximum of 14 sequential 0s and 15 sequential 1s. Simulates live data for 56 kbit/s to 2 Mbit/s circuits. This is the default pattern for E1.

PRBS 2 15 INV ITU Selects the inverted 2

-1 pseudorandom pattern, which generates a maximum of 14 sequential 1s and 15 sequential 0s.

PRBS 2 20 Selects the 2

-1 pseudorandom pattern, which generates a maximum of 19 sequential 0s and 20 sequential 1s.

PRBS 2 20 INV Selects the inverted 2

-1 pseudorandom pattern, which generates a maximum of 19 sequential 1s and 20 sequential 0s.

PRBS 2 23 ITU Selects the 223 -1 pseudorandom pattern, which

generates a maximum of 22 sequential 0s and 23 sequential 1s.

PRBS 2 23 INV ITU Selects the inverted 2

-1 pseudorandom pattern, which generates a maximum of 22 sequential 1s and 23 sequential 0s.

-1

PRBS DELAY Used for measuring round trip delay. Delay pattern

PRBS 2 20 QRSS Simulates live data. QRSS is a modified 2

dorandom pattern that allows a maximum of 15 sequential zeros and 20 sequential ones. 2

-1 pseu-

-1

pseudorandom pattern with 14-zero suppression.

LUP ALL ONES Provides a fixed test pattern of all ones (AMI

pulses). It can be used as an AIS in unframed circuits, a keep alive signal, or an idle code. This pattern is required to accurately measure the E1 signal power in dBnom.

LUP ALL ZEROS Provides a fixed test pattern of all ones. The Line

Code should be set for HDB3 when sending the All Zeros pattern or the network will lose timing. This pattern can be transmitted framed or unframed.

LUP QBF The Quick Brown Fox message.

LUP 1TO1 A one followed by a zero, the minimum stress on

clock recovery circuits.

LUP 1TO3 A one followed by 3 zeros.

LUP 1TO4 A one followed by 4 zeros.

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Chapter 5 Datacom Testing

Specifying test settings

Pattern Description

LUP 1TO7 A one followed by 7 zeroes. Stresses the minimum

ones density requirement for E1 circuits using AMI coding. This pattern is used to test timing clock recovery and can be transmitted framed and unframed.

BIT PROGRAMMABLE Selects a user-defined pattern from 3 to 32 bits long.

BYTE PROGRAMMABLE Selects a user-defined pattern from 1 to 64 bytes

long.

If you selected Bit Programmable or Byte Programmable, proceed to

step 3. Otherwise, proceed to step 4.

3 Do one of the following:

– If you selected Bit Programmable, specify the bit pattern you want to

use.

– If you selected Byte Programmable, specify the byte pattern you want

to use.

Specifying data parameters

Specifying the data rate

4 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

You have finished specifying the BERT pattern.

The following sections describe how to specify the data rate, enable/disable data loss detection, and specify the polarity for transmitted and received signal.

The following procedure describes how to specify the data rate.

To specify the data rate

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select Data Rate (bps).

3 Enter a value, in Hz, for the data rate (see Table 8 for a list of supported

data rates for each interface).

Table 8 Data rates by interface

Interface Synchronous Asynchronous

X.21 Balanced 50 Hz to 2.048 Hz

N/A

RS-232/V.24 Unbalanced 50 Hz to 128,000 Hz 50 Hz to 128,000 Hz

EIA-530 Balanced 50 Hz to 10 MHz N/A

V.35 Balanced 50 Hz to 2.048 Hz N/A

RS-449/V.36 Balanced 50 Hz to 10 MHz N/A

1. Can be up to 10 MHz, depending on the cable. See Table 5 on page 4 for more information.

You have finished specifying the data rate.

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Chapter 5 Datacom Testing

Specifying test settings

Enabling/disabling data loss

detection

Specifying the Rx input

Enabling (or disabling) data loss detection criteria affects Rx data loss counts and alarms. Enabling the criteria causes the E1/Datacom Tester to register data loss when no data transitions have occurred for 63 clock transitions in synchronous timing modes, or 10 seconds in asynchronous timing modes.

To enable or disable data loss detection

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select Data Loss Enable.

3 Select On to enable data loss detection or Off to disable.

You have finished specifying data loss detection.

The following procedure describes how to specify the Rx input.

To specify the Rx input

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select Rx Input.

3 Select the r

eceive input termination for the balanced Data interfaces.

Specifying the clock loss threshold

Specifying async settings

You have finished specifying the Rx input.

Clock loss threshold refers to the number of milliseconds, without transitions on the clock signal lead, needed for the E1/Datacom Tester to declare clock loss. The following procedure describes how to configure the clock loss threshold.

To specify the clock loss threshold

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select Clock Loss Thres (ms).

3 Enter a value for the clock loss threshold.

The default value is 50 ms.

You have finished specifying the clock loss threshold.

If you selected Asynchronous as the timing mode, you must specify the character format for the data.

To specify async settings

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

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Chapter 5 Datacom Testing

Specifying test settings

2 On the Configuration menu, select Async Settings, and then specify

values for the following settings:

Setting Parameter

Parity –None

– Even –Odd

Note: Selecting Odd or Even adds one bit to each character to accommodate the parity bit. For example, 7 data bits with even parity encoding generates 8 bit characters.

Data Bits – Data 5 for baudot encoding

– Data 6 for BCDIC encoding – Data 7 for ASCII encoding – Data 8 for EBCDIC encoding

Stop Bits –1

–1.5 –2

Specifying flow control

settings

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

You have finished specifying the async settings.

Determine whether the device you will connect the E1/Datacom Tester to uses flow control. If so, you can configure the E1/Datacom Tester for out-of-band flow control. If you are testing in asynchronous mode, you can also use in-band flow control. When you enable out-of-band flow control, you can specify whether data is transmitted based on specific signal lead conditions.

To specify flow control settings

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select Flow Ctrl Settings, and then specify

values for the following settings:

Setting Parameter

Oob Flow Control Select On to set out-of-band flow control; Off uses

in-band flow control.

DTR Out-of-band flow control based on the Data Terminal

Ready (DTR) signal.

DSR Out-of-band flow control based on the Data Signal

Ready (DSR) signal.

RTS/C Out-of-band flow control based on the Request To

Send (RTS) signal.

CTS/I Out-of-band flow control based on the Clear To Send

(CTS) signal.

RLSD Out-of-band flow control based on the Receiver Line

Signal Detect (DCD) signal.

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Chapter 5 Datacom Testing

Specifying test settings

Setting Parameter

In-band Flow Control If you are testing in asynchronous timing mode,

you can enable in-band flow control.

Select On to set in-band flow control; Off uses outof-band flow control.

In-band Xon Specify the in-band flow control Xon character.

Enter a value using a decimal format. The default value is 17.

In-band Xoff Specify the in-band flow control Xoff character.

Enter a value using a decimal format. The default value is 19.

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

You have finished specifying the flow control settings.

Specifying G.821

performance settings

Specifying error settings

The following procedure describes how to configure bit error insertion.

To specify the G.821 performance settings

1 If you haven’t already done so, launch the Data Communication applica-

tion (see “Launching the datacom application” on page 52).

2 On the Configuration menu, select G.821 Performance Settings, and

then specify the path allocation percentage.

Enter a value, from 0.1 to 100%, to indicate the percentage of the end-toend target values for ESR (Errored Seconds Ratio) and SESR (Severely Errored Seconds Ratio) that must be met for the test path to be acceptable. The end-to-end target values are based on the “Hypothetical Reference Configuration” (HRX) of length 27 500 km.

You have finished specifying the G.821 performance settings.

You can specify the number of bit errors to insert or the rate at which bit errors are inserted.

To specify error settings

1 From the BERT menu, select Error.

2 Select Error Settings.

3 Select Rate Type, and then indicate how errors will be inserted:

–Single

– Multiple

–Rate

4 If you selected Multiple, select Error Count and then enter the number of

errors to be inserted, between 1 and 50.

5 If you selected Rate, select Error Rate a

You have finished specifying the error settings.

60 SmartClass E1 Tester User’s Guide

nd then select the insertion rate.

Performing a self test

Chapter 5 Datacom Testing

Performing a self test

Before you begin testing, you should perform a self test on the E1/Datacom Tester to make sure it is operating properly on the selected interface standard. You can test the E1/Datacom Tester and the test cable.

To perform a self test on the E1/Datacom Tester

1 Configure a test.

2 On the test menu, select Action.

3 Select Self Loop, and then select one of the following options:

– Enable Internal Loop — This option connects the transmitter to the

receiver without involving amplifiers or cables. Skip to step 5.

– Enable Cable Test — This option tests the amplifiers along with one of

the emulation cables. When you select this option, the E1/Datacom Tester automatically sets the Rx Input setting to unterminated and the Tx Timing setting to Tx SYNTH. The maximum data rate supported for this option is 1 MHz.

Proceed to step 4.

4 If you selected Enable Cable Test, connect the cable's DCE connector to

the DTE connector.

5 After you have connected the emulation cables (if applicable), select

Restart from the Action menu.

6 On the test menu, select Results.

If an “All Results OK” message appears, the unit and interface are operating properly.

If errors appear in the Summary result category, there is a problem with the E1/Datacom Tester or the cables.

You have completed the self test.

Connecting the E1/Datacom Tester to the circuit

To connect the E1/Datacom Tester to the circuit, you must have the correct adaptor cable for the test operation and the interface standard you want to test. For a list of available cables, see Table 6 on page 7. For information on ordering cables, contact your local JDSU sales office.

NOTE:

All DTE and DCE emulation cables have yellow bands. All monitor cables have blue bands.

When you connect a cable to the E1/Datacom Tester and the Signal result screen is currently visible, the unit will display the cable type in the lower right corner of the screen.

The following sections describe how to connect the E1/Datacom Tester for monitor or DTE/DCE emulation tests.

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Chapter 5 Datacom Testing

Connecting the E1/Datacom Tester to the circuit

Connecting for X.21 testing

Connecting for RS-232/V.24

and EIA-530 testing

To connect the

1 Identify the correct cable for the test operation and interface standard:

– If the emulation mode is DTE or DCE Emulation, use one of the X.21

DTE/DCE Emulation cables (part number CB-44390 for up to

2.048 MHz or CB-44391 for up to 10 MHz).

– If the emulation mode is Monitor, use one of the X.21 Y-Monitor cables

(part number CB-44346 for up to 2.048 MHz or CB-44345 for up to 10 MHz)).

2 Connect one end of the adaptor cable to the E1/Datacom Tester’s

universal Datacom connector located on the top panel of the unit.

3 Connect the other end(s) of the adaptor cable to the test access point.

You have finished connecting the cables.

To connect for RS-232/V.24 or EIA-530 testing

1 Identify the correct cable for the test operation and interface standard:

– If the emulation mode is DTE or DCE Emulation, use the RS-232/EIA-

530 DTE/DCE Emulation cable (part number CB-44385).

– If the emulation mode is Monitor, use the RS-232/EIA-530 Y-Monitor

cable (part number CB-44348).

E1/Datacom Tester

to a X.21 circuit

Connecting for V.35 testing

Connecting for RS-449/V.36

testing

2 Connect one end of the adaptor cable to the E1/Datacom Tester’s

universal Datacom connector located on the top panel of the unit.

3 Connect the other end(s) of the adaptor cable to the test access point.

You have finished connecting the cables.

To connect for V.35 testing

1 Identify the correct cable for the test operation and interface standard:

– If the emulation mode is DTE or DCE Emulation, use the V.35 DTE/

DCE Emulation cable (part number CB-44389).

– If the emulation mode is Monitor, use the V.35 Y-Monitor cable (part

number CB-44341).

2 Connect one end of the adaptor cable to the E1/Datacom Tester’s

universal Datacom connector located on the top panel of the unit.

3 Connect the other end(s) of the adaptor cable to the test access point.

You have finished connecting the cables.

To connect for RS-449/V.36 testing

1 Identify the correct cable for the test operation and interface standard:

– If the emulation mode is DTE or DCE Emulation, use the V.36 DTE/

DCE Emulation cable (part number CB-44388).

– If the emulation mode is Monitor, use the V.36 Y-Monitor (part number

CB-44347).

2 Connect one end of the adaptor cable to the E1/Datacom Tester’s

universal Datacom connector located on the top panel of the unit.

62 SmartClass E1 Tester User’s Guide

BER Testing

Chapter 5 Datacom Testing

BER Testing

3 Connect the other end(s) of the adaptor cable to the test access point.

You have finished connecting the cables.

Performing a bit error rate test (BERT) involves configuring the test settings, including logic error insertion; connecting the E1/Datacom Tester to the a circuit; starting the test and inserting logic errors; and observing the results.

To do a bit error rate test

1 Set the test mode to DTE or DCE Emulation. See “Specifying the test

mode” on page 53.

2 Select a pattern. See “Specifying a BERT pattern” on page 55.

3 Specify the other settings on the Configuration menu, as needed.

See “Specifying the interface standard” on page 53.

See “Specifying timing parameters” on page 54.

See “Specifying polarity settings” on page 55.

See “Specifying data parameters” on page 57.

See “Specifying async settings” on page 58.

See “Specifying flow control settings” on page 59.

See “Specifying G.821 performance settings” on page 60

4 Specify how errors will be inserted. See “Specifying error settings” on

page 60.

5 If you want to run the test for a specific amount of time, configure the timed

test settings. See “Timed testing” on page 25.

6 If this is your first test of the day, perform a self test on the E1/Datacom

Tester. See “Performing a self test” on page 61.

7 Connect the E1/Datacom Tester to the circuit. See “Connecting the E1/

Datacom Tester to the circuit” on page 61.

8 From the Action menu, select Restart.

9 Verify that the Sync LED illuminates green.

10 To insert errors, press the * Action key to view the Error menu, and then

select press 1.

This will do one of the following:

– Enable or Disable Bit Error Rate Insertion — begin inserting bit

errors at the rate specified on the Error Settings menu (appears only if the Rate Type is set to “Rate”).

– Bit Error Multi Insert — inserts multiple bit errors with each press

(appears only if the Rate Type is set to “Multiple”).

– Bit Error Insert — inserts one bit error with each press (appears only if

the Rate Type is set to “Single”).

11 From the BERT menu, select Results and then the BERT category.

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Chapter 5 Datacom Testing

Monitoring a Datacom interface

12 To check other result categories, press Cancel to return to the BERT

You have finished the test.

Monitoring a Datacom interface

In monitor mode you can use the E1/Datacom Tester to non-intrusively monitor traffic in both directions on a specified interface standard.

1 From the BERT menu, select Configuration.

2 Set the test mode to Monitor. See “Specifying the test mode” on page 53.

3 Specify the other settings on the Configuration menu, as needed.

menu, and then select a result category.

See “Specifying the interface standard” on page 53.

See “Specifying timing parameters” on page 54.

See “Specifying polarity settings” on page 55.

See “Specifying data parameters” on page 57.

See “Specifying async settings” on page 58.

See “Specifying flow control settings” on page 59.

See “Specifying G.821 performance settings” on page 60

Frame Relay testing

4 Connect the E1/Datacom Tester to the circuit. See “Connecting the E1/

Datacom Tester to the circuit” on page 61.

5 Press Cancel to return to the BERT menu, and then select Restart.

6 Verify that the Sync LED illuminates green.

7 From the BERT menu, select Results soft key, and then select BERT.

8 To check other result categories, press Cancel to return to the BERT

menu, and then select a result category.

You have finished the test.

After the physical interface has been verified, you can use the E1/Datacom Tester’s Frame Relay option to monitor frame relay traffic, and to transmit and receive frame relay frames to commission and maintain frame relay services.

With the Frame Relay testing feature, results such as LMI message stats, error results, DCLI status, and link trace results are available.

Launching the Frame Relay

The following procedure describes how to launch the datacom application.

application

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Chapter 5 Datacom Testing

Frame Relay testing

To launch the Frame Relay application

– From the Data Communication menu, select Datacom Frame Relay.

NOTE:

Frame Relay is an optional feature. It only appears if you have purchased the frame relay option with the SmartClass E1/Datacom configuration, and is only available over the Datacom interface.

A message briefly appears stating that the unit is launching the test application.

A test menu appears for the application, including the following options: Configuration, Results, and Action.

Configuring the test mode

Specifying datacom settings

The following procedure describes how to set the test mode.

To specify the test mode

1 From the Frame Relay menu, select Configuration.

2 Select Test Mode, and then select a mode for the test operation: DTE

Emulation, DCE Emulation, or Monitor.

3 To return to the Frame Relay menu, press the Cancel key.

You have specified the test mode.

Before you transmit traffic, you can specify the characteristics of the datacom circuit you want to transmit the traffic on, such as the interface standard, timing mode, and data rate.

To specify datacom settings

1 If you haven’t already done so, launch the Frame Relay application (see

“Launching the Frame Relay application” on page 64).

2 On the Configuration menu, select Datacom Settings, and then specify

values for the following settings:

Setting Parameter

Standard The

E1/Datacom Tester allows you to test the fol-

lowing interface standards:

– RS-232/V.24 –X.21 –EIA-530 –V.35

– RS-449/V.36 – Codirectional Timing – Contradirectional Timing – Centralized Timing Also determine what cables you will need to connect

the E1/Datacom Tester to the test circuit. See

Table 5 on page 4

Timing Mode

Set to synchronous timing.

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Chapter 5 Datacom Testing

Frame Relay testing

Setting Parameter

Data Rate Determine the data rate of the device you will be

connecting to, between 50 and 10,000,000Hz. In asynchronous mode, you must configure the

Datacom Tester

DTE Rx Timing The receive timing for data applications.

DCE Rx Timing The receive timing for data applications.

Tx Timing The transmit timing for the data applications.

Rx Input Receive input termination settings, in Ohms, for the

balanced Data interfaces.

Clk Loss Thres. The number of milliseconds, between 0 and 1000,

without transitions on the clock signal lead needed to declare clock loss.

Data Loss Enable Enabling (or disabling) data loss detection criteria

affects Rx data loss counts and alarms. Enabling the criteria causes the data loss when no data transitions have occurred for 63 clock transitions in synchronous timing modes.

to use the same rate.

E1/Datacom Tester to register

E1/

Configuring the frame load

settings

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The datacom settings are specified.

You can configure frame characteristics such as the traffic load type and rate, frame length, and payload data. The following procedure describes how to specify these characteristics.

To configure frame load settings

1 If you haven’t already done so, launch the Frame Relay application (see

“Launching the Frame Relay application” on page 64).

2 On the Configuration menu, select FR Load Settings, and then specify

the following settings:

Setting Parameters

Load Type Select a traffic load type:

– None: No traffic load is generated. – Fixed: Causes the E1/Datacom Tester to transmit

frames constantly at a specified rate.

– Burst: Causes the

a burst of traffic followed by a specified period of no frame transmissions (burst idle time).

– Ping: Causes the

one ping per second.

E1/Datacom Tester to transmit

Load Rate (Fixed loads only)

Enter a value, from 1 to 10000 kbps, for the data load rate.

Note: It is possible to enter a load rate that exceeds the data rate for the interface.

66 SmartClass E1 Tester User’s Guide

Setting Parameters

Chapter 5 Datacom Testing

Frame Relay testing

Burst Tx Time (Burst loads only)

Burst Idle Time (Burst loads only)

Min Frm.Len Tx (Fixed and Burst

loads only)

Max Frm.Len Tx (Fixed and Burst

loads only)

Payload (Fixed and Burst

loads only)

Time, ranging from 0.1 to 99.9 seconds, during which

E1/Datacom Tester transmits a burst of traffic

the between idle time.

Note: To type a decimal point, use the asterisk (*) key

E1/Datacom Tester keypad.

on the

Time, ranging from 0.1 to 99.9 seconds, during which the E1/Datacom Tester is idle and does not transmit traffic between bursts.

Enter a value, from 5 to 9999 bytes, for the minimum frame length to be transmitted.

Note: Assigning the same value to the Min Frame Len Tx and Max Frame Len Tx will cause a fixed-length frame to be transmitted.

Enter a value, from 5 to 9999 bytes, for the maximum frame length to be transmitted.

Select the type of payload: – Seq Test: Transmits a sequential count from 0 to

65,535. The remainder of the data is a fixed pattern. Generated frames that are not of a length sufficient to conform to RFC 2427 will not have a TTC Test Frame Header. The received TTC test frames sequence numbers to check for lost frames.

– User 1 Data: Transmits a user-defined hexidecimal

payload from 1 to 64 bytes long.

– User 2 Data: Transmits a user-defined hexidecimal

payload from 1 to 64 bytes long.

– Seq + User 1: Transmits the sequential count (0 to

65,535), and then the user-defined hexidecimal payload.

Note: If you select the User 1 Data, User 2 Data, or Seq + User 1 payload, be certain to define the data.

E1/Datacom Tester analyzes

User 1 Data (User 1 Data or

Seq + User 1 payloads only)

User 2 Data (User 2 Data payload only)

Src.IP Address (Ping loads only)

Inverse ARP (Ping loads only)

Enter a hexidecimal value from 1 to 64 bytes long.

Enter the IP address of the device the echo reply packets will be transmitted to.

NOTE: The E1/Datacom Tester only receives echo messages if the source address of the incoming echo message matches the destination address configured on the E1/Datacom Tester.

Select one of the following: – On. If you want the HST to use Inverse ARP to

determine the IP address of the equipment at the other end of the Frame Relay link, select On.

– Off. If you specified a destination address for the

device you are pinging, select Off. Off is the default.

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Chapter 5 Datacom Testing

Frame Relay testing

Setting Parameters

Configuring the frame header

settings

Dest IP Address (Ping loads only)

Ping Length Enter a value, from 34 to 2000 octets, to indicate the

Encapsulation Select the type of encapsulation for the packets:

Enter the IP address of the device the echo request packets will be transmitted to.

length of the packets.

–NLPID –ETHER

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The frame load settings are configured.

You can specify characteristics for the frame header such as transmit (Terminate mode only) and receive DLCIs, and whether the transmit control bits (DE, FECN, BECN, and C/R) are active.

To specify frame header settings

1 If you haven’t already done so, launch the Frame Relay application (see

“Launching the Frame Relay application” on page 64).

2 On the Configuration menu, select FR Header Settings, and then specify

the following settings:

Setting Parameters

DLCI Tx Enter a value, from 0 to 1023, for the transmitted data

link connection identifier (DLCI).

DE Bit Tx Enter one of the following values for the discard eligibil-

ity indicator: – 1: Indicates the field is checked. – 0: Indicates the field is blank.

FECN Bit Tx Enter one of the following values for the forward explicit

congestion notification bit: – 1: Indicates the field is checked. – 0: Indicates the field is blank.

BECN Bit Tx Enter one of the following values for the backward

explicit congestion notification: – 1: Indicates the field is checked. – 0: Indicates the field is blank.

C/R Bit Tx Enter one of the following values for the command/

response field bit: – 1: Indicates the field is checked. – 0: Indicates the field is blank.

DLCI Rx Enter a value, from 0 to 1023, for the received data link

connection identifier (DLCI). The will display test results for the traffic on this DLCI in the DLCI result category; results for the entire link appear in the Link result category.

E1/Datacom Tester

68 SmartClass E1 Tester User’s Guide

Setting Parameters

Chapter 5 Datacom Testing

Frame Relay testing

Configuring the LMI Settings

Lng Frm Rx Thresh

Enter a value, from 5 to 9999 bytes, to indicate the long frame receive threshold.

E1/Datacom Tester will maintain a count of

The received frames that exceed the specified threshold.

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The frame header settings are configured.

Local Management Interface (LMI) is a signaling mechanism often used on frame relay networks to communicate information about the status of a network connection. With the Frame Relay testing option, the E1/Datacom Tester can monitor and emulate LMI signals on UNI-user, UNI-network, and NNI interfaces for the following LMI types:

– Annex D (ANSI T1.617)

– Annex A (ITU-T Q.933)

– LMI Rev 1

The E1/Datacom Tester can capture LMI messages, decode them, and then display them in the Trace result category. Other LMI link results include the LMI type, message count, errors, and timeouts. For more information about LMI results, see “LMI results” on page 100.

To specify LMI settings

1 If you haven’t already done so, launch the Frame Relay application (see

“Launching the Frame Relay application” on page 64).

2 On the Configuration menu, select FR LMI Settings, and then specify the

following settings:

Setting Parameters

Type Select the type of local management interface (LMI):

– Off – T1.617 Annex D – Q.933 Annex A – LMI Rev 1 – Auto

Status Poll Time Enter a value, from 5 to 30, to indicate the status poll

time in seconds.

Full Poll Time Enter a value (n), from 1 to 255, to indicate that the

Datacom Tester

every nth poll cycle. For example, if you enter 4, the

should perform a full status poll time

E1/

E1/Datacom Tester will perform a full status poll

every 4th time.

Interface Select one of the following interfaces:

– UNI-U (user) – UNI-N (network)

– NNI

SmartClass E1 Tester User’s Guide 69

Chapter 5 Datacom Testing

Frame Relay testing

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The frame relay LMI settings are configured.

Configuring the trace

settings

You can use the E1/Datacom Tester to capture and decode LMI messages. Captured messages can be displayed as link trace results in text, hexidecimal, or text and hexidecimal format. The following procedure describes how to set the trace settings.

To specify trace settings

1 If you haven’t already done so, launch the Frame Relay application (see

“Launching the Frame Relay application” on page 64).

2 On the Configuration menu, select FR Trace Settings, and then specify

the following settings:

Setting Parameters

Decode Level Select one of the following decode levels:

– Simple: Displays basic decode information for

each trace message.

– Verbose: Displays detailed decode information for

each trace message.

Display Type Select how trace messages will be displayed:

– Text: Displays the trace messages as text. – Hex: Displays the trace messages in a hexidecimal

format.

– Text & Hex: Displays the trace messages in both

text and hexidecimal formats.

Specifying flow control

settings

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The trace settings are configured.

Determine whether the device you will connect the E1/Datacom Tester to uses flow control. If so, you can configure the E1/Datacom Tester for out-of-band flow control.

To specify flow control settings

1 If you haven’t already done so, launch the Frame Relay application (see

“Launching the Frame Relay application” on page 64).

2 On the Configuration menu, select Flow Control Settings.

3 Select OOB Flow Ctrl, and then select On to enable out of band flow

control, if necessary.

4 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

The flow control settings are specified.

70 SmartClass E1 Tester User’s Guide

Chapter 5 Datacom Testing

Frame Relay testing

Specifying polarity settings

The following procedure describes how to configure clock and data polarity settings.

To specify polarity settings

1 If you haven’t already done so, launch the Frame Relay application (see

“Launching the Frame Relay application” on page 64).

2 On the Configuration menu, select Data/Clock Polarity Settings, and

then specify Normal (uses the phasing specified by the interface standard) or Inverted (uses the inverse of the phasing specified by the interface standard) for the following settings:

Setting Parameter

TxClock Polarity Specify the polarity for the Tx Clock

RxClock Polarity Specify the polarity for the Rx Clock

TxData Polarity Specify the polarity for the transmitted data

RxData Polarity Specify the polarity for the received data

3 If you need to specify other settings for the test, press Cancel to return to

the Configuration menu.

You have specified the polarity settings.

Monitoring traffic on

Datacom interfaces

The E1/Datacom Tester can monitor frame relay traffic on Datacom interfaces.

To monitor traffic on a Datacom interface

1 If you haven’t already done so, launch the Frame Relay application (see

“Launching the Frame Relay application” on page 64).

2 On the Configuration menu, select Datacom Settings, and then specify

the settings.

3 Specify the frame header settings:

a On the Configuration menu, select FR Header Settings.

b Select DLCI Rx, and then enter a value, from 0 to 1023, for the

received data link connection identifier (DLCI).

The E1/Datacom Tester will display test results for the traffic on this DLCI in the DLCI result category; results for the entire link appear in the Link result category.

c Select Lng Frm Thresh, and then enter a value, from 5 to 9999 bytes,

to indicate the threshold for long frames on the receiver.

The E1/Datacom Tester will maintain a count of received frames that exceed the specified threshold.

4 Specify the local management interface settings. See “Configuring the LMI

Settings” on page 69.

5 Specify how link trace results should be displayed. See “Configuring the

trace settings” on page 70.

6 Specify the polarity settings. See “Specifying polarity settings” on page 55.

7 After you finish configuring the test settings, press Cancel to return to the

Test menu.

SmartClass E1 Tester User’s Guide 71

Chapter 5 Datacom Testing

Frame Relay testing

8 Connect the E1/Datacom Tester to the circuit. For more information, see

“Connecting the E1/Datacom Tester to the circuit” on page 61.

9 On the Test menu, select Restart to begin the test.

You are monitoring frame relay traffic on a datacom interface.

Transmitting traffic over a

Datacom interface

The E1/Datacom Tester can also transmit frame relay traffic over a Datacom interface.

To transmit frame relay traffic over a Datacom interface

1 f you haven’t already done so, launch the Frame Relay application (see

“Launching the Frame Relay application” on page 64).

2 On the Configuration menu, select Data Comm., and then specify the

settings.

3 Specify the frame load settings. See “Configuring the frame load settings”

on page 66.

4 Specify the frame header settings. See “Configuring the frame header

settings” on page 68.

5 Specify the local management interface settings. See “Configuring the LMI

Settings” on page 69.

6 Specify how link trace results should be displayed. See “Configuring the

trace settings” on page 70.

7 Configure flow control settings. See “Specifying flow control settings” on

page 70.

8 After you finish configuring the test settings, press Cancel to return to the

Test menu.

9 Connect the E1/Datacom Tester to the circuit. For more information, see

“Connecting the E1/Datacom Tester to the circuit” on page 61.

10 On the Test menu, select Restart soft key to begin the test.

The E1/Datacom Tester transmits frame relay traffic over the Datacom interface.

72 SmartClass E1 Tester User’s Guide

Chapter6

VT100 Terminal Emulation

This chapter contains information about using the E1/Datacom Tester to emulate a VT100 terminal. Topics discussed in this chapter include the following:

– “About VT100” on page 74

– “VT100 cabling” on page 74

– “Emulating a VT100 terminal” on page 74

SmartClass E1 Tester User’s Guide 73

Chapter 6 VT100 Terminal Emulation

About VT100

The optional VT100 feature lets you use the E1/Datacom Tester to emulate a VT100 terminal, allowing local access to network elements. During a VT100 session, you can retrieve circuit and service performance information, such as loss, margin, synchronization, performance (such as SES, ES, and UAS), and alarm information from network elements such as HTU-R, HTU-C, HRE, and SmartJack (NIU). Data from the network element appears on the E1/Datacom Tester’s screen. You can save this information to an ASCII file, print it, or export it. During a VT100 session, you can also configure and provision the accessed network element from the E1/Datacom Tester.

For information about emulating a VT100 session using the E1/Datacom Tester, see “Emulating a VT100 terminal” on page 74.

NOTE:

For more information about the VT100 option and E1/Datacom Tester training, contact your JDSU sales representative.

VT100 cabling

Emulating a VT100 terminal

The optional VT100 emulation feature allows you to attach the E1/Datacom Tester to a network element.

To connect, you need the following:

– DB-9 RS-232 cable.

– DB-9 male to male null modem adapter for connecting to network

elements

To ensure an uninterrupted supply of power during the session, attach the standard AC Adapter or optional Cigarette Lighter Adapter.

The following procedure describes how to run a VT100 session on the E1/ Datacom Tester.

To emulate a VT100 terminal

1 If the E1/Datacom Tester is off, press the green power button to power on

the E1/Datacom Tester.

It may take several seconds for the E1/Datacom Tester to fully power on. When a menu appears, you can begin using the E1/Datacom Tester.

2 Connect the E1/Datacom Tester to the network element:

a Connect one end of the DB-9 cable to the E1/Datacom Tester’s RS-232

connector located on the left panel.

b If necessary, connect the other end of the cable to the null modem

adapter (DB-9 male to male).

c Connect the cable to a network element.

74 SmartClass E1 Tester User’s Guide

Chapter 6 VT100 Terminal Emulation

Emulating a VT100 terminal

3 Verify that VT100 is selected for the RS232 DB9 port, if needed. See

“Specifying DB9 port usage” on page 21.

4 From the main menu, select VT100.

The VT100 menu appears.

The main menu displays help for using the menus: Press and hold the *Action key and then press the appropriate key to view a menu.

5 Press and hold the *Action key and then press the 4 key to view the

Settings menu. Specify the following settings.

Parameter Option

Serial Speed Select a baud rate:

– 1200 – 2400 – 9600 – 19200 – 38400 (default) – 57600 – 115200

Data Bits Select a data bit setting:

–7

– 8 (default)

Flow Control Specify the flow control:

– Xon/Xoff

– None (default)

Stop Bits Select a stop bits setting:

– 1 (default)

–2

Parity Select the parity:

– None (default)

–Odd –Even

6 Press and hold the *Action key and then press the 5 key to view the File

menu and then select Connect.

7 If the VT100 session does not start after a few seconds, view the File

menu and then select 10 Spaces.

A VT100 session screen appears. The menu for the network element appears after a few seconds.

8 To view different parts of the screen, use the arrow keys.

SmartClass E1 Tester User’s Guide 75

Chapter 6 VT100 Terminal Emulation

Emulating a VT100 terminal

9 To send commands using the E1/Datacom Tester keypad, press and hold

the *Action key and then select

Spcl Keys (the 7 key) or Keypad (the 2

key).

Menu item Function

Spcl Keys To send commands, such as backspace, delete, tab, and

return, select Spcl Keys. A list of special key functions appears, including an option for function keys (F-keys).

To send commands, such as home, end, break, insert, and page up/page down, select Spcl Keys, then select Operator, and then select a command.

Keypad:ABC Keypad:abc Keypad:123

Keys 0 through 9, *, and #

Changes the behavior of repeated key presses: alphanumeric (ABC or abc) or numeric (123).

Press a key on the keypad to send a character. Press the key several times to view all the characters you can send with that key. The characters appear in the upper right corner of the

For example, the 1 key lets you send the following characters: #, space, _, &, $, %, <, >, +, and -.

E1/Datacom Tester display.

10 If you want to transmit a single space, or multiple space characters, view

the File menu and then select the number of spaces.

11 Optional. To save on-screen information to a file, do the following:

a Press and hold the *Action key and then press the 5 key to view the

File menu.

b Select Capture.

c Enter a file name, and then press the OK key.

You can view the saved file using the File Manager.

12 To exit, press and hold the *Action key, press the 5 key to view the File

menu, and then select Exit.

76 SmartClass E1 Tester User’s Guide

Chapter7

Test Results

This chapter describes the test result categories and the results within each category that are available when performing E1 tests. Topics discussed in this chapter include the following:

– “E1 Results” on page 78

– “Pulse shape results” on page 86

– “Jitter results” on page 88

– “MFC-R2 results” on page 90

– “Datacom results” on page 90

– “Frame relay results” on page 94

– “Saving results” on page 101

– “Viewing saved results” on page 101

SmartClass E1 Tester User’s Guide 77

Chapter 7 Test Results

E1 Results

E1 Summary results

The E1 Summary result category displays a large “All Summary Results OK” message if no anomalies or defects have been detected. If anomalies are detected, results are displayed.

Error results, key results that are out-of-specification, or key informational results are displayed. This allows quick access to the results without having to search each category.

Table 9 describes the results that appear in the E1 Summary category.

Table 9 E1 Summary results

Result Definition

LOS Seconds Total number of test seconds in which loss of signal was

detected.

TSE Number of Test Sequence Errors (bit errors).

Code Errors Number of detected violations of the selected encoding

method.

LOF Seconds Seconds in which loss of framing occurred.

AIS Seconds Number of test seconds during which the AIS condition

has been detected.

RDI Seconds Number of test seconds during which the RDI condition

has been detected.

MF-AIS Seconds Seconds in which Multiframe AIS was detected.

MF-RDI Seconds Number of test seconds during which the MF-RDI condi-

tion has been detected.

FAS Word Errors Number of errored FAS words received since initial frame

sync

MFAS Word Errors Number of errored MFAS words received since initial

frame sync.

CRC Errors Number of CRC errors detected.

E-bit Errors Number of remote CRC errors.

Block Errors Number of blocks containing one or more errored bits.

Pattern Slips Number of pattern slips detected since start of test.

Pattern Sync Losses Number of times synchronization is lost after pattern sync.

Rx Freq Max Dev Receive Frequency Maximum Deviation. This result

appears when the deviation from the nominal E1 frequency of 2048 kBps is greater than 50 ppm.

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Chapter 7 Test Results

E1 Results

Statistics results

Results in the Statistics results category are designated as “History” or real time (current). Restarting the test will clear the History Statistics results.

Table 10 describes the Statistics results.

Table 10 Statistics results

Result Description

LOS Loss of Signal

LOS History Loss of Signal since the last test restart

LOF Loss of Framing detected

LOF History Loss of Framing detected since the last test restart

LSS Loss of Sequence Synchronization

LSS History Loss of Sequence Synchronization since the last test restart

FAS Sync Frame Alignment Signal synchronized

FAS Sync History Frame Alignment Signal synchronized since the last test

restart

MFAS Sync Multiframe Alignment Signal synchronized

MFAS Sync History

Multiframe Alignment Signal synchronized since the last test restart

Signal results

CRC Sync Cyclic Redundancy Check synchronized

CRC Sync History Cyclic Redundancy Check synchronized since the last test

restart

AIS Alarm Indication Signal detected

AIS History Alarm Indication Signal detected since the last test restart

RDI Remote Defect Indicator detected

RDI History Remote Defect Indicator detected since the last test restart

MF AIS Multiframe AIS detected

MF AIS History Multiframe AIS detected since the last test restart

MF RDI Multiframe RDI detected

MF RDI History Multiframe RDI detected since the last test restart

The Signal category shows signal level, frequency, and loss seconds results. Results in this category accumulate after test restart. Table 11 describes the results that appear in the Signal category.

Table 11 Signal test results

Result Description

LOS Alarms Number of Loss of Signal alarms

LOS Seconds Number of seconds in which LOS was detected

Rx Frequency Frequency of the clock recovered from the received E1

circuit

Rx Freq Dev PPM Current received frequency deviation, ± 200 ppm

Rx Freq Max Dev Maximum received frequency deviation, ± 200 ppm

SmartClass E1 Tester User’s Guide 79

Chapter 7 Test Results

E1 Results

Table 11 Signal test results (Continued)

Result Description

Ref Clk Frequency Frequency of the reference clock

Rx Level Vpp Current receive level, in volts peak-to-peak

Rx Level dBnom Current receive level, in dB nominal

Code Errors Number of detected violations of the selected encoding

method.

Code Error Rate Ratio of code errors received to the total number of bits

received

Timing Slips Number of bit slips (±) counted when the E1 test signal slips

from the E1 reference signal after both signals are present simultaneously. Counts from 0 to + or - 255, and then rolls over to 0. Resets to 0 if signal present is lost on the analyzed E1 circuit or on the reference E1 circuit. A positive results indicates that the analyzed E1 circuit is faster than the reference E1 circuit.

Frame Slips Number of frame slips (absolute value) counted when the

E1 test signal slips from the E1 reference signal after both signals are present simultaneously.

Interface results

The Interface category lists results related to the physical interface. Table 12 describes the results that appear in the Interface category.

Table 12 Interface test results

Result Description

LOF Alarms Number of times the LOF condition was detected

LOF Seconds Seconds in which loss of framing was detected

AIS Alarms Number of alarm indication signals detected

AIS Seconds Number of seconds in which AIS was detected

RDI Alarms Number of Remote Defect Indication alarms

RDI Seconds Number of seconds in which RDI was detected

MF AIS Alarms Number of Multi Frame Alarm Indication Signals

detected

MF AIS Seconds Number of seconds in which MF-AIS was detected

MF RDI Alarms Number of Multi Frame Remote Defect Indication

alarms detected

MF RDI Seconds Number of seconds in which MF-RDI was detected

FAS BIT Errors Number of errored Frame Alignment Signal bits

detected

FAS BIT Error Rate Ratio of errored FAS bits to the total number of FAS

bits received

FAS Word Errors Number of errored FAS words detected

MFAS Word Errors Number of errored MFAS words received since initial

frame sync

80 SmartClass E1 Tester User’s Guide

Chapter 7 Test Results

E1 Results

Table 12 Interface test results (Continued)

Result Description

MFAS Word Error Rate Ratio of errored MFAS words to the total number of

frames received

MFAS Sync Losses Number of times MFAS Sync was lost

Frame Data results

The Frame Data category lists results related to framing. Table 13 describes the results that appear in the Frame Data category.

Table 13 Frame Data results

Result Description

FAS Word The current Frame Alignment Signal word

NFAS Word The current Non Frame Alignment Signal word

MFAS Word The current Multi Frame Alignment Signal word

NMFAS Word The current Non Multi Frame Alignment Signal word

Si Bit The current Si Bit setting

A Bit The current A Bit setting

Sa 4 The value of the Sa 4 bit over the previous 8 received

frames

Sa 5 The value of the Sa 5 bit over the previous 8 received

frames

Sa 6 The value of the Sa 6 bit over the previous 8 received

frames

Sa 7 The value of the Sa 7 bit over the previous 8 received

frames

Timeslot results

BERT results

Sa 8 The value of the Sa 8 bit over the previous 8 received

frames

The timeslot category lists the current bits, and signaling bits where applicable, for each timeslot.

The BERT category lists results related to the bit error rate test pattern.

Table 14 describes the results that appear in the BERT category.

Table 14 Test (BERT) results

Result Description

TSE Test Sequence Error (bit error)

Bit Error Rate Ratio of bit errors (TSEs) to received pattern data bits

Block Errors Number of blocks containing one or more errored bits.

Pattern Slips Number of pattern slips detected since start of test

(PRBS patterns only)

Pattern Slip Seconds Number of seconds during which one or more pattern

slips occurred after initial pattern synchronization.

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Chapter 7 Test Results

E1 Results

Table 14 Test (BERT) results (Continued)

Result Description

Pattern Sync Losses Number of times pattern synchronization is lost since

the last test start or restart.

Performance results

G.821 results

Pattern Sync Loss Seconds

Round Trip Delay (ms) The round trip delay for the last delay pattern sent and

Number of seconds during which the receiver has lost pattern synchronization, even momentarily, since initial pattern synchronization.

successfully received by the SmartClass E1. Calculated in milliseconds.

The SmartClass E1 provides performance analysis results in accordance with the ITU-T G.821, G.826, and M.2100 standards. The following sections describe the results for each standard.

Table 15 describes the G.821 performance results.

Table 15 G.821 performance results

Result Description

Verdict “Accepted” indicates that the test results have met the ITU-T Rec.

G.821 performance objectives. “Rejected” indicates that the test results did not meet the perfor-

mance objectives.

AS Available Seconds. A count of the number of Test Seconds which

met the ITU-T Rec. G.821 definition of available time.

ES Errored Seconds. The number of available seconds during which

one or more relevant anomalies or defects were present.

ESR Errored Seconds Ratio. The ratio of errored seconds to the num-

ber of available seconds.

SES Severely Errored Seconds. Seconds during which one or more

defects were present or the anomaly rate exceeded the ITU-T Rec. G.821 threshold.

SESR Severely Errored Seconds Ratio. The ratio of severely errored

seconds to the number of available seconds.

UAS Unavailable Seconds. A count of the number of test seconds

which met the ITU-T Rec. G.821 definition of unavailable time.

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Chapter 7 Test Results

E1 Results

G.826 ISM results

Table 16 describes the G.826 ISM (in service measurement) performance

results.

Table 16 G.826 ISM performance results

Result Description

NE Verdict Near End Verdict. Test status for the receive direction.

“Accepted” indicates that the test results have met the ITU-T Rec. G.826 performance objectives.

“Rejected” indicates that the test results did not meet the performance objectives.

NE AS Near End Available Seconds. A count of the number of Test Sec-

onds which met the ITU-T Rec. G.821 definition of available time.

NE ES Near End Errored Seconds. The number of available seconds

during which one or more relevant anomalies or defects were present.

NE ESR Near End Errored Seconds Ratio. The ratio errored seconds to

the number of available seconds.

NE SES Near End Severely Errored Seconds. Available seconds during

which one or more defects were present or the anomaly block error rate exceeded the ITU-T Rec. G.826 threshold.

NE SESR Near End Severely Errored Seconds Ratio. The ratio of Severely

Errored Seconds to the number of Available Seconds.

NE UAS Near End Unavailable Seconds. A count of the number of test

seconds which met the ITU-T Rec. G.826 definition of unavailable time.

FE Verdict Far End Verdict. Test status for the send direction.

“Accepted” indicates that the test results have met the ITU-T Rec. G.826 performance objectives.

“Rejected” indicates that the test results did not meet the performance objectives.

FE AS Far End Available Seconds. A count of the number of Test Sec-

onds which met the ITU-T Rec. G.821 definition of available time.

FE ES Far End Errored Seconds. The number of available seconds dur-

ing which one or more relevant anomalies or defects were present.

FE ESR Far End Errored Seconds Ratio. The ratio of errored seconds to

the number of available seconds.

FE SES Far End Severely Errored Seconds. Available seconds during

which one or more defects were present or the anomaly block error rate exceeded the ITU-T Rec. G.826 threshold.

FE SESR Far End Severely Errored Seconds Ratio. The ratio of severely

errored seconds to the number of available seconds.

FE UAS Far End Unavailable Seconds. A count of the number of Test Sec-

onds which met the ITU-T Rec. G.826 definition of unavailable time.

FE CRC BBE

FE CRC BBER

Far End CRC Background Block Error. Number of errored blocks that are not SES.

Far End CRC Background Block Error Ratio. The ratio of available blocks to the number of errored blocks.

SmartClass E1 Tester User’s Guide 83

Chapter 7 Test Results

E1 Results

G.826 OOS results

Table 17 describes the G.826 OOS (out of service) performance results in

alphabetical order.

Table 17 G.826 OOS performance results

Result Description

Verdict “Accepted” indicates that the test results have met the ITU-T Rec.

G.826 performance objectives. “Rejected” indicates that the test results did not meet the perfor-

mance objectives.

AS Available Seconds. A count of the number of Test Seconds which

met the ITU-T Rec. G.821 definition of available time.

ES Errored Seconds. The number of available seconds during which

one or more relevant anomalies or defects were present.

ESR Errored Seconds Ratio. The ratio errored seconds to the number

of available seconds.

SES Severely Errored Seconds. Available seconds during which one

or more defects were present or the anomaly block error rate exceeded the ITU-T Rec. G.826 threshold.

SESR Severely Errored Seconds Ratio. The ratio of severely errored

seconds to the number of available seconds.

UAS Unavailable Seconds. A count of the number of test seconds

which met the ITU-T Rec. G.826 definition of unavailable time.

M.2100 ISM results

CRC BBE CRC Background Block Error. Number of errored blocks that did

not result in a SES.

CRC BBER CRC Background Block Error Ratio. The ratio of CRC background

block errors to the number of blocks received.

Table 18 describes the M.2100 ISM (in service monitoring) performance

results in alphabetical order.

Table 18 M.2100 ISM performance results

Result Description

NE Verdict Near End Verdict. Test status for the receive direction.

“Accepted” indicates that the test results have met the M.2100 performance objectives.

“Uncertain” indicates that the SES and ES counts fall within the S1 <= n <= S2 range.

“Rejected” indicates that the test results did not meet the performance objectives.

NE AS Near End Available Seconds. A count of the number of Test Sec-

onds which met the ITU-T Rec. G.821 definition of available time.

NE ES Near End Errored Seconds. The number of available seconds

during which one or more relevant anomalies or defects were present.

NE ESR Near End Errored Seconds Ratio. The ratio errored seconds to

the number of available seconds.

NE SES Near End Severely Errored Seconds. Available seconds during

which one or more defects were present or the anomaly block error rate exceeded the ITU-T Rec. M.2100 threshold.

84 SmartClass E1 Tester User’s Guide

JDS Uniphase SmartClass E1, SmartClass E1/Datacom User Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Notice

Copyright

Trademarks

Ordering information

Industry Canada Requirements

EMC Directive Compliance

Low Voltage Directive Compliance

Table of Contents

About this Guide

Purpose and scope

Assumptions

Safety and compliance information

Conventions

Ship list

Features and capabilities

Options

Configurations

Software options

Optional accessories

Preparation for use

General preparation

Exploring the front panel

Charging the batteries

Status LEDs

Cancel key

OK key

Arrow keys

Keypad

*Action key

#Start key

Backlight key

Power key

Exploring the side panels

Left side panel

Right side panel

Exploring the bottom panel

Powering ON your unit

Powering OFF your unit

Navigating the user interface

Menu screens

Data entry screens

Result screens

Using the keypad

Returning to a previous menu

Entering numeric values

Typing text

Setting the language

Viewing the software and hardware information

Setting the date and time

Setting the date or time

Adjusting the contrast and brightness

Determining the specified battery type

Managing files

Specifying DB9 port usage

Setting options

Restoring factory defaults

Managing test configurations

Saving a configuration

Restoring a configuration

Viewing a configuration

Starting or restarting a test

Stopping a test

Timed testing

Viewing test results

Remote Control

About E1 testing

Launching an E1 test application

Specifying test application settings

Specifying a test mode

Specifying interface settings

Specifying a BERT pattern

Specifying VF settings

Monitoring a circuit

Measuring timing slips

Terminate testing

Line loopback testing