IXYS IXTK33N50 Datasheet

High Current MegaMOS
N-Channel Enhancement Mode
Preliminary data
TM
FET
IXTK 33N50 V
I R
DSS
D (cont)
DS(on)
= 500 V = 33 A = 0.17
Symbol Test conditions Maximum ratings V
DSS
V
DGR
V
GS
V
GSM
I
D25
I
DM
P
D
T
J
T
JM
T
stg
d Mounting torque 1.13/10 Nm/lb.in.
M
TJ= 25°C to 150°C 50 0 V TJ= 25°C to 150°C; R
= 1.0 M 500 V
GS
Continuous ±20 V Transient ±30 V
TC= 25°C 33 A TC= 25°C, pulse width limited by T
JM
132 A
TC= 25°C 416 W
-55 ... +150 °C 150 °C
-55 ... +150 °C
Weight 10 g Max lead temperature for soldering 30 0 °C
1.6 mm (0.062 in.) from case for 10 s
Symbol Test Conditions Characteristic Values
= 25°C unless otherwise specified) Min. Typ. Max.
(T
J
V
V
I I
R
GSS
DSS
DSS
GS(th)
DS(on)
VGS= 0 V, ID = 5 mA 500 V
temperature coefficient 0.087 %/K
BV
DSS
VDS= V V
GS(th)
, I
= 250 µA 2.0 4.0 V
GS
D
temperature coefficient -0.25 %/K VGS= ±20 V DC, VDS = 0 ±100 nA VDS= 0.8 V
V
VGS= 10 V, I
DSS
= 0 V TJ = 125°C 3 mA
= 0.5 I
D
D25
TJ = 25°C 200 µA
0.17
TO-264 AA
G
D
S
D (TAB)
G = Gate D = Drain S = Source TAB = Drain
Features
• Low R
• Rugged polysilicon gate cell
HDMOSTM process
DS (on)
structure
• International standard package
• Fast switching times
Applications
• Motor controls
• DC choppers
• Uninterruptable Power Supplies (UPS)
• Switch-mode and resonant-mode
Advantages
• Easy to mount with one screw (isolated mounting screw hole)
• Space savings
• High power density
IXYS reserves the right to change limits, test conditions, and dimensions.
© 2000 IXYS All rights reserved
95513C (4/97)
1 - 4
IXTK 33N50
Symbol Test Conditions Characteristic values
= 25°C unless otherwise specified) Min. Typ. Max.
(T
J
g C
C C
t t t t
Q Q Q
R R
fs
iss
oss
rss
d(on)
r
d(off)
f
g(on)
gs
gd
thJC
thCK
VDS= 10 V; ID = 0.5 I
, pulse test 24 S
D25
4900 pF
VGS = 0 V, VDS = 25 V, f = 1 MHz 69 0 pF
300 pF
53 ns
V
= 10 V, V
GS
= 0.5 V
DS
, ID = 0.5 I
DSS
D25
30 ns
RG = 1 (External) 14 0 ns
40 ns
250 nC
VGS= 10 V, VDS = 0.5 V
, ID = 0.5 I
DSS
D25
30 nC
115 nC
0.15 K/W
0.30 K/W
Source-Drain Diode Ratings and Characteristics
(TJ = 25°C unless otherwise specified)
Symbol Test Conditions Min. Typ. Max.
TO-264 AA Outline
Dim.
Millimeter Inches
Min. Max. Min. Max.
A 4.82 5.13 .190 .202 A1 2.54 2.89 .100 .114 A2 2.00 2.10 .079 .083 b 1.12 1.42 .044 .056 b1 2.39 2.69 .094 .106 b2 2.90 3.09 .114 .122 c 0.53 0.83 .021 .033
D 25.91 26.16 1.020 1.030 E 19.81 19.96 .780 .786 e 5.46 BSC .215 BSC J 0.00 0.25 .000 .010 K 0.00 0.25 .000 .010 L 20.32 20.83 .800 .820 L1 2.29 2.59 .090 .102 P 3.17 3.66 .125 .144 Q 6.07 6.27 .239 .247 Q1 8.38 8.69 .330 .342 R 3.81 4.32 .150 .170 R1 1.78 2.29 .070 .090 S 6.04 6.30 .238 .248 T 1.57 1.83 .062 .072
I
S
I
SM
V
SD
VGS= 0 V 33 A Repetitive; pulse width limited by T IF = IS, V
= 0 V, 1.5 V
GS
JM
132 A
Pulse test, t 300 µs, duty cycle d 2 %
t
rr
IF = IS, -di/dt = 100 A/µs, VR = 100 V 8 5 0 ns
© 2000 IXYS All rights reserved
IXYS MOSFETS and IGBTs are covered by one or more of the following U.S. patents: 4,835,592 4,881,106 5,017,508 5,049,961 5,187,117 5,486,715 4,850,072 4,931,844 5,034,796 5,063,307 5,237,481 5,381,025
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