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HiPerFET
Power MOSFETs
TM
IXFH 26N60/IXFT 26N60 600 V 26 A 0.25 W
IXFK 28N60 600 V 28 A 0.25 W
N-Channel Enhancement Mode
Avalanche Rated, High dv/dt, Low t
Preliminary data
Symbol Test Conditions Maximum Ratings
V
DSS
V
DGR
V
GS
V
GSM
I
D25
I
DM
I
AR
E
AR
E
AS
TJ= 25°C to 150°C 600 600 V
TJ= 25°C to 150°C; RGS = 1 MW 600 600 V
Continuous ±20 ±20 V
Transient ±30 ±30 V
TC= 25°C, Chip capability 26 28 A
TC= 25°C, pulse width limited by T
TC= 25°C2628A
TC= 25°C5050mJ
TC= 25°C 1.5 1.5 J
rr
IXFH/ IXFT IXFK
JM
104 112 A
V
DSS
t
£ 250 ns
rr
TO-247 AD (IXFH)
TO-268 (D3) ( IXFT)
G
I
D25
S
R
DS(on)
(TAB)
(TAB)
dv/dt I
P
D
T
J
T
JM
T
stg
T
L
£ IDM, di/dt £ 100 A/ms, VDD £ V
S
TJ £ 150°C, RG = 2 W
TC= 25°C 360 416 W
1.6 mm (0.063 in) from case for 10 s 300 30 0 °C
, 5 5 V/ns
DSS
-55 ... +150 °C
150 °C
-55 ... +150 °C
TO-264 AA (IXFK)
G = Gate
M
d
Mounting torque 1.13/10 0.9/6 Nm/lb.in.
Weight 610 g
S = Source TAB = Drain
Either Source terminal at miniBLOC can be used
as Main or Kelvin Source
Features
Symbol Test Conditions Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
V
V
I
I
R
DSS
GS(th)
GSS
DSS
DS(on)
VGS= 0 V, ID = 250 mA 600 V
VDS= VGS, ID = 4 mA 2 4.5 V
VGS= ±20 VDC, VDS = 0 ±200 nA
VDS= 0.8 • V
VGS= 0 V TJ = 125°C1mA
DSS
VGS= 10 V, ID = 0.5 • I
Pulse test, t £ 300 ms, duty cycle d £ 2 %
TJ = 25°C25mA
D25
0.25 W
• International standard packages
• Epoxy meet UL 94 V-0, flammability
• Low R
• Rugged polysilicon gate cell structure
• Avalanche energy and current rated
• Fast intrinsic Rectifier
Advantages
• Easy to mount
• Space savings
• High power density
G
classification
DS (on)
D
S
HDMOSTM process
D (TAB)
IXYS reserves the right to change limits, test conditions, and dimensions.
© 2000 IXYS All rights reserved
98511B (7/00)
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IXFH26N60 IXFK28N60
IXFT26N60
Symbol Test Conditions Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
g
C
C
C
t
t
t
t
Q
Q
Q
R
R
fs
iss
oss
rss
d(on)
r
d(off)
f
g(on)
gs
gd
thJC
thCK
VDS= 10 V; ID = 0.5 • I
VGS= 0 V, VDS = 25 V, f = 1 MHz 600 pF
VGS= 10 V, VDS = 0.5 • V
RG = 1.5 W (External), 110 ns
VGS= 10 V, VDS = 0.5 • V
TO-247 0.25 K/W
TO-264 0.15 K/W
, pulse test 11 18 S
D25
5000 pF
250 pF
30 ns
, ID = 0.5 • I
DSS
D25
43 ns
30 ns
250 300 nC
, ID = 0.5 • I
DSS
D25
33 45 nC
115 150 nC
26N60 0.35 K/W
28N60 0.30 K/W
TO-247 AD (IXFH) Outline
Dim. Millimeter Inches
Min. Max. Min. Max.
A 19.81 20.32 0.780 0.800
B 20.80 21.46 0.819 0.845
C 15.75 16.26 0.610 0.640
D 3.55 3.65 0.140 0.144
E 4.32 5.49 0.170 0.216
F 5.4 6.2 0.212 0.244
G 1.65 2.13 0.065 0.084
H - 4.5 - 0.177
J 1.0 1.4 0.040 0.055
K 10.8 11.0 0.426 0.433
L 4.7 5.3 0.185 0.209
M 0.4 0.8 0.016 0.031
N 1.5 2.49 0.087 0.102
TO-264 AA (IXFK) Outline
Source-Drain Diode Characteristic Values
(TJ = 25°C, unless otherwise specified)
Symbol Test Conditions min. typ. max.
I
S
I
SM
V
SD
t
rr
Q
RM
I
RM
TO-268AA (D3 PAK)
VGS= 0 V 26N60 26 A
28N60 28 A
Repetitive; pulse width limited by T
26N60 104 A
JM
28N60 112 A
IF = IS, VGS = 0 V, 1.5 V
Pulse test, t £ 300 ms, duty cycle d £ 2 %
250 ns
IF = IS -di/dt = 100 A/ms, VR = 100 V
Dim. Millimeter Inches
Min. Max. Min. Max.
A 4.9 5.1 .193 .201
A
2.7 2.9 .106 .114
1
A2.02 .25 .001 .010
b 1.15 1.45 .045 .057
1.9 2.1 .75 .83
b
2
C .4 .65 .016 .026
D 13.80 14.00 .543 .551
E 15.85 16.05 .624 .632
E
13.3 13.6 .524 .535
1
e 5.45 BSC .215 BSC
H 18.70 19.10 .736 .752
L 2.40 2.70 .094 .106
L1 1.20 1.40 .047 .055
L2 1.00 1.15 .039 .045
L3 0.25 BSC .010 BSC
L4 3.80 4.10 .150 .161
1 mC
10 A
Dim.
Millimeter Inches
Min. Max. Min. Max.
A 4.82 5.13 .190 .202
A1 2.54 2.89 .100 .114
A2 2.00 2.10 .079 .083
b 1.12 1.42 .044 .056
b1 2.39 2.69 .094 .106
b2 2.90 3.09 .114 .122
c 0.53 0.83 .021 .033
D 25.91 26.16 1.020 1.030
E 19.81 19.96 .780 .786
e 5.46 BSC .215 BSC
J 0.00 0.25 .000 .010
K 0.00 0.25 .000 .010
L 20.32 20.83 .800 .820
L1 2.29 2.59 .090 .102
P 3.17 3.66 .125 .144
Q 6.07 6.27 .239 .247
Q1 8.38 8.69 .330 .342
R 3.81 4.32 .150 .170
R1 1.78 2.29 .070 .090
S 6.04 6.30 .238 .248
T 1.57 1.83 .062 .072
Min. Recommended Footprint
© 2000 IXYS All rights reserved
IXYS MOSFETS and IGBTs are covered by one or more of the following U.S. patents:
4,835,592 4,881,106 5,017,508 5,049,961 5,187,117 5,486,715
4,850,072 4,931,844 5,034,796 5,063,307 5,237,481 5,381,025
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