© 2001 IXYS All rights reserved
1 - 2
D5
Symbol Conditions Maximum Ratings (per diode)
I
FRMS
TVJ = T
VJM
150 A
I
FAVM
① TC = 70°C; rectangular; d = 0.5 123 A
I
FRM
tP < 10 µs; rep. rating; pulse width limited by T
VJM
600 A
I
FSM
TVJ = 45°C; t = 10 ms (50 Hz), sine 1200 A
T
VJ
-40...+150 °C
T
VJM
150 °C
T
stg
-40...+150 °C
P
tot
TC = 25°C 250 W
V
ISOL
50/60 Hz, RMS t = 1 min 2500 V~
I
ISOL
≤ 1 mA t = 1 s 3000 V~
M
d
Mounting torque (M4) 1.5 - 2.0 Nm
14 - 18 lb.in.
Weight 20 g
Symbol Conditions Characteristic Values (per diode)
typ. max.
I
R
TVJ = 25°CVR= V
RRM
1mA
TVJ = 25°CVR= 0.8 • V
RRM
0.5 mA
TVJ = 125°CVR= 0.8 • V
RRM
20 mA
V
F
IF = 120 A; TVJ= 150°C 0.89 0.95 V
TVJ= 25°C 1.10 V
V
T0
For power-loss calculations only 0.7 V
r
T
TVJ = T
VJM
2.1 mΩ
R
thJC
0.7 K/W
R
thCK
0.1 K/W
t
rr
IF = 1 A; -di/dt = 400 A/µs 35 50 ns
VR = 30 V; TVJ = 25°C
I
RM
VR = 100 V; IF = 100 A; -diF/dt = 200 A/µs 12 15 A
L ≤ 0.05 µH; TVJ = 100°C
d
S
Creeping distance on surface min. 11.2 mm
d
A
Creeping distance in air min. 11.2 mm
a Allowable acceleration max. 50 m/s²
DSEI 2x121 I
FAVM
= 2x123 A
V
RRM
= 200 V
t
rr
= 35 ns
① I
FAVM
rating includes reverse blocking losses at T
VJM
, VR = 0.8 V
RRM
, duty cycle d = 0.5
Data according to IEC 60747
Features
• 2 independent FRED in 1 package
• Isolation voltage 3000 V~
• Planar passivated chips
• Leads suitable for PC board soldering
• Very short recovery time
• Soft recovery behaviour
Applications
• Antiparallel diode for high frequency
switching devices
• Anti saturation diode
• Snubber diode
• Free wheeling diode in converters
and motor control circuits
• Rectifiers in switch mode power
supplies (SMPS)
• Inductive heating and melting
• Uninterruptible power supplies (UPS)
• Ultrasonic cleaners and welders
Advantages
• Easy to mount with two screws
• Space and weight savings
• Improved temperature and power
cycling capability
• Low noise switching
• Small and light weight
Fast Recovery
Epitaxial Diode (FRED)
139
V
RSM
V
RRM
Type
V V
200 200 DSEI 2x 121-02P
IXYS reserves the right to change limits, test conditions and dimensions
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